WO2023035770A1

WO2023035770A1 - Intelligent luggage item security inspection system and method

Info

Publication number: WO2023035770A1
Application number: PCT/CN2022/105829
Authority: WO
Inventors: 张丽; 杨洪恺; 邢宇翔; 孙运达; 金鑫; 沈乐; 常铭; 许晓飞
Original assignee: 同方威视技术股份有限公司; 清华大学
Priority date: 2021-09-09
Filing date: 2022-07-14
Publication date: 2023-03-16
Also published as: CN115793077A

Abstract

A two-stage security inspection system (100), comprising: a primary detection device (102) used to perform primary detection on an inspected item (106) on a conveying device (104); a secondary detection device (108) used to perform secondary detection on one or more specific areas in the inspected item (106) that has been determined to be suspicious after passing primary detection, wherein the conveying device (104) comprises a buffer conveying segment (1041), and the buffer conveying segment (1041) is located between the primary detection device (102) and the secondary detection device (108), and is used to convey the suspicious inspected item (106) to the secondary detection device (108); and a control device (110) used to control the operation of the buffer conveying segment (1041) according to a conveying condition of the suspicious inspected item (106) on the buffer conveying segment (1041) to buffer a difference between detection rates of the primary detection device (102) and the secondary detection device (108). Further provided is a two-stage security inspection method (600, 900).

Description

行李物品智能安检***和方法Intelligent security inspection system and method for baggage items

相关申请的交叉引用Cross References to Related Applications

本申请要求享有于2021年9月9日提交的名称为“行李物品智能安检***和方法”的中国专利申请202111054291.9的优先权，该申请的全部内容通过引用并入本文中。This application claims priority to Chinese patent application 202111054291.9, filed September 9, 2021, entitled "Intelligent Security Inspection System and Method for Baggage and Items", the entire content of which is incorporated herein by reference.

技术领域technical field

本申请涉及安检技术领域，尤其涉及双级安检***和方法。The application relates to the technical field of security inspection, in particular to a two-stage security inspection system and method.

背景技术Background technique

X射线透视技术(Digital Radiography，DR)和X射线断层成像技术(Computed Tomography，CT)凭借检测方便快捷、检测物品涉及范围广等优势已成为公共安全领域的重要技术手段，覆盖机场、地铁、海关等众多应用场景。然而，CT和DR检测难以对原子序数和电子密度接近的物质进行有效区分，因此在实际应用中容易产生较高的误报率。X-ray fluoroscopy technology (Digital Radiography, DR) and X-ray tomography technology (Computed Tomography, CT) have become important technical means in the field of public security by virtue of their advantages such as convenient and fast detection and a wide range of detection items, covering airports, subways, customs and many other application scenarios. However, it is difficult for CT and DR detection to effectively distinguish substances with similar atomic numbers and electron densities, so it is easy to produce a high false positive rate in practical applications.

X射线衍射(X-ray diffraction，XRD)技术通过测量物质的衍射谱进行物质识别，可提供物质分子层面的结构信息，具有很强的特异性。然而，XRD检测如果要对物品内部进行全面检测，则扫描时间过长。如果通过增大探测器面积或提高光机电流等方式来提高XRD检测速度，则会导致成本升高、防护难度加大等问题，影响产品实用性。X-ray diffraction (X-ray diffraction, XRD) technology identifies substances by measuring the diffraction spectrum of substances, which can provide structural information at the molecular level of substances and has strong specificity. However, if XRD detection is to conduct a comprehensive inspection of the interior of the item, the scanning time is too long. If the XRD detection speed is increased by increasing the detector area or increasing the optomechanical current, etc., it will lead to problems such as increased cost and increased protection difficulty, which will affect the practicability of the product.

近年来，已经提出将CT或DR和XRD检测相结合，从而提高检测准确度的方案。然而，传统地，CT或DR检测和XRD检测只是简单结合，由于XRD检测所需时间长于CT或DR检测，因此不可避免会大大延长检测时间，影响安检通过效率和检测效率。In recent years, it has been proposed to combine CT or DR and XRD detection to improve the detection accuracy. However, traditionally, CT or DR detection and XRD detection are simply combined. Since the time required for XRD detection is longer than that of CT or DR detection, it is inevitable that the detection time will be greatly prolonged, which will affect the efficiency of security inspection and detection efficiency.

发明内容Contents of the invention

根据本申请的一方面，提供了一种双级安检***，包括：一级检测设备，用于对传送设备上的受检物品进行一级检测；二级检测设备，用于对已经过一级检测而被确定为可疑的受检物品中的一个或多个特定区域进行二级检测，其中，传送设备包括缓冲传送段，该缓冲传送段位于一级检测设备和二级检测设备之间，用于将可疑的受检物品运送到二级检测设备；以及控制设备，用于根据缓冲传送段上的可疑的受检物品的运送情况来控制缓冲传送段的运行以缓冲一级检测设备和二级检测设备的检测速率之间的差异。According to one aspect of the present application, a dual-level security inspection system is provided, including: a first-level detection device for performing a first-level detection on the inspected items on the conveying device; a second-level detection device for One or more specific areas in the inspected items determined to be suspicious through detection are subjected to secondary detection, wherein the transmission equipment includes a buffer transmission section, which is located between the primary detection equipment and the secondary detection equipment, and is used It is used to transport suspicious inspected items to the secondary detection equipment; and the control device is used to control the operation of the buffer transmission section according to the delivery of suspicious inspected items on the buffer transmission section to buffer the primary detection equipment and the secondary detection equipment. Detect the difference between the detection rates of the devices.

根据本申请的另一方面，提供了一种双级安检方法，包括：通过一级检测设备对传送设备上的受检物品进行一级检测；通过二级检测设备对已经过一级检测而被确定为可疑的受检物品中的一个或多个特定区域进行二级检测，其中传送设备包括缓冲传送段，该缓冲传送段位于一级检测设备和二级检测设备之间，用于将可疑的受检物品运送到二级检测设备；以及通过控制设备根据缓冲传送段上的可疑的受检物品的运送情况来控制缓冲传送段的运行以缓冲一级检测设备和二级检测设备的检测速率之间的差异。According to another aspect of the present application, a two-level security inspection method is provided, including: performing a first-level detection on the inspected items on the conveying device through a first-level detection device; One or more specific areas in the inspected items determined to be suspicious are subjected to secondary detection, wherein the transfer device includes a buffer transfer section, which is located between the primary detection device and the secondary detection device, and is used to transfer the suspicious The inspected items are transported to the secondary detection equipment; and the operation of the buffer transmission section is controlled by the control device according to the delivery of suspicious inspected items on the buffer transmission section to buffer the difference between the detection rates of the primary detection equipment and the secondary detection equipment. difference between.

根据本申请的另一方面，提供了一种XRD检测设备，包括：射线源，具有一排多个射线源焦点，每个射线源焦点能被独立控制而发射射线；前准直器，被布置为使得来自射线源的射线在一个或多个扇束平面照射到受检物品上；探测器模块，包括一组或多组探测器，每组探测器与一个或多个扇束平面之一相对应，并用于探测与该组探测器相对应的扇束平面的射线经受检物品衍射并经准直后的射线，其中，每组探测器包括一个或多个探测器，每个探测器用于探测经受检物品中的特定位置衍射并经准直后的射线，该特定位置处于该探测器的各像素元件沿与相应准直方向相反的方向与该组探测器相对应的扇束平面相交的交点位置。According to another aspect of the present application, an XRD detection device is provided, including: a radiation source having a row of multiple radiation source focal points, each of which can be independently controlled to emit radiation; a front collimator arranged In order to make the rays from the ray source irradiate the inspected article on one or more fan beam planes; the detector module includes one or more groups of detectors, and each group of detectors is connected to one of the one or more fan beam planes Corresponding, and used to detect the rays of the fan beam plane corresponding to the group of detectors that are diffracted by the inspected article and collimated, wherein each group of detectors includes one or more detectors, and each detector is used for Detect the collimated and diffracted rays at a specific position in the object under inspection. The specific position is located at each pixel element of the detector and intersects the corresponding fan beam plane of the group of detectors in the direction opposite to the corresponding collimation direction position of intersection.

根据本申请的另一方面，提供了一种XRD检测方法，包括：通过射线源来发射射线，其中射线源具有一排多个射线源焦点，每个射线源焦点能被独立控制而发射射线；通过前准直器使得来自射线源的射线在一个或多扇束平面照射到受检物品上；通过探测器模块来探测一个或多个扇束平面的射线经受检物品衍射并经准直后的射线，其中，探测器模块包括一组或多组探测器，每组探测器与一个或多个扇束平面之一相对应，并用于探测与该组探测器相对应的扇束平面的射线经受检物品衍射并经准直后的射线，其中每组探测器包括一个或多个探测器，每个探测器用于探测经受检物品中的特定位置衍射并经准直后的射线，该特定位置处于该探测器的各像素元件沿与相应准直方向相反的方向与该组探测器相对应的扇束平面相交的交点位置。According to another aspect of the present application, an XRD detection method is provided, including: emitting rays through a ray source, wherein the ray source has a row of multiple ray source focal points, and each ray source focus can be independently controlled to emit rays; Through the front collimator, the rays from the ray source are irradiated on the inspected item on one or more fan beam planes; the rays from one or more fan beam planes are detected by the detector module after being diffracted by the inspected item and collimated , wherein the detector module includes one or more groups of detectors, each group of detectors corresponds to one of one or more fan beam planes, and is used to detect the rays of the fan beam plane corresponding to the group of detectors The rays diffracted and collimated by the inspected article, wherein each group of detectors includes one or more detectors, each detector is used to detect the rays diffracted and collimated by a specific position in the inspected article, the The specific position is at the intersection position where each pixel element of the detector intersects the corresponding fan beam plane of the group of detectors along a direction opposite to the corresponding collimation direction.

根据本申请的又一方面，提供一种双级安检方法，包括：通过一级检测设备对传送设备的一级检测传送段上的受检物品进行一级检测；使得经过一级检测而被认为不可疑的受检物品通过传送设备的放行传送段而放行；使得经过一级检测而被认为可疑的受检物品传送到传送设备的缓冲传送段，其中缓冲传送段用于将可疑的受检物品运送到二级检测设备；通过控制设备根据缓冲传送段上的可疑的受检物品的运送情况来控制缓冲传送段的运行，以缓冲一级检测设备和二级检测设备的检测速率之间的差异；通过二级检测设备对可疑的受检物品中的每一个可疑的区域进行二级检测；使得经过二级检测而被认为不可疑的受检物品通过传送设备的放行传送段而放行；以及使得经过二级检测而被认为可疑的受检物品传送到传送设备的查验传送段以经受进一步检查。According to yet another aspect of the present application, a two-level security inspection method is provided, including: performing a first-level detection on the inspected items on the first-level detection transmission section of the conveying equipment through a first-level detection device; Unsuspicious inspected items are released through the release conveying section of the conveying equipment; the inspected articles considered suspicious after the first-level inspection are transmitted to the buffer conveying section of the conveying equipment, where the buffer conveying section is used to release suspicious inspected articles Transport to the secondary detection equipment; through the control equipment to control the operation of the buffer transmission section according to the delivery of suspicious items on the buffer transmission section, so as to buffer the difference between the detection rates of the primary detection equipment and the secondary detection equipment ; performing a secondary detection on each suspicious area in the suspicious inspected items through the secondary detection equipment; allowing the inspected items that are considered to be unsuspected after the secondary detection to be released through the release transmission section of the transmission device; and making the The inspected items that are considered suspicious after the secondary detection are transferred to the inspection conveying section of the conveying equipment for further inspection.

根据本申请的双级安检***和双级检测方法，由于缓冲传送段以及相关联的控制设备的设置，能够有效缓冲一级检测和二级检测之间的检测速率之间的差异，从而避免由于这两级检测的检测速率不同而可能导致由于二级检测设备处检测任务堆积而要求对安检***的其他部分进行暂停的需求，从而提高通过效率和检测效率。此外，在二级检测中采用了多焦点多扇束平面出束方式，可以覆盖传送方向上尽可能多的范围。According to the dual-level security inspection system and the dual-level detection method of the present application, due to the setting of the buffer transmission section and the associated control equipment, the difference between the detection rates between the first-level detection and the second-level detection can be effectively buffered, thereby avoiding the The different detection rates of these two levels of detection may lead to the need to suspend other parts of the security inspection system due to the accumulation of detection tasks at the secondary detection equipment, thereby improving the passing efficiency and detection efficiency. In addition, in the secondary detection, the multi-focus and multi-fan beam plane beam output method is adopted, which can cover as much range as possible in the transmission direction.

