BR112013011107A2 - ''processamento e detecção rápidos de não uniformidades em materiais á base de manta'' - Google Patents

''processamento e detecção rápidos de não uniformidades em materiais á base de manta''

Info

Publication number
BR112013011107A2
BR112013011107A2 BR112013011107A BR112013011107A BR112013011107A2 BR 112013011107 A2 BR112013011107 A2 BR 112013011107A2 BR 112013011107 A BR112013011107 A BR 112013011107A BR 112013011107 A BR112013011107 A BR 112013011107A BR 112013011107 A2 BR112013011107 A2 BR 112013011107A2
Authority
BR
Brazil
Prior art keywords
uniformity
detection
fast processing
mat materials
mat
Prior art date
Application number
BR112013011107A
Other languages
English (en)
Inventor
Derek H Justice
Evan J Ribnick
Guillermo Sapiro
John A Ramthun
Kenneth G Brittain
Original Assignee
3M Innovative Properties Co
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by 3M Innovative Properties Co filed Critical 3M Innovative Properties Co
Publication of BR112013011107A2 publication Critical patent/BR112013011107A2/pt

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/89—Investigating the presence of flaws or contamination in moving material, e.g. running paper or textiles
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T7/00—Image analysis
    • G06T7/0002—Inspection of images, e.g. flaw detection
    • G06T7/0004—Industrial image inspection
    • G06T7/001—Industrial image inspection using an image reference approach
    • B—PERFORMING OPERATIONS; TRANSPORTING
    • B65—CONVEYING; PACKING; STORING; HANDLING THIN OR FILAMENTARY MATERIAL
    • B65H—HANDLING THIN OR FILAMENTARY MATERIAL, e.g. SHEETS, WEBS, CABLES
    • B65H43/00—Use of control, checking, or safety devices, e.g. automatic devices comprising an element for sensing a variable
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N19/00—Investigating materials by mechanical methods
    • G01N19/02—Measuring coefficient of friction between materials
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N19/00—Investigating materials by mechanical methods
    • G01N19/10—Measuring moisture content, e.g. by measuring change in length of hygroscopic filament; Hygrometers
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/89—Investigating the presence of flaws or contamination in moving material, e.g. running paper or textiles
    • G01N21/892—Investigating the presence of flaws or contamination in moving material, e.g. running paper or textiles characterised by the flaw, defect or object feature examined
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N22/00—Investigating or analysing materials by the use of microwaves or radio waves, i.e. electromagnetic waves with a wavelength of one millimetre or more
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/20—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by using diffraction of the radiation by the materials, e.g. for investigating crystal structure; by using scattering of the radiation by the materials, e.g. for investigating non-crystalline materials; by using reflection of the radiation by the materials
    • G01N23/207—Diffractometry using detectors, e.g. using a probe in a central position and one or more displaceable detectors in circumferential positions
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/22—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by measuring secondary emission from the material
    • G01N23/223—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by measuring secondary emission from the material by irradiating the sample with X-rays or gamma-rays and by measuring X-ray fluorescence
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N24/00—Investigating or analyzing materials by the use of nuclear magnetic resonance, electron paramagnetic resonance or other spin effects
    • G01N24/08—Investigating or analyzing materials by the use of nuclear magnetic resonance, electron paramagnetic resonance or other spin effects by using nuclear magnetic resonance
    • G01N24/082—Measurement of solid, liquid or gas content
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N9/00—Investigating density or specific gravity of materials; Analysing materials by determining density or specific gravity
    • G01N9/36—Analysing materials by measuring the density or specific gravity, e.g. determining quantity of moisture
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T7/00—Image analysis
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T7/00—Image analysis
    • G06T7/0002—Inspection of images, e.g. flaw detection
    • G06T7/0004—Industrial image inspection
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T2207/00—Indexing scheme for image analysis or image enhancement
    • G06T2207/10—Image acquisition modality
    • G06T2207/10024—Color image
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T2207/00—Indexing scheme for image analysis or image enhancement
    • G06T2207/20—Special algorithmic details
    • G06T2207/20016—Hierarchical, coarse-to-fine, multiscale or multiresolution image processing; Pyramid transform
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T2207/00—Indexing scheme for image analysis or image enhancement
    • G06T2207/20—Special algorithmic details
    • G06T2207/20076—Probabilistic image processing
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T2207/00—Indexing scheme for image analysis or image enhancement
    • G06T2207/20—Special algorithmic details
    • G06T2207/20081—Training; Learning
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T2207/00—Indexing scheme for image analysis or image enhancement
    • G06T2207/30—Subject of image; Context of image processing
    • G06T2207/30108—Industrial image inspection
    • G06T2207/30124—Fabrics; Textile; Paper

