AU2005905598A0 - Method and system for inspecting indirect bandgap semiconductor structure - Google Patents

Method and system for inspecting indirect bandgap semiconductor structure

Info

Publication number
AU2005905598A0
AU2005905598A0 AU2005905598A AU2005905598A AU2005905598A0 AU 2005905598 A0 AU2005905598 A0 AU 2005905598A0 AU 2005905598 A AU2005905598 A AU 2005905598A AU 2005905598 A AU2005905598 A AU 2005905598A AU 2005905598 A0 AU2005905598 A0 AU 2005905598A0
Authority
AU
Australia
Prior art keywords
semiconductor structure
bandgap semiconductor
indirect bandgap
inspecting
inspecting indirect
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Abandoned
Application number
AU2005905598A
Inventor
Robert Andrew Bardos
Thorsten Trupke
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
NewSouth Innovations Pty Ltd
Original Assignee
NewSouth Innovations Pty Ltd
Filing date
Publication date
Application filed by NewSouth Innovations Pty Ltd filed Critical NewSouth Innovations Pty Ltd
Publication of AU2005905598A0 publication Critical patent/AU2005905598A0/en
Priority to CN201410770974.8A priority Critical patent/CN104568870B/en
Priority to EP06790291.6A priority patent/EP1946079B1/en
Priority to DK06790291.6T priority patent/DK1946079T3/en
Priority to KR1020137001369A priority patent/KR101365363B1/en
Priority to CN200680046029.7A priority patent/CN101365937B/en
Priority to CN201410770971.4A priority patent/CN104569779B/en
Priority to TR2018/02704T priority patent/TR201802704T4/en
Priority to JP2008534812A priority patent/JP2009512198A/en
Priority to AU2006301905A priority patent/AU2006301905A1/en
Priority to PCT/AU2006/001420 priority patent/WO2007041758A1/en
Priority to MYPI20081084A priority patent/MY157737A/en
Priority to KR1020087011175A priority patent/KR101365336B1/en
Priority to HUE06790291A priority patent/HUE036690T2/en
Priority to ES06790291.6T priority patent/ES2659781T3/en
Priority to US12/083,429 priority patent/US8064054B2/en
Priority to US13/273,697 priority patent/US8218140B2/en
Priority to US13/494,373 priority patent/US9234849B2/en
Priority to JP2012279527A priority patent/JP2013102172A/en
Priority to PH12015500265A priority patent/PH12015500265A1/en
Priority to JP2015076831A priority patent/JP2015173268A/en
Priority to US14/989,341 priority patent/US9909991B2/en
Abandoned legal-status Critical Current

Links

AU2005905598A 2005-10-11 2005-10-11 Method and system for inspecting indirect bandgap semiconductor structure Abandoned AU2005905598A0 (en)

Priority Applications (21)

Application Number Priority Date Filing Date Title
US12/083,429 US8064054B2 (en) 2005-10-11 2006-10-11 Method and system for inspecting indirect bandgap semiconductor structure
MYPI20081084A MY157737A (en) 2005-10-11 2006-10-11 Method and system for inspecting indirect bandgap semiconductor structure
KR1020087011175A KR101365336B1 (en) 2005-10-11 2006-10-11 Method and system for inspecting indirect bandgap semiconductor structure
EP06790291.6A EP1946079B1 (en) 2005-10-11 2006-10-11 Method and system for inspecting indirect bandgap semiconductor structure
KR1020137001369A KR101365363B1 (en) 2005-10-11 2006-10-11 Method and system for inspecting indirect bandgap semiconductor structure
CN200680046029.7A CN101365937B (en) 2005-10-11 2006-10-11 Method and system for inspecting indirect bandgap semiconductor structure
CN201410770971.4A CN104569779B (en) 2005-10-11 2006-10-11 For checking the method and system of indirect bandgap semiconductor structure
TR2018/02704T TR201802704T4 (en) 2005-10-11 2006-10-11 Method and system for monitoring the indirect band gap semiconductor structure.
JP2008534812A JP2009512198A (en) 2005-10-11 2006-10-11 Method and system for inspecting indirect bandgap semiconductor structures
HUE06790291A HUE036690T2 (en) 2005-10-11 2006-10-11 Method and system for inspecting indirect bandgap semiconductor structure
PCT/AU2006/001420 WO2007041758A1 (en) 2005-10-11 2006-10-11 Method and system for inspecting indirect bandgap semiconductor structure
CN201410770974.8A CN104568870B (en) 2005-10-11 2006-10-11 Method and system for checking indirect bandgap semiconductor structure
DK06790291.6T DK1946079T3 (en) 2005-10-11 2006-10-11 PROCEDURE AND SYSTEM FOR INSPECTING INDIRECT BANDWOOD SEMICONDUCTOR STRUCTURE
AU2006301905A AU2006301905A1 (en) 2005-10-11 2006-10-11 Method and system for inspecting indirect bandgap semiconductor structure
ES06790291.6T ES2659781T3 (en) 2005-10-11 2006-10-11 Method and system to inspect an indirect band jump semiconductor structure
US13/273,697 US8218140B2 (en) 2005-10-11 2011-10-14 Method and system for inspecting indirect bandgap semiconductor stucture
US13/494,373 US9234849B2 (en) 2005-10-11 2012-06-12 Method and system for inspecting indirect bandgap semiconductor structure
JP2012279527A JP2013102172A (en) 2005-10-11 2012-12-21 Method and system for inspecting indirect bandgap semiconductor structure
PH12015500265A PH12015500265A1 (en) 2005-10-11 2015-02-06 Method and system for inspecting indirect bandgap semiconductor structure
JP2015076831A JP2015173268A (en) 2005-10-11 2015-04-03 Method and system for inspecting indirect bandgap semiconductor structure
US14/989,341 US9909991B2 (en) 2005-10-11 2016-01-06 Method and system for inspecting indirect bandgap semiconductor structure

Publications (1)

Publication Number Publication Date
AU2005905598A0 true AU2005905598A0 (en) 2005-10-27

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