WO2021046797A1 - 一种天线方向图测试方法、设备及存储介质 - Google Patents
一种天线方向图测试方法、设备及存储介质 Download PDFInfo
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- WO2021046797A1 WO2021046797A1 PCT/CN2019/105631 CN2019105631W WO2021046797A1 WO 2021046797 A1 WO2021046797 A1 WO 2021046797A1 CN 2019105631 W CN2019105631 W CN 2019105631W WO 2021046797 A1 WO2021046797 A1 WO 2021046797A1
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R29/00—Arrangements for measuring or indicating electric quantities not covered by groups G01R19/00 - G01R27/00
- G01R29/08—Measuring electromagnetic field characteristics
- G01R29/10—Radiation diagrams of antennas
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- the present invention relates to the field of control technology, in particular to an antenna pattern test method, equipment and storage medium.
- the test of the antenna pattern depends on the echo of the test target, and the test target generally chooses a stationary corner reflector with a fixed position, because the corner reflector is located in the frequency domain at zero Doppler, and the ground clutter is also mainly located Zero Doppler, so ground clutter will affect the test effect of the antenna pattern.
- the current general solution is to build a microwave anechoic chamber and use absorbing materials to absorb ground clutter.
- the construction cost of a microwave anechoic chamber is extremely high, requiring more capital investment, and also requires more labor and construction costs, so it cannot meet the requirements. The needs of most researchers.
- the embodiments of the present invention provide an antenna pattern test method, device and storage medium, which can reduce the dependence of the antenna pattern on the test environment and the research and development cost, and improve the test effect.
- an embodiment of the present invention provides an antenna pattern test method, including:
- the directional pattern of the antenna is determined.
- an embodiment of the present invention provides an antenna pattern test device, including a memory and a processor;
- the memory is used to store programs
- the processor is used to call the program, and when the program is executed, it is used to perform the following operations:
- the directional pattern of the antenna is determined.
- an embodiment of the present invention provides a computer-readable storage medium, the computer-readable storage medium stores a computer program, and when the computer program is executed by a processor, the method as described in the first aspect is implemented.
- the antenna pattern test equipment acquires echo data generated by the antenna emitting electromagnetic waves to a target scene, the target scene includes a rotating reflector device; and determines the rotation according to the echo data Target echo data corresponding to the reflector device; thereby determining the antenna pattern according to the target echo data. Since the reflector device is in a rotating state, the echo data corresponding to the reflector device can be distinguished from the echo data corresponding to other stationary objects on the ground, thereby avoiding the interference of ground clutter, without resorting to absorbing materials , To ensure the accuracy of the pattern test. Through this implementation manner, the dependence of the antenna pattern on the test environment and the development cost can be reduced, and the test effect can be improved.
- FIG. 1 is a schematic structural diagram of an antenna pattern test system provided by an embodiment of the present invention
- Figure 2a is a schematic structural diagram of a reflector device provided by an embodiment of the present invention.
- Figure 2b is a side view of a reflector device provided by an embodiment of the present invention.
- FIG. 3 is a schematic flowchart of an antenna pattern testing method provided by an embodiment of the present invention.
- FIG. 4 is a schematic flowchart of another antenna pattern test method provided by an embodiment of the present invention.
- Fig. 5 is a two-dimensional transformed image provided by an embodiment of the present invention.
- Fig. 6 is a schematic structural diagram of an antenna pattern test equipment provided by an embodiment of the present invention.
- the antenna pattern test method provided in the embodiment of the present invention may be executed by an antenna pattern test system, specifically, it may be executed by an antenna pattern test device in the antenna pattern test system.
- the antenna pattern test system includes antenna pattern test equipment, reflector device and antenna.
- the antenna pattern test equipment may be connected to the antenna; in some embodiments, the antenna pattern test equipment may be spatially independent of the antenna.
- the antenna pattern test equipment can be installed in a terminal device (for example, a smart phone, a tablet computer, a desktop computer, a laptop computer, etc.).
- the antenna is a radar antenna, and the antenna pattern test equipment can be set on the radar or the upper computer of the radar.
