AU2001250306A1 - Column for a charged particle beam device - Google Patents
Column for a charged particle beam deviceInfo
- Publication number
- AU2001250306A1 AU2001250306A1 AU2001250306A AU5030601A AU2001250306A1 AU 2001250306 A1 AU2001250306 A1 AU 2001250306A1 AU 2001250306 A AU2001250306 A AU 2001250306A AU 5030601 A AU5030601 A AU 5030601A AU 2001250306 A1 AU2001250306 A1 AU 2001250306A1
- Authority
- AU
- Australia
- Prior art keywords
- column
- charged particle
- particle beam
- beam device
- charged
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Abandoned
Links
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
- H01J37/02—Details
- H01J37/04—Arrangements of electrodes and associated parts for generating or controlling the discharge, e.g. electron-optical arrangement, ion-optical arrangement
- H01J37/153—Electron-optical or ion-optical arrangements for the correction of image defects, e.g. stigmators
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
- H01J37/02—Details
- H01J37/04—Arrangements of electrodes and associated parts for generating or controlling the discharge, e.g. electron-optical arrangement, ion-optical arrangement
- H01J37/147—Arrangements for directing or deflecting the discharge along a desired path
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J2237/00—Discharge tubes exposing object to beam, e.g. for analysis treatment, etching, imaging
- H01J2237/04—Means for controlling the discharge
- H01J2237/047—Changing particle velocity
- H01J2237/0473—Changing particle velocity accelerating
- H01J2237/04735—Changing particle velocity accelerating with electrostatic means
- H01J2237/04737—Changing particle velocity accelerating with electrostatic means radio-frequency quadrupole [RFQ]
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J2237/00—Discharge tubes exposing object to beam, e.g. for analysis treatment, etching, imaging
- H01J2237/04—Means for controlling the discharge
- H01J2237/049—Focusing means
- H01J2237/0492—Lens systems
- H01J2237/04924—Lens systems electrostatic
Landscapes
- Chemical & Material Sciences (AREA)
- Analytical Chemistry (AREA)
- Electron Beam Exposure (AREA)
Applications Claiming Priority (3)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
EP00101373A EP1120810B1 (en) | 2000-01-24 | 2000-01-24 | Column for a charged particle beam device |
EP00101373 | 2000-01-24 | ||
PCT/EP2001/000744 WO2001054162A1 (en) | 2000-01-24 | 2001-01-24 | Column for a charged particle beam device |
Publications (1)
Publication Number | Publication Date |
---|---|
AU2001250306A1 true AU2001250306A1 (en) | 2001-07-31 |
Family
ID=8167690
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
AU2001250306A Abandoned AU2001250306A1 (en) | 2000-01-24 | 2001-01-24 | Column for a charged particle beam device |
Country Status (8)
Country | Link |
---|---|
US (1) | US6825476B2 (en) |
EP (1) | EP1120810B1 (en) |
JP (1) | JP3787091B2 (en) |
KR (1) | KR100543382B1 (en) |
CN (1) | CN1229849C (en) |
AU (1) | AU2001250306A1 (en) |
DE (1) | DE60045439D1 (en) |
WO (1) | WO2001054162A1 (en) |
Families Citing this family (15)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP3968334B2 (en) * | 2002-09-11 | 2007-08-29 | 株式会社日立ハイテクノロジーズ | Charged particle beam apparatus and charged particle beam irradiation method |
US6949895B2 (en) * | 2003-09-03 | 2005-09-27 | Axcelis Technologies, Inc. | Unipolar electrostatic quadrupole lens and switching methods for charged beam transport |
US7375326B2 (en) * | 2004-06-21 | 2008-05-20 | Applied Materials, Israel, Ltd. | Method and system for focusing a charged particle beam |
