CA2038526A1 - Measuring window for a measuring cell - Google Patents
Measuring window for a measuring cellInfo
- Publication number
- CA2038526A1 CA2038526A1 CA 2038526 CA2038526A CA2038526A1 CA 2038526 A1 CA2038526 A1 CA 2038526A1 CA 2038526 CA2038526 CA 2038526 CA 2038526 A CA2038526 A CA 2038526A CA 2038526 A1 CA2038526 A1 CA 2038526A1
- Authority
- CA
- Canada
- Prior art keywords
- measuring
- window
- cell
- measuring cell
- measuring window
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Abandoned
Links
Landscapes
- Analysing Materials By The Use Of Radiation (AREA)
Abstract
(57) ABSTRACT
The invention relates to a measuring window for a measuring cell, particularly to a measuring window for the measuring cell of an X-ray analyzer, which is made of beryllium.
According to the invention, the measuring window is, at least on one side, coated with some highly durable material such as diamond, boron carbide or boron nitride.
The invention relates to a measuring window for a measuring cell, particularly to a measuring window for the measuring cell of an X-ray analyzer, which is made of beryllium.
According to the invention, the measuring window is, at least on one side, coated with some highly durable material such as diamond, boron carbide or boron nitride.
Description
2 ~ e~
MEASURING WINDOW FOR A MEASURING CELL
The present invention relates to a measuring window for a measuring cell, particularly to the measuring cell of an X-ray analyzer, which measuring window can be employed in analyzing the properties of both light and heavy elements.
In the prior art there is known a measuring window for the measuring cell of an X-ray analyzer, which window is made of MYLAR or KAPTON plastic film. While using this kind of plastic film window for instance in the chemical industry, which includes both strongly alkalic processes and processes using strong acids, as well as processes where one and the same process employs solutions with different pH values, the MYLAR film, ~or example, is too weak to endure high temper-atures. As for the KAPTON film, problems arise from alkalic surroundings in the chemical industry.
A further weakness of a measuring window made of plastic film is its poor durability in wearing conditions, when a slurry containing solids is analyzed through the measuring window. Moreover, plastic film tends to stretch during use, which leads to changes in the measuring geometry of the apparatus, and thus to the weakening of the measuring accu-racy of the analyzing results.
The object of the present invention is to eliminate some of the drawbacks of the prior art and to realize an improved measuring window for measuring cells, particularly to be employed in X-ray analyzers, which measuring window is made of metallic material and coated, at least on one side, with some highly durable material. The essential novel features of the invention are apparent from the appended patent claims.
According to the invention the measuring window of a mea-suring cell, particularly that of an X-ray analyzer, is made ~ -~ ,. .
', , . . , . : . , '. . ' ., . - .:.
, , . . , .,. .. . . :, : . . . . :
~ 3 of beryllium which i~ at least on the surface that gets into contact with the material to be analyzed, i.e. on the pro-cess surface, coated with some highly durable material such as diamond, boron nitride or boron carbide.
The measuring window for a measuring cell of the present invention, made of beryllium, is particularly advantageous in an X-ray analyzer, because beryllium has good permeabil-ity of X-rays.
As for its properties, beryllium is a metal, and thus strong in mechanical characteristics, and therefore a measuring window made of beryllium endures essentially higher pres-sures than the prior art measuring window made of plastic film. The making itself of so thin a measuring window is easier and cheaper of beryllium than of plastic film, as in the prior art, even more so when the poor mechanical prop-erties of plastic film are taken into account. When an X-ray analyzer is used for analyzing light elements, the employed radiation source whereof can be a Fe55 isotope comprising the elements of the element system from sodium to titanium, the employed measuring window of the measuring cell is, according to the present invention, a beryllium window with a thickness within the range 13 - 50 ~m. For heavy elements, however, with a molar mass hea~ier than that of titanium, the thickness of the beryllium windows is within the range 130 - 500 ,um. The variation of the thick-ness of the beryllium window for different elements follows from the fact that the radiation created by heavy ele~ents is capable of penetrating a thicker beryllium window. Thus it is advantageous, for instance for production technical or economical reasons, to produce measuring windows of varying thicknesses, to be used in the analysis of different ele-ments.
