WO2021149333A1 - フィルタ装置、マルチプレクサ、高周波フロントエンド回路及び通信装置 - Google Patents
フィルタ装置、マルチプレクサ、高周波フロントエンド回路及び通信装置 Download PDFInfo
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- 238000004891 communication Methods 0.000 title claims description 16
- 230000000052 comparative effect Effects 0.000 description 20
- 230000005540 biological transmission Effects 0.000 description 19
- 239000003990 capacitor Substances 0.000 description 11
- 238000010586 diagram Methods 0.000 description 11
- 230000010363 phase shift Effects 0.000 description 9
- 239000011295 pitch Substances 0.000 description 7
- 238000000034 method Methods 0.000 description 3
- 230000004048 modification Effects 0.000 description 3
- 238000012986 modification Methods 0.000 description 3
- 238000010897 surface acoustic wave method Methods 0.000 description 3
- 238000006243 chemical reaction Methods 0.000 description 2
- 230000006866 deterioration Effects 0.000 description 2
- 229910013641 LiNbO 3 Inorganic materials 0.000 description 1
- 230000002776 aggregation Effects 0.000 description 1
- 238000004220 aggregation Methods 0.000 description 1
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- H—ELECTRICITY
- H03—ELECTRONIC CIRCUITRY
- H03H—IMPEDANCE NETWORKS, e.g. RESONANT CIRCUITS; RESONATORS
- H03H9/00—Networks comprising electromechanical or electro-acoustic devices; Electromechanical resonators
- H03H9/02—Details
- H03H9/125—Driving means, e.g. electrodes, coils
- H03H9/145—Driving means, e.g. electrodes, coils for networks using surface acoustic waves
- H03H9/14538—Formation
- H03H9/14541—Multilayer finger or busbar electrode
-
- H—ELECTRICITY
- H03—ELECTRONIC CIRCUITRY
- H03H—IMPEDANCE NETWORKS, e.g. RESONANT CIRCUITS; RESONATORS
- H03H9/00—Networks comprising electromechanical or electro-acoustic devices; Electromechanical resonators
- H03H9/70—Multiple-port networks for connecting several sources or loads, working on different frequencies or frequency bands, to a common load or source
- H03H9/72—Networks using surface acoustic waves
- H03H9/725—Duplexers
-
- H—ELECTRICITY
- H04—ELECTRIC COMMUNICATION TECHNIQUE
- H04B—TRANSMISSION
- H04B1/00—Details of transmission systems, not covered by a single one of groups H04B3/00 - H04B13/00; Details of transmission systems not characterised by the medium used for transmission
- H04B1/38—Transceivers, i.e. devices in which transmitter and receiver form a structural unit and in which at least one part is used for functions of transmitting and receiving
- H04B1/40—Circuits
-
- H—ELECTRICITY
- H03—ELECTRONIC CIRCUITRY
- H03H—IMPEDANCE NETWORKS, e.g. RESONANT CIRCUITS; RESONATORS
- H03H9/00—Networks comprising electromechanical or electro-acoustic devices; Electromechanical resonators
- H03H9/02—Details
- H03H9/125—Driving means, e.g. electrodes, coils
- H03H9/145—Driving means, e.g. electrodes, coils for networks using surface acoustic waves
-
- H—ELECTRICITY
- H03—ELECTRONIC CIRCUITRY
- H03H—IMPEDANCE NETWORKS, e.g. RESONANT CIRCUITS; RESONATORS
- H03H9/00—Networks comprising electromechanical or electro-acoustic devices; Electromechanical resonators
- H03H9/25—Constructional features of resonators using surface acoustic waves
-
- H—ELECTRICITY
- H03—ELECTRONIC CIRCUITRY
- H03H—IMPEDANCE NETWORKS, e.g. RESONANT CIRCUITS; RESONATORS
- H03H9/00—Networks comprising electromechanical or electro-acoustic devices; Electromechanical resonators
- H03H9/46—Filters
- H03H9/54—Filters comprising resonators of piezoelectric or electrostrictive material
- H03H9/542—Filters comprising resonators of piezoelectric or electrostrictive material including passive elements
