CN101021494A - X fluorescent multi-element analyser - Google Patents
X fluorescent multi-element analyser Download PDFInfo
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- CN101021494A CN101021494A CN 200610025556 CN200610025556A CN101021494A CN 101021494 A CN101021494 A CN 101021494A CN 200610025556 CN200610025556 CN 200610025556 CN 200610025556 A CN200610025556 A CN 200610025556A CN 101021494 A CN101021494 A CN 101021494A
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Abstract
An X fluorescent multi-element analyzer contains an exciting source, an X light tube, a collimator above X light tube, an elementary color filter on front-end of collimator and light tube high-voltage providing energy to X light tube for exciting X-ray. Sample plate has a rotary plate, on which set a sample hole for placing tested sample. Sample hole locates on light path of X-ray calibrated by collimator and appears the same angle as collimator. Probe faces the sample hole positively to receive X fluorescence excited by X-ray. It has a proportional counter tube with a secondary color filter on front-end. A circuit output device connects with probe in series. In the invention, elementary color filter is copper foil and secondary color filter is siliceous film. The invention is a dispersing-type X fluorescent multi-element analyzer with on chemical and radiating pollution and has short measuring time, high precision, simple structure, stable safety and low cost.
Description
Technical field
The present invention relates to a kind of analyser, especially a kind ofly be used for analysis of material, mainly be the energy dispersion type XRF multi-element analyser of aluminium, silicon, calcium, iron or its oxide content in cement slurry and the grog.
Background technology
At present, in the cement production enterprise, chemical analysis method is generally adopted in the measurement of aluminium, silicon, calcium, iron or its oxide content at home, also have and adopt the multi-element analyser of Wavelength dispersion type x ray fluorescence to analyze.If adopt chemical analysis method, then,, the healthy of user of service caused damage so can cause severe contamination to environment owing to need to use chemical reagent.Owing to be manually-operated, so labour intensity is bigger, personal error is also bigger.Owing to need analyze different elements or its oxide respectively, and the required time of chemical analysis own is longer, so whole Measuring Time is longer, overlong time will influence in cement production process the control to cement quality.If adopting the multi-element analyser of Wavelength dispersion type x ray fluorescence analyzes, then can overcome basically and adopt the above-mentioned defective that chemical analysis brought, but because the sample chamber more complicated of this quasi-instrument, cause its light path very long, just need to do excitation source with the high voltage supply X-ray pipe of high voltage and big electric current, thereby the energy that makes excitation source is higher and intensity is bigger, so can cause bigger radiation, the healthy of user of service is caused damage.And the total more complicated of this quasi-instrument, so cost an arm and a leg, seldom there is enterprise to use.
Summary of the invention
There is defective for overcoming prior art, the invention provides a kind of multi-element analyser that does not have chemical contamination, radiationless pollution, Measuring Time is short, precision is high, X-ray pipe simple in structure, safe and reliable, low-cost excites energy dispersion type XRF.
For reaching the foregoing invention purpose, the invention provides a kind of X fluorescent multi-element analyser, comprise excitation source, sample disc, probe and circuit output device, wherein
Excitation source has an X-ray pipe, and a collimating apparatus is set on the X-ray pipe, and the collimating apparatus front end is provided with primary filter, and this primary filter is a Copper Foil, and the light pipe high pressure that X-ray X ray excited by tube energy is provided;
Sample disc has a rotating disk, offers a sample well on the rotating disk for placing testing sample, and sample well is on the light path of the X ray of calibrating by collimating apparatus, and collimating apparatus and sample well are an angle simultaneously, and described sample disc is in the other calibration sample group that is provided with of sample well;
Probe receives the X fluorescence that is produced by the excitation of X-rays sample over against sample well, and it has a proportional counter tube, and the proportional counter tube front end is provided with secondary color filter, and secondary color filter is siliceous film; And
A circuit output device is connected with probe.
Above-mentioned X fluorescent multi-element analyser, the light pipe high pressure of wherein said X-ray pipe are that digital scalable high pressure and ceiling voltage are 10000 volts.
