WO2022227945A1

WO2022227945A1 - Cable parameter determination method, apparatus and system, storage medium, and electronic apparatus

Info

Publication number: WO2022227945A1
Application number: PCT/CN2022/082302
Authority: WO
Inventors: 刘诗涛; 毕煜; 易毕
Original assignee: 中兴通讯股份有限公司
Priority date: 2021-04-25
Filing date: 2022-03-22
Publication date: 2022-11-03
Also published as: CN115248347A

Abstract

A cable parameter determination method, apparatus and system, a storage medium, and an electronic apparatus, the method comprising: acquiring scattering parameters of a cable to be tested in a test fixture, or acquiring a reflection coefficient of the cable in the test fixture (S202); and determining a dielectric constant and loss factor of an insulating material in the cable according to the scattering parameters or the reflection coefficient (S204). The dielectric constant and loss factor at different frequencies can be measured at one time, which greatly reduces the cost of testing and improves the accuracy of the measurement results.

Description

线缆参数确定方法、装置、***、存储介质及电子装置Cable parameter determination method, device, system, storage medium and electronic device

相关申请的交叉引用CROSS-REFERENCE TO RELATED APPLICATIONS

本公开基于2021年04月25日提交的发明名称为“线缆参数确定方法、装置、***、存储介质及电子装置”的中国专利申请CN202110450581.9，并且要求该专利申请的优先权，通过引用将其所公开的内容全部并入本公开。The present disclosure is based on the Chinese patent application CN202110450581.9 filed on April 25, 2021, entitled "Cable parameter determination method, device, system, storage medium and electronic device", and claims the priority of this patent application, by reference Its disclosure is fully incorporated into this disclosure.

技术领域technical field

本公开实施例涉及通信领域，具体而言，涉及一种线缆参数确定方法、装置、***、存储介质及电子装置。Embodiments of the present disclosure relate to the field of communications, and in particular, to a method, device, system, storage medium, and electronic device for determining cable parameters.

背景技术Background technique

绝缘材料的介电常数D _k和损耗因子D _f是通信领域至关重要的两个变量，能否准确获取材料的介电性能是选材和***设计的关键所在。由于无法模拟材料在产品使用上的真实场景，目前无法对树脂材料进行准确高效的测试。 The dielectric constant D _k and loss factor D _f of insulating materials are two crucial variables in the field of communications. The ability to accurately obtain the dielectric properties of materials is the key to material selection and system design. Due to the inability to simulate the real scene of the material used in the product, it is currently impossible to accurately and efficiently test the resin material.

现有通过X-波段带状线测试法，适用于测量PCB板材的D _k和D _f，其缺点主要包括：操作复杂，需要大量的数据和样品；谐振腔的精准度和测试的误差影响比较大；每个腔体只能测试对应的频率，多个频率需要多个腔体，成本较高；测试的电磁场分布与实际连接器使用场景不同。 The existing X-band stripline test method is suitable for measuring D _k and D _f of PCB boards. Its disadvantages mainly include: complex operation, requiring a large amount of data and samples; comparison of the accuracy of the resonator and the influence of the test error Large; each cavity can only test the corresponding frequency, multiple cavities are required for multiple frequencies, and the cost is high; the distribution of the electromagnetic field tested is different from the actual connector usage scenarios.

通过固体电介质微波复介电常数测试方法，测量绝缘材料的D _k和D _f，其缺点主要包括：要求介质各向同性才可以测试；对样品的D _k要有大概的估计值才能准确的设计样品大小；测试的频率点单一，不能测试一段频谱下的介电常数和损耗因子。 The D _k and D _f of insulating materials are measured by the microwave complex permittivity test method of solid dielectric. The disadvantages mainly include: the dielectric is required to be isotropic to be tested; the D _k of the sample must be roughly estimated in order to accurately design The size of the sample; the frequency point of the test is single, and the dielectric constant and loss factor under a spectrum cannot be tested.

通过固体电介质微波复介电常数和介质损耗角正切值的测定方法，测量绝缘材料的D _k和D _f，其缺点主要包括：制作样品需要做成杆状，需要特质的模具；计算方法比较复杂；测试的频点点单一，每次只能测一个频率下的介电常数和损耗因子。 The D _k and D _f of insulating materials are measured by the method of determining the microwave complex permittivity and dielectric loss tangent of solid dielectrics. The disadvantages mainly include: the sample needs to be made into a rod shape, and a special mold is required; the calculation method is relatively complicated ; The frequency point of the test is single, and the dielectric constant and loss factor can only be measured at one frequency at a time.

针对相关技术中绝缘材料的介电常数和损耗因子的测试方法，存在操作复杂、测试频点单一、测量结果不准确等问题，尚未提出解决方案。Aiming at the test methods for the dielectric constant and loss factor of insulating materials in the related art, there are problems such as complicated operation, single test frequency, and inaccurate measurement results, and no solution has been proposed yet.

发明内容SUMMARY OF THE INVENTION

本公开实施例提供了一种线缆参数确定方法、装置、***、存储介质及电子装置，以至少解决相关技术中绝缘材料的介电常数和损耗因子的测试方法，存在操作复杂、测试频点单一、测量结果不准确等问题。Embodiments of the present disclosure provide a cable parameter determination method, device, system, storage medium, and electronic device, so as to at least solve the test methods for the dielectric constant and loss factor of insulating materials in the related art, which are complicated in operation and test frequency. Single, inaccurate measurement results, etc.

根据本公开的一个实施例，提供了一种线缆参数确定***，其中，包括：测试设备、测试夹具、处理器，其中，According to an embodiment of the present disclosure, a cable parameter determination system is provided, which includes: a test equipment, a test fixture, and a processor, wherein,

所述测试设备，用于获取所述测试夹具中待测线缆的散射参数，或者获取所述测试夹具中所述待测线缆的反射系数；The test equipment is used to obtain the scattering parameter of the cable under test in the test fixture, or obtain the reflection coefficient of the cable under test in the test fixture;

所述处理器，用于根据所述散射参数或所述反射系数确定所述待测线缆中绝缘材料的介电常数和损耗因子。The processor is configured to determine the dielectric constant and loss factor of the insulating material in the cable to be tested according to the scattering parameter or the reflection coefficient.

在一示例性实施例中，所述处理器，还用于根据所述散射参数提取所述待测线缆的相位角与***损耗，并根据所述相位角与所述***损耗确定所述待测线缆中绝缘材料的介电常数和损耗因子；或者In an exemplary embodiment, the processor is further configured to extract the phase angle and insertion loss of the cable to be tested according to the scattering parameter, and determine the phase angle and insertion loss of the cable to be tested according to the phase angle and the insertion loss. measure the dielectric constant and dissipation factor of the insulating material in the cable; or

根据所述反射系数确定所述待测线缆中绝缘材料的介电常数，并根据所述介电常数确定所述绝缘材料的损耗因子。The dielectric constant of the insulating material in the cable to be tested is determined according to the reflection coefficient, and the loss factor of the insulating material is determined according to the dielectric constant.

在一示例性实施例中，所述处理器，还用于通过以下方式根据所述相位角确定所述介电常数：In an exemplary embodiment, the processor is further configured to determine the dielectric constant according to the phase angle in the following manner:

其中，D _k位所述介电常数，c为真空中的光速，f为测试频率，φ为所述测试频率下的相位角，所述测试夹具包括所述第一夹具与所述第二夹具，L为所述第一夹具与所述第二夹具的长度差； Wherein, D _k is the dielectric constant, c is the speed of light in vacuum, f is the test frequency, φ is the phase angle at the test frequency, and the test fixture includes the first fixture and the second fixture , L is the length difference between the first clamp and the second clamp;

通过以下方式根据所述介电常数与所述***损耗确定所述损耗因子：The loss factor is determined from the dielectric constant and the insertion loss by:

其中，D _f为所述损耗因子，Loss _Total为总损耗，k ₁、k ₂为常数，Z ₁为所述待测线缆的端口阻抗，ρ _resistance为所述绝缘材料的电阻率。 Wherein, D _f is the loss factor, Loss _Total is the total loss, k ₁ and k ₂ are constants, Z ₁ is the port impedance of the cable to be tested, and ρ _resistance is the resistivity of the insulating material.

在一示例性实施例中，所述处理器，还用于通过以下方式根据所述反射系数确定所述测试夹具中待测线缆的线缆阻抗；In an exemplary embodiment, the processor is further configured to determine the cable impedance of the cable under test in the test fixture according to the reflection coefficient in the following manner;

其中，Z ₂为所述线缆阻抗，ρ为反射系数，Z ₀为固定值； Wherein, Z ₂ is the cable impedance, ρ is the reflection coefficient, and Z ₀ is a fixed value;

获取所述待测夹具的外壳内径以及所述待测线缆内中间导体的导体直径，并通过以下方式根据所述线缆阻抗、所述外壳内径以及所述导体直径确定所述绝缘材料的介电常数：Obtain the inner diameter of the shell of the fixture to be tested and the conductor diameter of the intermediate conductor in the cable to be tested, and determine the dielectric of the insulating material according to the impedance of the cable, the inner diameter of the shell and the diameter of the conductor in the following manner: Electric constant:

其中，D _k为所述介电常数，r _a为所述导体直径，r _b为所述外壳内径，μ _r为1，μ ₀为真空中的介电常数，ε ₀为真空中的磁导率。 Wherein, D _k is the dielectric constant, _{ra is the diameter of the conductor, r b} _is the inner diameter of the shell, μ _r is 1, μ ₀ is the dielectric constant in vacuum, ε ₀ is the magnetic permeability in vacuum Rate.

在一示例性实施例中，所述测试设备，还用于获取所述待测线缆的***损耗，其中，所述测试设备为网络分析仪或时域反射计；In an exemplary embodiment, the test equipment is further configured to obtain the insertion loss of the cable to be tested, wherein the test equipment is a network analyzer or a time domain reflectometer;

所述处理器，还用于通过以下方式根据所述介电常数、所述线缆阻抗以及所述***损耗确定所述损耗因子：The processor is further configured to determine the loss factor according to the dielectric constant, the cable impedance, and the insertion loss in the following manner:

其中，D _f为所述损耗因子，Loss _Total为所述***损耗，k ₁、k ₂为常数，ρ _resistance为所述绝缘材料的电阻率。 Wherein, D _f is the loss factor, Loss _Total is the insertion loss, k ₁ and k ₂ are constants, and ρ _resistance is the resistivity of the insulating material.

在一示例性实施例中，所述处理器，还用于获取所述待测线缆的导体损耗，并根据所述介电常数、所述导体损耗以及所述***损耗确定所述损耗因子。In an exemplary embodiment, the processor is further configured to acquire the conductor loss of the cable under test, and determine the loss factor according to the dielectric constant, the conductor loss and the insertion loss.

