ATE498124T1 - Off-center-tomosynthese - Google Patents

Off-center-tomosynthese

Info

Publication number
ATE498124T1
ATE498124T1 AT01995480T AT01995480T ATE498124T1 AT E498124 T1 ATE498124 T1 AT E498124T1 AT 01995480 T AT01995480 T AT 01995480T AT 01995480 T AT01995480 T AT 01995480T AT E498124 T1 ATE498124 T1 AT E498124T1
Authority
AT
Austria
Prior art keywords
interest
regions
subset
tomosynthesis
center
Prior art date
Application number
AT01995480T
Other languages
English (en)
Inventor
Dale Thayer
Original Assignee
Teradyne Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Teradyne Inc filed Critical Teradyne Inc
Application granted granted Critical
Publication of ATE498124T1 publication Critical patent/ATE498124T1/de

Links

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/02Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material
    • G01N23/04Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and forming images of the material
    • G01N23/046Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and forming images of the material using tomography, e.g. computed tomography [CT]
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/02Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material
    • G01N23/06Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and measuring the absorption
    • G01N23/083Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and measuring the absorption the radiation being X-rays
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/02Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material
    • G01N23/04Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and forming images of the material
    • G01N23/044Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and forming images of the material using laminography or tomosynthesis
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2223/00Investigating materials by wave or particle radiation
    • G01N2223/40Imaging
    • G01N2223/419Imaging computed tomograph

Landscapes

  • Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • General Health & Medical Sciences (AREA)
  • Pathology (AREA)
  • Biochemistry (AREA)
  • Physics & Mathematics (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Theoretical Computer Science (AREA)
  • Pulmonology (AREA)
  • Engineering & Computer Science (AREA)
  • Nuclear Medicine, Radiotherapy & Molecular Imaging (AREA)
  • Radiology & Medical Imaging (AREA)
  • Toxicology (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)
  • Apparatus For Radiation Diagnosis (AREA)
  • Image Processing (AREA)
  • Prostheses (AREA)
  • External Artificial Organs (AREA)
  • Control Of Motors That Do Not Use Commutators (AREA)
  • Preparation Of Compounds By Using Micro-Organisms (AREA)
  • Pyrane Compounds (AREA)
AT01995480T 2000-12-06 2001-12-05 Off-center-tomosynthese ATE498124T1 (de)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US09/731,335 US6748046B2 (en) 2000-12-06 2000-12-06 Off-center tomosynthesis
PCT/US2001/047540 WO2002046729A1 (en) 2000-12-06 2001-12-05 Off-center tomosynthesis

Publications (1)

Publication Number Publication Date
ATE498124T1 true ATE498124T1 (de) 2011-02-15

Family

ID=24939067

Family Applications (1)

Application Number Title Priority Date Filing Date
AT01995480T ATE498124T1 (de) 2000-12-06 2001-12-05 Off-center-tomosynthese

Country Status (13)

Country Link
US (1) US6748046B2 (de)
EP (1) EP1350088B1 (de)
JP (2) JP2004515762A (de)
KR (2) KR20080074986A (de)
CN (1) CN100465629C (de)
AT (1) ATE498124T1 (de)
AU (1) AU2002226058A1 (de)
BR (1) BR0116192A (de)
CA (1) CA2441881A1 (de)
DE (1) DE60144026D1 (de)
MX (1) MXPA03004979A (de)
TW (1) TW573118B (de)
WO (1) WO2002046729A1 (de)

