WO2023145802A1 - Chip resistor - Google Patents

Chip resistor Download PDF

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Publication number
WO2023145802A1
WO2023145802A1 PCT/JP2023/002378 JP2023002378W WO2023145802A1 WO 2023145802 A1 WO2023145802 A1 WO 2023145802A1 JP 2023002378 W JP2023002378 W JP 2023002378W WO 2023145802 A1 WO2023145802 A1 WO 2023145802A1
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WIPO (PCT)
Prior art keywords
resistance value
resistor
folded
value adjusting
chip resistor
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PCT/JP2023/002378
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French (fr)
Japanese (ja)
Inventor
光明 中尾
祥吾 中山
健太郎 玉村
Original Assignee
パナソニックＩｐマネジメント株式会社
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Application filed by パナソニックＩｐマネジメント株式会社 filed Critical パナソニックＩｐマネジメント株式会社
Publication of WO2023145802A1 publication Critical patent/WO2023145802A1/en

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    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01C—RESISTORS
    • H01C17/00—Apparatus or processes specially adapted for manufacturing resistors
    • H01C17/22—Apparatus or processes specially adapted for manufacturing resistors adapted for trimming
    • H01C17/24—Apparatus or processes specially adapted for manufacturing resistors adapted for trimming by removing or adding resistive material
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01C—RESISTORS
    • H01C7/00—Non-adjustable resistors formed as one or more layers or coatings; Non-adjustable resistors made from powdered conducting material or powdered semi-conducting material with or without insulating material

Definitions

  • the present disclosure relates generally to chip resistors, and more particularly to chip resistors comprising a pair of electrodes and a resistor.
  • Patent Document 1 discloses a resistor having an S-shaped portion and rectangular portions at both ends, in which linear trimming grooves are formed in the rectangular portions.
  • microcracks may occur near the end of the trimming groove (meandering groove).
  • resistance value fluctuations are caused by the load of the resistance value, and the reliability of the chip resistor is lowered.
  • An object of the present disclosure is to provide a highly reliable chip resistor.
  • a chip resistor includes a substrate, a pair of electrodes, and a resistor.
  • the pair of electrodes are provided at both ends of one surface of the substrate.
  • the resistor is provided between the pair of electrodes on the one surface of the substrate.
  • the resistor has a pair of connecting portions and a resistance adjusting portion.
  • the pair of connection portions are connected to the pair of electrodes, respectively.
  • the resistance adjusting section is provided between the pair of connecting sections.
  • a meandering formation groove is formed in the resistance value adjusting portion to form the resistance value adjusting portion in a meandering shape.
  • the meandering groove has a linear portion extending from the edge of the resistance value adjusting portion and a folded portion formed at one end of the linear portion.
  • a chip resistor includes a substrate, a pair of electrodes, and a resistor.
  • the pair of electrodes are provided at both ends of one surface of the substrate.
  • the resistor is provided between the pair of electrodes on the one surface of the substrate.
  • a trimming groove is formed in the resistor.
  • the trimming groove has a linear portion extending from an edge of the resistor along the direction in which the pair of electrodes are arranged, and one end of the linear portion, and has a shape having a curvature in plan view from the thickness direction of the substrate. and a folded portion that is folded back so as to be.
  • FIG. 1 is a top view of a chip resistor according to a first embodiment of the present disclosure
  • FIG. FIG. 2 is a top view of a chip resistor according to the second embodiment of the present disclosure
  • FIG. FIG. 3 is a top view of a chip resistor according to a third embodiment of the present disclosure
  • FIG. FIG. 4 is a top view of a chip resistor according to a fourth embodiment of the present disclosure
  • FIG. 5 is a top view of a chip resistor according to the fifth embodiment of the present disclosure
  • FIG. 6 is a top view of a chip resistor according to the sixth embodiment of the present disclosure
  • FIG. 7 is a top view of a chip resistor according to the seventh embodiment of the present disclosure
  • a chip resistor according to an embodiment will be described below with reference to the drawings.
  • Each drawing described in the following embodiments is a schematic drawing, and the ratio of the size and thickness of each component does not necessarily reflect the actual dimensional ratio.
  • the configurations described in the following embodiments are merely examples of the present disclosure.
  • the present disclosure is not limited to the following embodiments, and various modifications are possible according to design and the like as long as the effects of the present disclosure can be achieved.
  • the chip resistor 1 has an insulating substrate 2 (an example of a substrate), a first electrode 3 , a second electrode 4 and a resistor 5 .
  • the insulating substrate 2 is made of, for example, alumina containing 96% Al 2 O 3 and has a rectangular shape (rectangular when viewed from above).
  • the horizontal direction in FIG. 1 is defined as the longitudinal direction
  • the vertical direction in FIG. 1 is defined as the lateral direction. 1 is the first side in the longitudinal direction
  • the left side in FIG. 1 is the second side in the longitudinal direction
  • the upper side in FIG. 1 is the first side in the transverse direction
  • the lower side in FIG. side the longitudinal direction and the lateral direction are orthogonal to each other.
  • the first electrode 3 and the second electrode 4 are provided at both ends in the longitudinal direction of the surface 2A of the insulating substrate 2, and are formed by printing and baking a thick film material containing metal such as silver.
  • a pair of rear surface electrodes (not shown) are formed on the rear surface of the insulating substrate 2 so as to be spaced apart from each other by a predetermined distance.
  • an edge electrode (not shown) for electrically connecting the first electrode 3 and a back electrode (not shown) is provided on the outer surface of the insulating substrate 2 in the longitudinal direction.
  • an edge electrode (not shown) is provided to electrically connect the second electrode 4 and a back electrode (not shown).
  • the resistor 5 is formed by printing a thick film material made of copper nickel, silver palladium, or ruthenium oxide between the first electrode 3 and the second electrode 4 on the surface 2A of the insulating substrate 2, and then baking the material. and connected to the first electrode 3 and the second electrode 4 .
  • both ends of the resistor 5 are formed on the upper surfaces of both ends of the first electrode 3 and the second electrode 4, but they may be formed on the lower surfaces of both ends.
  • the resistor 5 has a first connection portion 31 , a second connection portion 32 and a resistance value adjustment portion 12 .
  • the resistance adjusting part 12 is arranged in the middle of the insulating substrate 2 in the longitudinal direction, that is, separated between the first electrode 3 and the second electrode 4 .
  • the resistance value adjustment portion 12 is a portion where the resistance value of the resistor 5 is adjusted by laser trimming, as will be described later.
  • the edge on the first side in the short direction of the resistance value adjusting portion 12 is called a first edge 121
  • the edge on the second side in the short direction is called a second edge 122 .
  • the first connecting portion 31 includes a first rectangular portion 6 , a second rectangular portion 7 and a third rectangular portion 8 .
  • the first rectangular portion 6 is connected to the first side portion of the first electrode 3 in the transverse direction and extends to the first side in the longitudinal direction.
  • the second rectangular portion 7 extends from the tip of the first rectangular portion 6 to the second side in the transverse direction.
  • the third rectangular portion 8 extends from the tip of the second rectangular portion 7 to the first side in the longitudinal direction and is connected to the resistance value adjusting portion 12 .
  • the second connecting portion 32 includes a fourth rectangular portion 9 , a fifth rectangular portion 10 and a sixth rectangular portion 11 .
  • the fourth rectangular portion 9 is connected to the first side portion of the second electrode 4 in the transverse direction and extends to the second side in the longitudinal direction.
  • the fifth rectangular portion 10 extends from the tip of the fourth rectangular portion 9 to the second side in the transverse direction.
  • the sixth rectangular portion 11 extends from the tip of the fifth rectangular portion 10 to the second longitudinal side and is connected to the resistance value adjusting portion 12 .
  • a trimming groove 15 (an example of a meandering groove) is formed in the resistance value adjusting portion 12 .
  • the trimming groove 15 is a groove for forming the resistance value adjusting portion 12 into a meandering shape.
  • the trimming groove 15 includes a first straight portion 16 (an example of a straight portion) extending from the second edge 122 of the resistance value adjusting portion 12 to the first side in the short direction, and a first side end of the first straight portion 16 in the short direction. It has a folded portion 17 (an example of a folded portion) formed in the .
  • the first linear portion 16 extends in the lateral direction.
  • the folded portion 17 has a semicircular arc shape in a plan view from the thickness direction of the insulating substrate 2 .
  • the trimming groove 15 further has a second straight portion 18 extending from the folded portion 17 so as to fold back with respect to the first straight portion 16 .
  • the second straight portion 18 extends parallel to the first straight portion 16 .
  • the first rectangular portion 6, the second rectangular portion 7, the third rectangular portion 8, and the resistance value adjusting portion 12 form a first turn 101 folded back to the first side in the short direction.
  • the fourth rectangular portion 9, the fifth rectangular portion 10, the sixth rectangular portion 11, and the resistance value adjusting portion 12 form a second turn 102 folded back to the first side in the width direction.
  • the trimming groove 15 forms a third turn 103 folded back to the second side in the short direction.
  • a current path having the same width as that of the first rectangular portion 6 and the fourth rectangular portion 9 is formed near the first edge 121 side of the resistance value adjustment portion 12.
  • position at or near imaginary extension line 19 extending in the longitudinal direction from the second lateral side edge of first rectangular portion 6 and fourth rectangular portion 9.
  • the terminal end 181 of the second straight portion 18 is located within the resistance value adjusting portion 12 relative to the imaginary extension line 20 extending in the longitudinal direction from the first lateral side edges of the third rectangular portion 8 and the sixth rectangular portion 11 . It is located on the first side in the short direction.
  • the position of the terminal end 181 of the second linear portion 18 is located at a place where the influence of the resistance value is small. Therefore, the reliability of the load characteristics of the resistor 5 is improved.
  • the location where the resistance value is less affected is the portion where the current distribution density is low in the resistance value adjusting section 12 .
  • the current distribution density is high near the farthest portion (in this embodiment, the folded portion 17) in the extending direction of the trimming groove, so it is preferable that the terminal end 181 is deviated therefrom, and more preferably further apart.
  • the second linear portion 18 is extended so that the terminal end 181 is positioned on the second side in the short direction from the center of the resistance value adjusting portion 12 in the short direction.
  • electrode paste is screen-printed on both ends of the insulating substrate 2 made of alumina in the longitudinal direction and fired at 850°C to form the first electrode 3 and the second electrode 4. do.
  • a resistor paste is screen-printed between the first electrode 3 and the second electrode 4 and fired at 850° C. to form the resistor 5 .
  • a trimming groove 15 is formed in order to form the resistance value adjusting portion 12 into a meandering shape by laser trimming.
  • the resistor 5 has a meandering shape with three turns.
  • the arrow (black) in FIG. 1 indicates the direction of laser trimming.
  • the trimming groove 15 since the trimming groove 15 has the folded portion 17, microcracks are less likely to occur in the forwardmost portion of the trimming groove 15 in the extending direction.
  • the folded portion 17 since the folded portion 17 has a semicircular arc shape, the above effect is enhanced.
  • the terminal end 181 of the trimming groove 15 can be arranged at a position away from the folded portion 17 in the lateral direction. Since the terminal end 181 of the second linear portion 18 is arranged at a position where the influence of the resistance value is small in the resistance value adjusting portion 12 in this way, even if a microcrack occurs near the terminal end 181, the resistance value does not easily fluctuate.
  • the second embodiment discloses a chip resistor 1A in which one resistance adjusting groove is formed in the resistor in addition to the meandering forming groove.
  • it since it demonstrates centering around difference with 1st Embodiment, it abbreviate
  • a first trimming groove 15A (an example of a meandering groove) is formed in the resistance value adjusting portion 12A.
  • the first trimming groove 15A is a groove for forming the resistance value adjusting portion 12A into a meandering shape.
  • the first trimming groove 15A includes a first linear portion 16A (an example of a linear portion) extending from a second edge 122 of the resistance value adjusting portion 12A to the first side in the short direction, and a first straight portion 16A extending in the first width direction of the first straight portion 16A. and a first folded portion 17A (an example of a folded portion) formed at the side end.
  • the first linear portion 16A extends in the lateral direction.
  • the first folded portion 17A has a semicircular arc shape when viewed from above in the thickness direction of the insulating substrate 2 .
  • the first trimming groove 15A further has a second straight portion 18A extending from the first folded portion 17A so as to fold back with respect to the first straight portion 16A.
  • the second straight portion 18A extends parallel to the first straight portion 16A.
  • the first rectangular portion 6, the second rectangular portion 7, the third rectangular portion 8, and the resistance value adjusting portion 12A form a first turn 101A folded back to the first side in the short direction.
  • the fourth rectangular portion 9, the fifth rectangular portion 10, the sixth rectangular portion 11, and the resistance value adjusting portion 12A form a second turn 102A folded back to the first side in the short direction.
  • the first trimming groove 15A forms a third turn 103A that folds back to the second side in the transverse direction.
  • a second trimming groove 21A (an example of a resistance value adjusting groove) is formed in the resistance value adjusting portion 12A of the chip resistor 1A.
  • the second trimming groove 21A is a groove for adjusting the resistance value of the resistance value adjusting portion 12A.
  • 21 A of 2nd trimming grooves are arrange
  • the second trimming groove 21A includes a third linear portion 22A (an example of a resistance value adjusting linear portion) extending from the second edge 122 of the resistance value adjusting portion 12A to the first side in the width direction, and a short portion of the third linear portion 22A. and a second folded portion 23A (an example of a folded portion for resistance value adjustment) formed at the first side end in the hand direction.
  • the third linear portion 22A extends in the lateral direction.
  • the second folded portion 23A has a semicircular arc shape in a plan view from the thickness direction of the insulating substrate 2 .
  • the second trimming groove 21A further has a fourth straight portion 24A that extends from the second folded portion 23A so as to fold back with respect to the third straight portion 22A.
  • the fourth straight portion 24A extends parallel to the third straight portion 22A.
  • the position of the apex of the first folded portion 17A of the first trimming groove 15A in the lateral direction is such that the current path having the same width as the first rectangular portion 6 and the fourth rectangular portion 9 is the resistance value adjusting portion 12A. (the same position as or near the imaginary extension line 19 of the second side edge in the short direction of the first rectangular portion 6 and the fourth rectangular portion 9).
  • the terminal end 18A1 of the second straight portion 18A is located within the resistance value adjusting portion 12A relative to the imaginary extension line 20 extending in the longitudinal direction from the first lateral side edges of the third rectangular portion 8 and the sixth rectangular portion 11. It is located on the first side in the short direction.
  • the area A1 is set as a place where the influence of the resistance value is small.
  • a region A1 is a region from the center of the resistance value adjusting portion 12A in the short direction to the second edge 122. As shown in FIG. That is, the terminal end 18A1 is preferably located on the second side in the widthwise direction of the center of the resistance value adjustment portion 12A in the widthwise direction.
  • the apex of the second folded portion 23A of the second trimming groove 21A is located on the second side in the transverse direction from the apex of the first folded portion 17A of the first trimming groove 15A. Further, the terminal end 24A1 of the fourth linear portion 24A is located on the second side in the short direction of the imaginary extension line 20 in the resistance value adjusting portion 12A.
  • a region A2 is set as a place where the influence of the resistance value is small.
  • a region A2 is a region from the imaginary extension line 20 to the second edge 122 .
  • a third embodiment will be described with reference to FIG.
  • the third embodiment discloses a chip resistor 1B in which two resistance adjusting grooves are formed in the resistor in addition to the meandering grooves.
  • symbol is attached
  • the first connecting portion 31 is the same as in the first and second embodiments, but the second connecting portion 32B is different from the first and second embodiments, and only the rectangular portion 9B is consists of The rectangular portion 9B is connected to the second lateral side portion of the resistance value adjusting portion 12B.
  • a first trimming groove 15B (an example of a meandering groove) is formed in the resistance value adjusting portion 12B of the chip resistor 1B.
  • the first trimming groove 15B is a groove for forming the resistance value adjusting portion 12B into a meandering shape.
  • the first trimming groove 15B includes a first straight portion 16B (an example of a straight portion) extending from the second edge 122 of the resistance value adjusting portion 12B to the first side in the short direction, and a first straight portion 16B extending in the first short direction of the first straight portion 16B. and a first folded portion 17B (an example of a folded portion) formed at the side end.
  • the first linear portion 16B extends in the lateral direction.
  • the first folded portion 17B has a semi-circular arc shape when viewed from above in the thickness direction of the insulating substrate 2 .
  • the first trimming groove 15B further has a second straight portion 18B that extends from the first folded portion 17B so as to fold back with respect to the first straight portion 16B.
  • the second straight portion 18B extends parallel to the first straight portion 16B.
  • the second linear portion 18B has a terminal end 18B1 within the resistance value adjusting portion 12B.
  • a second trimming groove 21B (an example of a resistance value adjusting groove) is formed in the resistance value adjusting portion 12B of the chip resistor 1A.
  • the second trimming groove 21B is a groove for adjusting the resistance value of the resistance value adjusting portion 12B.
  • the second trimming groove 21B includes a third straight portion 22B (an example of a resistance value adjusting straight portion) extending from the first edge 121 of the resistance value adjusting portion 12B to the second side in the short direction, and a short length of the third straight portion 22B. and a second folded portion 23B (an example of a folded portion for resistance value adjustment) formed at the second side end in the hand direction.
  • the second folded portion 23B has a semicircular arc shape in a plan view from the thickness direction of the insulating substrate 2 .
  • the second trimming groove 21B further has a fourth straight portion 24B extending from the second folded portion 23B so as to fold back toward the third straight portion 22B.
  • the fourth straight portion 24B extends parallel to the third straight portion 22B.
  • the fourth linear portion 24B has a terminal end 24B1 within the resistance value adjusting portion 12B.
  • a third trimming groove 25B (an example of a resistance value adjusting groove) is formed in the resistance value adjusting portion 12B of the chip resistor 1B.
  • the third trimming groove 25B is a groove for adjusting the resistance value of the resistance value adjusting portion 12B.
  • the third trimming groove 25B includes a fifth linear portion 26B (an example of a resistance value adjusting linear portion) extending from the second edge 122 of the resistance value adjusting portion 12B to the first side in the transverse direction, and a short portion of the fifth linear portion 26B. and a third folded portion 27B (an example of a folded portion for resistance value adjustment) formed at the first side end in the hand direction.
  • the fifth straight portion 26B extends in the lateral direction.
  • the third folded portion 27B has a semicircular arc shape when viewed from the thickness direction of the insulating substrate 2 in a plan view.