在一示例性实施例中，所述测试设备为网络分析仪，所述网络分析仪，用于分别获取第一夹具中待测线缆的第一散射参数和第二夹具中所述待测线缆的第二散射参数，根据所述第一散射参数和所述第二散射参数进行去嵌入操作，得到所述待测线缆的散射参数，其中，所述测试夹具包括所述第一夹具与所述第二夹具，所述第一夹具的长度大于所述第二夹具的长度，所述网络分析仪分别与所述第一夹具、所述第二夹具的两端连接；或者In an exemplary embodiment, the testing device is a network analyzer, and the network analyzer is used to obtain the first scattering parameter of the cable to be tested in the first fixture and the line to be tested in the second fixture, respectively. The second scattering parameter of the cable is obtained, and the de-embedding operation is performed according to the first scattering parameter and the second scattering parameter to obtain the scattering parameter of the cable to be tested, wherein the test fixture includes the first fixture and the For the second fixture, the length of the first fixture is greater than the length of the second fixture, and the network analyzer is respectively connected to both ends of the first fixture and the second fixture; or

所述测试设备为时域反射计，其中，所述时域反射计用于获取所述待测线缆的反射系数，所述时域反射计通过测试件与所述测试夹具的一端连接，所述测试夹具的另一端处于开路状态。The test equipment is a time domain reflectometer, wherein the time domain reflectometer is used to obtain the reflection coefficient of the cable to be tested, and the time domain reflectometer is connected to one end of the test fixture through a test piece, so The other end of the test fixture is open.

在一示例性实施例中，所述测试夹具包括第一圆盘、第二圆盘，所述第一圆盘与所述第二圆盘通过导电外壳连接，所述待测线缆设置于所述导电外壳内部，所述待测线缆内部设置有中间导体。In an exemplary embodiment, the test fixture includes a first disk and a second disk, the first disk and the second disk are connected through a conductive shell, and the cable to be tested is arranged on the Inside the conductive shell, an intermediate conductor is arranged inside the cable to be tested.

在一示例性实施例中，所述第一圆盘、所述第二圆盘以及所述导电外壳为一体成型结构。In an exemplary embodiment, the first disc, the second disc and the conductive shell are integrally formed.

在一示例性实施例中，所述第一圆盘、所述第二圆盘以及所述导电外壳为分体成型结构，其中，所述分体成型结构包括第一组件与第二组件，其中，所述第一组件与所述第二组件通过固定件固定形成所述测试夹具。In an exemplary embodiment, the first disc, the second disc, and the conductive housing are separate molded structures, wherein the separate molded structures include a first component and a second component, wherein , the first component and the second component are fixed by a fixing member to form the test fixture.

在一示例性实施例中，所述中间导体为一个或多个。In an exemplary embodiment, the intermediate conductors are one or more.

在一示例性实施例中，所述中间导体为圆柱体、长方体、正方体、六面体。In an exemplary embodiment, the intermediate conductor is a cylinder, a rectangular parallelepiped, a cube, or a hexahedron.

在一示例性实施例中，所述测试设备通过测试件与所述测试夹具连，所述第一圆盘与所述第二圆盘上设置有通孔，其中，所述第一圆盘上的通孔用于固定连接所述测试件与所述第一圆盘，所述第二圆盘上的通孔用于固定连接所述测试件与所述第二圆盘，所述通孔为一个或多个。In an exemplary embodiment, the test equipment is connected to the test fixture through a test piece, the first disc and the second disc are provided with through holes, wherein the first disc is The through hole is used for fixedly connecting the test piece and the first disc, the through hole on the second disc is used for fixedly connecting the test piece and the second disc, and the through hole is one or more.

在一示例性实施例中，所述测试夹具由电导率大于或等于第一预设阈值的导电材料制成。In an exemplary embodiment, the test fixture is made of a conductive material with a conductivity greater than or equal to a first preset threshold.

在一示例性实施例中，所述待测线缆与所述导电外壳之间通过填充物密封，其中，所述填充物的介电性能与所述绝缘材料的介电性能的差值小于第二预设阈值。In an exemplary embodiment, the cable to be tested and the conductive shell are sealed by a filler, wherein the difference between the dielectric properties of the filler and the dielectric properties of the insulating material is less than the first Two preset thresholds.

根据本公开的另一个实施例，还提供了一种线缆参数确定方法，所述方法包括：According to another embodiment of the present disclosure, a method for determining a cable parameter is also provided, the method comprising:

获取测试夹具中待测线缆的散射参数，或者获取所述测试夹具中所述/待测线缆的反射系数；Obtain the scattering parameters of the cable under test in the test fixture, or obtain the reflection coefficient of the cable/under test in the test fixture;

根据所述散射参数或所述反射系数确定所述待测线缆中绝缘材料的介电常数和损耗因子。The dielectric constant and loss factor of the insulating material in the cable to be tested are determined according to the scattering parameter or the reflection coefficient.

在一示例性实施例中，根据所述散射参数或所述反射系数确定所述待测线缆中绝缘材料的介电常数和损耗因子包括：In an exemplary embodiment, determining the dielectric constant and loss factor of the insulating material in the cable under test according to the scattering parameter or the reflection coefficient includes:

根据所述散射参数提取所述待测线缆的相位角与***损耗，并根据所述相位角与所述***损耗确定所述待测线缆中绝缘材料的介电常数和损耗因子；或者Extract the phase angle and insertion loss of the cable under test according to the scattering parameter, and determine the dielectric constant and loss factor of the insulating material in the cable under test according to the phase angle and the insertion loss; or

在一示例性实施例中，根据所述相位角与所述***损耗确定所述待测线缆中绝缘材料的介电常数和损耗因子包括：In an exemplary embodiment, determining the dielectric constant and loss factor of the insulating material in the cable under test according to the phase angle and the insertion loss includes:

通过以下方式根据所述相位角确定所述介电常数：The dielectric constant is determined from the phase angle by:

其中，D _f为所述损耗因子，Loss _Total为总损耗，k ₁、k ₂为常数，Z ₁为所述待测线缆的端口阻抗，ρ _{resis tan ce}为所述绝缘材料的电阻率。 Wherein, D _f is the loss factor, Loss _Total is the total loss, k ₁ and k ₂ are constants, Z ₁ is the port impedance of the cable to be tested, and ρ _{resis tance} is the resistivity of the insulating material.

在一示例性实施例中，根据所述反射系数确定所述待测线缆中绝缘材料的介电常数包括：In an exemplary embodiment, determining the dielectric constant of the insulating material in the cable under test according to the reflection coefficient includes:

通过以下方式根据所述反射系数确定所述测试夹具中待测线缆的线缆阻抗；Determine the cable impedance of the cable to be tested in the test fixture according to the reflection coefficient in the following manner;

获取所述待测夹具的外壳内径以及所述待测线缆内中间导体的导体直径；Obtain the inner diameter of the shell of the fixture to be tested and the conductor diameter of the intermediate conductor in the cable to be tested;

通过以下方式根据所述线缆阻抗、所述外壳内径以及所述导体直径确定所述绝缘材料的介电常数：The dielectric constant of the insulating material is determined from the cable impedance, the housing inner diameter, and the conductor diameter by:

在一示例性实施例中，根据所述介电常数确定所述绝缘材料的损耗因子包括：In an exemplary embodiment, determining the dissipation factor of the insulating material according to the dielectric constant includes:

通过网络分析仪或时域反射计获取所述待测线缆的***损耗；Obtain the insertion loss of the cable under test through a network analyzer or a time domain reflectometer;

通过以下方式根据所述介电常数、所述线缆阻抗以及所述***损耗确定所述损耗因子：The loss factor is determined from the dielectric constant, the cable impedance, and the insertion loss by:

其中，D _f为所述损耗因子，Loss _Total为所述***损耗，k ₁、k ₂为常数，ρ _{resis tan ce}为所述绝缘材料的电阻率。 Wherein, D _f is the loss factor, Loss _Total is the insertion loss, k ₁ and k ₂ are constants, and ρ _{resis tance} is the resistivity of the insulating material.

在一示例性实施例中，所述获取测试夹具中待测线缆的散射参数包括：In an exemplary embodiment, the obtaining the scattering parameter of the cable to be tested in the test fixture includes:

通过网络分析仪获取第一夹具中待测线缆的第一散射参数和第二夹具中所述待测线缆的第二散射参数，根据所述第一散射参数和所述第二散射参数进行去嵌入操作，得到所述待测线缆的散射参数，其中，所述第一夹具的长度大于所述第二夹具的长度，所述测试夹具包括所述第一夹具与所述第二夹具；Obtain the first scattering parameter of the cable under test in the first fixture and the second scattering parameter of the cable under test in the second fixture through the network analyzer, and perform the The de-embedding operation is performed to obtain the scattering parameters of the cable to be tested, wherein the length of the first fixture is greater than the length of the second fixture, and the test fixture includes the first fixture and the second fixture;

所述获取测试夹具中待测线缆的反射系数包括：The acquisition of the reflection coefficient of the cable to be tested in the test fixture includes:

通过时域反射计获取所述测试夹具中所述待测线缆的反射系数。The reflection coefficient of the cable to be tested in the test fixture is obtained by a time domain reflectometer.

根据本公开的另一个实施例，还提供了一种线缆参数确定装置，所述装置包括：According to another embodiment of the present disclosure, there is also provided an apparatus for determining a cable parameter, the apparatus comprising:

获取模块，设置为获取测试夹具中待测线缆的散射参数，或者获取测试夹具中待测线缆的反射系数；an acquisition module, configured to acquire the scattering parameters of the cable to be tested in the test fixture, or to acquire the reflection coefficient of the cable to be tested in the test fixture;

确定模块，设置为根据所述散射参数或所述反射系数确定所述待测线缆中绝缘材料的介电常数和损耗因子。A determination module, configured to determine the dielectric constant and loss factor of the insulating material in the cable to be tested according to the scattering parameter or the reflection coefficient.

在一示例性实施例中，所述确定模块包括：In an exemplary embodiment, the determining module includes:

第一确定子模块，设置为根据所述散射参数提取所述待测线缆的相位角与***损耗，并根据所述相位角与所述***损耗确定所述待测线缆中绝缘材料的介电常数和损耗因子；或者The first determination sub-module is configured to extract the phase angle and insertion loss of the cable under test according to the scattering parameter, and determine the dielectric properties of the insulating material in the cable under test according to the phase angle and the insertion loss. electric constant and dissipation factor; or

第二确定子模块，设置为根据所述反射系数确定所述待测线缆中绝缘材料的介电常数，并根据所述介电常数确定所述绝缘材料的损耗因子。The second determination sub-module is configured to determine the dielectric constant of the insulating material in the cable to be tested according to the reflection coefficient, and to determine the loss factor of the insulating material according to the dielectric constant.

在一示例性实施例中，所述第一确定子模块，还设置为In an exemplary embodiment, the first determination sub-module is further configured as

在一示例性实施例中，上述第二确定子模块，还设置为In an exemplary embodiment, the above-mentioned second determination sub-module is further configured as

在一示例性实施例中，所述获取模块，还设置为In an exemplary embodiment, the obtaining module is further set to

通过网络分析仪获取第一夹具中待测线缆的第一散射参数和第二夹具中所述待测线缆的第二散射参数，根据所述第一散射参数和所述第二散射参数进行去嵌入操作，得到所述待测线缆的散射参数，其中，所述第一夹具的长度大于所述第二夹具的长度，所述测试夹具包括所述第一夹具与所述第二夹具；或者通过时域反射计获取所述测试夹具中所述待测线缆的反射系数。Obtain the first scattering parameter of the cable under test in the first fixture and the second scattering parameter of the cable under test in the second fixture through the network analyzer, and perform the The de-embedding operation is performed to obtain the scattering parameters of the cable to be tested, wherein the length of the first fixture is greater than the length of the second fixture, and the test fixture includes the first fixture and the second fixture; Or obtain the reflection coefficient of the cable to be tested in the test fixture by using a time domain reflectometer.

