WO2021118017A1 - Hollow test pin - Google Patents

Hollow test pin Download PDF

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Publication number
WO2021118017A1
WO2021118017A1 PCT/KR2020/012220 KR2020012220W WO2021118017A1 WO 2021118017 A1 WO2021118017 A1 WO 2021118017A1 KR 2020012220 W KR2020012220 W KR 2020012220W WO 2021118017 A1 WO2021118017 A1 WO 2021118017A1
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WO
WIPO (PCT)
Prior art keywords
elastic member
hollow
plunger
diameter portion
contact
Prior art date
Application number
PCT/KR2020/012220
Other languages
French (fr)
Korean (ko)
Inventor
전진국
차상훈
정창모
Original Assignee
주식회사 오킨스전자
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Application filed by 주식회사 오킨스전자 filed Critical 주식회사 오킨스전자
Publication of WO2021118017A1 publication Critical patent/WO2021118017A1/en

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    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/06—Measuring leads; Measuring probes
    • G01R1/067—Measuring probes
    • G01R1/06711—Probe needles; Cantilever beams; "Bump" contacts; Replaceable probe pins
    • G01R1/06733—Geometry aspects
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/06—Measuring leads; Measuring probes
    • G01R1/067—Measuring probes
    • G01R1/06711—Probe needles; Cantilever beams; "Bump" contacts; Replaceable probe pins
    • G01R1/06716—Elastic
    • G01R1/06722—Spring-loaded
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2851—Testing of integrated circuits [IC]
    • G01R31/2855—Environmental, reliability or burn-in testing
    • G01R31/286—External aspects, e.g. related to chambers, contacting devices or handlers
    • G01R31/2863—Contacting devices, e.g. sockets, burn-in boards or mounting fixtures
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2851—Testing of integrated circuits [IC]
    • G01R31/2886—Features relating to contacting the IC under test, e.g. probe heads; chucks

Definitions

  • the present invention relates to a hollow test pin, and more particularly, to a hollow test pin suitable for testing of high voltage and high current.
  • a semiconductor product completed through a semiconductor manufacturing process undergoes various types of tests to evaluate the presence or absence of normal operation and reliability.
  • an electrical characteristic test to check normal operation and disconnection by connecting all input/output terminals of a semiconductor product to a test signal generating circuit, and some input/output terminals such as a power input terminal of a semiconductor product to connect to a test signal generating circuit to reduce stress
  • a burn-in test is performed to check the lifespan of the semiconductor product and whether defects occur.
  • an electrical connection between the semiconductor device and the test equipment In general, in order to inspect the electrical characteristics of a semiconductor device, an electrical connection between the semiconductor device and the test equipment must be made smoothly.
  • an inspection device for connecting the semiconductor device and the test equipment there are a socket board, a probe card, a connector, and the like.
  • the socket board is used when the semiconductor product is in the form of a semiconductor package
  • the probe card is used when the semiconductor product is in the form of a semiconductor chip.
  • connectors are also used as inspection devices that connect semiconductor devices and test equipment.
  • This inspection device serves to connect the semiconductor device side and the test equipment side to each other so that electrical signals can be exchanged in both directions.
  • the inspection device is equipped with a probe pin as a means for contacting the semiconductor device side. have.
  • the test is carried out in a state in which a test board or semiconductor package such as a PCB board is mounted on a separate test socket, and the shape of the test socket is basically determined according to the shape of the test board or semiconductor package and the test socket is tested.
  • the pad on the substrate side or the semiconductor package side and the connection terminal on the test socket side it serves to connect the test substrate or the semiconductor package to the test equipment.
  • test socket is connected to the test board or the semiconductor package and at the same time connected to the test equipment and connected to each other, so that the signal of the test equipment is transmitted to the test substrate or the semiconductor package to perform the test.
  • a probe pin is used as a means for electrically connecting a plurality of connection terminals of an IC embedded in a test socket and a plurality of pads of a test board or a semiconductor package one-to-one.
  • a probe pin is a combination of two contact pins and a spring between them. This type of probe pin facilitates the connection between semiconductor devices and test equipment, and has the advantage of cushioning the mechanical shock generated during connection. For this reason, it is a trend that is widely used in most socket boards.
  • test pin has a very diverse structure depending on needs, such as a structure in which a spring is located outside or inside.
  • Republic of Korea Patent No. 10-1509200 registered on March 31, 2015, probe pin with enhanced signal characteristics of the applicant of the present invention describes a test pin having a structure in which an elastic member is inserted inside.
  • a more specific configuration of the probe pin proposed in the above registered patent includes a barrel in which an upper plunger and a lower plunger are separately provided, and the upper plunger and the lower plunger and the elastic member are accommodated therein.
  • an object of the present invention is to provide a hollow test pin suitable for detecting high voltage and high current characteristics.
  • Another object of the present invention is to provide a hollow test pin that is easy to assemble.
  • the hollow test pin of the present invention for achieving the object as described above includes a hollow body with a contact apex located at the bottom, an elastic member accommodated in the body, and a part inserted into the body to contact the elastic member and a plunger, the body being provided integrally with a large-diameter portion providing an accommodating space in which the elastic member is accommodated, and the large-diameter portion and the shoulder portion interposed therebetween. It consists of a small-diameter part where the contact point is located.
  • one end of the elastic member may be in contact with the inner surface of the shoulder portion while being inserted into the large diameter portion.
  • the plunger is provided integrally with the insertion portion inserted into the large-diameter portion and upward with the insertion portion and the plunger shoulder interposed between the large-diameter portion and exposed to the outside of the large-diameter portion, and has a diameter smaller than that of the insertion portion It can be achieved with a smaller exposed portion.
  • the insertion portion is hollow, and an upper portion of the elastic member may be inserted into the hollow portion of the insertion portion.
