ATE323275T1 - Verfahren zur bestimmung der grösse der deformation eines taststiftes - Google Patents

Verfahren zur bestimmung der grösse der deformation eines taststiftes

Info

Publication number
ATE323275T1
ATE323275T1 AT01201247T AT01201247T ATE323275T1 AT E323275 T1 ATE323275 T1 AT E323275T1 AT 01201247 T AT01201247 T AT 01201247T AT 01201247 T AT01201247 T AT 01201247T AT E323275 T1 ATE323275 T1 AT E323275T1
Authority
AT
Austria
Prior art keywords
deformation
style
determining
size
touch probe
Prior art date
Application number
AT01201247T
Other languages
English (en)
Inventor
Daniel Dubois
Original Assignee
Saphirwerk Ind Prod
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Saphirwerk Ind Prod filed Critical Saphirwerk Ind Prod
Application granted granted Critical
Publication of ATE323275T1 publication Critical patent/ATE323275T1/de

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B21/00—Measuring arrangements or details thereof, where the measuring technique is not covered by the other groups of this subclass, unspecified or not relevant
    • G01B21/02—Measuring arrangements or details thereof, where the measuring technique is not covered by the other groups of this subclass, unspecified or not relevant for measuring length, width, or thickness
    • G01B21/04—Measuring arrangements or details thereof, where the measuring technique is not covered by the other groups of this subclass, unspecified or not relevant for measuring length, width, or thickness by measuring coordinates of points
    • G01B21/042—Calibration or calibration artifacts
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B21/00—Measuring arrangements or details thereof, where the measuring technique is not covered by the other groups of this subclass, unspecified or not relevant
    • G01B21/02—Measuring arrangements or details thereof, where the measuring technique is not covered by the other groups of this subclass, unspecified or not relevant for measuring length, width, or thickness
    • G01B21/04—Measuring arrangements or details thereof, where the measuring technique is not covered by the other groups of this subclass, unspecified or not relevant for measuring length, width, or thickness by measuring coordinates of points
    • G01B21/045—Correction of measurements
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B5/00—Measuring arrangements characterised by the use of mechanical techniques
    • G01B5/004—Measuring arrangements characterised by the use of mechanical techniques for measuring coordinates of points
    • G01B5/008—Measuring arrangements characterised by the use of mechanical techniques for measuring coordinates of points using coordinate measuring machines
    • G01B5/012—Contact-making feeler heads therefor
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B5/00—Measuring arrangements characterised by the use of mechanical techniques
    • G01B5/30—Measuring arrangements characterised by the use of mechanical techniques for measuring the deformation in a solid, e.g. mechanical strain gauge

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • A Measuring Device Byusing Mechanical Method (AREA)
  • Length Measuring Devices With Unspecified Measuring Means (AREA)
AT01201247T 2001-04-03 2001-04-03 Verfahren zur bestimmung der grösse der deformation eines taststiftes ATE323275T1 (de)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
EP01201247A EP1248073B1 (de) 2001-04-03 2001-04-03 Verfahren zur Bestimmung der Grösse der Deformation eines Taststiftes

Publications (1)

Publication Number Publication Date
ATE323275T1 true ATE323275T1 (de) 2006-04-15

Family

ID=8180104

Family Applications (1)

Application Number Title Priority Date Filing Date
AT01201247T ATE323275T1 (de) 2001-04-03 2001-04-03 Verfahren zur bestimmung der grösse der deformation eines taststiftes

Country Status (5)

Country Link
US (1) US6776023B2 (de)
EP (1) EP1248073B1 (de)
JP (1) JP2002310636A (de)
AT (1) ATE323275T1 (de)
DE (1) DE60118701T2 (de)

Families Citing this family (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE102006033443A1 (de) * 2006-07-19 2008-01-31 Saphirwerk Industrieprodukte Ag Taststift mit integriertem RFID-Chip
US7681432B2 (en) * 2006-12-12 2010-03-23 Agilent Technologies, Inc. Calibrating force and displacement sensors of mechanical probes
DE102007051054A1 (de) * 2007-10-19 2009-04-30 Carl Zeiss Industrielle Messtechnik Gmbh Verfahren zum Korrigieren der Messwerte eines Koordinatenmessgeräts und Koordinatenmessgerät
ES2559187T3 (es) * 2011-07-06 2016-02-10 Hexagon Metrology S.P.A. Método de calibración de un modelo matemático para una máquina de medición de coordenadas para la compensación de errores dinámicos debidos a la deformación
CN103486953B (zh) * 2013-08-30 2016-02-24 广西玉柴机器股份有限公司 一种活塞环挠曲度通用检具

Family Cites Families (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE3933575A1 (de) * 1989-10-07 1991-04-18 Hartmut Prof Dr Janocha Tasteinrichtung
US5321977A (en) * 1992-12-31 1994-06-21 International Business Machines Corporation Integrated tip strain sensor for use in combination with a single axis atomic force microscope
DE4436507A1 (de) * 1994-10-13 1996-04-18 Zeiss Carl Fa Verfahren zur Koordinatenmessung an Werkstücken
ATE199042T1 (de) * 1995-03-10 2001-02-15 Heidenhain Gmbh Dr Johannes Mehrkoordinaten-tastkopf mit gleichen auslenkungen
GB9517214D0 (en) * 1995-08-23 1995-10-25 Renishaw Plc Calibration of an articulating probe head for a coordinating positioning machine
DE19824107A1 (de) * 1998-05-29 1999-12-23 Werth Messtechnik Gmbh Tastschnittverfahren sowie Anordnung zur Messgrößenbestimmung einer Oberfläche eines Prüflings nach dem Tastschnittverfahren
GB9907644D0 (en) * 1999-04-06 1999-05-26 Renishaw Plc Surface sensing device with optical sensor

Also Published As

Publication number Publication date
DE60118701D1 (de) 2006-05-24
JP2002310636A (ja) 2002-10-23
DE60118701T2 (de) 2007-04-12
EP1248073A1 (de) 2002-10-09
US20020138999A1 (en) 2002-10-03
EP1248073B1 (de) 2006-04-12
US6776023B2 (en) 2004-08-17

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