根据本公开的又一个实施例，还提供了一种计算机可读的存储介质，所述存储介质中存储有计算机程序，其中，所述计算机程序被设置为运行时执行上述任一项方法实施例中的步骤。According to yet another embodiment of the present disclosure, a computer-readable storage medium is also provided, where a computer program is stored in the storage medium, wherein the computer program is configured to execute any one of the above method embodiments when running steps in .

根据本公开的又一个实施例，还提供了一种电子装置，包括存储器和处理器，所述存储器中存储有计算机程序，所述处理器被设置为运行所述计算机程序以执行上述任一项方法实施例中的步骤。According to yet another embodiment of the present disclosure, there is also provided an electronic device comprising a memory and a processor, wherein the memory stores a computer program, the processor is configured to run the computer program to execute any of the above Steps in Method Examples.

本公开实施例，获取测试夹具中待测线缆的散射参数，或者获取测试夹具中待测线缆的反射系数；根据所述散射参数或所述反射系数确定所述待测线缆中绝缘材料的介电常数和损耗因子，可以解决相关技术中绝缘材料的介电常数和损耗因子的测试方法，存在操作复杂、测试频点单一、测量结果不准确等问题，能够一次性测量不同频率下的介电常数和损耗因子，不需要一个一个频点重复测试，大大减少了测试的成本；通过不同的方式制造待测线缆样品来匹配实际产品的使用场景，测试的介电常数和损耗因子是最贴近产品应用的，提高了测量结果的准确性。In this embodiment of the present disclosure, the scattering parameter of the cable to be tested in the test fixture is obtained, or the reflection coefficient of the cable to be tested in the test fixture is obtained; the insulating material in the cable to be tested is determined according to the scattering parameter or the reflection coefficient The dielectric constant and loss factor can solve the problems of complex operation, single test frequency, inaccurate measurement results, etc., which can solve the test methods of dielectric constant and loss factor of insulating materials in related technologies. The dielectric constant and loss factor do not need to repeat the test one by one, which greatly reduces the cost of the test; the cable samples to be tested are manufactured in different ways to match the actual product usage scenarios. The tested dielectric constant and loss factor are The closest to the product application improves the accuracy of the measurement results.

附图说明Description of drawings

图1是本公开实施例的线缆参数确定方法的移动终端的硬件结构框图；1 is a block diagram of a hardware structure of a mobile terminal according to a method for determining a cable parameter according to an embodiment of the present disclosure;

图2是根据本公开实施例的线缆参数确定方法的流程图；FIG. 2 is a flowchart of a method for determining a cable parameter according to an embodiment of the present disclosure;

图3是根据本实施例的线缆参数确定***的示意图；3 is a schematic diagram of a cable parameter determination system according to the present embodiment;

图4是根据本实施例的通过测试夹具测试介电常数和损耗因子的示意图一；4 is a schematic diagram 1 of testing dielectric constant and dissipation factor through a test fixture according to the present embodiment;

图5是根据本实施例的测试夹具的示意图；5 is a schematic diagram of a test fixture according to the present embodiment;

图6是根据本可选实施例的测试夹具的示意图；6 is a schematic diagram of a test fixture according to this optional embodiment;

图7是根据本实施例的介电常数和损耗因子测试的示意图；7 is a schematic diagram of dielectric constant and dissipation factor tests according to the present embodiment;

图8是根据本实施例的通过测试夹具测试介电常数和损耗因子的示意图二；8 is a schematic diagram 2 of testing dielectric constant and dissipation factor through a test fixture according to the present embodiment;

图9是根据本实施例的测试波形的示意图；9 is a schematic diagram of a test waveform according to the present embodiment;

图10是根据本可选实施例的测试夹具的示意图一；10 is a schematic diagram 1 of a test fixture according to this optional embodiment;

图11是根据本可选实施例的测试夹具的示意图二；11 is a second schematic diagram of a test fixture according to this optional embodiment;

图12是根据本可选实施例的测试夹具的示意图三；12 is a schematic diagram three of a test fixture according to this optional embodiment;

图13是根据本可选实施例的测试夹具的示意图四；13 is a schematic diagram four of a test fixture according to this optional embodiment;

图14是根据本可选实施例的测试夹具的示意图五，；Figure 14 is a schematic diagram five of the test fixture according to the present optional embodiment;

图15是根据本可选实施例的测试夹具的示意图六，；15 is a schematic diagram VI of a test fixture according to the present optional embodiment;

图16是根据本可选实施例的测试夹具的示意图七，；16 is a schematic diagram seven of a test fixture according to this optional embodiment;

图17是根据本实施例的线缆参数确定装置的框图。FIG. 17 is a block diagram of a cable parameter determination apparatus according to the present embodiment.

具体实施方式Detailed ways

下文中将参考附图并结合实施例来详细说明本公开的实施例。Hereinafter, embodiments of the present disclosure will be described in detail with reference to the accompanying drawings and in conjunction with the embodiments.

需要说明的是，本公开的说明书和权利要求书及上述附图中的术语“第一”、“第二”等是用于区别类似的对象，而不必用于描述特定的顺序或先后次序。It should be noted that the terms "first", "second" and the like in the description and claims of the present disclosure and the above drawings are used to distinguish similar objects, and are not necessarily used to describe a specific sequence or sequence.

本公开实施例中所提供的方法实施例可以在移动终端、计算机终端或者类似的运算装置中执行。以运行在移动终端上为例，图1是本公开实施例的线缆参数确定方法的移动终端的硬件结构框图，如图1所示，移动终端可以包括一个或多个(图1中仅示出一个)处理器102(处理器102可以包括但不限于微处理器MCU或可编程逻辑器件FPGA等的处理装置)和用于存储数据的存储器104，其中，上述移动终端还可以包括用于通信功能的传输设备106以及输入输出设备108。本领域普通技术人员可以理解，图1所示的结构仅为示意，其并不对上述移动终端的结构造成限定。例如，移动终端还可包括比图1中所示更多或者更少的组件，或者具有与图1所示不同的配置。The method embodiments provided in the embodiments of the present disclosure may be executed in a mobile terminal, a computer terminal, or a similar computing device. Taking running on a mobile terminal as an example, FIG. 1 is a block diagram of the hardware structure of a mobile terminal according to a method for determining cable parameters according to an embodiment of the present disclosure. As shown in FIG. 1, the mobile terminal may include one or more (only shown in FIG. 1 ). A) a processor 102 (the processor 102 may include, but is not limited to, a processing device such as a microprocessor MCU or a programmable logic device FPGA, etc.) and a memory 104 for storing data, wherein the above-mentioned mobile terminal may also include a communication device for communication Function transmission device 106 and input and output device 108. Those of ordinary skill in the art can understand that the structure shown in FIG. 1 is only a schematic diagram, which does not limit the structure of the above-mentioned mobile terminal. For example, the mobile terminal may also include more or fewer components than those shown in FIG. 1 , or have a different configuration than that shown in FIG. 1 .

存储器104可用于存储计算机程序，例如，应用软件的软件程序以及模块，如本公开实施例中的线缆参数确定方法对应的计算机程序，处理器102通过运行存储在存储器104内的计算机程序，从而执行各种功能应用以及业务链地址池切片处理，即实现上述的方法。存储器104可包括高速随机存储器，还可包括非易失性存储器，如一个或者多个磁性存储装置、闪存、或者其他非易失性固态存储器。在一些实例中，存储器104可进一步包括相对于处理器102远程设置的存储器，这些远程存储器可以通过网络连接至移动终端。上述网络的实例包括但不限于互联网、企业内部网、局域网、移动通信网及其组合。The memory 104 can be used to store computer programs, for example, software programs and modules of application software, such as computer programs corresponding to the cable parameter determination method in the embodiment of the present disclosure. The processor 102 runs the computer programs stored in the memory 104 to thereby Execute various functional applications and business chain address pool slice processing, that is, to implement the above method. Memory 104 may include high-speed random access memory, and may also include non-volatile memory, such as one or more magnetic storage devices, flash memory, or other non-volatile solid-state memory. In some instances, the memory 104 may further include memory located remotely from the processor 102, and these remote memories may be connected to the mobile terminal through a network. Examples of such networks include, but are not limited to, the Internet, an intranet, a local area network, a mobile communication network, and combinations thereof.

传输装置106用于经由一个网络接收或者发送数据。上述的网络具体实例可包括移动终端的通信供应商提供的无线网络。在一个实例中，传输装置106包括一个网络适配器(Network Interface Controller，简称为NIC)，其可通过基站与其他网络设备相连从而可与互联网进行通讯。在一个实例中，传输装置106可以为射频(Radio Frequency，简称为RF)模块，其用于通过无线方式与互联网进行通讯。Transmission means 106 are used to receive or transmit data via a network. The specific example of the above-mentioned network may include a wireless network provided by a communication provider of the mobile terminal. In one example, the transmission device 106 includes a network adapter (Network Interface Controller, NIC for short), which can be connected to other network devices through a base station so as to communicate with the Internet. In one example, the transmission device 106 may be a radio frequency (Radio Frequency, RF for short) module, which is used to communicate with the Internet in a wireless manner.

在本实施例中提供了一种运行于上述移动终端或网络架构的线缆参数确定方法，图2是根据本公开实施例的线缆参数确定方法的流程图，如图2所示，该流程包括如下步骤：This embodiment provides a method for determining cable parameters that runs on the above-mentioned mobile terminal or network architecture. FIG. 2 is a flowchart of the method for determining cable parameters according to an embodiment of the present disclosure. As shown in FIG. 2 , the process It includes the following steps:

步骤S202，获取测试夹具中待测线缆的散射参数，或者获取测试夹具中待测线缆的反射系数；Step S202, acquiring the scattering parameter of the cable to be tested in the test fixture, or acquiring the reflection coefficient of the cable to be tested in the test fixture;

在本实施例中，上述步骤S202中具体可以通过以下方式获取：通过网络分析仪获取第一夹具中待测线缆的第一散射参数和第二夹具中所述待测线缆的第二散射参数，根据所述第一散射参数和所述第二散射参数进行去嵌入操作，得到所述待测线缆的散射参数，其中，所述第一夹具的长度大于所述第二夹具的长度，所述测试夹具包括所述第一夹具与所述第二夹具；或者通过时域反射计获取所述测试夹具中所述待测线缆的反射系数。In this embodiment, the above-mentioned step S202 can be obtained in the following manner: obtaining the first scattering parameter of the cable under test in the first fixture and the second scattering parameter of the cable under test in the second fixture through a network analyzer parameters, perform a de-embedding operation according to the first scattering parameter and the second scattering parameter to obtain the scattering parameter of the cable to be tested, wherein the length of the first fixture is greater than the length of the second fixture, The test fixture includes the first fixture and the second fixture; or the reflection coefficient of the cable to be tested in the test fixture is obtained through a time domain reflectometer.

步骤S204，根据所述散射参数或所述反射系数确定所述待测线缆中绝缘材料的介电常数和损耗因子。Step S204, determining the dielectric constant and loss factor of the insulating material in the cable to be tested according to the scattering parameter or the reflection coefficient.