  • the upper end of the elastic member may be in contact with the inner surface of the plunger shoulder.
  • the length of the insertion part may be 50% of the length of the large diameter part.
  • the present invention integrates the lower plunger and the body and minimizes the resistance component by increasing the contact area between the upper plunger and the body, thereby easily detecting high voltage and large current characteristics.
  • the present invention can complete the assembly by inserting the upper plunger into the lower plunger-integrated hollow body and caulking the upper periphery of the hollow body, thereby providing a structure that is very easy to assemble.
  • the present invention can omit the overlapping portion for coupling the conventional lower plunger and the body and the overlapping portion for coupling the upper plunger and the body, so that a longer elastic member can be used compared to the conventional same-length test pin, The cushioning action can be made more smoothly, and there is an effect that the adjustment of the contact force is easy.
  • FIG. 1 is an exploded perspective view of a hollow test pin according to a preferred embodiment of the present invention.
  • Figure 2 is a cross-sectional view of the coupled state of Figure 1;
  • FIG. 3 is a view showing the state in which the elastic member is compressed by the contact of the lower plunger in FIG. 2 .
  • FIG. 4 is a cross-sectional view of a hollow test pin according to another embodiment of the present invention.
  • Embodiments described herein will be described with reference to plan and cross-sectional views, which are ideal schematic views of the present invention. Accordingly, the shape of the illustrative drawing may be modified due to manufacturing technology and/or tolerance. Accordingly, the embodiments of the present invention are not limited to the specific form shown, but also include changes in the form generated according to the manufacturing process. Accordingly, the regions illustrated in the drawings have schematic properties, and the shapes of the illustrated regions in the drawings are intended to illustrate specific shapes of regions of the device, and not to limit the scope of the invention.
  • FIG. 1 is an exploded perspective view of a hollow test pin of the present invention
  • FIG. 2 is a cross-sectional configuration view of the combined state of FIG. 1 .
  • the hollow test pin of the present invention includes a hollow body 10 having a contact apex 13 at a lower portion, an elastic member 20 accommodated inside the body 10, and , is inserted inward from the upper side of the body 10 and is configured to include a plunger 30 in contact with the elastic member 20 .
  • the body 10 includes a cylindrical large-diameter portion 11 and a small-diameter portion 12 integrally formed at the lower end of the large-diameter portion 11 .
  • a structure in which the cross-section of the large-diameter portion 11 and the small-diameter portion 12 is circular is illustrated and described, but the cross-section may have a polygonal structure such as a triangle or a square, and in this case, the cross-sectional shape of the plunger is also that of the large diameter portion 11 It shall be the same as the cross-sectional shape.
  • the end of the small diameter portion 12 has a closed structure, and the central portion protrudes downward to form the contact point portion 13 .
  • a shoulder portion 14 is formed between the large-diameter portion 11 and the small-diameter portion 12 so that the large-diameter portion 11 and the small-diameter portion 12 having different diameters are integrally formed.
  • the small diameter portion 12 serves as a conventional lower plunger, but in the present invention, the resistance component can be reduced by integrating the structure of the conventional lower plunger and the barrel.
  • the large diameter portion 11 is hollow and provides an accommodation space portion 15 in which the elastic member 20 is accommodated.
  • the inner side of the shoulder 14 acts as a seating surface on which one end of the elastic member 20 is seated.
  • the elastic member 20 may be a coil-type spring, and the diameter of the elastic member 20 is larger than the inner diameter of the small diameter portion 12 and smaller than the inner diameter of the large diameter portion 11 .
  • the length of the elastic member 20 is slightly smaller than the length of the large-diameter portion 11 .
  • a part of the plunger 30 is inserted into one end of the large-diameter portion 11 opposite the small-diameter portion 12 .
  • the plunger 30 includes an insertion portion 32 inserted into the large-diameter portion 11 , and an exposed portion 31 positioned outside the large-diameter portion 11 in the inserted state of the insertion portion 32 .
  • At least the insertion part 32 is hollow, and for the convenience of manufacturing, the exposed part 31 may also be hollow.
  • the diameter of the insertion part 32 is larger than the diameter of the exposed part 31 .
  • the insertion part 32 comes into contact with the inner surface of the large diameter part 11 while being inserted into the large diameter part 11 of the body 10 and accommodates the upper end of the elastic member 20 inside.
  • the insertion part 32 located on the lower side of the plunger 30 is hollow, and a portion of the upper end of the elastic member 20 is inserted inwardly.
  • This structure increases the contact area between the plunger 30 and the body 10 to provide a structure suitable for detecting high voltage and high current characteristics, as well as maximize the length of the elastic member 20 .
  • the length of the elastic member 20 is longer in the pin of the same length, it is possible to facilitate the buffering action, and the adjustment of the contact force becomes very easy.
  • variable length of the body 10 and the plunger 30 it can be used for testing in various environments, thereby increasing versatility.
  • a plunger shoulder 33 is formed between the insertion portion 32 and the exposed portion 31 of the plunger 30, and the upper end of the elastic member 20 is in contact with the plunger shoulder portion 33, When the contact point 13 is in contact with the test target and an upward pressure is applied, the elastic member 20 can be compressed.
  • the upper end of the body 10 includes a caulking portion 16 bent toward the plunger 30 .
  • the caulking process is performed by inserting the elastic member 20 inside the large-diameter portion 11 of the body 10, and inserting the insertion portion 32 of the plunger 30 into the large-diameter portion 11. 16), so that it can be easily assembled.
  • the plunger shoulder 33 is in contact with the inside of the caulking part 16 , the plunger 30 is not separated from the body 10 .
  • the insertion portion 32 of the plunger 30 may have a sufficient length to minimize the resistance component at the boundary with the body 10 .
  • the length of the insertion part 32 may have a maximum length of 50% of the length of the large diameter part 11 .