附图说明Description of drawings

通过参考附图会更加清楚地理解本申请的特征和优点，附图是示意性的而不应理解为对本申请进行任何限制，在附图中：The features and advantages of the present application will be more clearly understood by reference to the accompanying drawings, which are schematic and should not be construed as limiting the application in any way, in which:

图1图示出根据本申请的实施例的双级安检***的示意图；FIG. 1 illustrates a schematic diagram of a two-stage security check system according to an embodiment of the present application;

图2图示出根据本申请的实施例的缓冲传送段的示意图；FIG. 2 illustrates a schematic diagram of a buffer transfer segment according to an embodiment of the present application;

图3图示出根据本申请的实施例的在图1的双级安检***中安装了成像设备的示意图；FIG. 3 illustrates a schematic diagram of an imaging device installed in the two-stage security check system of FIG. 1 according to an embodiment of the present application;

图4图示出根据本申请的实施例的XRD检测设备的示意图；Figure 4 illustrates a schematic diagram of an XRD detection device according to an embodiment of the present application;

图5图示出根据本申请的实施例的XRD检测设备的示意图；Figure 5 illustrates a schematic diagram of an XRD detection device according to an embodiment of the present application;

图6是示出根据本申请的实施例的双级安检方法的流程图；FIG. 6 is a flowchart illustrating a two-stage security check method according to an embodiment of the present application;

图7是示出根据本申请的实施例的XRD检测方法的流程图；Fig. 7 is the flowchart showing the XRD detection method according to the embodiment of the present application;

图8是示出根据本申请的实施例的双级安检***和方法的应用场景图示；以及Fig. 8 is a diagram illustrating an application scenario of a dual-level security inspection system and method according to an embodiment of the present application; and

图9是示出根据本申请的实施例的双级安检方法的流程图。FIG. 9 is a flowchart illustrating a two-stage security inspection method according to an embodiment of the present application.

具体实施方式Detailed ways

本申请提出了复合式双级安检***和方法，其中两级检测并不是简单结合，而是通过独特缓冲传送段设计而链接，能够避免由于这两级检测的检测速率不同而可能导致由于二级检测设备处检测任务堆积而要求对安检***的其他部分进行暂停的需求，从而提高通过效率和检测效率。此外，本申请还提出了一种独特的安检设备，其中射线发射模块和探测器模块具有独特的结构和排布，能够有助于实现高效检测。This application proposes a composite dual-level security inspection system and method, in which the two-level detection is not a simple combination, but is linked through a unique buffer transmission section design, which can avoid the possibility of secondary security due to the different detection rates of the two-level detection The accumulation of detection tasks at the detection equipment requires the suspension of other parts of the security inspection system, thereby improving the passing efficiency and detection efficiency. In addition, the present application also proposes a unique security inspection device, in which the radiation emitting module and the detector module have a unique structure and arrangement, which can help realize efficient detection.

下面结合图1-9来说明根据本申请实施例的双级安检***和方法。The two-level security inspection system and method according to the embodiment of the present application will be described below with reference to FIGS. 1-9 .

图1图示出根据本申请的实施例的双级安检***100的示意图。如图1所示，双级安检***100包括：一级检测设备102，用于对传送设备104上的受检物品106进行一级检测；二级检测设备108，用于对已经过一级检测而被确定为可疑的受检物品106中的一个或多个特定区域进行二级检测，其中，传送设备104包括缓冲传送段1041，该缓冲传送段1041位于一级检测设备102和二级检测设备108之间，用于将可疑的受检物品106运送到二级检测设备108；以及控制设备110，用于根据缓冲传送段1041上的可疑的受检物品的运送情况来控制缓冲传送段1041的运行以缓冲一级检测设备102和二级检测设备108的检测速率之间的差异。FIG. 1 illustrates a schematic diagram of a two-stage security inspection system 100 according to an embodiment of the present application. As shown in Figure 1, the two-level security inspection system 100 includes: a primary detection device 102, which is used to perform a primary detection on the inspected item 106 on the conveying device 104; a secondary detection device 108, which is used to perform a primary detection One or more specific areas in the inspected article 106 that are determined to be suspicious are subjected to secondary detection, wherein the transmission device 104 includes a buffer transmission section 1041, and the buffer transmission section 1041 is located at the primary detection device 102 and the secondary detection device. 108, for transporting suspicious inspected articles 106 to secondary detection equipment 108; Operates to buffer the difference between the detection rates of the primary detection device 102 and the secondary detection device 108 .

通过这种两级检测，一级检测设备102获取受检物品的信息，诸如但不限于受检物品整体及内部所有物体的几何形状、原子序数、电子密度、X射线衰减系数、内部干扰物的信息和内部可疑物的位置信息。二级检测设备108针对已经过一级检测而被确定为可疑的受检物品进行有针对性的局部检查(即针对可疑的受检物品的一个或多个特定区域(每一个可疑区域)进行检查)。这些信息被传送到处理设备以进行可疑物判断、风险水平评估等，以便做出放行还是开箱检查的后续决策，大幅降低了误报率，减少后续不必要的人工成本。Through this two-level detection, the first-level detection device 102 obtains the information of the inspected item, such as but not limited to the geometric shape, atomic number, electron density, X-ray attenuation coefficient, and internal interference of the entire inspected item and all internal objects. information and location information of suspicious objects inside. The secondary detection device 108 performs targeted local inspection on the inspected articles that have been determined to be suspicious after the primary inspection (that is, inspects one or more specific areas (each suspicious area) of the suspicious inspected articles. ). This information is transmitted to the processing equipment for suspicious object judgment, risk level assessment, etc., so as to make subsequent decisions on whether to release or open the box for inspection, which greatly reduces the false alarm rate and reduces unnecessary subsequent labor costs.

传送设备104用于在驱动下运送受检物品以经受安检***100的检测。在一些实现方式中，一级检测设备102和二级检测设备108可能具有不同的检测速率，诸如一级检测设备102的检测速率高于二级检测设备108的检测速率。在这种情况下，有可能发生二级检测设备108处检测任务堆积而要求例如一级检测设备102暂停以等待，直到二级检测设备108完成已有的检测任务，从而会影响整个安检***的通过效率和检测效率。缓冲传送段1041以及相关联的控制设备110的布置能够对两级检测设备的检测进行有效协调，以避免在二级检测设备完成其已有任务前对安检***的其他部分进行暂停的需求，从而提高整个安检***的通过效率和检测效率。The conveying device 104 is used to convey the inspected items under driving to be inspected by the security inspection system 100 . In some implementations, the primary detection device 102 and the secondary detection device 108 may have different detection rates, such as the detection rate of the primary detection device 102 being higher than the detection rate of the secondary detection device 108 . In this case, it may happen that the detection tasks at the secondary detection equipment 108 are piled up and require, for example, the primary detection equipment 102 to suspend and wait until the secondary detection equipment 108 completes the existing detection tasks, which will affect the operation of the entire security inspection system. Passing efficiency and detection efficiency. The arrangement of the buffer transfer section 1041 and the associated control device 110 can effectively coordinate the detection of the two-level detection equipment, so as to avoid the need to suspend other parts of the security inspection system before the second-level detection equipment completes its existing tasks, thereby Improve the passing efficiency and detection efficiency of the entire security inspection system.

缓冲传送段可以通过许多方式来构成。在一些实施例中，缓冲传送段可以通过圆柱件来构成。图2图示出根据本申请的实施例的缓冲传送段的示意图。如图2所述，缓冲传送段1041可以包括能独立滚动的多个圆柱件112，这多个圆柱件112沿着传送方向依次排布。在这些圆柱件112的滚动下，受检物品106可以被向着二级检测设备108运送。控制设备110根据缓冲传送段1041上的受检物品的运送情况来选择性地控制这多个圆柱件112中的一个或多个圆柱件以进行滚动或停止滚动，从而控制缓冲传送段1041上各受检物品的运送。圆柱件的材质不受限制，只要其适于用于传送受检物品即可。圆柱件的直径可以根据一级检测设备和二级检测设备之间的距离而设定。控制设备110可以被实现为使得每个圆柱件可以由各自相关联的控制单元来控制，也可以由集中控制装置来控制。应理解，本申请并不限于这种缓冲方式，而是在一些实现方式中，可以采用其他方式来实现这种对一级检测设备102和二级检测设备108之间的检测速率之间的差异的缓冲。Buffered transfer segments can be formed in a number of ways. In some embodiments, the buffer transfer section may be formed by a cylindrical member. FIG. 2 illustrates a schematic diagram of a buffer transfer segment according to an embodiment of the present application. As shown in FIG. 2 , the buffer conveying section 1041 may include a plurality of cylinders 112 that can roll independently, and the cylinders 112 are arranged in sequence along the conveying direction. Under the rolling of these cylinders 112 , the inspected item 106 can be transported toward the secondary inspection device 108 . The control device 110 selectively controls one or more of the plurality of cylinders 112 to roll or stop rolling according to the conveyance of the inspected articles on the buffer conveying section 1041, thereby controlling each cylinder on the buffer conveying section 1041 Shipping of inspected items. The material of the cylinder is not limited, as long as it is suitable for conveying the inspected items. The diameter of the cylindrical piece can be set according to the distance between the primary detection equipment and the secondary detection equipment. The control device 110 can be realized such that each cylinder can be controlled by a respective associated control unit, or by a centralized control device. It should be understood that the present application is not limited to this buffering manner, but in some implementation manners, other manners may be used to realize the difference between the detection rates of the primary detection device 102 and the secondary detection device 108 buffer.

缓冲传送段上的受检物品的运送情况可以通过许多方式来确定。在一些实施例中，缓冲传送段上的受检物品的运送情况可以通过成像设备所捕获的图像信息来确定。图3图示出根据本申请的实施例的在图1的双级安检***中安装了成像设备的示意图。如图3所示，在图1的双级安检***100中可以包括成像设备114，该成像设备114用于朝着缓冲传送段1041进行成像。控制设备110根据从成像设备114所捕获的图像信息来确定缓冲传送段上的受检物品的运送情况。具体地，通过此图像信息可以识别出哪些受检物品应该保持静止以及哪些受检物品应该继续向前运动。例如，当受检物品间的距离小于预定阈值时，则确定后面的受检物品应先暂停运行，而当受检物品间的距离大于等于预定阈值时，则确定所涉及的受检物品应继续向前；又如，当一段传送距离内的受检物品数量大于预定阈值时，则确定在后的受检物品应先暂停运行，而当一段传送距离内的受检物品数量小于等于预定阈值时，确定所涉及的受检物品应继续向前。应理解，本申请的实施例并不限于此。根据要被控制以静止或继续向前运动的那些受检物品，相应地识别出与这些受检物品相应的圆柱件，从而对这些圆柱件下达滚动或停止滚动的指令。The delivery of inspected items on the buffer conveyor can be determined in a number of ways. In some embodiments, the transport condition of the inspected item on the buffer conveying section can be determined through the image information captured by the imaging device. FIG. 3 illustrates a schematic diagram of an imaging device installed in the two-stage security inspection system of FIG. 1 according to an embodiment of the present application. As shown in FIG. 3 , the dual-stage security inspection system 100 in FIG. 1 may include an imaging device 114 for performing imaging toward the buffer transport section 1041 . The control device 110 determines the transport condition of the inspected item on the buffer conveying section according to the image information captured by the imaging device 114 . Specifically, it is possible to identify which inspected objects should remain stationary and which inspected objects should continue to move forward by means of the image information. For example, when the distance between the inspected items is less than a predetermined threshold, it is determined that the subsequent inspected items should first suspend operation, and when the distance between the inspected items is greater than or equal to a predetermined threshold, it is determined that the involved inspected items should continue Forward; for another example, when the number of inspected items within a transmission distance is greater than the predetermined threshold, it is determined that the subsequent inspection items should be suspended first, and when the number of inspected items within a transmission distance is less than or equal to the predetermined threshold , to determine the items involved in the inspection should move forward. It should be understood that the embodiments of the present application are not limited thereto. According to those inspected objects to be controlled to be stationary or continue to move forward, corresponding cylinders corresponding to these inspected objects are identified, so as to give instructions to these cylinders to roll or stop rolling.

