ATE521903T1 - Integrierte schaltung mit selbstprüfungsfunktion zur validierung der funktionsfähigkeit externer schnittstellen - Google Patents

Integrierte schaltung mit selbstprüfungsfunktion zur validierung der funktionsfähigkeit externer schnittstellen

Info

Publication number
ATE521903T1
ATE521903T1 AT08770869T AT08770869T ATE521903T1 AT E521903 T1 ATE521903 T1 AT E521903T1 AT 08770869 T AT08770869 T AT 08770869T AT 08770869 T AT08770869 T AT 08770869T AT E521903 T1 ATE521903 T1 AT E521903T1
Authority
AT
Austria
Prior art keywords
integrated circuit
external
functionality
interfaces
external interfaces
Prior art date
Application number
AT08770869T
Other languages
English (en)
Inventor
Srinivas Maddali
Original Assignee
Qualcomm Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Qualcomm Inc filed Critical Qualcomm Inc
Application granted granted Critical
Publication of ATE521903T1 publication Critical patent/ATE521903T1/de

Links

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317Testing of digital circuits
    • G01R31/3181Functional testing
    • G01R31/3187Built-in tests
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28Testing of electronic circuits, e.g. by signal tracer
    • G01R31/302Contactless testing
    • G01R31/305Contactless testing using electron beams
    • G01R31/307Contactless testing using electron beams of integrated circuits
    • GPHYSICS
    • G06COMPUTING; CALCULATING OR COUNTING
    • G06FELECTRIC DIGITAL DATA PROCESSING
    • G06F11/00Error detection; Error correction; Monitoring
    • G06F11/22Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing
    • G06F11/26Functional testing
    • G06F11/27Built-in tests

Landscapes

  • Engineering & Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Theoretical Computer Science (AREA)
  • Computer Hardware Design (AREA)
  • Quality & Reliability (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Tests Of Electronic Circuits (AREA)
  • Semiconductor Integrated Circuits (AREA)
  • Test And Diagnosis Of Digital Computers (AREA)
AT08770869T 2007-08-21 2008-06-12 Integrierte schaltung mit selbstprüfungsfunktion zur validierung der funktionsfähigkeit externer schnittstellen ATE521903T1 (de)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
US11/842,396 US8484524B2 (en) 2007-08-21 2007-08-21 Integrated circuit with self-test feature for validating functionality of external interfaces
US94393507P 2007-09-10 2007-09-10
PCT/US2008/066744 WO2008157246A1 (en) 2007-06-14 2008-06-12 Integrated circuit with self-test feature for validating functionality of external interfaces

Publications (1)

Publication Number Publication Date
ATE521903T1 true ATE521903T1 (de) 2011-09-15

Family

ID=39734919

Family Applications (1)

Application Number Title Priority Date Filing Date
AT08770869T ATE521903T1 (de) 2007-08-21 2008-06-12 Integrierte schaltung mit selbstprüfungsfunktion zur validierung der funktionsfähigkeit externer schnittstellen

Country Status (8)

Country Link
US (1) US8484524B2 (de)
EP (1) EP2158495B1 (de)
JP (1) JP2010537156A (de)
KR (2) KR101265116B1 (de)
CN (1) CN101680932B (de)
AT (1) ATE521903T1 (de)
TW (1) TW200909829A (de)
WO (1) WO2008157246A1 (de)

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US8622292B2 (en) * 2005-09-29 2014-01-07 Jeffrey Bart Katz Reservation-based preauthorization payment system
US20090089003A1 (en) * 2007-09-28 2009-04-02 Inventec Corporation Accessory-testing device and method therefor
US8220718B2 (en) * 2008-09-15 2012-07-17 Vasco Data Security, Inc. Method for post-manufacturing data transfer to and from a sealed device
JP2011075460A (ja) * 2009-09-30 2011-04-14 Toshiba Corp 半導体集積回路
US20120324302A1 (en) * 2011-06-17 2012-12-20 Qualcomm Incorporated Integrated circuit for testing using a high-speed input/output interface
US8933715B2 (en) * 2012-04-08 2015-01-13 Elm Technology Corporation Configurable vertical integration
US9542347B2 (en) 2013-03-16 2017-01-10 Intel Corporation Host interface crossbar for sensor hub
US9430414B2 (en) 2013-03-16 2016-08-30 Intel Corporation Bus independent platform for sensor hub peripherals to provide coalescing of multiple reports
CN104678279A (zh) * 2013-11-29 2015-06-03 英业达科技有限公司 使用测试向量测试连接插槽的***及其方法
US10379926B2 (en) * 2014-08-05 2019-08-13 Macronix International Co., Ltd. Method and device for monitoring data error status in a memory
US11403170B2 (en) * 2014-08-05 2022-08-02 Macronix International Co., Ltd. Method and device for monitoring data error status in a memory
KR102377362B1 (ko) * 2015-07-08 2022-03-23 삼성전자주식회사 보조 테스트 장치, 그것을 포함하는 테스트 보드 및 그것의 테스트 방법
US10657092B2 (en) * 2016-06-30 2020-05-19 Intel Corporation Innovative high speed serial controller testing
US10521363B2 (en) * 2016-11-23 2019-12-31 Nuvoton Technology Corporation Fully-digital multiple pin value detector apparatus and sampling methods useful in conjunction therewith
US20210055954A1 (en) * 2018-02-02 2021-02-25 Dover Microsystems, Inc. Systems and methods for post cache interlocking
CN112256512B (zh) * 2020-10-27 2024-05-07 重庆航天工业有限公司 一种基于glink总线的验证及测试通用***
US20220237297A1 (en) * 2021-01-27 2022-07-28 Advanced Micro Devices, Inc. Secure coprocessor enforced system firmware feature enablement
WO2023078573A1 (en) * 2021-11-08 2023-05-11 Advantest Corporation Automated test equipment, device under test, test setup methods using a measurement request
WO2023078571A1 (en) * 2021-11-08 2023-05-11 Advantest Corporation Automated test equipment, device under test, test setup methods using an acknowledge signaling
KR20230168801A (ko) 2022-06-08 2023-12-15 와이아이케이 주식회사 반도체 테스트 장치

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Also Published As

Publication number Publication date
KR101265116B1 (ko) 2013-05-16
EP2158495B1 (de) 2011-08-24
CN101680932B (zh) 2013-11-20
WO2008157246A8 (en) 2010-04-15
EP2158495A1 (de) 2010-03-03
CN101680932A (zh) 2010-03-24
KR20100027214A (ko) 2010-03-10
TW200909829A (en) 2009-03-01
JP2010537156A (ja) 2010-12-02
US20090055695A1 (en) 2009-02-26
KR20130040259A (ko) 2013-04-23
WO2008157246A1 (en) 2008-12-24
US8484524B2 (en) 2013-07-09

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