ATE232016T1 - Apparat zur lokalisierung von herstellungsfehler in einem substrat für ein photovoltaisches bauelement - Google Patents
Apparat zur lokalisierung von herstellungsfehler in einem substrat für ein photovoltaisches bauelementInfo
- Publication number
- ATE232016T1 ATE232016T1 AT00970312T AT00970312T ATE232016T1 AT E232016 T1 ATE232016 T1 AT E232016T1 AT 00970312 T AT00970312 T AT 00970312T AT 00970312 T AT00970312 T AT 00970312T AT E232016 T1 ATE232016 T1 AT E232016T1
- Authority
- AT
- Austria
- Prior art keywords
- substrate
- electrode
- localizing
- main surface
- photovoltaic component
- Prior art date
Links
- 239000000758 substrate Substances 0.000 title abstract 5
- 238000004519 manufacturing process Methods 0.000 title abstract 2
- 239000004020 conductor Substances 0.000 abstract 3
- 239000002800 charge carrier Substances 0.000 abstract 1
- 239000004065 semiconductor Substances 0.000 abstract 1
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L31/00—Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof
- H01L31/18—Processes or apparatus specially adapted for the manufacture or treatment of these devices or of parts thereof
- H01L31/20—Processes or apparatus specially adapted for the manufacture or treatment of these devices or of parts thereof such devices or parts thereof comprising amorphous semiconductor materials
- H01L31/208—Particular post-treatment of the devices, e.g. annealing, short-circuit elimination
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L31/00—Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof
- H01L31/18—Processes or apparatus specially adapted for the manufacture or treatment of these devices or of parts thereof
- H01L31/186—Particular post-treatment for the devices, e.g. annealing, impurity gettering, short-circuit elimination, recrystallisation
-
- H—ELECTRICITY
- H02—GENERATION; CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
- H02S—GENERATION OF ELECTRIC POWER BY CONVERSION OF INFRARED RADIATION, VISIBLE LIGHT OR ULTRAVIOLET LIGHT, e.g. USING PHOTOVOLTAIC [PV] MODULES
- H02S50/00—Monitoring or testing of PV systems, e.g. load balancing or fault identification
- H02S50/10—Testing of PV devices, e.g. of PV modules or single PV cells
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y02—TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMATE CHANGE
- Y02E—REDUCTION OF GREENHOUSE GAS [GHG] EMISSIONS, RELATED TO ENERGY GENERATION, TRANSMISSION OR DISTRIBUTION
- Y02E10/00—Energy generation through renewable energy sources
- Y02E10/50—Photovoltaic [PV] energy
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y02—TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMATE CHANGE
- Y02P—CLIMATE CHANGE MITIGATION TECHNOLOGIES IN THE PRODUCTION OR PROCESSING OF GOODS
- Y02P70/00—Climate change mitigation technologies in the production process for final industrial or consumer products
- Y02P70/50—Manufacturing or production processes characterised by the final manufactured product
Landscapes
- Engineering & Computer Science (AREA)
- Manufacturing & Machinery (AREA)
- Physics & Mathematics (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- Electromagnetism (AREA)
- General Physics & Mathematics (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Power Engineering (AREA)
- Photovoltaic Devices (AREA)
- Light Receiving Elements (AREA)
- Testing Of Individual Semiconductor Devices (AREA)
- Testing Or Measuring Of Semiconductors Or The Like (AREA)
- Container, Conveyance, Adherence, Positioning, Of Wafer (AREA)
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
NL1013204A NL1013204C2 (nl) | 1999-10-04 | 1999-10-04 | Inrichting voor het lokaliseren van productiefouten in een fotovolta´sch element. |
PCT/NL2000/000691 WO2001026163A1 (en) | 1999-10-04 | 2000-09-27 | Apparatus for localizing production errors in a photovoltaic element |
Publications (1)
Publication Number | Publication Date |
---|---|
ATE232016T1 true ATE232016T1 (de) | 2003-02-15 |
Family
ID=19769986
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
AT00970312T ATE232016T1 (de) | 1999-10-04 | 2000-09-27 | Apparat zur lokalisierung von herstellungsfehler in einem substrat für ein photovoltaisches bauelement |
