内置电容器的检测方法、装置、检测设备和存储介质Detection method, device, detection device and storage medium of built-in capacitor
技术领域technical field
本发明涉及检测技术领域,尤其涉及一种内置电容器的检测方法、装置、检测设备和存储介质。The present invention relates to the technical field of detection, and in particular, to a detection method, device, detection device and storage medium of a built-in capacitor.
背景技术Background technique
目前,大多数芯片的外部引脚都会在芯片内部采用电容器连接,以实现芯片引脚的滤波性能。At present, the external pins of most chips are connected with capacitors inside the chip to achieve the filtering performance of the chip pins.
为了确保芯片在生产过程中没有漏贴或错贴电容器,需要依据芯片设计图对芯片引脚对应的内置电容器进行检测。现有电容器测试技术多采用振荡电路,通过测谐振频率得出电容大小,进而判断芯片的内置电容器是否正确粘贴。In order to ensure that no capacitors are missed or incorrectly attached during the production process of the chip, the built-in capacitors corresponding to the chip pins need to be tested according to the chip design drawing. Existing capacitor testing technologies mostly use oscillating circuits, and the size of the capacitor is obtained by measuring the resonant frequency, and then it is judged whether the built-in capacitor of the chip is correctly pasted.
然而,此种检测方式对芯片的内置电容器的单次检测需要耗费较长的时间,且成本较高,无法实现芯片量产阶段的内置电容器检测。However, the single-time detection of the built-in capacitor of the chip takes a long time, and the cost is high, and the built-in capacitor detection in the stage of mass production of the chip cannot be realized.
发明内容SUMMARY OF THE INVENTION
有鉴于此,本发明实施例提供一种内置电容器的检测方法、装置、检测设备和存储介质,以实现芯片量产阶段的内置电容器检测。In view of this, embodiments of the present invention provide a detection method, device, detection device, and storage medium for a built-in capacitor, so as to realize the built-in capacitor detection in the stage of chip mass production.
第一方面,本发明实施例提供了一种内置电容器的检测方法,包括:In a first aspect, an embodiment of the present invention provides a method for detecting a built-in capacitor, including:
获取各待检测通道的充电电流值,其中,待检测芯片的内置电容器通过所述待检测芯片的引脚与至少一个待检测通道相连;acquiring the charging current value of each channel to be detected, wherein the built-in capacitor of the chip to be detected is connected to at least one channel to be detected through the pins of the chip to be detected;
分别控制各待检测通道采用对应的充电电流值向所连接的内置电容器充 电,并获取各内置电容器的检测电压值;Control each channel to be detected separately to charge the connected built-in capacitor with the corresponding charging current value, and obtain the detected voltage value of each built-in capacitor;
根据各充电电流值和各检测电压值确定所述待检测芯片的各内置电容器是否正确安装,生成检测结果。According to each charging current value and each detection voltage value, it is determined whether each built-in capacitor of the to-be-detected chip is correctly installed, and a detection result is generated.
第二方面,本发明实施例提供了一种内置电容器的检测装置,包括:In a second aspect, an embodiment of the present invention provides a detection device with a built-in capacitor, including:
电流获取模块,用于获取各待检测通道的充电电流值,其中,待检测芯片的内置电容器通过所述待检测芯片的引脚与至少一个待检测通道相连;a current acquisition module for acquiring the charging current value of each channel to be detected, wherein the built-in capacitor of the chip to be detected is connected to at least one channel to be detected through the pins of the chip to be detected;
电压检测模块,用于分别控制各待检测通道采用对应的充电电流值向所连接的内置电容器充电,并获取各内置电容器的检测电压值;The voltage detection module is used to separately control each channel to be detected to charge the connected built-in capacitor with the corresponding charging current value, and obtain the detected voltage value of each built-in capacitor;
结果生成模块,用于根据各充电电流值和各检测电压值确定所述待检测芯片的各内置电容器是否正确安装,生成检测结果。The result generating module is configured to determine whether each built-in capacitor of the to-be-detected chip is correctly installed according to each charging current value and each detection voltage value, and generate a detection result.
第三方面,本发明实施例提供了一种检测设备,包括:In a third aspect, an embodiment of the present invention provides a detection device, including:
一个或多个处理器;one or more processors;
存储器,用于存储一个或多个程序,memory for storing one or more programs,
当所述一个或多个程序被所述一个或多个处理器执行,使得所述一个或多个处理器实现如本发明实施例所述的内置电容器的检测装置方法。When the one or more programs are executed by the one or more processors, the one or more processors implement the method for detecting a built-in capacitor according to the embodiment of the present invention.
第四方面,本发明实施例还提供了一种计算机可读存储介质,其上存储有计算机程序,该程序被处理器执行时实现如本发明实施例所述的内置电容器的检测装置方法。In a fourth aspect, an embodiment of the present invention further provides a computer-readable storage medium storing a computer program thereon, and when the program is executed by a processor, the method for detecting a built-in capacitor according to the embodiment of the present invention is implemented.
在上述检测内置电容器的技术方案中,获取待检测芯片的各内置电容器通过待检测芯片的引脚所连接的待检测通道的充电电流值,分别采用各待检测通道的充电电流值向相应待检测通道所连接的内置电容器进行充电,并获取各内置电容器的检测电压值,进而根据各内置电容器的充电电流值和充电电压值确定待检测芯片的各内置电容器是否正确安装,生成检测结果。本发明实施例通 过采用上述技术方案,无需使用振荡电路即可检测内置电容器的电容值,并可以实现内置待检测芯片各内置电容器的并行检测,能够缩短待检测芯片内置电容器检测所耗费的时间,提高内置电容器的检测效率,从而实现待检测芯片量产阶段的内置电容器检测。In the above technical solution for detecting built-in capacitors, the charging current values of the channels to be detected to which the built-in capacitors of the chips to be detected are connected through the pins of the chips to be detected are obtained, and the charging current values of the channels to be detected are respectively used to transfer the charging current values of the channels to be detected to the corresponding channels to be detected. The built-in capacitor connected to the channel is charged, and the detection voltage value of each built-in capacitor is obtained, and then according to the charging current value and charging voltage value of each built-in capacitor, it is determined whether each built-in capacitor of the chip to be tested is correctly installed, and the detection result is generated. By adopting the above technical solution, the embodiment of the present invention can detect the capacitance value of the built-in capacitor without using an oscillation circuit, and can realize the parallel detection of each built-in capacitor of the built-in to-be-detected chip, which can shorten the time spent in detecting the built-in capacitor of the to-be-detected chip. The detection efficiency of the built-in capacitor is improved, so as to realize the built-in capacitor detection in the mass production stage of the chip to be tested.
附图说明Description of drawings
通过阅读参照以下附图所作的对非限制性实施例所作的详细描述,本发明的其它特征、目的和优点将会变得更明显:Other features, objects and advantages of the present invention will become more apparent by reading the detailed description of non-limiting embodiments made with reference to the following drawings:
图1为本发明实施例一提供的一种内置电容器的检测方法的流程示意图;1 is a schematic flowchart of a method for detecting a built-in capacitor according to Embodiment 1 of the present invention;
图2为本发明实施例二提供的一种内置电容器的检测方法的流程示意图;2 is a schematic flowchart of a method for detecting a built-in capacitor according to Embodiment 2 of the present invention;
图3为本发明实施例三提供的一种内置电容器的检测装置的结构框图;3 is a structural block diagram of a detection device with a built-in capacitor provided in Embodiment 3 of the present invention;
图4为本发明实施例四提供的一种检测设备的结构示意图。FIG. 4 is a schematic structural diagram of a detection device according to Embodiment 4 of the present invention.
