AU6750900A - Controlled compliance fine pitch interconnect - Google Patents
Controlled compliance fine pitch interconnectInfo
- Publication number
- AU6750900A AU6750900A AU67509/00A AU6750900A AU6750900A AU 6750900 A AU6750900 A AU 6750900A AU 67509/00 A AU67509/00 A AU 67509/00A AU 6750900 A AU6750900 A AU 6750900A AU 6750900 A AU6750900 A AU 6750900A
- Authority
- AU
- Australia
- Prior art keywords
- fine pitch
- controlled compliance
- pitch interconnect
- compliance fine
- interconnect
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Abandoned
Links
Classifications
-
- H—ELECTRICITY
- H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
- H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
- H05K3/00—Apparatus or processes for manufacturing printed circuits
- H05K3/30—Assembling printed circuits with electric components, e.g. with resistor
- H05K3/32—Assembling printed circuits with electric components, e.g. with resistor electrically connecting electric components or wires to printed circuits
- H05K3/325—Assembling printed circuits with electric components, e.g. with resistor electrically connecting electric components or wires to printed circuits by abutting or pinching, i.e. without alloying process; mechanical auxiliary parts therefor
- H05K3/326—Assembling printed circuits with electric components, e.g. with resistor electrically connecting electric components or wires to printed circuits by abutting or pinching, i.e. without alloying process; mechanical auxiliary parts therefor the printed circuit having integral resilient or deformable parts, e.g. tabs or parts of flexible circuits
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
- G01R1/02—General constructional details
- G01R1/06—Measuring leads; Measuring probes
- G01R1/067—Measuring probes
- G01R1/073—Multiple probes
- G01R1/07307—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card
- G01R1/0735—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card arranged on a flexible frame or film
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
- G01R1/02—General constructional details
- G01R1/06—Measuring leads; Measuring probes
- G01R1/067—Measuring probes
- G01R1/06711—Probe needles; Cantilever beams; "Bump" contacts; Replaceable probe pins
- G01R1/06733—Geometry aspects
- G01R1/06738—Geometry aspects related to tip portion
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01R—ELECTRICALLY-CONDUCTIVE CONNECTIONS; STRUCTURAL ASSOCIATIONS OF A PLURALITY OF MUTUALLY-INSULATED ELECTRICAL CONNECTING ELEMENTS; COUPLING DEVICES; CURRENT COLLECTORS
- H01R12/00—Structural associations of a plurality of mutually-insulated electrical connecting elements, specially adapted for printed circuits, e.g. printed circuit boards [PCB], flat or ribbon cables, or like generally planar structures, e.g. terminal strips, terminal blocks; Coupling devices specially adapted for printed circuits, flat or ribbon cables, or like generally planar structures; Terminals specially adapted for contact with, or insertion into, printed circuits, flat or ribbon cables, or like generally planar structures
- H01R12/50—Fixed connections
- H01R12/51—Fixed connections for rigid printed circuits or like structures
- H01R12/52—Fixed connections for rigid printed circuits or like structures connecting to other rigid printed circuits or like structures
- H01R12/523—Fixed connections for rigid printed circuits or like structures connecting to other rigid printed circuits or like structures by an interconnection through aligned holes in the boards or multilayer board
Landscapes
- Engineering & Computer Science (AREA)
- Metallurgy (AREA)
- Manufacturing & Machinery (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Measuring Leads Or Probes (AREA)
- Connecting Device With Holders (AREA)
- Testing Or Measuring Of Semiconductors Or The Like (AREA)
- Wire Bonding (AREA)
- Testing Of Short-Circuits, Discontinuities, Leakage, Or Incorrect Line Connections (AREA)
Applications Claiming Priority (3)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US14682599P | 1999-08-02 | 1999-08-02 | |
US60146825 | 1999-08-02 | ||
PCT/US2000/020748 WO2001009980A2 (en) | 1999-08-02 | 2000-07-31 | Controlled compliance fine pitch interconnect |
Publications (1)
Publication Number | Publication Date |
---|---|
AU6750900A true AU6750900A (en) | 2001-02-19 |
Family
ID=22519150