  • the third trimming groove 25B further has a sixth straight portion 28B that extends from the third folded portion 27B so as to fold toward the fifth straight portion 26B.
  • the sixth straight portion 28B extends parallel to the fifth straight portion 26B.
  • the sixth linear portion 28B has a terminal end 28B1 within the resistance value adjusting portion 12B.
  • the lateral position of the vertex 17B1 of the first folded portion 17B of the first trimming groove 15B is such that the current path having the same width as that of the first rectangular portion 6 is the first edge 121 of the resistance value adjusting portion 12B. It is a position formed in the vicinity of the side (a position that is the same as or near the imaginary extension line 19 extending in the longitudinal direction from the second lateral side edge of the first rectangular portion 6).
  • the terminal end 18B1 of the second straight portion 18B is located in the resistance value adjusting portion 12B in the short direction from the imaginary extension line 20 extending in the longitudinal direction from the first side edge in the short direction of the third rectangular portion 8 and the rectangular portion 9B. It is located on the second side of the direction.
  • the area B1 is set as a place where the influence of the resistance value is small.
  • a region B ⁇ b>1 is a region from the imaginary extension line 20 to the second edge 122 .
  • a current path having the same width as that of the third rectangular portion 8 and the rectangular portion 9B is formed near the second edge 122 of the resistance value adjusting portion 12B at the lateral position of the vertex of the second folded portion 23B of the second trimming groove 21B. (the same position as or near the imaginary extension line 19 extending in the longitudinal direction from the first side edge in the short direction of the third rectangular portion 8 and the rectangular portion 9B).
  • a terminal end 24B1 of the fourth linear portion 24B is located on the first side in the short direction of the imaginary extension line 19 in the resistance value adjusting portion 12B.
  • a region B2 is set as a place where the influence of the resistance value is small.
  • a region B ⁇ b>2 is a region from the imaginary extension line 19 to the first edge 121 .
  • the lateral position of the vertex of the third folded portion 27B of the third trimming groove 25B is on the first side in the lateral direction of the vertex of the second folded portion 23B of the second trimming groove 21B.
  • a terminal end 28B1 of the sixth straight portion 28B is located within the region B1. Therefore, it is possible to suppress the resistance value fluctuation after the resistance value correction, thereby improving the resistance value accuracy.
  • the folded portion of the trimming groove is not limited to a semicircular arc shape. However, it is preferable that the folded portion has no corners and is smooth.
  • the folding side (which side in the lateral direction) of the folding portion of the trimming groove is not particularly limited.
  • the number of trimming grooves is not particularly limited.
  • the direction in which the plurality of trimming grooves extend is not particularly limited.
  • the length and thickness of the trimming groove are not particularly limited.
  • the presence or absence and length of the second straight portion are not particularly limited.
  • At least one of the plurality of trimming grooves must have a folded portion, but there may be trimming grooves that do not have a folded portion.
  • the chip resistor 1C has an insulating substrate 2 (an example of a substrate), a first electrode 3, a second electrode 4, and a resistor 5C.
  • the insulating substrate 2 is made of, for example, alumina containing 96% Al 2 O 3 and has a rectangular shape (rectangular when viewed from above).
  • the horizontal direction in FIG. 4 is defined as the longitudinal direction
  • the vertical direction in FIG. 4 is the first side in the longitudinal direction
  • the left side in FIG. 4 is the second side in the longitudinal direction
  • the upper side in FIG. 4 is the first side in the transverse direction
  • the lower side in FIG. side is orthogonal to each other.
  • the first electrode 3 and the second electrode 4 are provided at both ends in the longitudinal direction of the surface 2A of the insulating substrate 2, and are formed by printing and baking a thick film material containing metal such as silver.
  • a pair of rear surface electrodes (not shown) are formed on the rear surface of the insulating substrate 2 so as to be spaced apart from each other by a predetermined distance.
  • an edge electrode (not shown) for electrically connecting the first electrode 3 and a back electrode (not shown) is provided on the outer surface of the insulating substrate 2 in the longitudinal direction.
  • an edge electrode (not shown) is provided to electrically connect the second electrode 4 and a back electrode (not shown).
  • the resistor 5C is formed by printing a thick film material made of copper nickel, silver palladium, or ruthenium oxide between the first electrode 3 and the second electrode 4 on the surface 2A of the insulating substrate 2, and then baking the material. and connected to the first electrode 3 and the second electrode 4 .
  • both ends of the resistor 5C are formed on the upper surfaces of both ends of the first electrode 3 and the second electrode 4, but they may be formed on the lower surfaces of both ends.
  • the resistor 5C is arranged in the middle of the insulating substrate 2 in the longitudinal direction, that is, between the first electrode 3 and the second electrode 4 .
  • 5 C of resistors are rectangles elongated in the left-right direction in top view.
  • the resistance value of the resistor 5C is adjusted by laser trimming as will be described later.
  • the edge on the first side in the short direction of the resistor 5D is defined as the first edge 5C1
  • the edge on the second side in the short direction is the second edge 5C2 (an example of an edge along the direction in which the pair of electrodes are arranged in the resistor). ).
  • a trimming groove 15C is formed in the resistor 5C.
  • the trimming groove 15C is formed at the first straight portion 16C (an example of the straight portion) extending from the second edge 5C2 of the resistor 5C to the first side in the short direction, and at the first side end in the short direction of the first straight portion 16C.
  • folded portion 17C (an example of the folded portion).
  • the first linear portion 16C extends in the lateral direction.
  • the folded portion 17C has a shape having a curvature in plan view from the thickness direction of the insulating substrate 2 .
  • a conventional chip resistor for example, in the case of an I-shaped trimming groove, current concentration occurs near the tip of the trimming groove, and heat is generated in the narrowed portion of the resistance path, resulting in deterioration of the resistor. , and as a result, there is a problem that the pulse characteristics are deteriorated.
  • power concentration occurs at the corners and near the tip of the L-shape, and heat is generated in the narrowed portion of the resistance path. There was a problem that the body deteriorated and, as a result, the pulse characteristics deteriorated.
  • the trimming groove 15C has the first straight portion 16C and the bent portion 17C having a curvature, so that excessive load concentration can be prevented when current flows. A long correction length of the groove can be secured. Therefore, it is possible to realize a high resistance value correction magnification while improving load characteristics.
  • the trimming groove 15C further has a second straight portion 18C extending from the folded portion 17C so as to fold back with respect to the first straight portion 16C.
  • the second straight portion 18C extends parallel to the first straight portion 16C. Note that "the second straight portion 18C is parallel to the first straight portion 16C" includes a state of being inclined by 2 to 3 degrees.
  • the resistance value can be precisely adjusted to a desired value by the second linear portion 18C while maintaining a high pulse resistance characteristic.
  • the folded portion 17C includes an arc portion, and in the arc portion, the angle of the portion connected to the first straight portion 16C with respect to the first straight portion 16C exceeds 90 degrees and is 180 degrees or less. Due to the action of the arc portion of the folded portion 17C, load concentration is less likely to occur than in conventional chip resistors, and therefore the pulse characteristics of the chip resistor 1C are improved.
  • the arc portion of the folded portion 17C includes a semicircle, and the diameter d1 of the semicircle is 1/10 or more of the width W2 (length in the lateral direction) of the resistor 5C.
  • the length W1 of the trimming groove 15C is 75% or less of the width W2 of the resistor 5C.
  • the position of the terminal end 18C1 of the second straight portion 18C is located at a place where the influence of the resistance value is small. Therefore, the reliability of load characteristics is improved in the resistor 5C.
  • the place where the resistance value is less affected is the part where the current distribution density is low in the resistor 5C.
  • the current distribution density is high near the farthest portion (in this embodiment, the folded portion 17C) of the trimming groove in the extending direction, so it is preferable that the terminal end 18C1 is deviated therefrom, and more preferably further apart.
  • electrode paste is screen-printed on both longitudinal ends of the insulating substrate 2 made of alumina, and fired at, for example, 850°C to form the first electrode 3 and the second electrode 4. Form.
  • a resistor paste is screen-printed between the first electrode 3 and the second electrode 4, and fired at 850°C to form the resistor 5C.
  • a trimming groove 15C is formed in the resistor 5C by laser trimming.
  • a fifth embodiment will be described with reference to FIG. A fifth embodiment discloses a chip resistor 1D in which two trimming grooves extend from the same edge of the resistor.
  • description is suitably abbreviate
  • a first trimming groove 15D1 (an example of a trimming groove) is formed in the resistor 5D.
  • the first trimming groove 15D1 includes a first linear portion 16D1 (a linear portion, an example of the first linear portion) extending from the second edge 5D2 of the resistor 5D to the first side in the width direction, and a width of the first linear portion 16D1. and a first folded portion 17D1 (an example of a folded portion) formed at the first direction side end.
  • the first folded portion 17D1 has a shape having a curvature in plan view from the thickness direction of the insulating substrate 2 .
  • the first trimming groove 15D1 further has a second straight portion 18D1 (an example of a second straight portion) extending from the first folded portion 17D1 so as to fold back with respect to the first straight portion 16D1.
  • the second straight portion 18D1 extends parallel to the first straight portion 16D1.
  • a second trimming groove 15D2 (an example of a trimming groove) is formed in the resistor 5D of the chip resistor 1D.
  • the second trimming groove 15D21 is arranged on the first longitudinal side (right side in FIG. 5) of the first trimming groove 15D1.
  • the second trimming groove 15D2 includes a third linear portion 16D2 (a linear portion, an example of the first linear portion) extending from the second edge 5D2 of the resistor 5D to the first side in the width direction, and a width of the third linear portion 16D2. and a second folded portion 17D2 (an example of a folded portion) formed at the first direction side end.
  • the third linear portion 16D2 extends in the lateral direction.
  • the second folded portion 17D2 has a shape having a curvature in plan view from the thickness direction of the insulating substrate 2 .
  • the first folded portion 17D1 of the first trimming groove 15D1 extends from the first straight portion 16D1 to the first side in the longitudinal direction
  • the second folded portion 17D2 of the second trimming groove 15D2 extends from the third straight portion 16D2 in the longitudinal direction. extending to the second side. In other words, both folded portions are folded back to face each other.
  • the second trimming groove 15D2 further has a fourth straight portion 18D2 (an example of a second straight portion) extending from the second folded portion 17D2 so as to fold back to the third straight portion 16D2.
  • the fourth linear portion 24D1 extends parallel to the third linear portion 16D2.
  • the chip resistor 1D since the chip resistor 1D has two trimming grooves, load concentration can be further suppressed. Therefore, the adjustment range of the resistance value of the chip resistor 1D is increased (the resistance value correction rate can be increased).
  • the length of the second trimming groove 15D2 in the widthwise direction is shorter than the length of the first trimming groove 15D1 in the widthwise direction. Furthermore, the fourth straight portion 18D2 of the second trimming groove 15D2 is shorter than the second straight portion 18D1 of the first trimming groove 15D1.
  • FIG. 1E A sixth embodiment will be described with reference to FIG.
  • the sixth embodiment discloses a chip resistor 1E with two trimming grooves extending from different edges of the resistor.
  • description is suitably abbreviate
  • a first trimming groove 15E1 (an example of a trimming groove) is formed in the resistor 5E.
  • the first trimming groove 15E1 includes a first straight portion 16E1 (a straight portion, an example of the first straight portion) extending from the second edge 5E2 of the resistor 5E to the first side in the short direction, and a short side of the first straight portion 16E1. and a first folded portion 17E1 (an example of a folded portion) formed at the first direction side end.
  • the first folded portion 17E1 has a shape having a curvature in plan view from the thickness direction of the insulating substrate 2 .
  • the first trimming groove 15E1 further has a second straight portion 18E1 (an example of a second straight portion) extending from the first folded portion 17E1 so as to fold back with respect to the first straight portion 16E1.
  • the second straight portion 18E1 extends parallel to the first straight portion 16E1.
  • a second trimming groove 15E2 (an example of a trimming groove) is formed in the resistor 5E of the chip resistor 1E.
  • the second trimming groove 15E2 is arranged on the first longitudinal side (right side in FIG. 6) of the first trimming groove 15E1.
  • the second trimming groove 15E2 includes a third straight portion 16E2 (a straight portion, an example of the first straight portion) extending from the first edge 5E1 of the resistor 5E to the second side in the short direction, and a short side of the third straight portion 16E2. and a second folded portion 17E2 (an example of a folded portion) formed at the first direction side end.
  • the third linear portion 16E2 extends in the lateral direction.
  • the second folded portion 17E2 has a shape having a curvature in plan view from the thickness direction of the insulating substrate 2 .
  • the first folded portion 17E1 of the first trimming groove 15E1 extends from the first straight portion 16E1 to the first side in the longitudinal direction
  • the second folded portion 17E2 of the second trimming groove 15E2 extends from the third straight portion 16E2 in the longitudinal direction. extending to the second side. In other words, both folded portions are folded back toward each other.
  • the second trimming groove 15E2 further has a fourth straight portion 18E2 (an example of a second straight portion) extending from the second folded portion 17E2 so as to fold back to the third straight portion 16E2.
  • the fourth straight portion 18E2 extends parallel to the third straight portion 16E2.
  • the chip resistor 1E has two trimming grooves, so load concentration can be further suppressed. Therefore, the adjustment range of the resistance value of the chip resistor 1E is increased (the resistance value correction rate can be increased).
  • the two trimming grooves extend from different edges of the resistor 5E. Line length can be lengthened. As a result, the correction width of the resistance value can be doubled or longer.
  • the folded portion of the trimming groove has a semicircular shape, but it is not limited to a semicircular shape as long as it has a curvature.
  • the second straight portion of the trimming groove is parallel to the first straight portion, but the extending direction is not limited as long as it is folded back with respect to the first straight portion. .
  • a trimming groove 15F (an example of a trimming groove) is formed in the resistor 5F.
  • the trimming groove 15F is formed at the first straight portion 16F (an example of the straight portion) extending from the second edge 5F2 of the resistor 5F to the first side in the short direction, and at the first side end in the short direction of the first straight portion 16F.
  • folded portion 17F (an example of the folded portion).
  • the folded portion 17 ⁇ /b>F has a shape having a curvature in plan view from the thickness direction of the insulating substrate 2 .
  • the folded portion 17F includes an arc but is not semicircular.
  • the trimming groove 15F further has a second straight portion 18F (an example of a second straight portion) extending from the folded portion 17F so as to fold back with respect to the first straight portion 16F.
  • the second straight portion 18F extends at an angle with respect to the first straight portion 16F. Specifically, the second straight portion 18F separates from the first straight portion 16F toward the first side in the longitudinal direction as it goes to the second side in the short direction. It extends like
  • the folded portion of the trimming groove is not limited to a semicircular shape.
  • the folding side (which side in the lateral direction) of the folding portion of the trimming groove is not particularly limited.
  • the number of trimming grooves is not particularly limited.
  • the direction in which the plurality of trimming grooves extend is not particularly limited.
  • the length and thickness of the trimming groove are not particularly limited.
  • the presence or absence and length of the second straight portion are not particularly limited.
  • At least one of the plurality of trimming grooves must have a folded portion, but there may be trimming grooves that do not have a folded portion.
  • the folded portion may be formed separately.
  • a chip resistor (1, 1A, 1B) according to the first aspect comprises a substrate (2), a pair of electrodes (3, 4), and resistors (5, 5A, 5B).
  • a pair of electrodes (3, 4) are provided at both ends of one surface (2A) of the substrate (2).
  • a resistor (5, 5A, 5B) is provided between a pair of electrodes (3, 4) on one surface (2A) of the substrate (2).
  • the resistors (5, 5A, 5B) have a pair of connection portions (31, 32) and resistance value adjustment portions (12, 12A, 12B).
  • a pair of connection portions (31, 32) are connected to a pair of electrodes (3, 4), respectively.
  • the resistance value adjusting portions (12, 12A, 12B) are provided between the pair of connecting portions (31, 32).
  • Meandering forming grooves (15, 15A, 15B) are formed in the resistance value adjusting portions (12, 12A, 12B) to form the resistance value adjusting portions (12, 12A, 12B) in a meandering shape.
  • the meandering grooves (15, 15A, 15B) are composed of linear portions (16, 16A, 16B) extending from the edges (122) of the resistance value adjusting portions (12, 12A, 12B) and linear portions (16, 16A, 16B). and a folded portion (17, 17A, 17B) formed at one end of the .
  • microcracks are formed in the furthest portions of the meandering grooves (15) in the extending direction. is less likely to occur.
  • the folded portions (17, 17A, 17B) are semicircular in plan view from the thickness direction of the substrate (2). be.
  • the folded portions (17, 17A, 17B) have a semicircular arc shape, microcracks are less likely to occur in the furthest portion of the extending direction of the meandering grooves (15, 15A, 15B).
  • the meandering grooves (15, 15A, 15B) extend from the folded portions (17, 17A, 17B) as straight portions. It further has a second straight portion (18, 18A, 18B) extending so as to fold back with respect to the first straight portion (16, 16A, 16B).
  • the second straight portions (18, 18A, 18B) have ends (181, 18A1, 18B1) within the resistance adjusting portions (12, 12A, 12B).
  • the meandering grooves (15, 15A, 15B) have the second straight portions (18, 18A, 18B) extending from the folded portions (17, 17A, 17B)
  • the meandering grooves ( 15, 15A, 15B) ends (181, 18A1, 18B1) can be arranged at positions separated in the lateral direction from the folded portions (17, 17A, 17B).
  • the terminal ends (181, 18A1, 18B1) can be separated from the vicinity of the folded portions (17, 17A, 17B) where the current distribution density is high, so microcracks occurred near the terminal ends (181, 18A1, 18B1). Even if the
  • the terminal end (181, 18A1, 18B1) of the second linear portion (18, 18A, 18B) is the resistance value adjusting portion (12 , 12A and 12B) at a position where the influence of the resistance value is small.
  • the terminal ends (181, 18A1, 18B1) of the second linear portions (18, 18A, 18B) are arranged at positions where the influence of the resistance value is small in the resistance value adjusting portions (12, 12A, 12B). Therefore, even if microcracks occur near the ends (181, 18A1, 18B1), the resistance value does not fluctuate easily.
  • the resistance value adjuster (12A, 12B) has the resistance value of the resistance value adjuster (12A, 12B) are formed with resistance value adjusting grooves (21A, 21B, 25B) for adjusting the .
  • the resistance value adjusting grooves (21A, 21B, 25B) include resistance value adjusting linear portions (22A, 22B, 26B) extending from the edges (121, 122) of the resistance value adjusting portions (12A, 12B) and resistance value adjusting grooves (22A, 22B, 26B). It has folded portions (23A, 23B, 27B) for resistance value adjustment formed at one end of the linear portions (22A, 22B, 26B).