具体实施方式Detailed ways
下面结合附图和实施例对本发明作进一步的详细说明。可以理解的是,此处所描述的具体实施例仅仅用于解释本发明,而非对本发明的限定。另外还需要说明的是,为了便于描述,附图中仅示出了与本发明相关的部分而非全部内容。此外,在不冲突的情况下,本发明中的实施例及实施例中的特征可以相互组合。The present invention will be further described in detail below in conjunction with the accompanying drawings and embodiments. It should be understood that the specific embodiments described herein are only used to explain the present invention, but not to limit the present invention. In addition, it should be noted that, for the convenience of description, the drawings only show some but not all of the contents related to the present invention. Furthermore, the embodiments of the invention and the features of the embodiments may be combined with each other without conflict.
实施例一Example 1
本发明实施例一提供一种内置电容器的检测方法。该方法可以由内置电容器的检测装置执行,其中,该装置可以由软件和/或硬件实现,可集成于检测设 备中,适用于对芯片的内置电容器进行检测的场景。图1为本发明实施例一提供的一种内置电容器的检测方法的流程示意图。如图1所示,本实施例提供的内置电容器的检测方法可以包括:Embodiment 1 of the present invention provides a detection method for a built-in capacitor. The method can be performed by a detection device with a built-in capacitor, wherein the device can be implemented by software and/or hardware, can be integrated into a detection device, and is suitable for a scenario where the built-in capacitor of a chip is detected. FIG. 1 is a schematic flowchart of a method for detecting a built-in capacitor according to Embodiment 1 of the present invention. As shown in FIG. 1 , the detection method for a built-in capacitor provided in this embodiment may include:
S110、获取各待检测通道的充电电流值,其中,待检测芯片的内置电容器通过所述待检测芯片的引脚与至少一个待检测通道相连。S110. Acquire the charging current value of each channel to be detected, wherein the built-in capacitor of the chip to be detected is connected to at least one channel to be detected through the pins of the chip to be detected.
其中,充电电流值可以理解为在对内置电容器进行检测时各测试通道需要向其所连接的内置电容器输入的电流的电流值。待检测芯片可以理解为需要对其内置电容器进行检测的芯片,如量产得到的芯片。待检测通道可以为本次检测需要开启的检测通道,不同待检测通道连接待检测芯片的不同引脚,各待检测通道所连接的引脚可以为同一待检测芯片的引脚,也可以为不同待检测芯片的引脚,即检测设备可以每次仅对一个待检测芯片的内置电容器进行检测,也可以对不同待检测芯片的内置电容器进行检测,具体可视实际检测需求以及待检测芯片需要检测的内置电容器的数量而定,如当需要检测的待检测芯片数量较多,且各个待检测芯片需要检测的内置电容器的数量较少(如不超过180个)时,可以同时对多个待检测芯片进行检测;当需要检测的待检测芯片的数量较少或各待检测芯片需要检测的内置电容器的数量较多(如大于300个)时,可以每次仅对一个待检测芯片进行检测。The charging current value can be understood as the current value of the current that each test channel needs to input to the built-in capacitor connected to the built-in capacitor when the built-in capacitor is detected. The chip to be tested can be understood as a chip whose built-in capacitor needs to be tested, such as a chip obtained by mass production. The channel to be detected can be the detection channel that needs to be turned on for this detection. Different channels to be detected are connected to different pins of the chip to be detected. The pins connected to each channel to be detected can be the pins of the same chip to be detected, or they can be different. The pins of the chip to be tested, that is, the testing equipment can test the built-in capacitors of only one chip to be tested at a time, or can test the built-in capacitors of different chips to be tested, depending on the actual testing requirements and the needs of the chips to be tested The number of built-in capacitors depends on the number of built-in capacitors. For example, when the number of chips to be tested is large, and the number of built-in capacitors to be tested for each chip to be tested is small (for example, no more than 180), multiple The chips are tested; when the number of chips to be tested to be tested is small or the number of built-in capacitors to be tested for each chip to be tested is large (eg more than 300), only one chip to be tested can be tested at a time.
在本实施例中,检测设备可以设置有多个检测通道,如检测通道的数量可以大于100或200个,又如,检测设备可以设置有360个检测通道;相应的,当对待检测芯片内的各内置电容器进行检测时,可以将各内置电容器所连接的引脚与检测设备的一个或两个检测通道相连,如当内置电容器的一端已接地时,可以将该内置电容器另一端所连接的引脚与检测设备的一个检测通道相连;当内置电容器的两端均未接地时,可以将内置电容器一端所连接的引脚与检测设 备的一个检测通道相连,并将内置电容器另一端所连接的引脚与检测设备的另一个检测通道相连。以下以内置电容器的一端已经接地为例进行说明。In this embodiment, the detection device may be provided with multiple detection channels. For example, the number of detection channels may be greater than 100 or 200. For another example, the detection device may be provided with 360 detection channels; When each built-in capacitor is detected, the pin connected to each built-in capacitor can be connected to one or two detection channels of the detection device. For example, when one end of the built-in capacitor is grounded, the pin connected to the other end of the built-in capacitor can be connected. The pin is connected to a detection channel of the detection device; when both ends of the built-in capacitor are not grounded, the pin connected to one end of the built-in capacitor can be connected to a detection channel of the detection device, and the pin connected to the other end of the built-in capacitor can be connected to a detection channel of the detection device. The pin is connected to another detection channel of the detection device. The following description is given by taking an example where one end of the built-in capacitor is grounded.
在一个实施方式中,各待检测通道的充电电流值可以由检测人员进行设置,如在将待检测芯片需要检测的各内置电容器通过内置电容器所连接的引脚连接到检测设备的不同检测通道上之后,检测人员可以通过上位机设置本次需要开启的(即本次需要进行充电的)待检测通道以及各待检测通道的充电电流值,即检测人员可以通过上位机输入各检测通道的充电电流值,上位机获取检测人员输入的检测电流值,并将其写入检测设备所配置的存储器中。其中,检测设备的存储器可以为任意类型的存储器,优选为双倍速率(Double Data Rate)同步动态随机存储器,该存储器可以与检测设备的处理器物理连接,检测设备的处理器可以为现场可编程逻辑门阵列(Field Programmable Gate Array,FPGA)。In one embodiment, the charging current value of each channel to be detected can be set by the testing personnel, for example, each built-in capacitor that needs to be detected on the chip to be detected is connected to different testing channels of the testing device through the pins connected to the built-in capacitors After that, the inspector can set the channel to be detected that needs to be turned on this time (that is to be charged this time) and the charging current value of each channel to be detected through the host computer, that is, the inspector can input the charging current of each channel through the host computer. value, the upper computer obtains the detection current value input by the inspection personnel, and writes it into the memory configured by the inspection equipment. Wherein, the memory of the detection device can be any type of memory, preferably a double-rate (Double Data Rate) synchronous dynamic random access memory, the memory can be physically connected with the processor of the detection device, and the processor of the detection device can be field programmable Logic Gate Array (Field Programmable Gate Array, FPGA).
