ATE498124T1 - Off-center-tomosynthese - Google Patents
Off-center-tomosyntheseInfo
- Publication number
- ATE498124T1 ATE498124T1 AT01995480T AT01995480T ATE498124T1 AT E498124 T1 ATE498124 T1 AT E498124T1 AT 01995480 T AT01995480 T AT 01995480T AT 01995480 T AT01995480 T AT 01995480T AT E498124 T1 ATE498124 T1 AT E498124T1
- Authority
- AT
- Austria
- Prior art keywords
- interest
- regions
- subset
- tomosynthesis
- center
- Prior art date
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
- G01N23/02—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material
- G01N23/04—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and forming images of the material
- G01N23/046—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and forming images of the material using tomography, e.g. computed tomography [CT]
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
- G01N23/02—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material
- G01N23/06—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and measuring the absorption
- G01N23/083—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and measuring the absorption the radiation being X-rays
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
- G01N23/02—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material
- G01N23/04—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and forming images of the material
- G01N23/044—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and forming images of the material using laminography or tomosynthesis
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N2223/00—Investigating materials by wave or particle radiation
- G01N2223/40—Imaging
- G01N2223/419—Imaging computed tomograph
Landscapes
- Health & Medical Sciences (AREA)
- General Physics & Mathematics (AREA)
- Immunology (AREA)
- General Health & Medical Sciences (AREA)
- Pathology (AREA)
- Biochemistry (AREA)
- Physics & Mathematics (AREA)
- Life Sciences & Earth Sciences (AREA)
- Chemical & Material Sciences (AREA)
- Analytical Chemistry (AREA)
- Theoretical Computer Science (AREA)
- Pulmonology (AREA)
- Engineering & Computer Science (AREA)
- Nuclear Medicine, Radiotherapy & Molecular Imaging (AREA)
- Radiology & Medical Imaging (AREA)
- Toxicology (AREA)
- Analysing Materials By The Use Of Radiation (AREA)
- Apparatus For Radiation Diagnosis (AREA)
- Image Processing (AREA)
- Prostheses (AREA)
- External Artificial Organs (AREA)
- Control Of Motors That Do Not Use Commutators (AREA)
- Preparation Of Compounds By Using Micro-Organisms (AREA)
- Pyrane Compounds (AREA)
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US09/731,335 US6748046B2 (en) | 2000-12-06 | 2000-12-06 | Off-center tomosynthesis |
PCT/US2001/047540 WO2002046729A1 (en) | 2000-12-06 | 2001-12-05 | Off-center tomosynthesis |
Publications (1)
Publication Number | Publication Date |
---|---|
ATE498124T1 true ATE498124T1 (de) | 2011-02-15 |
Family
ID=24939067
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
AT01995480T ATE498124T1 (de) | 2000-12-06 | 2001-12-05 | Off-center-tomosynthese |
Country Status (13)
Country | Link |
---|---|
US (1) | US6748046B2 (de) |
