WO2021082110A1 - 一种闪存存储装置掉电压力测试方法 - Google Patents

一种闪存存储装置掉电压力测试方法 Download PDF

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WO2021082110A1
WO2021082110A1 PCT/CN2019/119817 CN2019119817W WO2021082110A1 WO 2021082110 A1 WO2021082110 A1 WO 2021082110A1 CN 2019119817 W CN2019119817 W CN 2019119817W WO 2021082110 A1 WO2021082110 A1 WO 2021082110A1
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platform
power
software
storage device
flash memory
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PCT/CN2019/119817
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English (en)
French (fr)
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顾伟
魏智汎
王展南
谢享奇
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江苏华存电子科技有限公司
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Publication of WO2021082110A1 publication Critical patent/WO2021082110A1/zh

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    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
    • G11C29/56—External testing equipment for static stores, e.g. automatic test equipment [ATE]; Interfaces therefor
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06F—ELECTRIC DIGITAL DATA PROCESSING
    • G06F11/00—Error detection; Error correction; Monitoring
    • G06F11/22—Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing
    • G06F11/2284—Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing by power-on test, e.g. power-on self test [POST]

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  • the invention relates to the technical field of flash memory testing, in particular to a method for testing the voltage drop of a flash memory storage device.
  • some open source platforms can be powered down through the power-down device of the underlying control platform itself, but after the system is installed, the underlying power-down device can no longer be controlled.
  • the power-off device is designed as an independent timing power-off device.
  • This device needs to be loaded with a system for timing control.
  • Flash storage is used as the power source of the system storage device platform, which is like a microcomputer, but It cannot determine whether the system loaded by the flash memory storage device is down, and the tester cannot know when it was down in time.
  • the flash storage device needs to be placed on the platform of the loadable system as a memory, and the stability of the flash storage device after the system is loaded is verified.
  • One of the verifications requires the unexpected power failure of the platform.
  • the flash memory storage device is continuously and unexpectedly powered down to ensure the stability of the system loaded on the flash memory storage device.
  • this test a large number of repeated voltage tests are required, and the system installed on the flash memory storage device needs to be judged Whether it is started successfully each time, this process can be as high as tens of thousands of times, and the time required for each time is about 1 minute. If the power-off test manually requires a lot of manpower, the existing automatic power-off device can only perform power-off , It is impossible to judge whether the system loaded with the flash storage device is down, and the purchase cost is high.
  • the object of the present invention is to provide a method for testing the voltage drop of a flash memory storage device to solve the above-mentioned problems in the background art.
  • the present invention provides the following technical solution: a method for testing the voltage drop force of a flash memory storage device, comprising a PC, a simple power-off device and a platform, the PC and the simple power-off device are connected via a USB, and the simple power-off device The device provides power to the platform through a power output line, and the platform and the PC are connected through a serial port, a USB or a network cable.
  • a method for testing the voltage drop of a flash memory storage device includes the following steps:
  • the software checks the current test times, if the target times are reached or the system hangs up, the test will be stopped, and whether to continue to send the power-off command to the simple power-off device;
  • the platform starts after the power-on device provides power to the platform;
  • the platform is powered on and the log is continuously printed to the UART serial port, or the platform is successfully started, and the command sent by the PC software is processed;
  • the software obtains the system log at the end of the startup of the platform to be tested or reports the command processing result to the PC software;
  • the simple power-off device adopts a control switch.
  • the present invention has the beneficial effects that the present invention can be used to replace the manual power-off test on the flash memory storage device equipped with the system, and perform the power-off test whether the system loaded on the flash memory storage device is stable and more stable.
  • Existing technical devices reduce procurement costs.
  • Figure 1 is a block diagram of the principle of the present invention
  • Figure 2 is a flow chart of the present invention.
  • the present invention provides a technical solution: a method for testing the voltage drop of a flash memory storage device, including a PC1, a simple power-off device 2 and a platform 3, the PC1 and the simple power-off device 2 are connected via USB
  • the simple power-off device 2 provides power to the platform 3 through a power output line, and the platform 3 and the PC1 are connected through a serial port, USB or a network cable; the simple power-off device uses a control switch.
  • the external hardware device is connected and the test control software is installed on the PC.
  • the PC issues commands to the simple power-off device via USB, and the platform is powered on via the serial port and USB Or the network cable reports the boot information to the PC.
  • the Android development platform as the platform to be tested, it will continuously print the system log through the UART serial port when it is booted, and a logo will be printed after the boot is completed, so when the PC control software obtains the logo, it can be judged as a successful boot.
  • boot check commands to the ADB service provided by the platform to check the system status. If the flag is not obtained for a certain period of time, it will be judged as abnormal boot.
  • the PC control software records the relevant information of this test, and the first test ends.
  • the software checks the current test times, if the target times are reached or the system hangs up, the test will be stopped, and whether to continue to send the power-off command to the simple power-off device;
  • the platform starts after the power-on device provides power to the platform;
  • the platform is powered on and the log is continuously printed to the UART serial port, or the platform is successfully started, and the command sent by the PC software is processed;
  • the software obtains the system log at the end of the startup of the platform to be tested or reports the command processing result to the PC software;
  • the present invention can be used to replace the manual power-off test of the flash memory storage device with the system, and perform the power-off test whether the system loaded on the flash memory storage device is stable, and reduce the purchase cost compared with the existing technical device.