在另一个实施方式中,各待检测通道的充电电流值可以由检测设备计算得到。此时,优选的,所述获取各待检测通道的充电电流值,包括:获取各待检测通道所连接的内置电容器的电容器参数,所述电容器参数包括理论电容值、充电电流阈值和检测电压阈值;根据预先设置的检测时间和所述电容器参数确定各待检测通道的充电电流值。In another embodiment, the charging current value of each channel to be detected can be calculated by the detection device. At this time, preferably, the acquiring the charging current value of each channel to be detected includes: acquiring capacitor parameters of the built-in capacitors connected to each channel to be detected, the capacitor parameters including theoretical capacitance value, charging current threshold value and detection voltage threshold value ; Determine the charging current value of each channel to be detected according to the preset detection time and the capacitor parameters.
其中,电容器参数可以包括内置电容器的理论电容值、充电电流阈值和检测电压值,理论电容值可以理解为内置电容器的电容的理论值,充电电流阈值可以理解为内置电容器正常工作时的电流阈值,其可以包括最大电流阈值和最小电流阈值,检测电压阈值可以理解为在本次的检测过程中电容器至少需要上升至的电压值,各内置电容器的电容器参数可以由检测人员输入到上位机中。检测时间范围可以理解为本次进行检测的检测时间,其可以为一预先设置的时 间值,也可以为一个预先设置的时间范围,以下以检测时间为预先设置的时间值为例进行说明。Among them, the capacitor parameters can include the theoretical capacitance value of the built-in capacitor, the charging current threshold value and the detection voltage value. The theoretical capacitance value can be understood as the theoretical value of the capacitance of the built-in capacitor, and the charging current threshold value can be understood as the current threshold value when the built-in capacitor is working normally. It can include the maximum current threshold and the minimum current threshold. The detection voltage threshold can be understood as the voltage value that the capacitor needs to rise to at least during this detection process. The capacitor parameters of each built-in capacitor can be input by the testing personnel into the host computer. The detection time range can be understood as the detection time of the current detection, which can be a preset time value or a preset time range. The following takes the detection time as the preset time value as an example for description.
在上述实施方式中,检测人员可以设置本次的检测时间,相应的,检测设备可以控制各内置电容器的电压值在该检测时间之内上升到合适的电压值,以进行检测,从而在达到该检测时间时,完成各内置电容器的检测,使得同一次检测时各内置电容器尽量可以同步完成检测,减少检测人员的等待时间。In the above-mentioned embodiment, the testing personnel can set the current testing time. Correspondingly, the testing equipment can control the voltage value of each built-in capacitor to rise to an appropriate voltage value within the testing time for testing, so as to reach the testing time. During the detection time, the detection of each built-in capacitor is completed, so that each built-in capacitor can complete the detection synchronously as much as possible during the same detection, and reduce the waiting time of the testing personnel.
示例性的,检测人员可以在对本次批量生产的待检测芯片进行检测之前,设置本次需要开启的待检测通道以及各待检测通道与待检测芯片各内置电容器之间的连接关系,并向上位机中输入待检测芯片的各内置电容器的电容器参数和检测时间;相应的,上位机可以将检测人员输入的本次需要开启的待检测通道的标识信息、各待检测通道所连接的内置电容器的电容器参数以及检测时间写入检测设备中;从而,检测设备可根据上位机写入的标识信息确定需要开启的待检测通道,并根据上位机写入的检测时间以及各待检测通道所连接的内置电容器的电容器参数确定该检测通道的充电电流值,如可以基于公式i
0=C
0×u
0/t
0计算得到各待检测通道的充电电流值,其中,i
0为待检测通道的充电电流值,C
0为待检测通道所连接的内置电容器的理论电容值,u
0为待检测通道所连接内置电容器的检测电压值,t
0为检测时间。
Exemplarily, the inspector can set the channels to be inspected that need to be opened this time and the connection relationship between each channel to be inspected and the built-in capacitors of the chips to be inspected before inspecting the chips to be inspected in this batch production, and move upward. Input the capacitor parameters and detection time of each built-in capacitor of the chip to be detected in the host computer; correspondingly, the host computer can input the identification information of the channel to be detected that needs to be opened this time, and the built-in capacitor connected to each channel to be detected. The capacitor parameters and detection time are written into the detection device; thus, the detection device can determine the channels to be detected that need to be opened according to the identification information written by the host computer, and according to the detection time written by the host computer and the channels connected to the channels to be detected The capacitor parameter of the built-in capacitor determines the charging current value of the detection channel. For example, the charging current value of each channel to be detected can be calculated based on the formula i 0 =C 0 ×u 0 /t 0 , where i 0 is the charging current value of the channel to be detected Current value, C 0 is the theoretical capacitance value of the built-in capacitor connected to the channel to be detected, u 0 is the detection voltage value of the built-in capacitor connected to the channel to be detected, and t 0 is the detection time.
上位机在将检测人员输入的本次需要开启的待检测通道的标识信息写入检测设备时,举例而言,检测设备内可以设置有用于记录需要开启的检测通道和不需要开启的检测通道的通道寄存器,通道寄存器中的每个比特bit对应一个检测通道,bit为1表示其对应的检测通道在检测时需要打开,bit为0表示其对应的检测通道在检测时不需要开启,从而,上位机可以将本次需要开启的待检测通道在通道寄存器中所对应的bit置为1,并将本次需要开启的非待检测通 道在通道寄存器中所对应的bit置为0。When the host computer writes the identification information of the channel to be detected that needs to be opened this time entered by the inspector into the inspection device, for example, the inspection device may be provided with a device for recording the inspection channel that needs to be opened and the inspection channel that does not need to be opened. Channel register, each bit in the channel register corresponds to a detection channel, a bit of 1 indicates that the corresponding detection channel needs to be turned on during detection, and a bit of 0 indicates that the corresponding detection channel does not need to be turned on during detection. Therefore, the upper The computer can set the corresponding bit in the channel register of the channel to be detected that needs to be turned on this time to 1, and set the bit corresponding to the channel to be detected that needs to be turned on this time in the channel register to 0.
可以理解的,由于检测人员在设置检测时间时通常会考虑内置电容器的充电电流阈值,即检测人员所设置的检测时间一般不会导致内置电容器的实际充电电流位于其正常工作时的充电电流范围之外,因此,本实施例在确定各待检测通道的充电电流值时,也可以不考虑各内置电容器的充电电流阈值,仅根据预先设置的检测时间和内置电容器的理论电容值确定各检测通道的充电电流值,此时,相应的,所述电容器参数可以仅包括理论电容值和检测电压阈值。It is understandable that the tester usually considers the charging current threshold of the built-in capacitor when setting the test time, that is, the test time set by the tester generally does not cause the actual charging current of the built-in capacitor to be within the range of the charging current during normal operation. In addition, therefore, in this embodiment, when determining the charging current value of each channel to be detected, the charging current threshold value of each built-in capacitor may not be considered, and the charging current threshold value of each built-in capacitor may be determined only according to the preset detection time and the theoretical capacitance value of the built-in capacitor. The charging current value, at this time, correspondingly, the capacitor parameter may only include the theoretical capacitance value and the detection voltage threshold value.