  • the length of the insertion portion 32 is assumed to be 50% of the length of the large diameter portion 11 .
  • the present invention can improve assembly and reduce resistance components by providing one body 10 by changing the conventional lower plunger into an integrated structure with the barrel.
  • FIG. 4 is a cross-sectional configuration view of a hollow test pin according to another embodiment of the present invention.
  • the structure of the body 10 may be the same as that of the embodiment of FIG. 2 , and the plunger 30 may be used as a non-hollow one.
  • the present invention relates to a test pin capable of detecting high voltage and high current characteristics using a physical structure using a natural law, and has potential for industrial application.

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  • Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • General Engineering & Computer Science (AREA)
  • Environmental & Geological Engineering (AREA)
  • Geometry (AREA)
  • Measuring Leads Or Probes (AREA)

Abstract

The present invention relates to a hollow test pin comprising: a hollow body having a contact cusp placed at the bottom thereof; an elastic member received in the body; and a plunger partially inserted into the body and brought into contact with the elastic member, wherein the body comprises: a large-diameter portion providing a receiving space in which the elastic member is received; and a small-diameter portion provided integrally with the large-diameter portion with a shoulder portion interposed therebetween, having a structure with a smaller diameter than that of the large-diameter portion, and having the contact cusp placed at the bottom thereof.

Description

중공형 테스트 핀hollow test pin
본 발명은 중공형 테스트 핀에 관한 것으로, 더 상세하게는 고전압, 대전류의 테스트에 적합한 중공형 테스트 핀에 관한 것이다.The present invention relates to a hollow test pin, and more particularly, to a hollow test pin suitable for testing of high voltage and high current.
일반적으로 반도체 제조공정을 통해 완성된 반도체 제품은 정상동작의 유무, 신뢰성 평가 등을 위해 여러가지 형태의 테스트를 거치게 된다.In general, a semiconductor product completed through a semiconductor manufacturing process undergoes various types of tests to evaluate the presence or absence of normal operation and reliability.
예를 들면, 반도체 제품의 모든 입출력 단자를 검사 신호 발생회로와 연결하여 정상적인 동작 및 단선 여부를 검사하는 전기적 특성 테스트, 반도체 제품의 전원 입력 단자 등 일부 입출력 단자들을 검사 신호 발생회로와 연결하여 스트레스를 인가함으로써 반도체 제품의 수명 및 결함 발생 여부를 체크하는 번인 테스트(Burn-in test) 등을 거치게 된다.For example, an electrical characteristic test to check normal operation and disconnection by connecting all input/output terminals of a semiconductor product to a test signal generating circuit, and some input/output terminals such as a power input terminal of a semiconductor product to connect to a test signal generating circuit to reduce stress By applying the application, a burn-in test is performed to check the lifespan of the semiconductor product and whether defects occur.
보통 반도체 소자의 전기적 특성을 검사하기 위해서는 반도체 소자와 테스트 장비 간에 전기적 연결이 원활하게 이루어져야 하며, 이러한 반도체 소자와 테스트 장비의 연결을 위한 검사장치로는 소켓 보드, 프로브 카드, 커넥터 등이 있다.In general, in order to inspect the electrical characteristics of a semiconductor device, an electrical connection between the semiconductor device and the test equipment must be made smoothly. As an inspection device for connecting the semiconductor device and the test equipment, there are a socket board, a probe card, a connector, and the like.
여기서, 상기 소켓 보드는 반도체 제품이 반도체 패키지 형태인 경우에 사용되고, 상기 프로브 카드는 반도체 제품이 반도체 칩 형태인 경우에 사용된다.Here, the socket board is used when the semiconductor product is in the form of a semiconductor package, and the probe card is used when the semiconductor product is in the form of a semiconductor chip.
그리고 일부 개별 소자(Discrete device)에서는 커넥터를 반도체 소자와 테스트 장비를 연결하는 검사장치로 사용되기도 한다.And in some discrete devices, connectors are also used as inspection devices that connect semiconductor devices and test equipment.
이러한 검사장치는 반도체 소자측과 테스트 장비측을 서로 연결시켜 전기적인 신호가 양방향으로 교환될 수 있도록 해주는 역할을 하는 것으로서, 이를 위해 검사장치에는 반도체 소자측과의 접촉을 위한 수단으로 프로브 핀이 갖추어져 있다.This inspection device serves to connect the semiconductor device side and the test equipment side to each other so that electrical signals can be exchanged in both directions. To this end, the inspection device is equipped with a probe pin as a means for contacting the semiconductor device side. have.
일 예로서, 별도의 테스트 소켓에 PCB 기판 등과 같은 테스트 기판이나 반도체 패키지를 탑재시킨 상태에서 테스트가 진행되며, 이러한 테스트 소켓은 기본적으로 테스트 기판이나 반도체 패키지의 형태에 따라 그 모양이 결정됨과 더불어 테스트 기판측 또는 반도체 패키지측의 패드와 테스트 소켓측의 접속단자를 기계적으로 접촉시킴으로써, 테스트 기판이나 반도체 패키지와 테스트 장비를 연결하는 역할을 하게 된다.As an example, the test is carried out in a state in which a test board or semiconductor package such as a PCB board is mounted on a separate test socket, and the shape of the test socket is basically determined according to the shape of the test board or semiconductor package and the test socket is tested. By mechanically contacting the pad on the substrate side or the semiconductor package side and the connection terminal on the test socket side, it serves to connect the test substrate or the semiconductor package to the test equipment.