- the reflector device includes a driving member, a corner reflector connected to the driving member, and a sensor; in some embodiments, the driving member includes a motor for driving the corner reflector to rotate; in some embodiments Among them, the sensor includes a light shield and a photoelectric switch.
- the antenna pattern test system provided by the embodiment of the present invention will be schematically described below with reference to FIG. 1.
- FIG. 1 is a schematic structural diagram of an antenna pattern test system provided by an embodiment of the present invention.
- the antenna pattern test system includes: an antenna pattern test device 11, an antenna 12, and a reflector device 13.
- the antenna 12 is a radar antenna
- the antenna pattern test device 11 is set in the radar (not shown) or the upper computer of the radar (not shown).
- FIG. 2a a schematic structural diagram of the reflector device 13 is shown in FIG. 2a
- FIG. 2a is a schematic structural diagram of a transmitter device according to an embodiment of the present invention.
- the reflector device 13 includes a corner reflector 131, a carbon fiber rod 132, a bottom plate 133, a support plate 134, a horizontal plate 135, a mounting plate 136, a reinforcing rib 137, a connecting block 138, a stepping motor 139, and a motor bracket 1310.
- the two corner reflectors 131 are connected by a carbon fiber rod 132, and the two corner reflectors 131 are installed symmetrically at the center of the carbon fiber rod 132.
- the antenna pattern test equipment 11 obtains the echo data generated by the antenna 12 emitting electromagnetic waves to the target scene including the rotating reflector device 13, and determines the rotating reflector device 13 based on the echo data. Corresponding target echo data, thereby determining the directional pattern of the antenna 12 according to the target echo data.
- the antenna 12 can be controlled to rotate to the test angle according to the test angle requirement of the antenna pattern, and wait for the trigger signal sent by the sensor 1311.
- Fig. 2b is a side view of a reflector device provided by an embodiment of the present invention.
- the shading sheet 13111 is fixedly arranged on the coupling 1311, and the photoelectric switch 13112 includes a fixing block And the photoelectric door vertically arranged on the fixed block, the coupling 1311 drives the light shielding sheet 13111 to pass through the gap between the photoelectric doors when rotating, thereby shielding the light beam between the photoelectric doors, and the photoelectric switch 13112 sends a trigger signal at this time.
- the radar After the radar receives the trigger signal, it controls the antenna 12 to transmit electromagnetic waves to the target scene at a test angle and collect echo data. After filtering the echo data, the target echo data corresponding to the reflector device 13 is obtained, so as to determine the directional pattern of the antenna 12 according to the target echo data.
- the antenna pattern test device controls the antenna 12 to face the target scene at the test angle after the preset delay time of the trigger signal is received. Launch electromagnetic waves and collect echo data.
- the antenna pattern test equipment can control the antenna 12 to continuously emit electromagnetic waves to the target scene. And collect echo data.
- FIG. 3 the antenna pattern test method provided by the embodiment of the present invention will be schematically described with reference to FIG. 3 to FIG. 5.
- FIG. 3 the antenna pattern test method provided by the embodiment of the present invention will be schematically described with reference to FIG. 3 to FIG. 5.
- FIG. 3 is a schematic flowchart of an antenna pattern test method provided by an embodiment of the present invention.
- the method can be executed by an antenna pattern test device, where the specific explanation of the antenna pattern test device is as before Said.
- the method of the embodiment of the present invention includes the following steps.
- S301 Acquire echo data generated by the antenna emitting electromagnetic waves to a target scene, where the target scene includes a rotating reflector device.
- the antenna pattern test equipment can obtain echo data generated by the antenna emitting electromagnetic waves to a target scene, and the target scene includes a rotating reflector device.
- the antenna includes, but is not limited to, a radar antenna.
- the reflector device includes a driving part and a corner reflector connected to the driving part.
- the driving part is used to drive the corner reflector to rotate. Rotate every preset time to a position where the reflection port of the corner reflector faces the antenna.
- the antenna pattern test device may control the antenna to rotate to a test angle before acquiring the echo data generated by the antenna transmitting electromagnetic waves to the target scene, and control the antenna to move toward the test angle at the test angle.
- the target scene emits electromagnetic waves.