-
- H—ELECTRICITY
- H03—ELECTRONIC CIRCUITRY
- H03H—IMPEDANCE NETWORKS, e.g. RESONANT CIRCUITS; RESONATORS
- H03H9/00—Networks comprising electromechanical or electro-acoustic devices; Electromechanical resonators
- H03H9/46—Filters
- H03H9/64—Filters using surface acoustic waves
- H03H9/6423—Means for obtaining a particular transfer characteristic
- H03H9/6426—Combinations of the characteristics of different transducers
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- H—ELECTRICITY
- H03—ELECTRONIC CIRCUITRY
- H03H—IMPEDANCE NETWORKS, e.g. RESONANT CIRCUITS; RESONATORS
- H03H9/00—Networks comprising electromechanical or electro-acoustic devices; Electromechanical resonators
- H03H9/46—Filters
- H03H9/64—Filters using surface acoustic waves
- H03H9/6423—Means for obtaining a particular transfer characteristic
- H03H9/6433—Coupled resonator filters
- H03H9/6436—Coupled resonator filters having one acoustic track only
-
- H—ELECTRICITY
- H03—ELECTRONIC CIRCUITRY
- H03H—IMPEDANCE NETWORKS, e.g. RESONANT CIRCUITS; RESONATORS
- H03H9/00—Networks comprising electromechanical or electro-acoustic devices; Electromechanical resonators
- H03H9/46—Filters
- H03H9/64—Filters using surface acoustic waves
- H03H9/6423—Means for obtaining a particular transfer characteristic
- H03H9/6433—Coupled resonator filters
- H03H9/6483—Ladder SAW filters
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- H—ELECTRICITY
- H03—ELECTRONIC CIRCUITRY
- H03H—IMPEDANCE NETWORKS, e.g. RESONANT CIRCUITS; RESONATORS
- H03H9/00—Networks comprising electromechanical or electro-acoustic devices; Electromechanical resonators
- H03H9/02—Details
- H03H9/02535—Details of surface acoustic wave devices
- H03H9/02543—Characteristics of substrate, e.g. cutting angles
- H03H9/02559—Characteristics of substrate, e.g. cutting angles of lithium niobate or lithium-tantalate substrates
Definitions
- the present invention relates to a filter device having a plurality of series arm resonators, a multiplexer, a high frequency front end circuit, and a communication device.
- a band-passing filter as a transmission filter is connected between an input terminal and a common terminal.
- This band-passing filter has a plurality of series arm resonators and a plurality of parallel arm resonators.
- a phase shift circuit is connected in parallel with the filter between the input terminal and the common terminal.
- the phase shift circuit has, for example, four IDT electrodes. Two of the four IDT electrodes are connected to the node between the input terminal and the filter. Further, the remaining two IDT electrodes are connected to the node between the common terminal and the filter.
- phase in the phase shift circuit is inverted with respect to the phase outside the band of the filter. As a result, the amount of attenuation outside the band is improved.
- An object of the present invention is to provide a filter device capable of sufficiently increasing the amount of attenuation outside the pass band.
- the filter device includes a filter circuit having a first terminal, a second terminal, a plurality of series arm resonators arranged on a series arm connecting the first terminal and the second terminal, and the series arm.
- the additional circuit comprises at least a part of the series arm resonators connected in parallel, and the additional circuit includes at least three IDT electrodes including a first IDT electrode, a second IDT electrode, and a third IDT electrode.
- the first IDT electrode is a series arm resonator having the lowest antiresonance frequency among the plurality of series arm resonators.
