CA2146174A1 - Systeme de grande precision utilisant l'echantillonnage synchrone pour l'analyse vectorielle des signaux rf - Google Patents
Systeme de grande precision utilisant l'echantillonnage synchrone pour l'analyse vectorielle des signaux rfInfo
- Publication number
- CA2146174A1 CA2146174A1 CA002146174A CA2146174A CA2146174A1 CA 2146174 A1 CA2146174 A1 CA 2146174A1 CA 002146174 A CA002146174 A CA 002146174A CA 2146174 A CA2146174 A CA 2146174A CA 2146174 A1 CA2146174 A1 CA 2146174A1
- Authority
- CA
- Canada
- Prior art keywords
- synchronous sampling
- digital
- system based
- analysis system
- high precision
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R17/00—Measuring arrangements involving comparison with a reference value, e.g. bridge
- G01R17/10—AC or DC measuring bridges
- G01R17/16—AC or DC measuring bridges with discharge tubes or semiconductor devices in one or more arms of the bridge, e.g. voltmeter using a difference amplifier
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R19/00—Arrangements for measuring currents or voltages or for indicating presence or sign thereof
- G01R19/06—Measuring real component; Measuring reactive component
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R19/00—Arrangements for measuring currents or voltages or for indicating presence or sign thereof
- G01R19/28—Arrangements for measuring currents or voltages or for indicating presence or sign thereof adapted for measuring in circuits having distributed constants
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R25/00—Arrangements for measuring phase angle between a voltage and a current or between voltages or currents
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R25/00—Arrangements for measuring phase angle between a voltage and a current or between voltages or currents
- G01R25/02—Arrangements for measuring phase angle between a voltage and a current or between voltages or currents in circuits having distributed constants
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Measurement Of Resistance Or Impedance (AREA)
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
CA002146174A CA2146174C (fr) | 1995-04-03 | 1995-04-03 | Systeme de grande precision utilisant l'echantillonnage synchrone pour l'analyse vectorielle des signaux rf |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
CA002146174A CA2146174C (fr) | 1995-04-03 | 1995-04-03 | Systeme de grande precision utilisant l'echantillonnage synchrone pour l'analyse vectorielle des signaux rf |
Publications (2)
Publication Number | Publication Date |
---|---|
CA2146174A1 true CA2146174A1 (fr) | 1996-10-04 |
CA2146174C CA2146174C (fr) | 2005-01-11 |
Family
ID=4155555
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
CA002146174A Expired - Fee Related CA2146174C (fr) | 1995-04-03 | 1995-04-03 | Systeme de grande precision utilisant l'echantillonnage synchrone pour l'analyse vectorielle des signaux rf |
Country Status (1)
Country | Link |
---|---|
CA (1) | CA2146174C (fr) |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN107247183A (zh) * | 2017-06-09 | 2017-10-13 | 中国电子科技集团公司第四十研究所 | 一种相位测量***及方法 |
-
1995
- 1995-04-03 CA CA002146174A patent/CA2146174C/fr not_active Expired - Fee Related
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN107247183A (zh) * | 2017-06-09 | 2017-10-13 | 中国电子科技集团公司第四十研究所 | 一种相位测量***及方法 |
Also Published As
Publication number | Publication date |
---|---|
CA2146174C (fr) | 2005-01-11 |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
EEER | Examination request | ||
MKLA | Lapsed |