- the test angle may be preset according to the requirements of the test angle range of the antenna pattern.
- the target scene includes not only the reflector device, but also other things; in some embodiments, the echo data generated by the antenna emitting electromagnetic waves to the target scene includes the reflector device Corresponding reflected target echo data and ground clutter data corresponding to other things in the target scene.
- the test angle can be set in steps of 5 degrees, for example, the test angle is -70 degrees, -65 degrees, -60 degrees, ..., 0 degrees, ... ..., 60 degrees, 65 degrees, 70 degrees.
- the antenna pattern test equipment can control the antenna to rotate to the above-mentioned test angle, and emit electromagnetic waves to the target scene including the reflector device at the above-mentioned test angle, so as to obtain echo data generated by emitting electromagnetic waves to the target scene.
- S302 Determine target echo data corresponding to the rotating reflector device according to the echo data.
- the antenna pattern test equipment can determine the target echo data corresponding to the rotating reflector device according to the echo data.
- the echo data includes ground clutter data and target echo data corresponding to the rotating reflector device.
- the embodiment of the present invention uses a rotating reflector device so that the rotating reflector device
- the corresponding target echo data has a certain Doppler frequency offset. Therefore, the ground clutter data and target echo data can be distinguished according to the Doppler frequency offset, so as to determine the rotation from the echo data.
- the target echo data corresponding to the reflector device is not limited to the reflector device.
- the antenna pattern test equipment when it determines the target echo data corresponding to the rotating reflector device according to the echo data, it can obtain the rotation speed of the reflector device and the reflection The distance between the reflector device and the antenna, and the target echo data corresponding to the rotating reflector device is determined according to the rotation speed, the distance between the reflector device and the antenna, and the echo data.
- the rotation speed of the reflector device may be determined according to the angular velocity of the reflector device's rotation, and the angular velocity of the reflector device's rotation may be determined according to the time for the antenna to transmit and receive a frame of data.
- the time for the antenna to send and receive a frame of data is shown in the following formula (1):
- T is the time for the antenna to send and receive a frame of data
- N is the number of groups of signals transmitted by the antenna in a frame
- PRT is the duration of each group of signals.
- the angle of rotation of the reflector device within the time when the antenna transmits and receives one frame of data is less than a specified angle threshold; in one example, the specified angle threshold is 10 degrees.
- the maximum angular velocity of the reflector device is less than a specified angular velocity threshold, and the specified angular velocity threshold is calculated according to the following formula (2):
- w is the specified angular velocity threshold
- T is the time for the antenna to send and receive a frame of data
- pi is a constant.
- the maximum rotation speed of the reflector device is shown in the following formula (3):
- K is the maximum rotation speed of the reflector device
- w is the specified angular velocity threshold
- pi is a constant.
- the maximum linear velocity at which the reflector device rotates is shown in the following formula (4):
- V w*R (4)
- V is the maximum linear velocity of the rotation of the reflector device
- w is the specified angular velocity threshold
- R is the radius of rotation of the corner reflector of the reflector device.
- the antenna can distinguish the maximum speed of the tested reflector device as shown in the following formula (5):
- V_max is the maximum speed that the radar can distinguish
- PRT is the duration of each group of signal emission
- ⁇ is the wavelength.
- the maximum linear velocity of the rotation of the reflector device needs to be less than the maximum velocity.
- the antenna pattern test equipment determines the target echo corresponding to the rotating reflector device according to the rotation speed, the distance between the reflector device and the antenna, and the echo data.
- Data the echo data can be subjected to a two-dimensional discrete Fourier transform to obtain a two-dimensional transformed image, and the two-dimensional transformed image can be transformed in the two-dimensional image according to the rotation speed and the distance between the reflector device and the antenna.
- Determine the target area in the process and determine the target echo data corresponding to the rotating reflector device according to the target area.
- the antenna pattern test equipment when the antenna pattern test equipment determines the target echo data corresponding to the rotating reflector device according to the target area, it may determine the target according to the energy value in the target area. Echo data. In some embodiments, the maximum value of energy in the target area is used as the target echo data; in some embodiments, the energy value in the target area within a preset energy value range may be used as the target echo data. As the target echo data.