- the second IDT electrode is connected to a second node having a potential different from that of the first node, and the third IDT is connected to the first node and the second node. It is connected to a third node having a potential different from that of the node, and the first node and the second node are closer to the first terminal than the third node.
- the present invention it is possible to provide a filter device capable of sufficiently increasing the amount of attenuation outside the pass band.
- FIG. 1 is a circuit diagram of a filter device according to a first embodiment of the present invention.
- FIG. 2 is a plan view showing the electrode structure of the IDT electrode used in the first embodiment.
- FIG. 3 is a circuit diagram of the filter device of Comparative Example 1.
- FIG. 4 is a circuit diagram of the filter device of Comparative Example 2.
- FIG. 5 is a diagram showing attenuation-frequency characteristics of Examples and Comparative Examples 1 and 2.
- FIG. 6 is a circuit diagram of a filter device according to a second embodiment of the present invention.
- FIG. 7 is a circuit diagram of a filter device according to a third embodiment of the present invention.
- FIG. 8 is a block diagram of a communication device and a high-frequency front-end circuit according to an embodiment of the present invention.
- FIG. 1 is a circuit diagram of a filter device according to the first embodiment of the present invention.
- the filter device 1 has an input terminal as a first terminal 2a and a second terminal 2b. Although not shown in FIG. 1, the second terminal 2b is commonly connected to one end of another band-passing filter to form a multiplexer.
- This filter device 1 constitutes a Band 26 transmission filter.
- the pass band of the Band 26 transmission filter is 814 MHz to 849 MHz.
- the pass band of the Band 26 reception filter is 859 MHz to 894 MHz. Therefore, the filter device 1 is required to have a sufficiently large amount of attenuation at 859 MHz to 894 MHz.
- a ladder-type band-passing type filter circuit 3 is connected between the first terminal 2a and the second terminal 2b.
- the filter circuit 3 has a plurality of series arm resonators S1 to S4 and a plurality of parallel arm resonators P1 to P3.
- the series arm resonators S1 to S4 and the parallel arm resonators P1 to P3 are each composed of surface acoustic wave resonators.
- the structure of this surface acoustic wave resonator is not particularly limited, but an elastic surface wave resonator using a love wave using a Y-cut LiNbO 3 substrate was used.
- the anti-resonance frequency of the series arm resonators S1 to S4 constitutes the attenuation pole on the high frequency side of the pass band.
- the resonance frequencies and antiresonance frequencies of the series arm resonators S1 to S4 are as shown in Table 1 below.
- the anti-resonance frequency of the series arm resonator S3 is lower than the anti-resonance frequency of the other series arm resonators S1, S2, and S4.
- the resonance frequencies and antiresonance frequencies of the parallel arm resonators P1 to P3 are as shown in Table 2 below.
- a capacitor C1 is connected in parallel with the series arm resonator S3, which has the lowest antiresonance frequency, as a bridge capacitance.
- the anti-resonance frequency of the series arm resonator S3 shown here indicates the anti-resonance frequency after the capacitor C1 is connected in parallel as a bridge capacitance.
- the anti-resonance frequency of the series arm resonator means the anti-resonance frequency after the cross-resonance capacitance is connected as described above when the cross-resonance capacitance is connected in parallel.
- the bridge capacitance When the bridge capacitance is not connected in parallel, it means the antiresonance frequency of the series arm resonator itself.
- an additional circuit 4 is connected in parallel with the filter circuit 3 between the first terminal 2a and the second terminal 2b. Specifically, the additional circuit 4 is connected in parallel with the series arm resonators S2 to S4 among the series arm resonators S1 to S4 included in the filter circuit 3. As described above, the case where the additional circuit 4 is connected in parallel to at least a part of the series arm resonators included in the filter circuit 3 is also included in the case where the additional circuit is connected in parallel with the filter circuit. do.
- the additional circuit 4 has a plurality of IDT electrodes 5 to 8.
- the plurality of IDT electrodes 5 to 8 are arranged along the elastic wave propagation direction.