成像设备114可以是单独的设备或者可以与其他设备相集成。如图3所示，示出了两个成像设备114，其中一个附接在一级检测设备102的出口端，另一个悬吊于二级检测设备108的入口端的上方。然而，应理解，成像设备的数量和布置方式并不限于这里所描述的具体方式，只要其布置能够使能对缓冲传送段进行合适成像即可。例如，可以仅在两个检测设备之一处布置成像设备，或者可以在缓冲传送段上方布置一个或多个成像设备，或者它们的任何组合。成像设备所得的图像信息会被传送到双级安检 ***100的处理设备以进行处理以获得缓冲传送段上的受检物品的运送情况，诸如但不限于缓冲传送段上的受检物品的数目以及彼此之间的距离/位置等。控制设备根据这些信息来对缓冲传送段的运行实施控制。 Imaging device 114 may be a separate device or may be integrated with other devices. As shown in FIG. 3 , two imaging devices 114 are shown, one attached to the outlet end of the primary detection device 102 and the other suspended above the inlet end of the secondary detection device 108 . It should be understood, however, that the number and arrangement of imaging devices is not limited to the specifics described herein, as long as they are arranged to enable proper imaging of the buffered transport segment. For example, an imaging device may be placed at only one of the two detection devices, or one or more imaging devices may be placed above the buffer transport, or any combination thereof. The image information obtained by the imaging device will be transmitted to the processing device of the dual-level security inspection system 100 for processing to obtain the transport status of the inspected items on the buffer conveying section, such as but not limited to the number of inspected articles on the buffer conveying section and Distance/location etc. from each other. The control device controls the operation of the buffer transfer segment according to these information.

此外，受检物品在从一级检测设备102向二级检测设备108运送的过程中，难免有摩擦和移动等，通过一级检测设备102的检测所锁定的可疑区域的位置在二级检测设备处被用来进行进一步检测时很可能已经变化，这对于二级检测设备做有针对性的精准检测是不利的。在受检物品进入二级检测设备108的扫描前，成像设备114的图像信息还可以包括有关受检物品的姿态的信息。利用此信息，可以实现对可疑区域的位置配准，从而二级检测设备108能够基于从一级检测设备102所提供的可疑区域的位置信息以及从成像设备所提供的成像信息来准确地针对一级检测设备102所锁定的可疑区域实施有针对性的检测。In addition, in the process of transporting the inspected items from the primary detection equipment 102 to the secondary detection equipment 108, there will inevitably be friction and movement, etc., and the position of the suspicious area locked by the detection of the primary detection equipment 102 is within the range of the secondary detection equipment. It is likely to have changed when it is used for further detection, which is not good for the targeted and accurate detection of secondary detection equipment. Before the inspected article enters the scanning of the secondary detection device 108, the image information of the imaging device 114 may also include information about the posture of the inspected article. Using this information, the position registration of suspicious areas can be realized, so that the secondary detection device 108 can accurately target a suspicious area based on the position information of the suspicious area provided by the primary detection device 102 and the imaging information provided by the imaging device. The suspicious area locked by the high-level detection device 102 implements targeted detection.

在一些实现方式中，该成像设备114可以包括以下任一项：可见光拍摄装置、红外成像装置、X射线数字摄影装置。应理解，成像设备并不限于这些具体描述的成像装置，而是可以采用本领域中已经公知或者未来将知道的任何成像装置。In some implementation manners, the imaging device 114 may include any one of the following: a visible light imaging device, an infrared imaging device, and an X-ray digital imaging device. It should be understood that the imaging device is not limited to these specifically described imaging devices, but any imaging device known in the art or to be known in the future can be used.

在一些实施例中，缓冲传送段上的受检物品的运送情况可以通过光学传感器设备所捕获的光学信息来确定。光学传感器设备可以与成像设备相类似地结合在***中。光学传感器设备可以包括红外传感器和激光传感器中的至少一者。当缓冲传送段上的受检物品运动到某位置时，光路被遮挡，于是可以根据此来确定出受检物品及其位置。于是，根据受检物品之间的距离或受检物品的数量与阈值的比较(即确定了受检物品的对传送段的占用和排队情况)，可以确定出哪些受检物品应该保持静止以及哪些受检物品应该继续向前运动，并进而对相应圆柱件下达滚动或停止滚动的指令。In some embodiments, the transport condition of the inspected item on the buffer conveying section can be determined through the optical information captured by the optical sensor device. Optical sensor devices can be incorporated in the system similarly to imaging devices. The optical sensor device may include at least one of an infrared sensor and a laser sensor. When the inspected item on the buffer conveying section moves to a certain position, the optical path is blocked, so the inspected item and its position can be determined based on this. Then, according to the distance between the inspected articles or the comparison of the quantity of inspected articles with the threshold value (that is, the occupancy and queuing of the inspected articles on the conveying section are determined), it can be determined which inspected articles should remain stationary and which The inspected item should continue to move forward, and then issue an instruction to the corresponding cylindrical member to roll or stop rolling.

在一些实施例中，缓冲传送段上的受检物品的运送情况可以通过重力传感器设备(未在图中示出)所获得的重力信息来确定。具体的，对每一个圆柱件配备相应的重力传感器，每个重力传感器可以感测相应圆柱件上的重力情况。通过每个重力传感器感测的重力信息，可以确定出受检物品及其位置。于是，根据受检物品之间的距离或受检物品的数量与阈值的比较(即确定了受检物品对传送段的占用和排队情况)，可以确定出哪些受检物品应该保持静止以及哪些受检物品应该继续向前运动，并进而对相应圆柱件下达滚动或停止滚动的指令。In some embodiments, the transport condition of the inspected item on the buffer conveying section can be determined by gravity information obtained by a gravity sensor device (not shown in the figure). Specifically, each cylinder is equipped with a corresponding gravity sensor, and each gravity sensor can sense the gravity on the corresponding cylinder. Through the gravity information sensed by each gravity sensor, the inspected item and its position can be determined. Then, according to the distance between the inspected items or the comparison of the quantity of the inspected items with the threshold value (that is, the occupancy and queuing of the inspected items on the conveying section are determined), it can be determined which inspected items should remain stationary and which inspected items should be kept stationary. The inspected item should continue to move forward, and then issue an instruction to the corresponding cylindrical member to roll or stop rolling.

虽然上面分别描述了可用于确定缓冲传送段上的受检物品的运送情况的三种方式，但应理解，这些方式不但可以单独地使用，也可以以任意组合来使用。Although the above described three methods that can be used to determine the transport status of the inspected items on the buffer conveying section, it should be understood that these methods can be used not only individually, but also in any combination.

在一些实施例中，一级检测设备102可以是断层成像(CT)检测设备和透视技术(DR)检测设备中的任一项。对于CT检测，可以获取受检物品的CT信息，诸如但不限于受检物品的整体以及内部所有物体的几何形状、原子序数、电子密度、X射线衰减系数、内部干扰物的信息和内部可疑物的位置信息。在一些实施例中，二级检测设备108可以是X射线衍射(XRD)检测设备。在一些实施例中，二级检测设备108可以使用传统的XRD检测设备。在一些实施例中，二级检测设备108可以使用根据本公开的特定的XRD检测设备，以下结合图4和图5详细描述。In some embodiments, the primary detection device 102 may be any one of a tomography (CT) detection device and a fluoroscopy (DR) detection device. For CT detection, the CT information of the inspected item can be obtained, such as but not limited to the whole of the inspected item and the geometric shape, atomic number, electron density, X-ray attenuation coefficient, information of internal interference objects and internal suspicious objects location information. In some embodiments, the secondary detection device 108 may be an X-ray diffraction (XRD) detection device. In some embodiments, the secondary detection equipment 108 may use conventional XRD detection equipment. In some embodiments, the secondary detection device 108 may use a specific XRD detection device according to the present disclosure, which will be described in detail below in conjunction with FIGS. 4 and 5 .

图4和图5图示出根据本申请的实施例的作为二级检测设备108的示例的XRD检测设备400的示意图。在图4和图5中，建立三维右手螺旋的笛卡尔坐标系，定义垂直于传送设备104(例如传送带)的方向为y方向，传送设备104运动的方向为z方向，按右手螺旋定则确定x方向。4 and 5 illustrate schematic diagrams of an XRD detection device 400 as an example of the secondary detection device 108 according to an embodiment of the present application. In Fig. 4 and Fig. 5, establish the Cartesian coordinate system of three-dimensional right-handed spiral, define the direction perpendicular to conveying equipment 104 (such as conveyer belt) as y direction, the direction that conveying equipment 104 moves is z direction, determine according to right-handed spiral rule x-direction.

如图4和图5所示，该XRD检测设备400包括：射线发射模块402，在一个或多个扇束平面向受检物品106发射射线。射线发射模块402可以包括：射线源4021，用于发射射线。在一些实施例中，射线源4021具有一排多个射线源焦点，每个射线源焦点能被独立控制而发射射线。如图4和图5所示，射线源4021具有多个射线源焦点4023(在图5中特别标出射线源焦点4023-1和4023-2)，这些射线源焦点成排布置，如沿x方向排布。这种多射线源焦点的布置允许在x方向上能够覆盖更多的扫描范围。射线源焦点的数目不受限制，可以根据XRD检测设备的实际需求来选择设置。每个射线源焦点4023能被独立控制而发射射线。As shown in FIG. 4 and FIG. 5 , the XRD testing device 400 includes: a ray emitting module 402 , which emits rays to the inspected object 106 on one or more fan beam planes. The ray emitting module 402 may include: a ray source 4021, configured to emit rays. In some embodiments, the radiation source 4021 has a row of multiple radiation source focal points, and each radiation source focal point can be independently controlled to emit radiation. As shown in FIGS. 4 and 5 , the ray source 4021 has a plurality of ray source focal points 4023 (the ray source focal points 4023-1 and 4023-2 are particularly marked in FIG. 5 ), and these ray source focal points are arranged in rows, such as along x direction arrangement. This arrangement of focal points of multiple ray sources allows more scanning ranges to be covered in the x direction. The number of focal points of the ray source is not limited, and the settings can be selected according to the actual needs of the XRD detection equipment. Each ray source focal point 4023 can be independently controlled to emit rays.

射线发射模块402还包括前准直器4022。前准直器4022被布置在射线源4021和受检物品106之间，用于使得来自射线源4021的射线在一个或多个扇束平面照射到受检物品106上。如图4所示，前准直器4022使得来自射线源4021的射线在两个扇束平面S1-S2进行照射。应理解，扇束平面的数量并不限于此处描述的两个，而是可以是更多或更少的扇束平面。通过这种多扇束平面照射，在z方向上能够覆盖更多的扫描范围。The ray emitting module 402 also includes a front collimator 4022 . The front collimator 4022 is arranged between the radiation source 4021 and the inspected object 106, and is used to make the radiation from the radiation source 4021 irradiate the inspected object 106 in one or more fan beam planes. As shown in FIG. 4 , the front collimator 4022 enables the radiation from the radiation source 4021 to be irradiated on two fan beam planes S1-S2. It should be understood that the number of fan beam planes is not limited to the two described here, but may be more or less fan beam planes. Through this multi-fan beam planar irradiation, more scan ranges can be covered in the z direction.