EP (1) | EP1350088B1 (de) |
JP (2) | JP2004515762A (de) |
KR (2) | KR20080074986A (de) |
CN (1) | CN100465629C (de) |
AT (1) | ATE498124T1 (de) |
AU (1) | AU2002226058A1 (de) |
BR (1) | BR0116192A (de) |
CA (1) | CA2441881A1 (de) |
DE (1) | DE60144026D1 (de) |
MX (1) | MXPA03004979A (de) |
TW (1) | TW573118B (de) |
WO (1) | WO2002046729A1 (de) |
Families Citing this family (37)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US10638994B2 (en) | 2002-11-27 | 2020-05-05 | Hologic, Inc. | X-ray mammography with tomosynthesis |
US7110490B2 (en) * | 2002-12-10 | 2006-09-19 | General Electric Company | Full field digital tomosynthesis method and apparatus |
US20050041746A1 (en) * | 2003-08-04 | 2005-02-24 | Lowell Rosen | Software-defined wideband holographic communications apparatus and methods |
JP4603823B2 (ja) * | 2003-10-14 | 2010-12-22 | キヤノン株式会社 | 放射線撮像装置、放射線撮像方法及びプログラム |
JP4636500B2 (ja) * | 2005-03-28 | 2011-02-23 | 名古屋電機工業株式会社 | X線検査装置、x線検査方法およびx線検査プログラム |
US7245693B2 (en) * | 2005-06-02 | 2007-07-17 | Agilent Technologies, Inc. | X-ray inspection system having on-axis and off-axis sensors |
DE102005026578A1 (de) * | 2005-06-08 | 2006-12-21 | Comet Gmbh | Vorrichtung zur Röntgen-Laminographie und/oder Tomosynthese |
US20070009088A1 (en) * | 2005-07-06 | 2007-01-11 | Edic Peter M | System and method for imaging using distributed X-ray sources |
US7505554B2 (en) * | 2005-07-25 | 2009-03-17 | Digimd Corporation | Apparatus and methods of an X-ray and tomosynthesis and dual spectra machine |
US7302031B2 (en) * | 2005-10-27 | 2007-11-27 | Sectra Mamea Ab | Method and arrangement relating to X-ray imaging |
DE202005017496U1 (de) * | 2005-11-07 | 2007-03-15 | Comet Gmbh | Target für eine Mikrofocus- oder Nanofocus-Röntgenröhre |
US20070189460A1 (en) * | 2006-02-15 | 2007-08-16 | Buck Dean C | Precise x-ray inspection system |
US20080037703A1 (en) * | 2006-08-09 | 2008-02-14 | Digimd Corporation | Three dimensional breast imaging |
US20080089567A1 (en) * | 2006-10-11 | 2008-04-17 | Eliasson Tracy K | Artifact reduction in an x-ray imaging system |
US7925074B2 (en) * | 2006-10-16 | 2011-04-12 | Teradyne, Inc. | Adaptive background propagation method and device therefor |
US20080247505A1 (en) * | 2007-04-07 | 2008-10-09 | Rohit Patnaik | Xray device for planar tomosynthesis |
US7529336B2 (en) | 2007-05-31 | 2009-05-05 | Test Research, Inc. | System and method for laminography inspection |
US8031929B2 (en) * | 2007-09-21 | 2011-10-04 | Teradyne, Inc. | X-ray inspection of solder reflow in high-density printed circuit board applications |
WO2009078415A1 (ja) * | 2007-12-17 | 2009-06-25 | Uni-Hite System Corporation | X線検査装置および方法 |
CN101960296B (zh) * | 2007-12-27 | 2012-12-12 | 欧姆龙株式会社 | X射线检查装置及x射线检查方法 |
US7819581B2 (en) * | 2008-02-29 | 2010-10-26 | Teradyne, Inc. | Method of and system for calibration of inspection systems producing X-ray images |
WO2009121051A2 (en) * | 2008-03-28 | 2009-10-01 | Nordson Corporation | X-ray inspection systems and methods |