通过上述步骤S202至S204，获取测试夹具中待测线缆的散射参数，或者获取测试夹具中待测线缆的反射系数；根据所述散射参数或所述反射系数确定所述待测线缆中绝缘材料的介电常数和损耗因子，可以解决相关技术中绝缘材料的介电常数和损耗因子的测试方法，存在操作复杂、测试频点单一、测量结果不准确等问题，能够一次性测量不同频率下的介电常数和损耗因子，不需要一个一个频点重复测试，大大减少了测试的成本；通过不同的方式制造待测线缆样品来匹配实际产品的使用场景，测试的介电常数和损耗因子是最贴近产品应用的，提高了测量结果的准确性。Through the above steps S202 to S204, the scattering parameters of the cable under test in the test fixture are obtained, or the reflection coefficient of the cable under test in the test fixture is obtained; The dielectric constant and loss factor of insulating materials can solve the test methods of dielectric constant and loss factor of insulating materials in related technologies, which have problems such as complicated operation, single test frequency, and inaccurate measurement results, and can measure different frequencies at one time. It does not need to repeat the test at each frequency point, which greatly reduces the cost of the test; the cable samples to be tested are manufactured in different ways to match the actual product usage scenarios, and the tested dielectric constant and loss The factor is closest to the product application, improving the accuracy of the measurement results.

在本实施例中，上述步骤S204具体可以包括：In this embodiment, the foregoing step S204 may specifically include:

S2041，若上述步骤S202中，获取的是所述散射参数，根据所述散射参数提取所述待测线缆的相位角与***损耗，并根据所述相位角与所述***损耗确定所述待测线缆中绝缘材料的介电常数和损耗因子；S2041, if the scattering parameter is obtained in the above step S202, the phase angle and insertion loss of the cable to be tested are extracted according to the scattering parameter, and the phase angle and the insertion loss are determined according to the phase angle and the insertion loss. Measure the dielectric constant and loss factor of insulating materials in cables;

S2042，若上述步骤S202中，获取的是所述反射系数，根据所述反射系数确定所述待测线缆中绝缘材料的介电常数，并根据所述介电常数确定所述绝缘材料的损耗因子。S2042, if the reflection coefficient is obtained in the above step S202, the dielectric constant of the insulating material in the cable to be tested is determined according to the reflection coefficient, and the loss of the insulating material is determined according to the dielectric constant factor.

在一示例性实施例中，上述S2041中，根据所述相位角与所述***损耗确定所述待测线缆中绝缘材料的介电常数和损耗因子具体可以包括：In an exemplary embodiment, in the above S2041, determining the dielectric constant and loss factor of the insulating material in the cable under test according to the phase angle and the insertion loss may specifically include:

其中，D _f为所述损耗因子，Loss _Total为总损耗，k ₁、k ₂为与测试夹具的几何形状相关的常数，Z ₁为所述待测线缆的端口阻抗，ρ _{resis tan ce}为所述绝缘材料的电阻率。 Wherein, D _f is the loss factor, Loss _Total is the total loss, k ₁ and k ₂ are constants related to the geometry of the test fixture, Z ₁ is the port impedance of the cable to be tested, and ρ _{resis tan ce} is The resistivity of the insulating material.

本实施例中的***损耗由两部分组成，一部分为导体损耗，一部分为介质损耗。其中介质损耗与D _k和D _f有关，具体公式如下： The insertion loss in this embodiment consists of two parts, one part is conductor loss, and the other part is dielectric loss. The dielectric loss is related to D _k and D _f , and the specific formula is as follows:

公式中Loss _material为介质损耗，Loss _conduction为导体损耗，k ₁、k ₂为常数，与测试夹具的形状相关，k ₁＝3.3×10 ⁷□3.5×10 ⁷,k ₂＝4□4.5；Z ₁根据测试夹具的结构确定的，ρ _{resis tan ce}为材料的电阻率，可以根据选材得到；***损耗Loss _Total测量得到的，根据上述公式便可计算出损耗因子D _f。 In the formula, Loss _material is dielectric loss, Loss _conduction is conductor loss, k ₁ , k ₂ are constants, which are related to the shape of the test fixture, k ₁ =3.3×10 ⁷ □3.5×10 ⁷ , k ₂ =4□4.5; Z ₁ Determined according to the structure of the test fixture, ρ _{resis tan ce} is the resistivity of the material, which can be obtained according to the material selection; the loss factor D _f can be calculated according to the above formula if the insertion loss Loss _Total is measured.

在一示例性实施例中，上述S2042中，根据所述反射系数确定所述待测线缆中绝缘材料的介电常数包括：In an exemplary embodiment, in the above S2042, determining the dielectric constant of the insulating material in the cable under test according to the reflection coefficient includes:

r _a、r _b即为所述测试夹具的中间导体的半径与外壳半径，都可以实际测量得出。而测试夹具选用的材料μ _r对于大部分非磁性材料(即绝缘材料)均为1，ε ₀和μ ₀为真空中的磁导率和介电常数，为已知值，式子中只有一个未知数D _k即为绝缘材料的介电常数。 r _a , r _b are the radius of the middle conductor of the test fixture and the radius of the shell, which can be obtained by actual measurement. The material μ _r selected for the test fixture is 1 for most non-magnetic materials (ie insulating materials), ε ₀ and μ ₀ are the magnetic permeability and dielectric constant in vacuum, which are known values, and there is only one in the formula The unknown D _k is the dielectric constant of the insulating material.

在一示例性实施例中，上述S2042中，根据所述介电常数确定所述绝缘材料的损耗因子具体可以包括：In an exemplary embodiment, in the above S2042, determining the loss factor of the insulating material according to the dielectric constant may specifically include:

根据本公开的另一个实施例，提供了一种线缆参数确定***，图3是根据本实施例的线缆参数确定***的示意图，如图3所示，包括：测试夹具32、测试设备34、处理器36，其中，According to another embodiment of the present disclosure, a cable parameter determination system is provided. FIG. 3 is a schematic diagram of the cable parameter determination system according to this embodiment. As shown in FIG. 3 , the system includes: a test fixture 32 and a test equipment 34 , processor 36, wherein,

所述测试设备34，用于获取所述测试夹具32中待测线缆的散射参数，或者获取所述测试夹具32中所述待测线缆的反射系数；The test equipment 34 is used to obtain the scattering parameter of the cable under test in the test fixture 32, or obtain the reflection coefficient of the cable under test in the test fixture 32;

所述处理器36，用于根据所述散射参数或所述反射系数确定所述待测线缆中绝缘材料的介电常数和损耗因子。The processor 36 is configured to determine the dielectric constant and loss factor of the insulating material in the cable to be tested according to the scattering parameter or the reflection coefficient.

在一示例性实施例中，所述处理器36，还用于在所述测试设备34获取的是所述散射参数的情况下，根据所述散射参数提取所述待测线缆的相位角与***损耗，并根据所述相位角与所述***损耗确定所述待测线缆中绝缘材料的介电常数和损耗因子；In an exemplary embodiment, the processor 36 is further configured to extract the phase angle and the phase angle of the cable to be tested according to the scattering parameter when the scattering parameter is obtained by the testing device 34 Insertion loss, and determine the dielectric constant and loss factor of the insulating material in the cable under test according to the phase angle and the insertion loss;

在所述测试设备34获取的是所述反射系数的情况下，根据所述反射系数确定所述待测线缆中绝缘材料的介电常数，并根据所述介电常数确定所述绝缘材料的损耗因子。In the case that the reflection coefficient obtained by the testing device 34 is the reflection coefficient, the dielectric constant of the insulating material in the cable to be tested is determined according to the reflection coefficient, and the dielectric constant of the insulating material is determined according to the dielectric constant. loss factor.

在一示例性实施例中，所述处理器36，还用于通过以下方式根据所述相位角确定所述介电常数：In an exemplary embodiment, the processor 36 is further configured to determine the dielectric constant according to the phase angle in the following manner:

其中，D _k位所述介电常数，c为真空中的光速，f为测试频率，φ为所述测试频率下的相位角，所述测试夹具32包括所述第一夹具与所述第二夹具，L为所述第一夹具与所述第二夹具的长度差； Wherein, D _k is the dielectric constant, c is the speed of light in vacuum, f is the test frequency, φ is the phase angle at the test frequency, and the test fixture 32 includes the first fixture and the second fixture. clamp, L is the length difference between the first clamp and the second clamp;

在一示例性实施例中，所述处理器36，还用于通过以下方式根据所述反射系数确定所述测试夹具32中待测线缆的线缆阻抗；In an exemplary embodiment, the processor 36 is further configured to determine the cable impedance of the cable to be tested in the test fixture 32 according to the reflection coefficient in the following manner;

在一示例性实施例中，所述测试设备34，还用于获取所述待测线缆的***损耗，其中，所述测试设备34为网络分析仪或时域反射计；In an exemplary embodiment, the testing device 34 is further configured to obtain the insertion loss of the cable to be tested, wherein the testing device 34 is a network analyzer or a time domain reflectometer;

所述处理器36，还用于通过以下方式根据所述介电常数、所述线缆阻抗以及所述***损耗确定所述损耗因子：The processor 36 is further configured to determine the loss factor according to the dielectric constant, the cable impedance and the insertion loss in the following manner:

在一示例性实施例中，所述处理器36，还用于获取所述待测线缆的导体损耗，并根据所述介电常数、所述导体损耗以及所述***损耗确定所述损耗因子。In an exemplary embodiment, the processor 36 is further configured to acquire the conductor loss of the cable under test, and determine the loss factor according to the dielectric constant, the conductor loss and the insertion loss .

在一示例性实施例中，上述的散射参数可以通过网络分析仪测量得到，具体的，所述测试设备34为网络分析仪，所述网络分析仪，用于分别获取第一夹具中待测线缆的第一散射参数和第二夹具中所述待测线缆的第二散射参数，根据所述第一散射参数和所述第二散射参数进行去嵌入操作，得到所述待测线缆的散射参数，其中，所述测试夹具32包括所述第一夹具与所述第二夹具，所述第一夹具的长度大于所述第二夹具的长度，所述网络分析仪分别与所述第一夹具、所述第二夹具的两端连接；In an exemplary embodiment, the above-mentioned scattering parameters can be measured by a network analyzer. Specifically, the testing device 34 is a network analyzer, and the network analyzer is used to obtain the lines to be measured in the first fixture respectively. the first scattering parameter of the cable and the second scattering parameter of the cable to be tested in the second fixture, perform a de-embedding operation according to the first scattering parameter and the second scattering parameter, and obtain the Scattering parameters, wherein the test fixture 32 includes the first fixture and the second fixture, the length of the first fixture is greater than the length of the second fixture, the network analyzer and the first fixture are respectively The two ends of the clamp and the second clamp are connected;

上述的反射系数可以通过时域反射计测量得到，具体的，所述测试设备34为时域反射计，其中，所述时域反射计用于获取所述待测线缆的反射系数，所述时域反射计通过测试件与所述测试夹具32的一端连接，所述测试夹具32的另一端处于开路状态。The above reflection coefficient can be obtained by measuring the time domain reflectometer. Specifically, the test device 34 is a time domain reflectometer, wherein the time domain reflectometer is used to obtain the reflection coefficient of the cable to be tested. The time domain reflectometer is connected to one end of the test fixture 32 through a test piece, and the other end of the test fixture 32 is in an open state.