在一些实施例中，多个射线源焦点中的一个或多个射线源焦点被选定来发射射线。在一些实现方式中，选定的射线源焦点可以根据基于一级检测的信息所确定的受检物品上的一个或多个特定区域而被选定，以使得这一个或多个特定区域中的至少一个特定区域能被至少一个扇束平面覆盖。在一些实施例中，一个或多个特定区域可以是根据基于一级检测的信息所确定的受检物品中的可疑物的位置、可疑物周边的干扰物的位置而确定的。如图5所示，受检物品106上可能存在两个可疑物W1、W2(以圆形表示)，它们周边分别存在干扰物(例如，金属)G1、G2(以长方形表示)。根据这些干扰物G1、G2和可疑物W1、W2的位置，可以确定出包括可疑物位置而不包括干扰物位置的区域，这样可以对可疑物进行更有针对性的检测。在图5中，相对应地，两个射线源焦点4023-1、4023-2被选择性地控制点亮以发射射线。这些射线经由前准直器4022形成两个扇束平面S1和S2，分别覆盖了这两处的包含可疑物位置的特定区域。如前所述，采用多扇束平面出束的前准直方式，可以同时覆盖z方向上尽可能多的扫描范围。应理解，在一些实施例中，有可能存在扇束平面不足以覆盖所有特定区域的情况，在这种情况下，在被扇束平面覆盖的那些特定区域完成检测后，可以通过XRD检测设备400内的传送段进行控制以适当地移动受检物品的位置，来使得未被扇束平面覆盖的那些特定区域得以被覆盖，从而使能进一步检测。In some embodiments, one or more of the plurality of source focal points is selected to emit radiation. In some implementations, the selected focus of the radiation source can be selected according to one or more specific areas on the inspected article determined based on the information of the primary detection, so that the one or more specific areas in the one or more specific areas At least one specific area can be covered by at least one fan beam plane. In some embodiments, one or more specific areas may be determined based on the position of the suspicious object in the inspected item and the positions of disturbing objects around the suspicious object determined based on the information of the primary detection. As shown in FIG. 5 , there may be two suspicious objects W1 and W2 (represented by circles) on the inspected item 106 , and there are interfering objects (eg, metal) G1 and G2 (represented by rectangles) around them respectively. According to the positions of the disturbing objects G1, G2 and the suspicious objects W1, W2, the area including the suspicious objects but not the disturbing objects can be determined, so that suspicious objects can be detected more specifically. In FIG. 5 , correspondingly, two ray source focal points 4023-1 and 4023-2 are selectively controlled to be turned on to emit rays. These rays pass through the front collimator 4022 to form two fan beam planes S1 and S2, which respectively cover specific areas containing suspicious object positions in these two places. As mentioned above, the front collimation method of multi-fan beam plane output can cover as much scanning range as possible in the z direction at the same time. It should be understood that in some embodiments, there may be a situation where the fan beam plane is not enough to cover all specific areas, in this case, after the detection of those specific areas covered by the fan beam plane is completed, the XRD detection device 400 can be used to The conveying section within is controlled to move the position of the inspected item appropriately so that those specific areas not covered by the fan beam plane are covered to enable further inspection.

该XRD检测设备400还包括：探测器模块，探测一个或多个扇束平面的射线经受检物品衍射并经准直后的射线，其中探测器模块包括一组或多组探测器，每组探测器与一个或多个扇束平面之一相对应，并用于探测与该组探测器相对应的扇束平面的射线经受检物品衍射并经准直后的射线。The XRD detection device 400 also includes: a detector module, which detects rays of one or more fan beam planes that are diffracted by the inspected object and collimated, wherein the detector module includes one or more groups of detectors, each group The detector corresponds to one of the one or more fan beam planes, and is used to detect rays of the fan beam plane corresponding to the group of detectors which are diffracted by the inspected object and collimated.

如图4和图5所示，由于示出了两个扇束平面S1-S2，两组探测器404-1至404-2相应被图示出。具体地，与扇束平面S1相对应地，提供了第一组探测器404-1；与扇束平面S2相对应地，提供了第二组探测器404-2。应理解，对于更多或更少的扇束平面，可以相应地设置更多或更少的探测器组。As shown in Figures 4 and 5, since two fan beam planes S1-S2 are shown, two sets of detectors 404-1 to 404-2 are correspondingly illustrated. Specifically, corresponding to the fan beam plane S1, a first group of detectors 404-1 is provided; corresponding to the fan beam plane S2, a second group of detectors 404-2 is provided. It should be understood that for more or fewer fan beam planes, more or fewer detector groups may be provided correspondingly.

每组探测器包括一个或多个探测器，每个探测器用于探测经受检物品中的特定位置衍射并经准直后的射线，该特定位置处于该探测器的各像素元件沿与相应准直方向相反的方向与该组探测器相对应的扇束平面的交点位置。应理解，在图4中，对于每组探测器仅图示出一个探测器，然而实际上每组探测器中的一个或多个探测器可以是沿x方向排布的，对于其排布没有太多限制，可以沿直线也可以沿弧线，只要探测的是它们负责的扇束平面射出的射线经衍射并经准直后的射线即可。在图5中，由于探测器的可移动性，对于每组探测器仅图示出一个探测器以作为示例，这将在下文中具体描述。然而还应理解，对于每组探测器，可以存在不止一个可移动式探测器。Each group of detectors includes one or more detectors, and each detector is used to detect rays diffracted and collimated at a specific position in the object under inspection. The direction opposite to the vertical direction is the intersection position of the fan beam plane corresponding to this group of detectors. It should be understood that in FIG. 4, only one detector is shown for each group of detectors, but actually one or more detectors in each group of detectors may be arranged along the x direction, and there is no There are too many restrictions, it can be along a straight line or along an arc, as long as the probe is the diffracted and collimated ray emitted by the fan beam plane they are responsible for. In FIG. 5 , due to the mobility of the detectors, only one detector is illustrated for each group of detectors as an example, which will be described in detail below. It should also be understood, however, that there may be more than one movable detector for each set of detectors.

再如图4和图5所示，与扇束平面S1相对应地，对应的一组探测器404-1中的探测器之一(图中所示的探测器)用于探测该扇束平面S1中的射线经受检物品106中可疑物位置W1衍射并经准直后的射线，该位置W1处于该探测器的像素元件沿与相应准直方向相反的方向与扇束平面S1相交的交点位置处。也就是说，对于扇束平面S1，其对应的一组探测器404-1中的探测器之一探测到的射线可能来自多个射线源焦点4023(如4023-1和4023-2)在该扇束平面S1内经衍射后并经准直的射线，其中衍射位置是该探测器中的像素元件沿与相应准直方向相反的方向与扇束平面S1相交的交点位置(由于直线与平面相交，只有一个交点)。换言之，衍射角需要根据这两个射线源焦点4023-1和4023-2的位置来计算。如图5中，这两个射线源焦点在可疑物W1处衍射的衍射角并不相同，但是它们出射光线的路径是相同的，进入同一个探测器，因此该探测器的信号是数个同位置处不同射线源焦点的不同衍射角的衍射信号的叠加。对于扇束平面S2，情况类似，在此不再赘述。As shown in Figures 4 and 5, corresponding to the fan beam plane S1, one of the detectors in the corresponding group of detectors 404-1 (the detector shown in the figure) is used to detect the fan beam plane The rays in S1 are collimated and diffracted by the suspicious object position W1 in the object under inspection 106, and the position W1 is at the intersection point where the pixel element of the detector intersects the fan beam plane S1 along the direction opposite to the corresponding collimation direction location. That is to say, for the fan beam plane S1, the rays detected by one of the detectors in the corresponding group of detectors 404-1 may come from multiple ray source focal points 4023 (such as 4023-1 and 4023-2). The diffracted and collimated rays in the fan beam plane S1, where the diffraction position is the intersection point where the pixel element in the detector intersects the fan beam plane S1 along the direction opposite to the corresponding collimation direction (because the straight line intersects the plane, only one point of intersection). In other words, the diffraction angle needs to be calculated according to the positions of the two ray source focal points 4023-1 and 4023-2. As shown in Figure 5, the diffraction angles of the focal points of the two ray sources at the suspicious object W1 are not the same, but the paths of their outgoing rays are the same and enter the same detector, so the signals of the detector are several identical The superposition of the diffraction signals of different diffraction angles at the focal point of different ray sources at the position. For the fan beam plane S2, the situation is similar and will not be repeated here.

应理解，每个探测器可以包含多个像素元件以使得能够覆盖y方向上一定深度范围的探测范围。另外，应注意，扇束平面与探测器组是一一对应的，也就是每组探测器不允许探测到它们负责或对应的扇束平面以外的扇束平面发出的射线的衍射射线。例如，与扇束平面S1相对应的一组探测器中的探测器的各像素元件沿与相应准直方向相反的方向与扇束平面S2的交点必须位于探测区域以外(即受检物品体积以外)，否则它将探测到探测区域中不止一个位置的衍射信号，那样信息就混乱了。这是设计多扇束平面的XRD检测装置的几何布局时必须考虑的一个限制条件。It should be understood that each detector may contain multiple pixel elements to enable coverage of a detection range of a certain depth range in the y-direction. In addition, it should be noted that there is a one-to-one correspondence between the fan beam planes and the detector groups, that is, each group of detectors is not allowed to detect the diffracted rays of the rays emitted by the fan beam planes other than the fan beam planes they are responsible for or correspond to. For example, the intersection point of each pixel element of the detector in a group of detectors corresponding to the fan beam plane S1 and the fan beam plane S2 along the direction opposite to the corresponding collimation direction must be located outside the detection area (that is, outside the volume of the object under inspection). ), otherwise it will detect diffraction signals from more than one location in the detection area, and the information will be confused. This is a constraint that must be considered when designing the geometric layout of the multi-fan beam plane XRD detection device.

在一些实施例中，探测器可以是光子计数探测器。应理解，在其他实施例中，探测器也可以采用其他类型的探测器。In some embodiments, the detector may be a photon counting detector. It should be understood that in other embodiments, the detectors may also use other types of detectors.

继续参考图4和图5，与每个探测器相对应地，提供了后准直器。如针对图中所示的探测器，相应地提供了后准直器405-1和405-2。后准直器被布置在受检物品106和每个探测器之间，使得从受检物品106衍射的射线选择性地射入对应的探测器。Continuing to refer to FIG. 4 and FIG. 5 , corresponding to each detector, a rear collimator is provided. As for the detector shown in the figure, rear collimators 405-1 and 405-2 are provided accordingly. The rear collimator is arranged between the inspected item 106 and each detector, so that the rays diffracted from the inspected item 106 selectively enter the corresponding detector.

在一些实施例中，每组探测器可以采用多探测器静止型模式。在该模式下，每组探测器中的一个或多个探测器都是静止式探测器，即其各自位置是固定的，并且这一个或多个探测器可以同时对该组探测器相对应的扇束平面所涉及的由一级检测设备102所锁定的一个或多个特定区域内发生衍射并经准直后的射线进行探测。例如，在图4中，在采用多探测器静止型模式的情况中，与扇束平面S1对应的第一组探测器404-1中的一个或多个探测器同时针对该扇束平面S1所涉及的由一级检测设备102所锁定的一个或多个特定区域内发生衍射并经准直后的射线进行探测。类似地，与扇束平面S2对应的第二组探测器404-2中的一个或多个探测器同时针对该扇束平面S2所涉及的由一级检测设备102所锁定的一个或多个特定区域内发生衍射并经准直后的射线进行探测。在该模式中，由于这一个或多个探测器能够同时进行探测，因此其优点在于较高的检测速度。In some embodiments, each set of detectors may employ a multi-detector quiescent mode. In this mode, one or more detectors in each group of detectors are static detectors, that is, their respective positions are fixed, and the one or more detectors can be corresponding to the group of detectors at the same time The diffracted and collimated rays in one or more specific areas locked by the primary detection device 102 involved in the fan beam plane are detected. For example, in FIG. 4, in the case of using a multi-detector stationary mode, one or more detectors in the first group of detectors 404-1 corresponding to the fan beam plane S1 simultaneously The relevant rays that have been diffracted and collimated in one or more specific areas locked by the primary detection device 102 are detected. Similarly, one or more detectors in the second group of detectors 404-2 corresponding to the fan beam plane S2 simultaneously aim at one or more specific detectors locked by the primary detection device 102 involved in the fan beam plane S2. The diffracted and collimated rays in the area are detected. In this mode, the advantage lies in the higher detection speed since the one or more detectors can detect simultaneously.