Above-mentioned X fluorescent multi-element analyser is 25 millimeters between the X-ray pipe of wherein said excitation source and the sample, and the diameter of collimating apparatus is 6 millimeters.
Above-mentioned X fluorescent multi-element analyser wherein is 45 degree between collimating apparatus and the sample well
Above-mentioned X fluorescent multi-element analyser, wherein said calibration sample group are the one group of stable hard sample corresponding to the different measuring element.
Above-mentioned X fluorescent multi-element analyser, wherein said proportional counter tube are the thin berylium window proportional counter tube.
Above-mentioned X fluorescent multi-element analyser, wherein the angle of the window of counter tube and sample well is 0 degree, distance is 15 millimeters.
Above-mentioned X fluorescent multi-element analyser, wherein said circuit output device comprise pulse-shaping amplifier, multichannel pulse scope-analyzer, computer data processing and the control of series connection successively, and output device.
Above-mentioned X fluorescent multi-element analyser, the wherein said excitation source and the outer iron plate that is equipped with of popping one's head in.
The invention has the beneficial effects as follows: compare with existing chemical analysis method, owing to adopt Physical Analysis Methods, so personal error is little, operator's labour intensity is low, and Measuring Time is short, no chemical contamination; Compare with the multi-element analyser of existing Wavelength dispersion type x ray fluorescence, because the mxm. of X-ray pipe high pressure is 10000 volts, the X ray energy that is sent is up to 10keV, 40keV～60keV than Wavelength dispersion type is much lower, through 3 millimeters the no any leakage of iron plate shielding, thus the user of service there is not radiation damage, again because much simple in structure, so low price helps promoting in enterprise.Therefore, the invention has the beneficial effects as follows no chemical contamination, radiationless pollution, Measuring Time is short, precision is high, simple in structure, safe and reliable, easy to use, low price.
The accompanying drawing summary
Fig. 1 is a fundamental diagram of the present invention.
Embodiment
In Fig. 1, multi-element analyser of the present invention, by excitation source, sample disc, probe, the circuit output device is formed.
Excitation source is by X-ray pipe 1, collimating apparatus 2, and primary filter 3, light pipe high pressure 4 is formed.Before collimating apparatus 2 was arranged on X-ray pipe 1, primary filter 3 was arranged on the end of collimating apparatus 2.Light pipe high pressure 4 is used to provide the energy that excites X-ray pipe 1 to produce X ray A.
In the present embodiment, primary filter 3 adopts 10 microns Copper Foil, so that the spectral energy of exciting light is more monochromatic, thereby makes the characteristic X-ray fluorescence spectrum of aluminium, silicon, calcium, iron in the spectrum of exciting light and the sample noiseless substantially.Light pipe high pressure 4 is that digital scalable high pressure and ceiling voltage are 10000 volts,
Sample disc is positioned at the excitation source top, comprises a rotating disk 8, offers a sample well 9 on the rotating disk 8 for placing testing sample.X-ray bombardment by collimating apparatus 2 is in rotating disk 8 bottom surfaces, and sample well 9 is on the light path of X ray A simultaneously.Collimating apparatus 2 is an angle with sample well 9 bottom surfaces, so the X ray of directive sample well 9 also has identical angle with sample well 9.
In the present embodiment, this angle is preferably 45 degree, and simultaneously, X-ray pipe 1 is 35 millimeters with sample well 9 apart from the best, and the diameter of collimating apparatus 2 is that the best is 6 millimeters, thereby guarantees that analyser obtains best resolution.
Rotating disk 8 is provided with calibration sample group 10 on sample well 9 next doors.Calibration sample group 10 is the one group of stable hard sample corresponding to the different measuring element.Analyser is when measuring samples not, and calibration sample group 10 is in measuring position (in the sample well 9).Analyser is measured aluminium, silicon, calcium, the iron data of calibration sample group 10, with the influence of factors such as calibration environment, thus the precision of raising analyser.Calibration sample group 10 can adopt high-purity aluminium to make the hard sample with corresponding to aluminium element, adopts glass to make the hard sample with corresponding to element silicon, adopts cement to make the hard sample with corresponding to calcium, this two element of iron.