- FIG. 2 shows the electrode structures of the IDT electrodes 5 to 8 in a plan view.
- reflectors 9 and 10 are provided on both sides of the plurality of IDT electrodes 5 to 8 in the elastic wave propagation direction.
- a vertically coupled resonator is constructed.
- at least three IDT electrodes 5 to 8 may be arranged along the elastic wave propagation direction, and the reflectors 9 and 10 may not be provided. Therefore, not only the vertically coupled type but also a transversal type elastic wave device may be used.
- the IDT electrode 7 corresponds to the first IDT electrode in the present invention
- the IDT electrode 5 corresponds to the second IDT electrode in the present invention
- the IDT electrodes 6 and 8 correspond to the third IDT electrode. do.
- Each end of the IDT electrodes 5 to 8 is connected to the ground potential.
- the other ends of the IDT electrodes 5 to 8 are connected to the filter circuit 3. More specifically, the other ends of the IDT electrodes 5 and 7 are connected to the node on the first terminal 2a side of the filter circuit 3.
- the IDT electrode 7 is connected to the first node N1.
- the IDT electrode 5 is connected to the second node N2.
- the node on the first terminal 2a side includes the center in the portion where the series arm resonators S1 to S4 are configured, and is provided on the first terminal 2a side with respect to the center. Indicates a node.
- the second node N2 is different from the first node N1.
- the first node N1 is located at one end of the series arm resonator S3 having the lowest antiresonance frequency.
- the second node N2 is a node between the series arm resonator S1 and the series arm resonator S2.
- the third node N3 is a node located on the second terminal 2b side, and specifically, is a node between the second terminal 2b and the series arm resonator S4.
- the IDT electrodes 6 and 8 are connected to the third node N3, which is the same node as described above.
- the IDT electrodes 6 and 8 are connected to the third node N3 via capacitors C2 and C3, respectively.
- the additional circuit 4 has at least three IDT electrodes 5 to 8, non-essential reflectors 9 and 10, and non-essential capacitors C2 and C3.
- the average electrode finger pitches of the IDT electrodes 5 to 8 are 2.024 ⁇ m, 1.976 ⁇ m, 2.030 ⁇ m, and 1.990 ⁇ m, respectively.
- the average electrode finger pitch is (total electrode finger pitch of each electrode finger) / (number of electrode fingers) in the IDT electrode.
- the average electrode finger pitch of the IDT electrode 7 connected to the first node N1 is larger than the average electrode finger pitch of the IDT electrode 5 connected to the second node N2.
- the attenuation-frequency characteristics of the filter device 1 are shown by a solid line in FIG.
- the thick broken line shows the attenuation-frequency characteristic of Comparative Example 1
- the thin broken line shows the attenuation-frequency characteristic of Comparative Example 2.
- the circuit diagram of the filter device 101 of Comparative Example 1 is shown in FIG. Further, FIG. 4 shows a circuit diagram of the filter device 102 of Comparative Example 2.
- the filter device 101 does not have the additional circuit 4.
- the filter device 102 of Comparative Example 2 has an additional circuit 4, but the IDT electrodes 5 and 7 are all connected to the second node N2.
- Other configurations of the filter devices 101 and 102 of Comparative Example 1 and Comparative Example 2 were the same as those of the Examples.
- the minimum attenuation of the pass band of the Band 26 reception filter was 47.9 dB in Comparative Example 1 and 49.8 dB in Comparative Example 2. On the other hand, it was 57.9 dB in the example. Therefore, according to the embodiment, it can be seen that the amount of attenuation in the pass band of the Band 26 reception filter, that is, the attenuation region on the high frequency side of the Band 26 transmission filter can be increased.
- the loss in the pass band of the Band 26 transmission filter from 814 MHz to 849 MHz was 2.08 dB in Comparative Example 1 and 2.27 dB in Comparative Example 2. On the other hand, it was 2.08 dB in the example.