즉, 상기 테스트 소켓은 테스트 기판이나 반도체 패키지와 연결됨과 동시에 테스트 장비와 연결되면서 이들을 서로 연결시킴으로써, 테스트 장비의 신호가 테스트 기판이나 반도체 패키지에 전달되어 테스트가 이루어지도록 하는 역할을 하게 되며, 이때의 테스트 소켓에 내장된 IC의 복수 개의 접속단자와 테스트 기판 또는 반도체 패키지의 복수 개의 패드를 일대일로 전기적으로 연결시켜주는 수단으로 프로브 핀이 사용된다.That is, the test socket is connected to the test board or the semiconductor package and at the same time connected to the test equipment and connected to each other, so that the signal of the test equipment is transmitted to the test substrate or the semiconductor package to perform the test. A probe pin is used as a means for electrically connecting a plurality of connection terminals of an IC embedded in a test socket and a plurality of pads of a test board or a semiconductor package one-to-one.
보통 프로브 핀은 2개의 접촉 핀과 그 사이의 스프링이 조합된 형태로서, 이러한 형태의 프로브 핀은 반도체 소자와 테스트 장비의 연결을 원활하게 하고, 연결 시 발생하는 기계적인 충격을 완충할 수 있는 장점 때문에 대부분의 소켓 보드에 많이 채택되고 있는 추세이다.In general, a probe pin is a combination of two contact pins and a spring between them. This type of probe pin facilitates the connection between semiconductor devices and test equipment, and has the advantage of cushioning the mechanical shock generated during connection. For this reason, it is a trend that is widely used in most socket boards.
이와 같은 테스트 핀의 형태는 스프링이 외측 또는 내측에 위치하는 구조 등 필요에 따라 매우 다양한 구조를 가지고 있다.The shape of such a test pin has a very diverse structure depending on needs, such as a structure in which a spring is located outside or inside.
본 발명의 출원인의 대한민국 등록특허 10-1509200호(2015년 3월 31일 등록, 신호특성이 강화된 프로브핀)에는 내측에 탄성부재가 삽입된 구조의 테스트 핀에 대하여 기재되어 있다.Republic of Korea Patent No. 10-1509200 (registered on March 31, 2015, probe pin with enhanced signal characteristics) of the applicant of the present invention describes a test pin having a structure in which an elastic member is inserted inside.
상기 등록특허에서 제안한 프로브핀의 좀 더 구체적인 구성은, 상부 플런저와 하부 플런저가 별개로 마련되어 있고, 상부 플런저와 하부 플런저 및 탄성부재를 수용하는 배럴을 포함한다.A more specific configuration of the probe pin proposed in the above registered patent includes a barrel in which an upper plunger and a lower plunger are separately provided, and the upper plunger and the lower plunger and the elastic member are accommodated therein.
이처럼 플런저들과 배럴이 분할된 구조의 경우 상대적으로 조립이 어렵고, 하부 플런저와 배럴의 계면과 배럴과 상부 플런저의 계면을 가지게 되어 저항 성분의 증가에 의해 검출 특성이 저하될 우려가 있다.In the case of a structure in which the plungers and the barrel are divided as described above, assembly is relatively difficult, and the interface between the lower plunger and the barrel and the interface between the barrel and the upper plunger are provided.
특히, 고전압 및 대전류 특성의 테스트를 수행하기에는 저항의 증가에 의해 검출 특성이 저하될 우려가 있으며, 테스트 핀 자체에서 열이 발생하는 등의 부차적인 문제점이 발생할 우려가 있었다.In particular, there is a fear that the detection characteristics may be deteriorated due to an increase in resistance in performing the high voltage and large current characteristics test, and there is a concern that secondary problems such as heat generation in the test pin itself may occur.
따라서 현재 시장에서는 저항 성분을 최소화함과 아울러 조립이 용이한 새로운 구조의 테스트 핀의 개발이 요구되고 있다.Therefore, in the current market, there is a demand for the development of a test pin having a new structure that is easy to assemble while minimizing the resistance component.
따라서 본 발명의 목적은 고전압 및 대전류 특성의 검출에 적합한 중공형 테스트 핀을 제공함에 있다.Accordingly, an object of the present invention is to provide a hollow test pin suitable for detecting high voltage and high current characteristics.
또한, 본 발명의 다른 목적은 조립이 용이한 중공형 테스트 핀을 제공함에 있다.Another object of the present invention is to provide a hollow test pin that is easy to assemble.
아울러 탄성부재의 길이를 최대한 길게하여 접촉 힘의 조정이 용이하도록 하는 중공형 테스트 핀을 제공함에 있다.In addition, it is to provide a hollow test pin that makes it easy to adjust the contact force by making the length of the elastic member as long as possible.
전술한 바와 같은 목적을 달성하기 위한 본 발명 중공형 테스트 핀은, 하단에 접촉첨점부가 위치하며 중공된 바디와, 상기 바디에 수용되는 탄성부재와, 상기 바디에 일부가 삽입되어 상기 탄성부재에 접촉되는 플런저를 포함하며, 상기 바디는, 상기 탄성부재가 수용되는 수용공간을 제공하는 대경부와, 상기 대경부와 견부를 사이에 두고 일체로 마련되어 직경이 대경부에 비해 더 작은 구조로서 하단에 상기 접촉첨점부가 위치하는 소경부로 이루어진다.The hollow test pin of the present invention for achieving the object as described above includes a hollow body with a contact apex located at the bottom, an elastic member accommodated in the body, and a part inserted into the body to contact the elastic member and a plunger, the body being provided integrally with a large-diameter portion providing an accommodating space in which the elastic member is accommodated, and the large-diameter portion and the shoulder portion interposed therebetween. It consists of a small-diameter part where the contact point is located.
본 발명의 실시예에서, 상기 탄성부재의 일단은, 상기 대경부에 삽입된 상태에서 상기 견부의 안쪽면에 접촉될 수 있다.In an embodiment of the present invention, one end of the elastic member may be in contact with the inner surface of the shoulder portion while being inserted into the large diameter portion.
