AU2003211797A1 - Photosensitive resin composition, process for forming photosensitive elements or resist patterns with the same, and process for production of printed wiring boards - Google Patents

Photosensitive resin composition, process for forming photosensitive elements or resist patterns with the same, and process for production of printed wiring boards

Info

Publication number
AU2003211797A1
AU2003211797A1 AU2003211797A AU2003211797A AU2003211797A1 AU 2003211797 A1 AU2003211797 A1 AU 2003211797A1 AU 2003211797 A AU2003211797 A AU 2003211797A AU 2003211797 A AU2003211797 A AU 2003211797A AU 2003211797 A1 AU2003211797 A1 AU 2003211797A1
Authority
AU
Australia
Prior art keywords
production
resin composition
printed wiring
same
wiring boards
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Abandoned
Application number
AU2003211797A
Inventor
Takahiro Hidaka
Michiko Natori
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Showa Denko Materials Co ltd
Original Assignee
Hitachi Chemical Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Hitachi Chemical Co Ltd filed Critical Hitachi Chemical Co Ltd
Publication of AU2003211797A1 publication Critical patent/AU2003211797A1/en
Abandoned legal-status Critical Current

Links

Classifications

    • GPHYSICS
    • G03PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
    • G03FPHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
    • G03F7/00Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
    • G03F7/004Photosensitive materials
    • G03F7/027Non-macromolecular photopolymerisable compounds having carbon-to-carbon double bonds, e.g. ethylenic compounds
    • GPHYSICS
    • G03PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
    • G03FPHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
    • G03F7/00Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
    • G03F7/004Photosensitive materials
    • G03F7/027Non-macromolecular photopolymerisable compounds having carbon-to-carbon double bonds, e.g. ethylenic compounds
    • G03F7/028Non-macromolecular photopolymerisable compounds having carbon-to-carbon double bonds, e.g. ethylenic compounds with photosensitivity-increasing substances, e.g. photoinitiators
    • G03F7/031Organic compounds not covered by group G03F7/029
    • GPHYSICS
    • G03PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
    • G03FPHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
    • G03F7/00Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
    • G03F7/004Photosensitive materials
    • G03F7/027Non-macromolecular photopolymerisable compounds having carbon-to-carbon double bonds, e.g. ethylenic compounds
    • G03F7/028Non-macromolecular photopolymerisable compounds having carbon-to-carbon double bonds, e.g. ethylenic compounds with photosensitivity-increasing substances, e.g. photoinitiators

Landscapes

  • Physics & Mathematics (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • General Physics & Mathematics (AREA)
  • Materials For Photolithography (AREA)
AU2003211797A 2002-02-28 2003-02-27 Photosensitive resin composition, process for forming photosensitive elements or resist patterns with the same, and process for production of printed wiring boards Abandoned AU2003211797A1 (en)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
JP2002054451 2002-02-28
JP2002-054451 2002-02-28
PCT/JP2003/002255 WO2003073168A1 (en) 2002-02-28 2003-02-27 Photosensitive resin composition, process for forming photosensitive elements or resist patterns with the same, and process for production of printed wiring boards

Publications (1)

Publication Number Publication Date
AU2003211797A1 true AU2003211797A1 (en) 2003-09-09

Family

ID=27764398

Family Applications (1)

Application Number Title Priority Date Filing Date
AU2003211797A Abandoned AU2003211797A1 (en) 2002-02-28 2003-02-27 Photosensitive resin composition, process for forming photosensitive elements or resist patterns with the same, and process for production of printed wiring boards

Country Status (6)

Country Link
JP (1) JP3855998B2 (en)
KR (1) KR100630322B1 (en)
CN (1) CN100576074C (en)
AU (1) AU2003211797A1 (en)
TW (1) TW200303452A (en)
WO (1) WO2003073168A1 (en)