According to the invention, the properties of a beryllium measuring window of a measuring cell are improved, for t.
''' ' ;;' ' . . , ' . . :, .: . .',- ' . : , : ' ': ~. ' ' . '' , :
. ' ' . ' ~ . ' :
MEASURING WINDOW FOR A MEASURING CELL
The present invention relates to a measuring window for a measuring cell, particularly to the measuring cell of an X-ray analyzer, which measuring window can be employed in analyzing the properties of both light and heavy elements.
In the prior art there is known a measuring window for the measuring cell of an X-ray analyzer, which window is made of MYLAR or KAPTON plastic film. While using this kind of plastic film window for instance in the chemical industry, which includes both strongly alkalic processes and processes using strong acids, as well as processes where one and the same process employs solutions with different pH values, the MYLAR film, ~or example, is too weak to endure high temper-atures. As for the KAPTON film, problems arise from alkalic surroundings in the chemical industry.
A further weakness of a measuring window made of plastic film is its poor durability in wearing conditions, when a slurry containing solids is analyzed through the measuring window. Moreover, plastic film tends to stretch during use, which leads to changes in the measuring geometry of the apparatus, and thus to the weakening of the measuring accu-racy of the analyzing results.
The object of the present invention is to eliminate some of the drawbacks of the prior art and to realize an improved measuring window for measuring cells, particularly to be employed in X-ray analyzers, which measuring window is made of metallic material and coated, at least on one side, with some highly durable material. The essential novel features of the invention are apparent from the appended patent claims.
According to the invention the measuring window of a mea-suring cell, particularly that of an X-ray analyzer, is made ~ -~ ,. .
', , . . , . : . , '. . ' ., . - .:.
, , . . , .,. .. . . :, : . . . . :
~ 3 of beryllium which i~ at least on the surface that gets into contact with the material to be analyzed, i.e. on the pro-cess surface, coated with some highly durable material such as diamond, boron nitride or boron carbide.
The measuring window for a measuring cell of the present invention, made of beryllium, is particularly advantageous in an X-ray analyzer, because beryllium has good permeabil-ity of X-rays.
As for its properties, beryllium is a metal, and thus strong in mechanical characteristics, and therefore a measuring window made of beryllium endures essentially higher pres-sures than the prior art measuring window made of plastic film. The making itself of so thin a measuring window is easier and cheaper of beryllium than of plastic film, as in the prior art, even more so when the poor mechanical prop-erties of plastic film are taken into account. When an X-ray analyzer is used for analyzing light elements, the employed radiation source whereof can be a Fe55 isotope comprising the elements of the element system from sodium to titanium, the employed measuring window of the measuring cell is, according to the present invention, a beryllium window with a thickness within the range 13 - 50 ~m. For heavy elements, however, with a molar mass hea~ier than that of titanium, the thickness of the beryllium windows is within the range 130 - 500 ,um. The variation of the thick-ness of the beryllium window for different elements follows from the fact that the radiation created by heavy ele~ents is capable of penetrating a thicker beryllium window. Thus it is advantageous, for instance for production technical or economical reasons, to produce measuring windows of varying thicknesses, to be used in the analysis of different ele-ments.
According to the invention, the properties of a beryllium measuring window of a measuring cell are improved, for t.
''' ' ;;' ' . . , ' . . :, .: . .',- ' . : , : ' ': ~. ' ' . '' , :
. ' ' . ' ~ . ' :
3 ~ ' h i.3 instance in specially wearing conditions, by coating the measuring window, at least on the surface that gets into contact with the material to be analyzed, with a thin layer of coating. In the coating process, for example the method and apparatus described in the FI patent 79,351 can be em-ployed. According to the said FI patent, the material is coated by means of a plasma jet, by accelerating the pul-sated plasma jet discharged from at least one electrode, by means of a magnet field created with a bent coil, and by bending the said plasma jet, in order to separate uncharged particles, by means of a magnet field, whereafter the plasma jet hits the surface of the material to be coated.
While the employed coating, according to the invention, is a diamond film, the thickness of the coating can be between 0.5 - 3.0 um, advantageously between 1.5 - 3.0 ~m on that surface of the beryllium window that gets into contact with the material under analysis, i.e. on the process surface.