S120、分别控制各待检测通道采用对应的充电电流值向所连接的内置电容器充电,并获取各内置电容器的检测电压值。S120 , respectively controlling each channel to be detected to charge the connected built-in capacitor with a corresponding charging current value, and acquiring the detected voltage value of each built-in capacitor.
其中,内置电容器的检测电压值可以理解为在充电过程中检测得到的内置电容器的电压值。The detection voltage value of the built-in capacitor can be understood as the voltage value of the built-in capacitor detected during the charging process.
在本实施例中,检测设备可以并行检测各待检测通道所连接的内置电容器的检测电容,如控制各待检测通道内设置的用于向内置电容器充电的充电器件以其所属待检测通道的充电电流值向其所属待检测通道连接的内置电容器充电,并控制各待检测通道内设置的检测器件检测其所属检测通道的检测电压值。In this embodiment, the detection device can detect the detection capacitance of the built-in capacitor connected to each channel to be detected in parallel, such as controlling the charging device provided in each channel to be detected for charging the built-in capacitor with the charging of the channel to be detected to which it belongs. The current value charges the built-in capacitor connected to the to-be-detected channel to which it belongs, and controls the detection device set in each to-be-detected channel to detect the detection voltage value of the to-be-detected channel to which it belongs.
在一个实施方式中,待检测通道内设置的充电器件可以为参数测量单元(Parametric Measurement Unit,PMU),待检测通道内设置的检测器件可以为模数转换(Analogue to Digital Conversion,ADC)芯片,相应的,所述分别控制各待检测通道采用对应的充电电流值向所连接的内置电容器充电,并获取各内置电容器的检测电压值,包括:针对每个待检测通道,控制所述待检测通道内的参数测量单元采用目标电流向所述待检测通道连接的内置电容器充电,并通过所述待检测通道内的模数转换芯片周期性地检测所述内置电容器的检测电压值;其中,所述目标电流的电流值为所述待检测通道所连接的内置电容器 的充电电流值。In one embodiment, the charging device set in the channel to be detected may be a parameter measurement unit (Parametric Measurement Unit, PMU), and the detection device set in the channel to be detected may be an analog-to-digital conversion (Analogue to Digital Conversion, ADC) chip, Correspondingly, the separately controlling each channel to be detected uses the corresponding charging current value to charge the connected built-in capacitor, and acquiring the detected voltage value of each built-in capacitor includes: for each channel to be detected, controlling the channel to be detected The parameter measurement unit inside uses the target current to charge the built-in capacitor connected to the channel to be detected, and periodically detects the detected voltage value of the built-in capacitor through the analog-to-digital conversion chip in the channel to be detected; wherein, the The current value of the target current is the charging current value of the built-in capacitor connected to the channel to be detected.
在上述实施方式中,检测设备的各检测通道内可以设置有参数测量单元和模数转换芯片,某一待检测通道内的参数测量单元可以分别与其所属待检测通道内的模数转换芯片、待检测芯片的引脚以及检测设备的处理器相连;某一待检测通道内的模数转换芯片可以分别与待检测芯片的引脚以及检测设备的处理器相连。In the above embodiment, each detection channel of the detection device may be provided with a parameter measurement unit and an analog-to-digital conversion chip, and the parameter measurement unit in a certain channel to be detected may be respectively associated with the analog-to-digital conversion chip in the channel to be detected to which it belongs. The pins of the detection chip are connected to the processor of the detection device; the analog-to-digital conversion chip in a certain channel to be detected can be respectively connected to the pins of the to-be-detected chip and the processor of the detection device.
示例性的,检测设备的处理器可以同时向各待检测通道内的参数测量单元发送用于控制参数测量单元按照相应待检测通道的充电电流值对待检测通道所连接的内置电容器进行充电的充电指令;相应的,各待检测通道内的参数测量单元在接收到处理器发送的充电指令后,可以按照该充电指令对应的充电电流值向其所属待检测通道所连接的内置电容器进行充电。Exemplarily, the processor of the detection device may simultaneously send a charging instruction to the parameter measurement unit in each channel to be detected for controlling the parameter measurement unit to charge the built-in capacitor connected to the channel to be detected according to the charging current value of the corresponding channel to be detected. Correspondingly, after receiving the charging command sent by the processor, the parameter measurement unit in each channel to be detected can charge the built-in capacitor connected to the channel to be detected to which it belongs according to the charging current value corresponding to the charging command.
在本实施例中,各待检测通道可以持续向其所连接的内置电容器充电,直至内置电容器已达到其所能容纳的最大电量或接收到处理器发送的停止充电指令为止;也可以在充电时间达到预先设置的超时时间时,即停止向其所连接的内置电容器充电,此时,优选的,本实施例提供的内置电容器的检测方法还可以包括:当各内置电容器的充电时间达到预设超时时间时,控制各待检测通道停止向所连接的内置电容器充电。其中,超时时间可以由检测人员进行设置或者由检测设备根据检测人员设置的检测时间计算得到,如将超时时间设置为检测时间的设定倍数(如3倍)等;检测设备可以在某一待检测通道检测得到的检测电压值的大小或数量已经能够确定该待检测通道所连接的内置电容器是否正确安装时,即向该待检测通道发送停止充电指令,也可以在所有待检测通道检测得到的检测电压值的大小或数量均已经能够确定相应检测通道所连接的内置电容器是否正确安装时,再向各待检测通道发送停止充电指令,本实施例不 对此进行限制。In this embodiment, each channel to be detected can continue to charge the built-in capacitor connected to it until the built-in capacitor reaches the maximum power that it can hold or receives a stop charging instruction sent by the processor; When the preset timeout time is reached, the charging to the built-in capacitor connected thereto is stopped. At this time, preferably, the detection method for the built-in capacitor provided in this embodiment may further include: when the charging time of each built-in capacitor reaches the preset timeout When the time is up, control each channel to be detected to stop charging the connected built-in capacitor. Among them, the timeout time can be set by the testing personnel or calculated by the testing equipment according to the testing time set by the testing personnel, such as setting the timeout time to a set multiple (such as 3 times) of the testing time; When the size or quantity of the detection voltage value detected by the detection channel has been able to determine whether the built-in capacitor connected to the channel to be detected is correctly installed, the charging stop command is sent to the channel to be detected, or it can be detected in all channels to be detected. When the size or quantity of the detection voltage value can already determine whether the built-in capacitor connected to the corresponding detection channel is correctly installed, a charging stop command is sent to each channel to be detected, which is not limited in this embodiment.
S130、根据各充电电流值和各检测电压值确定所述待检测芯片的各内置电容器是否正确安装,生成检测结果。S130. Determine whether each built-in capacitor of the to-be-detected chip is correctly installed according to each charging current value and each detection voltage value, and generate a detection result.
在本实施例中,确定各内置电容器是否正确安装的方法可以根据需要选取,如可以通过判断某一内置电容器的电压值在一定时间长度内实际达到的第一电压值与其在该时间长度内应该达到的第二电压值之间的差值是否在一定电压范围之内,若是,则确定该内置电容器正确安装,若否,则确定该内置电容器未正确安装;也可以根据内置电容器的充电电流值和检测电压值计算该内置电容器的电容值,如果该电容值与其理论电容值在一定误差范围之内,则确定该内置电容器正确安装,若否,则确定该内置电容器未正确安装。In this embodiment, the method for determining whether each built-in capacitor is correctly installed can be selected according to needs. Whether the difference between the reached second voltage values is within a certain voltage range, if so, it is determined that the built-in capacitor is installed correctly; if not, it is determined that the built-in capacitor is not installed correctly; or according to the charging current value of the built-in capacitor Calculate the capacitance value of the built-in capacitor with the detected voltage value. If the capacitance value and its theoretical capacitance value are within a certain error range, it is determined that the built-in capacitor is installed correctly. If not, it is determined that the built-in capacitor is not installed correctly.