在一示例性实施例中，所述测试夹具32包括第一圆盘、第二圆盘，所述第一圆盘与所述第二圆盘通过导电外壳连接，所述待测线缆设置于所述导电外壳内部，所述待测线缆内部设置有中间导体。In an exemplary embodiment, the test fixture 32 includes a first disk and a second disk, the first disk and the second disk are connected through a conductive shell, and the cable to be tested is arranged on the Inside the conductive shell, an intermediate conductor is arranged inside the cable to be tested.

在一示例性实施例中，为了避免导电外壳变形，还可以对导电外壳进行加固，可以通过增加导电外壳的部分区域的厚度进行加固，也可以通过增加加固件的方式进行加固，加固的方式和加固件的结构不做具体限定。In an exemplary embodiment, in order to avoid deformation of the conductive shell, the conductive shell can also be reinforced, which can be reinforced by increasing the thickness of a part of the conductive shell, or by adding reinforcements. The structure of the reinforcement is not specifically limited.

在一示例性实施例中，所述第一圆盘、所述第二圆盘以及所述导电外壳为分体成型结构，其中，所述分体成型结构包括第一组件与第二组件，其中，所述第一组件与所述第二组件通过固定件固定形成所述测试夹具32。In an exemplary embodiment, the first disc, the second disc, and the conductive housing are separate molded structures, wherein the separate molded structures include a first component and a second component, wherein , the first component and the second component are fixed by a fixing member to form the test fixture 32 .

在一示例性实施例中，所述测试设备34通过测试件与所述测试夹具32连，所述第一圆盘与所述第二圆盘上设置有通孔，其中，所述第一圆盘上的通孔用于固定连接所述测试件与所述第一圆盘，所述第二圆盘上的通孔用于固定连接所述测试件与所述第二圆盘，所述通孔为一个或多个。In an exemplary embodiment, the test equipment 34 is connected to the test fixture 32 through a test piece, the first disc and the second disc are provided with through holes, wherein the first disc is The through holes on the disc are used for fixedly connecting the test piece and the first disc, and the through holes on the second disc are used for fixedly connecting the test piece and the second disc, and the through holes are used for fixedly connecting the test piece and the second disc. There are one or more holes.

在一示例性实施例中，所述测试夹具32由电导率大于或等于第一预设阈值的导电材料制成。In an exemplary embodiment, the test fixture 32 is made of a conductive material with a conductivity greater than or equal to a first preset threshold.

下面以具体实例的方式对上述实施例进行详细说明。The above embodiments are described in detail below by way of specific examples.

图4是根据本实施例的通过测试夹具测试介电常数和损耗因子的示意图一，如图4所示，网络分析仪通过通用同轴连接器与测试夹具的两端连接。图5是根据本实施例的测试夹具的示意图，如图5所示，该测试夹具对应的k ₁＝3.3×10 ⁷,k ₂＝4.4，同轴线由中间的内金属导体和外面包裹待测的待测材料和外面的金属外壳构成，其材料的材质H70黄铜或者是电导率满足一定条件的导电物质，要求电导率。测试过程以及装配关系为：中间导体线线通过装配或者注塑到树脂样品中；在将装配好的样品装配到夹具当中；将整套夹具与通用的测试件相连；通过通用测试件将分析仪器和夹具相连接，即可开始测试得到散射参数；测试夹具有长短一对，另外一套夹具和样品按照上述步骤处理得到另一个散射参数；最后使用***对散射参数进行去嵌入处理，并通过相位和***损耗提取得到D _k、D _f。通用同轴连接器应当具备以下特征：具有与分析仪器的线缆相连接作用；是一种同轴连接器，它具有频带宽、性能优、高可靠、寿命长的特点。 FIG. 4 is a schematic diagram 1 of testing dielectric constant and loss factor through a test fixture according to the present embodiment. As shown in FIG. 4 , the network analyzer is connected to both ends of the test fixture through a universal coaxial connector. FIG. 5 is a schematic diagram of a test fixture according to the present embodiment. As shown in FIG. 5 , the test fixture corresponds to k ₁ =3.3×10 ⁷ , k ₂ =4.4, and the coaxial line is wrapped by an inner metal conductor in the middle and an outer surface to be wrapped. The material to be tested is composed of the outer metal shell. The material of the material is H70 brass or a conductive substance whose conductivity meets certain conditions, and the conductivity is required. The test process and assembly relationship are: the middle conductor wire is assembled or injected into the resin sample; the assembled sample is assembled into the fixture; the entire set of fixtures is connected to the general test piece; the analytical instrument and the fixture are connected through the general test piece Connected, you can start the test to get the scattering parameters; the test fixture has a pair of long and short, and the other set of fixtures and the sample are processed according to the above steps to obtain another scattering parameter; finally, the system is used to de-embed the scattering parameters, and phase and insert The loss is extracted to obtain D _k , D _f . The general coaxial connector should have the following characteristics: it has the function of connecting with the cable of the analytical instrument; it is a coaxial connector with the characteristics of wide frequency band, excellent performance, high reliability and long life.

内外圈直径大小设置需要满足端口阻抗为一定值，例如，将端口阻抗定为50Ω，中间导线的半径为0.5mm，要满足阻抗值为50Ω则外径为2.4mm，如果内半径为0.64mm，则外半径要保证50Ω的阻抗，也可以计算得出外径的大小，因此端口具有某一定的阻抗值是该夹具的关键特征。图5中需要待测材料和内部中间导体和外层金属壳中保证无间隙，如果有空气则相当于测试待测样品和空气的混合介电性能，导致误差提高。其次为了装配过程方便，因此需要用到一种有机绝缘硅胶润滑树脂进行内部轴线(如果采用注塑的形式则内部轴线不需要)和外部金属壳的无间隙接触。同时润滑树脂应当具有如下几个特征：润滑；绝缘；介电性能与待测样品相近。The diameter of the inner and outer rings needs to meet a certain value of the port impedance. For example, the port impedance is set to 50Ω, and the radius of the middle wire is 0.5mm. If the impedance value is 50Ω, the outer diameter is 2.4mm. If the inner radius is 0.64mm, Then the outer radius must ensure the impedance of 50Ω, and the size of the outer diameter can also be calculated, so the port has a certain impedance value is the key feature of the fixture. In Figure 5, it is necessary to ensure that there is no gap in the material to be tested, the inner intermediate conductor and the outer metal shell. If there is air, it is equivalent to testing the mixed dielectric properties of the sample to be tested and air, resulting in increased errors. Secondly, in order to facilitate the assembly process, it is necessary to use an organic insulating silicone lubricating resin for gap-free contact between the inner axis (if it is in the form of injection molding, the inner axis is not required) and the outer metal shell. At the same time, the lubricating resin should have the following characteristics: lubrication; insulation; dielectric properties similar to those of the sample to be tested.

一方面测试前对分析仪器进行校准外，另一方面测试过程中为了进一步提高精度需要对接触过程进行优化，由于发明所述的过程中使用了通用连接器结构，在夹具与通用连接器的接触中会引入误差，为了消除这种误差需要用到两个长度的夹具进行测试，并对测试结果进行去嵌入算法，即可去除该夹具的测试误差。同理，测试中用到的样品的长度也有两个。本实施例所涉及的长度不同具体差异为长结构件和短结构件的差异大于0.1mm即可，该长度的值反应在***处理数据过程中。On the one hand, the analytical instrument is calibrated before the test, and on the other hand, the contact process needs to be optimized in order to further improve the accuracy during the test process. In order to eliminate this error, it is necessary to use a fixture with two lengths for testing, and perform a de-embedding algorithm on the test results to remove the test error of the fixture. Similarly, there are two lengths of samples used in the test. The specific difference between the lengths involved in this embodiment is that the difference between the long structural member and the short structural member is greater than 0.1 mm, and the value of the length is reflected in the process of data processing by the system.

除此之外，可以对两端的接触点大小、厚度以及中间的导线的同心度进行仿真优化。利用仿真软件对长线和短线进行接触盘大小的扫参，不论长线还是短线，不论接触盘的半径从7.16mm变化到8.64mm，对整段同轴线的***损耗和回波损耗都无影响，接触盘的半径大于5mm即可。In addition, the size and thickness of the contact points at both ends and the concentricity of the conductor in the middle can be simulated and optimized. Use the simulation software to scan the size of the contact disc for the long and short lines. No matter the long line or the short line, no matter whether the radius of the contact disc changes from 7.16mm to 8.64mm, it has no effect on the insertion loss and return loss of the entire coaxial line. The radius of the contact disc may be greater than 5mm.

若厚度越厚势必将阻抗波动的范围增加，若越薄的话不仅加工会有很大难度且在使用过程中容易弯曲，不耐使用。接触盘的厚度设置为相对容易加工且比较薄的情况，小于5mm即可。If the thickness is thicker, the range of impedance fluctuation will increase. If the thickness is thinner, it will not only be very difficult to process, but also easy to bend during use, which is not resistant to use. The thickness of the contact disc is set to be relatively easy to process and relatively thin, and it is sufficient to be less than 5 mm.

对于实际的加工过程中，中间的导体不论采用注塑或者是装配的方式都会存在一定的偏差，当同心度存在偏差对提取得到的相位和***损耗差别不大，因此夹具的中心导线存在夹具内部的具***置可以有一定偏移量，但是要保证与通用连接器的电气连接器即可。图6是根据本可选实施例的测试夹具的示意图，如图6所示，包含长线(DUT)和短线(Thru)。For the actual processing process, there will be a certain deviation in the middle conductor whether it is injection molded or assembled. When there is a deviation in concentricity, the extracted phase and insertion loss have little difference. Therefore, the center wire of the fixture exists inside the fixture. The specific position can have a certain offset, but it is enough to ensure the electrical connector with the universal connector. FIG. 6 is a schematic diagram of a test fixture according to this alternative embodiment, as shown in FIG. 6 , including a long wire (DUT) and a short wire (Thru).

按照图4进行测试可以获得长线和短线的散射参数，在通过去嵌入操作后，提取出真实同轴线的相位以及***损耗后，可以根据一定的算法得到D _k、D _f。为了简化操作步骤，本发明将去嵌入和D _k、D _f提取过程整合到***之中，其中***包含主要包含两个功能：进行去嵌入操作，即将长夹具和短夹具的散射参数进行一系列数学运算，达到去除夹具连接过程引入的误差；对处理后的散射参数进行相位和***损耗读取，并计算出材料的介电常数和损耗因子进行计算。 The scattering parameters of long and short lines can be obtained by testing according to Fig. 4. After de-embedding, the phase and insertion loss of the real coaxial line are extracted, and D _k and D _f can be obtained according to a certain algorithm. In order to simplify the operation steps, the present invention integrates the process of de-embedding and D _k , D _f extraction into the system, wherein the system mainly includes two functions: performing the de-embedding operation, that is, performing a series of scattering parameters of the long and short fixtures Mathematical operations can be used to remove the errors introduced by the fixture connection process; the phase and insertion loss of the processed scattering parameters are read, and the dielectric constant and loss factor of the material are calculated for calculation.