在一些实施例中，至少一组探测器可以是采用少探测器可移动型模式。在该模式下，相比多探测器静止型模式，至少一组探测器包括的一个或多个探测器中有至少一个可移动式探测器。在该模式中，每组探测器包括的一个或多个探测器的布置方式与多探测器静止型模式基本相同。只是，在该模式中，由于至少一组探测器中的至少一个探测器是可移动式的，因此相比多探测静止型模式而言，所使用的探测器的数目更少。在该模式中，每个可移动式探测器能被独立控制而移动，因此至少一组探测器中的至少一个可移动式探测器之一能被移动到与至少一个特定区域之一相应的位置，从而能够针对性地实现准确检测。在一些实施例中，至少一个可移动式探测器之一向至少一个特定区域之一的移动轨迹是直线形和弧线形中的任一种。In some embodiments, at least one set of detectors may be in a detector-less transportable mode. In this mode, at least one of the one or more detectors included in at least one group of detectors has at least one movable detector compared to the multi-detector stationary mode. In this mode, each group of detectors consists of one or more detectors arranged in much the same way as the multi-detector stationary mode. However, in this mode, since at least one detector in at least one group of detectors is movable, the number of detectors used is less than that of the multi-detector static mode. In this mode, each movable detector can be independently controlled to move so that one of at least one movable detector in at least one group of detectors can be moved to a position corresponding to one of at least one specific area , so as to achieve accurate detection in a targeted manner. In some embodiments, the trajectory of one of the at least one movable detector to one of the at least one specific area is any one of a straight line and an arc.

参见图5，例如，当需要对x方向中某个特定区域(如包含可疑物W1的区域)进行检测时，与覆盖该区域的扇束平面S1相对应的一组探测器404-1中的可移动探测器之一(例如图中所示的探测器)可被移动到与该特定区域对应的位置(避开了干扰物)来实现对该特定区域的检测。Referring to Fig. 5, for example, when it is necessary to detect a specific area in the x direction (such as the area containing the suspicious object W1), the detectors 404-1 in a group of detectors 404-1 corresponding to the fan beam plane S1 covering the area One of the movable detectors (such as the detector shown in the figure) can be moved to a position corresponding to the specific area (avoiding interfering objects) to realize the detection of the specific area.

应理解，XRD检测设备400可以选择射线源焦点和探测器的最优组合。当满足避开干扰物的射线源焦点和探测器不止一对时，可以选择多对射线源焦点-探测器来进行数据采集。这样做的好处在于可以缩短出束时间，提高检测效率。而且，由于所得到的衍射数据来自不止一个晶面方向，衍射峰更全，检测结果更准确。It should be understood that the XRD detection device 400 can select the optimal combination of the focal point of the ray source and the detector. When there are more than one pair of ray source focus and detector to avoid interference, multiple pairs of ray source focus-detector can be selected for data collection. The advantage of this is that the beam output time can be shortened and the detection efficiency can be improved. Moreover, since the obtained diffraction data come from more than one crystal plane direction, the diffraction peaks are more complete and the detection results are more accurate.

应理解，与多探测器静止型模式相比，少探测器可移动型模式比较慢，但是如上所述，可以节省探测器模块，从而减少***成本。此外，在少探测器可移动型模式中，探测器被相对准确定位，能够有效地减少干扰并从而提高检测准确度。It will be appreciated that the less-detector movable mode is slower than the multi-detector stationary mode, but, as mentioned above, saves on detector modules, thereby reducing system cost. In addition, in the less-detector movable mode, the detectors are positioned relatively accurately, which can effectively reduce interference and thereby improve detection accuracy.

不论哪种模式，XRD检测设备400能够根据一级检测设备的检测信息，如受检物品中的可疑物的位置等信息(可选地，还可基于成像设备的成像和配准信息)，来进行准确检测。由于XRD检测设备400采用了如上所述的多焦点多扇束平面出束方式以及对应的探测器布置，有助于对受检物品进行全方位检测，从而减少误判情况并提高检测准确度。Regardless of the mode, the XRD detection device 400 can detect information based on the detection information of the primary detection device, such as the position of the suspicious object in the inspected item (optionally, it can also be based on the imaging and registration information of the imaging device). for accurate testing. Since the XRD detection device 400 adopts the above-mentioned multi-focus, multi-fan beam planar beam output mode and the corresponding detector arrangement, it is helpful for all-round detection of the inspected item, thereby reducing misjudgment and improving detection accuracy.

应注意，虽然上面论述的XRD检测设备适合用于根据本申请实施例讨论的二级安检***中的二级检测设备，然而，该XRD检测设备能够单独用来对受检物品进行检测。在此情形中，受检物品上的可疑区域可预先标定并且此信息被传送给XRD检测设备以实施检测。It should be noted that although the XRD detection equipment discussed above is suitable for the secondary detection equipment in the secondary security inspection system discussed according to the embodiment of the present application, however, the XRD detection equipment can be used alone to detect the inspected items. In this case, the suspicious areas on the inspected item can be pre-marked and this information is transmitted to the XRD detection equipment for detection.

图6是示出根据本申请的实施例的双级安检方法的流程图。该方法可以由如上讨论的双级安检***来实施。FIG. 6 is a flow chart illustrating a two-stage security inspection method according to an embodiment of the present application. The method can be implemented by a two-level security system as discussed above.

如图6所示，根据本申请的实施例的双级安检方法600包括：S601，通过一级检测设备对传送设备上的受检物品进行一级检测；S602，通过二级检测设备对已经过一级检测而被确定为可疑的受检物品中的一个或多个特定区域进行二级检测，其中传送设备包括缓冲传送段，该缓冲传送段位于一级检测设备和二级检测设备之间，用于将可疑的受检物品运送到二级检测设备；以及S603，通过控制设备根据缓冲传送段上的可疑的受检物品的运送情况来控制缓冲传送段的运行以缓冲一级检测设备和二级检测设备的检测速率之间的差异。As shown in Figure 6, the dual-stage security inspection method 600 according to the embodiment of the present application includes: S601, performing a primary detection on the inspected item on the conveying device through a primary detection device; S602, using a secondary detection device to detect One or more specific areas in the inspected items determined to be suspicious through the primary detection are subjected to secondary detection, wherein the conveying device includes a buffer conveying section, and the buffer conveying section is located between the primary detecting device and the secondary detecting device, It is used to transport the suspicious inspected articles to the secondary detection equipment; and S603, the operation of the buffer conveying section is controlled by the control device according to the conveyance of the suspicious inspected articles on the buffer conveying section to buffer the primary detection equipment and the secondary detection equipment. The difference between the detection rate of the level detection equipment.

在一些实施例中，缓冲传送段包括：能独立滚动的多个圆柱件，这多个圆柱件沿着传送方向依次排布。根据本申请的实施例的双级安检方法还可以包括：通过控制设备根据缓冲传送段上的可疑的受检物品的运送情况而选择性地控制多个圆柱件中的一个或多个圆柱件以进行滚动或停止滚动。如前述针对***实施例所描述的，圆柱件的材质不受限制，只要其适用于传送受检物品即可。圆柱件的直径可以根据一级检测设备和二级检测设备之间的距离而设定。控制设备可被实现为使得每个圆柱件可以由各自相关联的控制单元来控制，也可以由集中控制装置来控制。In some embodiments, the buffer conveying section includes: a plurality of cylinders capable of rolling independently, and the plurality of cylinders are arranged in sequence along the conveying direction. The two-stage security inspection method according to the embodiment of the present application may also include: selectively controlling one or more of the plurality of cylinders by the control device according to the delivery situation of the suspicious checked items on the buffer conveying section to to scroll or to stop scrolling. As described above for the system embodiments, the material of the cylinder is not limited, as long as it is suitable for conveying the inspected items. The diameter of the cylindrical piece can be set according to the distance between the primary detection equipment and the secondary detection equipment. The control device can be realized in such a way that each cylinder can be controlled by a respective associated control unit, but also by a centralized control device.

在一些实施例中，根据本申请的实施例的双级安检方法还可以包括：从成像设备、光学传感器设备和重力传感器设备中的至少一种设备所获得的信息来确定缓冲传送段上的可疑的受检物品的运送情况。例如，在使用成像设备的用例中，通过成像设备朝着缓冲传送段进行成像，缓冲传送段上的受检物品的运送情况于是可以从该成像设备所捕获的图像信息而确定。成像设备可以是单独的设备或者可以与其他设备相集成。成像设备可以附接或集成到任一检测设备，或者被安装在适于朝着缓冲传送段进行成像的任何合适的位置。在使用光学传感器设备的用例中，通过光学传感器设备感测来自缓冲传送段上的受检物品的光线的情况中，缓冲传送段上的受检物品的运送情况于是可以从该光学传感器所感测的光学信息而确定的。光学传感器设备可以是红外传感器和激光传感器中的至少一者。与成像设备类似地，光学传感器设备可以是单独的设备或者可以与其他设备相集成。光学传感器设备可以附接或集成到任一检测设备，或者被安装在适于接收来自缓冲传送段上的受检物品的光学信息的任何合适的位置。在使用重力传感器设备的用例中，通过与每个圆柱件耦接的重力传感器来感测相应圆柱件上是否有受检物品，缓冲传送段上的受检物品的运送情况于是可以从每个重力传感器所感测的重力信息而确定。缓冲传送段上的运送情况诸如但不限于缓冲传送段上的受检物品的数目以及彼此之间的距离/位置等。关于成像设备、光学传感器设备、重力传感器设备的更多详细的描述，可以参考上面针对***实施例而描述的细节，因此在此不再赘述。In some embodiments, the two-stage security inspection method according to the embodiment of the present application may further include: determining suspicious The delivery status of the inspected items. For example, in a use case using an imaging device, by which imaging is performed towards a buffer transport, the transport of inspected items on the buffer transport can then be determined from image information captured by the imaging device. The imaging device may be a separate device or may be integrated with other devices. The imaging device may be attached or integrated to either detection device, or mounted at any suitable location suitable for imaging towards the buffer transport. In the use case where an optical sensor device is used, where the light from the inspected item on the buffer conveyance is sensed by the optical sensor device, the transport of the inspected article on the buffer conveyance can then be obtained from the sensed by the optical sensor determined by optical information. The optical sensor device may be at least one of an infrared sensor and a laser sensor. Similar to the imaging device, the optical sensor device may be a separate device or may be integrated with other devices. The optical sensor device may be attached or integrated to any inspection device, or mounted at any suitable location suitable for receiving optical information from inspected items on the buffer transport. In the use case of using the gravity sensor device, the gravity sensor coupled with each cylinder senses whether there is an inspected item on the corresponding cylinder, and the conveyance of the inspected item on the buffer conveying section can then be obtained from each gravity It is determined by the gravity information sensed by the sensor. The transport conditions on the buffer conveying section are such as but not limited to the number of inspected items on the buffer conveying section and the distance/position between each other. For more detailed descriptions of the imaging device, the optical sensor device, and the gravity sensor device, reference may be made to the details described above for the system embodiment, so details are not repeated here.

在一些实施例中，二级检测可以是X射线衍射(XRD)检测。图7是示出根据本申请的实施例的XRD检测方法的流程图。根据本申请的实施例的XRD检测方法700包括：S701，通过射线发射模块来在一个或多个扇束平面向受检物品发射射线；以及S702，通过探测器模块来探测一个或多个扇束平面的射线经受检物品衍射并经准直后的射线，其中探测器模块包括一组或多组探测器，每组探测器与一个或多个扇束平面之一相对应，并用于探测与该组探测器相对应的扇束平面的射线经受检物品衍射并经准直后的射线。In some embodiments, secondary detection may be X-ray diffraction (XRD) detection. FIG. 7 is a flowchart illustrating an XRD detection method according to an embodiment of the present application. The XRD detection method 700 according to the embodiment of the present application includes: S701, using the ray emitting module to emit rays on one or more fan beam planes to the inspected article; and S702, using the detector module to detect one or more fan beams The plane rays are diffracted by the object to be inspected and collimated. The detector module includes one or more groups of detectors, each group of detectors corresponds to one or more fan beam planes, and is used to detect and The rays of the fan beam plane corresponding to the group of detectors are collimated and diffracted by the inspected object.

在一些实施例中，每组探测器包括一个或多个探测器，每个探测器用于探测经受检物品中的特定位置衍射并经准直后的射线，该特定位置处于该探测器的各像素元件沿与相应准直方向相反的方向与该组探测器相对应的扇束平面相交的交点位置。In some embodiments, each group of detectors includes one or more detectors, and each detector is used to detect rays diffracted and collimated by a specific position in the object under inspection, and the specific position is located in each of the detectors. An intersection point where the pixel element intersects the fan beam plane corresponding to the group of detectors in a direction opposite to the corresponding collimation direction.