  • the resistance value adjusting grooves (21A, 21B, 25B) have the resistance value adjusting folded portions (23A, 23B, 27B), the resistance value adjusting grooves (21A, 21B, 25B) Microcracks are less likely to occur at the farthest portion in the stretching direction.
  • a chip resistor (1C, 1D, 1E, 1F) according to a sixth aspect comprises a substrate (2), a pair of electrodes (3, 4), and resistors (5C, 5D, 5E, 5F) there is A pair of electrodes (3, 4) are provided at both ends of one surface (2A) of the substrate (2). Resistors (5C, 5D, 5E, 5F) are provided between a pair of electrodes (3, 4) on one surface (2A) of the substrate (2). Trimming grooves (15C, 15D1, 15D2, 15E1, 15E2, 15F) are formed in the resistors (5C, 5D, 5E, 5F).
  • the trimming grooves (15C, 15D1, 15D2, 15E1, 15E2, 15F) are the edges (5C2, 5D1, 5D2, 5E1, 5E2, 5C2, 5D1, 5D2, 5E1, 5E2, 5F2) extending from (16C, 16D1, 16D2, 16E1, 16E2, 16F), and formed at one end of the straight portions (16C, 16D1, 16D2, 16E1, 16E2, 16F) in the thickness direction of the substrate (2). It has folded portions (17C, 17D1, 17D2, 17E1, 17E2) that are folded so as to have a shape having a curvature when viewed from above.
  • trimming grooves (15C, 15D1, 15D2, 15E1) having linear portions (16C, 16D1, 16D2, 16E1, 16E2, 16F) and curved folded portions (17C, 17D1, 17D2, 17E1, 17E2) , 15E2, 15F) provide good control of current flow in resistors (5C, 5D, 5E, 5F) and prevent excessive load concentration when current flows. As a result, the pulse resistance of the chip resistors (1C, 1D, 1E, 1F) is improved.
  • the trimming grooves (15C, 15D1, 15D2, 15E1, 15E2) has a second linear portion (18C, 18D1, 18D2, 18E1, 18E2) extending parallel to the first linear portion as a linear portion (16C, 16D1, 16D2, 16E1, 16E2) from one end of the .
  • the second linear portions (18C, 18D1, 18D2, 18E1, 18E2) can accurately adjust the resistance value to a desired value while maintaining high pulse resistance characteristics.
  • the length (W1) of the trimming grooves (15C, 15D1, 15D2, 15E1, 15E2, 15F) is 75% or less of the length (W2) of the resistors (5C, 5D, 5E, 5F) be.
  • a plurality of trimming grooves (15D1, 15D2, 15E1, 15E2) are formed.
  • the chip resistors (1D, 1E) have a plurality of trimming grooves (15D1, 15D2, 15E1, 15E2), load concentration can be further suppressed. Therefore, the adjustment range of the resistance values of the chip resistors (1D, 1E) is increased.
  • the plurality of trimming grooves (15E1, 15E2) are arranged along the direction in which the pair of electrodes (3, 4) of the resistor (5E) are aligned. extending from each of the two edges (5E1, 5E2).
  • the resistor (5E) can be trimmed without causing large load concentrations.
  • the meandering shape allows the line length to be lengthened. As a result, the correction width of the resistance value can be doubled or longer.
  • the folded portion (17C, 17D1, 17D2, 17E1, 17E2, 17F) is at least partially It has an arc portion.
  • the pulse resistance of the chip resistors (1C, 1D, 1E, 1F) is improved.
  • the arc portions of the folded portions (17C, 17D1, 17D2, 17E1, 17E2, 17F) are linear portions (16C, 16D1 , 16D2, 16E1, 16E2, 16F) with respect to the straight line portion (16C, 16D1, 16D2, 16E1, 16E2, 16F) is more than 90 degrees and 180 degrees or less.
  • the pulse resistance of the chip resistors (1C, 1D, 1E, 1F) is improved.
  • the arc portion includes a semicircle.
  • the diameter (D) of the semicircle is 1/10 or more of the length (W2) of the resistors (5C, 5D, 5E) in the direction crossing the direction in which the pair of electrodes (3, 4) are arranged.
  • the pulse resistance of the chip resistors (1C, 1D, 1E) is improved.
  • 1, 1A, 1B, 1C, 1D, 1E, 1F chip resistor 2: insulating substrate 2A: surface 3: first electrode 4: second electrode 5, 5A, 5B, 5C, 5D, 5E, 5F: resistor 12, 12A, 12B: resistance value adjusting portion 15: trimming grooves 15A, 15B, 15D1, 16E1: first trimming groove 15C: trimming grooves 15D2, 16E2: second trimming groove 16: first linear portions 16A, 16B, 16C, 16D1, 16E1: first straight portions 16D2, 16E2: third straight portions 17, 17C: folded portions 17A, 17B, 17D1, 17E1: first folded portions 17D2, 17E2: second folded portions 18, 18A, 18B, 18C, 18D1, 18E1: Second straight portions 18D2, 18E2: Fourth straight portions 181, 18A1, 18B1: Terminal ends 21A, 21B: Second trimming grooves 22A, 22B: Third straight portion 26B: Fifth straight portion 27B: Third folded back Part 28B: sixth straight part

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Abstract

The purpose of the present invention is to provide a highly reliable chip resistor. In a chip resistor (1), a resistive element (5) includes a first connection part (31), a second connection part (32), and a resistance value adjustment unit (12). The resistance value adjustment unit (12) is provided between the first connection part (31) and the second connection part (32). A trimming groove (15) for shaping the resistance value adjustment unit (12) into a meandering shape is formed in the resistance value adjustment unit (12). The trimming groove (15) includes a first linear section (16) extending from an edge of the resistance value adjustment unit (12) and a folded-back section (17) formed on one end of the first linear section.

Description

チップ抵抗器chip resistor
　本開示は、一般にチップ抵抗器に関し、より詳細には、一対の電極と抵抗体とを備えるチップ抵抗器に関する。 TECHNICAL FIELD The present disclosure relates generally to chip resistors, and more particularly to chip resistors comprising a pair of electrodes and a resistor.
　特許文献１には、Ｓ字部と両端の矩形部を有する抵抗体において、矩形部に直線状のトリミング溝が形成された抵抗器が開示されている。 Patent Document 1 discloses a resistor having an S-shaped portion and rectangular portions at both ends, in which linear trimming grooves are formed in the rectangular portions.
特開２００１－３３８８０１号公報Japanese Patent Application Laid-Open No. 2001-338801
　特許文献１に記載のチップ抵抗器では、トリミング溝（蛇行形成溝）の終端付近にマイクロクラックが発生する可能性がある。マイクロクラックが発生すると、抵抗値の負荷による抵抗値変動が引き起こされて、チップ抵抗器の信頼性が低下する。 In the chip resistor described in Patent Document 1, microcracks may occur near the end of the trimming groove (meandering groove). When microcracks occur, resistance value fluctuations are caused by the load of the resistance value, and the reliability of the chip resistor is lowered.
　本開示の目的は、信頼性が高いチップ抵抗器を提供することにある。 An object of the present disclosure is to provide a highly reliable chip resistor.
　本開示の一態様に係るチップ抵抗器は、基板と、一対の電極と、抵抗体とを備えている。前記一対の電極は、前記基板の一面の両端に設けられている。前記抵抗体は、前記基板の前記一面において前記一対の電極の間に設けられている。前記抵抗体は、一対の接続部と、抵抗値調整部とを有している。前記一対の接続部は、前記一対の電極にそれぞれ接続されている。前記抵抗値調整部は、前記一対の接続部の間に設けられている。前記抵抗値調整部には、前記抵抗値調整部を蛇行形状とするための蛇行形成溝が形成されている。前記蛇行形成溝は、前記抵抗値調整部の縁から延びる直線部と、前記直線部の一端に形成された折り返し部とを有している。 A chip resistor according to one aspect of the present disclosure includes a substrate, a pair of electrodes, and a resistor. The pair of electrodes are provided at both ends of one surface of the substrate. The resistor is provided between the pair of electrodes on the one surface of the substrate. The resistor has a pair of connecting portions and a resistance adjusting portion. The pair of connection portions are connected to the pair of electrodes, respectively. The resistance adjusting section is provided between the pair of connecting sections. A meandering formation groove is formed in the resistance value adjusting portion to form the resistance value adjusting portion in a meandering shape. The meandering groove has a linear portion extending from the edge of the resistance value adjusting portion and a folded portion formed at one end of the linear portion.
　本開示の他の態様に係るチップ抵抗器は、基板と、一対の電極と、抵抗体とを備えている。前記一対の電極は、前記基板の一面の両端に設けられている。前記抵抗体は、前記基板の前記一面において前記一対の電極の間に設けられている。前記抵抗体には、トリミング溝が形成されている。前記トリミング溝は、前記抵抗体における前記一対の電極が並ぶ方向に沿った縁から延びる直線部と、前記直線部の一端に形成され、前記基板の厚さ方向からの平面視において曲率を有する形状となるように折り返された折り返し部と、を有している。 A chip resistor according to another aspect of the present disclosure includes a substrate, a pair of electrodes, and a resistor. The pair of electrodes are provided at both ends of one surface of the substrate. The resistor is provided between the pair of electrodes on the one surface of the substrate. A trimming groove is formed in the resistor. The trimming groove has a linear portion extending from an edge of the resistor along the direction in which the pair of electrodes are arranged, and one end of the linear portion, and has a shape having a curvature in plan view from the thickness direction of the substrate. and a folded portion that is folded back so as to be.
　本開示によれば、信頼性が高いチップ抵抗器が得られる。 According to the present disclosure, a highly reliable chip resistor can be obtained.
図１は、本開示の第１実施形態におけるチップ抵抗器の上面図である。1 is a top view of a chip resistor according to a first embodiment of the present disclosure; FIG. 図２は、本開示の第２実施形態におけるチップ抵抗器の上面図である。FIG. 2 is a top view of a chip resistor according to the second embodiment of the present disclosure; FIG. 図３は、本開示の第３実施形態におけるチップ抵抗器の上面図である。FIG. 3 is a top view of a chip resistor according to a third embodiment of the present disclosure; FIG. 図４は、本開示の第４実施形態におけるチップ抵抗器の上面図である。FIG. 4 is a top view of a chip resistor according to a fourth embodiment of the present disclosure; 図５は、本開示の第５実施形態におけるチップ抵抗器の上面図である。FIG. 5 is a top view of a chip resistor according to the fifth embodiment of the present disclosure; 図６は、本開示の第６実施形態におけるチップ抵抗器の上面図である。FIG. 6 is a top view of a chip resistor according to the sixth embodiment of the present disclosure; 図７は、本開示の第７実施形態におけるチップ抵抗器の上面図である。FIG. 7 is a top view of a chip resistor according to the seventh embodiment of the present disclosure;
　以下、実施形態に係るチップ抵抗器について、図面を参照して説明する。下記の実施形態において説明する各図は模式的な図であり、各構成要素の大きさや厚さそれぞれの比が必ずしも実際の寸法比を反映しているとは限らない。また、下記の実施形態で説明する構成は本開示の一例にすぎない。本開示は、下記の実施形態に限定されず、本開示の効果を奏することができれば、設計等に応じて種々の変更が可能である。 A chip resistor according to an embodiment will be described below with reference to the drawings. Each drawing described in the following embodiments is a schematic drawing, and the ratio of the size and thickness of each component does not necessarily reflect the actual dimensional ratio. Also, the configurations described in the following embodiments are merely examples of the present disclosure. The present disclosure is not limited to the following embodiments, and various modifications are possible according to design and the like as long as the effects of the present disclosure can be achieved.
　（第１実施形態）
　（１）チップ抵抗器の基本構成
　以下、図１を参照しながら、第１実施形態を説明する。第１実施形態は、蛇行形成溝が抵抗体に形成されているチップ抵抗器１を開示している。 (First embodiment)
(1) Basic Configuration of Chip Resistor A first embodiment will be described below with reference to FIG. The first embodiment discloses a chip resistor 1 in which meandering grooves are formed in the resistor.
　チップ抵抗器１は、絶縁基板２（基板の一例）と、第１電極３と、第２電極４、抵抗体５と有している。 The chip resistor 1 has an insulating substrate 2 (an example of a substrate), a first electrode 3 , a second electrode 4 and a resistor 5 .
　絶縁基板２は、例えばＡｌ２Ｏ３を９６％含有するアルミナで構成され、その形状は矩形状（上面視にて長方形）となっている。以後、図１の左右方向を長手方向とし、図１の上下方向を短手方向とする。さらに、図１の右側を長手方向第１側とし、図１の左側を長手方向第２側とし、図１の上側を短手方向第１側とし、図１の下側を短手方向第２側とする。なお、長手方向と短手方向は直交している。 The insulating substrate 2 is made of, for example, alumina containing 96% Al 2 O 3 and has a rectangular shape (rectangular when viewed from above). Hereinafter, the horizontal direction in FIG. 1 is defined as the longitudinal direction, and the vertical direction in FIG. 1 is defined as the lateral direction. 1 is the first side in the longitudinal direction, the left side in FIG. 1 is the second side in the longitudinal direction, the upper side in FIG. 1 is the first side in the transverse direction, and the lower side in FIG. side. In addition, the longitudinal direction and the lateral direction are orthogonal to each other.
　第１電極３及び第２電極４は、絶縁基板２の表面２Ａの長手方向両端部に各々設けられ、銀等の金属を有する厚膜材料を印刷、焼成することによって形成されている。また、絶縁基板２の裏面には、所定の間隔を有するように設けられた一対の裏面電極（図示せず）が形成されている。さらに、絶縁基板２の長手方向の外側面には、第１電極３と裏面電極（図示せず）とを電気的に接続する端面電極（図示せず）を設けている。同様に、第２電極４と裏面電極（図示せず）とを電気的に接続するように、端面電極（図示せず）を設けている。 The first electrode 3 and the second electrode 4 are provided at both ends in the longitudinal direction of the surface 2A of the insulating substrate 2, and are formed by printing and baking a thick film material containing metal such as silver. A pair of rear surface electrodes (not shown) are formed on the rear surface of the insulating substrate 2 so as to be spaced apart from each other by a predetermined distance. Furthermore, an edge electrode (not shown) for electrically connecting the first electrode 3 and a back electrode (not shown) is provided on the outer surface of the insulating substrate 2 in the longitudinal direction. Similarly, an edge electrode (not shown) is provided to electrically connect the second electrode 4 and a back electrode (not shown).
　抵抗体５は、絶縁基板２の表面２Ａにおいて、第１電極３と第２電極４の間に、銅ニッケル、銀パラジウム、または酸化ルテニウムからなる厚膜材料を印刷した後、焼成することによって形成され、第１電極３及び第２電極４に接続されている。なお、図１では、抵抗体５の両端部が第１電極３及び第２電極４の両端部の上面に形成されているが、それらの両端部の下面に形成してもよい。 The resistor 5 is formed by printing a thick film material made of copper nickel, silver palladium, or ruthenium oxide between the first electrode 3 and the second electrode 4 on the surface 2A of the insulating substrate 2, and then baking the material. and connected to the first electrode 3 and the second electrode 4 . In FIG. 1, both ends of the resistor 5 are formed on the upper surfaces of both ends of the first electrode 3 and the second electrode 4, but they may be formed on the lower surfaces of both ends.
　（２）抵抗体
　抵抗体５は、第１接続部３１と、第２接続部３２と、抵抗値調整部１２と、を有している。 (2) Resistor The resistor 5 has a first connection portion 31 , a second connection portion 32 and a resistance value adjustment portion 12 .
　抵抗値調整部１２は、絶縁基板２の長手方向中間、つまり第１電極３と第２電極４の間に離れて配置されている。抵抗値調整部１２は、後述するようにレーザトリミングによって抵抗体５の抵抗値が調整される部分である。なお、抵抗値調整部１２の短手方向第１側の縁を第１縁１２１として、短手方向第２側の縁を第２縁１２２とする。 The resistance adjusting part 12 is arranged in the middle of the insulating substrate 2 in the longitudinal direction, that is, separated between the first electrode 3 and the second electrode 4 . The resistance value adjustment portion 12 is a portion where the resistance value of the resistor 5 is adjusted by laser trimming, as will be described later. The edge on the first side in the short direction of the resistance value adjusting portion 12 is called a first edge 121 , and the edge on the second side in the short direction is called a second edge 122 .
　第１接続部３１は、第１矩形部６と、第２矩形部７と、第３矩形部８と、を含む。第１矩形部６は、第１電極３の短手方向第１側部分に接続され長手方向第１側に延びる。第２矩形部７は、第１矩形部６の先端から短手方向第２側に延びる。第３矩形部８は、第２矩形部７の先端から長手方向第１側に延びて抵抗値調整部１２に接続されている。 The first connecting portion 31 includes a first rectangular portion 6 , a second rectangular portion 7 and a third rectangular portion 8 . The first rectangular portion 6 is connected to the first side portion of the first electrode 3 in the transverse direction and extends to the first side in the longitudinal direction. The second rectangular portion 7 extends from the tip of the first rectangular portion 6 to the second side in the transverse direction. The third rectangular portion 8 extends from the tip of the second rectangular portion 7 to the first side in the longitudinal direction and is connected to the resistance value adjusting portion 12 .
　第２接続部３２は、第４矩形部９と、第５矩形部１０と、第６矩形部１１と、を含む。第４矩形部９は、第２電極４の短手方向第１側部分に接続され長手方向第２側に延びる。第５矩形部１０は、第４矩形部９の先端から短手方向第２側に延びる。第６矩形部１１は、第５矩形部１０の先端から長手方向第２側に延びて抵抗値調整部１２に接続されている。 The second connecting portion 32 includes a fourth rectangular portion 9 , a fifth rectangular portion 10 and a sixth rectangular portion 11 . The fourth rectangular portion 9 is connected to the first side portion of the second electrode 4 in the transverse direction and extends to the second side in the longitudinal direction. The fifth rectangular portion 10 extends from the tip of the fourth rectangular portion 9 to the second side in the transverse direction. The sixth rectangular portion 11 extends from the tip of the fifth rectangular portion 10 to the second longitudinal side and is connected to the resistance value adjusting portion 12 .