本发明实施例一提供的内置电容器的检测方法,获取待检测芯片的各内置电容器通过待检测芯片的引脚所连接的待检测通道的充电电流值,分别采用各待检测通道的充电电流值向相应待检测通道所连接的内置电容器进行充电,并获取各内置电容器的检测电压值,进而根据各内置电容器的充电电流值和充电电压值确定待检测芯片的各内置电容器是否正确安装,生成检测结果。本实施例通过采用上述技术方案,无需使用振荡电路即可检测内置电容器的电容值,并可以实现待检测芯片各内置电容器的并行检测,能够缩短待检测芯片内置电容器检测所耗费的时间,提高内置电容器的检测效率,从而实现待检测芯片量产阶段的内置电容器检测。In the method for detecting built-in capacitors provided in the first embodiment of the present invention, the charging current values of the channels to be detected connected to the built-in capacitors of the chips to be detected through the pins of the chips to be detected are obtained, and the charging current values of the channels to be detected are respectively used to The built-in capacitor connected to the corresponding channel to be detected is charged, and the detection voltage value of each built-in capacitor is obtained, and then according to the charging current value and charging voltage value of each built-in capacitor, it is determined whether each built-in capacitor of the chip to be detected is correctly installed, and the detection result is generated. . By adopting the above technical solution, the present embodiment can detect the capacitance value of the built-in capacitor without using an oscillation circuit, and can realize the parallel detection of each built-in capacitor of the chip to be detected, which can shorten the time spent on detecting the built-in capacitor of the chip to be detected, and improve the built-in capacitor value. The detection efficiency of the capacitor is realized, so as to realize the built-in capacitor detection in the mass production stage of the chip to be tested.
实施例二Embodiment 2
图2为本实施例提供的一种内置电容器的检测方法的流程示意图。本实施例在上述实施例的基础上,将“根据各充电电流值和各检测电压值确定所述待 检测芯片的各内置电容器是否正确安装”优化为:根据各内置电容器的充电电流值和检测电压值计算各内置电容器的检测电容值;将各内置电容的检测电容值发送给上位机,以通过所述上位机根据各检测电容值确定待检测芯片的各内置电容器是否正确安装。FIG. 2 is a schematic flowchart of a method for detecting a built-in capacitor provided in this embodiment. In this embodiment, on the basis of the above-mentioned embodiments, "determining whether each built-in capacitor of the chip to be tested is correctly installed according to each charging current value and each detection voltage value" is optimized as: according to the charging current value of each built-in capacitor and the detection The voltage value calculates the detection capacitance value of each built-in capacitor; the detection capacitance value of each built-in capacitor is sent to the upper computer, so that the upper computer determines whether each built-in capacitor of the chip to be detected is correctly installed according to each detection capacitance value.
进一步地,在所述分别控制各待检测通道采用对应的充电电流值向所连接的内置电容器充电之前,还包括:分别控制各待检测通道向所连接的内置电容器施加0V电压,以释放各内置电容器中的残存电荷。Further, before the said separately controlling each channel to be detected adopts the corresponding charging current value to charge the connected built-in capacitor, it also includes: respectively controlling each channel to be detected to apply 0V voltage to the connected built-in capacitor to release each built-in capacitor. residual charge in the capacitor.
相应的,如图2所示,本实施例提供的内置电容器的检测方法可以包括:Correspondingly, as shown in FIG. 2 , the method for detecting a built-in capacitor provided in this embodiment may include:
S210、获取各待检测通道的充电电流值,其中,待检测芯片的内置电容器通过所述待检测芯片的引脚与至少一个待检测通道相连。S210. Acquire the charging current value of each channel to be detected, wherein the built-in capacitor of the chip to be detected is connected to at least one channel to be detected through the pins of the chip to be detected.
S220、分别控制各待检测通道向所连接的内置电容器施加0V电压,以释放各内置电容器中的残存电荷。S220 , respectively controlling each channel to be detected to apply a voltage of 0V to the connected built-in capacitors, so as to release the residual charges in each built-in capacitor.
在本实施例中,由于待检测芯片的内置电容器中可能残存有电荷,因此,在各待检测通道使能后,可以首先控制各待检测通道内的参数测量单元向其所属待检测通道所连接的内置电容器输出0V电压,以控制各内置电容器放电,避免内置电容器中的残存电荷对内置电容器的检测造成影响。其中,残存电荷可以接为内置电容器中残留的电荷。In this embodiment, since charges may remain in the built-in capacitors of the chip to be detected, after each channel to be detected is enabled, the parameter measurement unit in each channel to be detected can be controlled to be connected to the channel to be detected to which it belongs. The built-in capacitors output 0V voltage to control the discharge of each built-in capacitor, so as to prevent the residual charge in the built-in capacitor from affecting the detection of the built-in capacitor. Among them, the residual charge can be connected to the residual charge in the built-in capacitor.
S230、针对每个待检测通道,控制所述待检测通道内的参数测量单元采用目标电流向所述待检测通道连接的内置电容器充电,并通过所述待检测通道内的模数转换芯片周期性地检测所述内置电容器的检测电压值;其中,所述目标电流的电流值为所述待检测通道所连接的内置电容器的充电电流值。S230. For each channel to be detected, control the parameter measurement unit in the channel to be detected to charge the built-in capacitor connected to the channel to be detected by using the target current, and periodically pass the analog-to-digital conversion chip in the channel to be detected The detection voltage value of the built-in capacitor is grounded; wherein, the current value of the target current is the charging current value of the built-in capacitor connected to the channel to be detected.
S240、根据各内置电容器的充电电流值和检测电压值计算各内置电容器的检测电容值。S240. Calculate the detection capacitance value of each built-in capacitor according to the charging current value and the detection voltage value of each built-in capacitor.
其中,检测电容值可以理解为检测设备检测得到的内置电容器的电容值。The detection capacitance value can be understood as the capacitance value of the built-in capacitor detected by the detection device.
具体的,可以根据各内置电容器在至少两个检测周期的监测电压值计算各内置电容器在单位时间内的检测电压值变化量,进而根据各内置电容器的充电电流和各内置电容器在单位时间内的检测电压值变化量计算得到各内置电容器的检测电容值。Specifically, the change amount of the detection voltage value of each built-in capacitor in unit time can be calculated according to the monitoring voltage value of each built-in capacitor in at least two detection cycles, and then according to the charging current of each built-in capacitor and the voltage value of each built-in capacitor in unit time The detection capacitance value of each built-in capacitor is obtained by calculating the change amount of the detection voltage value.