在一些实施例中，步骤S701可以包括：通过射线发射模块中的射线源来发射射线，其中该射线源具有一排多个射线源焦点，每个射线源焦点能被独立控制而发射射线；以及通过射线发射模块中的前准直器使得来自射线源的射线在一个或多个扇束平面照射到可疑的受检物品上。In some embodiments, step S701 may include: emitting rays through a ray source in the ray emitting module, wherein the ray source has a row of multiple ray source focal points, and each ray source focal point can be independently controlled to emit rays; and The rays from the radiation source are irradiated on suspicious inspected items in one or more fan beam planes through the front collimator in the radiation emitting module.

在一些实施例中，根据基于一级检测的信息所确定的受检物品上的一个或多个特定区域来选择多个射线源焦点中的一个或多个射线源焦点发射射线，以使得一个或多个特定区域中的至少一个特定区域能被一个或多个扇束平面中的至少一个扇束平面覆盖。在一些实施例中，一个或多个特定区域是根据基于一级检测的信息所确定的受检物品中的可疑物的位置、可疑物周边的干扰物的位置来确定的。In some embodiments, one or more ray source focal points among the plurality of ray source focal points are selected to emit rays according to one or more specific areas on the inspected article determined based on the information of the primary detection, so that one or At least one specific area among the plurality of specific areas can be covered by at least one fan beam plane among the one or more fan beam planes. In some embodiments, one or more specific areas are determined based on the position of the suspicious object in the inspected item and the positions of disturbing objects around the suspicious object determined based on the information of the primary detection.

在一些实施例中，每组探测器中的一个或多个探测器可以包括至少一个可移动式探测器，该可移动式探测器能被独立控制而移动。根据本申请的实施例的XRD检测方法还包括：S703，将与至少一个扇束平面中每个扇束平面相对应的一组探测器中的至少一个可移动式探测器之一移动到与一个或多个特定区域之一相应的位置。至少一个可移动式探测器之一向至少一个特定区域之一的移动轨迹是直线形和弧线形中的任一种。In some embodiments, one or more detectors in each set of detectors may include at least one movable detector that can be independently controlled to move. The XRD detection method according to the embodiment of the present application further includes: S703, moving one of at least one movable detector in a group of detectors corresponding to each fan beam plane in at least one fan beam plane to a or the location corresponding to one of several specific regions. The trajectory of one of the at least one movable detector to one of the at least one specific area is any one of a straight line and an arc.

应注意，虽然在图7中图示出了所有步骤S701-S703，然而如上所述，探测器可以采用多探测器静止型模式和少探测器可移动型模式，仅在使用少探测器可移动型模式时才包括步骤S703的移动探测器的步骤，因此在图中以虚线框示出。还应理解，虽然以上图7是作为图6中的双级安检方法中的二级检测而描述的，但是图7中的检测方法可以单独使用。在此情形中，受检物品上的可疑区域可预先标定并且此信息被传送给XRD检测设备以实施检测。It should be noted that although all steps S701-S703 are illustrated in FIG. 7, as mentioned above, the detectors can adopt the multi-detector stationary mode and the few-detector movable mode, only when using the few-detector movable mode. The step of moving the detector in step S703 is only included in the model mode, so it is shown in a dotted line box in the figure. It should also be understood that although FIG. 7 above is described as a secondary detection in the two-level security inspection method in FIG. 6 , the detection method in FIG. 7 can be used independently. In this case, the suspicious area on the inspected item can be pre-marked and this information is transmitted to the XRD detection equipment for detection.

根据本申请实施例的二级安检方法，通过缓冲一级检测设备和二级检测设备的检测速率之间的差异，能够对两级检测设备的检测进行有效协调，防止因二级检测设备处检测任务堆积而要求对安检***的其他部分进行暂停的需求，从而提高整个安检***的通过效率和检测效率。此外，在二级检测中采用了多扇束平面出束的前准直方式，可以同时覆盖z方向上尽可能多的范围。另外，移动式探测器的使用，可以减少***成本并且有效地减少干扰并从而提高检测准确度。图8是示出根据本申请的实施例的双级安检***和方法的应用场景图示。在图8中，存在两级检测设备，即一级检测设备801和二级检测设备802。一级检测设备801用于对传送设备上的受检物品803进行一级检测，如CT检测。二级检测设备802用于对已经过一级检测而被确定为可疑的受检物品803进行二级检测，如XRD检测。According to the secondary security inspection method of the embodiment of the present application, by buffering the difference between the detection rates of the primary detection equipment and the secondary detection equipment, the detection of the two-level detection equipment can be effectively coordinated to prevent the detection caused by the secondary detection equipment. Task accumulation requires the suspension of other parts of the security inspection system, thereby improving the passing efficiency and detection efficiency of the entire security inspection system. In addition, in the secondary detection, the front collimation method of multi-fan beam plane output is adopted, which can cover as much range as possible in the z direction at the same time. In addition, the use of mobile detectors can reduce system costs and effectively reduce interference and thereby improve detection accuracy. FIG. 8 is a diagram illustrating an application scenario of a two-stage security inspection system and method according to an embodiment of the present application. In FIG. 8 , there are two levels of detection equipment, namely primary detection equipment 801 and secondary detection equipment 802 . The primary detection device 801 is used to perform primary detection on the inspected item 803 on the conveying device, such as CT detection. The secondary detection device 802 is used for performing secondary detection, such as XRD detection, on the inspected item 803 that has passed the primary detection and is determined to be suspicious.

传送设备用于在驱动下运送受检物品以经受安检***的整个检测。如图8所示，传送设备包括缓冲传送段8041，该缓冲传送段8041位于一级检测设备801和二级检测设备802之间，用于将可疑的受检物品803运送到二级检测设备802。与缓冲传送段8041相关联地，存在控制设备(在图中未示出)，用于根据缓冲传送段8041上的可疑的受检物品803的运送情况而控制缓冲传送段8041的运行以缓冲一级检测设备801和二级检测设备802的检测速率之间的差异。The conveying equipment is used to transport the inspected items under the drive to undergo the entire inspection of the security inspection system. As shown in FIG. 8, the transfer device includes a buffer transfer section 8041, which is located between the primary detection device 801 and the secondary detection device 802, and is used for transporting suspicious inspected items 803 to the secondary detection device 802 . Associated with the buffer transfer section 8041, there is a control device (not shown in the figure), which is used to control the operation of the buffer transfer section 8041 to buffer a The difference between the detection rates of the primary detection device 801 and the secondary detection device 802.

除了缓冲传送段8041外，传送设备还包括一级检测传送段8042和二级检测传送段8043，如图8所示。一级检测传送段8041用于一级检测部分的受检物品运送。例如，将受检物品送入一级检测设备801以及运送受检物品通过一级检测设备801。二级检测传送段8043用于二级检测部分的受检物品运送。例如，运送受检物品通过二级检测设备802以及将受检物品从二级检测设备802送出。In addition to the buffer transmission section 8041, the transmission device also includes a primary detection transmission section 8042 and a secondary detection transmission section 8043, as shown in FIG. 8 . The first-level detection conveying section 8041 is used for transporting the inspected items in the first-level detection part. For example, sending the inspected item into the primary detection device 801 and transporting the inspected item through the primary detection device 801 . The secondary detection conveying section 8043 is used for transporting the inspected items in the secondary detection part. For example, the inspected item is transported through the secondary inspection device 802 and the inspected item is sent out from the secondary inspection device 802 .

此外，传送设备还包括第一放行传送段，该第一放行传送段与一级检测设备801的出口处的传送段连接。如上所述，可以把经受一级检测设备801的检测而被认为可疑的受检物品运送到二级检测设备802，而已经受一级检测设备801的检测并被认为不可疑的受检物品可从一级检测设备801的出口处的传送段被传送的到该第一放行传送段，而非向二级检测设备802运送。这对于那些仅通过一级检测设备801就能被确定为安全的物品而言，安检效率得以提高。传送设备还可以包括第二放行传送段，该第二放行传送段与二级检测设备802的出口处的传送段连接。已经受二级检测设备802的检测并被认为不可疑的受检物品可从二级检测设备802的出口处的传送段被传送到该第二放行传送段以放行受检物品。在图8中，第一放行传送段与第二放行传送段汇聚在一起，被称为了放行传送段8044。In addition, the transmission device also includes a first release transmission section, which is connected to the transmission section at the exit of the primary detection device 801 . As mentioned above, the inspected articles that have been detected by the primary detection equipment 801 and are considered suspicious can be transported to the secondary inspection equipment 802, while the inspected articles that have been detected by the primary detection equipment 801 and are considered to be unsuspicious can be transported from The transmission section at the exit of the primary detection equipment 801 is transmitted to the first release transmission section instead of being transported to the secondary detection equipment 802 . This improves security inspection efficiency for those items that can be determined to be safe only through the primary detection device 801 . The transmission device may also include a second release transmission section, which is connected to the transmission section at the exit of the secondary detection device 802 . The inspected articles that have been detected by the secondary detection device 802 and considered not suspicious can be transferred from the conveying section at the exit of the secondary detecting device 802 to the second release conveying section to release the inspected articles. In FIG. 8 , the first clearing transmission segment and the second clearing transmission segment converge together, which is called the clearing transmission segment 8044 .

传送设备还可以包括查验传送段8045，该查验传送段8045与二级检测设备802的出口处的传送段连接。已经受二级检测设备802的检测并被认为可疑的受检物品可从二级检测设备802的出口处的传送段被传送的到该查验传送段8045以便安检人员进行开箱查验。The transfer device may also include a check transfer segment 8045 that is connected to the transfer segment at the exit of the secondary detection device 802. The inspected items that have been detected by the secondary detection equipment 802 and considered suspicious can be transported from the transmission section at the exit of the secondary detection equipment 802 to the inspection transmission section 8045 so that the security personnel can open the box for inspection.

此外，如图8所示，成像设备805被提供。成像设备805被附接到二级检测设备802的入口端上方，用于朝着缓冲传送段8041进行成像。从成像设备8041所得到的图像信息可导出运送情况信息以对缓冲传送段8041进行控制。另外，成像设备805对缓冲传送段的成像还可以包括有关受检物品的姿态的信息。利用此信息，可以实现对可疑区域的位置配准，从而二级检测设备802能够基于从一级检测设备801所提供的可疑区域的位置信息以及从成像设备所提供的成像信息来准确地针对一级检测设备801所锁定的可疑区域实施有针对性的进一步检测。Furthermore, as shown in FIG. 8, an imaging device 805 is provided. An imaging device 805 is attached above the inlet end of the secondary detection device 802 for imaging towards the buffer transport section 8041 . The image information obtained from the imaging device 8041 can derive the delivery status information to control the buffer transfer section 8041. In addition, the imaging of the buffer transport section by the imaging device 805 may also include information about the posture of the inspected object. Using this information, the location registration of the suspicious area can be realized, so that the secondary detection device 802 can accurately target a suspicious area based on the location information of the suspicious area provided by the primary detection device 801 and the imaging information provided by the imaging device. The suspicious area locked by the high-level detection device 801 is targeted for further detection.