본 발명의 실시예에서, 상기 플런저는, 상기 대경부 내에 삽입되는 삽입부와, 상기 삽입부와 플런저 견부를 사이에 두고 상향에 일체로 마련되어 대경부 외부로 노출되며, 상기 삽입부에 비해 직경이 더 작은 노출부로 이루질 수 있다.In an embodiment of the present invention, the plunger is provided integrally with the insertion portion inserted into the large-diameter portion and upward with the insertion portion and the plunger shoulder interposed between the large-diameter portion and exposed to the outside of the large-diameter portion, and has a diameter smaller than that of the insertion portion It can be achieved with a smaller exposed portion.
본 발명의 실시예에서, 상기 삽입부는 중공된 것이며, 상기 탄성부재의 상부 일부가 삽입부의 중공에 삽입될 수 있다.In an embodiment of the present invention, the insertion portion is hollow, and an upper portion of the elastic member may be inserted into the hollow portion of the insertion portion.
본 발명의 실시예에서, 상기 탄성부재의 상단은 상기 플런저 견부의 안쪽면에 접하는 것일 수 있다.In an embodiment of the present invention, the upper end of the elastic member may be in contact with the inner surface of the plunger shoulder.
본 발명의 실시예에서, 상기 삽입부의 길이는, 상기 대경부 길이의 50%일 수 있다.In an embodiment of the present invention, the length of the insertion part may be 50% of the length of the large diameter part.
본 발명은 하부 플런저와 바디를 일체함과 아울러 상부 플런저와 바디 사이의 접촉면적을 증가시켜 저항 성분을 최소화함으로써, 고전압 및 대전류 특성 검출에 용이한 효과가 있다.The present invention integrates the lower plunger and the body and minimizes the resistance component by increasing the contact area between the upper plunger and the body, thereby easily detecting high voltage and large current characteristics.
또한, 본 발명은 하부 플런저 일체형 중공 바디에 상부 플런저를 삽입하고, 중공 바디의 상부측 둘레를 코킹하는 것으로 조립을 완료할 수 있어, 조립이 매우 용이한 구조를 제공할 수 있는 효과가 있다.In addition, the present invention can complete the assembly by inserting the upper plunger into the lower plunger-integrated hollow body and caulking the upper periphery of the hollow body, thereby providing a structure that is very easy to assemble.
아울러 본 발명은 종래 하부 플런저와 바디의 결합을 위한 중첩 부분 및 상부 플런저와 바디의 결합을 위한 중첩 부분을 생략할 수 있어, 종래의 동일 길이 테스트 핀에 비하여 더 긴 탄성부재를 사용할 수 있게 됨으로써, 완충 작용을 보다 원활하게 할 수 있으며, 접촉 힘의 조정이 용이한 효과가 있다.In addition, the present invention can omit the overlapping portion for coupling the conventional lower plunger and the body and the overlapping portion for coupling the upper plunger and the body, so that a longer elastic member can be used compared to the conventional same-length test pin, The cushioning action can be made more smoothly, and there is an effect that the adjustment of the contact force is easy.
또한, 접촉시 가변 길이를 최대화하여 다양한 환경에서 사용할 수 있어 범용성을 향상시킬 수 있는 효과가 있다.In addition, it can be used in various environments by maximizing the variable length at the time of contact, thereby improving versatility.
도 1은 본 발명의 바람직한 실시예에 따른 중공형 테스트 핀의 분해 사시도이다.1 is an exploded perspective view of a hollow test pin according to a preferred embodiment of the present invention.
도 2는 도 1의 결합상태 단면도이다.Figure 2 is a cross-sectional view of the coupled state of Figure 1;
도 3은 도 2에서 하부 플런저의 접촉으로 탄성부재가 압축된 상태도이다.3 is a view showing the state in which the elastic member is compressed by the contact of the lower plunger in FIG. 2 .
도 4는 본 발명의 다른 실시예에 따른 중공형 테스트 핀의 단면도이다.4 is a cross-sectional view of a hollow test pin according to another embodiment of the present invention.
- 부호의 설명 -- Explanation of symbols -
10:바디 11:대경부10: Body 11: Daekyungbu
12:소경부 13:접촉첨점부12: small diameter part 13: contact apical part
14:견부 15:수용공간부14: shoulder 15: receiving space
16:코킹부 20:탄성부재16: caulking portion 20: elastic member
30:플런저 31:노출부30: plunger 31: exposed part
32:삽입부 33:플런저 견부32: insertion part 33: plunger shoulder
본 발명의 이점 및 특징, 그리고 그것들을 달성하는 방법은 첨부되는 도면과 함께 상세하게 후술되어 있는 실시예들을 참조하면 명확해 질 것이다. 그러나 본 발명은 이하에서 개시되는 실시예들에 한정되는 것이 아니라 서로 다른 다양한 형태로 구현될 것이며, 단지 본 실시예들은 본 발명의 개시가 완전하도록 하며, 본 발명이 속하는 기술분야에서 통상의 지식을 가진 자에게 발명의 범주를 완전하게 알려 주기 위해 제공되는 것이며, 본 발명은 청구항의 범주에 의해 정의될 뿐이다. 도면에서 층 및 영역들의 크기 및 상대적인 크기는 설명의 명료성을 위해 과장된 것일 수 있다. 명세서 전체에 걸쳐 동일 참조 부호는 동일 구성 요소를 지칭한다.Advantages and features of the present invention and methods of achieving them will become apparent with reference to the embodiments described below in detail in conjunction with the accompanying drawings. However, the present invention is not limited to the embodiments disclosed below, but will be implemented in a variety of different forms, and only these embodiments allow the disclosure of the present invention to be complete, and common knowledge in the technical field to which the present invention belongs It is provided to fully inform the possessor of the scope of the invention, and the present invention is only defined by the scope of the claims. Sizes and relative sizes of layers and regions in the drawings may be exaggerated for clarity of description. Like reference numerals refer to like elements throughout.