- the amount of attenuation in the pass band of the reception filter outside the pass band can be sufficiently increased. Moreover, in the example, the loss due to the pass band of 814 MHz to 849 MHz was not deteriorated as compared with Comparative Example 1 having no additional circuit 4.
- the amount of attenuation is sufficiently large in both the vicinity of the low-frequency side end Lch and the high-frequency side end Hch of the pass band of the reception filter. It is possible to do.
- the IDT electrodes 5 and 7 connected to the input terminal side of the additional circuit 4 are connected to different first and second nodes N1 and N2, so that the low frequency side end Lch of the pass band of the reception filter It is possible to improve the amount of attenuation on the side.
- the center of the pass band formed by the path of the IDT electrode 7 ⁇ IDT electrode 8 in the additional circuit 4 The frequency becomes low. Therefore, the amount of attenuation on the low frequency side end Lch side of the pass band of the reception filter is further improved over a wide frequency range by the path passing through the first node N1.
- the average electrode finger pitch of the IDT electrode 5 connected to the second node N2 relatively small, the center frequency of the pass band formed by the path from the IDT electrode 5 to the IDT electrode 6 becomes high. Therefore, the amount of attenuation on the high frequency side end Hch side of the pass band of the reception filter can be improved by the path passing through the second node N2.
- the amount of attenuation can be sufficiently increased in both the vicinity of the low frequency side end Lch and the vicinity of the high frequency side end Hch. Moreover, the amount of attenuation can be sufficiently increased over the entire pass band of the reception filter.
- the capacitor C1 is connected in parallel to the series arm resonator S3 having the lowest antiresonance frequency.
- the IDT electrode 7 By connecting the IDT electrode 7 to the first node N1 which is one end of the series arm resonator S3, the effect of improving the attenuation amount in the entire pass band of the reception filter is further enhanced. This is because the phase near the antiresonance frequency can be effectively inverted by directly connecting the additional circuit 4 to the series arm resonator S3 without using other elements.
- Comparative Example 2 the same amount of attenuation as in Example is obtained in the vicinity of the high frequency side end Hch of the pass band of the reception filter. However, in the vicinity of the low frequency side end Lch, the amount of attenuation is hardly improved in Comparative Example 2 as compared with Comparative Example 1 which does not have the additional circuit 4. It is considered that this is because the phase change in the rebound portion near the low frequency side end Lch generated due to the anti-resonance frequency of the series arm resonator S3 is large, and it is difficult to invert the phase in the additional circuit 4. .
- the path of the IDT electrode 7 ⁇ IDT electrode 8 for improving the attenuation amount near the high frequency side end Hch and the low frequency side end Lch since the IDT electrodes 5 and 7 are connected to the same second node N2, the path of the IDT electrode 7 ⁇ IDT electrode 8 for improving the attenuation amount near the high frequency side end Hch and the low frequency side end Lch.
- the paths of the IDT electrode 5 ⁇ IDT electrode 6 that improve the amount of attenuation in the vicinity interfere with each other. Therefore, it is difficult to share the phase adjustment between the vicinity of the low frequency side end Lch and the vicinity of the high frequency side end Hch.
- the first terminal 2a is an input terminal
- a plurality of IDT electrodes 5 and 7 connected to the input terminal side are connected to the first node N1 or the second node N2 which are different nodes.
- the additional circuit 4 is less likely to be destroyed when a large amount of power is applied. Therefore, preferably, at least one of the IDT electrode 5 and the IDT electrode 7 is between the series arm resonator S1 closest to the first terminal 2a and the first terminal 2a among the plurality of series arm resonators S1 to S4. It is desirable to be connected to a node other than the node.
- the IDT electrode 5 may be connected to a node between the first terminal 2a and the series arm resonator S1 closest to the first terminal 2a. That is, at least one of the IDT electrode 7 and the IDT electrode 5 may be connected between the series arm resonator S1 closest to the first terminal 2a and the first terminal 2a.