Country Status (9)
Country | Link |
---|---|
US (1) | US6750662B1 (de) |
EP (1) | EP1218946B1 (de) |
JP (1) | JP4628628B2 (de) |
AT (1) | ATE232016T1 (de) |
AU (1) | AU772404B2 (de) |
DE (1) | DE60001333T2 (de) |
ES (1) | ES2193992T3 (de) |
NL (1) | NL1013204C2 (de) |
WO (1) | WO2001026163A1 (de) |
Families Citing this family (37)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US8076568B2 (en) * | 2006-04-13 | 2011-12-13 | Daniel Luch | Collector grid and interconnect structures for photovoltaic arrays and modules |
US8664030B2 (en) | 1999-03-30 | 2014-03-04 | Daniel Luch | Collector grid and interconnect structures for photovoltaic arrays and modules |
US8138413B2 (en) | 2006-04-13 | 2012-03-20 | Daniel Luch | Collector grid and interconnect structures for photovoltaic arrays and modules |
US8222513B2 (en) | 2006-04-13 | 2012-07-17 | Daniel Luch | Collector grid, electrode structures and interconnect structures for photovoltaic arrays and methods of manufacture |
US20090111206A1 (en) | 1999-03-30 | 2009-04-30 | Daniel Luch | Collector grid, electrode structures and interrconnect structures for photovoltaic arrays and methods of manufacture |
US7507903B2 (en) | 1999-03-30 | 2009-03-24 | Daniel Luch | Substrate and collector grid structures for integrated series connected photovoltaic arrays and process of manufacture of such arrays |
US7898053B2 (en) | 2000-02-04 | 2011-03-01 | Daniel Luch | Substrate structures for integrated series connected photovoltaic arrays and process of manufacture of such arrays |
US7898054B2 (en) | 2000-02-04 | 2011-03-01 | Daniel Luch | Substrate structures for integrated series connected photovoltaic arrays and process of manufacture of such arrays |
US8198696B2 (en) | 2000-02-04 | 2012-06-12 | Daniel Luch | Substrate structures for integrated series connected photovoltaic arrays and process of manufacture of such arrays |
US7838868B2 (en) * | 2005-01-20 | 2010-11-23 | Nanosolar, Inc. | Optoelectronic architecture having compound conducting substrate |
US7732229B2 (en) * | 2004-09-18 | 2010-06-08 | Nanosolar, Inc. | Formation of solar cells with conductive barrier layers and foil substrates |
US7276724B2 (en) * | 2005-01-20 | 2007-10-02 | Nanosolar, Inc. | Series interconnected optoelectronic device module assembly |
US8927315B1 (en) | 2005-01-20 | 2015-01-06 | Aeris Capital Sustainable Ip Ltd. | High-throughput assembly of series interconnected solar cells |
DE102005040010A1 (de) * | 2005-08-23 | 2007-03-15 | Rwe Schott Solar Gmbh | Verfahren und Vorrichtung zur Ermittlung von Produktionsfehlern in einem Halbleiterbau-element |
US9236512B2 (en) | 2006-04-13 | 2016-01-12 | Daniel Luch | Collector grid and interconnect structures for photovoltaic arrays and modules |
US9865758B2 (en) | 2006-04-13 | 2018-01-09 | Daniel Luch | Collector grid and interconnect structures for photovoltaic arrays and modules |
US8884155B2 (en) | 2006-04-13 | 2014-11-11 | Daniel Luch | Collector grid and interconnect structures for photovoltaic arrays and modules |
US8729385B2 (en) | 2006-04-13 | 2014-05-20 | Daniel Luch | Collector grid and interconnect structures for photovoltaic arrays and modules |
US9006563B2 (en) | 2006-04-13 | 2015-04-14 | Solannex, Inc. | Collector grid and interconnect structures for photovoltaic arrays and modules |
US8822810B2 (en) | 2006-04-13 | 2014-09-02 | Daniel Luch | Collector grid and interconnect structures for photovoltaic arrays and modules |
US7554346B2 (en) | 2007-04-19 | 2009-06-30 | Oerlikon Trading Ag, Trubbach | Test equipment for automated quality control of thin film solar modules |
US20090223511A1 (en) * | 2008-03-04 | 2009-09-10 | Cox Edwin B | Unglazed photovoltaic and thermal apparatus and method |
EP2159583A1 (de) * | 2008-08-29 | 2010-03-03 | ODERSUN Aktiengesellschaft | System und Verfahren zur Lokalisierung und Passivierung von Fehlern in einem photovoltaischen Element |
US7979969B2 (en) * | 2008-11-17 | 2011-07-19 | Solopower, Inc. | Method of detecting and passivating a defect in a solar cell |
US8318240B2 (en) * | 2008-11-17 | 2012-11-27 | Solopower, Inc. | Method and apparatus to remove a segment of a thin film solar cell structure for efficiency improvement |