此外，如图8所示，处理设备806被提供。该处理设备806用于获取各组件的信息以及把相关信息传送给相应组件。该处理设备806可以是分布式处理装置的集合或者是中央处理装置的形式。在分布式处理装置的情形下，各个组件可包括各自的处理装置。例如，一级检测设备801除了包括探测器装置外，还可以包括其处理装置，该处理装置用于基于探测器装置检测到的诸如CT信息(诸如但不限于：受检物品内部所有物体的几何形状、原子序数、电子密度、X射线衰减系数、内部干扰物的信息、和内部可疑物的位置信息)来评估受检物品的各可疑物的危险性并确定其位置；二级检测设备802除了包括探测器装置外，还可包括其处理装置，该处理装置用于基于一级检测设备801的诸如CT信息以及自身探测器装置检测到的信息来评估受检物品的各可疑物的危险性。评估算法包括但不局限于：通过查找表、多项式函数、神经网络等形式建立CT信息和XRD信息到受检物品是否是违禁品的映射关系，从而实现对受检物品风险的双级判别。类似地，成像设备805除了进行物体的成像的摄像头外，还可以包括其处理装置，该处理装置用于基于摄像头所拍摄的图像信息导出缓冲传送段8041上的运送情况以及基于一级检测设备801的检测信息和图像信息来进行图像配准，以便二级检测设备802的准确检测。在中央处理装置的情形下，以上描述的各种处理装置可以集成在一起作为单独的设备来实现上述的功能，可以位于该***的本地，也可以位于远程位置处而通过各种有线、无线等通信方式来与该***通信。应理解，与处理设备相关联地，可以存在存储设备，用于存储供处理设备运行以实现上述功能的指令。存储设备可以是任何计算机可读存储介质，例如但不限于是电子的、磁的、光的、电磁的、红外的或者半导体的***、装置或设备，或者前述的任何适当组合。Furthermore, as shown in Figure 8, a processing device 806 is provided. The processing device 806 is used for acquiring information of each component and transmitting related information to corresponding components. The processing device 806 may be a collection of distributed processing devices or be in the form of a central processing device. In the case of distributed processing means, each component may comprise a respective processing means. For example, in addition to the detector device, the primary detection device 801 may also include its processing device, which is used to detect information such as CT based on the detector device (such as but not limited to: the geometry of all objects inside the object under inspection) Shape, atomic number, electron density, X-ray attenuation coefficient, information of internal interference, and position information of internal suspicious objects) to assess the danger of each suspicious object of the inspected item and determine its position; the secondary detection equipment 802 is in addition to In addition to the detector device, it may also include its processing device, which is used to evaluate the danger of each suspicious object of the inspected item based on the CT information of the primary detection device 801 and the information detected by its own detector device. The evaluation algorithm includes but is not limited to: establishing the mapping relationship between CT information and XRD information and whether the inspected item is a contraband through a lookup table, polynomial function, neural network, etc., so as to realize a two-level judgment on the risk of the inspected item. Similarly, in addition to the camera for imaging the object, the imaging device 805 may also include its processing device, which is used for deriving the transportation situation on the buffer transmission section 8041 based on the image information captured by the camera and based on the primary detection device 801 The detection information and image information are used for image registration, so that the secondary detection equipment 802 can detect accurately. In the case of the central processing device, the various processing devices described above can be integrated together as a separate device to realize the above functions, which can be located locally in the system or at a remote location through various wired, wireless, etc. communication method to communicate with the system. It should be understood that, associated with the processing device, there may be a storage device for storing instructions for the processing device to execute to implement the above functions. A storage device may be any computer readable storage medium such as, but not limited to, an electronic, magnetic, optical, electromagnetic, infrared, or semiconductor system, apparatus, or device, or any suitable combination of the foregoing.

根据以上示例使用场景，本申请的实施例提供了一种双级安检方法，该方法在图9中示出。如图9所示，根据本申请的实施例的一种双级安检方法900包括：According to the above example usage scenarios, embodiments of the present application provide a two-stage security check method, which is shown in FIG. 9 . As shown in FIG. 9, a two-stage security inspection method 900 according to an embodiment of the present application includes:

步骤S901，通过一级检测设备801对传送设备的一级检测传送段8042的受检物品803进行一级检测；Step S901, using the primary detection device 801 to perform a primary detection on the inspected item 803 in the primary detection transmission section 8042 of the transmission device;

步骤S902：使得经过一级检测而被认为不可疑的受检物品通过传送设备的放行传送段8044而放行；Step S902: Make the inspected articles that are deemed not suspicious after the first-level inspection pass through the release conveying section 8044 of the conveying equipment;

步骤S903：使得经过一级检测而被认为可疑的受检物品传送到传送设备的缓冲传送段8041，其中缓冲传送段8041用于将可疑的受检物品运送到二级检测设备802；Step S903: Make the inspected articles considered suspicious after the first-level inspection be sent to the buffer transfer section 8041 of the transport device, wherein the buffer transfer section 8041 is used to transport the suspicious inspected articles to the second-level inspection device 802;

步骤S904：通过控制设备806根据缓冲传送段8041上的可疑的受检物品的运送情况来控制缓冲传送段8041的运行，以缓冲一级检测设备801和二级检测设备802的检测速率之间的差异；Step S904: Use the control device 806 to control the operation of the buffer transfer section 8041 according to the delivery of suspicious items on the buffer transfer section 8041, so as to buffer the difference between the detection rates of the primary detection device 801 and the secondary detection device 802. difference;

步骤S905：通过二级检测设备802对可疑的受检物品中的每一个可疑区域进行二级检测；Step S905: performing secondary detection on each suspicious area in the suspicious item under inspection through the secondary detection device 802;

步骤S906：使得经过二级检测而被认为不可疑的受检物品通过传送设备的放行传送段8044而放行；以及Step S906: making the inspected articles that are considered unsuspected after the secondary detection pass through the release conveying section 8044 of the conveying device; and

步骤S907：使得经过二级检测而被认为可疑的受检物品传送到传送设备的查验传送段8045以经受进一步检查。Step S907: Make the inspected articles considered suspicious after the secondary inspection be sent to the inspection conveying section 8045 of the conveying device for further inspection.

根据本申请实施例的二级安检***和方法，通过缓冲一级检测设备和二级检测设备的检测速率之间的差异，能够对两级检测设备的检测进行有效协调，防止由于二级检测设备处检测任务堆积而要求对安检***的其他部分进行暂停的需求，从而提高整个安检***的通过效率和检测效率。例如，在160kV电压且3mA电流的条件下，对每个可能含违禁品的物品进行二级XRD检测大约需要10秒。假设CT检测报警率20％，级联二级XRD检测后，安检***整体上可以达到1800件/小时的通过速度，进一步假设XRD检测后的开箱率为10％，则整体开箱频率为36件/小时，假设人工开箱检查速度为20件/小时，可估算单套***在极限通过率1800件/小时的情况下，大约需要2名开箱检查人员。由此可见，这种级联型安检***可大幅提高通过效率和检测效率，并有效降低了人工成本。以上对本申请的实施例的详细描述涵盖了许多具体细节，以便提供对本申请的全面理解。但是，对于本领域技术人员来说显而易见的是，本申请可以在不需要这些具体细节中的一些细节的情况下实施。上面对实施例的描述仅仅是为了通过示出本申请的示例来提供对本申请更清楚的理解。本申请绝不限于下面所提出的任何具体配置和方法步骤，而是在不脱离本申请的教导的前提下覆盖了相关元素、部件和方法步骤的任何修改、替换和改进。According to the secondary security inspection system and method of the embodiment of the present application, by buffering the difference between the detection rates of the primary detection equipment and the secondary detection equipment, the detection of the two-level detection equipment can be effectively coordinated to prevent the The need to suspend other parts of the security inspection system due to the accumulation of detection tasks, thereby improving the passing efficiency and detection efficiency of the entire security inspection system. For example, under the conditions of 160kV voltage and 3mA current, it takes about 10 seconds to perform secondary XRD detection for each item that may contain contraband. Assuming that the alarm rate of CT detection is 20%, after cascading secondary XRD detection, the overall security inspection system can reach a passing speed of 1,800 pieces/hour, further assuming that the unpacking rate after XRD detection is 10%, then the overall unpacking frequency is 36 pieces/hour, assuming that the speed of manual unpacking inspection is 20 pieces/hour, it can be estimated that about 2 unpacking inspection personnel are required for a single system with a limit pass rate of 1800 pieces/hour. It can be seen that this cascading security inspection system can greatly improve the passing efficiency and detection efficiency, and effectively reduce labor costs. The above detailed description of the embodiments of the present application covers numerous specific details in order to provide a thorough understanding of the present application. It will be apparent, however, to one skilled in the art that the present application may be practiced without some of these specific details. The above description of the embodiments is only to provide a clearer understanding of the present application by showing examples of the present application. The present application is in no way limited to any specific configuration and method steps set forth below, but rather covers any modifications, substitutions and improvements of related elements, components and method steps without departing from the teachings of the present application.

应当注意，在权利要求中，单词“包含”或“包括”并不排除存在未列在权利要求中的元件或组件。位于元件或组件之前的冠词“一”或“一个”也并不排除存在多个这样的元件或组件的情况。It should be noted that in the claims, the word "comprising" or "comprising" does not exclude the presence of elements or components not listed in the claims. The article "a" or "an" preceding an element or component also does not exclude the presence of a plurality of such elements or components.

此外，还应当注意，本说明书中使用的语言主要是为了可读性和教导的目的而选择的，而不是为了解释或者限定本申请的主题而选择的。因此，在不偏离所附权利要求书的范围和精神的情况下，对于本技术领域的普通技术人员来说许多修改和变更都是显而易见的。关于本申请的范围，说明书中所做的描述都是说明性的，而非限制性的，本申请的范围由所附权利要求书限定。In addition, it should also be noted that the language used in the specification has been chosen primarily for the purpose of readability and instruction rather than to explain or delimit the subject matter of the application. Accordingly, many modifications and alterations will be apparent to those of ordinary skill in the art without departing from the scope and spirit of the appended claims. Regarding the scope of the present application, the descriptions made in the specification are illustrative rather than restrictive, and the scope of the present application is defined by the appended claims.

Claims

一种双级安检***，包括：A two-level security screening system comprising:

一级检测设备，用于对传送设备上的受检物品进行一级检测；Primary detection equipment, used for primary detection of the inspected items on the conveying equipment;

二级检测设备，用于对已经过所述一级检测而被确定为可疑的受检物品中的一个或多个特定区域进行二级检测，其中，所述传送设备包括缓冲传送段，所述缓冲传送段位于所述一级检测设备和所述二级检测设备之间，用于将所述可疑的受检物品运送到所述二级检测设备；以及A secondary detection device, configured to perform secondary detection on one or more specific areas of the inspected item that have passed the primary detection and are determined to be suspicious, wherein the transmission device includes a buffer transmission section, the The buffer transfer section is located between the primary detection equipment and the secondary detection equipment, and is used to transport the suspicious inspected items to the secondary detection equipment; and

控制设备，用于根据所述缓冲传送段上的可疑的受检物品的运送情况来控制所述缓冲传送段的运行以缓冲所述一级检测设备和所述二级检测设备的检测速率之间的差异。a control device, configured to control the operation of the buffer conveying section according to the transport situation of suspicious inspected items on the buffer conveying section, so as to buffer between the detection rates of the primary detection equipment and the secondary detection equipment; difference.
根据权利要求1所述的双级安检***，其中，所述缓冲传送段包括能独立滚动的多个圆柱件，所述多个圆柱件沿着传送方向依次排布，并且，The dual-level security inspection system according to claim 1, wherein the buffer conveying section includes a plurality of cylindrical parts that can roll independently, and the plurality of cylindrical parts are arranged in sequence along the conveying direction, and,

所述控制设备根据所述缓冲传送段上的可疑的受检物品的运送情况而选择性地控制所述多个圆柱件中的一个或多个圆柱件以进行滚动或停止滚动。The control device selectively controls one or more of the plurality of cylinders to roll or stop rolling according to the conveyance of suspicious inspected items on the buffer conveying section.
根据权利要求1或2所述的双级安检***，其中，所述双级安检***还包括以下设备中的至少一种设备：成像设备、光学传感器设备和重力传感器设备，以从该至少一种设备所获得的信息来确定所述缓冲传送段上的可疑的受检物品的运送情况。The dual-level security check system according to claim 1 or 2, wherein the dual-level security check system further comprises at least one of the following devices: an imaging device, an optical sensor device, and a gravity sensor device, so that the at least one The information obtained by the equipment is used to determine the transport situation of suspicious inspected items on the buffer transport section.
根据权利要求1所述的双级安检***，其中所述二级检测设备是X射线衍射XRD检测设备。The dual-stage security inspection system according to claim 1, wherein the secondary detection equipment is X-ray diffraction (XRD) detection equipment.
根据权利要求4所述的双级安检***，其中，所述XRD检测设备包括：The dual-stage security inspection system according to claim 4, wherein the XRD detection equipment comprises:

射线发射模块，在一个或多个扇束平面向所述可疑的受检物品发射射线；以及a radiation emitting module, emitting radiation to the suspicious inspected item in one or more fan beam planes; and

探测器模块，探测所述一个或多个扇束平面的射线经所述可疑的受检物品衍射并经准直后的射线，其中所述探测器模块包括一组或多组探测器，每组探测器与所述一个或多个扇束平面之一相对应，并用于探测与该组探测器相对应的扇束平面的射线经所述可疑的受检物品衍射并经准直后的射线。a detector module, for detecting the rays of the one or more fan beam planes diffracted by the suspicious item to be inspected and collimated, wherein the detector module includes one or more groups of detectors, each group The detector corresponds to one of the one or more fan beam planes, and is used to detect rays of the fan beam plane corresponding to the group of detectors that are diffracted by the suspicious inspected item and collimated.
根据权利要求5所述的双级安检***，其中每组探测器包括一个或多个探测器，每个探测器用于探测经所述可疑的受检物品中的特定位置衍射并经准直后的射线，该特定位置处于所述探测器的各像素元件沿与相应准直方向相反的方向与该组探测器相对应的扇束平面相交的交点位置。The dual-level security inspection system according to claim 5, wherein each group of detectors includes one or more detectors, and each detector is used to detect the collimated and diffracted by a specific position in the suspicious inspected item. The ray, the specific position is at the intersection position where each pixel element of the detector intersects the fan beam plane corresponding to the group of detectors along a direction opposite to the corresponding collimation direction.
根据权利要求6所述的双级安检***，其中，所述射线发射模块包括：The dual-level security inspection system according to claim 6, wherein the ray emitting module comprises:

射线源，用于发射射线，其中，所述射线源具有一排多个射线源焦点，每个射线源焦点能被独立控制而发射射线；以及a ray source for emitting rays, wherein the ray source has a row of multiple ray source focal points, and each ray source focal point can be independently controlled to emit rays; and

前准直器，被布置为使得来自所述射线源的射线在所述一个或多个扇束平面照射到所述可疑的受检物品上。The front collimator is arranged so that the radiation from the radiation source is irradiated on the suspicious inspected item on the one or more fan beam planes.
根据权利要求7所述的双级安检***，其中，所述多个射线源焦点中的一个或多个射线源焦点被选定来发射射线，The dual-level security inspection system according to claim 7, wherein one or more of the plurality of ray source focal points are selected to emit radiation,

其中，选定的射线源焦点是根据基于所述一级检测的信息所确定的所述可疑的受检物品上的所述一个或多个特定区域而被选定的，以使得所述一个或多个特定区域中的至少一个特定区域能被所述一个或多个扇束平面中的至少一个扇束平面覆盖。Wherein, the selected focus of the radiation source is selected according to the one or more specific areas on the suspicious item under inspection determined based on the information of the primary detection, so that the one or more At least one specific area of the plurality of specific areas can be covered by at least one fan beam plane of the one or more fan beam planes.
根据权利要求8所述的双级安检***，其中，所述一个或多个特定区域是根据基于所述一级检测的信息所确定的所述可疑的受检物品中的可疑物的位置、可疑物周边的干扰物的位置而确定的。The two-stage security inspection system according to claim 8, wherein the one or more specific areas are determined based on the information of the primary detection based on the location of suspicious objects in the suspicious inspected items, suspicious It is determined by the position of the interfering objects around the object.
根据权利要求9所述的双级安检***，其中，所述一个或多个探测器包括至少一个可移动式探测器，所述可移动式探测器能被独立控制而移动，并且所述至少一个可移动式探测器之一能被移动到与所述至少一个特定区域之一相应的位置。The dual-level security inspection system according to claim 9, wherein said one or more detectors include at least one movable detector capable of being independently controlled to move, and said at least one One of the movable detectors can be moved to a position corresponding to one of the at least one specific area.
一种双级安检方法，包括：A two-level approach to security, including:

通过一级检测设备对传送设备上的受检物品进行一级检测；The first-level inspection is carried out on the inspected items on the conveying equipment through the first-level inspection equipment;

通过二级检测设备对已经过所述一级检测而被确定为可疑的受检物品中的一个或多个特定区域进行二级检测,其中所述传送设备包括缓冲传送段，所述缓冲传送段位于所述一级检测设备和所述二级检测设备之间，用于将所述可疑的受检物品运送到所述二级检测设备；以及One or more specific areas in the inspected articles that have been determined to be suspicious through the primary detection are subjected to secondary detection by secondary detection equipment, wherein the transmission equipment includes a buffer transmission section, and the buffer transmission section located between the primary detection device and the secondary detection device, for transporting the suspicious inspected item to the secondary detection device; and

通过控制设备根据所述缓冲传送段上的可疑的受检物品的运送情况来控制所述缓冲传送段的运行以缓冲所述一级检测设备和所述二级检测设备的检测速率之间的差异。Controlling the operation of the buffer conveying section by the control device according to the transport situation of suspicious inspected items on the buffer conveying section to buffer the difference between the detection rates of the primary detection equipment and the secondary detection equipment .
根据权利要求11所述的双级安检方法，其中，所述缓冲传送段包括能独立滚动的多个圆柱件，所述多个圆柱件沿着传送方向依次排布，并且The two-stage security inspection method according to claim 11, wherein the buffer conveying section includes a plurality of cylindrical parts that can roll independently, and the plurality of cylindrical parts are arranged in sequence along the conveying direction, and

所述双级安检方法包括：通过所述控制设备根据所述缓冲传送段上的可疑的受检物品的运送情况而选择性地控制所述多个圆柱件中的一个或多个圆柱件以进行滚动或停止滚动。The two-stage security inspection method includes: using the control device to selectively control one or more of the plurality of cylindrical members according to the transport situation of the suspicious checked items on the buffer conveying section to perform Scroll or stop scrolling.
根据权利要求11或12所述的双级安检方法，还包括：According to the dual-stage security inspection method described in claim 11 or 12, further comprising:

从成像设备、光学传感器设备和重力传感器设备中的至少一种设备所获得的信息来确定所述缓冲传送段上的可疑的受检物品的运送情况。The information obtained from at least one of the imaging device, the optical sensor device and the gravity sensor device is used to determine the delivery status of the suspicious inspected item on the buffer conveying section.
根据权利要求11所述的双级安检方法，其中所述二级检测是X射线衍射XRD检测。The dual-stage security inspection method according to claim 11, wherein the secondary detection is X-ray diffraction (XRD) detection.
根据权利要求14所述的双级安检方法，其中，所述XRD检测包括：The dual-stage security inspection method according to claim 14, wherein the XRD detection comprises:

通过射线发射模块来在一个或多个扇束平面向所述可疑的受检物品发射射线；以及using a ray emitting module to emit rays on one or more fan beam planes to the suspected inspected item; and

通过探测器模块来探测所述一个或多个扇束平面的射线经所述可疑的受检物品衍射并经准直后的射线，其中所述探测器模块包括一组或多组探测器，每组探测器与所述一个或多个扇束平面之一相对应，并用于探测与该组探测器相对应的扇束平面的射线经所述可疑的受检物品衍射并经准直后的射线。A detector module is used to detect the radiation of the one or more fan beam planes diffracted by the suspicious object to be inspected and collimated, wherein the detector module includes one or more groups of detectors, each A group of detectors corresponds to one of the one or more fan beam planes, and is used to detect the rays of the fan beam plane corresponding to the group of detectors that are diffracted by the suspicious item under inspection and collimated .
根据权利要求15所述的双级安检方法，其中，每组探测器包括一个或多个探测器，每个探测器用于探测经所述可疑的受检物品中的特定位置衍射并经准直后的射线，该特定位置处于所述探测器的各像素元件沿与相应准直方向相反的方向与该组探测器相对应的扇束平面相交的交点位置。The dual-stage security inspection method according to claim 15, wherein each group of detectors includes one or more detectors, and each detector is used to detect the suspected object that is diffracted by a specific position in the inspected item and collimated. The specific position is at the intersection point where each pixel element of the detector intersects the fan beam plane corresponding to the group of detectors along a direction opposite to the corresponding collimation direction.
根据权利要求16所述的双级安检方法，还包括：The two-stage security inspection method according to claim 16, further comprising:

通过所述射线发射模块中的射线源来发射射线，其中所述射线源具有一排多个射线源焦点，每个射线源焦点能被独立控制而发射射线；以及Radiation is emitted by the ray source in the ray emitting module, wherein the ray source has a row of multiple ray source focal points, and each ray source focal point can be independently controlled to emit rays; and

通过所述射线发射模块中的前准直器使得来自所述射线源的射线在所述一个或多个扇束平面照射到所述可疑的受检物品上。The radiation from the radiation source is irradiated on the suspicious inspected item on the one or more fan beam planes through the front collimator in the radiation emitting module.
根据权利要求17所述的双级安检方法，还包括根据基于所述一级检测的信息所确定的所述可疑的受检物品上的所述一个或多个特定区域来选择所述多个射线源焦点中的一个或多个射线源焦点发射射线，以使得所述一个或多个特定区域中的至少一个特定区域能被所述一个或多个扇束平面中的至少一个扇束平面覆盖。The two-level security inspection method according to claim 17, further comprising selecting the plurality of rays according to the one or more specific areas on the suspicious inspected article determined based on the information of the first-level detection One or more of the source focal points emits rays such that at least one of the one or more specific regions can be covered by at least one fan beam plane of the one or more fan beam planes.
根据权利要求18所述的双级安检方法，其中所述一个或多个特定区域是根据基于所述一级检测的信息所确定的所述可疑的受检物品中的可疑物的位置、可疑物周边的干扰物的位置来确定的。The two-level security inspection method according to claim 18, wherein the one or more specific areas are determined based on the information of the first-level detection, the position of the suspicious object in the suspicious object, the suspicious object The position of the surrounding interference objects is determined.
根据权利要求19所述的双级安检方法，其中，所述一个或多个探测器包括至少一个可移动式探测器，所述可移动式探测器能被独立控制而移动，The dual-stage security inspection method according to claim 19, wherein said one or more detectors include at least one movable detector capable of being independently controlled to move,

所述双级安检方法还包括：The two-stage security check method also includes:

将所述至少一个可移动式探测器之一移动到与所述至少一个特定区域之一相应的位置。One of the at least one movable detector is moved to a position corresponding to one of the at least one specific area.
一种双级安检方法，包括：A two-level approach to security, including:

通过一级检测设备对传送设备的一级检测传送段上的受检物品进行一级检测；Use the first-level detection equipment to conduct the first-level detection on the inspected items on the first-level detection transmission section of the transmission equipment;

使得经过所述一级检测而被认为不可疑的受检物品通过所述传送设备的放行传送段而放行；Make the inspected articles that are considered not suspicious after the first-level inspection pass through the release conveying section of the conveying equipment;

使得经过所述一级检测而被认为可疑的受检物品传送到所述传送设备的缓冲传送段，其中所述缓冲传送段用于将所述可疑的受检物品运送到二级检测设备；making the inspected items deemed suspicious after the first-level inspection be transferred to the buffer transfer section of the transfer device, wherein the buffer transfer section is used to transport the suspicious inspected articles to the second-level inspection device;

通过控制设备根据所述缓冲传送段上的可疑的受检物品的运送情况来控制所述缓冲传送段的运行以缓冲所述一级检测设备和所述二级检测设备的检测速率之间的差异；Controlling the operation of the buffer conveying section by the control device according to the transport situation of suspicious inspected items on the buffer conveying section to buffer the difference between the detection rates of the primary detection equipment and the secondary detection equipment ;

通过二级检测设备对所述可疑的受检物品中的每一个可疑的区域进行二级检测；performing secondary detection on each suspicious area in the suspicious inspected item by secondary detection equipment;

使得经过所述二级检测而被认为不可疑的受检物品通过所述传送设备的放行传送段而放行；Allowing the inspected items that are deemed not suspicious after the secondary detection to pass through the release conveying section of the conveying equipment;

使得经过所述二级检测而被认为可疑的受检物品传送到所述传送设备的查验传送段以经受进一步检查。The inspected articles that are considered suspicious after the secondary detection are transferred to the inspection conveying section of the conveying device to undergo further inspection.