- the IDT electrodes 6 and 8 connected to the filter circuit 3 on the second terminal 2b side are connected to different nodes, that is, the third node N3 and the fourth node N4. It may be connected.
- the IDT electrode 6 is the third IDT electrode in the present invention
- the IDT electrode 8 is the fourth IDT electrode in the present invention.
- the additional circuit 4 has capacitors C2 and C3 in order to invert the phase and adjust the amplitude of the signal.
- the capacitors C2 and C3 do not necessarily have to be provided.
- the IDT electrodes 5 and 7 were directly connected to the filter circuit 3, a capacitive element was connected between the IDT electrode 5 and the second node N2 and between the IDT electrode 7 and the first node N1. May be good. Thereby, the amplitude of the signal that inverts the phase can be corrected.
- the capacitance of the series arm resonator may be applied instead of the capacitance elements that may be connected to the capacitors C2 and C3 and the IDT electrodes 5 and 7 as described above.
- the filter circuit 3 is a ladder type filter having a plurality of elastic wave resonators, but in the present invention, the circuit configuration of the filter circuit 3 of the filter device 1 is not limited to this. .. Various band-passing type filters having a plurality of series arm resonators can be used as the filter circuit 3.
- the filter device 1 is not limited to the transmission filter, but may be a reception filter or another band-passing type filter. Therefore, the first terminal 2a may be a receiving terminal.
- the amount of attenuation in the pass band of the reception filter of Band 26 is improved as the high frequency side of the pass band.
- the portion for improving the attenuation on the high frequency side of the pass band is not limited to the pass band of the Band 26 reception filter.
- the filter device 1 can be used as a duplexer by, for example, connecting the second terminal 2b to one end of the receiving filter in common. Further, the filter device 1 can be preferably used as one band-passing type filter in a multiplexer in which one ends of three or more band-passing type filters are commonly connected to each other.
- the series arm resonators S1 to S4 and the parallel arm resonators P1 to P3 are composed of surface acoustic wave resonators, but may be composed of bulk wave resonators.
- the filter device of each of the above embodiments can be used as a duplexer of a high frequency front end circuit or the like. This example will be described below.
- FIG. 8 is a configuration diagram of a communication device and a high-frequency front-end circuit.
- each component connected to the high frequency front end circuit 230 for example, the antenna element 202 and the RF signal processing circuit (RFIC) 203 is also shown.
- the high-frequency front-end circuit 230 and the RF signal processing circuit 203 constitute a communication device 240.
- the communication device 240 may include a power supply, a CPU, and a display.
- the high frequency front end circuit 230 includes a switch 225, duplexers 201A and 201B, filters 231 and 232, low noise amplifier circuits 214 and 224, and power amplifier circuits 234a, 234b, 244a and 244b.
- the high-frequency front-end circuit 230 and the communication device 240 in FIG. 8 are examples of the high-frequency front-end circuit and the communication device, and are not limited to this configuration.
- Duplexer 201A has filters 211 and 212.
- Duplexer 201B has filters 221,222.
- the duplexers 201A and 201B are connected to the antenna element 202 via the switch 225.
- the filter device may be filters 211,212 or filters 211,222,231,232.
- the present invention can also be applied to a multiplexer having three or more filters, such as a triplexer having common antenna terminals of three filters and a hexaplexer having common antenna terminals of six filters. ..
- the multiplexer is not limited to the configuration including both the transmission filter and the reception filter, and may be configured to include only the transmission filter or only the reception filter.
- the switch 225 connects the antenna element 202 and the signal path corresponding to a predetermined band according to a control signal from a control unit (not shown), and is composed of, for example, a SPDT (Single Pole Double Throw) type switch. ..
