WO2021189490A1 - X射线平板探测器及其图像校正方法 - Google Patents

X射线平板探测器及其图像校正方法 Download PDF

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WO2021189490A1
WO2021189490A1 PCT/CN2020/081869 CN2020081869W WO2021189490A1 WO 2021189490 A1 WO2021189490 A1 WO 2021189490A1 CN 2020081869 W CN2020081869 W CN 2020081869W WO 2021189490 A1 WO2021189490 A1 WO 2021189490A1
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pixels
panel detector
pseudo
ray flat
dummy
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PCT/CN2020/081869
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English (en)
French (fr)
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赵斌
徐帅
庞净
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京东方科技集团股份有限公司
北京京东方传感技术有限公司
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Priority to CN202080000416.7A priority Critical patent/CN113766878B/zh
Priority to PCT/CN2020/081869 priority patent/WO2021189490A1/zh
Publication of WO2021189490A1 publication Critical patent/WO2021189490A1/zh

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    • A—HUMAN NECESSITIES
    • A61—MEDICAL OR VETERINARY SCIENCE; HYGIENE
    • A61B—DIAGNOSIS; SURGERY; IDENTIFICATION
    • A61B6/00—Apparatus or devices for radiation diagnosis; Apparatus or devices for radiation diagnosis combined with radiation therapy equipment
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L27/00—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate
    • H01L27/14—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation
    • H01L27/144—Devices controlled by radiation
    • H01L27/146—Imager structures
    • H—ELECTRICITY
    • H04—ELECTRIC COMMUNICATION TECHNIQUE
    • H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
    • H04N25/00—Circuitry of solid-state image sensors [SSIS]; Control thereof

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  • the present disclosure relates to the technical field of X-ray imaging, in particular to an X-ray flat panel detector and an image correction method thereof.
  • X-ray inspection has been widely used in various fields such as medical treatment, safety, non-destructive testing, and scientific research.
  • the more common X-ray detection technology is the X-ray digital radiography (DR) detection technology that appeared in the late 1990s.
  • the flat panel detector (FPD) is used in the X-ray digital photography detection technology, and its pixel size can be less than 0.1mm, so its image quality and resolution can almost be comparable to the film camera system, and it also overcomes the film camera system.
  • the shortcomings in, also provide convenience for the computer processing of the image.
  • the image generation rules are also different. Each is different and needs to be distinguished separately for specific circuit boards and drawing rules.
  • the conventional method is to put an obstruction on the surface and expose it, and then locate the obstruction in the image as a reference.
  • the above method is likely to cause scratches or other static mura defects on the surface of the plate due to touching the obstruction, and the image acquisition process is also more complicated.
  • the embodiments of the present disclosure provide an X-ray flat-panel detector and an image correction method thereof.
  • the specific solutions are as follows:
  • an X-ray flat-panel detector provided by an embodiment of the present disclosure includes a display area and a frame area.
  • the display area includes: a plurality of signal reading lines, a plurality of scanning lines, and a plurality of signals arranged in a matrix. Pixels; wherein at least one of the pixels in the display area is a pseudo pixel, and the pseudo pixel is in a dark state when the flat-panel detector collects an image;
  • the coordinate positions of all the pseudo pixels are different from the coordinate positions of all the pseudo pixels after the display area is horizontally flipped;
  • the coordinate positions of all the pseudo pixels are different from the coordinate positions of all the pseudo pixels after the display area is vertically flipped;
  • the coordinate positions of all the pseudo pixels after the display area is horizontally flipped are different from the coordinate positions of all the pseudo pixels after the display area is vertically flipped.
  • the number of the dummy pixels is greater than one and less than or equal to five.
  • all the dummy pixels are arranged adjacently along the row direction and/or the column direction.
  • some of the pseudo pixels are arranged adjacently among all the pseudo pixels.
  • all the dummy pixels are not adjacent to each other.
  • the coordinate positions of the dummy pixels are all set at a position where the display area is close to the frame area.
  • the pixel includes: a photoelectric conversion unit and a thin film transistor; wherein, the photoelectric conversion unit is used to convert X-ray light into an electrical signal and For storage; the first stage of the thin film transistor is connected to the output terminal of the photoelectric conversion unit, the second electrode of the thin film transistor is connected to the signal reading line, and the gate of the thin film transistor is connected to the scan line; The thin film transistor is used to provide the signal output by the photoelectric conversion unit to the signal reading line under the control of the scan line.
  • the first electrode and the second electrode of the thin film transistor are directly electrically connected.
  • the gate of the thin film transistor is disconnected from the scan line.
  • the second electrode of the thin film transistor is disconnected from the signal reading line.
  • the first electrode of the thin film transistor is disconnected from the photoelectric conversion unit.
  • the embodiments of the present disclosure also provide an image correction method of any of the above-mentioned X-ray flat panel detectors provided by the embodiments of the present disclosure, which includes:
  • the brightness of the dummy pixel is determined according to the brightness of the surrounding pixels of the dummy pixel, specifically:
  • the brightness of the dummy pixel is equal to the average value of the brightness of all adjacent pixels.
  • FIG. 1 is a schematic structural diagram of an X-ray flat-panel detector provided by an embodiment of the disclosure
  • 2a is a schematic comparison diagram of the positions of pseudo pixels in an X-ray flat panel detector provided by an embodiment of the disclosure
  • 2b is a schematic comparison diagram of the positions of pseudo pixels in the X-ray flat-panel detector provided by an embodiment of the disclosure
  • 2c is a schematic comparison diagram of the positions of pseudo pixels in the X-ray flat panel detector provided by the embodiments of the disclosure.