其中,去嵌入的过程，如图4所示的测试场景中实际包含由长夹具(对应上述第一夹具)和短夹具(对应上述第二夹具)测试的两个S参数，图7是根据本实施例的介电常数和损耗因子测试的示意图，如图7所示，得到两个A+DUT+B以及A+B的S2P文件之后对其进行矩阵运算，得到单独的DUT的S参数。众所周知的是，S参数里包含着每一个频率下左右两个端口的信号幅值和相位的信息，因此对每个频率下的相位和幅值进行运算即可知道DUT在每个频率下的幅值和相位的信息，也即得到***损耗和相位角。相位角与介电常数强相关，如果介质中介电常数越小就说明电磁场相位传播的速度也就越快，因此在单位时间相位传播的角度不难从相位角图形中得出，因此可以获得不同频率下的介电常数。Among them, the de-embedding process actually includes two S parameters tested by the long fixture (corresponding to the first fixture) and the short fixture (corresponding to the second fixture) as shown in Figure 4. Figure 7 is based on this The schematic diagram of the dielectric constant and loss factor test of the embodiment is shown in FIG. 7 . After obtaining two S2P files of A+DUT+B and A+B, matrix operations are performed on them to obtain the S-parameters of the individual DUTs. As we all know, the S-parameter contains the information of the signal amplitude and phase of the left and right ports at each frequency. Therefore, by calculating the phase and amplitude at each frequency, the amplitude of the DUT at each frequency can be known. Value and phase information, that is, insertion loss and phase angle. The phase angle is strongly related to the dielectric constant. If the dielectric constant in the medium is smaller, the speed of the electromagnetic field phase propagation is faster. Therefore, the angle of phase propagation per unit time is not difficult to obtain from the phase angle graph, so it is possible to obtain different Dielectric constant at frequency.

在获取材料的介电常数之后，需要在对材料的D _f进行提取。***损耗的来源包含介质损耗和导体损耗，而介质损耗的大小由D _k、D _f决定，而D _k在前面已经获得，因此根据***损耗便可以推出D _f。 After obtaining the dielectric constant of the material, it is necessary to extract the D _f of the material. The sources of insertion loss include dielectric loss and conductor loss, and the magnitude of dielectric loss is determined by D _k and D _f , and D _k has been obtained before, so D _f can be deduced according to the insertion loss.

上述的测试过程是通过***处理，从去嵌入计算后的散射参数中提取相位和***损耗从而获取待测材料的D _k、D _f。图8是根据本实施例的通过测试夹具测试介电常数和损耗因子的示意图二，如图8所示，还可以利用本实施例提到的装置进行时域反射计(TDR)测试，将一端口进行开路，通过端口的反射特性得到材料的D _k值，再通过网络分析仪对***损耗的测量确定D _f。 The above-mentioned testing process is to obtain the D _k and D _f of the material to be tested by extracting the phase and insertion loss from the scattering parameters calculated after de-embedding through systematic processing. FIG. 8 is a second schematic diagram of the dielectric constant and loss factor tested by a test fixture according to this embodiment. As shown in FIG. 8 , the device mentioned in this embodiment can also be used to perform a time domain reflectometry (TDR) test. The port is open-circuited, and the _Dk value of the material is obtained through the reflection characteristics of the port, and then _Df is determined by measuring the insertion loss of the network analyzer.

测试步骤变化为：制备并装配好样品；使用TDR(时域反射计)对待测夹具进行测试，并保持一端开路；根据反射系数提取材料的D _k值；再使用网络分析仪或TDR进行插损测试；根据***损耗和前面得到的D _k值进行D _f的计算。另外除了TDR方法获取端口反射的特性之外，也可以通过网络分析仪的散射参数中进行反射特性的提取从而得到材料的D _k。 The test steps change as follows: prepare and assemble the sample; use TDR (time domain reflectometer) to test the fixture to be tested, and keep one end open; extract the D _k value of the material according to the reflection coefficient; then use a network analyzer or TDR for insertion loss Test; _Df is calculated based on insertion loss and _Dk value obtained earlier. In addition to the TDR method to obtain the port reflection characteristics, the _Dk of the material can also be obtained by extracting the reflection characteristics from the scattering parameters of the network analyzer.

使用TDR的原理，如图8所示，一端开路不接线，测得夹具的阻抗(即反射系数)。而夹具的阻抗决定因素有：外壳内径的大小，中间导体细线的直径，以及待测绝缘材料的D _k值。由于该结构已经固定，所以外壳内径和内导电细线直径都是固定的，因此即可计算得出D _k。长夹具和短夹具同时测试，作为重复验证实验，不需要再进行去嵌入操作。 Using the principle of TDR, as shown in Figure 8, one end is open without wiring, and the impedance (ie reflection coefficient) of the fixture is measured. The impedance determining factors of the fixture are: the size of the inner diameter of the shell, the diameter of the thin wire of the intermediate conductor, and the _Dk value of the insulating material to be tested. Since the structure has been fixed, the inner diameter of the shell and the diameter of the inner conductive thin wire are fixed, so D _k can be calculated. The long and short fixtures were tested simultaneously as a repeated verification experiment, and no de-embedding was required.

在TDR设备完成校准之后，接上通用同轴连接器，在不接入夹具时记录波形。将夹具接入时，再次记录测试波形，图9是根据本实施例的测试波形的示意图，如图9所示，,对不重合段的波形取均值(虚线框所示)，作为夹具的阻抗。根据外壳内径的大小，中间导体细线的直径以及该阻抗值进行D _k的计算。 After the TDR device has been calibrated, the universal coaxial connector is attached and the waveform is recorded when the fixture is not attached. When the fixture is connected, the test waveform is recorded again. Fig. 9 is a schematic diagram of the test waveform according to the present embodiment, as shown in Fig. 9, the average value of the waveforms of the non-overlapping segments (shown in the dashed box) is used as the impedance of the fixture. . According to the size of the inner diameter of the casing, the diameter of the intermediate conductor thin line and the impedance value, the calculation of D _k is performed.

使用网络分析仪或TDR则不能开路，还是需要如图4所示的连接，测量得到***损耗，只是原理变化为根据S参数进行阻抗计算，再根据阻抗和外壳内径和内导电细线尺寸进行D _k的计算，步骤与使用TDR类似，只是多了一个步骤，就是根据S参数转换得到阻抗。 If you use a network analyzer or TDR, you can't open the circuit. You still need to connect as shown in Figure 4 to measure the insertion loss, but the principle changes to calculate the impedance according to the S parameter, and then calculate the D according to the impedance, the inner diameter of the casing and the size of the inner conductive thin wire. The calculation steps of _k are similar to those of using TDR, except that there is one more step, which is to convert the impedance according to the S parameter.

本实施例中的测试夹具还可以扩展到差分同轴线的结构上，图10是根据本可选实施例的测试夹具的示意图一，如图10所示，该测试夹具对应的k ₁＝3.3×10 ⁷,k ₂＝4.5，拓展为一对差分线，该结构也可测试S参数从而达到提取介电特性的目的，可以看作两个夹具的组合体，其具体四个接触盘的约束条件和尺寸与上述相同，测试过程和步骤也相同。而图10中的尺寸由结构件的阻抗值所决定，为达到该阻抗值该装置的横截面可以是如图10所示，图11是根据本可选实施例的测试夹具的示意图二，如图11所示，该测试夹具对应的k ₁＝3.3×10 ⁷,k ₂＝4.3，关键特征在于端口拥有一定阻抗值差分线，而其具体的结构可以通过调整导线和金属壳体的大小，以及两根内导体的相对位置来进行调整来达到所需要阻抗值。***计算方法会对差分形式的同轴结构进行调整，但是原理还是通过提取相位和***损耗来计算D _k和D _f。 The test fixture in this embodiment can also be extended to the structure of the differential coaxial line. FIG. 10 is a schematic diagram 1 of the test fixture according to this optional embodiment. As shown in FIG. 10 , the corresponding k ₁ =3.3 of the test fixture ×10 ⁷ , k ₂ =4.5, extended to a pair of differential lines, this structure can also test S-parameters to achieve the purpose of extracting dielectric properties, it can be regarded as a combination of two fixtures, the specific constraints of the four contact disks The conditions and dimensions are the same as above, as are the testing procedures and procedures. The size in FIG. 10 is determined by the impedance value of the structural member. In order to achieve the impedance value, the cross section of the device can be as shown in FIG. 10 , and FIG. 11 is a schematic diagram 2 of a test fixture according to this optional embodiment. As shown in Figure 11, the test fixture corresponds to k ₁ =3.3×10 ⁷ , k ₂ =4.3. The key feature is that the port has a differential line with a certain impedance value, and its specific structure can be adjusted by adjusting the size of the wire and the metal shell. And the relative position of the two inner conductors can be adjusted to achieve the required impedance value. The system calculation method adjusts the coaxial structure in differential form, but the principle is to calculate _Dk and _Df by extracting the phase and insertion loss.

图12是根据本可选实施例的测试夹具的示意图三，如图12所示，还可以通过卡扣、螺丝槽或者是固定片来实现装配的目的，采用区域标识的螺丝槽来实现固定的方案，即放入样品之后盖上图12所示上半部分再通过螺丝进行装配和固定。图13是根据本可选实施例的测试夹具的示意图四，如图13所示，螺丝槽的数量可以很多种，同时装配可以是一半和另一半对接，也可以四分之一和四分之一组装，目的都是为了达到组装构成传输线结构。另外也可以通过固定片或者卡扣来实现装配的目的。Fig. 12 is a schematic diagram 3 of a test fixture according to this optional embodiment. As shown in Fig. 12, the purpose of assembling can also be achieved by means of a buckle, a screw slot or a fixing piece, and a screw slot marked with a region is used to realize the fixing. The solution is to cover the upper part shown in Figure 12 after placing the sample, and then assemble and fix it with screws. Fig. 13 is a schematic diagram of a test fixture according to this optional embodiment 4. As shown in Fig. 13, the number of screw slots can be various, and the assembly can be half and the other half butt, or quarter and quarter Once assembled, the purpose is to assemble the transmission line structure. In addition, the purpose of assembling can also be achieved by fixing sheets or snaps.

如图14、15、16所示，测试夹具对应的k ₁＝3.4×10 ⁷,k ₂＝4，除了测试同轴线外，还可以扩展到所有传输线类型中，可以设计为除同轴线结构外的其他结构，还可以延展到差分线对中。其具体的尺寸都可以通过调整来达到不同阻抗值的目的，这里便不在一一举例。 As shown in Figures 14, 15 and 16, the corresponding k ₁ =3.4×10 ⁷ , k ₂ =4 of the test fixture can be extended to all types of transmission lines in addition to testing coaxial cables, and can be designed to be in addition to coaxial cables Other structures outside the structure can also be extended to differential line pairs. Its specific dimensions can be adjusted to achieve the purpose of different impedance values, which will not be listed here.

本实施例中的夹具的材料可以是电导率相当导电材料，电导率≥2MS/m。在样品和夹具中间充当填充物的种类可以很多种，满足介电性能相近、绝缘和润滑作用即可。The material of the fixture in this embodiment can be a material with a relatively conductive conductivity, and the conductivity is greater than or equal to 2MS/m. There are many types of fillers between the sample and the fixture, as long as the dielectric properties are similar, insulation and lubrication are required.

根据本公开的另一个实施例，还提供了一种线缆参数确定装置，图17是根据本实施例的线缆参数确定装置的框图，如图17所示，所述装置包括：According to another embodiment of the present disclosure, an apparatus for determining a cable parameter is also provided. FIG. 17 is a block diagram of the apparatus for determining a cable parameter according to this embodiment. As shown in FIG. 17 , the apparatus includes:

获取模块172，设置为获取测试夹具中待测线缆的散射参数，或者获取测试夹具中待测线缆的反射系数；The acquiring module 172 is configured to acquire the scattering parameter of the cable to be tested in the test fixture, or acquire the reflection coefficient of the cable to be tested in the test fixture;

确定模块174，设置为根据所述散射参数或所述反射系数确定所述待测线缆中绝缘材料的介电常数和损耗因子。The determining module 174 is configured to determine the dielectric constant and loss factor of the insulating material in the cable to be tested according to the scattering parameter or the reflection coefficient.

