BR0116192A - Aparelho e método para aquisição de imagens de raio-x fora de eixo e método para aquisição simult nea de um conjunto de imagens de raio-x fora de eixo - Google Patents
Aparelho e método para aquisição de imagens de raio-x fora de eixo e método para aquisição simult nea de um conjunto de imagens de raio-x fora de eixoInfo
- Publication number
- BR0116192A BR0116192A BR0116192-0A BR0116192A BR0116192A BR 0116192 A BR0116192 A BR 0116192A BR 0116192 A BR0116192 A BR 0116192A BR 0116192 A BR0116192 A BR 0116192A
- Authority
- BR
- Brazil
- Prior art keywords
- axis
- interest
- regions
- ray
- image set
- Prior art date
Links
Classifications
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
- G01N23/02—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material
- G01N23/04—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and forming images of the material
- G01N23/044—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and forming images of the material using laminography or tomosynthesis
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
- G01N23/02—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material
- G01N23/06—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and measuring the absorption
- G01N23/083—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and measuring the absorption the radiation being X-rays
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
- G01N23/02—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material
- G01N23/04—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and forming images of the material
- G01N23/046—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and forming images of the material using tomography, e.g. computed tomography [CT]
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N2223/00—Investigating materials by wave or particle radiation
- G01N2223/40—Imaging
- G01N2223/419—Imaging computed tomograph
Landscapes
- Health & Medical Sciences (AREA)
- General Physics & Mathematics (AREA)
- Immunology (AREA)
- General Health & Medical Sciences (AREA)
- Pathology (AREA)
- Biochemistry (AREA)
- Physics & Mathematics (AREA)
- Life Sciences & Earth Sciences (AREA)
- Chemical & Material Sciences (AREA)
- Analytical Chemistry (AREA)
- Theoretical Computer Science (AREA)
- Pulmonology (AREA)
- Engineering & Computer Science (AREA)
- Nuclear Medicine, Radiotherapy & Molecular Imaging (AREA)
- Radiology & Medical Imaging (AREA)
- Toxicology (AREA)
- Analysing Materials By The Use Of Radiation (AREA)
- Apparatus For Radiation Diagnosis (AREA)
- Image Processing (AREA)
- Prostheses (AREA)
- External Artificial Organs (AREA)
- Control Of Motors That Do Not Use Commutators (AREA)
- Preparation Of Compounds By Using Micro-Organisms (AREA)
- Pyrane Compounds (AREA)
Abstract
"APARELHO E MéTODO PARA AQUISIçãO DE IMAGENS DE RAIO-X FORA DE EIXO E MéTODO PARA AQUISIçãO SIMULT NEA DE UM CONJUNTO DE IMAGENS DE RAIO-X FORA DE EIXO". A presente invenção está direcionada a um aparelho e método para aquisição de imagens de raios-X fora de eixo de um conjunto de regiões de interesse. O aparelho inclui uma fonte produzindo um feixe de radiação, uma superfície para suportar pelo menos um subconjunto do conjunto de regiões de interesse, e um detector de raios-X localizado de forma a receber simultaneamente partes do feixe que passaram através do subconjunto do conjunto de regiões de interesse. O detector de raios-X produz a partir das partes recebidas do feixe uma representação eletrónica de uma imagem para cada região de interesse dentro do subconjunto do conjunto de regiões de interesse. Qualquer combinação de fonte, superfície e detector pode ser movimentável para posicionar as regiões de interesse dentro do feixe.