　抵抗値調整部１２には、トリミング溝１５（蛇行形成溝の一例）が形成されている。トリミング溝１５は、抵抗値調整部１２を蛇行形状とするための溝である。トリミング溝１５は、抵抗値調整部１２の第２縁１２２から短手方向第１側に延びる第１直線部１６（直線部の一例）と、第１直線部１６の短手方向第１側端に形成された折り返し部１７（折り返し部の一例）とを有している。第１直線部１６は、短手方向に延びている。折り返し部１７は、絶縁基板２の厚さ方向からの平面視において半円弧形状である。 A trimming groove 15 (an example of a meandering groove) is formed in the resistance value adjusting portion 12 . The trimming groove 15 is a groove for forming the resistance value adjusting portion 12 into a meandering shape. The trimming groove 15 includes a first straight portion 16 (an example of a straight portion) extending from the second edge 122 of the resistance value adjusting portion 12 to the first side in the short direction, and a first side end of the first straight portion 16 in the short direction. It has a folded portion 17 (an example of a folded portion) formed in the . The first linear portion 16 extends in the lateral direction. The folded portion 17 has a semicircular arc shape in a plan view from the thickness direction of the insulating substrate 2 .
　トリミング溝１５は、折り返し部１７から第１直線部１６に対して折り返すように延びる第２直線部１８を更に有している。第２直線部１８は、第１直線部１６と平行に延びている。 The trimming groove 15 further has a second straight portion 18 extending from the folded portion 17 so as to fold back with respect to the first straight portion 16 . The second straight portion 18 extends parallel to the first straight portion 16 .
　第１矩形部６、第２矩形部７、第３矩形部８及び抵抗値調整部１２によって、短手方向第１側に折り返す第１ターン１０１が形成されている。第４矩形部９、第５矩形部１０、第６矩形部１１及び抵抗値調整部１２によって、短手方向第１側に折り返す第２ターン１０２が形成されている。トリミング溝１５によって、短手方向第２側に折り返す第３ターン１０３が形成されている。 The first rectangular portion 6, the second rectangular portion 7, the third rectangular portion 8, and the resistance value adjusting portion 12 form a first turn 101 folded back to the first side in the short direction. The fourth rectangular portion 9, the fifth rectangular portion 10, the sixth rectangular portion 11, and the resistance value adjusting portion 12 form a second turn 102 folded back to the first side in the width direction. The trimming groove 15 forms a third turn 103 folded back to the second side in the short direction.
　さらに詳細に説明すれば、折り返し部１７の頂点の位置は、第１矩形部６及び第４矩形部９と同じ幅の電流経路が抵抗値調整部１２の第１縁１２１側付近に形成される位置（第１矩形部６及び第４矩形部９の短手方向第２側縁から長手方向に延びる仮想延長線１９と同じ又は近傍の位置）である。また、第２直線部１８の終端１８１は、抵抗値調整部１２内において、第３矩形部８及び第６矩形部１１の短手方向第１側縁から長手方向に延びる仮想延長線２０よりも短手方向第１側に位置している。 More specifically, at the position of the vertex of the folded portion 17, a current path having the same width as that of the first rectangular portion 6 and the fourth rectangular portion 9 is formed near the first edge 121 side of the resistance value adjustment portion 12. position (at or near imaginary extension line 19 extending in the longitudinal direction from the second lateral side edge of first rectangular portion 6 and fourth rectangular portion 9). In addition, the terminal end 181 of the second straight portion 18 is located within the resistance value adjusting portion 12 relative to the imaginary extension line 20 extending in the longitudinal direction from the first lateral side edges of the third rectangular portion 8 and the sixth rectangular portion 11 . It is located on the first side in the short direction.
　なお、第２直線部１８の終端１８１の位置は、抵抗値影響の少ない場所にある。したがって、抵抗体５において負荷特性の信頼性が向上する。なお、抵抗値影響の少ない場所とは、抵抗値調整部１２に電流分布密度が低い部分である。一般にトリミング溝の延伸方向の最も先の部分（本実施形態では折り返し部１７）付近は電流分布密度が高いので、そこから終端１８１が外れることが好ましく、さらに遠く離れることがさらに好ましい。以上より、この実施形態では、終端１８１が抵抗値調整部１２の短手方向中心より短手方向第２側に位置するように、第２直線部１８が延ばされている。 Note that the position of the terminal end 181 of the second linear portion 18 is located at a place where the influence of the resistance value is small. Therefore, the reliability of the load characteristics of the resistor 5 is improved. Note that the location where the resistance value is less affected is the portion where the current distribution density is low in the resistance value adjusting section 12 . Generally, the current distribution density is high near the farthest portion (in this embodiment, the folded portion 17) in the extending direction of the trimming groove, so it is preferable that the terminal end 181 is deviated therefrom, and more preferably further apart. As described above, in this embodiment, the second linear portion 18 is extended so that the terminal end 181 is positioned on the second side in the short direction from the center of the resistance value adjusting portion 12 in the short direction.
　（３）チップ抵抗器の製造方法
　最初に、アルミナからなる絶縁基板２の長手方向両端部に電極ペーストをスクリーン印刷し、これを８５０℃で焼成して第１電極３及び第２電極４を形成する。 (3) Manufacturing method of chip resistor First, electrode paste is screen-printed on both ends of the insulating substrate 2 made of alumina in the longitudinal direction and fired at 850°C to form the first electrode 3 and the second electrode 4. do.
　次に、第１電極３と第２電極４との間に抵抗ペーストをスクリーン印刷し、これを８５０℃で焼成して抵抗体５を形成する。 Next, a resistor paste is screen-printed between the first electrode 3 and the second electrode 4 and fired at 850° C. to form the resistor 5 .
　次に、レーザトリミングにより抵抗値調整部１２を蛇行形状にするために、トリミング溝１５を形成する。これにより、抵抗体５は３ターンを有する蛇行形状になる。なお、図１の矢印（黒）は、レーザトリミングの向きを示している。 Next, a trimming groove 15 is formed in order to form the resistance value adjusting portion 12 into a meandering shape by laser trimming. As a result, the resistor 5 has a meandering shape with three turns. The arrow (black) in FIG. 1 indicates the direction of laser trimming.
　上記の構成では、トリミング溝１５は折り返し部１７を有しているので、トリミング溝１５の延伸方向の最も先の部分にマイクロクラックが発生しにくい。特に折り返し部１７が半円弧形状であるので、上記効果が高くなる。 In the above configuration, since the trimming groove 15 has the folded portion 17, microcracks are less likely to occur in the forwardmost portion of the trimming groove 15 in the extending direction. In particular, since the folded portion 17 has a semicircular arc shape, the above effect is enhanced.
　さらに、折り返し部１７から延びる第２直線部１８が形成されるので、トリミング溝１５の終端１８１を折り返し部１７から短手方向に離れた位置に配置できる。このように第２直線部１８の終端１８１を抵抗値調整部１２内において抵抗値影響が少ない位置に配置しているので、終端１８１付近にマイクロクラックが生じたとしても抵抗値変動が生じにくい。 Furthermore, since the second straight portion 18 extending from the folded portion 17 is formed, the terminal end 181 of the trimming groove 15 can be arranged at a position away from the folded portion 17 in the lateral direction. Since the terminal end 181 of the second linear portion 18 is arranged at a position where the influence of the resistance value is small in the resistance value adjusting portion 12 in this way, even if a microcrack occurs near the terminal end 181, the resistance value does not easily fluctuate.
　（第２実施形態）
　図２を参照しながら、第２実施形態を説明する。第２実施形態は、蛇行形成溝に加えて１本の抵抗値調整溝が抵抗体に形成されているチップ抵抗器１Ａを開示している。なお、第１実施形態との相違点を中心に説明するので、同じ構成には同じ又は対応する符号を付すことで説明を適宜省略する。 (Second embodiment)
A second embodiment will be described with reference to FIG. The second embodiment discloses a chip resistor 1A in which one resistance adjusting groove is formed in the resistor in addition to the meandering forming groove. In addition, since it demonstrates centering around difference with 1st Embodiment, it abbreviate|omits description suitably by attaching|subjecting the same or corresponding code|symbol to the same structure.
　抵抗値調整部１２Ａには、第１トリミング溝１５Ａ（蛇行形成溝の一例）が形成されている。第１トリミング溝１５Ａは、抵抗値調整部１２Ａを蛇行形状とするための溝である。第１トリミング溝１５Ａは、抵抗値調整部１２Ａの第２縁１２２から短手方向第１側に延びる第１直線部１６Ａ（直線部の一例）と、第１直線部１６Ａの短手方向第１側端に形成された第１折り返し部１７Ａ（折り返し部の一例）とを有している。第１直線部１６Ａは、短手方向に延びている。第１折り返し部１７Ａは、絶縁基板２の厚さ方向からの平面視において半円弧形状である。 A first trimming groove 15A (an example of a meandering groove) is formed in the resistance value adjusting portion 12A. The first trimming groove 15A is a groove for forming the resistance value adjusting portion 12A into a meandering shape. The first trimming groove 15A includes a first linear portion 16A (an example of a linear portion) extending from a second edge 122 of the resistance value adjusting portion 12A to the first side in the short direction, and a first straight portion 16A extending in the first width direction of the first straight portion 16A. and a first folded portion 17A (an example of a folded portion) formed at the side end. The first linear portion 16A extends in the lateral direction. The first folded portion 17A has a semicircular arc shape when viewed from above in the thickness direction of the insulating substrate 2 .
　第１トリミング溝１５Ａは、第１折り返し部１７Ａから第１直線部１６Ａに対して折り返すように延びる第２直線部１８Ａを更に有している。第２直線部１８Ａは、第１直線部１６Ａと平行に延びている。 The first trimming groove 15A further has a second straight portion 18A extending from the first folded portion 17A so as to fold back with respect to the first straight portion 16A. The second straight portion 18A extends parallel to the first straight portion 16A.
　第１矩形部６、第２矩形部７、第３矩形部８及び抵抗値調整部１２Ａによって、短手方向第１側に折り返す第１ターン１０１Ａが形成されている。第４矩形部９、第５矩形部１０、第６矩形部１１及び抵抗値調整部１２Ａによって、短手方向第１側に折り返す第２ターン１０２Ａが形成されている。第１トリミング溝１５Ａによって、短手方向第２側に折り返す第３ターン１０３Ａが形成されている。 The first rectangular portion 6, the second rectangular portion 7, the third rectangular portion 8, and the resistance value adjusting portion 12A form a first turn 101A folded back to the first side in the short direction. The fourth rectangular portion 9, the fifth rectangular portion 10, the sixth rectangular portion 11, and the resistance value adjusting portion 12A form a second turn 102A folded back to the first side in the short direction. The first trimming groove 15A forms a third turn 103A that folds back to the second side in the transverse direction.
　チップ抵抗器１Ａの抵抗値調整部１２Ａには、第２トリミング溝２１Ａ（抵抗値調整溝の一例）が形成されている。第２トリミング溝２１Ａは、抵抗値調整部１２Ａの抵抗値を調整するための溝である。第２トリミング溝２１Ａは、第１トリミング溝１５Ａの長手方向片側（図２の右側）に配置されている。 A second trimming groove 21A (an example of a resistance value adjusting groove) is formed in the resistance value adjusting portion 12A of the chip resistor 1A. The second trimming groove 21A is a groove for adjusting the resistance value of the resistance value adjusting portion 12A. 21 A of 2nd trimming grooves are arrange|positioned at the longitudinal direction one side (right side of FIG. 2) of 15 A of 1st trimming grooves.
　第２トリミング溝２１Ａは、抵抗値調整部１２Ａの第２縁１２２から短手方向第１側に延びる第３直線部２２Ａ（抵抗値調整用直線部の一例）と、第３直線部２２Ａの短手方向第１側端に形成された第２折り返し部２３Ａ（抵抗値調整用折り返し部の一例）とを有している。第３直線部２２Ａは、短手方向に延びている。第２折り返し部２３Ａは、絶縁基板２の厚さ方向からの平面視において半円弧形状である。 The second trimming groove 21A includes a third linear portion 22A (an example of a resistance value adjusting linear portion) extending from the second edge 122 of the resistance value adjusting portion 12A to the first side in the width direction, and a short portion of the third linear portion 22A. and a second folded portion 23A (an example of a folded portion for resistance value adjustment) formed at the first side end in the hand direction. The third linear portion 22A extends in the lateral direction. The second folded portion 23A has a semicircular arc shape in a plan view from the thickness direction of the insulating substrate 2 .
　第２トリミング溝２１Ａは、第２折り返し部２３Ａから第３直線部２２Ａに対して折り返すように延びる第４直線部２４Ａを更に有している。第４直線部２４Ａは、第３直線部２２Ａと平行に延びている。 The second trimming groove 21A further has a fourth straight portion 24A that extends from the second folded portion 23A so as to fold back with respect to the third straight portion 22A. The fourth straight portion 24A extends parallel to the third straight portion 22A.
　さらに詳細に説明すれば、第１トリミング溝１５Ａの第１折り返し部１７Ａの頂点の短手方向位置は、第１矩形部６及び第４矩形部９と同じ幅の電流経路が抵抗値調整部１２Ａの第１縁１２１側付近に形成される位置（第１矩形部６及び第４矩形部９の短手方向第２側縁の仮想延長線１９と同じ又は近傍の位置）である。また、第２直線部１８Ａの終端１８Ａ１は、抵抗値調整部１２Ａ内において、第３矩形部８及び第６矩形部１１の短手方向第１側縁から長手方向に延びる仮想延長線２０よりも短手方向第１側に位置している。終端１８Ａ１の位置は、抵抗値影響の少ない場所とすることで、負荷特性の信頼性が向上する。この実施形態では、抵抗値影響の少ない場所として、領域Ａ１が設定されている。領域Ａ１は、抵抗値調整部１２Ａの短手方向中心から第２縁１２２までの領域である。すなわち、終端１８Ａ１は、抵抗値調整部１２Ａの短手方向中心より短手方向第２側にあることが好ましい。 More specifically, the position of the apex of the first folded portion 17A of the first trimming groove 15A in the lateral direction is such that the current path having the same width as the first rectangular portion 6 and the fourth rectangular portion 9 is the resistance value adjusting portion 12A. (the same position as or near the imaginary extension line 19 of the second side edge in the short direction of the first rectangular portion 6 and the fourth rectangular portion 9). In addition, the terminal end 18A1 of the second straight portion 18A is located within the resistance value adjusting portion 12A relative to the imaginary extension line 20 extending in the longitudinal direction from the first lateral side edges of the third rectangular portion 8 and the sixth rectangular portion 11. It is located on the first side in the short direction. By setting the position of the terminal end 18A1 to a place where the influence of the resistance value is small, the reliability of the load characteristics is improved. In this embodiment, the area A1 is set as a place where the influence of the resistance value is small. A region A1 is a region from the center of the resistance value adjusting portion 12A in the short direction to the second edge 122. As shown in FIG. That is, the terminal end 18A1 is preferably located on the second side in the widthwise direction of the center of the resistance value adjustment portion 12A in the widthwise direction.
　第２トリミング溝２１Ａの第２折り返し部２３Ａの頂点の短手方向位置は、第１トリミング溝１５Ａの第１折り返し部１７Ａの頂点よりも短手方向第２側にある。また、第４直線部２４Ａの終端２４Ａ１は、抵抗値調整部１２Ａ内において、仮想延長線２０よりも短手方向第２側にある。この実施形態では、終端２４Ａ１の位置を抵抗値影響の少ない場所とすることで、抵抗値修正後の抵抗値変動を抑制でき、それにより抵抗値精度を高精度にできる。抵抗値影響の少ない場所として、領域Ａ２が設定されている。領域Ａ２は、仮想延長線２０から第２縁１２２までの領域である。 The apex of the second folded portion 23A of the second trimming groove 21A is located on the second side in the transverse direction from the apex of the first folded portion 17A of the first trimming groove 15A. Further, the terminal end 24A1 of the fourth linear portion 24A is located on the second side in the short direction of the imaginary extension line 20 in the resistance value adjusting portion 12A. In this embodiment, by setting the position of the terminal end 24A1 to a place where the effect of the resistance value is small, it is possible to suppress the resistance value fluctuation after the resistance value correction, thereby improving the resistance value accuracy. A region A2 is set as a place where the influence of the resistance value is small. A region A2 is a region from the imaginary extension line 20 to the second edge 122 .
　（第３実施形態）
　図３を参照しながら、第３実施形態を説明する。第３実施形態は、蛇行形成溝に加えて２本の抵抗値調整溝が抵抗体に形成されているチップ抵抗器１Ｂを開示している。なお、第１実施形態及び第２実施形態との相違点を中心に説明するので、同じ構成には同じ又は対応する符号を付すことで説明を適宜省略する。 (Third embodiment)
A third embodiment will be described with reference to FIG. The third embodiment discloses a chip resistor 1B in which two resistance adjusting grooves are formed in the resistor in addition to the meandering grooves. In addition, since it demonstrates centering on difference with 1st Embodiment and 2nd Embodiment, the same or corresponding code|symbol is attached|subjected to the same structure, and description is abbreviate|omitted suitably.
　なお、この実施形態では、第１接続部３１は第１及び第２実施形態と同じであるが、第２接続部３２Ｂは、第１及び第２実施形態とは異なっており、矩形部９Ｂのみからなる。矩形部９Ｂは、抵抗値調整部１２Ｂの短手方向第２側部分に接続されている。 In this embodiment, the first connecting portion 31 is the same as in the first and second embodiments, but the second connecting portion 32B is different from the first and second embodiments, and only the rectangular portion 9B is consists of The rectangular portion 9B is connected to the second lateral side portion of the resistance value adjusting portion 12B.
　チップ抵抗器１Ｂの抵抗値調整部１２Ｂには、第１トリミング溝１５Ｂ（蛇行形成溝の一例）が形成されている。第１トリミング溝１５Ｂは、抵抗値調整部１２Ｂを蛇行形状とするための溝である。第１トリミング溝１５Ｂは、抵抗値調整部１２Ｂの第２縁１２２から短手方向第１側に延びる第１直線部１６Ｂ（直線部の一例）と、第１直線部１６Ｂの短手方向第１側端に形成された第１折り返し部１７Ｂ（折り返し部の一例）とを有している。第１直線部１６Ｂは、短手方向に延びている。第１折り返し部１７Ｂは、絶縁基板２の厚さ方向からの平面視において半円弧形状である。 A first trimming groove 15B (an example of a meandering groove) is formed in the resistance value adjusting portion 12B of the chip resistor 1B. The first trimming groove 15B is a groove for forming the resistance value adjusting portion 12B into a meandering shape. The first trimming groove 15B includes a first straight portion 16B (an example of a straight portion) extending from the second edge 122 of the resistance value adjusting portion 12B to the first side in the short direction, and a first straight portion 16B extending in the first short direction of the first straight portion 16B. and a first folded portion 17B (an example of a folded portion) formed at the side end. The first linear portion 16B extends in the lateral direction. The first folded portion 17B has a semi-circular arc shape when viewed from above in the thickness direction of the insulating substrate 2 .