- the antenna pattern test equipment may determine the pattern of the antenna according to the target echo data.
- the target echo data includes target echo data corresponding to multiple test angles; when the antenna pattern test device determines the antenna pattern according to the target echo data, it can The target echo data determines the gain value of the antenna at the multiple test angles, and determines the directional pattern of the antenna according to the gain value of the antenna at the multiple test angles.
- the antenna pattern test equipment acquires echo data generated by the antenna emitting electromagnetic waves to a target scene, the target scene includes a rotating reflector device; and determines the rotation according to the echo data Target echo data corresponding to the reflector device; thereby determining the antenna pattern according to the target echo data. Since the reflector device is in a rotating state, the echo data corresponding to the reflector device can be distinguished from the echo data corresponding to other stationary objects on the ground, thereby avoiding the interference of ground clutter, without resorting to absorbing materials , To ensure the accuracy of the pattern test. Through this implementation manner, the dependence of the antenna pattern on the test environment and the development cost can be reduced, and the test effect can be improved.
- FIG. 4 is a schematic flowchart of another antenna pattern test method provided by an embodiment of the present invention.
- the method can be executed by an antenna pattern test device, where the specific explanation of the antenna pattern test device is as As mentioned earlier.
- the difference between the method of the embodiment of the present invention and the method of the embodiment of FIG. 3 is that the embodiment of the present invention schematically illustrates the process of determining the antenna pattern by acquiring the trigger signal sent by the sensor.
- the method of the embodiment of the present invention includes the following steps.
- S401 Control the antenna to rotate to the test angle.
- the antenna pattern test equipment can control the antenna to rotate to the test angle.
- the specific implementation is as described above.
- S402 Acquire a trigger signal sent by a sensor, where the sensor is used to send the trigger signal when the reflector device rotates to a preset position.
- the antenna pattern test equipment can obtain the trigger signal sent by the sensor, and the sensor is used to send the trigger signal when the reflector device rotates to a preset position.
- the senor includes a light-shielding sheet and a photoelectric switch
- the photoelectric switch includes a photoelectric gate
- the sensor sends the trigger signal when the light-shielding sheet passes between the photoelectric gates.
- the antenna pattern test equipment may control the antenna to emit electromagnetic waves to a target scene at the test angle after obtaining the preset delay time of the trigger signal, and the target scene includes a rotating reflector Device.
- the corner reflector on the reflector device rotates to a position where the reflection port of the corner reflector faces the antenna.
- the predetermined delay time may be the time from when the corner reflector triggers the sensor to the corner reflector's reflection port facing the antenna. It can be seen that the echo data collected by the antenna can be more accurate by setting the preset delay time.
- the antenna pattern test equipment can obtain echo data generated by the antenna emitting electromagnetic waves to the target scene.
- the specific implementation is as described above and will not be repeated here.
- S405 Determine target echo data corresponding to the rotating reflector device according to the echo data.
- the antenna pattern test equipment can determine the target echo data corresponding to the rotating reflector device according to the echo data.
- the antenna pattern test equipment when it determines the target echo data corresponding to the rotating reflector device according to the echo data, it can obtain the rotation speed of the reflector device and the reflection The distance between the reflector device and the antenna, and the target echo data corresponding to the rotating reflector device is determined according to the rotation speed, the distance between the reflector device and the antenna, and the echo data.
- the antenna pattern test equipment determines the target echo corresponding to the rotating reflector device according to the rotation speed, the distance between the reflector device and the antenna, and the echo data.
- Data the echo data can be subjected to a two-dimensional discrete Fourier transform to obtain a two-dimensional transformed image, and the two-dimensional transformed image can be transformed in the two-dimensional image according to the rotation speed and the distance between the reflector device and the antenna.
- Determine the target area in the process and determine the target echo data corresponding to the rotating reflector device according to the target area.
- the antenna pattern test equipment can obtain radar operating parameters when determining the target area in the two-dimensional transformed image according to the rotation speed and the distance between the reflector device and the antenna.