According to the invention, the beryllium window employed as the measuring window of a measuring cell can also be coated on the opposite surface, the analyzer-side surface, i.e. the environment ~urface, with a respective coating. While using a diamond film on the analyzer-side surfa~e, the thickness of the coating can be between 0.1 - 1.0 ,um.
While the employed coating, according to the invention, is a diamond film, the thickness of the coating can be between 0.5 - 3.0 um, advantageously between 1.5 - 3.0 ~m on that surface of the beryllium window that gets into contact with the material under analysis, i.e. on the process surface.
According to the invention, the beryllium window employed as the measuring window of a measuring cell can also be coated on the opposite surface, the analyzer-side surface, i.e. the environment ~urface, with a respective coating. While using a diamond film on the analyzer-side surfa~e, the thickness of the coating can be between 0.1 - 1.0 ,um.
Claims (8)
1. A measuring window for a measuring cell, particularly the measuring cell of an x-ray analyzer, which window is made of beryllium, c h a r a c t e r i z e d in that the measuring window is at least on one surface coated with some highly durable material.
2. The measuring window of claim 1 for a measuring cell, c h a r a c t e r i z e d in that the employed coating material is diamond.
3. The measuring window of claim 1 or 2 for a measuring cell, c h a r a c t e r i z e d in that the thickness of the coating on the surface that gets into contact with the material to be analyzed is 0.5 - 3.0 µm, advantageously 1.5 - 3.0 µm.
4. The measuring window of claim 1, 2 or 3 for a measuring cell, c h a r a c t e r i z e d in that the thickness of the coating on the surface on the analyzer side of the mea-suring window is 0.1 - 1.0 µm.
5. The measuring window of claim 1 for a measuring cell, c h a r a c t e r i z e d in that the coating material is boron nitride.
6. The measuring window of claim 1 for a measuring cell, c h a r a c t e r i z e d in that the coating material is boron carbide.
7. The measuring window for a measuring cell of any of the preceding claims, c h a r a c t e r i z e d in that the thickness of the measuring window, while analyzing light elements, is between 13 - 50 µm.
8. The measuring window for a measuring cell of any of the claims 1 - 6, c h a r a c t e r i z e d in that the thickness of the measuring window, while analyzing heavy elements, is between 130 - 500 µm.
Applications Claiming Priority (2)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| FI901348A FI901348A (en) | 1990-03-19 | 1990-03-19 | MAETNINGSFOENSTER I MAETCELL. |
| FI901348 | 1990-03-19 |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CA2038526A1 true CA2038526A1 (en) | 1991-09-20 |
Family
ID=8530085
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CA 2038526 Abandoned CA2038526A1 (en) | 1990-03-19 | 1991-03-18 | Measuring window for a measuring cell |
Country Status (3)
| Country | Link |
|---|---|
| AU (1) | AU641986B2 (en) |
| CA (1) | CA2038526A1 (en) |
| FI (1) | FI901348A (en) |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US9989510B2 (en) | 2016-01-20 | 2018-06-05 | Rense 't Hooft | Flow cell as well as a system and a method for analysing a fluid |
Family Cites Families (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| HU176847B (en) * | 1979-04-23 | 1981-05-28 | Mta Atommag Kutato Intezete | Measuring head with entering windov made from beryllium,used for measuring x- and soft gamma radiation and method for making this |
-
1990
- 1990-03-19 FI FI901348A patent/FI901348A/en not_active IP Right Cessation
-
1991
- 1991-03-07 AU AU72726/91A patent/AU641986B2/en not_active Expired
- 1991-03-18 CA CA 2038526 patent/CA2038526A1/en not_active Abandoned
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US9989510B2 (en) | 2016-01-20 | 2018-06-05 | Rense 't Hooft | Flow cell as well as a system and a method for analysing a fluid |
Also Published As
| Publication number | Publication date |
|---|---|
| FI901348A (en) | 1991-09-20 |
| AU641986B2 (en) | 1993-10-07 |
| FI901348A0 (en) | 1990-03-19 |
| AU7272691A (en) | 1991-09-19 |
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Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| FZDE | Dead |