　第１トリミング溝１５Ｂは、第１折り返し部１７Ｂから第１直線部１６Ｂに対して折り返すように延びる第２直線部１８Ｂを更に有している。第２直線部１８Ｂは、第１直線部１６Ｂと平行に延びている。第２直線部１８Ｂは、抵抗値調整部１２Ｂ内に終端１８Ｂ１を有している。 The first trimming groove 15B further has a second straight portion 18B that extends from the first folded portion 17B so as to fold back with respect to the first straight portion 16B. The second straight portion 18B extends parallel to the first straight portion 16B. The second linear portion 18B has a terminal end 18B1 within the resistance value adjusting portion 12B.
　チップ抵抗器１Ａの抵抗値調整部１２Ｂには、第２トリミング溝２１Ｂ（抵抗値調整溝の一例）が形成されている。第２トリミング溝２１Ｂは、抵抗値調整部１２Ｂの抵抗値を調整するための溝である。第２トリミング溝２１Ｂは、抵抗値調整部１２Ｂの第１縁１２１から短手方向第２側に延びる第３直線部２２Ｂ（抵抗値調整用直線部の一例）と、第３直線部２２Ｂの短手方向第２側端に形成された第２折り返し部２３Ｂ（抵抗値調整用折り返し部の一例）とを有している。第２折り返し部２３Ｂは、絶縁基板２の厚さ方向からの平面視において半円弧形状である。 A second trimming groove 21B (an example of a resistance value adjusting groove) is formed in the resistance value adjusting portion 12B of the chip resistor 1A. The second trimming groove 21B is a groove for adjusting the resistance value of the resistance value adjusting portion 12B. The second trimming groove 21B includes a third straight portion 22B (an example of a resistance value adjusting straight portion) extending from the first edge 121 of the resistance value adjusting portion 12B to the second side in the short direction, and a short length of the third straight portion 22B. and a second folded portion 23B (an example of a folded portion for resistance value adjustment) formed at the second side end in the hand direction. The second folded portion 23B has a semicircular arc shape in a plan view from the thickness direction of the insulating substrate 2 .
　第２トリミング溝２１Ｂは、第２折り返し部２３Ｂから第３直線部２２Ｂに対して折り返すように延びる第４直線部２４Ｂを更に有している。第４直線部２４Ｂは、第３直線部２２Ｂと平行に延びている。第４直線部２４Ｂは、抵抗値調整部１２Ｂ内に終端２４Ｂ１を有している。 The second trimming groove 21B further has a fourth straight portion 24B extending from the second folded portion 23B so as to fold back toward the third straight portion 22B. The fourth straight portion 24B extends parallel to the third straight portion 22B. The fourth linear portion 24B has a terminal end 24B1 within the resistance value adjusting portion 12B.
　チップ抵抗器１Ｂの抵抗値調整部１２Ｂには、第３トリミング溝２５Ｂ（抵抗値調整溝の一例）が形成されている。第３トリミング溝２５Ｂは、抵抗値調整部１２Ｂの抵抗値を調整するための溝である。第３トリミング溝２５Ｂは、抵抗値調整部１２Ｂの第２縁１２２から短手方向第１側に延びる第５直線部２６Ｂ（抵抗値調整用直線部の一例）と、第５直線部２６Ｂの短手方向第１側端に形成された第３折り返し部２７Ｂ（抵抗値調整用折り返し部の一例）とを有している。第５直線部２６Ｂは、短手方向に延びている。第３折り返し部２７Ｂは、絶縁基板２の厚さ方向からの平面視において半円弧形状である。 A third trimming groove 25B (an example of a resistance value adjusting groove) is formed in the resistance value adjusting portion 12B of the chip resistor 1B. The third trimming groove 25B is a groove for adjusting the resistance value of the resistance value adjusting portion 12B. The third trimming groove 25B includes a fifth linear portion 26B (an example of a resistance value adjusting linear portion) extending from the second edge 122 of the resistance value adjusting portion 12B to the first side in the transverse direction, and a short portion of the fifth linear portion 26B. and a third folded portion 27B (an example of a folded portion for resistance value adjustment) formed at the first side end in the hand direction. The fifth straight portion 26B extends in the lateral direction. The third folded portion 27B has a semicircular arc shape when viewed from the thickness direction of the insulating substrate 2 in a plan view.
　第３トリミング溝２５Ｂは、第３折り返し部２７Ｂから第５直線部２６Ｂに対して折り返すように延びる第６直線部２８Ｂを更に有している。第６直線部２８Ｂは、第５直線部２６Ｂと平行に延びている。第６直線部２８Ｂは、抵抗値調整部１２Ｂ内に終端２８Ｂ１を有している。 The third trimming groove 25B further has a sixth straight portion 28B that extends from the third folded portion 27B so as to fold toward the fifth straight portion 26B. The sixth straight portion 28B extends parallel to the fifth straight portion 26B. The sixth linear portion 28B has a terminal end 28B1 within the resistance value adjusting portion 12B.
　さらに詳細に説明すれば、第１トリミング溝１５Ｂの第１折り返し部１７Ｂの頂点１７Ｂ１の短手方向位置は、第１矩形部６と同じ幅の電流経路が抵抗値調整部１２Ｂの第１縁１２１側付近に形成される位置（第１矩形部６の短手方向第２側縁から長手方向に延びる仮想延長線１９と同じ又は近傍の位置）である。また、第２直線部１８Ｂの終端１８Ｂ１は、抵抗値調整部１２Ｂ内において、第３矩形部８及び矩形部９Ｂの短手方向第１側縁から長手方向に延びる仮想延長線２０よりも短手方向第２側に位置している。終端１８Ｂ１の位置は、抵抗値影響の少ない場所とすることで、負荷特性の信頼性が向上する。この実施形態では、抵抗値影響の少ない場所として、領域Ｂ１が設定されている。領域Ｂ１は、仮想延長線２０から第２縁１２２までの領域である。 More specifically, the lateral position of the vertex 17B1 of the first folded portion 17B of the first trimming groove 15B is such that the current path having the same width as that of the first rectangular portion 6 is the first edge 121 of the resistance value adjusting portion 12B. It is a position formed in the vicinity of the side (a position that is the same as or near the imaginary extension line 19 extending in the longitudinal direction from the second lateral side edge of the first rectangular portion 6). In addition, the terminal end 18B1 of the second straight portion 18B is located in the resistance value adjusting portion 12B in the short direction from the imaginary extension line 20 extending in the longitudinal direction from the first side edge in the short direction of the third rectangular portion 8 and the rectangular portion 9B. It is located on the second side of the direction. By setting the position of the terminal end 18B1 to a place where the influence of the resistance value is small, the reliability of the load characteristics is improved. In this embodiment, the area B1 is set as a place where the influence of the resistance value is small. A region B<b>1 is a region from the imaginary extension line 20 to the second edge 122 .
　第２トリミング溝２１Ｂの第２折り返し部２３Ｂの頂点の短手方向位置は、第３矩形部８及び矩形部９Ｂと同じ幅の電流経路が抵抗値調整部１２Ｂの第２縁１２２側付近に形成される位置（第３矩形部８及び矩形部９Ｂの短手方向第１側縁から長手方向に延びる仮想延長線１９と同じ又は近傍の位置）である。また、第４直線部２４Ｂの終端２４Ｂ１は、抵抗値調整部１２Ｂ内において、仮想延長線１９よりも短手方向第１側に位置している。この実施形態では、終端２４Ｂ１の位置を抵抗値影響の少ない場所とすることで、抵抗値修正後の抵抗値変動を抑制でき、それにより抵抗値精度を高精度にできる。抵抗値影響の少ない場所として、領域Ｂ２が設定されている。領域Ｂ２は、仮想延長線１９から第１縁１２１までの領域である。 A current path having the same width as that of the third rectangular portion 8 and the rectangular portion 9B is formed near the second edge 122 of the resistance value adjusting portion 12B at the lateral position of the vertex of the second folded portion 23B of the second trimming groove 21B. (the same position as or near the imaginary extension line 19 extending in the longitudinal direction from the first side edge in the short direction of the third rectangular portion 8 and the rectangular portion 9B). A terminal end 24B1 of the fourth linear portion 24B is located on the first side in the short direction of the imaginary extension line 19 in the resistance value adjusting portion 12B. In this embodiment, by setting the position of the terminal end 24B1 to a place where the effect of the resistance value is small, it is possible to suppress the resistance value fluctuation after the resistance value correction, thereby increasing the resistance value accuracy. A region B2 is set as a place where the influence of the resistance value is small. A region B<b>2 is a region from the imaginary extension line 19 to the first edge 121 .
　第３トリミング溝２５Ｂの第３折り返し部２７Ｂの頂点の短手方向位置は、第２トリミング溝２１Ｂの第２折り返し部２３Ｂの頂点よりも短手方向第１側である。また、第６直線部２８Ｂの終端２８Ｂ１は、領域Ｂ１内にある。したがって、抵抗値修正後の抵抗値変動を抑制でき、それにより抵抗値精度を高精度にできる。 The lateral position of the vertex of the third folded portion 27B of the third trimming groove 25B is on the first side in the lateral direction of the vertex of the second folded portion 23B of the second trimming groove 21B. A terminal end 28B1 of the sixth straight portion 28B is located within the region B1. Therefore, it is possible to suppress the resistance value fluctuation after the resistance value correction, thereby improving the resistance value accuracy.
　（第１～第３実施形態の変形例）
　上述の各実施形態は、本開示の様々な実施形態の一つに過ぎない。上述の実施形態は、本開示の目的を達成できれば、設計等に応じて種々の変更が可能である。以下、上述の実施形態の変形例を列挙する。以下に説明する変形例は、適宜組み合わせて適用可能である。 (Modifications of the first to third embodiments)
Each embodiment described above is but one of the various embodiments of the present disclosure. The above-described embodiments can be modified in various ways according to design and the like as long as the object of the present disclosure can be achieved. Modifications of the above-described embodiment are listed below. Modifications described below can be applied in combination as appropriate.
　トリミング溝の折り返し部は半円弧形状に限定されない。ただし、折り返し部は、角を有さず滑らかであることが好ましい。 The folded portion of the trimming groove is not limited to a semicircular arc shape. However, it is preferable that the folded portion has no corners and is smooth.
　トリミング溝の折り返し部の折り返し側（短手方向のどちら側か）は特に限定されない。 The folding side (which side in the lateral direction) of the folding portion of the trimming groove is not particularly limited.
　トリミング溝の本数は特に限定されない。 The number of trimming grooves is not particularly limited.
　複数のトリミング溝の延びる向きは特に限定されない。 The direction in which the plurality of trimming grooves extend is not particularly limited.
　トリミング溝の長さ及び太さは特に限定されない。 The length and thickness of the trimming groove are not particularly limited.
　トリミング溝において、第２直線部（折り返し部から折り返されて延びる部分）の有無及び長さは特に限定されない。 In the trimming groove, the presence or absence and length of the second straight portion (the portion extending by folding back from the folded portion) are not particularly limited.
　複数のトリミング溝のうち少なくとも一つは折り返し部を有している必要はあるが、折り返し部を有しないトリミング溝があってもよい。 At least one of the plurality of trimming grooves must have a folded portion, but there may be trimming grooves that do not have a folded portion.
　（第４実施形態）
　（１）チップ抵抗器の基本構成
　以下、図４を参照しながら、第４実施形態を説明する。第４実施形態は、１本のトリミング溝が抵抗体に形成されているチップ抵抗器１Ｃを開示している。 (Fourth embodiment)
(1) Basic Configuration of Chip Resistor A fourth embodiment will be described below with reference to FIG. The fourth embodiment discloses a chip resistor 1C in which one trimming groove is formed in the resistor.
　チップ抵抗器１Ｃは、絶縁基板２（基板の一例）と、第１電極３と、第２電極４と、抵抗体５Ｃと有している。 The chip resistor 1C has an insulating substrate 2 (an example of a substrate), a first electrode 3, a second electrode 4, and a resistor 5C.
　絶縁基板２は、例えばＡｌ２Ｏ３を９６％含有するアルミナで構成され、その形状は矩形状（上面視にて長方形）となっている。以後、図４の左右方向を長手方向とし、図４の上下方向を短手方向（一対の電極が並ぶ方向に交差する方向の一例）とする。さらに、図４の右側を長手方向第１側とし、図４の左側を長手方向第２側とし、図４の上側を短手方向第１側とし、図４の下側を短手方向第２側とする。なお、長手方向と短手方向は直交している。 The insulating substrate 2 is made of, for example, alumina containing 96% Al 2 O 3 and has a rectangular shape (rectangular when viewed from above). Hereinafter, the horizontal direction in FIG. 4 is defined as the longitudinal direction, and the vertical direction in FIG. 4 is the first side in the longitudinal direction, the left side in FIG. 4 is the second side in the longitudinal direction, the upper side in FIG. 4 is the first side in the transverse direction, and the lower side in FIG. side. In addition, the longitudinal direction and the lateral direction are orthogonal to each other.
　第１電極３及び第２電極４は、絶縁基板２の表面２Ａの長手方向両端部に各々設けられ、銀等の金属を有する厚膜材料を印刷、焼成することによって形成されている。また、絶縁基板２の裏面には、所定の間隔を有するように設けられた一対の裏面電極（図示せず）が形成されている。さらに、絶縁基板２の長手方向の外側面には、第１電極３と裏面電極（図示せず）とを電気的に接続する端面電極（図示せず）を設けている。同様に、第２電極４と裏面電極（図示せず）とを電気的に接続するように、端面電極（図示せず）を設けている。 The first electrode 3 and the second electrode 4 are provided at both ends in the longitudinal direction of the surface 2A of the insulating substrate 2, and are formed by printing and baking a thick film material containing metal such as silver. A pair of rear surface electrodes (not shown) are formed on the rear surface of the insulating substrate 2 so as to be spaced apart from each other by a predetermined distance. Furthermore, an edge electrode (not shown) for electrically connecting the first electrode 3 and a back electrode (not shown) is provided on the outer surface of the insulating substrate 2 in the longitudinal direction. Similarly, an edge electrode (not shown) is provided to electrically connect the second electrode 4 and a back electrode (not shown).
　抵抗体５Ｃは、絶縁基板２の表面２Ａにおいて、第１電極３と第２電極４の間に、銅ニッケル、銀パラジウム、または酸化ルテニウムからなる厚膜材料を印刷した後、焼成することによって形成され、第１電極３及び第２電極４に接続されている。なお、図４では、抵抗体５Ｃの両端部が第１電極３及び第２電極４の両端部の上面に形成されているが、それらの両端部の下面に形成してもよい。 The resistor 5C is formed by printing a thick film material made of copper nickel, silver palladium, or ruthenium oxide between the first electrode 3 and the second electrode 4 on the surface 2A of the insulating substrate 2, and then baking the material. and connected to the first electrode 3 and the second electrode 4 . In FIG. 4, both ends of the resistor 5C are formed on the upper surfaces of both ends of the first electrode 3 and the second electrode 4, but they may be formed on the lower surfaces of both ends.
　（２）抵抗体
　抵抗体５Ｃは、絶縁基板２の長手方向中間、つまり第１電極３と第２電極４の間に配置されている。抵抗体５Ｃは、上面視において左右方向に長い長方形である。抵抗体５Ｃは、後述するようにレーザトリミングによって抵抗値が調整される。なお、抵抗体５Ｄの短手方向第１側の縁を第１縁５Ｃ１として、短手方向第２側の縁を第２縁５Ｃ２（抵抗体において一対の電極が並ぶ方向に沿った縁の一例）とする。 (2) Resistor The resistor 5C is arranged in the middle of the insulating substrate 2 in the longitudinal direction, that is, between the first electrode 3 and the second electrode 4 . 5 C of resistors are rectangles elongated in the left-right direction in top view. The resistance value of the resistor 5C is adjusted by laser trimming as will be described later. Note that the edge on the first side in the short direction of the resistor 5D is defined as the first edge 5C1, and the edge on the second side in the short direction is the second edge 5C2 (an example of an edge along the direction in which the pair of electrodes are arranged in the resistor). ).
　抵抗体５Ｃには、トリミング溝１５Ｃが形成されている。トリミング溝１５Ｃは、抵抗体５Ｃの第２縁５Ｃ２から短手方向第１側に延びる第１直線部１６Ｃ（直線部の一例）と、第１直線部１６Ｃの短手方向第１側端に形成された折り返し部１７Ｃ（折り返し部の一例）とを有している。第１直線部１６Ｃは、短手方向に延びている。折り返し部１７Ｃは、絶縁基板２の厚さ方向からの平面視において曲率を有する形状である。このように、第１直線部１６Ｃと曲率を有する折り返し部１７Ｃとを有するトリミング溝１５Ｃを形成することにより、トリミング溝に角張った部分をなくすことができ、そのため電流が流れるときに過度な負荷集中が防止される。この結果、チップ抵抗器１Ｃの耐パルス性が向上する。 A trimming groove 15C is formed in the resistor 5C. The trimming groove 15C is formed at the first straight portion 16C (an example of the straight portion) extending from the second edge 5C2 of the resistor 5C to the first side in the short direction, and at the first side end in the short direction of the first straight portion 16C. folded portion 17C (an example of the folded portion). The first linear portion 16C extends in the lateral direction. The folded portion 17C has a shape having a curvature in plan view from the thickness direction of the insulating substrate 2 . By forming the trimming groove 15C having the first straight portion 16C and the bent portion 17C having a curvature in this way, it is possible to eliminate the angular portion of the trimming groove, thereby causing excessive load concentration when current flows. is prevented. As a result, the pulse resistance of the chip resistor 1C is improved.