  • FIG. 3a is a schematic diagram of the positions of pseudo pixels that do not meet the conditions of the X-ray flat-panel detector of the present disclosure provided by an embodiment of the present disclosure
  • 3b is a schematic diagram of the positions of pseudo pixels that do not meet the conditions of the X-ray flat panel detector of the present disclosure provided by the embodiments of the present disclosure;
  • Fig. 3c is a schematic diagram of the positions of false pixels that do not meet the conditions of the X-ray flat-panel detector of the present disclosure provided by an embodiment of the present disclosure
  • FIG. 4 is a schematic structural diagram of another X-ray flat panel detector provided by an embodiment of the disclosure.
  • FIG. 5 is a schematic structural diagram of yet another X-ray flat panel detector provided by an embodiment of the disclosure.
  • FIG. 6 is a schematic structural diagram of normal pixels in an X-ray flat-panel detector provided by an embodiment of the disclosure.
  • FIG. 7 is a schematic structural diagram of a pseudo pixel in the X-ray flat-panel detector provided by an embodiment of the disclosure.
  • FIG. 8 is a schematic structural diagram of another pseudo pixel in the X-ray flat-panel detector provided by an embodiment of the disclosure.
  • FIG. 9 is a schematic structural diagram of yet another pseudo pixel in the X-ray flat-panel detector provided by an embodiment of the disclosure.
  • FIG. 10 is a schematic structural diagram of yet another pseudo pixel in the X-ray flat panel detector provided by an embodiment of the disclosure.
  • FIG. 11 is a schematic flowchart of an image correction method of an X-ray flat-panel detector provided by an embodiment of the disclosure.
  • FIG. 12 is a schematic diagram of the positions of pseudo pixels and pixels adjacent to them in the image correction method provided by an embodiment of the disclosure.
  • the circuit boards used by different brands of flat panel detectors are different, and the scanning method of the grid line and the scanning method of the signal reading line of the flat panel detector are different from each other.
  • the board settings For example, for the difference between the forward and reverse scanning directions of the grid line, the corresponding collected image is upside down; the difference between the forward and reverse scanning directions of the signal reading line corresponds to the left and right reverse.
  • the embodiments of the present disclosure provide an X-ray flat-panel detector and an image correction method thereof, which are not limited by the raster scan mode of the X-ray flat-panel detector and the scanning mode of the signal reading line. Positioning.
  • An X-ray flat-panel detector provided by an embodiment of the present disclosure, as shown in FIG. 1, includes a display area AA and a frame area SS.
  • the display area AA includes: a plurality of signal reading lines R1 and a plurality of scanning lines G1 intersectingly arranged And a plurality of pixels pix arranged in a matrix; wherein at least one pixel pix in the display area AA is a pseudo pixel pix', and the pseudo pixel pix' is in a dark state when the flat panel detector collects an image;
  • the correct direction of the image can be positioned, so it can be ensured that the position of the dark spot formed by the pseudo pixel pix' is not affected by the scanning method along the pixel row direction when the image is collected.
  • the coordinate positions of all pseudo pixels pix' are different after vertical flipping.
  • the pseudo pixels pix' are located The upper left corner of the display area AA, so when the pseudo pixel pix' in the collected image is located in the upper left corner of the display area AA, the collected image is considered to be in the correct direction. If the flat panel detector scans along the pixel column direction and along the pixel row direction When both are different, the collected images may be the two situations in Figure 2c.
  • the correct direction of the image can be positioned, so It can be ensured that the position of the dark spot formed by the pseudo pixel pix' when the image is collected is not affected by the scanning mode along the pixel column direction and the pixel row direction.
  • the position coordinates of all the pseudo pixels meet the three conditions mentioned above: (1) In the same coordinate system , The coordinate positions of all the pseudo pixels are different from the coordinate positions of all the pseudo pixels after the display area is flipped horizontally; (2) And in the same coordinate system, the coordinate positions of all the pseudo pixels are the same as those of all the pseudo pixels after the display area is flipped vertically. The coordinate positions are not the same; (3) In the same coordinate system, the coordinate positions of all the pseudo pixels after the display area is flipped horizontally are different from the coordinate positions of all the pseudo pixels after the display area is flipped vertically. Therefore, no matter how the X-ray flat-panel detector scans along the pixel row direction and how it scans along the pixel column direction, the correct direction of the image can be located according to the position of the pseudo pixel in the collected image.
  • the X-ray flat panel detector provided by the embodiments of the present disclosure has simple method operation, less changes than existing products, and does not affect other characteristics of the product, and has better implementation.
  • the pseudo pixels are relative to the normal pixels, that is, the pseudo pixels are pixels that cannot work normally like normal pixels.
  • the normal pixels are collecting the initial image
  • the middle is a bright spot, but the pseudo-pixels are dark spots in the collected initial image. Therefore, the correct direction of the image can be determined according to the position of the dark spots in the collected initial image.
  • the number of pseudo pixels is not limited, but if the number of pseudo pixels is too large, the pseudo pixels may affect the X-ray flat panel detection during use.
  • the number of pseudo pixels can be one, but when collecting images, if a dark spot is collected, it is easy to be confused with the pseudo pixels. It is easy to misjudge.
  • the number of dummy pixels is greater than one and less than or equal to five.
  • all the dummy pixels are arranged adjacently along the row direction; or, all the dummy pixels are arranged adjacently along the column direction; or, some of the dummy pixels are arranged adjacently along the row direction. Adjacently arranged, and some dummy pixels are arranged adjacently along the column direction.