- the number of signal paths connected to the antenna element 202 is not limited to one, and may be multiple. That is, the high frequency front end circuit 230 may support carrier aggregation.
- the low noise amplifier circuit 214 is a reception amplifier circuit that amplifies a high frequency signal (here, a high frequency reception signal) that has passed through the antenna element 202, the switch 225, and the duplexer 201A, and outputs the high frequency signal to the RF signal processing circuit 203.
- the low-noise amplifier circuit 224 is a reception amplifier circuit that amplifies a high-frequency signal (here, a high-frequency reception signal) that has passed through the antenna element 202, the switch 225, and the duplexer 201B, and outputs the signal to the RF signal processing circuit 203.
- the power amplifier circuits 234a and 234b are transmission amplifier circuits that amplify the high-frequency signal (here, high-frequency transmission signal) output from the RF signal processing circuit 203 and output it to the antenna element 202 via the duplexer 201A and the switch 225. ..
- the power amplifier circuits 244a and 244b are transmission amplifier circuits that amplify the high frequency signal (here, high frequency transmission signal) output from the RF signal processing circuit 203 and output it to the antenna element 202 via the duplexer 201B and the switch 225. ..
- the RF signal processing circuit 203 processes the high frequency received signal input from the antenna element 202 via the received signal path by down-conversion or the like, and outputs the received signal generated by the signal processing. Further, the RF signal processing circuit 203 processes the input transmission signal by up-conversion or the like, and outputs the high-frequency transmission signal generated by the signal processing to the power amplifier circuits 234a, 234b, 244a, 244b.
- the RF signal processing circuit 203 is, for example, an RFIC.
- the communication device may include a BB (baseband) IC. In this case, the BBIC signals the received signal processed by the RFIC. Further, the BBIC processes the transmission signal and outputs it to the RFIC.
- the received signal processed by the BBIC and the transmitted signal before the signal processing by the BBIC are, for example, an image signal, an audio signal, or the like.
- the high-frequency front-end circuit 230 may include a duplexer according to a modification of the duplexers 201A and 201B instead of the duplexers 201A and 201B.
- the filters 231 and 232 in the communication device 240 are connected between the RF signal processing circuit 203 and the switch 225 without passing through the low noise amplifier circuits 214 and 224 and the power amplifier circuits 234a, 234b, 244a and 244b.
- the filters 231 and 232 are also connected to the antenna element 202 via the switch 225, similarly to the duplexers 201A and 201B.
- the filter device, the high-frequency front-end circuit, and the communication device according to the embodiment of the present invention have been described above with reference to the embodiments, but the present invention is another one realized by combining arbitrary components in the above embodiment.
- the present invention can be widely used in communication devices such as mobile phones as elastic wave resonators, filters, duplexers, multiplexers applicable to multiband systems, front-end circuits and communication devices.