Probe is used to receive the X fluorescence B that sample produces over against sample well 9.Probe comprises a proportional counter tube 5, and proportional counter tube 5 front ends are provided with secondary color filter 6.And proportional counter tube 5 is connected with a charge-sensitive preamplifier 11.
In the present embodiment, proportional counter tube 5 is the thin berylium window proportional counter tube.The angle of the window of counter tube and sample surfaces (sample well 9) is that 0 degree, distance are 15 millimeters, and these are in order to guarantee that analyser obtains best resolution equally.The secondary color filter 6 of proportional counter tube 5 front end settings is for containing the film of silicon, and this has overcome the shortcoming of proportional counter tube energy resolution difference, makes the power spectrum of aluminium, these two adjacent elements of silicon just obtain differentiation before entering proportional counter tube.
Circuit and output device comprise the pulse-shaping amplifier 12 of connecting successively with charge-sensitive preamplifier 11, multichannel pulse scope-analyzer 13, and computer data is handled and is controlled 14, and output device.Output device can comprise display 15 and printer 16.
During actual measurement, excitation source emission X ray is to sample, inspire the characteristic X-ray fluorescence of aluminium, silicon, calcium, iron on the sample top layer, this fluorescence is tentatively distinguished through secondary color filter 6, accept and be converted into electric signal through proportional counter tube 5 again, passages through which vital energy circulates is washed into aluminium, silicon, calcium, iron are afterwards distinguished in the 12 shaping amplifications of type amplifier by multichannel pulse scope-analyzer 13 characteristic X-ray fluorescence again, is counted by computing machine 14 again.Because the characteristic X-ray fluorescence of the aluminium that the content of aluminium, silicon, calcium, iron or its oxide and analyser obtain in the sample, silicon, calcium, iron counting is directly proportional, so can draw the content of aluminium in the sample, silicon, calcium, iron or its oxide as calculated after machine 14 computings, by display 15, printer 16 data be exported at last.
Claims (9)
1. an X fluorescent multi-element analyser comprises excitation source, sample disc, and probe and circuit output device is characterized in that:
It has an X-ray pipe (1) excitation source, and a collimating apparatus (2) is set on the X-ray pipe (1), and the collimating apparatus front end is provided with primary filter (3), and this primary filter (3) is a Copper Foil, and the light pipe high pressure (4) that X-ray X ray excited by tube energy is provided;
Sample disc has a rotating disk (8), offer a sample well (9) on the rotating disk (8) for placing testing sample, sample well (9) is on the light path of the X ray of calibrating by collimating apparatus (2), collimating apparatus (2) is an angle with sample well (9) simultaneously, and described sample disc is in the other calibration sample group (10) that is provided with of sample well (9);
Probe receives the X fluorescence that is produced by the excitation of X-rays sample over against sample well (9), and it has a proportional counter tube (5), and proportional counter tube (5) front end is provided with secondary color filter (6), and secondary color filter (6) is siliceous film; And
A circuit output device is connected with probe.
2. X fluorescent multi-element analyser as claimed in claim 1 is characterized in that: the light pipe high pressure (4) of described X-ray pipe (1) is that digital scalable high pressure and ceiling voltage are 10000 volts.
3. X fluorescent multi-element analyser as claimed in claim 1 or 2 is characterized in that: between the X-ray pipe (1) of described excitation source and the sample is 25 millimeters, and the diameter of collimating apparatus (2) is 6 millimeters.
4. X fluorescent multi-element analyser as claimed in claim 3 is characterized in that: be 45 degree between collimating apparatus (2) and the sample well (9)
5. X fluorescent multi-element analyser as claimed in claim 1 is characterized in that: described calibration sample group (10) is the one group of stable hard sample corresponding to the different measuring element.
6. X fluorescent multi-element analyser as claimed in claim 1 is characterized in that: described proportional counter tube (5) is the thin berylium window proportional counter tube.
7. X fluorescent multi-element analyser as claimed in claim 6 is characterized in that: the angle of the window of counter tube and sample well (9) is 0 degree, and distance is 15 millimeters.
