ATE159814T1 - Vorrichtung und verfahren zum prüfen von optischen elementen - Google Patents
Vorrichtung und verfahren zum prüfen von optischen elementenInfo
- Publication number
- ATE159814T1 ATE159814T1 AT93101739T AT93101739T ATE159814T1 AT E159814 T1 ATE159814 T1 AT E159814T1 AT 93101739 T AT93101739 T AT 93101739T AT 93101739 T AT93101739 T AT 93101739T AT E159814 T1 ATE159814 T1 AT E159814T1
- Authority
- AT
- Austria
- Prior art keywords
- optical element
- array
- optical elements
- degrees
- angle
- Prior art date
Links
- 230000003287 optical effect Effects 0.000 title abstract 6
- 230000007547 defect Effects 0.000 abstract 2
- 230000001360 synchronised effect Effects 0.000 abstract 1
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01M—TESTING STATIC OR DYNAMIC BALANCE OF MACHINES OR STRUCTURES; TESTING OF STRUCTURES OR APPARATUS, NOT OTHERWISE PROVIDED FOR
- G01M11/00—Testing of optical apparatus; Testing structures by optical methods not otherwise provided for
- G01M11/02—Testing optical properties
- G01M11/0242—Testing optical properties by measuring geometrical properties or aberrations
- G01M11/0278—Detecting defects of the object to be tested, e.g. scratches or dust
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01M—TESTING STATIC OR DYNAMIC BALANCE OF MACHINES OR STRUCTURES; TESTING OF STRUCTURES OR APPARATUS, NOT OTHERWISE PROVIDED FOR
- G01M11/00—Testing of optical apparatus; Testing structures by optical methods not otherwise provided for
- G01M11/02—Testing optical properties
- G01M11/0242—Testing optical properties by measuring geometrical properties or aberrations
- G01M11/0257—Testing optical properties by measuring geometrical properties or aberrations by analyzing the image formed by the object to be tested
- G01M11/0264—Testing optical properties by measuring geometrical properties or aberrations by analyzing the image formed by the object to be tested by using targets or reference patterns
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/84—Systems specially adapted for particular applications
- G01N21/88—Investigating the presence of flaws or contamination
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/84—Systems specially adapted for particular applications
- G01N21/88—Investigating the presence of flaws or contamination
- G01N21/8806—Specially adapted optical and illumination features
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Chemical & Material Sciences (AREA)
- Analytical Chemistry (AREA)
- Life Sciences & Earth Sciences (AREA)
- Health & Medical Sciences (AREA)
- Geometry (AREA)
- Biochemistry (AREA)
- General Health & Medical Sciences (AREA)
- Immunology (AREA)
- Pathology (AREA)
- Testing Of Optical Devices Or Fibers (AREA)
- Testing Or Measuring Of Semiconductors Or The Like (AREA)
- Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
- Tests Of Electronic Circuits (AREA)
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
IL100972A IL100972A0 (en) | 1992-02-17 | 1992-02-17 | Device for testing optical elements |
Publications (1)
Publication Number | Publication Date |
---|---|
ATE159814T1 true ATE159814T1 (de) | 1997-11-15 |
Family
ID=11063373
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
AT93101739T ATE159814T1 (de) | 1992-02-17 | 1993-02-04 | Vorrichtung und verfahren zum prüfen von optischen elementen |
Country Status (6)
Country | Link |
---|---|
US (1) | US5438405A (de) |
EP (1) | EP0556655B1 (de) |
JP (1) | JPH05346368A (de) |
AT (1) | ATE159814T1 (de) |
DE (1) | DE69314821D1 (de) |
IL (1) | IL100972A0 (de) |
Families Citing this family (7)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP3417738B2 (ja) * | 1995-09-06 | 2003-06-16 | ペンタックス株式会社 | 光学部材検査装置 |
JP3417737B2 (ja) * | 1995-08-29 | 2003-06-16 | ペンタックス株式会社 | 光学部材検査装置 |
US6437857B1 (en) * | 1999-08-31 | 2002-08-20 | Eastman Kodak Company | Variable field angle and test pattern spatial frequency system for testing a lens |
EP1605241A1 (de) | 2004-06-09 | 2005-12-14 | Automation & Robotics | Apparat zur optischen Kontrolle von transparenten oder reflektierenden Proben |
US7564556B2 (en) * | 2007-04-02 | 2009-07-21 | Taiwan Semiconductor Manufacturing Company | Method and apparatus for lens contamination control |
JP2015225059A (ja) * | 2014-05-30 | 2015-12-14 | 株式会社リコー | 光学素子検査装置および光学素子検査方法および光学素子検査システム |
JP7046819B2 (ja) * | 2016-02-24 | 2022-04-04 | ベクトン ディキンソン フランス | 透明シリンダを検査するためのシステムおよび方法 |
Family Cites Families (7)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US3813173A (en) * | 1972-02-22 | 1974-05-28 | Corning Glass Works | Defect sensing apparatus and method |
US3788749A (en) * | 1972-03-13 | 1974-01-29 | N George | Image quality rating system |
GB1403911A (en) * | 1972-07-26 | 1975-08-28 | Sira Institute | Method and apparatus for testing optical components |
US3988068A (en) * | 1974-05-09 | 1976-10-26 | Itek Corporation | Method and apparatus for detecting cosmetic defects in opthalmic lenses |
DE3620129A1 (de) * | 1986-06-14 | 1987-12-17 | Zeiss Carl Fa | Vorrichtung zum pruefen von bauteilen aus transparentem material auf oberflaechenfehler und einschluesse |
DE3620108A1 (de) * | 1986-06-14 | 1987-12-17 | Zeiss Carl Fa | Vorrichtung zum beleuchten von bauteilen aus transparentem material bei der fehlerpruefung |
DE3620146A1 (de) * | 1986-06-14 | 1987-12-17 | Zeiss Carl Fa | Verfahren zum pruefen von bauteilen aus transparentem material auf oberflaechenfehler und einschluesse |
-
1992
- 1992-02-17 IL IL100972A patent/IL100972A0/xx unknown
-
1993
- 1993-02-04 DE DE69314821T patent/DE69314821D1/de not_active Expired - Lifetime
- 1993-02-04 EP EP93101739A patent/EP0556655B1/de not_active Expired - Lifetime
- 1993-02-04 AT AT93101739T patent/ATE159814T1/de not_active IP Right Cessation
- 1993-02-09 US US08/015,006 patent/US5438405A/en not_active Expired - Fee Related
- 1993-02-17 JP JP5028221A patent/JPH05346368A/ja active Pending
Also Published As
Publication number | Publication date |
---|---|
US5438405A (en) | 1995-08-01 |
JPH05346368A (ja) | 1993-12-27 |
EP0556655A3 (en) | 1993-10-13 |
DE69314821D1 (de) | 1997-12-04 |
EP0556655A2 (de) | 1993-08-25 |
EP0556655B1 (de) | 1997-10-29 |
IL100972A0 (en) | 1992-11-15 |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
RER | Ceased as to paragraph 5 lit. 3 law introducing patent treaties |