  • some of the pseudo pixels are arranged adjacent to each other.
  • all the dummy pixels are not adjacent to each other.
  • the display area AA of the X-ray flat-panel detector is generally rectangular, and the following takes the number of pseudo pixels as an example to describe the X-ray flat-panel detector provided by the embodiment of the present disclosure.
  • the number of pseudo pixels pix' is 3, of which two pseudo pixels pix' are arranged adjacently, and the other pseudo pixel pix' 'It is not adjacent to the other 2 pseudo pixels pix', so the area of the dark spot formed by 2 pseudo pixels pix' is different from the area of the dark spot formed by 1 pseudo pixel pix', which can prevent confusion .
  • the display area AA is rectangular, and two dummy pixels pix' arranged adjacently are arranged close to one of the corners of the display area AA.
  • another pseudo pixel pix' is located close to another corner of the display area AA, such as the lower right corner in FIG.
  • the number of pseudo pixels pix' is 3, none of the 3 pseudo pixels pix' are adjacent, and the 3 pseudo pixels pix' In this way, the shape of the triangle formed by the connection of 3 pseudo pixels pix' can be used to determine the direction of the collected image.
  • the display area AA is rectangular, and the three pseudo pixels pix' of the triangle formed by the connection are arranged close to one of the corners of the display area AA, such as the lower right corner of FIG.
  • the coordinate positions of the dummy pixels are all set at the position where the display area AA is close to the frame area SS, that is, the distance between the dummy pixels and the frame area SS is less than the distance between the dummy pixels and the center of the display area AA. distance.
  • the pixel pix includes: a photoelectric conversion unit 01 and a thin film transistor 02; Converted into an electrical signal and stored; the first stage of the thin film transistor 02 is connected to the output terminal of the photoelectric conversion unit 01, the second pole of the thin film transistor 02 is connected to the signal reading line R1, and the gate of the thin film transistor 02 is connected to the scanning line G1 Connection; the thin film transistor 02 is used to provide the signal output by the photoelectric conversion unit 01 to the signal reading line R1 under the control of the scan line G1. Thereby, an image is generated based on the signal of the signal reading line R1.
  • one of the first electrode and the second electrode of the thin film transistor is a source electrode and the other electrode is a drain electrode, which is not limited herein.
  • the photoelectric conversion unit generally includes an X-ray conversion layer 011, a photodiode 012, and a capacitor C1.
  • the X-ray conversion layer 011 is converted into visible light of about 550 nm, and then the visible light is converted into an electrical signal by the photodiode 012, which is stored in the capacitor C1.
  • the signal reading line R1 reads electric charges and generates gray scale data, thereby generating an image.
  • the bias voltage Vb connected to the anode of the photodiode 012 keeps the photodiode 012 reversely cut off, and the voltage at point VP is derived from the charge generated by the photodiode 012 after being illuminated.
  • the first electrode and the second electrode of the thin film transistor 02 are directly electrically connected. That is, in a normal pixel, the first electrode and the second electrode of the thin film transistor are independent of each other, and only when the gate controls the thin film transistor to turn on, the first electrode and the second electrode will be turned on.
  • the first electrode and the second electrode of the thin film transistor are directly electrically connected, so that the electrical signal converted by the X-ray light by the photoelectric conversion unit cannot be stored, and will be directly transmitted through the first electrode and the second electrode of the thin film transistor To the signal reading line, so when the scanning line scans to the thin film transistor, there is no charge on the signal reading line and the dummy pixel is a dark spot.
  • the dummy pixel is realized by directly electrically connecting the first electrode and the second electrode of the thin film transistor. From the manufacturing process, only the patterns of the first electrode and the second electrode of the thin film transistor at the position of the dummy pixel need to be changed, and the operation is simple and easy Realize without adding process steps.
  • the gate of the thin film transistor 02 is disconnected from the scan line G1.
  • the gate of the thin film transistor 02 and the scan line G1 in FIG. 8 are connected by a dotted line to indicate an open circuit.
  • the scan line scans to the thin film transistor
  • the thin film transistor is still in an off state, so there is no charge on the signal reading line, and the dummy pixel is a dark spot.
  • the manufacturing process it is only necessary to disconnect the originally electrically connected gate and the scan line, the operation is simple and easy to implement, and no additional process steps are required.
  • the second electrode of the thin film transistor 02 is disconnected from the signal reading line R1.
  • the second pole of the thin film transistor 02 in FIG. 9 and the signal reading line R1 are connected by a dotted line to indicate an open circuit.
  • the pseudo pixel is a dark spot.
  • the manufacturing process it is only necessary to disconnect the originally electrically connected thin film transistor from the signal reading line, the operation is simple and easy to implement, and no additional process steps are required.
  • the first electrode of the thin film transistor 02 is disconnected from the photoelectric conversion unit 01.
  • the first pole of the thin film transistor 02 and the photoelectric conversion unit 01 in FIG. 10 are connected by a dotted line to indicate an open circuit.
  • the pseudo pixel is a dark spot.
  • pseudo pixels can also be implemented in other ways, for example, no photoelectric conversion unit, or no photodiode, or no thin film transistor is provided in the pseudo pixel, or neither the photoelectric conversion unit nor the thin film transistor is provided.
  • the settings, etc., are not limited here, as long as the dummy pixels are dark spots when the image pixels are collected.