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US10638994B2 (en) 2002-11-27 2020-05-05 Hologic, Inc. X-ray mammography with tomosynthesis
US7110490B2 (en) * 2002-12-10 2006-09-19 General Electric Company Full field digital tomosynthesis method and apparatus
US20050041746A1 (en) * 2003-08-04 2005-02-24 Lowell Rosen Software-defined wideband holographic communications apparatus and methods
JP4603823B2 (ja) * 2003-10-14 2010-12-22 キヤノン株式会社 放射線撮像装置、放射線撮像方法及びプログラム
JP4636500B2 (ja) * 2005-03-28 2011-02-23 名古屋電機工業株式会社 X線検査装置、x線検査方法およびx線検査プログラム
US7245693B2 (en) * 2005-06-02 2007-07-17 Agilent Technologies, Inc. X-ray inspection system having on-axis and off-axis sensors
DE102005026578A1 (de) * 2005-06-08 2006-12-21 Comet Gmbh Vorrichtung zur Röntgen-Laminographie und/oder Tomosynthese
US20070009088A1 (en) * 2005-07-06 2007-01-11 Edic Peter M System and method for imaging using distributed X-ray sources
US7505554B2 (en) * 2005-07-25 2009-03-17 Digimd Corporation Apparatus and methods of an X-ray and tomosynthesis and dual spectra machine
US7302031B2 (en) * 2005-10-27 2007-11-27 Sectra Mamea Ab Method and arrangement relating to X-ray imaging
DE202005017496U1 (de) * 2005-11-07 2007-03-15 Comet Gmbh Target für eine Mikrofocus- oder Nanofocus-Röntgenröhre
US20070189460A1 (en) * 2006-02-15 2007-08-16 Buck Dean C Precise x-ray inspection system
US20080037703A1 (en) * 2006-08-09 2008-02-14 Digimd Corporation Three dimensional breast imaging
US20080089567A1 (en) * 2006-10-11 2008-04-17 Eliasson Tracy K Artifact reduction in an x-ray imaging system
US7925074B2 (en) * 2006-10-16 2011-04-12 Teradyne, Inc. Adaptive background propagation method and device therefor
US20080247505A1 (en) * 2007-04-07 2008-10-09 Rohit Patnaik Xray device for planar tomosynthesis
US7529336B2 (en) 2007-05-31 2009-05-05 Test Research, Inc. System and method for laminography inspection
US8031929B2 (en) * 2007-09-21 2011-10-04 Teradyne, Inc. X-ray inspection of solder reflow in high-density printed circuit board applications
WO2009078415A1 (ja) * 2007-12-17 2009-06-25 Uni-Hite System Corporation X線検査装置および方法
CN101960296B (zh) * 2007-12-27 2012-12-12 欧姆龙株式会社 X射线检查装置及x射线检查方法
US7819581B2 (en) * 2008-02-29 2010-10-26 Teradyne, Inc. Method of and system for calibration of inspection systems producing X-ray images
WO2009121051A2 (en) * 2008-03-28 2009-10-01 Nordson Corporation X-ray inspection systems and methods
DE102008046698A1 (de) * 2008-09-10 2010-03-18 Fraunhofer-Gesellschaft zur Förderung der angewandten Forschung e.V. Verfahren und Röntgencomputertomograf zur zerstörungsfreien Prüfung von aus Materiallagen aufgebauten Objekten mittels Röntgencomputertomografie
TWI394490B (zh) * 2008-09-10 2013-04-21 Omron Tateisi Electronics Co X射線檢查裝置及x射線檢查方法
US7986764B2 (en) * 2008-12-08 2011-07-26 Morpho Detection, Inc. X-ray laminography device, object imaging system, and method for operating a security system
WO2010074030A1 (ja) * 2008-12-22 2010-07-01 オムロン株式会社 X線検査方法およびx線検査装置
JP5177236B2 (ja) * 2008-12-22 2013-04-03 オムロン株式会社 X線検査方法およびx線検査装置
US8515004B2 (en) * 2009-01-16 2013-08-20 Varian Medical Systems, Inc. Real-time motion tracking using tomosynthesis
CN101839871B (zh) * 2010-05-18 2011-12-28 华南理工大学 一种x射线分层摄影检测方法与***
CN103278515A (zh) * 2013-05-16 2013-09-04 华南理工大学 旋转式x射线分层摄影检测***与方法
EP3011266B1 (de) * 2013-06-17 2022-04-13 Hexagon Metrology, Inc Verfahren und vorrichtung zur messung von objekten mittels selektiver bildgebung
US9642581B2 (en) * 2013-11-12 2017-05-09 KUB Technologies, Inc. Specimen radiography with tomosynthesis in a cabinet
US10488351B2 (en) 2016-09-07 2019-11-26 KUB Technologies, Inc. Specimen radiography with tomosynthesis in a cabinet with geometric magnification
US10830712B2 (en) * 2017-03-27 2020-11-10 KUB Technologies, Inc. System and method for cabinet x-ray systems with camera
JP6622260B2 (ja) * 2017-07-07 2019-12-18 名古屋電機工業株式会社 3次元撮像装置、3次元撮像方法および3次元撮像プログラム
EP3832689A3 (de) 2019-12-05 2021-08-11 Hologic, Inc. Systeme und verfahren für verbesserte röntgenröhrenlebensdauer
US11471118B2 (en) 2020-03-27 2022-10-18 Hologic, Inc. System and method for tracking x-ray tube focal spot position