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US09/731,335 US6748046B2 (en) | 2000-12-06 | 2000-12-06 | Off-center tomosynthesis |
PCT/US2001/047540 WO2002046729A1 (en) | 2000-12-06 | 2001-12-05 | Off-center tomosynthesis |
Publications (1)
Publication Number | Publication Date |
---|---|
BR0116192A true BR0116192A (pt) | 2004-01-13 |
Family
ID=24939067
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
BR0116192-0A BR0116192A (pt) | 2000-12-06 | 2001-12-05 | Aparelho e método para aquisição de imagens de raio-x fora de eixo e método para aquisição simult nea de um conjunto de imagens de raio-x fora de eixo |
Country Status (13)
Country | Link |
---|---|
US (1) | US6748046B2 (pt) |
EP (1) | EP1350088B1 (pt) |
JP (2) | JP2004515762A (pt) |
KR (2) | KR20080074986A (pt) |
CN (1) | CN100465629C (pt) |
AT (1) | ATE498124T1 (pt) |
AU (1) | AU2002226058A1 (pt) |
BR (1) | BR0116192A (pt) |
CA (1) | CA2441881A1 (pt) |
DE (1) | DE60144026D1 (pt) |
MX (1) | MXPA03004979A (pt) |
TW (1) | TW573118B (pt) |
WO (1) | WO2002046729A1 (pt) |
Families Citing this family (37)
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US10638994B2 (en) | 2002-11-27 | 2020-05-05 | Hologic, Inc. | X-ray mammography with tomosynthesis |
US7110490B2 (en) * | 2002-12-10 | 2006-09-19 | General Electric Company | Full field digital tomosynthesis method and apparatus |
US20050041746A1 (en) * | 2003-08-04 | 2005-02-24 | Lowell Rosen | Software-defined wideband holographic communications apparatus and methods |
JP4603823B2 (ja) * | 2003-10-14 | 2010-12-22 | キヤノン株式会社 | 放射線撮像装置、放射線撮像方法及びプログラム |
JP4636500B2 (ja) * | 2005-03-28 | 2011-02-23 | 名古屋電機工業株式会社 | X線検査装置、x線検査方法およびx線検査プログラム |
US7245693B2 (en) * | 2005-06-02 | 2007-07-17 | Agilent Technologies, Inc. | X-ray inspection system having on-axis and off-axis sensors |
DE102005026578A1 (de) * | 2005-06-08 | 2006-12-21 | Comet Gmbh | Vorrichtung zur Röntgen-Laminographie und/oder Tomosynthese |
US20070009088A1 (en) * | 2005-07-06 | 2007-01-11 | Edic Peter M | System and method for imaging using distributed X-ray sources |
US7505554B2 (en) * | 2005-07-25 | 2009-03-17 | Digimd Corporation | Apparatus and methods of an X-ray and tomosynthesis and dual spectra machine |
US7302031B2 (en) * | 2005-10-27 | 2007-11-27 | Sectra Mamea Ab | Method and arrangement relating to X-ray imaging |
DE202005017496U1 (de) * | 2005-11-07 | 2007-03-15 | Comet Gmbh | Target für eine Mikrofocus- oder Nanofocus-Röntgenröhre |
US20070189460A1 (en) * | 2006-02-15 | 2007-08-16 | Buck Dean C | Precise x-ray inspection system |
US20080037703A1 (en) * | 2006-08-09 | 2008-02-14 | Digimd Corporation | Three dimensional breast imaging |
US20080089567A1 (en) * | 2006-10-11 | 2008-04-17 | Eliasson Tracy K | Artifact reduction in an x-ray imaging system |
US7925074B2 (en) * | 2006-10-16 | 2011-04-12 | Teradyne, Inc. | Adaptive background propagation method and device therefor |
US20080247505A1 (en) * | 2007-04-07 | 2008-10-09 | Rohit Patnaik | Xray device for planar tomosynthesis |
US7529336B2 (en) | 2007-05-31 | 2009-05-05 | Test Research, Inc. | System and method for laminography inspection |
US8031929B2 (en) * | 2007-09-21 | 2011-10-04 | Teradyne, Inc. | X-ray inspection of solder reflow in high-density printed circuit board applications |
WO2009078415A1 (ja) * | 2007-12-17 | 2009-06-25 | Uni-Hite System Corporation | X線検査装置および方法 |
CN101960296B (zh) * | 2007-12-27 | 2012-12-12 | 欧姆龙株式会社 | X射线检查装置及x射线检查方法 |
US7819581B2 (en) * | 2008-02-29 | 2010-10-26 | Teradyne, Inc. | Method of and system for calibration of inspection systems producing X-ray images |
WO2009121051A2 (en) * | 2008-03-28 | 2009-10-01 | Nordson Corporation | X-ray inspection systems and methods |
DE102008046698A1 (de) * | 2008-09-10 | 2010-03-18 | Fraunhofer-Gesellschaft zur Förderung der angewandten Forschung e.V. | Verfahren und Röntgencomputertomograf zur zerstörungsfreien Prüfung von aus Materiallagen aufgebauten Objekten mittels Röntgencomputertomografie |
TWI394490B (zh) * | 2008-09-10 | 2013-04-21 | Omron Tateisi Electronics Co | X射線檢查裝置及x射線檢查方法 |
US7986764B2 (en) * | 2008-12-08 | 2011-07-26 | Morpho Detection, Inc. | X-ray laminography device, object imaging system, and method for operating a security system |
WO2010074030A1 (ja) * | 2008-12-22 | 2010-07-01 | オムロン株式会社 | X線検査方法およびx線検査装置 |