본 명세서에서 기술하는 실시예들은 본 발명의 이상적인 개략도인 평면도 및 단면도를 참고하여 설명될 것이다. 따라서 제조 기술 및/또는 허용 오차 등에 의해 예시도의 형태가 변형될 수 있다. 따라서 본 발명의 실시예들은 도시된 특정 형태로 제한되는 것이 아니라 제조 공정에 따라 생성되는 형태의 변화도 포함하는 것이다. 따라서 도면에서 예시된 영역들은 개략적인 속성을 가지며, 도면에서 예시된 영역들의 모양은 소자의 영역의 특정 형태를 예시하기 위한 것이고, 발명의 범주를 제한하기 위한 것은 아니다.Embodiments described herein will be described with reference to plan and cross-sectional views, which are ideal schematic views of the present invention. Accordingly, the shape of the illustrative drawing may be modified due to manufacturing technology and/or tolerance. Accordingly, the embodiments of the present invention are not limited to the specific form shown, but also include changes in the form generated according to the manufacturing process. Accordingly, the regions illustrated in the drawings have schematic properties, and the shapes of the illustrated regions in the drawings are intended to illustrate specific shapes of regions of the device, and not to limit the scope of the invention.
이하, 본 발명 중공형 테스트 핀에 대하여 바람직한 실시예들을 첨부된 도면을 참조하여 상세히 설명한다.Hereinafter, preferred embodiments of the hollow test pin of the present invention will be described in detail with reference to the accompanying drawings.
도 1은 본 발명 중공형 테스트 핀의 분해 사시도이고, 도 2는 도 1의 결합 상태 단면 구성도이다.1 is an exploded perspective view of a hollow test pin of the present invention, and FIG. 2 is a cross-sectional configuration view of the combined state of FIG. 1 .
도 1과 도 2를 각각 참조하면 본 발명 중공형 테스트 핀은, 하부에 접촉첨점부(13)를 가지는 중공된 바디(10)와, 상기 바디(10)의 내측에 수용된 탄성부재(20)와, 상기 바디(10)의 상부측에서 내측으로 삽입되어 탄성부재(20)에 접촉되는 플런저(30)를 포함하여 구성된다.1 and 2, respectively, the hollow test pin of the present invention includes a hollow body 10 having a contact apex 13 at a lower portion, an elastic member 20 accommodated inside the body 10, and , is inserted inward from the upper side of the body 10 and is configured to include a plunger 30 in contact with the elastic member 20 .
이하, 상기와 같이 구성되는 본 발명 중공형 테스트 핀의 구조에 대하여 보다 상세히 설명한다.Hereinafter, the structure of the present invention hollow test pin configured as described above will be described in more detail.
먼저, 바디(10)는 원통형의 대경부(11)와, 상기 대경부(11)의 하단측에서 일체로 형성된 소경부(12)를 포함한다. 도면에서는 대경부(11)와 소경부(12)의 단면이 원형인 구조에 대하여 도시하고 설명하지만 그 단면은 삼각형, 사각형 등 다각형 구조일 수 있으며, 이때 플런저의 단면 형상도 대경부(11)의 단면 형상과 동일한 것으로 한다.First, the body 10 includes a cylindrical large-diameter portion 11 and a small-diameter portion 12 integrally formed at the lower end of the large-diameter portion 11 . In the drawings, a structure in which the cross-section of the large-diameter portion 11 and the small-diameter portion 12 is circular is illustrated and described, but the cross-section may have a polygonal structure such as a triangle or a square, and in this case, the cross-sectional shape of the plunger is also that of the large diameter portion 11 It shall be the same as the cross-sectional shape.
소경부(12)의 끝단은 막힌 구조로 중앙부가 하향으로 돌출되어 접촉첨점부(13)를 형성한다.The end of the small diameter portion 12 has a closed structure, and the central portion protrudes downward to form the contact point portion 13 .
상기 대경부(11)와 소경부(12)의 사이는 견부(14)가 형성되어 직경이 서로 다른 대경부(11)와 소경부(12)가 일체로 형성되도록 한다.A shoulder portion 14 is formed between the large-diameter portion 11 and the small-diameter portion 12 so that the large-diameter portion 11 and the small-diameter portion 12 having different diameters are integrally formed.
상기 소경부(12)는 종래 하부 플런저의 역할을 하는 것이지만, 본 발명에서는 종래 하부 플런저와 배럴의 구조를 일체로 하여 저항 성분을 줄일 수 있다.The small diameter portion 12 serves as a conventional lower plunger, but in the present invention, the resistance component can be reduced by integrating the structure of the conventional lower plunger and the barrel.
또한, 하부 플런저와 배럴 구조의 조립을 위한 조립 공정을 생략할 수 있어, 조립성을 개선하고 생산성을 향상시킬 수 있는 특징이 있다.In addition, since the assembly process for assembling the lower plunger and the barrel structure can be omitted, it is possible to improve assembly properties and improve productivity.
상기 대경부(11)는 중공형으로 탄성부재(20)가 수용되는 수용공간부(15)를 제공한다.The large diameter portion 11 is hollow and provides an accommodation space portion 15 in which the elastic member 20 is accommodated.
상기 견부(14)의 내측은 탄성부재(20)의 일단이 안착되는 안착면으로 작용한다.The inner side of the shoulder 14 acts as a seating surface on which one end of the elastic member 20 is seated.
즉, 탄성부재(20)는 코일형 스프링일 수 있으며, 그 탄성부재(20)의 직경은 상기 소경부(12)의 내경보다 크고 대경부(11)의 내경보다 작은 특징이 있다.That is, the elastic member 20 may be a coil-type spring, and the diameter of the elastic member 20 is larger than the inner diameter of the small diameter portion 12 and smaller than the inner diameter of the large diameter portion 11 .