  • the images collected by the X-ray flat panel detectors we see in daily life such as the X-ray images taken by the hospital imaging room, are all formed after correcting the collected initial pixels. Therefore, the X-ray flat-panel detector provided by the embodiments of the present disclosure can correct the brightness of the pseudo pixels when correcting the initial image.
  • the embodiments of the present disclosure also provide an image correction method of any of the above-mentioned X-ray flat-panel detectors, as shown in FIG. 11, including:
  • S102 Position the direction of the initial image according to the position coordinates of the dark point in the initial image
  • the brightness of the dummy pixel is determined according to the brightness of the surrounding pixels of the dummy pixel, specifically:
  • the brightness of a dummy pixel is equal to the average value of the brightness of all pixels adjacent to it.
  • the brightness of the pseudo pixel pix' is equal to the average brightness of the 8 pixels of 1-8.
  • the brightness of the pseudo pixel pix′ can also be determined according to the average brightness of several of the 8 pixels, which is not limited here.
  • the position coordinates of all the pseudo pixels meet the following three conditions: (1) In the same coordinate system, The coordinate positions of all pseudo pixels are different from the coordinate positions of all pseudo pixels after the display area is flipped horizontally; (2) In the same coordinate system, the coordinate positions of all pseudo pixels are the coordinates of all pseudo pixels after the display area is flipped vertically The positions are not the same; (3) In the same coordinate system, the coordinate positions of all the pseudo pixels after the display area is flipped horizontally are different from the coordinate positions of all the pseudo pixels after the display area is flipped vertically. Therefore, no matter how the X-ray flat-panel detector scans along the pixel row direction and how it scans along the pixel column direction, the correct direction of the image can be located according to the position of the pseudo pixel in the collected image.

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Abstract

本公开公开了一种X射线平板探测器及其图像校正方法，显示区域中将部分像素设置伪像素，所有伪像素的位置坐标满足如下3个条件：(1)在同一坐标系中，所有伪像素的坐标位置与显示区域经过水平翻转后所有伪像素的坐标位置不相同；(2)且在同一坐标系中，所有伪像素的坐标位置与显示区域经过垂直翻转后所有伪像素的坐标位置不相同；(3)且在同一坐标系中，显示区域经过水平翻转后所有伪像素的坐标位置与显示区域经过垂直翻转后所有伪像素的坐标位置不相同。