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US5259012A (en) * 1990-08-30 1993-11-02 Four Pi Systems Corporation Laminography system and method with electromagnetically directed multipath radiation source
US5359637A (en) * 1992-04-28 1994-10-25 Wake Forest University Self-calibrated tomosynthetic, radiographic-imaging system, method, and device
DE4235183C2 (de) * 1992-10-19 1997-10-23 Fraunhofer Ges Forschung Verfahren zur Erzeugung von Schichtaufnahmen von einem Meßobjekt mittels Röntgenstrahlung
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KR100198515B1 (ko) * 1994-02-03 1999-06-15 토비 에취. 쿠스머 주사이미지의 질을 개선하기 위한 x선 단층촬영시스템과 방법
US5594770A (en) * 1994-11-18 1997-01-14 Thermospectra Corporation Method and apparatus for imaging obscured areas of a test object
US5687209A (en) * 1995-04-11 1997-11-11 Hewlett-Packard Co. Automatic warp compensation for laminographic circuit board inspection
US5583904A (en) * 1995-04-11 1996-12-10 Hewlett-Packard Co. Continuous linear scan laminography system and method
US5760403A (en) * 1996-04-18 1998-06-02 Loral Fairchild Corp. High modulation transfer function CCD X-ray image sensor apparatus and method
US5710063A (en) * 1996-06-06 1998-01-20 Sun Microsystems, Inc. Method for improving the alignment of holes with other elements on a printed circuit board
DE69739995D1 (de) * 1996-07-23 2010-10-28 Gen Hospital Corp Anordnung zur mammographie mittels tomosynthese
US6028910A (en) * 1998-01-19 2000-02-22 Foster-Miller, Inc. High resolution areal tomosynthesis
JP2000046760A (ja) * 1998-05-29 2000-02-18 Shimadzu Corp X線断層面検査装置
CN1240948A (zh) * 1998-07-03 2000-01-12 三星电子株式会社 利用层析x-射线照相***获取图像的方法
US6222902B1 (en) * 1998-11-25 2001-04-24 Picker International, Inc. Real-time tomographic system with flat panel detectors
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Also Published As

Publication number Publication date
EP1350088A4 (de) 2006-05-03
US20030058983A1 (en) 2003-03-27
KR100863975B1 (ko) 2008-10-16
TW573118B (en) 2004-01-21
JP2007127668A (ja) 2007-05-24
WO2002046729A1 (en) 2002-06-13
MXPA03004979A (es) 2005-04-29
AU2002226058A1 (en) 2002-06-18
JP2004515762A (ja) 2004-05-27
CN1479868A (zh) 2004-03-03
US6748046B2 (en) 2004-06-08
CN100465629C (zh) 2009-03-04
KR20030055340A (ko) 2003-07-02
EP1350088A1 (de) 2003-10-08
CA2441881A1 (en) 2002-06-13
KR20080074986A (ko) 2008-08-13
DE60144026D1 (en) 2011-03-24
JP4619349B2 (ja) 2011-01-26
EP1350088B1 (de) 2011-02-09
BR0116192A (pt) 2004-01-13

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