상기 탄성부재(20)의 길이는 대경부(11)의 길이보다 약간 작은 것으로 한다.The length of the elastic member 20 is slightly smaller than the length of the large-diameter portion 11 .
상기 소경부(12) 반대편의 대경부(11) 일단에는 플런저(30)의 일부가 삽입된다.A part of the plunger 30 is inserted into one end of the large-diameter portion 11 opposite the small-diameter portion 12 .
상기 플런저(30)는 상기 대경부(11) 내에 삽입되는 삽입부(32)와, 삽입부(32)의 삽입 상태에서 대경부(11) 외측에 위치하는 노출부(31)를 포함한다.The plunger 30 includes an insertion portion 32 inserted into the large-diameter portion 11 , and an exposed portion 31 positioned outside the large-diameter portion 11 in the inserted state of the insertion portion 32 .
적어도 상기 삽입부(32)는 중공된 것으로 하며, 제조의 편의를 위하여 노출부(31)도 중공된 것으로 할 수 있다.At least the insertion part 32 is hollow, and for the convenience of manufacturing, the exposed part 31 may also be hollow.
상기 삽입부(32)의 직경은 상기 노출부(31)의 직경보다 더 큰 것으로 한다.The diameter of the insertion part 32 is larger than the diameter of the exposed part 31 .
상기 삽입부(32)는 바디(10)의 대경부(11) 내에 삽입된 상태에서 상기 대경부(11)의 안쪽면에 접촉됨과 아울러 탄성부재(20)의 상단측을 내측에 수용하게 된다.The insertion part 32 comes into contact with the inner surface of the large diameter part 11 while being inserted into the large diameter part 11 of the body 10 and accommodates the upper end of the elastic member 20 inside.
즉, 플런저(30)의 하부측에 위치하는 삽입부(32)는 중공된 것이며, 상기 탄성부재(20)의 상단 일부가 내측으로 삽입된 상태가 된다.That is, the insertion part 32 located on the lower side of the plunger 30 is hollow, and a portion of the upper end of the elastic member 20 is inserted inwardly.
이와 같은 구조는 플런저(30)와 바디(10)의 접촉면적을 증가시켜 고전압 및 대전류 특성 검출에 적합한 구조를 제공할 뿐만 아니라 탄성부재(20)의 길이를 최대화할 수 있는 특징이 있다.This structure increases the contact area between the plunger 30 and the body 10 to provide a structure suitable for detecting high voltage and high current characteristics, as well as maximize the length of the elastic member 20 .
동일한 길이의 핀에서 탄성부재(20)의 길이를 더 길게하면, 완충작용을 더 용이하게 할 수 있으며, 접촉 힘의 조절이 매우 용이하게 된다.If the length of the elastic member 20 is longer in the pin of the same length, it is possible to facilitate the buffering action, and the adjustment of the contact force becomes very easy.
또한, 바디(10)와 플런저(30)의 가변 길이를 증가시켜 다양한 환경의 테스트에 이용할 수 있어 범용성을 높일 수 있다.In addition, by increasing the variable length of the body 10 and the plunger 30, it can be used for testing in various environments, thereby increasing versatility.
상기 플런저(30)의 삽입부(32)와 노출부(31)의 사이에는 플런저 견부(33)가 형성되어 있으며, 탄성부재(20)의 상단은 플런저 견부(33)에 접촉된 상태가 되어, 접촉첨점부(13)가 테스트 대상에 접촉되어 상향의 압력이 가해지면 탄성부재(20)가 압축될 수 있게 된다.A plunger shoulder 33 is formed between the insertion portion 32 and the exposed portion 31 of the plunger 30, and the upper end of the elastic member 20 is in contact with the plunger shoulder portion 33, When the contact point 13 is in contact with the test target and an upward pressure is applied, the elastic member 20 can be compressed.
이처럼 탄성부재(20)가 압축된 상태의 본 발명을 도 3에 도시하였다.In this way, the present invention in a state in which the elastic member 20 is compressed is shown in FIG. 3 .
상기 바디(10)의 상단은 플런저(30)를 향해 절곡된 코킹부(16)를 포함한다.The upper end of the body 10 includes a caulking portion 16 bent toward the plunger 30 .
즉, 바디(10)의 대경부(11) 안쪽에 탄성부재(20)를 삽입하고, 플런저(30)의 삽입부(32)를 대경부(11)에 삽입한 상태에서 코킹 공정을 코킹부(16)를 형성함으로써 용이하게 조립할 수 있다.That is, the caulking process is performed by inserting the elastic member 20 inside the large-diameter portion 11 of the body 10, and inserting the insertion portion 32 of the plunger 30 into the large-diameter portion 11. 16), so that it can be easily assembled.
상기 코킹부(16)의 안쪽에서 플런저 견부(33)가 접촉됨으로써 플런저(30)가 바디(10)에서 분리되지 않게 된다.Since the plunger shoulder 33 is in contact with the inside of the caulking part 16 , the plunger 30 is not separated from the body 10 .
상기 플런저(30)의 삽입부(32)는 충분한 길이를 갖도록 하여 바디(10)와의 경계에서의 저항 성분을 최소화할 수 있다.The insertion portion 32 of the plunger 30 may have a sufficient length to minimize the resistance component at the boundary with the body 10 .
상기 삽입부(32)의 길이는 상기 대경부(11) 길이의 최대 50%의 길이를 가질 수 있다. 본 발명의 목적에 부합하도록 삽입부(32)의 길이는 대경부(11) 길이의 50%인 것으로 한다.The length of the insertion part 32 may have a maximum length of 50% of the length of the large diameter part 11 . In order to meet the object of the present invention, the length of the insertion portion 32 is assumed to be 50% of the length of the large diameter portion 11 .