　従来のチップ抵抗器では、例えばＩ字状のトリミング溝の場合、トリミング溝の先端付近で電流集中が生じ、さらには抵抗経路の狭くなっている部分が発熱することで、抵抗体が劣化して、そのためパルス特性が悪くなるという課題を有していた。また、従来のチップ抵抗器では、例えばＬ字状のトリミング溝の場合、Ｌ字の角部分及び先端付近で電力集中が生じ、さらには抵抗経路の狭くなっている部分が発熱することで、抵抗体が劣化して、そのためパルス特性が悪くなるという課題を有していた。さらに、いずれの場合も、トリミング溝の長さを長くすることで抵抗体の切り込み量を増加させた場合、抵抗経路が狭くなった部分で負荷集中が大幅に増大して、そのためパルス特性が大幅に悪化するので、トリミング溝の長さは抵抗体幅の約１／２程度に抑える必要があった。その結果、高い抵抗値修正倍率を実現できなかった。 In a conventional chip resistor, for example, in the case of an I-shaped trimming groove, current concentration occurs near the tip of the trimming groove, and heat is generated in the narrowed portion of the resistance path, resulting in deterioration of the resistor. , and as a result, there is a problem that the pulse characteristics are deteriorated. In conventional chip resistors, for example, in the case of an L-shaped trimming groove, power concentration occurs at the corners and near the tip of the L-shape, and heat is generated in the narrowed portion of the resistance path. There was a problem that the body deteriorated and, as a result, the pulse characteristics deteriorated. Furthermore, in both cases, when the length of the trimming groove is lengthened to increase the depth of cut in the resistor, the load concentration increases significantly in the narrowed portion of the resistance path, resulting in a significant drop in pulse characteristics. Therefore, it was necessary to limit the length of the trimming groove to about half the width of the resistor. As a result, a high resistance correction magnification could not be achieved.
　それに対して、本実施形態では、前述のように、トリミング溝１５Ｃは第１直線部１６Ｃと曲率を有する折り返し部１７Ｃとを有するので、電流が流れるときに過度な負荷集中を防止でき、そのためトリミング溝の修正長さを長く確保できる。したがって、負荷特性を向上しつつ、高い抵抗値修正倍率を実現できる。 In contrast, in the present embodiment, as described above, the trimming groove 15C has the first straight portion 16C and the bent portion 17C having a curvature, so that excessive load concentration can be prevented when current flows. A long correction length of the groove can be secured. Therefore, it is possible to realize a high resistance value correction magnification while improving load characteristics.
　トリミング溝１５Ｃは、折り返し部１７Ｃから第１直線部１６Ｃに対して折り返すように延びる第２直線部１８Ｃを更に有している。第２直線部１８Ｃは、第１直線部１６Ｃと平行に延びている。なお、「第２直線部１８Ｃが第１直線部１６Ｃと平行」とは２～３度傾いた状態を含む。第２直線部１８Ｃによって、耐パルス特性を高く維持しつつ、抵抗値を所望の値に精度よく調整できる。 The trimming groove 15C further has a second straight portion 18C extending from the folded portion 17C so as to fold back with respect to the first straight portion 16C. The second straight portion 18C extends parallel to the first straight portion 16C. Note that "the second straight portion 18C is parallel to the first straight portion 16C" includes a state of being inclined by 2 to 3 degrees. The resistance value can be precisely adjusted to a desired value by the second linear portion 18C while maintaining a high pulse resistance characteristic.
　折り返し部１７Ｃは円弧部を含んでおり、円弧部は、第１直線部１６Ｃに接続された部分の第１直線部１６Ｃに対する角度が９０度を超え、かつ、１８０度以下である。折り返し部１７Ｃの円弧部の作用により、従来のチップ抵抗器に比べ、負荷集中が起こりにくく、そのため、チップ抵抗器１Ｃのパルス特性が向上する。 The folded portion 17C includes an arc portion, and in the arc portion, the angle of the portion connected to the first straight portion 16C with respect to the first straight portion 16C exceeds 90 degrees and is 180 degrees or less. Due to the action of the arc portion of the folded portion 17C, load concentration is less likely to occur than in conventional chip resistors, and therefore the pulse characteristics of the chip resistor 1C are improved.
　より詳細には、折り返し部１７Ｃの円弧部は半円を含んでおり、半円の直径ｄ１は抵抗体５Ｃの幅Ｗ２（短手方向長さ）の１／１０以上である。 More specifically, the arc portion of the folded portion 17C includes a semicircle, and the diameter d1 of the semicircle is 1/10 or more of the width W2 (length in the lateral direction) of the resistor 5C.
　短手方向において、トリミング溝１５Ｃの長さＷ１は、抵抗体５Ｃの幅Ｗ２の７５％以下である。このようにトリミング溝１５Ｃの長さを制限することで、負荷集中を抑えて、それによりチップ抵抗器１Ｃのパルス特性を維持できる。 In the lateral direction, the length W1 of the trimming groove 15C is 75% or less of the width W2 of the resistor 5C. By limiting the length of the trimming groove 15C in this way, load concentration can be suppressed, thereby maintaining the pulse characteristics of the chip resistor 1C.
　第２直線部１８Ｃの終端１８Ｃ１の位置は、抵抗値影響の少ない場所にある。したがって、抵抗体５Ｃにおいて負荷特性の信頼性が向上する。なお、抵抗値影響の少ない場所とは、抵抗体５Ｃに電流分布密度が低い部分である。一般にトリミング溝の延伸方向の最も先の部分（本実施形態では折り返し部１７Ｃ）付近は電流分布密度が高いので、そこから終端１８Ｃ１が外れることが好ましく、さらに遠く離れることがさらに好ましい。 The position of the terminal end 18C1 of the second straight portion 18C is located at a place where the influence of the resistance value is small. Therefore, the reliability of load characteristics is improved in the resistor 5C. The place where the resistance value is less affected is the part where the current distribution density is low in the resistor 5C. Generally, the current distribution density is high near the farthest portion (in this embodiment, the folded portion 17C) of the trimming groove in the extending direction, so it is preferable that the terminal end 18C1 is deviated therefrom, and more preferably further apart.
　（３）チップ抵抗器の製造方法
　最初に、アルミナからなる絶縁基板２の長手方向両端部に電極ペーストをスクリーン印刷し、これを例えば８５０℃で焼成して第１電極３及び第２電極４を形成する。 (3) Manufacturing method of chip resistor First, electrode paste is screen-printed on both longitudinal ends of the insulating substrate 2 made of alumina, and fired at, for example, 850°C to form the first electrode 3 and the second electrode 4. Form.
　次に、第１電極３と第２電極４との間に抵抗ペーストをスクリーン印刷し、これを８５０℃で焼成して抵抗体５Ｃを形成する。 Next, a resistor paste is screen-printed between the first electrode 3 and the second electrode 4, and fired at 850°C to form the resistor 5C.
　次に、レーザトリミングにより、トリミング溝１５Ｃを抵抗体５Ｃに形成する。 Next, a trimming groove 15C is formed in the resistor 5C by laser trimming.
　（第５実施形態）
　図５を参照しながら、第５実施形態を説明する。第５実施形態は、２本のトリミング溝が抵抗体の同じ縁から延びるチップ抵抗器１Ｄを開示している。なお、第４実施形態との相違点を中心に説明するので、同じ構成には同じ又は対応する符号を付すことで説明を適宜省略する。 (Fifth embodiment)
A fifth embodiment will be described with reference to FIG. A fifth embodiment discloses a chip resistor 1D in which two trimming grooves extend from the same edge of the resistor. In addition, since it demonstrates centering around difference with 4th Embodiment, description is suitably abbreviate|omitted by attaching|subjecting the same or corresponding code|symbol to the same structure.
　抵抗体５Ｄには、第１トリミング溝１５Ｄ１（トリミング溝の一例）が形成されている。第１トリミング溝１５Ｄ１は、抵抗体５Ｄの第２縁５Ｄ２から短手方向第１側に延びる第１直線部１６Ｄ１（直線部、第１直線部の一例）と、第１直線部１６Ｄ１の短手方向第１側端に形成された第１折り返し部１７Ｄ１（折り返し部の一例）とを有している。第１折り返し部１７Ｄ１は、絶縁基板２の厚さ方向からの平面視において曲率を有する形状である。 A first trimming groove 15D1 (an example of a trimming groove) is formed in the resistor 5D. The first trimming groove 15D1 includes a first linear portion 16D1 (a linear portion, an example of the first linear portion) extending from the second edge 5D2 of the resistor 5D to the first side in the width direction, and a width of the first linear portion 16D1. and a first folded portion 17D1 (an example of a folded portion) formed at the first direction side end. The first folded portion 17D1 has a shape having a curvature in plan view from the thickness direction of the insulating substrate 2 .
　第１トリミング溝１５Ｄ１は、第１折り返し部１７Ｄ１から第１直線部１６Ｄ１に対して折り返すように延びる第２直線部１８Ｄ１（第２直線部の一例）を更に有している。第２直線部１８Ｄ１は、第１直線部１６Ｄ１と平行に延びている。 The first trimming groove 15D1 further has a second straight portion 18D1 (an example of a second straight portion) extending from the first folded portion 17D1 so as to fold back with respect to the first straight portion 16D1. The second straight portion 18D1 extends parallel to the first straight portion 16D1.
　チップ抵抗器１Ｄの抵抗体５Ｄには、第２トリミング溝１５Ｄ２（トリミング溝の一例）が形成されている。第２トリミング溝１５Ｄ２１は、第１トリミング溝１５Ｄ１の長手方向第１側（図５の右側）に配置されている。 A second trimming groove 15D2 (an example of a trimming groove) is formed in the resistor 5D of the chip resistor 1D. The second trimming groove 15D21 is arranged on the first longitudinal side (right side in FIG. 5) of the first trimming groove 15D1.
　第２トリミング溝１５Ｄ２は、抵抗体５Ｄの第２縁５Ｄ２から短手方向第１側に延びる第３直線部１６Ｄ２（直線部、第１直線部の一例）と、第３直線部１６Ｄ２の短手方向第１側端に形成された第２折り返し部１７Ｄ２（折り返し部の一例）とを有している。第３直線部１６Ｄ２は、短手方向に延びている。第２折り返し部１７Ｄ２は、絶縁基板２の厚さ方向からの平面視において曲率を有する形状である。なお、第１トリミング溝１５Ｄ１の第１折り返し部１７Ｄ１は第１直線部１６Ｄ１から長手方向第１側に延びており、第２トリミング溝１５Ｄ２の第２折り返し部１７Ｄ２は第３直線部１６Ｄ２から長手方向第２側に延びている。つまり、両折り返し部は互いに向き合う側に折り返されている。 The second trimming groove 15D2 includes a third linear portion 16D2 (a linear portion, an example of the first linear portion) extending from the second edge 5D2 of the resistor 5D to the first side in the width direction, and a width of the third linear portion 16D2. and a second folded portion 17D2 (an example of a folded portion) formed at the first direction side end. The third linear portion 16D2 extends in the lateral direction. The second folded portion 17D2 has a shape having a curvature in plan view from the thickness direction of the insulating substrate 2 . The first folded portion 17D1 of the first trimming groove 15D1 extends from the first straight portion 16D1 to the first side in the longitudinal direction, and the second folded portion 17D2 of the second trimming groove 15D2 extends from the third straight portion 16D2 in the longitudinal direction. extending to the second side. In other words, both folded portions are folded back to face each other.
　第２トリミング溝１５Ｄ２は、第２折り返し部１７Ｄ２から第３直線部１６Ｄ２に対して折り返すように延びる第４直線部１８Ｄ２（第２直線部の一例）を更に有している。第４直線部２４Ｄ１は、第３直線部１６Ｄ２と平行に延びている。 The second trimming groove 15D2 further has a fourth straight portion 18D2 (an example of a second straight portion) extending from the second folded portion 17D2 so as to fold back to the third straight portion 16D2. The fourth linear portion 24D1 extends parallel to the third linear portion 16D2.
　この実施形態では、チップ抵抗器１Ｄのトリミング溝が２本なので、負荷集中をさらに抑制できる。したがって、チップ抵抗器１Ｄの抵抗値の調整幅が大きくなる（抵抗値修正率を増加できる）。 In this embodiment, since the chip resistor 1D has two trimming grooves, load concentration can be further suppressed. Therefore, the adjustment range of the resistance value of the chip resistor 1D is increased (the resistance value correction rate can be increased).
　なお、この実施形態では、第２トリミング溝１５Ｄ２の短手方向長さは、第１トリミング溝１５Ｄ１の短手方向長さより短い。さらに、第２トリミング溝１５Ｄ２の第４直線部１８Ｄ２は、第１トリミング溝１５Ｄ１の第２直線部１８Ｄ１よりも短い。 Note that, in this embodiment, the length of the second trimming groove 15D2 in the widthwise direction is shorter than the length of the first trimming groove 15D1 in the widthwise direction. Furthermore, the fourth straight portion 18D2 of the second trimming groove 15D2 is shorter than the second straight portion 18D1 of the first trimming groove 15D1.
　（第６実施形態）
　図６を参照しながら、第６実施形態を説明する。第６実施形態は、２本のトリミング溝が抵抗体の異なる縁から延びるチップ抵抗器１Ｅを開示している。なお、第４実施形態との相違点を中心に説明するので、同じ構成には同じ又は対応する符号を付すことで説明を適宜省略する。 (Sixth embodiment)
A sixth embodiment will be described with reference to FIG. The sixth embodiment discloses a chip resistor 1E with two trimming grooves extending from different edges of the resistor. In addition, since it demonstrates centering around difference with 4th Embodiment, description is suitably abbreviate|omitted by attaching|subjecting the same or corresponding code|symbol to the same structure.
　抵抗体５Ｅには、第１トリミング溝１５Ｅ１（トリミング溝の一例）が形成されている。第１トリミング溝１５Ｅ１は、抵抗体５Ｅの第２縁５Ｅ２から短手方向第１側に延びる第１直線部１６Ｅ１（直線部、第１直線部の一例）と、第１直線部１６Ｅ１の短手方向第１側端に形成された第１折り返し部１７Ｅ１（折り返し部の一例）とを有している。第１折り返し部１７Ｅ１は、絶縁基板２の厚さ方向からの平面視において曲率を有する形状である。 A first trimming groove 15E1 (an example of a trimming groove) is formed in the resistor 5E. The first trimming groove 15E1 includes a first straight portion 16E1 (a straight portion, an example of the first straight portion) extending from the second edge 5E2 of the resistor 5E to the first side in the short direction, and a short side of the first straight portion 16E1. and a first folded portion 17E1 (an example of a folded portion) formed at the first direction side end. The first folded portion 17E1 has a shape having a curvature in plan view from the thickness direction of the insulating substrate 2 .
　第１トリミング溝１５Ｅ１は、第１折り返し部１７Ｅ１から第１直線部１６Ｅ１に対して折り返すように延びる第２直線部１８Ｅ１（第２直線部の一例）を更に有している。第２直線部１８Ｅ１は、第１直線部１６Ｅ１と平行に延びている。 The first trimming groove 15E1 further has a second straight portion 18E1 (an example of a second straight portion) extending from the first folded portion 17E1 so as to fold back with respect to the first straight portion 16E1. The second straight portion 18E1 extends parallel to the first straight portion 16E1.
　チップ抵抗器１Ｅの抵抗体５Ｅには、第２トリミング溝１５Ｅ２（トリミング溝の一例）が形成されている。第２トリミング溝１５Ｅ２は、第１トリミング溝１５Ｅ１の長手方向第１側（図６の右側）に配置されている。 A second trimming groove 15E2 (an example of a trimming groove) is formed in the resistor 5E of the chip resistor 1E. The second trimming groove 15E2 is arranged on the first longitudinal side (right side in FIG. 6) of the first trimming groove 15E1.
　第２トリミング溝１５Ｅ２は、抵抗体５Ｅの第１縁５Ｅ１から短手方向第２側に延びる第３直線部１６Ｅ２（直線部、第１直線部の一例）と、第３直線部１６Ｅ２の短手方向第１側端に形成された第２折り返し部１７Ｅ２（折り返し部の一例）とを有している。第３直線部１６Ｅ２は、短手方向に延びている。第２折り返し部１７Ｅ２は、絶縁基板２の厚さ方向からの平面視において曲率を有する形状である。なお、第１トリミング溝１５Ｅ１の第１折り返し部１７Ｅ１は第１直線部１６Ｅ１から長手方向第１側に延びており、第２トリミング溝１５Ｅ２の第２折り返し部１７Ｅ２は第３直線部１６Ｅ２から長手方向第２側に延びている。つまり、両折り返し部に互いに向き合う側に折り返されている。 The second trimming groove 15E2 includes a third straight portion 16E2 (a straight portion, an example of the first straight portion) extending from the first edge 5E1 of the resistor 5E to the second side in the short direction, and a short side of the third straight portion 16E2. and a second folded portion 17E2 (an example of a folded portion) formed at the first direction side end. The third linear portion 16E2 extends in the lateral direction. The second folded portion 17E2 has a shape having a curvature in plan view from the thickness direction of the insulating substrate 2 . The first folded portion 17E1 of the first trimming groove 15E1 extends from the first straight portion 16E1 to the first side in the longitudinal direction, and the second folded portion 17E2 of the second trimming groove 15E2 extends from the third straight portion 16E2 in the longitudinal direction. extending to the second side. In other words, both folded portions are folded back toward each other.
　第２トリミング溝１５Ｅ２は、第２折り返し部１７Ｅ２から第３直線部１６Ｅ２に対して折り返すように延びる第４直線部１８Ｅ２（第２直線部の一例）を更に有している。第４直線部１８Ｅ２は、第３直線部１６Ｅ２と平行に延びている。 The second trimming groove 15E2 further has a fourth straight portion 18E2 (an example of a second straight portion) extending from the second folded portion 17E2 so as to fold back to the third straight portion 16E2. The fourth straight portion 18E2 extends parallel to the third straight portion 16E2.
　この実施形態では、第４実施形態とは異なってチップ抵抗器１Ｅのトリミング溝が２本なので、負荷集中をさらに抑制できる。したがって、チップ抵抗器１Ｅの抵抗値の調整幅が大きくなる（抵抗値修正率を増加できる）。 In this embodiment, unlike the fourth embodiment, the chip resistor 1E has two trimming grooves, so load concentration can be further suppressed. Therefore, the adjustment range of the resistance value of the chip resistor 1E is increased (the resistance value correction rate can be increased).
　この実施形態では、第５実施形態とは異なって２本のトリミング溝は抵抗体５Ｅの異なる縁から延びているので、大きな負荷集中を生じさせることなく、抵抗体５Ｅを蛇行形状とすることで線路長を長くできる。その結果、抵抗値の修正幅を２倍以上長くできる。 In this embodiment, unlike the fifth embodiment, the two trimming grooves extend from different edges of the resistor 5E. Line length can be lengthened. As a result, the correction width of the resistance value can be doubled or longer.