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  • Engineering & Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
  • Theoretical Computer Science (AREA)
  • Computer Hardware Design (AREA)
  • Quality & Reliability (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Techniques For Improving Reliability Of Storages (AREA)
  • For Increasing The Reliability Of Semiconductor Memories (AREA)

Abstract

一种闪存存储装置掉电压力测试方法，包括PC（1）、简易断电装置（2）和平台（3），PC（1）与简易断电装置（2）通过USB连接，简易断电装置（2）通过电源输出线向平台（3）提供电源，平台（3）与PC（1）之间通过串口、USB或网线连接，在外置硬件装置连接完成，并在PC（1）安装测试控制软件，用户在该软件上设置测试的次数后，PC（1）通过USB向简易断电装置（2）进行下发命令，平台（3）开机后通过串口、USB或网线向PC回报开机信息。该方法可用于代替人工进行对装有***的闪存存储装置做掉电压力测试，且能够降低采购成本。

Description

一种闪存存储装置掉电压力测试方法 技术领域
本发明涉及闪存测试技术领域，具体为一种闪存存储装置掉电压力测试方法。
背景技术
在以闪存存储装置作为***存储装置平台中，部分开源平台可以通过底层控制平台本身带有的掉电装置进行掉电，但装有***后就无法再控制底层的掉电装置。
现有的技术装置中，有将掉电装置设计为一个独立的定时掉电的装置，此装置需要装载***来进行定时控制以闪存存储作为***存储装置平台的电源，形如一台微型电脑，但其不能判定闪存存储装置装载的***是否挂掉，导致测试人员不能及时知道其是在什么时候挂掉的。
在闪存存储装置研发结束阶段，需要将闪存存储装置放置在可装载***的平台上作为存储器，对装载***后的闪存存储装置进行稳定性验证，其中一项验证就需要对平台进行意外掉电，间接对闪存存储装置进行不断地意外掉电来确保该闪存存储装置装载的***的稳定性，而在做该项测试时需要大量重复掉电压力测试，且需要判断装在闪存存储装置上的***每次是否都成功启动，这个过程可高达上万次，每次所需时长在1分钟左右，如果人工上断电测试需要耗费巨大的人力，而现有的自动掉电装置只能进行掉电，不能对装载闪存存储装置的***进行判断是否挂掉，且采购成本高。
发明内容
本发明的目的在于提供一种闪存存储装置掉电压力测试方法，以解决上述背景技术中提出的问题。
为实现上述目的，本发明提供如下技术方案：一种闪存存储装置掉电压力测试方法，包括PC、简易断电装置和平台，所述PC与简易断电装置通过USB连接，所述简易断电装置通过电源输出线向平台提供电源，所述平台与PC之间通过串口、USB或网线连接。
优选的，一种闪存存储装置掉电压力测试方法，包括以下步骤：
A、运行设计好的PC控制软件；
B、设置好希望测试的次数后点击开始；
C、软件检查当前测试的次数，如果达到目标次数或***挂掉则停止测试，否继续向简易断电装置发送断上电命令；
D、上电装置向平台提供电源后平台启动；
E、平台上电启动，并不断地向UART串口打印日志，或平台启动成功，处理PC软件发来的命令；
F、软件获得待测平台开机结束的***日志或向PC软件回报命令处理结果；
G、PC软件处理平台回报的结果，并显示在软件上；
H、测试结束。
优选的，所述简易断电装置采用控制开关。
与现有技术相比，本发明的有益效果是：本发明可用于代替人工进行对装有***的闪存存储装置做掉电压力测试，进行掉电测试闪存 存储装置装载的***是否稳定，且较现有的技术装置降低采购成本。
附图说明
图1为本发明原理框图；
图2为本发明流程图。
具体实施方式
下面将结合本发明实施例中的附图，对本发明实施例中的技术方案进行清楚、完整地描述，显然，所描述的实施例仅仅是本发明一部分实施例，而不是全部的实施例。基于本发明中的实施例，本领域普通技术人员在没有做出创造性劳动前提下所获得的所有其他实施例，都属于本发明保护的范围。
请参阅图1-2，本发明提供一种技术方案：一种闪存存储装置掉电压力测试方法，包括PC1、简易断电装置2和平台3，所述PC1与简易断电装置2通过USB连接，所述简易断电装置2通过电源输出线向平台3提供电源，所述平台3与PC1之间通过串口、USB或网线连接；简易断电装置采用控制开关。
本发明中，在外置硬件装置连接完成，并在PC安装测试控制软件，用户在该软件上设置测试的次数后，PC通过USB向简易断电装置进行下发命令，平台开机后通过串口、USB或网线向PC回报开机信息。例如：使用Android开发平台作为待测平台时，其开机启动时会不断地通过UART串口打印***日志，当开机完成后会打印一个标志，所以当PC控制软件获得该标志后可判为成功开机，也可通过不断地向平台提供的ADB服务不断地发送开机检查命令检查***状态， 如果超过一定时间未获得该标志，判为开机异常。PC控制软件记录本次测试的相关信息，第一次测试结束。
工作原理：一种闪存存储装置掉电压力测试方法，包括以下步骤：
A、运行设计好的PC控制软件；
B、设置好希望测试的次数后点击开始；
C、软件检查当前测试的次数，如果达到目标次数或***挂掉则停止测试，否继续向简易断电装置发送断上电命令；
D、上电装置向平台提供电源后平台启动；
E、平台上电启动，并不断地向UART串口打印日志，或平台启动成功，处理PC软件发来的命令；
F、软件获得待测平台开机结束的***日志或向PC软件回报命令处理结果；
G、PC软件处理平台回报的结果，并显示在软件上；
H、测试结束。
综上所述，本发明可用于代替人工进行对装有***的闪存存储装置做掉电压力测试，进行掉电测试闪存存储装置装载的***是否稳定，且较现有的技术装置降低采购成本。
尽管已经示出和描述了本发明的实施例，对于本领域的普通技术人员而言，可以理解在不脱离本发明的原理和精神的情况下可以对这些实施例进行多种变化、修改、替换和变型，本发明的范围由所附权利要求及其等同物限定。