US7315029B2 (en) * | 2005-09-30 | 2008-01-01 | Applied Materials, Inc. | Electrostatic deflection system with low aberrations and vertical beam incidence |
KR101251432B1 (en) * | 2005-11-16 | 2013-04-05 | 전자빔기술센터 주식회사 | Magnetic deflector for electron column |
EP1801838B1 (en) * | 2005-12-20 | 2012-05-09 | ICT Integrated Circuit Testing Gesellschaft für Halbleiterprüftechnik mbH | Charged particle beam emitting device and method for operating a charged particle beam emitting device |
EP1830385A1 (en) * | 2006-03-01 | 2007-09-05 | ICT Integrated Circuit Testing Gesellschaft für Halbleiterprüftechnik mbH | Ion beam apparatus and method for aligning same |
KR100946270B1 (en) * | 2008-08-12 | 2010-03-09 | 주식회사 메가젠임플란트 | Dental instrument for cutting soft tissue |
WO2010039339A2 (en) * | 2008-09-30 | 2010-04-08 | Carl Zeiss Smt Inc. | Aligning charged particle beams |
EP2579265B1 (en) * | 2010-05-27 | 2015-12-02 | Mitsubishi Electric Corporation | Particle beam irradiation system |
US9171694B2 (en) | 2013-11-26 | 2015-10-27 | Kla-Tencor Corporation | Asymmetric electrostatic quadrupole deflector for improved field uniformity |
EP2879155B1 (en) * | 2013-12-02 | 2018-04-25 | ICT Integrated Circuit Testing Gesellschaft für Halbleiterprüftechnik mbH | Multi-beam system for high throughput EBI |
CN109637692B (en) * | 2019-01-23 | 2023-12-19 | 深圳铭杰医疗科技有限公司 | Trajectory corrector suitable for charged particle beam |
CN112086332A (en) * | 2020-09-27 | 2020-12-15 | 北京中科科仪股份有限公司 | Electrostatic deflection device and deflection method thereof |
CN116246923B (en) * | 2022-12-30 | 2023-11-14 | 广东省科学院半导体研究所 | Electron beam focusing deflection system and electron beam light column |
Family Cites Families (7)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
FR2584234B1 (en) * | 1985-06-28 | 1988-12-09 | Cameca | INTEGRATED CIRCUIT TESTER WITH ELECTRON BEAM |
US4725736A (en) * | 1986-08-11 | 1988-02-16 | Electron Beam Memories | Electrostatic electron gun with integrated electron beam deflection and/or stigmating system |
JP2706192B2 (en) * | 1991-11-06 | 1998-01-28 | 富士通株式会社 | Electron beam exposure system |
US5393985A (en) * | 1992-11-26 | 1995-02-28 | Shimadzu Corporation | Apparatus for focusing an ion beam |
JP3356270B2 (en) * | 1997-11-27 | 2002-12-16 | 株式会社日立製作所 | Scanning electron microscope |
US6452175B1 (en) * | 1999-04-15 | 2002-09-17 | Applied Materials, Inc. | Column for charged particle beam device |
US6614026B1 (en) * | 1999-04-15 | 2003-09-02 | Applied Materials, Inc. | Charged particle beam column |
-
2000
- 2000-01-24 DE DE60045439T patent/DE60045439D1/en not_active Expired - Lifetime
- 2000-01-24 EP EP00101373A patent/EP1120810B1/en not_active Expired - Lifetime
-
2001
- 2001-01-24 KR KR1020027009482A patent/KR100543382B1/en not_active IP Right Cessation
- 2001-01-24 WO PCT/EP2001/000744 patent/WO2001054162A1/en active IP Right Grant
- 2001-01-24 CN CNB018054315A patent/CN1229849C/en not_active Expired - Fee Related
- 2001-01-24 US US10/182,226 patent/US6825476B2/en not_active Expired - Lifetime
- 2001-01-24 JP JP2001553555A patent/JP3787091B2/en not_active Expired - Fee Related
- 2001-01-24 AU AU2001250306A patent/AU2001250306A1/en not_active Abandoned
Also Published As
Publication number | Publication date |
---|---|
EP1120810B1 (en) | 2010-12-29 |
US6825476B2 (en) | 2004-11-30 |
EP1120810A1 (en) | 2001-08-01 |
JP3787091B2 (en) | 2006-06-21 |
KR100543382B1 (en) | 2006-01-20 |
WO2001054162A1 (en) | 2001-07-26 |
CN1404618A (en) | 2003-03-19 |
KR20020070354A (en) | 2002-09-05 |
US20030075686A1 (en) | 2003-04-24 |
DE60045439D1 (en) | 2011-02-10 |
CN1229849C (en) | 2005-11-30 |
JP2003520408A (en) | 2003-07-02 |
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