　（第７実施形態）
　第１～第６実施形態では、トリミング溝の折り返し部は半円形状であったが、曲率を有する形状であればよいので、半円形状に限定されない。 (Seventh embodiment)
In the first to sixth embodiments, the folded portion of the trimming groove has a semicircular shape, but it is not limited to a semicircular shape as long as it has a curvature.
　第１～第６実施形態では、トリミング溝の第２直線部は第１直線部に対して平行であったが、第１直線部に対して折り返されていればよいので、延びる方向は限定されない。 In the first to sixth embodiments, the second straight portion of the trimming groove is parallel to the first straight portion, but the extending direction is not limited as long as it is folded back with respect to the first straight portion. .
　図７を参照しながら、上記の変形例としての第６実施形態を説明する。なお、第４実施形態との相違点を中心に説明するので、同じ構成には同じ又は対応する符号を付すことで説明を適宜省略する。 A sixth embodiment as a modification of the above will be described with reference to FIG. In addition, since it demonstrates centering around difference with 4th Embodiment, description is suitably abbreviate|omitted by attaching|subjecting the same or corresponding code|symbol to the same structure.
　抵抗体５Ｆには、トリミング溝１５Ｆ（トリミング溝の一例）が形成されている。トリミング溝１５Ｆは、抵抗体５Ｆの第２縁５Ｆ２から短手方向第１側に延びる第１直線部１６Ｆ（直線部の一例）と、第１直線部１６Ｆの短手方向第１側端に形成された折り返し部１７Ｆ（折り返し部の一例）とを有している。折り返し部１７Ｆは、絶縁基板２の厚さ方向からの平面視において曲率を有する形状である。折り返し部１７Ｆは円弧を含んでいるが半円形状ではない。 A trimming groove 15F (an example of a trimming groove) is formed in the resistor 5F. The trimming groove 15F is formed at the first straight portion 16F (an example of the straight portion) extending from the second edge 5F2 of the resistor 5F to the first side in the short direction, and at the first side end in the short direction of the first straight portion 16F. folded portion 17F (an example of the folded portion). The folded portion 17</b>F has a shape having a curvature in plan view from the thickness direction of the insulating substrate 2 . The folded portion 17F includes an arc but is not semicircular.
　トリミング溝１５Ｆは、折り返し部１７Ｆから第１直線部１６Ｆに対して折り返すように延びる第２直線部１８Ｆ（第２直線部の一例）を更に有している。第２直線部１８Ｆは、第１直線部１６Ｆに対して角度を付けて延びており、具体的には短手方向第２側にいくにしたがって第１直線部１６Ｆから長手方向第１側に離れるように延びている。 The trimming groove 15F further has a second straight portion 18F (an example of a second straight portion) extending from the folded portion 17F so as to fold back with respect to the first straight portion 16F. The second straight portion 18F extends at an angle with respect to the first straight portion 16F. Specifically, the second straight portion 18F separates from the first straight portion 16F toward the first side in the longitudinal direction as it goes to the second side in the short direction. It extends like
　（第４～第７実施形態の変形例）
　上述の各実施形態は、本開示の様々な実施形態の一つに過ぎない。上述の実施形態は、本開示の目的を達成できれば、設計等に応じて種々の変更が可能である。以下、上述の実施形態の変形例を列挙する。以下に説明する変形例は、適宜組み合わせて適用可能である。 (Modified examples of the fourth to seventh embodiments)
Each embodiment described above is but one of the various embodiments of the present disclosure. The above-described embodiments can be modified in various ways according to design and the like as long as the object of the present disclosure can be achieved. Modifications of the above-described embodiment are listed below. Modifications described below can be applied in combination as appropriate.
　トリミング溝の折り返し部は半円状に限定されない。 The folded portion of the trimming groove is not limited to a semicircular shape.
　トリミング溝の折り返し部の折り返し側（短手方向のどちら側か）は特に限定されない。 The folding side (which side in the lateral direction) of the folding portion of the trimming groove is not particularly limited.
　トリミング溝の本数は特に限定されない。 The number of trimming grooves is not particularly limited.
　複数のトリミング溝の延びる向きは特に限定されない。 The direction in which the plurality of trimming grooves extend is not particularly limited.
　トリミング溝の長さ及び太さは特に限定されない。 The length and thickness of the trimming groove are not particularly limited.
　トリミング溝において、第２直線部（折り返し部から折り返されて延びる部分）の有無及び長さは特に限定されない。 In the trimming groove, the presence or absence and length of the second straight portion (the portion extending by folding back from the folded portion) are not particularly limited.
　複数のトリミング溝のうち少なくとも一つは折り返し部を有している必要はあるが、折り返し部を有しないトリミング溝があってもよい。 At least one of the plurality of trimming grooves must have a folded portion, but there may be trimming grooves that do not have a folded portion.
　折返し部は分割して形成されてもよい。 The folded portion may be formed separately.
　（態様）
　本明細書には、以下の態様が開示されている。 (mode)
The following aspects are disclosed in this specification.
　第１態様に係るチップ抵抗器（１、１Ａ、１Ｂ）は、基板（２）と、一対の電極（３、４）と、抵抗体（５、５Ａ、５Ｂ）とを備えている。一対の電極（３、４）は、基板（２）の一面（２Ａ）の両端に設けられている。抵抗体（５、５Ａ、５Ｂ）は、基板（２）の一面（２Ａ）において一対の電極（３、４）の間に設けられている。抵抗体（５、５Ａ、５Ｂ）は、一対の接続部（３１、３２）と、抵抗値調整部（１２、１２Ａ、１２Ｂ）とを有している。一対の接続部（３１、３２）は、一対の電極（３、４）にそれぞれ接続されている。抵抗値調整部（１２、１２Ａ、１２Ｂ）は、一対の接続部（３１、３２）の間に設けられている。抵抗値調整部（１２、１２Ａ、１２Ｂ）には、抵抗値調整部（１２、１２Ａ、１２Ｂ）を蛇行形状とするための蛇行形成溝（１５、１５Ａ、１５Ｂ）が形成されている。蛇行形成溝（１５、１５Ａ、１５Ｂ）は、抵抗値調整部（１２、１２Ａ、１２Ｂ）の縁（１２２）から延びる直線部（１６、１６Ａ、１６Ｂ）と、直線部（１６、１６Ａ、１６Ｂ）の一端に形成された折り返し部（１７、１７Ａ、１７Ｂ）とを有している。 A chip resistor (1, 1A, 1B) according to the first aspect comprises a substrate (2), a pair of electrodes (3, 4), and resistors (5, 5A, 5B). A pair of electrodes (3, 4) are provided at both ends of one surface (2A) of the substrate (2). A resistor (5, 5A, 5B) is provided between a pair of electrodes (3, 4) on one surface (2A) of the substrate (2). The resistors (5, 5A, 5B) have a pair of connection portions (31, 32) and resistance value adjustment portions (12, 12A, 12B). A pair of connection portions (31, 32) are connected to a pair of electrodes (3, 4), respectively. The resistance value adjusting portions (12, 12A, 12B) are provided between the pair of connecting portions (31, 32). Meandering forming grooves (15, 15A, 15B) are formed in the resistance value adjusting portions (12, 12A, 12B) to form the resistance value adjusting portions (12, 12A, 12B) in a meandering shape. The meandering grooves (15, 15A, 15B) are composed of linear portions (16, 16A, 16B) extending from the edges (122) of the resistance value adjusting portions (12, 12A, 12B) and linear portions (16, 16A, 16B). and a folded portion (17, 17A, 17B) formed at one end of the .
　この態様によれば、蛇行形成溝（１５、１５Ａ、１５Ｂ）が折り返し部（１７、１７Ａ、１７Ｂ）を有しているので、蛇行形成溝（１５）の延伸方向の最も先の部分にマイクロクラックが発生しにくい。 According to this aspect, since the meandering grooves (15, 15A, 15B) have the folded portions (17, 17A, 17B), microcracks are formed in the furthest portions of the meandering grooves (15) in the extending direction. is less likely to occur.
　第２態様に係るチップ抵抗器（１、１Ａ、１Ｂ）では、第１態様において、折り返し部（１７、１７Ａ、１７Ｂ）は、基板（２）の厚さ方向からの平面視において半円弧形状である。 In the chip resistors (1, 1A, 1B) according to the second aspect, in the first aspect, the folded portions (17, 17A, 17B) are semicircular in plan view from the thickness direction of the substrate (2). be.
　この態様によれば、折り返し部（１７、１７Ａ、１７Ｂ）が半円弧形状であるので、蛇行形成溝（１５、１５Ａ、１５Ｂ）の延伸方向の最も先の部分にマイクロクラックが発生しにくい。 According to this aspect, since the folded portions (17, 17A, 17B) have a semicircular arc shape, microcracks are less likely to occur in the furthest portion of the extending direction of the meandering grooves (15, 15A, 15B).
　第３態様に係るチップ抵抗器（１、１Ａ、１Ｂ）では、第１又は第２態様において、蛇行形成溝（１５、１５Ａ、１５Ｂ）は、折り返し部（１７、１７Ａ、１７Ｂ）から直線部としての第１直線部（１６、１６Ａ、１６Ｂ）に対して折り返すように延びる第２直線部（１８、１８Ａ、１８Ｂ）を更に有している。第２直線部（１８、１８Ａ、１８Ｂ）は、抵抗値調整部（１２、１２Ａ、１２Ｂ）内に終端（１８１、１８Ａ１、１８Ｂ１）を有している。 In the chip resistor (1, 1A, 1B) according to the third aspect, in the first or second aspect, the meandering grooves (15, 15A, 15B) extend from the folded portions (17, 17A, 17B) as straight portions. It further has a second straight portion (18, 18A, 18B) extending so as to fold back with respect to the first straight portion (16, 16A, 16B). The second straight portions (18, 18A, 18B) have ends (181, 18A1, 18B1) within the resistance adjusting portions (12, 12A, 12B).
　この態様によれば、蛇行形成溝（１５、１５Ａ、１５Ｂ）が折り返し部（１７、１７Ａ、１７Ｂ）から延びる第２直線部（１８、１８Ａ、１８Ｂ）を有しているので、蛇行形成溝（１５、１５Ａ、１５Ｂ）の終端（１８１、１８Ａ１、１８Ｂ１）を折り返し部（１７、１７Ａ、１７Ｂ）から短手方向に離れた位置に配置できる。このように終端（１８１、１８Ａ１、１８Ｂ１）を、電流分布密度が高い折り返し部（１７、１７Ａ、１７Ｂ）付近から離すことができるので、終端（１８１、１８Ａ１、１８Ｂ１）付近にマイクロクラックが生じたとしても抵抗値変動が生じにくい。 According to this aspect, since the meandering grooves (15, 15A, 15B) have the second straight portions (18, 18A, 18B) extending from the folded portions (17, 17A, 17B), the meandering grooves ( 15, 15A, 15B) ends (181, 18A1, 18B1) can be arranged at positions separated in the lateral direction from the folded portions (17, 17A, 17B). In this way, the terminal ends (181, 18A1, 18B1) can be separated from the vicinity of the folded portions (17, 17A, 17B) where the current distribution density is high, so microcracks occurred near the terminal ends (181, 18A1, 18B1). Even if the
　第４態様に係るチップ抵抗器（１、１Ａ、１Ｂ）では、第３態様において、第２直線部（１８、１８Ａ、１８Ｂ）の終端（１８１、１８Ａ１、１８Ｂ１）は、抵抗値調整部（１２、１２Ａ、１２Ｂ）内において抵抗値影響が少ない位置にある。 In the chip resistor (1, 1A, 1B) according to the fourth aspect, in the third aspect, the terminal end (181, 18A1, 18B1) of the second linear portion (18, 18A, 18B) is the resistance value adjusting portion (12 , 12A and 12B) at a position where the influence of the resistance value is small.
　この態様によれば、第２直線部（１８、１８Ａ、１８Ｂ）の終端（１８１、１８Ａ１、１８Ｂ１）を抵抗値調整部（１２、１２Ａ、１２Ｂ）内において抵抗値影響が少ない位置に配置しているので、終端（１８１、１８Ａ１、１８Ｂ１）付近にマイクロクラックが生じたとしても抵抗値変動が生じにくい。 According to this aspect, the terminal ends (181, 18A1, 18B1) of the second linear portions (18, 18A, 18B) are arranged at positions where the influence of the resistance value is small in the resistance value adjusting portions (12, 12A, 12B). Therefore, even if microcracks occur near the ends (181, 18A1, 18B1), the resistance value does not fluctuate easily.
　第５態様に係るチップ抵抗器（１Ａ、１Ｂ）では、第１～第４態様のいずれかにおいて、抵抗値調整部（１２Ａ、１２Ｂ）には、抵抗値調整部（１２Ａ、１２Ｂ）の抵抗値を調整するための抵抗値調整溝（２１Ａ、２１Ｂ、２５Ｂ）が形成されている。抵抗値調整溝（２１Ａ、２１Ｂ、２５Ｂ）は、抵抗値調整部（１２Ａ、１２Ｂ）の縁（１２１、１２２）から延びる抵抗値調整用直線部（２２Ａ、２２Ｂ、２６Ｂ）と、抵抗値調整用直線部（２２Ａ、２２Ｂ、２６Ｂ）の一端に形成された抵抗値調整用折り返し部（２３Ａ、２３Ｂ、２７Ｂ）とを有している。 In the chip resistor (1A, 1B) according to the fifth aspect, in any one of the first to fourth aspects, the resistance value adjuster (12A, 12B) has the resistance value of the resistance value adjuster (12A, 12B) are formed with resistance value adjusting grooves (21A, 21B, 25B) for adjusting the . The resistance value adjusting grooves (21A, 21B, 25B) include resistance value adjusting linear portions (22A, 22B, 26B) extending from the edges (121, 122) of the resistance value adjusting portions (12A, 12B) and resistance value adjusting grooves (22A, 22B, 26B). It has folded portions (23A, 23B, 27B) for resistance value adjustment formed at one end of the linear portions (22A, 22B, 26B).
　この態様によれば、抵抗値調整溝（２１Ａ、２１Ｂ、２５Ｂ）が抵抗値調整用折り返し部（２３Ａ、２３Ｂ、２７Ｂ）を有しているので、抵抗値調整溝（２１Ａ、２１Ｂ、２５Ｂ）の延伸方向の最も先の部分にマイクロクラックが発生しにくい。 According to this aspect, since the resistance value adjusting grooves (21A, 21B, 25B) have the resistance value adjusting folded portions (23A, 23B, 27B), the resistance value adjusting grooves (21A, 21B, 25B) Microcracks are less likely to occur at the farthest portion in the stretching direction.
　第６態様に係るチップ抵抗器（１Ｃ、１Ｄ、１Ｅ、１Ｆ）は、基板（２）と、一対の電極（３、４）と、抵抗体（５Ｃ、５Ｄ、５Ｅ、５Ｆ）とを備えている。一対の電極（３，４）は、基板（２）の一面（２Ａ）の両端に設けられている。抵抗体（５Ｃ、５Ｄ、５Ｅ、５Ｆ）は、基板（２）の一面（２Ａ）において一対の電極（３、４）の間に設けられている。抵抗体（５Ｃ、５Ｄ、５Ｅ、５Ｆ）にはトリミング溝（１５Ｃ、１５Ｄ１、１５Ｄ２、１５Ｅ１、１５Ｅ２、１５Ｆ）が形成されている。トリミング溝（１５Ｃ、１５Ｄ１、１５Ｄ２、１５Ｅ１、１５Ｅ２、１５Ｆ）は、抵抗体（５Ｃ、５Ｄ、５Ｅ、５Ｆ）における一対の電極が並ぶ方向に沿った縁（５Ｃ２、５Ｄ１、５Ｄ２、５Ｅ１、５Ｅ２、５Ｆ２）から延びる直線部（１６Ｃ、１６Ｄ１、１６Ｄ２、１６Ｅ１、１６Ｅ２、１６Ｆ）と、直線部（１６Ｃ、１６Ｄ１、１６Ｄ２、１６Ｅ１、１６Ｅ２、１６Ｆ）の一端に形成され、基板（２）の厚さ方向からの平面視において曲率を有する形状となるように折り返された折り返し部（１７Ｃ、１７Ｄ１、１７Ｄ２、１７Ｅ１、１７Ｅ２）とを有している。 A chip resistor (1C, 1D, 1E, 1F) according to a sixth aspect comprises a substrate (2), a pair of electrodes (3, 4), and resistors (5C, 5D, 5E, 5F) there is A pair of electrodes (3, 4) are provided at both ends of one surface (2A) of the substrate (2). Resistors (5C, 5D, 5E, 5F) are provided between a pair of electrodes (3, 4) on one surface (2A) of the substrate (2). Trimming grooves (15C, 15D1, 15D2, 15E1, 15E2, 15F) are formed in the resistors (5C, 5D, 5E, 5F). The trimming grooves (15C, 15D1, 15D2, 15E1, 15E2, 15F) are the edges (5C2, 5D1, 5D2, 5E1, 5E2, 5C2, 5D1, 5D2, 5E1, 5E2, 5F2) extending from (16C, 16D1, 16D2, 16E1, 16E2, 16F), and formed at one end of the straight portions (16C, 16D1, 16D2, 16E1, 16E2, 16F) in the thickness direction of the substrate (2). It has folded portions (17C, 17D1, 17D2, 17E1, 17E2) that are folded so as to have a shape having a curvature when viewed from above.
　この態様によれば、直線部（１６Ｃ、１６Ｄ１、１６Ｄ２、１６Ｅ１、１６Ｅ２、１６Ｆ）と曲率を有する折り返し部（１７Ｃ、１７Ｄ１、１７Ｄ２、１７Ｅ１、１７Ｅ２）を有するトリミング溝（１５Ｃ、１５Ｄ１、１５Ｄ２、１５Ｅ１、１５Ｅ２、１５Ｆ）を形成することにより、抵抗体（５Ｃ、５Ｄ、５Ｅ、５Ｆ）における電流の流れを適切に制御し、電流が流れるときに過度な負荷集中が防止される。この結果、チップ抵抗器（１Ｃ、１Ｄ、１Ｅ、１Ｆ）の耐パルス性が向上する。 According to this aspect, trimming grooves (15C, 15D1, 15D2, 15E1) having linear portions (16C, 16D1, 16D2, 16E1, 16E2, 16F) and curved folded portions (17C, 17D1, 17D2, 17E1, 17E2) , 15E2, 15F) provide good control of current flow in resistors (5C, 5D, 5E, 5F) and prevent excessive load concentration when current flows. As a result, the pulse resistance of the chip resistors (1C, 1D, 1E, 1F) is improved.
