BE689412A - - Google Patents
Info
- Publication number
- BE689412A BE689412A BE689412DA BE689412A BE 689412 A BE689412 A BE 689412A BE 689412D A BE689412D A BE 689412DA BE 689412 A BE689412 A BE 689412A
- Authority
- BE
- Belgium
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01M—TESTING STATIC OR DYNAMIC BALANCE OF MACHINES OR STRUCTURES; TESTING OF STRUCTURES OR APPARATUS, NOT OTHERWISE PROVIDED FOR
- G01M99/00—Subject matter not provided for in other groups of this subclass
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N27/00—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means
- G01N27/02—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating impedance
- G01N27/04—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating impedance by investigating resistance
- G01N27/20—Investigating the presence of flaws
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/2801—Testing of printed circuits, backplanes, motherboards, hybrid circuits or carriers for multichip packages [MCP]
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/2851—Testing of integrated circuits [IC]
- G01R31/2853—Electrical testing of internal connections or -isolation, e.g. latch-up or chip-to-lead connections
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/2851—Testing of integrated circuits [IC]
- G01R31/2886—Features relating to contacting the IC under test, e.g. probe heads; chucks
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/50—Testing of electric apparatus, lines, cables or components for short-circuits, continuity, leakage current or incorrect line connections
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/50—Testing of electric apparatus, lines, cables or components for short-circuits, continuity, leakage current or incorrect line connections
- G01R31/52—Testing for short-circuits, leakage current or ground faults
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/50—Testing of electric apparatus, lines, cables or components for short-circuits, continuity, leakage current or incorrect line connections
- G01R31/54—Testing for continuity
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- H—ELECTRICITY
- H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
- H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
- H05K13/00—Apparatus or processes specially adapted for manufacturing or adjusting assemblages of electric components
- H05K13/0015—Orientation; Alignment; Positioning
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Engineering & Computer Science (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Computer Hardware Design (AREA)
- General Engineering & Computer Science (AREA)
- Chemical & Material Sciences (AREA)
- Electrochemistry (AREA)
- Chemical Kinetics & Catalysis (AREA)
- Health & Medical Sciences (AREA)
- Life Sciences & Earth Sciences (AREA)
- Analytical Chemistry (AREA)
- Biochemistry (AREA)
- General Health & Medical Sciences (AREA)
- Immunology (AREA)
- Pathology (AREA)
- Manufacturing & Machinery (AREA)
- Testing Of Individual Semiconductor Devices (AREA)
- Testing Relating To Insulation (AREA)
Applications Claiming Priority (3)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US50783365A | 1965-11-15 | 1965-11-15 | |
US507848A US3413839A (en) | 1965-11-15 | 1965-11-15 | Method of and apparatus for mechanically testing the quality of bonded joints |
US544993A US3371780A (en) | 1966-04-25 | 1966-04-25 | Apparatus for mechanically and electrically testing the quality of bonded joints |
Publications (1)
Publication Number | Publication Date |
---|---|
BE689412A true BE689412A (ja) | 1967-04-14 |
Family
ID=27414359
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
BE689412D BE689412A (ja) | 1965-11-15 | 1966-11-08 |
Country Status (5)
Country | Link |
---|---|
BE (1) | BE689412A (ja) |
CH (1) | CH470671A (ja) |
FR (1) | FR1498864A (ja) |
GB (1) | GB1159456A (ja) |
SE (1) | SE331716B (ja) |
Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
FR2172399A1 (ja) * | 1972-02-17 | 1973-09-28 | Bunker Ramo | |
CN111398790A (zh) * | 2020-04-29 | 2020-07-10 | 苏州创瑞机电科技有限公司 | 光学芯片模组测试装置 |
Families Citing this family (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
FR2471601A1 (fr) * | 1979-12-14 | 1981-06-19 | Commissariat Energie Atomique | Procede et dispositif de controle non destructif des soudures par points |
US5349869A (en) * | 1993-04-05 | 1994-09-27 | General Electric Company | Welded nickel alloy double-cantilever beam crack growth sensor and method for its fabrication |
-
1966
- 1966-11-02 FR FR8113A patent/FR1498864A/fr not_active Expired
- 1966-11-08 BE BE689412D patent/BE689412A/xx unknown
- 1966-11-11 CH CH1629666A patent/CH470671A/de not_active IP Right Cessation
- 1966-11-15 SE SE15631/66A patent/SE331716B/xx unknown
-
1968
- 1968-11-09 GB GB50092/66A patent/GB1159456A/en not_active Expired
Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
FR2172399A1 (ja) * | 1972-02-17 | 1973-09-28 | Bunker Ramo | |
CN111398790A (zh) * | 2020-04-29 | 2020-07-10 | 苏州创瑞机电科技有限公司 | 光学芯片模组测试装置 |
Also Published As
Publication number | Publication date |
---|---|
FR1498864A (fr) | 1967-10-20 |
SE331716B (ja) | 1971-01-11 |
CH470671A (de) | 1969-05-14 |
GB1159456A (en) | 1969-07-23 |
DE1640492B1 (de) | 1971-02-04 |