이상 상세히 설명한 바와 같이 본 발명은 종래의 하부 플런저를 배럴과 일체형 구조로 변경하여 하나의 바디(10)를 제공함으로써 조립성 개선 및 저항성분을 줄일 수 있다.As described above in detail, the present invention can improve assembly and reduce resistance components by providing one body 10 by changing the conventional lower plunger into an integrated structure with the barrel.
또한, 상부의 플런저(30)를 중공구조로 하여 탄성부재(20)의 길이를 최대화할 수 있으며, 또한 플런저(30)와 바디(10)의 접촉면적을 최대화하여 저항성분을 줄일 수 있는 특징이 있다.In addition, it is possible to maximize the length of the elastic member 20 by making the upper plunger 30 a hollow structure, and to maximize the contact area between the plunger 30 and the body 10 to reduce the resistance component. have.
도 4는 본 발명의 다른 실시예에 따른 중공형 테스트 핀의 단면 구성도이다.4 is a cross-sectional configuration view of a hollow test pin according to another embodiment of the present invention.
도 4를 참조하면 바디(10)의 구조를 도 2의 실시예와 동일하게 할 수 있으며, 플런저(30)를 중공되지 않은 것으로 사용할 수 있다.Referring to FIG. 4 , the structure of the body 10 may be the same as that of the embodiment of FIG. 2 , and the plunger 30 may be used as a non-hollow one.
이상에서 본 발명에 따른 실시예들이 설명되었으나, 이는 예시적인 것에 불과하며, 당해 분야에서 통상적 지식을 가진 자라면 이로부터 다양한 변형 및 균등한 범위의 실시예가 가능하다는 점을 이해할 것이다. 따라서, 본 발명의 진정한 기술적 보호 범위는 다음의 청구범위에 의해서 정해져야 할 것이다.Although the embodiments according to the present invention have been described above, these are merely exemplary, and those of ordinary skill in the art will understand that various modifications and equivalent ranges of embodiments are possible therefrom. Accordingly, the true technical protection scope of the present invention should be defined by the following claims.
본 발명은 자연 법칙을 이용한 물리적 구조를 이용하여, 고전압 및 대전류 특성을 검출할 수 있는 테스트 핀에 관한 것으로, 산업상 이용 가능성이 있다.The present invention relates to a test pin capable of detecting high voltage and high current characteristics using a physical structure using a natural law, and has potential for industrial application.

Claims (6)

  1. 하단에 접촉첨점부가 위치하며 중공된 바디;The contact point is located at the bottom and the hollow body;
    상기 바디에 수용되는 탄성부재; 및an elastic member accommodated in the body; and
    상기 바디에 일부가 삽입되어 상기 탄성부재에 접촉되는 플런저를 포함하며,and a plunger partly inserted into the body and in contact with the elastic member,
    상기 바디는,The body is
    상기 탄성부재가 수용되는 수용공간을 제공하는 대경부와, 상기 대경부와 견부를 사이에 두고 일체로 마련되어 직경이 대경부에 비해 더 작은 구조로서 하단에 상기 접촉첨점부가 위치하는 소경부로 이루어진 것을 특징으로 하는 중공형 테스트 핀. It is characterized in that it consists of a large-diameter portion providing an accommodating space in which the elastic member is accommodated, and a small-diameter portion integrally provided with the large-diameter portion and the shoulder portion therebetween and having a smaller diameter than the large-diameter portion, in which the contact point is located at the lower end Hollow test pins.
  2. 제1항에 있어서,According to claim 1,
    상기 탄성부재의 일단은, 상기 대경부에 삽입된 상태에서 상기 견부의 안쪽면에 접촉되는 것을 특징으로 하는 중공형 테스트 핀.One end of the elastic member is a hollow test pin, characterized in that in contact with the inner surface of the shoulder in the state inserted into the large-diameter portion.
  3. 제1항 또는 제2항에 있어서,3. The method of claim 1 or 2,
    상기 플런저는,The plunger is
    상기 대경부 내에 삽입되는 삽입부와,an insertion part inserted into the large diameter part;
    상기 삽입부와 플런저 견부를 사이에 두고 상향에 일체로 마련되어 대경부 외부로 노출되며, 상기 삽입부에 비해 직경이 더 작은 노출부로 이루어진 것을 특징으로 하는 중공형 테스트 핀.Hollow test pin, characterized in that it is provided integrally in the upward direction with the insertion part and the plunger shoulder interposed therebetween and is exposed to the outside of the large-diameter part, and comprises an exposed part having a smaller diameter than the insertion part.
  4. 제3항에 있어서,4. The method of claim 3,
    상기 삽입부는 중공된 것이며,The insert is hollow,
    상기 탄성부재의 상부 일부가 삽입부의 중공에 삽입되는 것을 특징으로 하는 중공형 테스트 핀.A hollow test pin, characterized in that the upper part of the elastic member is inserted into the hollow of the insertion part.
  5. 제4항에 있어서,5. The method of claim 4,
    상기 탄성부재의 상단은 상기 플런저 견부의 안쪽면에 접하는 것을 특징으로 하는 중공형 테스트 핀.The upper end of the elastic member is a hollow test pin, characterized in that in contact with the inner surface of the plunger shoulder.
  6. 제4항에 있어서,5. The method of claim 4,
    상기 삽입부의 길이는,The length of the insert is,
    상기 대경부 길이의 50%인 것을 특징으로 하는 중공형 테스트 핀.A hollow test pin, characterized in that 50% of the length of the large diameter part.
PCT/KR2020/012220 2019-12-12 2020-09-10 Hollow test pin WO2021118017A1 (en)

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KR1020190165409A KR102158027B1 (en) 2019-12-12 2019-12-12 A hollow test pin

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