DE102008046698A1 (de) * | 2008-09-10 | 2010-03-18 | Fraunhofer-Gesellschaft zur Förderung der angewandten Forschung e.V. | Verfahren und Röntgencomputertomograf zur zerstörungsfreien Prüfung von aus Materiallagen aufgebauten Objekten mittels Röntgencomputertomografie |
TWI394490B (zh) * | 2008-09-10 | 2013-04-21 | Omron Tateisi Electronics Co | X射線檢查裝置及x射線檢查方法 |
US7986764B2 (en) * | 2008-12-08 | 2011-07-26 | Morpho Detection, Inc. | X-ray laminography device, object imaging system, and method for operating a security system |
WO2010074030A1 (ja) * | 2008-12-22 | 2010-07-01 | オムロン株式会社 | X線検査方法およびx線検査装置 |
JP5177236B2 (ja) * | 2008-12-22 | 2013-04-03 | オムロン株式会社 | X線検査方法およびx線検査装置 |
US8515004B2 (en) * | 2009-01-16 | 2013-08-20 | Varian Medical Systems, Inc. | Real-time motion tracking using tomosynthesis |
CN101839871B (zh) * | 2010-05-18 | 2011-12-28 | 华南理工大学 | 一种x射线分层摄影检测方法与*** |
CN103278515A (zh) * | 2013-05-16 | 2013-09-04 | 华南理工大学 | 旋转式x射线分层摄影检测***与方法 |
EP3011266B1 (de) * | 2013-06-17 | 2022-04-13 | Hexagon Metrology, Inc | Verfahren und vorrichtung zur messung von objekten mittels selektiver bildgebung |
US9642581B2 (en) * | 2013-11-12 | 2017-05-09 | KUB Technologies, Inc. | Specimen radiography with tomosynthesis in a cabinet |
US10488351B2 (en) | 2016-09-07 | 2019-11-26 | KUB Technologies, Inc. | Specimen radiography with tomosynthesis in a cabinet with geometric magnification |
US10830712B2 (en) * | 2017-03-27 | 2020-11-10 | KUB Technologies, Inc. | System and method for cabinet x-ray systems with camera |
JP6622260B2 (ja) * | 2017-07-07 | 2019-12-18 | 名古屋電機工業株式会社 | 3次元撮像装置、3次元撮像方法および3次元撮像プログラム |
EP3832689A3 (de) | 2019-12-05 | 2021-08-11 | Hologic, Inc. | Systeme und verfahren für verbesserte röntgenröhrenlebensdauer |
US11471118B2 (en) | 2020-03-27 | 2022-10-18 | Hologic, Inc. | System and method for tracking x-ray tube focal spot position |
Family Cites Families (19)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US4688241A (en) * | 1984-03-26 | 1987-08-18 | Ridge, Inc. | Microfocus X-ray system |
US4926452A (en) * | 1987-10-30 | 1990-05-15 | Four Pi Systems Corporation | Automated laminography system for inspection of electronics |
US5259012A (en) * | 1990-08-30 | 1993-11-02 | Four Pi Systems Corporation | Laminography system and method with electromagnetically directed multipath radiation source |
US5359637A (en) * | 1992-04-28 | 1994-10-25 | Wake Forest University | Self-calibrated tomosynthetic, radiographic-imaging system, method, and device |
DE4235183C2 (de) * | 1992-10-19 | 1997-10-23 | Fraunhofer Ges Forschung | Verfahren zur Erzeugung von Schichtaufnahmen von einem Meßobjekt mittels Röntgenstrahlung |
CA2113752C (en) * | 1994-01-19 | 1999-03-02 | Stephen Michael Rooks | Inspection system for cross-sectional imaging |
KR100198515B1 (ko) * | 1994-02-03 | 1999-06-15 | 토비 에취. 쿠스머 | 주사이미지의 질을 개선하기 위한 x선 단층촬영시스템과 방법 |
US5594770A (en) * | 1994-11-18 | 1997-01-14 | Thermospectra Corporation | Method and apparatus for imaging obscured areas of a test object |
US5687209A (en) * | 1995-04-11 | 1997-11-11 | Hewlett-Packard Co. | Automatic warp compensation for laminographic circuit board inspection |
US5583904A (en) * | 1995-04-11 | 1996-12-10 | Hewlett-Packard Co. | Continuous linear scan laminography system and method |