在一示例性实施例中，所述确定模块174包括：In an exemplary embodiment, the determining module 174 includes:

第一确定子模块，设置为在获取的是散射参数的前反馈下，根据所述散射参数提取所述待测线缆的相位角与***损耗，并根据所述相位角与所述***损耗确定所述待测线缆中绝缘材料的介电常数和损耗因子；或者The first determination sub-module is configured to extract the phase angle and insertion loss of the cable to be tested according to the scattering parameters under the forward feedback of the obtained scattering parameters, and determine the phase angle and the insertion loss according to the phase angle and the insertion loss. The dielectric constant and dissipation factor of the insulating material in the cable under test; or

第二确定子模块，设置为在获取的是反射系数的情况下，根据所述反射系数确定所述待测线缆中绝缘材料的介电常数，并根据所述介电常数确定所述绝缘材料的损耗因子。The second determination sub-module is configured to determine the dielectric constant of the insulating material in the cable under test according to the reflection coefficient, and determine the insulating material according to the dielectric constant under the condition that the acquired reflection coefficient is obtained. loss factor.

本公开的实施例还提供了一种计算机可读存储介质，该计算机可读存储介质中存储有计算机程序，其中，该计算机程序被设置为运行时执行上述任一项方法实施例中的步骤。Embodiments of the present disclosure also provide a computer-readable storage medium, where a computer program is stored in the computer-readable storage medium, wherein the computer program is configured to execute the steps in any one of the above method embodiments when running.

在一个示例性实施例中，上述计算机可读存储介质可以包括但不限于：U盘、只读存储器(Read-Only Memory，简称为ROM)、随机存取存储器(Random Access Memory，简称为RAM)、移动硬盘、磁碟或者光盘等各种可以存储计算机程序的介质。In an exemplary embodiment, the above-mentioned computer-readable storage medium may include, but is not limited to, a USB flash drive, a read-only memory (Read-Only Memory, referred to as ROM for short), and a random access memory (Random Access Memory, referred to as RAM for short) , mobile hard disk, magnetic disk or CD-ROM and other media that can store computer programs.

本公开的实施例还提供了一种电子装置，包括存储器和处理器，该存储器中存储有计算机程序，该处理器被设置为运行计算机程序以执行上述任一项方法实施例中的步骤。An embodiment of the present disclosure also provides an electronic device, including a memory and a processor, where a computer program is stored in the memory, and the processor is configured to run the computer program to execute the steps in any one of the above method embodiments.

在一个示例性实施例中，上述电子装置还可以包括传输设备以及输入输出设备，其中，该传输设备和上述处理器连接，该输入输出设备和上述处理器连接。In an exemplary embodiment, the above-mentioned electronic device may further include a transmission device and an input-output device, wherein the transmission device is connected to the above-mentioned processor, and the input-output device is connected to the above-mentioned processor.

本实施例中的具体示例可以参考上述实施例及示例性实施方式中所描述的示例，本实施例在此不再赘述。For specific examples in this embodiment, reference may be made to the examples described in the foregoing embodiments and exemplary implementation manners, and details are not described herein again in this embodiment.

显然，本领域的技术人员应该明白，上述的本公开的各模块或各步骤可以用通用的计算装置来实现，它们可以集中在单个的计算装置上，或者分布在多个计算装置所组成的网络上，它们可以用计算装置可执行的程序代码来实现，从而，可以将它们存储在存储装置中由计算装置来执行，并且在某些情况下，可以以不同于此处的顺序执行所示出或描述的步骤，或者将它们分别制作成各个集成电路模块，或者将它们中的多个模块或步骤制作成单个集成电路模块来实现。这样，本公开不限制于任何特定的硬件和软件结合。Obviously, those skilled in the art should understand that the above-mentioned modules or steps of the present disclosure can be implemented by a general-purpose computing device, and they can be centralized on a single computing device or distributed in a network composed of multiple computing devices On the other hand, they can be implemented in program code executable by a computing device, so that they can be stored in a storage device and executed by the computing device, and in some cases, can be performed in a different order than shown here. Or the described steps, or they are respectively made into individual integrated circuit modules, or a plurality of modules or steps in them are made into a single integrated circuit module to realize. As such, the present disclosure is not limited to any particular combination of hardware and software.

以上所述仅为本公开的优选实施例而已，并不用于限制本公开，对于本领域的技术人员来说，本公开可以有各种更改和变化。凡在本公开的原则之内，所作的任何修改、等同替换、改进等，均应包含在本公开的保护范围之内。The above descriptions are only preferred embodiments of the present disclosure, and are not intended to limit the present disclosure. For those skilled in the art, the present disclosure may have various modifications and changes. Any modification, equivalent replacement, improvement, etc. made within the principles of the present disclosure shall be included within the protection scope of the present disclosure.

Claims

一种线缆参数确定***，包括：测试设备、测试夹具、处理器，其中，A cable parameter determination system, comprising: testing equipment, a testing fixture, and a processor, wherein,

所述测试设备，用于获取所述测试夹具中待测线缆的散射参数，或者获取所述测试夹具中所述待测线缆的反射系数；The test equipment is used to obtain the scattering parameter of the cable under test in the test fixture, or obtain the reflection coefficient of the cable under test in the test fixture;

所述处理器，用于根据所述散射参数或所述反射系数确定所述待测线缆中绝缘材料的介电常数和损耗因子。The processor is configured to determine the dielectric constant and loss factor of the insulating material in the cable to be tested according to the scattering parameter or the reflection coefficient.
根据权利要求1所述的***，其中，The system of claim 1, wherein,

所述处理器，还用于根据所述散射参数提取所述待测线缆的相位角与***损耗，并根据所述相位角与所述***损耗确定所述待测线缆中绝缘材料的介电常数和损耗因子；或者The processor is further configured to extract the phase angle and insertion loss of the cable under test according to the scattering parameter, and determine the dielectric properties of the insulating material in the cable under test according to the phase angle and the insertion loss. electric constant and dissipation factor; or

根据所述反射系数确定所述待测线缆中绝缘材料的介电常数，并根据所述介电常数确定所述绝缘材料的损耗因子。The dielectric constant of the insulating material in the cable to be tested is determined according to the reflection coefficient, and the loss factor of the insulating material is determined according to the dielectric constant.
根据权利要求2所述的***，其中，The system of claim 2, wherein,

所述处理器，还用于通过以下方式根据所述相位角确定所述介电常数：The processor is further configured to determine the dielectric constant according to the phase angle in the following manner:

其中，D _k位所述介电常数，c为真空中的光速，f为测试频率，φ为所述测试频率下的相位角，所述测试夹具包括所述第一夹具与所述第二夹具，L为所述第一夹具与所述第二夹具的长度差； Wherein, D _k is the dielectric constant, c is the speed of light in vacuum, f is the test frequency, φ is the phase angle at the test frequency, and the test fixture includes the first fixture and the second fixture , L is the length difference between the first clamp and the second clamp;

通过以下方式根据所述介电常数与所述***损耗确定所述损耗因子：The loss factor is determined from the dielectric constant and the insertion loss by:

其中，D _f为所述损耗因子，Loss _Total为总损耗，k ₁、k ₂为常数，Z ₁为所述待测线缆的端口阻抗，ρ _resistance为所述绝缘材料的电阻率。 Wherein, D _f is the loss factor, Loss _Total is the total loss, k ₁ and k ₂ are constants, Z ₁ is the port impedance of the cable to be tested, and ρ _resistance is the resistivity of the insulating material.
根据权利要求2所述的***，其中，The system of claim 2, wherein,

所述处理器，还用于通过以下方式根据所述反射系数确定所述测试夹具中待测线缆的线缆阻抗；The processor is further configured to determine the cable impedance of the cable to be tested in the test fixture according to the reflection coefficient in the following manner;

其中，Z ₂为所述线缆阻抗，ρ为反射系数，Z ₀为固定值； Wherein, Z ₂ is the cable impedance, ρ is the reflection coefficient, and Z ₀ is a fixed value;

获取所述待测夹具的外壳内径以及所述待测线缆内中间导体的导体直径，并通过以下方式根据所述线缆阻抗、所述外壳内径以及所述导体直径确定所述绝缘材料的介电常数：Obtain the inner diameter of the shell of the fixture to be tested and the conductor diameter of the intermediate conductor in the cable to be tested, and determine the dielectric of the insulating material according to the impedance of the cable, the inner diameter of the shell and the diameter of the conductor in the following manner: Electric constant:

其中，D _k为所述介电常数，r _a为所述导体直径，r _b为所述外壳内径，μ _r为1，μ ₀为真空中的介电常数，ε ₀为真空中的磁导率。 Wherein, D _k is the dielectric constant, _{ra is the diameter of the conductor, r b} _is the inner diameter of the shell, μ _r is 1, μ ₀ is the dielectric constant in vacuum, ε ₀ is the magnetic permeability in vacuum Rate.
根据权利要求4所述的***，其中，The system of claim 4, wherein,

所述测试设备，还用于获取所述待测线缆的***损耗，其中，所述测试设备为网络分析仪或时域反射计；The test equipment is also used to obtain the insertion loss of the cable to be tested, wherein the test equipment is a network analyzer or a time domain reflectometer;

所述处理器，还用于通过以下方式根据所述介电常数、所述线缆阻抗以及所述***损耗确定所述损耗因子：The processor is further configured to determine the loss factor according to the dielectric constant, the cable impedance, and the insertion loss in the following manner:

其中，D _f为所述损耗因子，Loss _Total为所述***损耗，k ₁、k ₂为常数，ρ _resistance为所述绝缘材料的电阻率。 Wherein, D _f is the loss factor, Loss _Total is the insertion loss, k ₁ and k ₂ are constants, and ρ _resistance is the resistivity of the insulating material.
根据权利要求3或5所述的***，其中，A system according to claim 3 or 5, wherein,

所述处理器，还用于获取所述待测线缆的导体损耗，并根据所述介电常数、所述导体损耗以及所述***损耗确定所述损耗因子。The processor is further configured to acquire the conductor loss of the cable to be tested, and determine the loss factor according to the dielectric constant, the conductor loss and the insertion loss.
根据权利要求1或2所述的***，其中，The system of claim 1 or 2, wherein,

所述测试设备为网络分析仪，所述网络分析仪，用于分别获取第一夹具中待测线缆的第一散射参数和第二夹具中所述待测线缆的第二散射参数，根据所述第一散射参数和所述第二散射参数进行去嵌入操作，得到所述待测线缆的散射参数，其中，所述测试夹具包括所述第一夹具与所述第二夹具，所述第一夹具的长度大于所述第二夹具的长度，所述网络分析仪分别与所述第一夹具、所述第二夹具的两端连接；或者The test equipment is a network analyzer, and the network analyzer is used to obtain the first scattering parameter of the cable to be tested in the first fixture and the second scattering parameter of the cable to be tested in the second fixture, respectively, according to The first scattering parameter and the second scattering parameter are de-embedded to obtain the scattering parameter of the cable to be tested, wherein the test fixture includes the first fixture and the second fixture, and the test fixture includes the first fixture and the second fixture. The length of the first fixture is greater than the length of the second fixture, and the network analyzer is respectively connected to both ends of the first fixture and the second fixture; or