为了进一步提高计算得到的内置电容器的检测电容值的准确性,进而提高最终生成的检测结果的准确性,优选的,所述根据各内置电容器的充电电流值和检测电压值计算各内置电容器的检测电容值,包括:针对每个内置电容器,根据所述内置电容值在各检测周期内的检测电压值确定所述内置电容器由预设最小电压值上升至预设最大电压值的电压上升时间;根据所述充电电流值、所述电压上升时间以及所述预设最大电压值与所述预设最小电压值之间的电压差值计算所述内置电容器的检测电容值。其中,预设最小电压值和预设最大电压值可以为电容器充电较稳定的时间段内的两电压值,其可以由检测人员预先进行设置。In order to further improve the accuracy of the calculated detection capacitance value of the built-in capacitor, and further improve the accuracy of the final detection result, preferably, the detection of each built-in capacitor is calculated according to the charging current value and the detection voltage value of each built-in capacitor. The capacitance value includes: for each built-in capacitor, determining the voltage rise time of the built-in capacitor from the preset minimum voltage value to the preset maximum voltage value according to the detection voltage value of the built-in capacitance value in each detection period; The detection capacitance value of the built-in capacitor is calculated from the charging current value, the voltage rise time, and the voltage difference between the preset maximum voltage value and the preset minimum voltage value. Wherein, the preset minimum voltage value and the preset maximum voltage value may be two voltage values within a time period in which the capacitor is charged relatively stably, which may be preset by the testing personnel.
示例性的,在控制各待检测通道对所连接的内置电容器进行充电后,检测设备可以周期性地检测每个内置电容器的检测电压值,判断该检测电压值是否达到预设最小电压值,在其达到预设最小电压值时开始计时,继续判断内置电容器的检测电压值是否达到预设最大电压值,并在其达到预设最大电压值时,停止计时,得到内置电容器的电压上升时间;然后计算预设最大电压值与预设最小电压值之间的差值与电压上升时间之间的比值,并进一步计算该比值与内置电容器的充电电流值之间的乘积,即可得到内置电容器的检测电容值。Exemplarily, after controlling each channel to be detected to charge the connected built-in capacitors, the detection device may periodically detect the detected voltage value of each built-in capacitor, and determine whether the detected voltage value reaches the preset minimum voltage value, and then It starts timing when it reaches the preset minimum voltage value, continues to judge whether the detection voltage value of the built-in capacitor reaches the preset maximum voltage value, and stops timing when it reaches the preset maximum voltage value to obtain the voltage rise time of the built-in capacitor; then Calculate the ratio between the difference between the preset maximum voltage value and the preset minimum voltage value and the voltage rise time, and further calculate the product between the ratio and the charging current value of the built-in capacitor, and then the detection of the built-in capacitor can be obtained. capacitance value.
S250、将各内置电容的检测电容值发送给上位机,以通过所述上位机根据各检测电容值确定待检测芯片的各内置电容器是否正确安装,生成检测结果。S250. Send the detected capacitance value of each built-in capacitor to the upper computer, so that the upper computer determines whether each built-in capacitor of the chip to be detected is correctly installed according to each detected capacitance value, and generates a detection result.
示例性的,检测设备在检测得到各内置电容器的检测电容值之后,可以将各内置电容器的检测电容值存储于存储器中并通知上位机检测完成,如将检测设备内部的检测寄存器由0置为1,以表征各内置电容器的检测电容值已完成检测;上位机在监测到检测寄存器置为1时,即可确定各内置电容器的检测电容值检测完成,从检测设备的存储器中读取各内置电容器的检测电容值,并进一步判断各内置电容器的检测电容值与其理论电容值之间的差值是否在预设电容范围之内,若是,则可以判断内置电容器正确安装;若否,则可以判断内置电容器未正确安装,并进一步确定待检测芯片的检测结果为不合格。Exemplarily, after the detection device detects and obtains the detection capacitance value of each built-in capacitor, it can store the detection capacitance value of each built-in capacitor in the memory and notify the upper computer that the detection is completed, for example, setting the detection register inside the detection device from 0 to 1, to indicate that the detection capacitance value of each built-in capacitor has been detected; when the host computer monitors that the detection register is set to 1, it can determine that the detection of the detection capacitance value of each built-in capacitor is completed, and read each built-in capacitor from the memory of the detection device. The detection capacitance value of the capacitor, and further determine whether the difference between the detection capacitance value of each built-in capacitor and its theoretical capacitance value is within the preset capacitance range. If so, it can be judged that the built-in capacitor is installed correctly; The built-in capacitor is not properly installed, and further confirms that the test result of the chip to be tested is unqualified.
本发明实施例二提供的内置电容器的检测方法,获取各待检测通道的充电电流值,首先分别控制各待检测通道向所连接的内置电容器施加0V电压,然后控制待检测通道采用对应的充电电流值向所连接的内置电容器充电,并检测各内置电容器的检测电压值,进而根据各充电电流值和检测电压值计算各内置电容器的检测电容器,并将各内置电容器的检测电容器发送给上位机,以使上位机通过各内置电容器的检测电容值判断各内置电容器是否正确安装,生成检测结果。本实施例通过采用上述技术方案,能够进一步提高检测得到的内置电容器的检测电容值的准确性,进而提高待检测芯片检测结果的准确性。The method for detecting a built-in capacitor provided in the second embodiment of the present invention obtains the charging current value of each channel to be detected, first controls each channel to be detected to apply 0V voltage to the connected built-in capacitor, and then controls the channel to be detected to use the corresponding charging current The value charges the connected built-in capacitor, and detects the detection voltage value of each built-in capacitor, and then calculates the detection capacitor of each built-in capacitor according to each charging current value and detection voltage value, and sends the detection capacitor of each built-in capacitor to the upper computer. In order to make the upper computer judge whether each built-in capacitor is installed correctly according to the detected capacitance value of each built-in capacitor, and generate the detection result. By adopting the above technical solution in this embodiment, the accuracy of the detected capacitance value of the built-in capacitor obtained by detection can be further improved, thereby improving the accuracy of the detection result of the chip to be detected.
实施例三Embodiment 3
本发明实施例三提供一种内置电容器的检测装置。该装置可以由软件和/或硬件实现,可集成于检测设备中,可通过执行内置电容器的检测方法对内置电容器进行检测。图3为本发明实施例三提供的一种内置电容器的检测装置的结构框图。如图3所示,该装置包括:电流获取模块301、电压检测模块302和结果生成模块303,其中,The third embodiment of the present invention provides a detection device with a built-in capacitor. The device can be implemented by software and/or hardware, can be integrated into a detection device, and can detect the built-in capacitor by executing a method for detecting the built-in capacitor. FIG. 3 is a structural block diagram of a detection device with a built-in capacitor according to Embodiment 3 of the present invention. As shown in FIG. 3, the device includes: a current acquisition module 301, a voltage detection module 302 and a result generation module 303, wherein,
电流获取模块301,用于获取各待检测通道的充电电流值,其中,待检测芯片的内置电容器通过所述待检测芯片的引脚与至少一个待检测通道相连;The current acquisition module 301 is used for acquiring the charging current value of each channel to be detected, wherein the built-in capacitor of the chip to be detected is connected to at least one channel to be detected through the pins of the chip to be detected;
电压检测模块302,用于分别控制各待检测通道采用对应的充电电流值向所连接的内置电容器充电,并获取各内置电容器的检测电压值;The voltage detection module 302 is used to separately control each channel to be detected to charge the connected built-in capacitor with the corresponding charging current value, and obtain the detected voltage value of each built-in capacitor;
结果生成模块303,用于根据各充电电流值和各检测电压值确定所述待检测芯片的各内置电容器是否正确安装,生成检测结果。The result generating module 303 is configured to determine whether each built-in capacitor of the to-be-detected chip is correctly installed according to each charging current value and each detection voltage value, and generate a detection result.