Description

X射线平板探测器及其图像校正方法 技术领域
本公开涉及X射线摄像技术领域，尤指一种X射线平板探测器及其图像校正方法。
背景技术
近年来，X射线检测广泛应用于医疗、安全、无损检测以及科研等各个领域。目前，比较常见的X射线检测技术是20世纪90年代末出现的X射线数字照相(Digital Radiography，DR)检测技术。X射线数字照相检测技术中使用了平板探测器(Flat Panel Detector，FPD)，其像素尺寸可小于0.1mm，因而其成像质量及分辨率几乎可与胶片照相***媲美，同时还克服了胶片照相***中的缺点，也为图像的计算机处理提供了方便。
现有的平板探测器，对产品进行不良分析时，首先需要进行图像采集，然后结合图像对不良位置在平板上进行定位，由于不同客户使用的电路板及采图时序存在差异，图像生成规则也各不相同，需要针对具体电路板及采图规则进行单独区分。常规方法为表面放上遮挡物并进行曝光，然后以图像中的遮挡物为参考进行定位。但是，上述方法容易使平板表面由于触碰遮挡物导致划伤或其他静电类mura不良，且采图过程也较为复杂。
发明内容
本公开实施例提供一种X射线平板探测器及其图像校正方法，具体方案如下：
一方面，本公开实施例提的一种X射线平板探测器，包括显示区域和边框区域，所述显示区域包括：交叉设置的多条信号读取线、多条扫描线和呈矩阵排列的多个像素；其中，所述显示区域内至少有一个所述像素为伪像素，所述伪像素在所述平板探测器采集图像时为暗态；
所有所述伪像素的位置坐标满足如下条件：
在同一坐标系中，所有所述伪像素的坐标位置与所述显示区域经过水平翻转后所有所述伪像素的坐标位置不相同；
且在同一坐标系中，所有所述伪像素的坐标位置与所述显示区域经过垂直翻转后所有所述伪像素的坐标位置不相同；
且在同一坐标系中，所述显示区域经过水平翻转后所有所述伪像素的坐标位置与所述显示区域经过垂直翻转后所有所述伪像素的坐标位置不相同。
可选地，在本公开实施例提供的X射线平板探测器中，其中，所述伪像素的数量大于1个小于或等于5个。
可选地，在本公开实施例提供的X射线平板探测器中，所有所述伪像素均沿行方向和/或列方向相邻设置。
可选地，在本公开实施例提供的X射线平板探测器中，所有所述伪像素中部分伪像素相邻设置。
可选地，在本公开实施例提供的X射线平板探测器中，所有所述伪像素各自均互不相邻。
可选地，在本公开实施例提供的X射线平板探测器中，其中，所述伪像素的坐标位置均设置在所述显示区域靠近所述边框区域的位置。
可选地，在本公开实施例提供的X射线平板探测器中，其中，所述像素包括：光电转换单元和薄膜晶体管；其中，所述光电转换单元用于将X射线光转换为电信号并进行存储；所述薄膜晶体管的第一级与所述光电转换单元的输出端连接，所述薄膜晶体管的第二极与信号读取线连接，所述薄膜晶体管的栅极与扫描线连接；所述薄膜晶体管用于在所述扫描线的控制下将所述光电转换单元输出的信号提供至所述信号读取线。
可选地，在本公开实施例提供的X射线平板探测器中，其中，所述伪像素中，所述薄膜晶体管的第一极和第二极直接电连接。
可选地，在本公开实施例提供的X射线平板探测器中，其中，所述伪像素中，所述薄膜晶体管的栅极与所述扫描线断路。
可选地，在本公开实施例提供的X射线平板探测器中，其中，所述伪像素中，所述薄膜晶体管的第二极与所述信号读取线断路。
可选地，在本公开实施例提供的X射线平板探测器中，其中，所述伪像素中，所述薄膜晶体管的第一极与所述光电转换单元断路。
另一方面，本公开实施例还提供了一种本公开实施例提供的上述任一种X射线平板探测器的图像校正方法，其中，包括：
获取所述平板探测器采集的初始图像；
根据所述初始图像中暗点的位置坐标定位所述初始图像的方向；
对所述初始图像中的伪像素进行修复，其中所述伪像素的亮度根据所述伪像素周边像素的亮度确定。
可选地，在本公开实施例提供的图像校正方法中，其中，所述伪像素的亮度根据所述伪像素周边像素的亮度确定，具体为：
所述伪像素的亮度等于与相邻的所有像素的亮度平均值。
附图说明
图1为本公开实施例提供的一种X射线平板探测器的结构示意图；
图2a为本公开实施例提供的X射线平板探测器中伪像素的位置示意比较图；
图2b为本公开实施例提供的X射线平板探测器中伪像素的位置示意比较图；
图2c为本公开实施例提供的X射线平板探测器中伪像素的位置示意比较图；
图3a为本公开实施例提供的不满足本公开X射线平板探测器条件的伪像素的位置示意图；
图3b为本公开实施例提供的不满足本公开X射线平板探测器条件的伪像素的位置示意图；
图3c为本公开实施例提供的不满足本公开X射线平板探测器条件的伪像 素的位置示意图；
图4为本公开实施例提供的另一种X射线平板探测器的结构示意图；
图5为本公开实施例提供的又一种X射线平板探测器的结构示意图；
图6为本公开实施例提供的X射线平板探测器中正常像素的结构示意图；
图7为本公开实施例提供的X射线平板探测器中一种伪像素的结构示意图；
图8为本公开实施例提供的X射线平板探测器中另一种伪像素的结构示意图；
图9为本公开实施例提供的X射线平板探测器中又一种伪像素的结构示意图；
图10为本公开实施例提供的X射线平板探测器中又一种伪像素的结构示意图；
图11为本公开实施例提供的X射线平板探测器的图像校正方法的流程示意图；
图12为本公开实施例提供的图像校正方法中伪像素以及与其相邻的像素的位置示意图。
具体实施方式
具体地，由于目前市面上使用的平板探测器的品牌较多，不同品牌的平板探测器使用的电路板均不同，而平板探测器的栅线扫描方式以及信号读取线的扫描方式均与各自的电路板设置相关。例如栅线正向与反向的扫描方向差异，对应采集的图像即为上下颠倒；信号读取线正向与反向的扫描方向差异，对应采集的图像即为左右颠倒。由此可能出现多种图像与实物的匹配规律。为产品进行不良解析时的定位造成巨大的干扰。