Landscapes

  • Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • General Physics & Mathematics (AREA)
  • Chemical & Material Sciences (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Theoretical Computer Science (AREA)
  • Computer Vision & Pattern Recognition (AREA)
  • Textile Engineering (AREA)
  • Quality & Reliability (AREA)
  • High Energy & Nuclear Physics (AREA)
  • Automation & Control Theory (AREA)
  • Electromagnetism (AREA)
  • Crystallography & Structural Chemistry (AREA)
  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
  • Image Analysis (AREA)
  • Treatment Of Fiber Materials (AREA)
BR112013011107A 2010-11-12 2011-10-28 ''processamento e detecção rápidos de não uniformidades em materiais á base de manta'' BR112013011107A2 (pt)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US41325010P 2010-11-12 2010-11-12
PCT/US2011/058250 WO2012064522A1 (en) 2010-11-12 2011-10-28 Rapid processing and detection of non-uniformities in web-based materials

Publications (1)

Publication Number Publication Date
BR112013011107A2 true BR112013011107A2 (pt) 2016-08-02

Family

ID=46051242

Family Applications (1)

Application Number Title Priority Date Filing Date
BR112013011107A BR112013011107A2 (pt) 2010-11-12 2011-10-28 ''processamento e detecção rápidos de não uniformidades em materiais á base de manta''

Country Status (8)

Country Link
US (1) US9031312B2 (pt)
EP (1) EP2638384A4 (pt)
JP (1) JP5912125B2 (pt)
KR (1) KR101800058B1 (pt)
CN (1) CN103221807B (pt)
BR (1) BR112013011107A2 (pt)
SG (1) SG190143A1 (pt)
WO (1) WO2012064522A1 (pt)

Families Citing this family (11)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR20140031201A (ko) * 2011-02-24 2014-03-12 쓰리엠 이노베이티브 프로퍼티즈 캄파니 웨브 기반 재료 내의 불균일성의 검출 시스템
DE102011108754A1 (de) * 2011-07-28 2013-01-31 Khs Gmbh Inspektionseinheit
CN103988175A (zh) * 2011-10-10 2014-08-13 惠普发展公司，有限责任合伙企业 识别用于响应云计算***中的异常的动作的方法和***
US10181185B2 (en) * 2016-01-11 2019-01-15 Kla-Tencor Corp. Image based specimen process control
US10388011B2 (en) * 2016-05-17 2019-08-20 Abb Schweiz Ag Real-time, full web image processing method and system for web manufacturing supervision
EP3361444A1 (en) * 2017-02-10 2018-08-15 ABB Schweiz AG Real-time, full web image processing method and system for web manufacturing supervision
CN107065545B (zh) * 2017-04-01 2020-03-24 同济大学 基于马尔科夫跳变的分布式事件触发滤波***及设计方法
CN108227664A (zh) * 2018-02-05 2018-06-29 华侨大学 基于样本数据训练的产品质量控制设备及质量控制方法
JP6681082B2 (ja) * 2018-02-21 2020-04-15 株式会社タナカ技研 情報処理装置、情報システム、情報処理方法、およびプログラム
US11878928B2 (en) 2019-02-06 2024-01-23 Corning Incorporated Methods of processing a viscous ribbon
JP7084634B2 (ja) * 2019-12-20 2022-06-15 株式会社タナカ技研 、情報処理装置、端末装置、情報処理方法、およびプログラム