所述测试设备为时域反射计，其中，所述时域反射计用于获取所述待测线缆的反射系数，所述时域反射计通过测试件与所述测试夹具的一端连接，所述测试夹具的另一端处于开路状态。The test equipment is a time domain reflectometer, wherein the time domain reflectometer is used to obtain the reflection coefficient of the cable to be tested, and the time domain reflectometer is connected to one end of the test fixture through a test piece, so The other end of the test fixture is open.
根据权利要求1所述的***，其中，The system of claim 1, wherein,

所述测试夹具包括第一圆盘、第二圆盘，所述第一圆盘与所述第二圆盘通过导电外壳连接，所述待测线缆设置于所述导电外壳内部，所述待测线缆内部设置有中间导体。The test fixture includes a first disk and a second disk, the first disk and the second disk are connected through a conductive shell, the cable to be tested is arranged inside the conductive shell, and the to-be-tested cable is arranged inside the conductive shell. There is an intermediate conductor inside the measuring cable.
根据权利要求8所述的***，其中，The system of claim 8, wherein,

所述第一圆盘、所述第二圆盘以及所述导电外壳为一体成型结构。The first disc, the second disc and the conductive shell are integrally formed.
根据权利要求8所述的***，其中，The system of claim 8, wherein,

所述第一圆盘、所述第二圆盘以及所述导电外壳为分体成型结构，其中，所述分体成型结构包括第一组件与第二组件，其中，所述第一组件与所述第二组件通过固定件固定形成所述测试夹具。The first disc, the second disc, and the conductive shell are a separate molding structure, wherein the separate molding structure includes a first component and a second component, wherein the first component and the The second component is fixed by a fixing member to form the test fixture.
根据权利要求8所述的***，其中，所述中间导体为一个或多个。9. The system of claim 8, wherein the intermediate conductor is one or more.
根据权利要求8所述的***，其中，所述中间导体为圆柱体、长方体、正方体、六面体。The system of claim 8, wherein the intermediate conductor is a cylinder, a rectangular parallelepiped, a cube, or a hexahedron.
根据权利要求8所述的***，其中，The system of claim 8, wherein,

所述测试设备通过测试件与所述测试夹具连，所述第一圆盘与所述第二圆盘上设置有通孔，其中，所述第一圆盘上的通孔用于固定连接所述测试件与所述第一圆盘，所述第二圆盘上的通孔用于固定连接所述测试件与所述第二圆盘，所述通孔为一个或多个。The test equipment is connected to the test fixture through a test piece, and through holes are provided on the first disk and the second disk, wherein the through holes on the first disk are used for fixedly connecting the test fixture. The test piece and the first disc, the through holes on the second disc are used for fixedly connecting the test piece and the second disc, and the through holes are one or more.
根据权利要求8至13中任一项所述的***，其中，A system according to any one of claims 8 to 13, wherein,

所述测试夹具由电导率大于或等于第一预设阈值的导电材料制成。The test fixture is made of a conductive material with a conductivity greater than or equal to a first preset threshold.
根据权利要求8至13中任一项所述的***，其中，A system according to any one of claims 8 to 13, wherein,

所述待测线缆与所述导电外壳之间通过填充物密封，其中，所述填充物的介电性能与所述绝缘材料的介电性能的差值小于第二预设阈值。The cable to be tested and the conductive shell are sealed by a filler, wherein the difference between the dielectric properties of the filler and the dielectric properties of the insulating material is less than a second preset threshold.
一种线缆参数确定方法，所述方法包括：A method for determining a cable parameter, the method comprising:

获取测试夹具中待测线缆的散射参数，或者获取所述测试夹具中所述待测线缆的反射系数；Obtain the scattering parameter of the cable under test in the test fixture, or obtain the reflection coefficient of the cable under test in the test fixture;

根据所述散射参数或所述反射系数确定所述待测线缆中绝缘材料的介电常数和损耗因子。The dielectric constant and loss factor of the insulating material in the cable to be tested are determined according to the scattering parameter or the reflection coefficient.
根据权利要求16所述的方法，其中，根据所述散射参数或所述反射系数确定所述待测线缆中绝缘材料的介电常数和损耗因子包括：The method according to claim 16, wherein determining the dielectric constant and loss factor of the insulating material in the cable under test according to the scattering parameter or the reflection coefficient comprises:

根据所述散射参数提取所述待测线缆的相位角与***损耗，并根据所述相位角与所述***损耗确定所述待测线缆中绝缘材料的介电常数和损耗因子；或者Extract the phase angle and insertion loss of the cable under test according to the scattering parameter, and determine the dielectric constant and loss factor of the insulating material in the cable under test according to the phase angle and the insertion loss; or

根据所述反射系数确定所述待测线缆中绝缘材料的介电常数，并根据所述介电常数确定所述绝缘材料的损耗因子。The dielectric constant of the insulating material in the cable to be tested is determined according to the reflection coefficient, and the loss factor of the insulating material is determined according to the dielectric constant.
根据权利要求17所述的方法，其中，根据所述相位角与所述***损耗确定所述待测线缆中绝缘材料的介电常数和损耗因子包括：The method according to claim 17, wherein determining the dielectric constant and loss factor of the insulating material in the cable under test according to the phase angle and the insertion loss comprises:

通过以下方式根据所述相位角确定所述介电常数：The dielectric constant is determined from the phase angle by:

其中，D _k位所述介电常数，c为真空中的光速，f为测试频率，φ为所述测试频率下的相位角，所述测试夹具包括所述第一夹具与所述第二夹具，L为所述第一夹具与所述第二夹具的长度差； Wherein, D _k is the dielectric constant, c is the speed of light in vacuum, f is the test frequency, φ is the phase angle at the test frequency, and the test fixture includes the first fixture and the second fixture , L is the length difference between the first clamp and the second clamp;

通过以下方式根据所述介电常数与所述***损耗确定所述损耗因子：The loss factor is determined from the dielectric constant and the insertion loss by:

其中，D _f为所述损耗因子，Loss _Total为总损耗，k ₁、k ₂为常数，Z ₁为所述待测线缆的端口阻抗，ρ _resistance为所述绝缘材料的电阻率。 Wherein, D _f is the loss factor, Loss _Total is the total loss, k ₁ and k ₂ are constants, Z ₁ is the port impedance of the cable to be tested, and ρ _resistance is the resistivity of the insulating material.
根据权利要求17所述的方法，其中，根据所述反射系数确定所述待测线缆中绝缘材料的介电常数包括：The method according to claim 17, wherein determining the dielectric constant of the insulating material in the cable under test according to the reflection coefficient comprises:

通过以下方式根据所述反射系数确定所述测试夹具中待测线缆的线缆阻抗；Determine the cable impedance of the cable to be tested in the test fixture according to the reflection coefficient in the following manner;

其中，Z ₂为所述线缆阻抗，ρ为反射系数，Z ₀为固定值； Wherein, Z ₂ is the cable impedance, ρ is the reflection coefficient, and Z ₀ is a fixed value;

获取所述待测夹具的外壳内径以及所述待测线缆内中间导体的导体直径；Obtain the inner diameter of the shell of the fixture to be tested and the conductor diameter of the intermediate conductor in the cable to be tested;

通过以下方式根据所述线缆阻抗、所述外壳内径以及所述导体直径确定所述绝缘材料的介电常数：The dielectric constant of the insulating material is determined from the cable impedance, the housing inner diameter, and the conductor diameter by:

其中，D _k为所述介电常数，r _a为所述导体直径，r _b为所述外壳内径，μ _r为1，μ ₀为真空中的介电常数，ε ₀为真空中的磁导率。 Wherein, D _k is the dielectric constant, _{ra is the diameter of the conductor, r b} _is the inner diameter of the shell, μ _r is 1, μ ₀ is the dielectric constant in vacuum, ε ₀ is the magnetic permeability in vacuum Rate.
根据权利要求19所述的方法，其中，根据所述介电常数确定所述绝缘材料的损耗因子包括：20. The method of claim 19, wherein determining the dissipation factor of the insulating material based on the dielectric constant comprises:

通过网络分析仪或时域反射计获取所述待测线缆的***损耗；Obtain the insertion loss of the cable under test through a network analyzer or a time domain reflectometer;

通过以下方式根据所述介电常数、所述线缆阻抗以及所述***损耗确定所述损耗因子：The loss factor is determined from the dielectric constant, the cable impedance, and the insertion loss by:

其中，D _f为所述损耗因子，Loss _Total为所述***损耗，k ₁、k ₂为常数，ρ _resistance为所述绝缘材料的电阻率。 Wherein, D _f is the loss factor, Loss _Total is the insertion loss, k ₁ and k ₂ are constants, and ρ _resistance is the resistivity of the insulating material.
根据权利要求16或17所述的方法，其中，A method according to claim 16 or 17, wherein,

所述获取测试夹具中待测线缆的散射参数包括：The obtaining of the scattering parameters of the cable to be tested in the test fixture includes:

通过网络分析仪获取第一夹具中待测线缆的第一散射参数和第二夹具中所述待测线缆的第二散射参数，根据所述第一散射参数和所述第二散射参数进行去嵌入操作，得到所述待测线缆的散射参数，其中，所述第一夹具的长度大于所述第二夹具的长度，所述测试夹具包括所述第一夹具与所述第二夹具；Obtain the first scattering parameter of the cable under test in the first fixture and the second scattering parameter of the cable under test in the second fixture through the network analyzer, and perform the The de-embedding operation is performed to obtain the scattering parameters of the cable to be tested, wherein the length of the first fixture is greater than the length of the second fixture, and the test fixture includes the first fixture and the second fixture;

所述获取测试夹具中待测线缆的反射系数包括：The acquisition of the reflection coefficient of the cable to be tested in the test fixture includes:

通过时域反射计获取所述测试夹具中所述待测线缆的反射系数。The reflection coefficient of the cable to be tested in the test fixture is obtained by a time domain reflectometer.
一种线缆参数确定装置，所述装置包括：A cable parameter determination device, the device includes:

获取模块，设置为获取测试夹具中待测线缆的散射参数，或者获取测试夹具中待测线缆的反射系数；an acquisition module, configured to acquire the scattering parameters of the cable to be tested in the test fixture, or to acquire the reflection coefficient of the cable to be tested in the test fixture;

确定模块，设置为根据所述散射参数或所述反射系数确定所述待测线缆中绝缘材料的介电常数和损耗因子。A determination module, configured to determine the dielectric constant and loss factor of the insulating material in the cable to be tested according to the scattering parameter or the reflection coefficient.
一种计算机可读的存储介质，所述存储介质中存储有计算机程序，其中，所述计算机程序被设置为运行时执行所述权利要求16至21任一项中所述的方法。A computer-readable storage medium in which a computer program is stored, wherein the computer program is configured to execute the method of any one of claims 16 to 21 when run.
一种电子装置，包括存储器和处理器，所述存储器中存储有计算机程序，所述处理器被设置为运行所述计算机程序以执行所述权利要求16至21任一项中所述的方法。An electronic device comprising a memory and a processor having a computer program stored in the memory, the processor being arranged to run the computer program to perform the method of any one of claims 16 to 21.