US5760403A (en) * | 1996-04-18 | 1998-06-02 | Loral Fairchild Corp. | High modulation transfer function CCD X-ray image sensor apparatus and method |
US5710063A (en) * | 1996-06-06 | 1998-01-20 | Sun Microsystems, Inc. | Method for improving the alignment of holes with other elements on a printed circuit board |
DE69739995D1 (de) * | 1996-07-23 | 2010-10-28 | Gen Hospital Corp | Anordnung zur mammographie mittels tomosynthese |
US6028910A (en) * | 1998-01-19 | 2000-02-22 | Foster-Miller, Inc. | High resolution areal tomosynthesis |
JP2000046760A (ja) * | 1998-05-29 | 2000-02-18 | Shimadzu Corp | X線断層面検査装置 |
CN1240948A (zh) * | 1998-07-03 | 2000-01-12 | 三星电子株式会社 | 利用层析x-射线照相***获取图像的方法 |
US6222902B1 (en) * | 1998-11-25 | 2001-04-24 | Picker International, Inc. | Real-time tomographic system with flat panel detectors |
JP3559952B2 (ja) * | 1998-12-18 | 2004-09-02 | 松下電器産業株式会社 | X線受像装置 |
US6324249B1 (en) * | 2001-03-21 | 2001-11-27 | Agilent Technologies, Inc. | Electronic planar laminography system and method |
-
2000
- 2000-12-06 US US09/731,335 patent/US6748046B2/en not_active Expired - Fee Related
-
2001
- 2001-12-05 EP EP01995480A patent/EP1350088B1/de not_active Expired - Lifetime
- 2001-12-05 BR BR0116192-0A patent/BR0116192A/pt not_active IP Right Cessation
- 2001-12-05 WO PCT/US2001/047540 patent/WO2002046729A1/en active IP Right Grant
- 2001-12-05 CA CA002441881A patent/CA2441881A1/en not_active Abandoned
- 2001-12-05 JP JP2002548419A patent/JP2004515762A/ja active Pending
- 2001-12-05 AU AU2002226058A patent/AU2002226058A1/en not_active Abandoned
- 2001-12-05 MX MXPA03004979A patent/MXPA03004979A/es active IP Right Grant
- 2001-12-05 KR KR1020087014573A patent/KR20080074986A/ko active Search and Examination
- 2001-12-05 AT AT01995480T patent/ATE498124T1/de not_active IP Right Cessation
- 2001-12-05 CN CNB018201628A patent/CN100465629C/zh not_active Expired - Fee Related
- 2001-12-05 KR KR1020037007589A patent/KR100863975B1/ko not_active IP Right Cessation
- 2001-12-05 DE DE60144026T patent/DE60144026D1/de not_active Expired - Lifetime
-
2002
- 2002-10-08 TW TW091123171A patent/TW573118B/zh not_active IP Right Cessation
-
2006
- 2006-12-27 JP JP2006351449A patent/JP4619349B2/ja not_active Expired - Fee Related
Also Published As
Publication number | Publication date |
---|---|
EP1350088A4 (de) | 2006-05-03 |
US20030058983A1 (en) | 2003-03-27 |
KR100863975B1 (ko) | 2008-10-16 |
TW573118B (en) | 2004-01-21 |
JP2007127668A (ja) | 2007-05-24 |
WO2002046729A1 (en) | 2002-06-13 |
MXPA03004979A (es) | 2005-04-29 |
AU2002226058A1 (en) | 2002-06-18 |
JP2004515762A (ja) | 2004-05-27 |
CN1479868A (zh) | 2004-03-03 |
US6748046B2 (en) | 2004-06-08 |
CN100465629C (zh) | 2009-03-04 |
KR20030055340A (ko) | 2003-07-02 |
EP1350088A1 (de) | 2003-10-08 |
CA2441881A1 (en) | 2002-06-13 |
KR20080074986A (ko) | 2008-08-13 |
DE60144026D1 (en) | 2011-03-24 |
JP4619349B2 (ja) | 2011-01-26 |
EP1350088B1 (de) | 2011-02-09 |
BR0116192A (pt) | 2004-01-13 |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
RER | Ceased as to paragraph 5 lit. 3 law introducing patent treaties |