Family Cites Families (39)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4728800A (en) * 1985-04-24 1988-03-01 Young Engineering, Inc. Apparatus and method for detecting defects in a moving web
EP0537329B1 (en) * 1991-05-03 1996-04-03 Eastman Kodak Company Control of web winding
US5911139A (en) 1996-03-29 1999-06-08 Virage, Inc. Visual image database search engine which allows for different schema
FR2761475B1 (fr) * 1997-03-28 1999-06-11 Lorraine Laminage Procede d'inspection de surface d'une bande en defilement par segmentation d'image en zones suspectes
US5893055A (en) * 1997-05-30 1999-04-06 Abb Industrial Systems, Inc. Two-dimensional web property variation modeling and control
US5999636A (en) * 1997-10-10 1999-12-07 Printprobe Technology, Llc Apparatus and process for inspecting print material
DE69906706T2 (de) * 1998-02-10 2004-01-29 Abb Ind Systems Inc Verfahren zum extrahieren und klassifizieren von blattvariationsmustern aus zwei-dimensionalen blattmessungen
US6445834B1 (en) 1998-10-19 2002-09-03 Sony Corporation Modular image query system
US6539106B1 (en) * 1999-01-08 2003-03-25 Applied Materials, Inc. Feature-based defect detection
JP4173246B2 (ja) 1999-04-28 2008-10-29 株式会社リコー 類似画像表示方法及び類似画像表示処理プログラムを格納した記録媒体
US6999614B1 (en) * 1999-11-29 2006-02-14 Kla-Tencor Corporation Power assisted automatic supervised classifier creation tool for semiconductor defects
KR20010101697A (ko) 1999-11-29 2001-11-14 기시모토 마사도시 결함검사시스템
KR100355404B1 (ko) 1999-12-03 2002-10-11 삼성전자 주식회사 주파수 공간상에서의 가보 필터를 이용한 질감표현방법 및질감기반 영상 검색방법
JP3386025B2 (ja) * 1999-12-15 2003-03-10 株式会社ニコン 画像特徴抽出装置、画像特徴抽出方法、監視検査システム、半導体露光システム、およびインターフェースシステム
US7113994B1 (en) 2000-01-24 2006-09-26 Microsoft Corporation System and method of proxy authentication in a secured network
US7099860B1 (en) 2000-10-30 2006-08-29 Microsoft Corporation Image retrieval systems and methods with semantic and feature based relevance feedback
US6950547B2 (en) * 2001-02-12 2005-09-27 3M Innovative Properties Company Web inspection method and device
US6681060B2 (en) 2001-03-23 2004-01-20 Intel Corporation Image retrieval using distance measure
US6847733B2 (en) 2001-05-23 2005-01-25 Eastman Kodak Company Retrieval and browsing of database images based on image emphasis and appeal
US7283659B1 (en) 2002-01-09 2007-10-16 Kla-Tencor Technologies Corporation Apparatus and methods for searching through and analyzing defect images and wafer maps
JP4155496B2 (ja) 2002-04-25 2008-09-24 大日本スクリーン製造株式会社 分類支援装置、分類装置およびプログラム
JP4118703B2 (ja) * 2002-05-23 2008-07-16 株式会社日立ハイテクノロジーズ 欠陥分類装置及び欠陥自動分類方法並びに欠陥検査方法及び処理装置
JP2004109105A (ja) * 2002-07-23 2004-04-08 Jfe Steel Kk 表面欠陥検出における疵種分類境界設定方法、及び欠陥検出方法
FI20021578A (fi) 2002-09-03 2004-03-04 Honeywell Oy Paperin karakterisointi
US7162071B2 (en) 2002-12-20 2007-01-09 Taiwan Semiconductor Manufacturing Co., Ltd. Progressive self-learning defect review and classification method
US7359544B2 (en) * 2003-02-12 2008-04-15 Kla-Tencor Technologies Corporation Automatic supervised classifier setup tool for semiconductor defects
US7602962B2 (en) * 2003-02-25 2009-10-13 Hitachi High-Technologies Corporation Method of classifying defects using multiple inspection machines
US7027934B2 (en) * 2003-09-24 2006-04-11 3M Innovative Properties Company Apparatus and method for automated web inspection
US20050135667A1 (en) 2003-12-22 2005-06-23 Abb Oy. Method and apparatus for labeling images and creating training material
US7545985B2 (en) * 2005-01-04 2009-06-09 Microsoft Corporation Method and system for learning-based quality assessment of images
JP4639858B2 (ja) * 2005-03-07 2011-02-23 Ｊｆｅスチール株式会社 表面欠陥検査方法及びその装置
JP2008175588A (ja) * 2007-01-16 2008-07-31 Kagawa Univ 外観検査装置
JP5022174B2 (ja) * 2007-10-22 2012-09-12 株式会社日立製作所 欠陥分類方法及びその装置
JP4629118B2 (ja) * 2008-03-03 2011-02-09 株式会社日立ハイテクノロジーズ 欠陥検査装置およびこの欠陥検査装置に用いるパラメータ調整方法。
US7937233B2 (en) * 2008-04-17 2011-05-03 3M Innovative Properties Company Preferential defect marking on a web
JP5255953B2 (ja) * 2008-08-28 2013-08-07 株式会社日立ハイテクノロジーズ 欠陥検査方法及び装置
JP5414416B2 (ja) * 2008-09-24 2014-02-12 キヤノン株式会社 情報処理装置及び方法
WO2010059679A2 (en) 2008-11-19 2010-05-27 3M Innovative Properties Company Constructing enhanced hybrid classifiers from parametric classifier families using receiver operating characteristics
JP5294114B2 (ja) * 2009-01-26 2013-09-18 株式会社メガオプト 光学モジュール