Claims (3)

  1. 一种闪存存储装置掉电压力测试方法，其特征在于：包括PC(1)、简易断电装置(2)和平台(3)，所述PC(1)与简易断电装置(2)通过USB连接，所述简易断电装置(2)通过电源输出线向平台(3)提供电源，所述平台(3)与PC(1)之间通过串口、USB或网线连接。
  2. 根据权利要求1所述的一种闪存存储装置掉电压力测试方法，其特征在于：包括以下步骤：
    A、运行设计好的PC控制软件；
    B、设置好希望测试的次数后点击开始；
    C、软件检查当前测试的次数，如果达到目标次数或***挂掉则停止测试，否继续向简易断电装置发送断上电命令；
    D、上电装置向平台提供电源后平台启动；
    E、平台上电启动，并不断地向UART串口打印日志，或平台启动成功，处理PC软件发来的命令；
    F、软件获得待测平台开机结束的***日志或向PC软件回报命令处理结果；
    G、PC软件处理平台回报的结果，并显示在软件上；
    H、测试结束。
  3. 根据权利要求1所述的一种闪存存储装置掉电压力测试方法，其特征在于：所述简易断电装置采用控制开关。
PCT/CN2019/119817 2019-10-31 2019-11-21 一种闪存存储装置掉电压力测试方法 WO2021082110A1 (zh)

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CN113077834A (zh) * 2021-04-23 2021-07-06 深圳创维－Rgb电子有限公司 存储设备测试方法、装置、电视机以及存储介质
CN115035946A (zh) * 2022-08-12 2022-09-09 武汉麓谷科技有限公司 一种可扩展的NVMe固态硬盘测试***
CN115641905B (zh) * 2022-12-19 2023-04-14 合肥康芯威存储技术有限公司 一种数据存储芯片的掉电测试装置及测试方法
CN117746970A (zh) * 2024-02-21 2024-03-22 江苏华存电子科技有限公司 一种断电上电的装置和方法

Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN101650976A (zh) * 2008-08-12 2010-02-17 深圳市朗科科技股份有限公司 闪存管理装置及方法
CN201421721Y (zh) * 2009-02-11 2010-03-10 彭玉元 一种闪存测试仪
CN101719383A (zh) * 2009-11-10 2010-06-02 上海宏力半导体制造有限公司 闪存芯片的测试方法
CN109857599A (zh) * 2018-12-28 2019-06-07 北京旷视科技有限公司 用于硬件设备测试的方法、装置、***和计算机可读介质

Family Cites Families (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN103678067A (zh) * 2013-12-19 2014-03-26 大唐微电子技术有限公司 一种智能卡掉电测试方法、测试设备和被测设备
CN105279072A (zh) * 2015-10-26 2016-01-27 广东威创视讯科技股份有限公司 一种电子产品开机掉电测试方法、装置及***
CN108614754A (zh) * 2018-08-17 2018-10-02 北京航星中云科技有限公司 一种基于飞腾平台的服务器掉电测试方法及装置
CN110147299B (zh) * 2019-05-15 2023-08-29 深圳忆联信息***有限公司 一种用于ssd整机异常掉电测试方法及其***

Patent Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN101650976A (zh) * 2008-08-12 2010-02-17 深圳市朗科科技股份有限公司 闪存管理装置及方法
CN201421721Y (zh) * 2009-02-11 2010-03-10 彭玉元 一种闪存测试仪
CN101719383A (zh) * 2009-11-10 2010-06-02 上海宏力半导体制造有限公司 闪存芯片的测试方法
CN109857599A (zh) * 2018-12-28 2019-06-07 北京旷视科技有限公司 用于硬件设备测试的方法、装置、***和计算机可读介质

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