基于此，本公开实施例提供了一种X射线平板探测器及其图像校正方法，不受X射线平板探测器的栅线扫描方式以及信号读取线的扫描方式的限定就可以对采集的图片进行定位。
为使本公开的上述目的、特征和优点能够更为明显易懂，下面将结合附图和实施例对本公开做进一步说明。然而，示例实施方式能够以多种形式实施，且不应被理解为限于在此阐述的实施方式；相反，提供这些实施方式使得本公开更全面和完整，并将示例实施方式的构思全面地传达给本领域的技术人员。在图中相同的附图标记表示相同或类似的结构，因而将省略对它们的重复描述。本公开中所描述的表达位置与方向的词，均是以附图为例进行的说明，但根据需要也可以做出改变，所做改变均包含在本公开保护范围内。本公开的附图仅用于示意相对位置关系不代表真实比例。
需要说明的是，在以下描述中阐述了具体细节以便于充分理解本公开。但是本公开能够以多种不同于在此描述的其它方式来实施，本领域技术人员可以在不违背本公开内涵的情况下做类似推广。因此本公开不受下面公开的具体实施方式的限制。说明书后续描述为实施本申请的较佳实施方式，然所述描述乃以说明本申请的一般原则为目的，并非用以限定本申请的范围。本申请的保护范围当视所附权利要求所界定者为准。
下面结合附图，对本公开实施例提供的X射线平板探测器及其图像校正方法进行具体说明。
本公开实施例提供的一种X射线平板探测器，如图1所示，包括显示区域AA和边框区域SS，显示区域AA包括：交叉设置的多条信号读取线R1、多条扫描线G1和呈矩阵排列的多个像素pix；其中，显示区域AA内至少有一个像素pix为伪像素pix’，该伪像素pix’在平板探测器采集图像时为暗态；
所有伪像素pix’的位置坐标满足如下3个条件：
(1)、如图2a所示，在同一坐标系中(图2a中以XY坐标系为例进行示意)，显示区域AA经过水平翻转后所有伪像素pix’的坐标位置与显示区域AA经过垂直翻转后所有伪像素pix’的坐标位置不相同；例如图1中，伪像素pix’位于显示区域AA的左上角，因此当采集的图像中伪像素pix’位于显示区域AA的左上角时认为采集的图像为正确的方向，如果平板探测器沿像素行方向的扫描方式不同时，采集到的图像可能是图2a中的两种情况，只要针对采集 到的图像将伪像素pix’的位置调整到位于显示区域AA的左上角时就能定位图像的正确方向，因此可以保证在采集图像时由伪像素pix’形成的暗点的位置不受沿像素行方向的扫描方式的影响。
(2)、如图2b所示，且在同一坐标系中(图2b中以XY坐标系为例进行示意)，所有伪像素pix’的坐标位置与显示区域AA经过垂直翻转后所有伪像素pix’的坐标位置不相同；例如图1中，伪像素pix’位于显示区域AA的左上角，因此当采集的图像中伪像素pix’位于显示区域AA的左上角时认为采集的图像为正确的方向，如果平板探测器沿像素列方向的扫描方式不同时，采集到的图像可能是图2b中的两种情况，只要针对采集到的图像将伪像素pix’的位置调整到位于显示区域AA的左上角时就能定位图像的正确方向，因此可以保证在采集图像时由伪像素pix’形成的暗点的位置不受沿像素列方向的扫描方式的影响。
如图2c所示，且在同一坐标系中(图2c中以XY坐标系为例进行示意)，垂直翻转后所有伪像素pix’的坐标位置不相同，例如图1中，伪像素pix’位于显示区域AA的左上角，因此当采集的图像中伪像素pix’位于显示区域AA的左上角时认为采集的图像为正确的方向，如果平板探测器沿像素列方向和沿像素行方向的扫描方式均不同时，采集到的图像可能是图2c中的两种情况，只要针对采集到的图像将伪像素pix’的位置调整到位于显示区域AA的左上角时就能定位图像的正确方向，因此可以保证在采集图像时由伪像素pix’形成的暗点的位置不受沿像素列方向和像素行方向的扫描方式的影响。
需要说明的是，图2a至图2c中，显示区域内“1”、“2”、“3”、“4”表示4个位置的像素pix，当显示区域AA发生翻转后，参见图2a至图2c，在同一坐标系内“1”、“2”、“3”、“4”这4个位置的像素pix的位置也发生变化。
为了进一步说明本公开实施例提供的X射线平板探测器中伪像素的位置，下面举几个反例来说明。例如图3a所示，如果所有伪像素pix’的坐标位置与显示区域AA经过水平翻转后所有伪像素pix’的坐标位置相同，那么从左向右扫描和从右向左扫描采集到的图像中伪像素pix’的位置是相同，因此根据伪像 素pix’的位置不能定位图像的正确方向。例如图3b所示，如果所有伪像素pix’的坐标位置与显示区域AA经过垂直翻转后所有伪像素pix’的坐标位置相同，那么从上向下扫描和从下向上扫描采集到的图像中伪像素pix’的位置是相同，因此根据伪像素pix’的位置不能定位图像的正确方向。例如图3c所示，如果显示区域AA经过水平翻转后所有伪像素pix’的坐标位置与显示区域AA经过垂直翻转后所有伪像素pix’的坐标位置相同，那么从右向左扫描和从下向上扫描采集到的图像中伪像素pix’的位置是相同，因此根据伪像素pix’的位置不能定位图像的正确方向。
综上，本公开实施例提供的X射线平板探测器，由于在显示区域中将部分像素设置伪像素，所有伪像素的位置坐标满足上面提到的3个条件：(1)在同一坐标系中，所有伪像素的坐标位置与显示区域经过水平翻转后所有伪像素的坐标位置不相同；(2)且在同一坐标系中，所有伪像素的坐标位置与显示区域经过垂直翻转后所有伪像素的坐标位置不相同；(3)且在同一坐标系中，显示区域经过水平翻转后所有伪像素的坐标位置与显示区域经过垂直翻转后所有伪像素的坐标位置不相同。因此，不管X射线平板探测器沿像素行方向如何扫描，沿像素列方向如何扫描，根据采集到的图像中伪像素的位置均能定位图像的正确方向。
