AU2001263175A1 - Method and apparatus for testing integrated circuit chips that output clocks fortiming - Google Patents

Method and apparatus for testing integrated circuit chips that output clocks fortiming

Info

Publication number
AU2001263175A1
AU2001263175A1 AU2001263175A AU6317501A AU2001263175A1 AU 2001263175 A1 AU2001263175 A1 AU 2001263175A1 AU 2001263175 A AU2001263175 A AU 2001263175A AU 6317501 A AU6317501 A AU 6317501A AU 2001263175 A1 AU2001263175 A1 AU 2001263175A1
Authority
AU
Australia
Prior art keywords
fortiming
integrated circuit
circuit chips
testing integrated
output clocks
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Abandoned
Application number
AU2001263175A
Inventor
George Conner
Peter Reichert
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Teradyne Inc
Original Assignee
Teradyne Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Teradyne Inc filed Critical Teradyne Inc
Publication of AU2001263175A1 publication Critical patent/AU2001263175A1/en
Abandoned legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3181—Functional testing
    • G01R31/319—Tester hardware, i.e. output processing circuits
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3181—Functional testing
    • G01R31/319—Tester hardware, i.e. output processing circuits
    • G01R31/31917—Stimuli generation or application of test patterns to the device under test [DUT]
    • G01R31/31924—Voltage or current aspects, e.g. driver, receiver
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3181—Functional testing
    • G01R31/319—Tester hardware, i.e. output processing circuits
    • G01R31/31903—Tester hardware, i.e. output processing circuits tester configuration
    • G01R31/31905—Interface with the device under test [DUT], e.g. arrangements between the test head and the DUT, mechanical aspects, fixture
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3181—Functional testing
    • G01R31/319—Tester hardware, i.e. output processing circuits
    • G01R31/3193—Tester hardware, i.e. output processing circuits with comparison between actual response and known fault free response
    • G01R31/31937—Timing aspects, e.g. measuring propagation delay

Landscapes

  • Engineering & Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Tests Of Electronic Circuits (AREA)
AU2001263175A 2000-05-19 2001-05-16 Method and apparatus for testing integrated circuit chips that output clocks fortiming Abandoned AU2001263175A1 (en)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
US09/577,255 US6486693B1 (en) 2000-05-19 2000-05-19 Method and apparatus for testing integrated circuit chips that output clocks for timing
US09577255 2000-05-19
PCT/US2001/015782 WO2001090768A2 (en) 2000-05-19 2001-05-16 Method and apparatus for testing source synchronous integrated circuits

Publications (1)

Publication Number Publication Date
AU2001263175A1 true AU2001263175A1 (en) 2001-12-03

Family

ID=24307927

Family Applications (1)

Application Number Title Priority Date Filing Date
AU2001263175A Abandoned AU2001263175A1 (en) 2000-05-19 2001-05-16 Method and apparatus for testing integrated circuit chips that output clocks fortiming

Country Status (8)

Country Link
US (1) US6486693B1 (en)
EP (1) EP1290460B1 (en)
JP (1) JP4955891B2 (en)
KR (3) KR100787409B1 (en)
AU (1) AU2001263175A1 (en)
MY (1) MY118113A (en)
TW (1) TW504579B (en)
WO (1) WO2001090768A2 (en)

Families Citing this family (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP4782271B2 (en) * 2000-07-06 2011-09-28 株式会社アドバンテスト Semiconductor device testing method and semiconductor device testing equipment
US6857089B2 (en) * 2001-05-09 2005-02-15 Teradyne, Inc. Differential receiver architecture
US6747469B2 (en) * 2001-11-08 2004-06-08 Koninklijke Philips Electronics N.V. Preconditioning integrated circuit for integrated circuit testing
US7375542B2 (en) * 2004-06-30 2008-05-20 Teradyne, Inc. Automated test equipment with DIB mounted three dimensional tester electronics bricks
US8149901B2 (en) * 2005-05-27 2012-04-03 Verigy (Singapore) Pte. Ltd. Channel switching circuit
EP2365349A1 (en) * 2010-02-19 2011-09-14 Salland Engineering International BV A test system for testing integrated circuits and an additional tester therefore
US10970612B2 (en) * 2018-10-22 2021-04-06 Fiteq, Inc. Interactive core for electronic cards
TWI770523B (en) * 2020-06-04 2022-07-11 大陸商北京集創北方科技股份有限公司 IC test circuit board combination and IC test system
US11747396B2 (en) * 2020-07-30 2023-09-05 Openlight Photonics, Inc. Optical interconnections for hybrid testing using automated testing equipment

Family Cites Families (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4792932A (en) * 1987-01-16 1988-12-20 Teradyne, Inc. Time measurement in automatic test equipment
US5058087A (en) 1987-05-29 1991-10-15 Siemens Aktiengesellschaft Process for determining the electrical duration of signal paths
JP3181736B2 (en) 1992-12-25 2001-07-03 三菱電機株式会社 IC function test apparatus and test method
JPH08185724A (en) * 1994-12-28 1996-07-16 Junkosha Co Ltd Low-speed coaxial cable
US5794175A (en) * 1997-09-09 1998-08-11 Teradyne, Inc. Low cost, highly parallel memory tester
JP4201878B2 (en) * 1998-05-07 2008-12-24 株式会社ルネサステクノロジ Semiconductor device and test board
DE19922907B4 (en) * 1998-05-19 2006-08-10 Advantest Corp. Calibration method for calibrating an output time of a test signal, calibration method for calibrating a time shift, and semiconductor tester
JP3569154B2 (en) * 1998-05-19 2004-09-22 株式会社アドバンテスト Semiconductor device test apparatus and calibration method thereof

Also Published As

Publication number Publication date
KR100787409B1 (en) 2007-12-21
KR100813871B1 (en) 2008-03-17
EP1290460A2 (en) 2003-03-12
WO2001090768A2 (en) 2001-11-29
KR20070070245A (en) 2007-07-03
WO2001090768A3 (en) 2002-05-16
MY118113A (en) 2004-08-30
US6486693B1 (en) 2002-11-26
KR20030014233A (en) 2003-02-15
KR20070067237A (en) 2007-06-27
JP4955891B2 (en) 2012-06-20
TW504579B (en) 2002-10-01
JP2003534553A (en) 2003-11-18
EP1290460B1 (en) 2004-10-06
KR100813872B1 (en) 2008-03-17

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