8. X fluorescent multi-element analyser as claimed in claim 1, it is characterized in that: described circuit output device comprises pulse-shaping amplifier (12), multichannel pulse scope-analyzer (13), computer data processing and the control (14) of series connection successively, and output device.
9. X fluorescent multi-element analyser as claimed in claim 1 is characterized in that: the described excitation source and the outer iron plate (17) that is equipped with of popping one's head in.
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| CN200610025556A CN100593116C (en) | 2006-04-10 | 2006-04-10 | X fluorescent multi-element analyser |
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| CN200610025556A CN100593116C (en) | 2006-04-10 | 2006-04-10 | X fluorescent multi-element analyser |
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| CN100593116C CN100593116C (en) | 2010-03-03 |
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Cited By (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN103674986A (en) * | 2013-12-20 | 2014-03-26 | 江苏天瑞仪器股份有限公司 | X-ray fluorescence spectrograph based on digital multi-channel pulse amplitude analysis |
| CN104020184A (en) * | 2014-04-04 | 2014-09-03 | 苏州三值精密仪器有限公司 | Upward-lighting type X-ray fluorescence spectrophotometer and control method thereof |
| CN104569019A (en) * | 2015-01-20 | 2015-04-29 | 铜陵有色金属集团股份有限公司金冠铜业分公司 | Method for measuring content of metal elements in copper anode mud |
| CN111337525A (en) * | 2020-04-20 | 2020-06-26 | 厦门汇美集智科技有限公司 | X-ray induced light-emitting device for remote measurement |
Family Cites Families (8)
| Publication number | Priority date | Publication date | Assignee | Title |
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| US3417243A (en) * | 1965-10-28 | 1968-12-17 | Minnesota Mining & Mfg | Method and apparatus for x-ray fluorescence gauging of a higher atomic number selected element in a coating on a base |
| DE1673174A1 (en) * | 1966-09-28 | 1972-03-23 | Ube Industries | Sample analyzer |
| CN86209041U (en) * | 1986-11-14 | 1987-10-31 | 清华大学 | Proportional counter with thin window, multi-filament for detecting characteristic spectral lines of ca, fe, si and al simultaneously |
| CN86209048U (en) * | 1986-12-19 | 1987-11-07 | 清华大学 | Composition analyzer of raw materials of cement |
| CN1031768C (en) * | 1991-07-02 | 1996-05-08 | 中国建筑材料科学研究院水泥科学研究所 | Multi-element analyzer with isotope and X fluorescence |
| US6130931A (en) * | 1998-09-17 | 2000-10-10 | Process Control, Inc. | X-ray fluorescence elemental analyzer |
| JP4002149B2 (en) * | 2002-07-26 | 2007-10-31 | 日本電子株式会社 | X-ray analyzer |
| CN2886561Y (en) * | 2006-04-10 | 2007-04-04 | 上海爱斯特电子有限公司 | Multi-element analyzer |
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2006
- 2006-04-10 CN CN200610025556A patent/CN100593116C/en active Active
Cited By (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN103674986A (en) * | 2013-12-20 | 2014-03-26 | 江苏天瑞仪器股份有限公司 | X-ray fluorescence spectrograph based on digital multi-channel pulse amplitude analysis |
| CN104020184A (en) * | 2014-04-04 | 2014-09-03 | 苏州三值精密仪器有限公司 | Upward-lighting type X-ray fluorescence spectrophotometer and control method thereof |
| CN104020184B (en) * | 2014-04-04 | 2017-03-01 | 苏州三值精密仪器有限公司 | A kind of upper illuminated X fluorescence spectrometer and its control method |
| CN104569019A (en) * | 2015-01-20 | 2015-04-29 | 铜陵有色金属集团股份有限公司金冠铜业分公司 | Method for measuring content of metal elements in copper anode mud |
| CN111337525A (en) * | 2020-04-20 | 2020-06-26 | 厦门汇美集智科技有限公司 | X-ray induced light-emitting device for remote measurement |
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| Publication number | Publication date |
|---|---|
| CN100593116C (en) | 2010-03-03 |
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