并且，本公开实施例提供的X射线平板探测器，方法操作简单，且相较于现有产品变更少，且不会对产品其它特性产生影响，具有较好的实施性。
需要说明的时，在本公开实施例提供的X射线平板探测器中，伪像素是相对正常像素而言的，即伪像素是不能像正常像素一样正常工作的像素，正常像素在采集的初始图像中为亮点，但是伪像素在采集的初始图像中为暗点，因此，根据采集的初始图像中暗点的位置就可以确定图像的正确方向。
在具体实施时，在本公开实施例提供的X射线平板探测器中，对伪像素的数量不作限定，但是如果伪像素数量太多，那么在使用过程中，伪像素可能会影响X射线平板探测器对目标产品的采集。
具体地，在本公开实施例提供的X射线平板探测器中，伪像素的数量可 以为1个，但是在采集图像时，如果正好采集到一个暗点，容易与伪像素发生混淆，在图像定位是容易误判。
因此，可选地，在本公开实施例提供的X射线平板探测器中，伪像素的数量大于1个小于或等于5个。
可选地，在本公开实施例提供的X射线平板探测器中，所有伪像素均沿行方向相邻设置；或者，所有伪像素均沿列方向相邻设置；或者，部分伪像素沿行方向相邻设置，部分伪像素沿列方向相邻设置。
或者，可选地，在本公开实施例提供的X射线平板探测器中，所有伪像素中部分伪像素相邻设置。
或者，可选地，在本公开实施例提供的X射线平板探测器中，所有伪像素各自均互不相邻。
具体地，X射线平板探测器的显示区域AA一般为矩形，下面以伪像素的数量为3个为例，说明本公开实施例提供的X射线平板探测器。
可选地，在本公开实施例提供的X射线平板探测器中，如图4所示，伪像素pix’的数量为3，其中2个伪像素pix’相邻设置，另1个伪像素pix’与其它2个伪像素pix’均不相邻，这样由于2个伪像素pix’形成的暗点的面积与1个伪像素pix’形成的暗点的面积不同，可起到防止混淆的作用。
进一步地，在具体实施时，如图4所示，显示区域AA为矩形，相邻设置的2个伪像素pix’靠近显示区域AA的其中一个角设置。例如图4的左上角，另1个伪像素pix’靠近显示区域AA的另一个角设置，例如图4中的右下角。
可选地，在本公开实施例提供的X射线平板探测器中，如图5所示，伪像素pix’的数量为3，3个伪像素pix’均不相邻，3个伪像素pix’的连线构成的三角形，这样可以利用3个伪像素pix’的连线构成的三角形的形状来判断采集的图像的方向。
进一步地，在具体实施时，如图5所示，显示区域AA为矩形，连线构成的三角形的3个伪像素pix’靠近显示区域AA的其中一个角设置，例如图5 的右下角。
具体地，由于X射线平板探测器在使用时，目标产品一般均在显示区域的中心区域成像，因此，为了避免伪像素对X射线平板探测器采集目标产品图像产生影响，因此，可选地，在本公开实施例提供的X射线平板探测器中，伪像素的坐标位置均设置在显示区域AA靠近边框区域SS的位置，即伪像素距离边框区域SS的距离小于伪像素距离显示区域AA中心的距离。
在具体实施时，在本公开实施例提供的X射线平板探测器中，如图6所示，像素pix包括：光电转换单元01和薄膜晶体管02；其中，光电转换单元01用于将X射线光转换为电信号并进行存储；薄膜晶体管02的第一级与光电转换单元01的输出端连接，薄膜晶体管02的第二极与信号读取线R1连接，薄膜晶体管02的栅极与扫描线G1连接；薄膜晶体管02用于在扫描线G1的控制下将光电转换单元01输出的信号提供至信号读取线R1。从而根据信号读取线R1的信号生成图像。
在具体实施时，薄膜晶体管的第一极和第二极中其中一极为源极，另一极为漏极，在此不作限定。
可选地，在本公开实施例提供的X射线平板探测器中，如图6所示，光电转换单元一般包括X射线转化层011、光电二极管012和电容C1，在采集图像时，X射线经X射线转化层011转化为550nm左右的可见光，再由光电二极管012将可见光转化为电信号，储存于电容C1中。当薄膜晶体管02打开时，信号读取线R1读取电荷，并生成灰度数据，从而生成图像。其中，光电二极管012的阳极连接的偏执电压Vb使光电二极管012保持反向截止，VP点电压源自于为光电二极管012受光照后产生的电荷。
可选地，在本公开实施例提供的X射线平板探测器中，如图7所示，伪像素pix’中，薄膜晶体管02的第一极和第二极直接电连接。即在正常像素中，薄膜晶体管的第一极和第二极是彼此独立的，只有当栅极控制薄膜晶体管打开时，第一极和第二极之间才会导通。而在伪像素中，薄膜晶体管的第一极和第二极直接电连接，这样光电转换单元将X射线光转换的电信号不能进行 存储，会直接通过薄膜晶体管的第一极和第二极传输至信号读取线，这样当扫描线扫描至该薄膜晶体管时，信号读取线上没有电荷，伪像素为暗点。
通过使薄膜晶体管的第一极和第二极直接电连接实现伪像素，从制作工艺来说，仅需要对伪像素位置处薄膜晶体管的第一极和第二极的图形进行更改，操作简单易实现，不用增加工艺步骤。
或者，可选地，在本公开实施例提供的X射线平板探测器中，如图8所示，伪像素pix’中，薄膜晶体管02的栅极与扫描线G1断路。其中，图8中薄膜晶体管02的栅极与扫描线G1用虚线连接表示断路。这样当扫描线扫描至该薄膜晶体管时，薄膜晶体管仍是截止状态，因此信号读取线上没有电荷，伪像素为暗点。在制作工艺上，仅需要将原本电连接的栅极与扫描线断开即可，操作简单易实现，不用增加工艺步骤。
或者，可选地，在本公开实施例提供的X射线平板探测器中，如图9所示，伪像素pix’中，薄膜晶体管02的第二极与信号读取线R1断路。其中，图9中薄膜晶体管02的第二极与信号读取线R1用虚线连接表示断路。这样信号读取线上始终没有电荷，伪像素为暗点。在制作工艺上，仅需要将原本电连接的薄膜晶体管与信号读取线断开即可，操作简单易实现，不用增加工艺步骤。