　第７態様に係るチップ抵抗器（１Ｃ、１Ｄ、１Ｅ）では、第６態様において、トリミング溝（１５Ｃ、１５Ｄ１、１５Ｄ２、１５Ｅ１、１５Ｅ２）は、折り返し部（１７Ｃ、１７Ｄ１、１７Ｄ２、１７Ｅ１、１７Ｅ２）の一端から、直線部（１６Ｃ、１６Ｄ１、１６Ｄ２、１６Ｅ１、１６Ｅ２）としての第１直線部に対して平行に延びる第２直線部（１８Ｃ、１８Ｄ１、１８Ｄ２、１８Ｅ１、１８Ｅ２）を有している。 In the chip resistor (1C, 1D, 1E) according to the seventh aspect, in the sixth aspect, the trimming grooves (15C, 15D1, 15D2, 15E1, 15E2) has a second linear portion (18C, 18D1, 18D2, 18E1, 18E2) extending parallel to the first linear portion as a linear portion (16C, 16D1, 16D2, 16E1, 16E2) from one end of the .
　この態様によれば、第２直線部（１８Ｃ、１８Ｄ１、１８Ｄ２、１８Ｅ１、１８Ｅ２）によって、耐パルス特性を高く維持しつつ、抵抗値を所望の値に精度よく調整できる。 According to this aspect, the second linear portions (18C, 18D1, 18D2, 18E1, 18E2) can accurately adjust the resistance value to a desired value while maintaining high pulse resistance characteristics.
　第８態様に係るチップ抵抗器（１Ｃ、１Ｄ、１Ｅ、１Ｆ）では、第６又は第７態様において、抵抗体（５Ｃ、５Ｄ、５Ｅ、５Ｆ）における一対の電極（３、４）が並ぶ方向に交差する方向において、トリミング溝（１５Ｃ、１５Ｄ１、１５Ｄ２、１５Ｅ１、１５Ｅ２、１５Ｆ）の長さ（Ｗ１）は抵抗体（５Ｃ、５Ｄ、５Ｅ、５Ｆ）の長さ（Ｗ２）の７５％以下である。 In the chip resistor (1C, 1D, 1E, 1F) according to the eighth aspect, in the sixth or seventh aspect, the direction in which the pair of electrodes (3, 4) of the resistor (5C, 5D, 5E, 5F) are arranged , the length (W1) of the trimming grooves (15C, 15D1, 15D2, 15E1, 15E2, 15F) is 75% or less of the length (W2) of the resistors (5C, 5D, 5E, 5F) be.
　この態様によれば、トリミング溝１５の長さを制限することで、負荷集中を抑えて、それによりチップ抵抗器（１Ｃ、１Ｄ、１Ｅ、１Ｆ）のパルス特性を維持できる。 According to this aspect, by limiting the length of the trimming groove 15, load concentration can be suppressed, thereby maintaining the pulse characteristics of the chip resistors (1C, 1D, 1E, 1F).
　第９態様に係るチップ抵抗器（１Ｄ、１Ｅ）では、第６～第８態様のいずれかにおいて、トリミング溝（１５Ｄ１、１５Ｄ２、１５Ｅ１、１５Ｅ２）は複数形成されている。 In the chip resistor (1D, 1E) according to the ninth aspect, in any one of the sixth to eighth aspects, a plurality of trimming grooves (15D1, 15D2, 15E1, 15E2) are formed.
　この態様によれば、チップ抵抗器（１Ｄ、１Ｅ）のトリミング溝（１５Ｄ１、１５Ｄ２、１５Ｅ１、１５Ｅ２）が複数なので、負荷集中をさらに抑制できる。したがって、チップ抵抗器（１Ｄ、１Ｅ）の抵抗値の調整幅が大きくなる。 According to this aspect, since the chip resistors (1D, 1E) have a plurality of trimming grooves (15D1, 15D2, 15E1, 15E2), load concentration can be further suppressed. Therefore, the adjustment range of the resistance values of the chip resistors (1D, 1E) is increased.
　第１０態様に係るチップ抵抗器（１Ｅ）では、第９態様において、複数のトリミング溝（１５Ｅ１、１５Ｅ２）は、抵抗体（５Ｅ）における一対の電極（３、４）が並ぶ方向に沿った２つの縁（５Ｅ１、５Ｅ２）の各々から延びるものを含む。 In the chip resistor (1E) according to the tenth aspect, in the ninth aspect, the plurality of trimming grooves (15E1, 15E2) are arranged along the direction in which the pair of electrodes (3, 4) of the resistor (5E) are aligned. extending from each of the two edges (5E1, 5E2).
　この態様によれば、複数のトリミング溝（１５Ｅ１、１５Ｅ２）は抵抗体（５Ｅ）の異なる縁（５Ｅ１、５Ｅ２）から延びているので、大きな負荷集中を生じさせることなく、抵抗体（５Ｅ）を蛇行形状とすることで線路長を長くできる。その結果、抵抗値の修正幅を２倍以上長くできる。 According to this aspect, since the plurality of trimming grooves (15E1, 15E2) extend from different edges (5E1, 5E2) of the resistor (5E), the resistor (5E) can be trimmed without causing large load concentrations. The meandering shape allows the line length to be lengthened. As a result, the correction width of the resistance value can be doubled or longer.
　第１１態様に係るチップ抵抗器（１Ｃ、１Ｄ、１Ｅ、１Ｆ）では、第６～１０態様のいずれかにおいて、折り返し部（１７Ｃ、１７Ｄ１、１７Ｄ２、１７Ｅ１、１７Ｅ２、１７Ｆ）は、少なくとも一部に円弧部を有している。 In the chip resistor (1C, 1D, 1E, 1F) according to the eleventh aspect, in any one of the sixth to tenth aspects, the folded portion (17C, 17D1, 17D2, 17E1, 17E2, 17F) is at least partially It has an arc portion.
　この態様によれば、チップ抵抗器（１Ｃ、１Ｄ、１Ｅ、１Ｆ）の耐パルス性が向上する。 According to this aspect, the pulse resistance of the chip resistors (1C, 1D, 1E, 1F) is improved.
　第１２態様に係るチップ抵抗器（１Ｃ、１Ｄ、１Ｅ、１Ｆ）では、第１１態様において、折り返し部（１７Ｃ、１７Ｄ１、１７Ｄ２、１７Ｅ１、１７Ｅ２、１７Ｆ）の円弧部は、直線部（１６Ｃ、１６Ｄ１、１６Ｄ２、１６Ｅ１、１６Ｅ２、１６Ｆ）に接続された部分の直線部（１６Ｃ、１６Ｄ１、１６Ｄ２、１６Ｅ１、１６Ｅ２、１６Ｆ）に対する角度が９０度を超え、かつ、１８０度以下である。 In the chip resistor (1C, 1D, 1E, 1F) according to the twelfth aspect, in the eleventh aspect, the arc portions of the folded portions (17C, 17D1, 17D2, 17E1, 17E2, 17F) are linear portions (16C, 16D1 , 16D2, 16E1, 16E2, 16F) with respect to the straight line portion (16C, 16D1, 16D2, 16E1, 16E2, 16F) is more than 90 degrees and 180 degrees or less.
　この態様によれば、チップ抵抗器（１Ｃ、１Ｄ、１Ｅ、１Ｆ）の耐パルス性が向上する。 According to this aspect, the pulse resistance of the chip resistors (1C, 1D, 1E, 1F) is improved.
　第１３態様に係るチップ抵抗器（１Ｃ、１Ｄ、１Ｅ）では、第１１又は第１２態様において、円弧部は半円を含んでいる。半円の直径（Ｄ）は、一対の電極（３、４）が並ぶ方向に交差する方向における抵抗体（５Ｃ、５Ｄ、５Ｅ）の長さ（Ｗ２）の１／１０以上である。 In the chip resistor (1C, 1D, 1E) according to the thirteenth aspect, in the eleventh or twelfth aspect, the arc portion includes a semicircle. The diameter (D) of the semicircle is 1/10 or more of the length (W2) of the resistors (5C, 5D, 5E) in the direction crossing the direction in which the pair of electrodes (3, 4) are arranged.
　この態様によれば、チップ抵抗器（１Ｃ、１Ｄ、１Ｅ）の耐パルス性が向上する。 According to this aspect, the pulse resistance of the chip resistors (1C, 1D, 1E) is improved.
１、１Ａ、１Ｂ、１Ｃ、１Ｄ、１Ｅ、１Ｆ：チップ抵抗器
２：絶縁基板
２Ａ：表面
３：第１電極
４：第２電極
５、５Ａ、５Ｂ、５Ｃ、５Ｄ、５Ｅ、５Ｆ：抵抗体
１２、１２Ａ、１２Ｂ：抵抗値調整部
１５：トリミング溝
１５Ａ、１５Ｂ、１５Ｄ１、１６Ｅ１：第１トリミング溝
１５Ｃ：トリミング溝
１５Ｄ２、１６Ｅ２：第２トリミング溝
１６：第１直線部
１６Ａ、１６Ｂ、１６Ｃ、１６Ｄ１、１６Ｅ１：第１直線部
１６Ｄ２、１６Ｅ２：第３直線部
１７、１７Ｃ：折り返し部
１７Ａ、１７Ｂ、１７Ｄ１、１７Ｅ１：第１折り返し部
１７Ｄ２、１７Ｅ２：第２折り返し部
１８、１８Ａ、１８Ｂ、１８Ｃ、１８Ｄ１、１８Ｅ１：第２直線部
１８Ｄ２、１８Ｅ２：第４直線部
１８１、１８Ａ１、１８Ｂ１：終端
２１Ａ、２１Ｂ：第２トリミング溝
２２Ａ、２２Ｂ：第３直線部
２６Ｂ：第５直線部
２７Ｂ：第３折り返し部
２８Ｂ：第６直線部 1, 1A, 1B, 1C, 1D, 1E, 1F: chip resistor 2: insulating substrate 2A: surface 3: first electrode 4: second electrode 5, 5A, 5B, 5C, 5D, 5E, 5F: resistor 12, 12A, 12B: resistance value adjusting portion 15: trimming grooves 15A, 15B, 15D1, 16E1: first trimming groove 15C: trimming grooves 15D2, 16E2: second trimming groove 16: first linear portions 16A, 16B, 16C, 16D1, 16E1: first straight portions 16D2, 16E2: third straight portions 17, 17C: folded portions 17A, 17B, 17D1, 17E1: first folded portions 17D2, 17E2: second folded portions 18, 18A, 18B, 18C, 18D1, 18E1: Second straight portions 18D2, 18E2: Fourth straight portions 181, 18A1, 18B1: Terminal ends 21A, 21B: Second trimming grooves 22A, 22B: Third straight portion 26B: Fifth straight portion 27B: Third folded back Part 28B: sixth straight part

Claims (13)

  1. 　基板と、
    　前記基板の一面の両端に設けられた一対の電極と、
    　前記基板の前記一面において前記一対の電極の間に設けられた抵抗体と、を備え、
    　前記抵抗体は、
    　　前記一対の電極にそれぞれ接続された一対の接続部と、
    　　前記一対の接続部の間に設けられた抵抗値調整部と、を有しており、
    　前記抵抗値調整部には、前記抵抗値調整部を蛇行形状とするための蛇行形成溝が形成されており、
    　前記蛇行形成溝は、
    　　前記抵抗値調整部の縁から延びる直線部と、
    　　前記直線部の一端に形成された折り返し部とを有している、
    チップ抵抗器。     a substrate;
    a pair of electrodes provided at both ends of one surface of the substrate;
    a resistor provided between the pair of electrodes on the one surface of the substrate;
    The resistor is
    a pair of connection portions respectively connected to the pair of electrodes;
    and a resistance value adjustment unit provided between the pair of connection units,
    The resistance value adjusting portion is formed with a meandering groove for forming the resistance value adjusting portion in a meandering shape,
    The meandering groove is
    a straight portion extending from the edge of the resistance value adjusting portion;
    and a folded portion formed at one end of the straight portion,
    chip resistor.
  2. 　前記折り返し部は、前記基板の厚さ方向からの平面視において半円弧形状である、
    請求項１に記載のチップ抵抗器。     The folded portion has a semicircular arc shape in plan view from the thickness direction of the substrate,
    The chip resistor according to claim 1.
  3. 　前記蛇行形成溝は、前記折り返し部から前記直線部としての第１直線部に対して折り返すように延びる第２直線部を更に有しており、
    　前記第２直線部は、前記抵抗値調整部内に終端を有している、
    請求項１又は２に記載のチップ抵抗器。     The meandering forming groove further has a second straight portion extending from the folded portion so as to fold back with respect to the first straight portion as the straight portion,
    The second linear portion has a terminal end within the resistance value adjusting portion,
    A chip resistor according to claim 1 or 2.
  4. 　前記第２直線部の前記終端は、前記抵抗値調整部内において抵抗値影響が少ない位置にある、
    請求項３に記載のチップ抵抗器。     The terminal end of the second linear portion is located at a position where the influence of the resistance value is small within the resistance value adjusting portion,
    The chip resistor according to claim 3.
  5. 　前記抵抗値調整部には、前記抵抗値調整部の抵抗値を調整するための抵抗値調整溝が形成されており、
    　前記抵抗値調整溝は、前記抵抗値調整部の縁から延びる抵抗値調整用直線部と、前記抵抗値調整用直線部の一端に形成された抵抗値調整用折り返し部とを有している、
    請求項１～４のいずれかに記載のチップ抵抗器。     a resistance value adjusting groove for adjusting a resistance value of the resistance value adjusting portion is formed in the resistance value adjusting portion;
    The resistance value adjusting groove has a resistance value adjusting straight portion extending from an edge of the resistance value adjusting portion, and a resistance value adjusting folded portion formed at one end of the resistance value adjusting straight portion.
    A chip resistor according to any one of claims 1 to 4.
  6. 　基板と、
    　前記基板の一面の両端に設けられた一対の電極と、
    　前記基板の前記一面において前記一対の電極の間に設けられた抵抗体と、を備え、
    　前記抵抗体にはトリミング溝が形成されており、
    　前記トリミング溝は、
    　　前記抵抗体における前記一対の電極が並ぶ方向に沿った縁から延びる直線部と、
    　　前記直線部の一端に形成され、前記基板の厚さ方向からの平面視において曲率を有する形状となるように折り返された折り返し部と、
    　有する、
    チップ抵抗器。     a substrate;
    a pair of electrodes provided at both ends of one surface of the substrate;
    a resistor provided between the pair of electrodes on the one surface of the substrate;
    A trimming groove is formed in the resistor,
    The trimming groove is
    a linear portion extending from an edge of the resistor along the direction in which the pair of electrodes are arranged;
    a folded portion formed at one end of the linear portion and folded back so as to have a shape having a curvature in plan view from the thickness direction of the substrate;
    have
    chip resistor.
  7. 　前記トリミング溝は、前記折り返し部の一端から、前記直線部としての第１直線部に対して平行に延びる第２直線部を有する、
    請求項６に記載のチップ抵抗器。     The trimming groove has a second linear portion extending parallel to the first linear portion as the linear portion from one end of the folded portion,
    The chip resistor according to claim 6.
  8. 　前記抵抗体における前記一対の電極が並ぶ方向に交差する方向において、前記トリミング溝の長さは前記抵抗体の長さの７５％以下である、
    請求項６又は７に記載のチップ抵抗器。     The length of the trimming groove is 75% or less of the length of the resistor in a direction intersecting the direction in which the pair of electrodes of the resistor are arranged,
    A chip resistor according to claim 6 or 7.
  9. 　前記トリミング溝は複数形成されている、
    請求項６～８のいずれかに記載のチップ抵抗器。     A plurality of the trimming grooves are formed,
    A chip resistor according to any one of claims 6 to 8.
  10. 　前記複数のトリミング溝は、前記抵抗体における前記一対の電極が並ぶ方向に沿った２つの縁の各々から延びるものを含む、
    請求項９に記載のチップ抵抗器。     The plurality of trimming grooves include those extending from each of two edges along the direction in which the pair of electrodes of the resistor are arranged,
    The chip resistor according to claim 9.
  11. 　前記折り返し部は、少なくとも一部に円弧部を有している、
    請求項６～１０のいずれかに記載のチップ抵抗器。     The folded portion has an arc portion at least in part,
    A chip resistor according to any one of claims 6 to 10.
  12. 　前記折り返し部の前記円弧部は、前記直線部に接続された部分の前記直線部に対する角度が９０度を超え、かつ、１８０度以下である、
    請求項１１に記載のチップ抵抗器。     In the arc portion of the folded portion, the angle of the portion connected to the straight portion with respect to the straight portion exceeds 90 degrees and is 180 degrees or less.
    The chip resistor according to claim 11.
  13. 　前記円弧部は半円を含んでおり、
    　前記半円の直径は、前記一対の電極が並ぶ方向に交差する方向における前記抵抗体の長さの１／１０以上である、
    請求項１１又は１２に記載のチップ抵抗器。     the arc portion includes a semicircle,
    The diameter of the semicircle is 1/10 or more of the length of the resistor in the direction intersecting the direction in which the pair of electrodes are arranged.
    A chip resistor according to claim 11 or 12.
PCT/JP2023/002378 2022-01-31 2023-01-26 Chip resistor WO2023145802A1 (en)

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Citations (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH1140401A (en) * 1997-07-22 1999-02-12 Rohm Co Ltd Chip resistor and method of laser trimming the same
JPH11126701A (en) * 1987-10-22 1999-05-11 Hokuriku Electric Ind Co Ltd Chip resistor
JP2000012305A (en) * 1998-04-22 2000-01-14 Kamaya Denki Kk Chip type fuse resistor
JP2002033203A (en) * 2000-07-13 2002-01-31 K-Tech Devices Corp Composite electronic component
JP2018026519A (en) * 2016-08-11 2018-02-15 サムソン エレクトロ−メカニックス カンパニーリミテッド． Chip resistor element and chip resistor element assembly

Patent Citations (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH11126701A (en) * 1987-10-22 1999-05-11 Hokuriku Electric Ind Co Ltd Chip resistor
JPH1140401A (en) * 1997-07-22 1999-02-12 Rohm Co Ltd Chip resistor and method of laser trimming the same
JP2000012305A (en) * 1998-04-22 2000-01-14 Kamaya Denki Kk Chip type fuse resistor
JP2002033203A (en) * 2000-07-13 2002-01-31 K-Tech Devices Corp Composite electronic component
JP2018026519A (en) * 2016-08-11 2018-02-15 サムソン エレクトロ−メカニックス カンパニーリミテッド． Chip resistor element and chip resistor element assembly

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