US8247243B2 (en) * | 2009-05-22 | 2012-08-21 | Nanosolar, Inc. | Solar cell interconnection |
JP4866954B2 (ja) * | 2009-11-05 | 2012-02-01 | 共進電機株式会社 | 太陽電池セル測定用試料台 |
US20130000705A1 (en) * | 2009-12-16 | 2013-01-03 | Yissum Research Development Company Of The Hebrew University Of Jerusalem, Ltd. | Photovoltaic device and method of its fabrication |
US8164818B2 (en) | 2010-11-08 | 2012-04-24 | Soladigm, Inc. | Electrochromic window fabrication methods |
US9306491B2 (en) * | 2011-05-16 | 2016-04-05 | First Solar, Inc. | Electrical test apparatus for a photovoltaic component |
EP2756289B1 (de) | 2011-09-14 | 2023-03-29 | View, Inc. | Tragbarer fehlerreduzierer für elektrochrome fenster |
US9885934B2 (en) | 2011-09-14 | 2018-02-06 | View, Inc. | Portable defect mitigators for electrochromic windows |
WO2013038780A1 (ja) * | 2011-09-15 | 2013-03-21 | 三洋電機株式会社 | 太陽電池及び太陽電池モジュール |
US9341912B2 (en) | 2012-03-13 | 2016-05-17 | View, Inc. | Multi-zone EC windows |
US9638977B2 (en) | 2012-03-13 | 2017-05-02 | View, Inc. | Pinhole mitigation for optical devices |
WO2013173591A1 (en) | 2012-05-18 | 2013-11-21 | View, Inc. | Circumscribing defects in optical devices |
CN207135068U (zh) * | 2017-08-30 | 2018-03-23 | 米亚索乐装备集成(福建)有限公司 | 可变角度光伏组件户外测试装置 |
Family Cites Families (12)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US4301409A (en) * | 1978-06-06 | 1981-11-17 | California Institute Of Technology | Solar cell anomaly detection method and apparatus |
US4640002A (en) * | 1982-02-25 | 1987-02-03 | The University Of Delaware | Method and apparatus for increasing the durability and yield of thin film photovoltaic devices |
JPS58158977A (ja) * | 1982-02-25 | 1983-09-21 | ユニバ−シテイ・オブ・デラウエア | 薄膜太陽電池を製造する方法及び装置 |
US4464823A (en) * | 1982-10-21 | 1984-08-14 | Energy Conversion Devices, Inc. | Method for eliminating short and latent short circuit current paths in photovoltaic devices |
US4451970A (en) * | 1982-10-21 | 1984-06-05 | Energy Conversion Devices, Inc. | System and method for eliminating short circuit current paths in photovoltaic devices |
US4599558A (en) * | 1983-12-14 | 1986-07-08 | Ibm | Photovoltaic imaging for large area semiconductors |
JPS6154681A (ja) * | 1984-08-25 | 1986-03-18 | Fuji Electric Corp Res & Dev Ltd | 薄膜光起電力素子の製造方法 |
JPS6358274A (ja) * | 1986-08-29 | 1988-03-14 | Nec Corp | 半導体受光素子測定装置 |
JPH02216844A (ja) * | 1989-02-17 | 1990-08-29 | Toshiba Corp | 半導体の光電特性測定方法 |
JP2633953B2 (ja) * | 1989-03-28 | 1997-07-23 | シャープ株式会社 | 積層型太陽電池の特性測定方法 |
US5521519A (en) * | 1992-07-30 | 1996-05-28 | International Business Machines Corporation | Spring probe with piloted and headed contact and method of tip formation |
US5517128A (en) * | 1993-01-05 | 1996-05-14 | Sentech Instruments Gmbh | Method and arrangement for charge carrier profiling in semiconductor structure by means of AFM scanning |
-
1999
- 1999-10-04 NL NL1013204A patent/NL1013204C2/nl not_active IP Right Cessation
-
2000
- 2000-09-27 JP JP2001529029A patent/JP4628628B2/ja not_active Expired - Fee Related
- 2000-09-27 AT AT00970312T patent/ATE232016T1/de not_active IP Right Cessation
- 2000-09-27 AU AU79711/00A patent/AU772404B2/en not_active Ceased
- 2000-09-27 DE DE60001333T patent/DE60001333T2/de not_active Expired - Lifetime
- 2000-09-27 EP EP00970312A patent/EP1218946B1/de not_active Expired - Lifetime
- 2000-09-27 US US10/089,546 patent/US6750662B1/en not_active Expired - Fee Related
- 2000-09-27 ES ES00970312T patent/ES2193992T3/es not_active Expired - Lifetime
- 2000-09-27 WO PCT/NL2000/000691 patent/WO2001026163A1/en active IP Right Grant
Also Published As
Publication number | Publication date |
---|---|
ES2193992T3 (es) | 2003-11-16 |
EP1218946B1 (de) | 2003-01-29 |
JP2003511861A (ja) | 2003-03-25 |
DE60001333T2 (de) | 2004-01-15 |
EP1218946A1 (de) | 2002-07-03 |
AU7971100A (en) | 2001-05-10 |
US6750662B1 (en) | 2004-06-15 |
NL1013204C2 (nl) | 2001-04-05 |
DE60001333D1 (de) | 2003-03-06 |
JP4628628B2 (ja) | 2011-02-09 |
AU772404B2 (en) | 2004-04-29 |
WO2001026163A1 (en) | 2001-04-12 |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
RER | Ceased as to paragraph 5 lit. 3 law introducing patent treaties |