Also Published As

Publication number Publication date
CN103221807A (zh) 2013-07-24
US20130236082A1 (en) 2013-09-12
WO2012064522A1 (en) 2012-05-18
EP2638384A4 (en) 2017-04-19
US9031312B2 (en) 2015-05-12
KR20130141584A (ko) 2013-12-26
JP5912125B2 (ja) 2016-04-27
KR101800058B1 (ko) 2017-11-21
JP2013545979A (ja) 2013-12-26
SG190143A1 (en) 2013-07-31
CN103221807B (zh) 2015-08-12
EP2638384A1 (en) 2013-09-18

Similar Documents

Publication Publication Date Title
BR112013011107A2 (pt) ''processamento e detecção rápidos de não uniformidades em materiais á base de manta''
BRPI0916189A2 (pt) resfriamento e processamento de materiais
GB2457375B (en) Scanned laser detection and ranging apparatus
BR112013008307A2 (pt) plotagem contínua de severidade de não-uniformidade para detecção de variabilidade em materiais à base de manta
BRPI0817321A2 (pt) artigos preparados usando materiais reciclados e métodos de preparação dos mesmos
ZA201105220B (en) Optically active materials and articles and systems in which they may be used
BR112012025259A2 (pt) "equipamento sensor, item de vestimenta, método e programa de computador"
BRPI0716300A2 (pt) Artigo e mistura
PL2689908T3 (pl) Urządzenie i sposób obróbki materiału z tworzywa sztucznego
HK1176646A1 (en) Methods for the detection of biologically relevant molecules and their interaction characteristics
FI20085986A (fi) Objektien ilmaiseminen ja seuraaminen digitaalisissa kuvissa
BRPI0820812A2 (pt) Sistema e métodos de entrega de material
PL2589954T3 (pl) Urządzenie do wykrywania przedmiotów i sposób ich wykrywania
BRPI1008427A2 (pt) produtos compreendendo amidas de aminoácidos n-fenilpropenoíla e uso das mesmas
IT1403497B1 (it) "dispositivo di rilevamento per contenitori in movimento"
BRPI0908259A2 (pt) Materiais biológicos e usos dos mesmos
PL2589955T3 (pl) Urządzenie do wykrywania przedmiotu i sposób do tego
BR112013004664A2 (pt) ''laminados de segurança e métodos para autenticar um artigo''
IT1401531B1 (it) Sistema utilizzabile in due modalita'
EP2722663A4 (en) SENSOR CHIP FOR USE IN A SAMPLE DETECTION DEVICE AND SAMPLE RECEPTION DEVICE WITH THE SENSOR CHIP
DK2168714T3 (da) Fremførings- og bearbejdningsindretning
SI2580042T1 (sl) Naparava za obdelavo materiala z mešanjem in/ali plastificiranjem
ITMI20080607A1 (it) Dispositivo e procedimento di analisi di difetti, particolarmente per oggetti in materia plastica.
BRPI1010666A2 (pt) peptídeos de cdc45l e vacinas incluindo dos mesmos
BR112014012888A2 (pt) dispositivo e método para processamento de materiais

Legal Events

Date Code Title Description
B06F Objections, documents and/or translations needed after an examination request according [chapter 6.6 patent gazette]
B08F Application dismissed because of non-payment of annual fees [chapter 8.6 patent gazette]

Free format text: REFERENTE A 8A ANUIDADE.

B08K Patent lapsed as no evidence of payment of the annual fee has been furnished to inpi [chapter 8.11 patent gazette]

Free format text: EM VIRTUDE DO ARQUIVAMENTO PUBLICADO NA RPI 2537 DE 20-08-2019 E CONSIDERANDO AUSENCIA DE MANIFESTACAO DENTRO DOS PRAZOS LEGAIS, INFORMO QUE CABE SER MANTIDO O ARQUIVAMENTO DO PEDIDO DE PATENTE, CONFORME O DISPOSTO NO ARTIGO 12, DA RESOLUCAO 113/2013.