Families Citing this family (16)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP4485288B2 (en) * 2003-09-26 2010-06-16 三菱化学株式会社 Blue-violet laser photosensitive composition
JP4599974B2 (en) * 2004-10-04 2010-12-15 日立化成工業株式会社 Photosensitive resin composition, photosensitive element using the same, resist pattern forming method, and printed wiring board manufacturing method
CN100434948C (en) * 2004-11-16 2008-11-19 奇美实业股份有限公司 Photosensitive resin composition for colour filter
CN103885292B (en) 2005-10-25 2017-09-22 日立化成株式会社 Photosensitive polymer combination, the photosensitive element using it, the manufacture method of the forming method of Resist patterns and printed circuit board (PCB)
TW200745749A (en) * 2006-02-21 2007-12-16 Hitachi Chemical Co Ltd Photosensitive resin composition, method for forming resist pattern, method for manufacturing printed wiring board, and method for producing substrate for plasma display panel
WO2007114014A1 (en) 2006-03-31 2007-10-11 Hitachi Chemical Company, Ltd. Photosensitive resin composition, photosensitive element using same, method for forming resist pattern, and method for producing printed wiring board
WO2007123062A1 (en) 2006-04-18 2007-11-01 Hitachi Chemical Company, Ltd. Photosensitive element, method for formation of resist pattern, and method for production of print circuit board
JP5196738B2 (en) * 2006-05-26 2013-05-15 富士フイルム株式会社 Colored curable composition for color filter, color filter, and production method thereof
WO2008032674A1 (en) * 2006-09-13 2008-03-20 Hitachi Chemical Company, Ltd. Photosensitive resin composition, photosensitive element, method for forming resist pattern, and method for producing printed wiring board
US7615332B2 (en) * 2007-02-06 2009-11-10 Canon Kabushiki Kaisha Photosensitive compound, photosensitive composition, resist pattern forming method, and device production process
MY152732A (en) * 2008-04-28 2014-11-28 Hitachi Chemical Co Ltd Photosensitive resin composition, photosensitive element, method for forming resist pattern and method for manufacturing printed wiring board
CN101957559A (en) * 2010-08-30 2011-01-26 上海交通大学 Optical reversible nanoimprint photoresist as well as preparation method and application method thereof
WO2013084283A1 (en) 2011-12-05 2013-06-13 日立化成株式会社 Method for forming protective film for touch panel electrodes, photosensitive resin composition, and photosensitive element
WO2013084282A1 (en) 2011-12-05 2013-06-13 日立化成株式会社 Method for forming resin cured film pattern, photosensitive resin composition, and photosensitive element
CN108205240B (en) * 2018-02-01 2021-05-07 浙江福斯特新材料研究院有限公司 Photosensitive resin composition with high photosensitivity and excellent hole masking performance and application thereof
CN112650024B (en) * 2020-12-17 2023-08-01 江苏艾森半导体材料股份有限公司 High-film-thickness negative photoresist applied to chip packaging technology

Family Cites Families (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2001174992A (en) * 1999-04-28 2001-06-29 Hitachi Chem Co Ltd Photosensitive resin composition, photosensitive element using same, method for producing resist pattern and method for producing printed wiring board
JP4389132B2 (en) * 1999-09-24 2009-12-24 日立化成工業株式会社 Photosensitive element, method for producing resist pattern using the same, and method for producing printed wiring board
JP3437133B2 (en) * 1999-12-15 2003-08-18 日立化成工業株式会社 Photosensitive resin composition, photosensitive element using the same, method for producing resist pattern, and method for producing printed wiring board
JP4051594B2 (en) * 2000-03-09 2008-02-27 日立化成工業株式会社 Photosensitive resin composition, photosensitive element using the same, resist pattern manufacturing method, and printed wiring board manufacturing method

Also Published As

Publication number Publication date
TWI320513B (en) 2010-02-11
CN1639641A (en) 2005-07-13
JP3855998B2 (en) 2006-12-13
WO2003073168A1 (en) 2003-09-04
CN100576074C (en) 2009-12-30
JPWO2003073168A1 (en) 2005-06-23
KR20040086310A (en) 2004-10-08
TW200303452A (en) 2003-09-01
KR100630322B1 (en) 2006-09-29

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Legal Events

Date Code Title Description
MK6 Application lapsed section 142(2)(f)/reg. 8.3(3) - pct applic. not entering national phase