ATE212716T1 - Elketrostatischer haftfestigkeitsprüfer für dünnschichtleiter - Google Patents

Elketrostatischer haftfestigkeitsprüfer für dünnschichtleiter

Info

Publication number
ATE212716T1
ATE212716T1 AT98914398T AT98914398T ATE212716T1 AT E212716 T1 ATE212716 T1 AT E212716T1 AT 98914398 T AT98914398 T AT 98914398T AT 98914398 T AT98914398 T AT 98914398T AT E212716 T1 ATE212716 T1 AT E212716T1
Authority
AT
Austria
Prior art keywords
thin film
film conductor
adhesion tester
conducting portion
adhesion
Prior art date
Application number
AT98914398T
Other languages
English (en)
Inventor
Alfred J Griffin Jr
Franz R Brotzen
Daniel L Callahan
Haining S Yang
Original Assignee
Rice University
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Priority claimed from US09/008,969 external-priority patent/US6002259A/en
Application filed by Rice University filed Critical Rice University
Application granted granted Critical
Publication of ATE212716T1 publication Critical patent/ATE212716T1/de

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N19/00—Investigating materials by mechanical methods
    • G01N19/04—Measuring adhesive force between materials, e.g. of sealing tape, of coating
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2203/00—Investigating strength properties of solid materials by application of mechanical stress
    • G01N2203/003—Generation of the force
    • G01N2203/005—Electromagnetic means

Landscapes

  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Testing Or Measuring Of Semiconductors Or The Like (AREA)
  • Preparing Plates And Mask In Photomechanical Process (AREA)
  • Paints Or Removers (AREA)
  • Adhesives Or Adhesive Processes (AREA)
  • Investigating Or Analyzing Materials By The Use Of Electric Means (AREA)
  • Investigating Strength Of Materials By Application Of Mechanical Stress (AREA)
AT98914398T 1997-03-31 1998-03-31 Elketrostatischer haftfestigkeitsprüfer für dünnschichtleiter ATE212716T1 (de)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
US4224397P 1997-03-31 1997-03-31
US09/008,969 US6002259A (en) 1998-01-20 1998-01-20 Electrostatic adhesion tester for thin film conductors
PCT/US1998/006424 WO1998044334A1 (en) 1997-03-31 1998-03-31 Electrostatic adhesion tester for thin film conductors

Publications (1)

Publication Number Publication Date
ATE212716T1 true ATE212716T1 (de) 2002-02-15

Family

ID=26678856

Family Applications (1)

Application Number Title Priority Date Filing Date
AT98914398T ATE212716T1 (de) 1997-03-31 1998-03-31 Elketrostatischer haftfestigkeitsprüfer für dünnschichtleiter

Country Status (8)

Country Link
EP (1) EP0972182B1 (de)
JP (1) JP2001524209A (de)
KR (1) KR20010005829A (de)
CN (1) CN1254414A (de)
AT (1) ATE212716T1 (de)
CA (1) CA2284831A1 (de)
DE (1) DE69803660T2 (de)
WO (1) WO1998044334A1 (de)

Families Citing this family (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP2375675B1 (de) 2004-03-10 2013-05-01 Qualcomm Incorporated Schnittstellenvorrichtung mit hoher Datenrate und Verfahren
JP2020521132A (ja) * 2017-05-25 2020-07-16 コーニング インコーポレイテッド 平面間の付着力を測定するための方法及び装置

Family Cites Families (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
SU1310699A1 (ru) * 1985-10-16 1987-05-15 Гомельский политехнический институт Способ определени адгезии металлической пленки к диэлектрической подложке
SU1627931A1 (ru) * 1988-11-16 1991-02-15 Предприятие П/Я Г-4671 Устройство дл испытани на адгезию токопровод щих пленок на диэлектрических подложках
JP2566496B2 (ja) * 1991-10-07 1996-12-25 株式会社東洋精機製作所 粘着応用製品の性能評価装置

Also Published As

Publication number Publication date
EP0972182B1 (de) 2002-01-30
DE69803660D1 (de) 2002-03-14
CN1254414A (zh) 2000-05-24
EP0972182A1 (de) 2000-01-19
CA2284831A1 (en) 1998-10-08
DE69803660T2 (de) 2002-10-17
JP2001524209A (ja) 2001-11-27
WO1998044334A1 (en) 1998-10-08
KR20010005829A (ko) 2001-01-15

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Legal Events

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