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
AU67509/00A Abandoned AU6750900A (en) | 1999-08-02 | 2000-07-31 | Controlled compliance fine pitch interconnect |
Country Status (4)
Country | Link |
---|---|
EP (1) | EP1204988A2 (en) |
JP (1) | JP2003506833A (en) |
AU (1) | AU6750900A (en) |
WO (1) | WO2001009980A2 (en) |
Families Citing this family (11)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US6409521B1 (en) | 1997-05-06 | 2002-06-25 | Gryphics, Inc. | Multi-mode compliant connector and replaceable chip module utilizing the same |
DE60016563T2 (en) | 1999-02-02 | 2005-05-12 | Gryphics, Inc., Plymouth | CONNECTORS WITH LOW OR LOW MOUNTING POWER FOR PCB AND ELECTRICAL DEVICES |
US6830460B1 (en) | 1999-08-02 | 2004-12-14 | Gryphics, Inc. | Controlled compliance fine pitch interconnect |
US6957963B2 (en) | 2000-01-20 | 2005-10-25 | Gryphics, Inc. | Compliant interconnect assembly |
JP2003315361A (en) * | 2002-04-26 | 2003-11-06 | Japan Electronic Materials Corp | Manufacturing method of probe, mask for manufacturing probe and probe |
WO2005008838A1 (en) | 2003-07-07 | 2005-01-27 | Gryphics, Inc. | Normally closed zero insertion force connector |
DE102004027886A1 (en) * | 2004-05-28 | 2005-12-22 | Feinmetall Gmbh | Test device for electrical testing of a test specimen and method for producing a test device |
JP4838658B2 (en) * | 2006-08-01 | 2011-12-14 | 日本電産リード株式会社 | Substrate inspection jig and electrode structure of substrate inspection jig |
JP2010145381A (en) * | 2008-12-22 | 2010-07-01 | Nippon Mektron Ltd | Substrate inspection apparatus, and method of manufacturing inspection jig |
JP2013002976A (en) * | 2011-06-17 | 2013-01-07 | Hioki Ee Corp | Probe unit, circuit board inspection device and probe unit manufacturing method |
KR20140020627A (en) * | 2012-08-10 | 2014-02-19 | 삼성전기주식회사 | Method of manufacturing for electric inspection jig |
Family Cites Families (16)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
ZA773036B (en) * | 1977-05-23 | 1978-08-30 | L Mei | Elastomeric electrical contact |
JPS61118977A (en) * | 1984-11-13 | 1986-06-06 | シチズン時計株式会社 | Multi-electrode connector construction |
US4859189A (en) * | 1987-09-25 | 1989-08-22 | Minnesota Mining And Manufacturing Company | Multipurpose socket |
KR100196195B1 (en) * | 1991-11-18 | 1999-06-15 | 이노우에 쥰이치 | Probe card |
US5252916A (en) * | 1992-01-27 | 1993-10-12 | Everett Charles Technologies, Inc. | Pneumatic test fixture with springless test probes |
US5521519A (en) * | 1992-07-30 | 1996-05-28 | International Business Machines Corporation | Spring probe with piloted and headed contact and method of tip formation |
JP2532331B2 (en) * | 1992-11-09 | 1996-09-11 | 日本発条株式会社 | Conductive contact |
US5299090A (en) * | 1993-06-29 | 1994-03-29 | At&T Bell Laboratories | Pin-fin heat sink |
JP2710544B2 (en) * | 1993-09-30 | 1998-02-10 | インターナショナル・ビジネス・マシーンズ・コーポレイション | Probe structure, method of forming probe structure |
JP3400051B2 (en) * | 1993-11-10 | 2003-04-28 | ザ ウィタカー コーポレーション | Anisotropic conductive film, method of manufacturing the same, and connector using the same |
JP2602623B2 (en) * | 1993-12-17 | 1997-04-23 | 山一電機株式会社 | IC socket |
JPH0973934A (en) * | 1995-09-01 | 1997-03-18 | Whitaker Corp:The | Connector |
JP3640268B2 (en) * | 1995-10-06 | 2005-04-20 | ザ ウィタカー コーポレーション | Connector and connector manufacturing method |
US5637539A (en) * | 1996-01-16 | 1997-06-10 | Cornell Research Foundation, Inc. | Vacuum microelectronic devices with multiple planar electrodes |
US6181149B1 (en) * | 1996-09-26 | 2001-01-30 | Delaware Capital Formation, Inc. | Grid array package test contactor |
JP4040206B2 (en) * | 1999-04-28 | 2008-01-30 | 信越ポリマー株式会社 | Electrical connector |
-
2000
- 2000-07-31 AU AU67509/00A patent/AU6750900A/en not_active Abandoned
- 2000-07-31 WO PCT/US2000/020748 patent/WO2001009980A2/en active Application Filing
- 2000-07-31 EP EP00955283A patent/EP1204988A2/en not_active Withdrawn
- 2000-07-31 JP JP2001514505A patent/JP2003506833A/en active Pending
Also Published As
Publication number | Publication date |
---|---|
WO2001009980A2 (en) | 2001-02-08 |
WO2001009980A3 (en) | 2001-08-30 |
EP1204988A2 (en) | 2002-05-15 |
JP2003506833A (en) | 2003-02-18 |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
MK6 | Application lapsed section 142(2)(f)/reg. 8.3(3) - pct applic. not entering national phase |