JP5177236B2 (ja) * | 2008-12-22 | 2013-04-03 | オムロン株式会社 | X線検査方法およびx線検査装置 |
US8515004B2 (en) * | 2009-01-16 | 2013-08-20 | Varian Medical Systems, Inc. | Real-time motion tracking using tomosynthesis |
CN101839871B (zh) * | 2010-05-18 | 2011-12-28 | 华南理工大学 | 一种x射线分层摄影检测方法与*** |
CN103278515A (zh) * | 2013-05-16 | 2013-09-04 | 华南理工大学 | 旋转式x射线分层摄影检测***与方法 |
EP3011266B1 (en) * | 2013-06-17 | 2022-04-13 | Hexagon Metrology, Inc | Method and apparatus of measuring objects using selective imaging |
US9642581B2 (en) * | 2013-11-12 | 2017-05-09 | KUB Technologies, Inc. | Specimen radiography with tomosynthesis in a cabinet |
US10488351B2 (en) | 2016-09-07 | 2019-11-26 | KUB Technologies, Inc. | Specimen radiography with tomosynthesis in a cabinet with geometric magnification |
US10830712B2 (en) * | 2017-03-27 | 2020-11-10 | KUB Technologies, Inc. | System and method for cabinet x-ray systems with camera |
JP6622260B2 (ja) * | 2017-07-07 | 2019-12-18 | 名古屋電機工業株式会社 | 3次元撮像装置、3次元撮像方法および3次元撮像プログラム |
EP3832689A3 (en) | 2019-12-05 | 2021-08-11 | Hologic, Inc. | Systems and methods for improved x-ray tube life |
US11471118B2 (en) | 2020-03-27 | 2022-10-18 | Hologic, Inc. | System and method for tracking x-ray tube focal spot position |
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US4688241A (en) * | 1984-03-26 | 1987-08-18 | Ridge, Inc. | Microfocus X-ray system |
US4926452A (en) * | 1987-10-30 | 1990-05-15 | Four Pi Systems Corporation | Automated laminography system for inspection of electronics |
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US5359637A (en) * | 1992-04-28 | 1994-10-25 | Wake Forest University | Self-calibrated tomosynthetic, radiographic-imaging system, method, and device |
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-
2000
- 2000-12-06 US US09/731,335 patent/US6748046B2/en not_active Expired - Fee Related
-
2001
- 2001-12-05 EP EP01995480A patent/EP1350088B1/en not_active Expired - Lifetime
- 2001-12-05 BR BR0116192-0A patent/BR0116192A/pt not_active IP Right Cessation
- 2001-12-05 WO PCT/US2001/047540 patent/WO2002046729A1/en active IP Right Grant
- 2001-12-05 CA CA002441881A patent/CA2441881A1/en not_active Abandoned
- 2001-12-05 JP JP2002548419A patent/JP2004515762A/ja active Pending
- 2001-12-05 AU AU2002226058A patent/AU2002226058A1/en not_active Abandoned
- 2001-12-05 MX MXPA03004979A patent/MXPA03004979A/es active IP Right Grant
- 2001-12-05 KR KR1020087014573A patent/KR20080074986A/ko active Search and Examination
- 2001-12-05 AT AT01995480T patent/ATE498124T1/de not_active IP Right Cessation
- 2001-12-05 CN CNB018201628A patent/CN100465629C/zh not_active Expired - Fee Related
- 2001-12-05 KR KR1020037007589A patent/KR100863975B1/ko not_active IP Right Cessation
- 2001-12-05 DE DE60144026T patent/DE60144026D1/de not_active Expired - Lifetime
-
2002
- 2002-10-08 TW TW091123171A patent/TW573118B/zh not_active IP Right Cessation
-
2006
- 2006-12-27 JP JP2006351449A patent/JP4619349B2/ja not_active Expired - Fee Related
Also Published As
Publication number | Publication date |
---|---|
EP1350088A4 (en) | 2006-05-03 |
US20030058983A1 (en) | 2003-03-27 |
KR100863975B1 (ko) | 2008-10-16 |
TW573118B (en) | 2004-01-21 |
JP2007127668A (ja) | 2007-05-24 |
WO2002046729A1 (en) | 2002-06-13 |
MXPA03004979A (es) | 2005-04-29 |
AU2002226058A1 (en) | 2002-06-18 |
JP2004515762A (ja) | 2004-05-27 |
CN1479868A (zh) | 2004-03-03 |
US6748046B2 (en) | 2004-06-08 |
CN100465629C (zh) | 2009-03-04 |
KR20030055340A (ko) | 2003-07-02 |
EP1350088A1 (en) | 2003-10-08 |
CA2441881A1 (en) | 2002-06-13 |
KR20080074986A (ko) | 2008-08-13 |
DE60144026D1 (en) | 2011-03-24 |
ATE498124T1 (de) | 2011-02-15 |
JP4619349B2 (ja) | 2011-01-26 |
EP1350088B1 (en) | 2011-02-09 |
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Legal Events
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B08F | Application dismissed because of non-payment of annual fees [chapter 8.6 patent gazette] |
Free format text: CONFORME ARTIGO 10O DA RESOLUCAO 124/06, CABE SER ARQUIVADO REFERENTE AO NAO RECOLHIMENTO DA 10A ANUIDADE. |
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B08K | Patent lapsed as no evidence of payment of the annual fee has been furnished to inpi [chapter 8.11 patent gazette] |
Free format text: REFERENTE AO DESPACHO 8.6 PUBLICADO NA RPI 2144 DE 07/02/2012. |