或者，可选地，在本公开实施例提供的X射线平板探测器中，如图10所示，伪像素pix’中，薄膜晶体管02的第一极与光电转换单元01断路。其中，图10中薄膜晶体管02的第一极与光电转换单元01用虚线连接表示断路。这样信号读取线上始终没有电荷，伪像素为暗点。在制作工艺上，仅需要将原本电连接的薄膜晶体管的第一极与光电转换单元断开即可，操作简单易实现，不用增加工艺步骤。
当然，在具体实施时，还可以通过其它方式实现伪像素，例如在伪像素中不设置光电转换单元、或者不设置光电二级管、或者不设置薄膜晶体管、或者光电转换单元和薄膜晶体管均不设置等，在此不作限定，只要保证伪像素在采集图像素时为暗点即可。
在具体实施时，日常生活中我们看到的X射线平板探测器采集的图像，例如医院影像室拍的X射线图像，均是对采集的初始像素进行校正后形成的。因此，本公开实施例提供的X射线平板探测器，在使用时，可以在对初始图像进行校正时，对伪像素的亮度进行校正。
因此，基于同一发明构思，本公开实施例还提供了一种上述任一种X射线平板探测器的图像校正方法，如图11所示，包括：
S101、获取平板探测器采集的初始图像；
S102、根据初始图像中暗点的位置坐标定位初始图像的方向；
S103、对初始图像中的伪像素进行修复，其中伪像素的亮度根据伪像素周边像素的亮度确定。
可选地，在本公开实施例提供的图像校正方法中，伪像素的亮度根据伪像素周边像素的亮度确定，具体为：
伪像素的亮度等于与其相邻的所有像素的亮度平均值。
具体地，以图12所示伪像素pix’为例，与该伪像素pix’相邻的像素有8个，因此该伪像素pix’的亮度等于1-8这8个像素的亮度平均值，当然，在具体实施时，该伪像素pix’的亮度也可以根据这8个像素中其中几个像素的亮度平均值确定，在此不作限定。
本公开实施例提供的X射线平板探测器及其图像校正方法，由于在显示区域中将部分像素设置伪像素，所有伪像素的位置坐标满足如下3个条件：(1)在同一坐标系中，所有伪像素的坐标位置与显示区域经过水平翻转后所有伪像素的坐标位置不相同；(2)且在同一坐标系中，所有伪像素的坐标位置与显示区域经过垂直翻转后所有伪像素的坐标位置不相同；(3)且在同一坐标系中，显示区域经过水平翻转后所有伪像素的坐标位置与显示区域经过垂直翻转后所有伪像素的坐标位置不相同。因此，不管X射线平板探测器沿像素行方向如何扫描，沿像素列方向如何扫描，根据采集到的图像中伪像素的位置均能定位图像的正确方向。
显然，本领域的技术人员可以对本公开进行各种改动和变型而不脱离本 公开的精神和范围。这样，倘若本公开的这些修改和变型属于本公开权利要求及其等同技术的范围之内，则本公开也意图包含这些改动和变型在内。

Claims (13)

  1. 一种X射线平板探测器，包括显示区域和边框区域，所述显示区域包括：交叉设置的多条信号读取线、多条扫描线和呈矩阵排列的多个像素；其中，所述显示区域内至少有一个所述像素为伪像素，所述伪像素在所述平板探测器采集图像时为暗态；
    所有所述伪像素的位置坐标满足如下条件：
    在同一坐标系中，所有所述伪像素的坐标位置与所述显示区域经过水平翻转后所有所述伪像素的坐标位置不相同；
    且在同一坐标系中，所有所述伪像素的坐标位置与所述显示区域经过垂直翻转后所有所述伪像素的坐标位置不相同；
    且在同一坐标系中，所述显示区域经过水平翻转后所有所述伪像素的坐标位置与所述显示区域经过垂直翻转后所有所述伪像素的坐标位置不相同。
  2. 如权利要求1所述的X射线平板探测器，其中，所述伪像素的数量大于1个小于或等于5个。
  3. 如权利要求2所述的X射线平板探测器，其中，所有所述伪像素均沿行方向和/或列方向相邻设置。
  4. 如权利要求2所述的X射线平板探测器，其中，所有所述伪像素中部分伪像素相邻设置。
  5. 如权利要求2所述的X射线平板探测器，其中，所有所述伪像素各自均互不相邻。
  6. 如权利要求1所述的X射线平板探测器，其中，所述伪像素的坐标位置均设置在所述显示区域靠近所述边框区域的位置。
  7. 如权利要求1-6任一项所述的X射线平板探测器，其中，所述像素包括：光电转换单元和薄膜晶体管；其中，所述光电转换单元用于将X射线光转换为电信号并进行存储；所述薄膜晶体管的第一级与所述光电转换单元的输出端连接，所述薄膜晶体管的第二极与信号读取线连接，所述薄膜晶体管 的栅极与扫描线连接；所述薄膜晶体管用于在所述扫描线的控制下将所述光电转换单元输出的信号提供至所述信号读取线。
  8. 如权利要求7所述的X射线平板探测器，其中，所述伪像素中，所述薄膜晶体管的第一极和第二极直接电连接。
  9. 如权利要求7所述的X射线平板探测器，其中，所述伪像素中，所述薄膜晶体管的栅极与所述扫描线断路。
  10. 如权利要求7所述的X射线平板探测器，其中，所述伪像素中，所述薄膜晶体管的第二极与所述信号读取线断路。
  11. 如权利要求7所述的X射线平板探测器，其中，所述伪像素中，所述薄膜晶体管的第一极与所述光电转换单元断路。
  12. 一种如权利要求1-11任一项所述的X射线平板探测器的图像校正方法，其中，包括：
    获取所述平板探测器采集的初始图像；
    根据所述初始图像中暗点的位置坐标定位所述初始图像的方向；
    对所述初始图像中的伪像素进行修复，其中所述伪像素的亮度根据所述伪像素周边像素的亮度确定。
  13. 如权利要求12所述的图像校正方法，其中，所述伪像素的亮度根据所述伪像素周边像素的亮度确定，具体为：
    所述伪像素的亮度等于与相邻的所有像素的亮度平均值。
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