本发明实施例三提供的内置电容器的检测装置,通过电流获取模块301获取待检测芯片的各内置电容器通过待检测芯片的引脚所连接的待检测通道的充电电流值,通过电压检测模块302分别采用各待检测通道的充电电流值向相应待检测通道所连接的内置电容器进行充电,并获取各内置电容器的检测电压值,进而通过结果生成模块303根据各内置电容器的充电电流值和充电电压值确定待检测芯片的各内置电容器是否正确安装,生成检测结果。本实施例通过采用上述技术方案,无需使用振荡电路即可检测内置电容器的电容值,并可以实现待检测芯片各内置电容器的并行检测,能够缩短待检测芯片内置电容器检测所耗费的时间,提高内置电容器的检测效率,从而实现待检测芯片量产阶段的内置电容器检测。In the detection device for built-in capacitors provided by the third embodiment of the present invention, the current acquisition module 301 acquires the charging current values of the channels to be detected connected to the built-in capacitors of the to-be-detected chip through the pins of the to-be-detected chip, and the voltage detection module 302 respectively Use the charging current value of each channel to be detected to charge the built-in capacitor connected to the corresponding channel to be detected, and obtain the detected voltage value of each built-in capacitor, and then pass the result generation module 303 according to the charging current value and charging voltage value of each built-in capacitor. Determine whether each built-in capacitor of the chip to be tested is installed correctly, and generate the test result. By adopting the above technical solution, the present embodiment can detect the capacitance value of the built-in capacitor without using an oscillation circuit, and can realize the parallel detection of each built-in capacitor of the chip to be detected, which can shorten the time spent on detecting the built-in capacitor of the chip to be detected, and improve the built-in capacitor value. The detection efficiency of the capacitor is realized, so as to realize the built-in capacitor detection in the mass production stage of the chip to be tested.
在上述方案中,所述电压检测模块302具体可以用于:针对每个待检测通道,控制所述待检测通道内的参数测量单元采用目标电流向所述待检测通道连接的内置电容器充电,并通过所述待检测通道内的模数转换芯片周期性地检测所述内置电容器的检测电压值;其中,所述目标电流的电流值为所述待检测通道所连接的内置电容器的充电电流值。In the above solution, the voltage detection module 302 can be specifically configured to: for each channel to be detected, control the parameter measurement unit in the channel to be detected to charge the built-in capacitor connected to the channel to be detected by using the target current, and The detection voltage value of the built-in capacitor is periodically detected by the analog-to-digital conversion chip in the channel to be detected; wherein, the current value of the target current is the charging current value of the built-in capacitor connected to the channel to be detected.
在上述方案中,所述结果生成模块303可以包括:电容计算单元,用于根据各内置电容器的充电电流值和检测电压值计算各内置电容器的检测电容值; 结果生成单元,用于将各内置电容的检测电容值发送给上位机,以通过所述上位机根据各检测电容值确定待检测芯片的各内置电容器是否正确安装,生成检测结果。In the above solution, the result generation module 303 may include: a capacitance calculation unit for calculating the detection capacitance value of each built-in capacitor according to the charging current value and detection voltage value of each built-in capacitor; The detected capacitance value of the capacitor is sent to the upper computer, so that the upper computer determines whether each built-in capacitor of the chip to be detected is correctly installed according to each detected capacitance value, and generates a detection result.
在上述方案中,所述电容计算单元可以包括:时间检测子单元,用于针对每个内置电容器,根据所述内置电容器在各检测周期内的检测电压值确定所述内置电容器由预设最小电压值上升至预设最大电压值的电压上升时间;电容计算子单元,用于根据所述充电电流值、所述电压上升时间以及所述预设最大电压值与所述预设最小电压值之间的电压差值计算所述内置电容器的检测电容值。In the above solution, the capacitance calculation unit may include: a time detection subunit, configured for each built-in capacitor to determine, for each built-in capacitor, the built-in capacitor from a preset minimum voltage value according to the detected voltage value of the built-in capacitor in each detection period. The voltage rise time for the value to rise to the preset maximum voltage value; the capacitance calculation sub-unit is used to calculate the value according to the charging current value, the voltage rise time and the difference between the preset maximum voltage value and the preset minimum voltage value The detected capacitance value of the built-in capacitor is calculated from the voltage difference value.
进一步地,本实施例提供的内置电容器的检测装置还可以包括:充电停止模块,用于在各内置电容器的充电时间达到预设超时时间时,控制各待检测通道停止向所连接的内置电容器充电。Further, the detection device for built-in capacitors provided in this embodiment may further include: a charging stop module, configured to control each channel to be detected to stop charging the connected built-in capacitors when the charging time of each built-in capacitor reaches a preset timeout time. .
进一步地,本实施例提供的内置电容器的检测装置还可以包括:电荷释放模块,用于在所述分别控制各待检测通道采用对应的充电电流值向所连接的内置电容器充电之前分别控制各待检测通道向所连接的内置电容器施加0V电压,以释放各内置电容器中的残存电荷。Further, the detection device for built-in capacitors provided in this embodiment may further include: a charge release module, configured to separately control each to-be-detected channel to charge the connected built-in capacitor with a corresponding charging current value. The detection channel applies 0V to the connected built-in capacitors to discharge the residual charge in each built-in capacitor.
在上述方案中,所述电流获取模块可以包括:参数获取单元,用于获取各待检测通道所连接的内置电容器的电容器参数,所述电容器参数包括理论电容值、充电电流阈值和检测电压阈值;电流确定单元,用于根据预先设置的检测时间和所述电容器参数确定各待检测通道的充电电流值。In the above solution, the current acquisition module may include: a parameter acquisition unit for acquiring capacitor parameters of the built-in capacitors connected to each channel to be detected, the capacitor parameters including theoretical capacitance value, charging current threshold and detection voltage threshold; The current determining unit is configured to determine the charging current value of each channel to be detected according to the preset detection time and the capacitor parameter.
本发明实施例三提供的内置电容器的检测装置可执行本发明任意实施例提供的内置电容器的检测方法,具备执行内置电容器的检测方法相应的功能模块和有益效果。未在本实施例中详尽描述的技术细节,可参见本发明任意实施例 所提供的内置电容器的检测方法。The device for detecting a built-in capacitor provided in Embodiment 3 of the present invention can execute the method for detecting a built-in capacitor provided in any embodiment of the present invention, and has functional modules and beneficial effects corresponding to executing the method for detecting a built-in capacitor. For technical details not described in detail in this embodiment, reference may be made to the detection method for a built-in capacitor provided by any embodiment of the present invention.
实施例四Embodiment 4
图4为本发明实施例四提供的一种检测设备的结构示意图,如图4所示,该检测设备包括处理器40和存储器41,还可以包括多个检测通道42;检测设备中处理器40的数量可以是一个或多个,图4中以一个处理器40为例;检测设备中的处理器40、存储器41和各检测通道可以通过总线或其他方式连接。FIG. 4 is a schematic structural diagram of a detection device according to Embodiment 4 of the present invention. As shown in FIG. 4 , the detection device includes a processor 40 and a memory 41, and may also include a plurality of detection channels 42; the processor 40 in the detection device The number can be one or more, and one processor 40 is taken as an example in FIG. 4 ; the processor 40, the memory 41 and each detection channel in the detection device can be connected through a bus or other means.
