CA2038526A1 - Measuring window for a measuring cell - Google Patents

Measuring window for a measuring cell

Info

Publication number
CA2038526A1
CA2038526A1 CA 2038526 CA2038526A CA2038526A1 CA 2038526 A1 CA2038526 A1 CA 2038526A1 CA 2038526 CA2038526 CA 2038526 CA 2038526 A CA2038526 A CA 2038526A CA 2038526 A1 CA2038526 A1 CA 2038526A1
Authority
CA
Canada
Prior art keywords
measuring
window
cell
measuring cell
measuring window
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Abandoned
Application number
CA 2038526
Other languages
English (en)
French (fr)
Inventor
Rense 't Hooft
Heikki J. Sipila
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Individual
Original Assignee
Individual
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Individual filed Critical Individual
Publication of CA2038526A1 publication Critical patent/CA2038526A1/en
Abandoned legal-status Critical Current

Links

Landscapes

  • Analysing Materials By The Use Of Radiation (AREA)
CA 2038526 1990-03-19 1991-03-18 Measuring window for a measuring cell Abandoned CA2038526A1 (en)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
FI901348A FI901348A (fi) 1990-03-19 1990-03-19 Maetningsfoenster i maetcell.
FI901348 1990-03-19

Publications (1)

Publication Number Publication Date
CA2038526A1 true CA2038526A1 (en) 1991-09-20

Family

ID=8530085

Family Applications (1)

Application Number Title Priority Date Filing Date
CA 2038526 Abandoned CA2038526A1 (en) 1990-03-19 1991-03-18 Measuring window for a measuring cell

Country Status (3)

Country Link
AU (1) AU641986B2 (fi)
CA (1) CA2038526A1 (fi)
FI (1) FI901348A (fi)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US9989510B2 (en) 2016-01-20 2018-06-05 Rense 't Hooft Flow cell as well as a system and a method for analysing a fluid

Family Cites Families (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
HU176847B (en) * 1979-04-23 1981-05-28 Mta Atommag Kutato Intezete Measuring head with entering windov made from beryllium,used for measuring x- and soft gamma radiation and method for making this

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US9989510B2 (en) 2016-01-20 2018-06-05 Rense 't Hooft Flow cell as well as a system and a method for analysing a fluid

Also Published As

Publication number Publication date
FI901348A (fi) 1991-09-20
AU641986B2 (en) 1993-10-07
FI901348A0 (fi) 1990-03-19
AU7272691A (en) 1991-09-19

Similar Documents

Publication Publication Date Title
Leidheiser Cathodic delamination of polybutadiene from steel-A review
CA2008941C (en) Tunnel probe and apparatus for simultaneously measuring electrochemical reaction and a tunneling current
KR970059301A (ko) 액중(液中)방전에 의한 표면처리방법
Wolf Modification of chemical surface properties by ion beam assisted deposition
Detwiler et al. Texture of calcium hydroxide near the cement paste-aggregate interface
GB2167860A (en) Test piece for ultrasonic inspection
CA2038526A1 (en) Measuring window for a measuring cell
Beeghly An X‐Ray Method for Determining Tin Coating Thickness on Steel
Alexander et al. Functionalized plasma polymer coatings for improved durability of aluminium–epoxy adhesive joints: fractography
Tagawa et al. Contact angle hysteresis in carbon fibers studied by wetting force measurements
EP0076562B1 (en) Substrate with chemically modified surface and method of manufacture thereof
JPH08240542A (ja) 大気圧下測定用イオンビーム分析装置のイオンビーム出口窓
US4510386A (en) Thinning of specimens for examination under the electron microscope
Broughton et al. Review of surface characterisation techniques for adhesive bonding.
Graham et al. Oxygen in pyrrhotite; 2, Determination of oxygen in natural pyrrhotites
Kadereit et al. Studies of the adhesion properties of LIGA microstructures by X-ray spectroscopy and mechanical measurements
Sbriz et al. Determination of thin surface layers in-situ by the conversion electron mössbauer spectroscopy/CEMS/, using a parallel plate avalanche counter/PPAC
Markowicz et al. Absorption correction in electron probe x-ray microanalysis of thin samples
Koch et al. Quantification of SNMS investigations of coated materials
JP2004294125A (ja) 試料調整器具、試料調整方法、元素分析方法
Pan et al. Groove adhesion test for electrodeposited chromium
Wang et al. Scanning Kelvin Probe Measurements Near Salt Particles on Zinc and Iron in High Humidity, March 2005
Roman et al. LASER DIAGNOSTICS OF PACVD PROCESSES FOR DEPOSITING HARD FACE COATINGS
Watts et al. The analysis of surface coatings and raw materials
Baun Experimental methods to determine locus of failure and bond failure mechanism in adhesive joints and coating-substrate combinations

Legal Events

Date Code Title Description
FZDE Dead