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Abstract
Description
2a,2b…第1,第2端子
3…フィルタ回路
4…付加回路
5,6,7,8…IDT電極
9,10…反射器
201A,201B…デュプレクサ
202…アンテナ素子
203…RF信号処理回路
211,212…フィルタ
214…ローノイズアンプ回路
221,222…フィルタ
224…ローノイズアンプ回路
225…スイッチ
230…高周波フロントエンド回路
231,232…フィルタ
234a,234b…パワーアンプ回路
240…通信装置
244a,244b…パワーアンプ回路
C1,C2,C3…コンデンサ
N1,N2,N3,N4…第1,第2,第3,第4ノード
P1,P2,P3…並列腕共振器
S1,S2,S3,S4…直列腕共振器
Claims (10)
- 第1端子と、第2端子と、前記第1端子と前記第2端子を結ぶ直列腕に配置された複数の直列腕共振器を有するフィルタ回路と、
前記直列腕において、少なくとも一部の前記直列腕共振器に並列に接続されている付加回路と、
を備え、
前記付加回路は、第1IDT電極と第2IDT電極と第3IDT電極とを、含む少なくとも3つのIDT電極を有し、少なくとも3つの前記IDT電極は、弾性波伝搬方向に沿って配置されており、
前記第1IDT電極は、前記複数の直列腕共振器のうち最も低い***振周波数を有する直列腕共振器の一方端部である第1ノードに接続されており、前記第2IDT電極は前記第1ノードとは電位が異なる第2ノードに接続されており、前記第3IDTは前記第1ノードおよび前記第2ノードとは電位の異なる第3ノードに接続されており、前記第1ノードおよび前記第2ノードは、前記第3ノードより前記第1端子に近い、フィルタ装置。 - 前記第1IDT電極の平均電極指ピッチが、前記第2IDT電極の平均電極指ピッチよりも大きい、請求項1に記載のフィルタ装置。
- 前記第1端子が入力端子であり、前記第1IDT電極及び前記第2IDT電極のうち少なくとも一方が、前記複数の直列腕共振器のうち、前記第1端子に最も近い直列腕共振器と前記第1端子との間のノード以外のノードに接続されている、請求項1又は2に記載のフィルタ装置。
- 前記第1IDT電極及び前記第2IDT電極のうち少なくとも一方が、前記複数の直列腕共振器のうち、前記第1端子に最も近い直列腕共振器と前記第1端子との間のノードに接続されている、請求項1又は2に記載のフィルタ装置。
- 最も低い***振周波数を有する前記直列腕共振器に並列に接続されている容量素子をさらに備える、請求項1~4のいずれか1項に記載のフィルタ装置。
- 少なくとも3つの前記IDT電極は、第4IDT電極をさらに有し、前記第4IDT電極は前記第2ノードとは電位が異なる第4ノードに接続されており、前記第4ノードは、前記第1ノード及び前記第2ノードよりも前記直列腕において前記第2端子側に位置しており、前記第4ノードは、前記第3ノードとは電位が異なるノードである、請求項1~5のいずれか1項に記載のフィルタ装置。
- 前記フィルタ回路は、複数の並列腕共振器をさらに有する、請求項1~6のいずれか1項に記載のフィルタ装置。
- 請求項1~7のいずれか1項に記載のフィルタ装置と、前記フィルタ装置と一端同士が共通接続されている他のフィルタ装置とを備える、マルチプレクサ。
- 請求項8に記載のマルチプレクサと、前記マルチプレクサに接続されている増幅器とを備える、高周波フロントエンド回路。
- 請求項9に記載の高周波フロントエンド回路と、前記高周波フロントエンド回路と接続されたRF信号処理回路とを備える、通信装置。
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JP2017092945A (ja) * | 2015-10-01 | 2017-05-25 | スカイワークスフィルターソリューションズジャパン株式会社 | 分波器 |
WO2018003338A1 (ja) * | 2016-06-27 | 2018-01-04 | 株式会社村田製作所 | 弾性波フィルタ装置 |
WO2018079284A1 (ja) * | 2016-10-28 | 2018-05-03 | 株式会社村田製作所 | ラダー型フィルタ、デュプレクサ及び弾性波フィルタ装置 |
JP2018074539A (ja) * | 2016-11-04 | 2018-05-10 | 株式会社村田製作所 | マルチプレクサ |
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JP2012151697A (ja) * | 2011-01-19 | 2012-08-09 | Taiyo Yuden Co Ltd | 分波器 |
JP2017092945A (ja) * | 2015-10-01 | 2017-05-25 | スカイワークスフィルターソリューションズジャパン株式会社 | 分波器 |
WO2018003338A1 (ja) * | 2016-06-27 | 2018-01-04 | 株式会社村田製作所 | 弾性波フィルタ装置 |
WO2018079284A1 (ja) * | 2016-10-28 | 2018-05-03 | 株式会社村田製作所 | ラダー型フィルタ、デュプレクサ及び弾性波フィルタ装置 |
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