存储器41作为一种计算机可读存储介质,可用于存储软件程序、计算机可执行程序以及模块,如本发明实施例中的内置电容器的检测方法对应的程序指令/模块(例如,内置电容器的检测装置中的电流获取模块301、电压检测模块302和结果生成模块303)。处理器40通过运行存储在存储器41中的软件程序、指令以及模块,从而执行检测设备的各种功能应用以及数据处理,即实现上述的内置电容器的检测方法。As a computer-readable storage medium, the memory 41 can be used to store software programs, computer-executable programs, and modules, such as program instructions/modules corresponding to the built-in capacitor detection method in the embodiment of the present invention (for example, a built-in capacitor detection device) The current acquisition module 301, the voltage detection module 302 and the result generation module 303). The processor 40 executes various functional applications and data processing of the detection device by running the software programs, instructions and modules stored in the memory 41 , that is, to implement the above-mentioned detection method for a built-in capacitor.
存储器41可主要包括存储程序区和存储数据区,其中,存储程序区可存储操作***、至少一个功能所需的应用程序;存储数据区可存储根据终端的使用所创建的数据等。此外,存储器41可以包括高速随机存取存储器,还可以包括非易失性存储器,例如至少一个磁盘存储器件、闪存器件、或其他非易失性固态存储器件。在一些实例中,存储器41可进一步包括相对于处理器40远程设置的存储器,这些远程存储器可以通过网络连接至检测设备。上述网络的实例包括但不限于互联网、企业内部网、局域网、移动通信网及其组合。The memory 41 may mainly include a storage program area and a storage data area, wherein the storage program area may store an operating system, an application program required for at least one function; the storage data area may store data created according to the use of the terminal, and the like. In addition, memory 41 may include high-speed random access memory, and may also include non-volatile memory, such as at least one magnetic disk storage device, flash memory device, or other non-volatile solid-state storage device. In some instances, memory 41 may further include memory located remotely relative to processor 40, and these remote memories may be connected to the detection device through a network. Examples of such networks include, but are not limited to, the Internet, an intranet, a local area network, a mobile communication network, and combinations thereof.
检测通道42可包括参数测量单元421和模数转换芯片422,参数测量单元421可用于向内置电容器充电,模数转换芯片422可用于检测内置电容器的检测电容值,并将其由模拟信号转换为数字信号。本发明实施例四还提供一种包含 计算机可执行指令的存储介质,所述计算机可执行指令在由计算机处理器执行时用于执行一种内置电容器的检测方法,该方法包括:The detection channel 42 may include a parameter measurement unit 421 and an analog-to-digital conversion chip 422, the parameter measurement unit 421 may be used to charge the built-in capacitor, and the analog-to-digital conversion chip 422 may be used to detect the detection capacitance value of the built-in capacitor, and convert it from an analog signal to Digital signal. The fourth embodiment of the present invention also provides a storage medium containing computer-executable instructions, the computer-executable instructions being used to execute a method for detecting a built-in capacitor when executed by a computer processor, the method comprising:
获取各待检测通道的充电电流值,其中,待检测芯片的内置电容器通过所述待检测芯片的引脚与至少一个待检测通道相连;acquiring the charging current value of each channel to be detected, wherein the built-in capacitor of the chip to be detected is connected to at least one channel to be detected through the pins of the chip to be detected;
分别控制各待检测通道采用对应的充电电流值向所连接的内置电容器充电,并获取各内置电容器的检测电压值;Control each channel to be detected separately to charge the connected built-in capacitor with the corresponding charging current value, and obtain the detected voltage value of each built-in capacitor;
根据各充电电流值和各检测电压值确定所述待检测芯片的各内置电容器是否正确安装,生成检测结果。According to each charging current value and each detection voltage value, it is determined whether each built-in capacitor of the to-be-detected chip is correctly installed, and a detection result is generated.
当然,本发明实施例所提供的一种包含计算机可执行指令的存储介质,其计算机可执行指令不限于如上所述的方法操作,还可以执行本发明任意实施例所提供的内置电容器的检测方法中的相关操作。Of course, a storage medium containing computer-executable instructions provided by an embodiment of the present invention, the computer-executable instructions of which are not limited to the above-mentioned method operations, and can also perform the detection method for a built-in capacitor provided by any embodiment of the present invention. related operations in .
通过以上关于实施方式的描述,所属领域的技术人员可以清楚地了解到,本发明可借助软件及必需的通用硬件来实现,当然也可以通过硬件实现,但很多情况下前者是更佳的实施方式。基于这样的理解,本发明的技术方案本质上或者说对现有技术做出贡献的部分可以以软件产品的形式体现出来,该计算机软件产品可以存储在计算机可读存储介质中,如计算机的软盘、只读存储器(Read-Only Memory,ROM)、随机存取存储器(Random Access Memory,RAM)、闪存(FLASH)、硬盘或光盘等,包括若干指令用以使得一台计算机设备(可以是个人计算机,服务器,或者网络设备等)执行本发明各个实施例所述的方法。From the above description of the embodiments, those skilled in the art can clearly understand that the present invention can be realized by software and necessary general-purpose hardware, and of course can also be realized by hardware, but in many cases the former is a better embodiment . Based on such understanding, the technical solutions of the present invention can be embodied in the form of software products in essence or the parts that make contributions to the prior art, and the computer software products can be stored in a computer-readable storage medium, such as a floppy disk of a computer , read-only memory (Read-Only Memory, ROM), random access memory (Random Access Memory, RAM), flash memory (FLASH), hard disk or optical disk, etc., including several instructions to make a computer device (which can be a personal computer , server, or network device, etc.) to execute the methods described in the various embodiments of the present invention.
值得注意的是,上述内置电容器的检测装置的实施例中,所包括的各个单元和模块只是按照功能逻辑进行划分的,但并不局限于上述的划分,只要能够实现相应的功能即可;另外,各功能单元的具体名称也只是为了便于相互区分,并不用于限制本发明的保护范围。It is worth noting that, in the above-mentioned embodiment of the detection device with built-in capacitor, the included units and modules are only divided according to functional logic, but are not limited to the above-mentioned division, as long as the corresponding functions can be realized; , the specific names of the functional units are only for the convenience of distinguishing from each other, and are not used to limit the protection scope of the present invention.
注意,上述仅为本发明的较佳实施例及所运用技术原理。本领域技术人员会理解,本发明不限于这里所述的特定实施例,对本领域技术人员来说能够进行各种明显的变化、重新调整和替代而不会脱离本发明的保护范围。因此,虽然通过以上实施例对本发明进行了较为详细的说明,但是本发明不仅仅限于以上实施例,在不脱离本发明构思的情况下,还可以包括更多其他等效实施例,而本发明的范围由所附的权利要求范围决定。Note that the above are only preferred embodiments of the present invention and applied technical principles. Those skilled in the art will understand that the present invention is not limited to the specific embodiments described herein, and various obvious changes, readjustments and substitutions can be made by those skilled in the art without departing from the protection scope of the present invention. Therefore, although the present invention has been described in detail through the above embodiments, the present invention is not limited to the above embodiments, and can also include more other equivalent embodiments without departing from the concept of the present invention. The scope is determined by the scope of the appended claims.