- the radar operating parameters include speed resolution and range resolution, and the Doppler information and Doppler information corresponding to the reflector device are determined according to the rotation speed and the distance between the reflector device and the antenna and the radar operating parameters. Distance information, and determining a target area in the two-dimensional transformed image according to the Doppler information and the distance information.
- the reference value of Doppler and the distance can be determined according to the rotation speed and the distance between the reflector device and the antenna, and the Doppler gate range and the distance can be determined according to the operating parameters of the radar.
- Distance to the gate range According to the reference value, the range of the Doppler gate and the range of the distance gate, the target area can be determined in the above-mentioned two-dimensional transformed image. The maximum energy in the target area is used as the target echo data corresponding to the corner reflector.
- the frequency deviation of the echo is smaller.
- the Doppler wave gate range should not be too large. If it is too large, false detection may occur. If the distance resolution and velocity resolution of the antenna are high, the Doppler wave gate range and distance wave gate range should not be too small at this time, otherwise the detection may be missed.
- FIG. 5 is a two-dimensional transformed image provided by an embodiment of the present invention, where the horizontal axis X corresponds to distance information, and the vertical axis Y corresponds to Doppler information.
- S406 Determine the directional pattern of the antenna according to the target echo data.
- the antenna pattern test equipment may determine the pattern of the antenna according to the target echo data.
- the target echo data includes target echo data corresponding to multiple test angles; when the antenna pattern test device determines the antenna pattern according to the target echo data, it can The echo data determines the gain value of the antenna at the multiple test angles, and determines the directional pattern of the antenna according to the gain value of the antenna at the multiple test angles. For example, the antenna gain values at the multiple test angles may be fitted to obtain the antenna pattern.
- the antenna pattern test equipment can control the antenna to rotate to the test angle, obtain the trigger signal sent by the sensor, and after obtaining the preset delay time of the trigger signal, control the antenna at the test angle Transmit electromagnetic waves to the target scene, and determine the target echo data corresponding to the rotating reflector device according to the acquired echo data generated by the antenna emitting electromagnetic waves to the target scene, so as to determine the target echo data according to the target echo data.
- the pattern of the antenna Since the reflector device is in a rotating state, the echo data corresponding to the reflector device can be distinguished from the echo data corresponding to other stationary objects on the ground, thereby avoiding the interference of ground clutter, without resorting to absorbing materials , To ensure the accuracy of the pattern test. Through this implementation manner, the dependence of the antenna pattern on the test environment and R&D costs can be reduced, and the accuracy of the echo data collected by the antenna can be improved, thereby improving the test effect.
- FIG. 6 is a schematic structural diagram of an antenna pattern test equipment provided by an embodiment of the present invention.
- the antenna pattern test equipment includes: a memory 601 and a processor 602.
- the antenna pattern testing device further includes a data interface 603, and the data interface 603 is used to transfer data information between the antenna pattern testing device and other devices.
- the memory 601 may include a volatile memory (volatile memory); the memory 601 may also include a non-volatile memory (non-volatile memory); the memory 601 may also include a combination of the foregoing types of memories.
- the processor 602 may be a central processing unit (CPU).
- the processor 602 may further include a hardware chip.
- the aforementioned hardware chip may be an application-specific integrated circuit (ASIC), a programmable logic device (PLD), or a combination thereof.
- the above-mentioned PLD may be a complex programmable logic device (CPLD), a field-programmable gate array (FPGA), or any combination thereof.
- the memory 601 is used to store programs, and the processor 602 can call the programs stored in the memory 601 to perform the following steps:
- the directional pattern of the antenna is determined.
- the reflector device includes a driving part and a corner reflector connected to the driving part, the driving part is used to drive the corner reflector to rotate, and the corner reflector is preset every time during the rotation. Time is rotated to the position where the reflection port of the corner reflector faces the antenna.
- the processor 602 obtains the echo data generated by the antenna transmitting electromagnetic waves to the target scene, it is also used to:
- processor 602 is further configured to:
- the processor 602 controls the antenna to emit electromagnetic waves to the target scene at the test angle, it is specifically configured to:
- the senor includes a light shielding sheet and a photoelectric switch
- the photoelectric switch includes a photoelectric gate
- the sensor sends the trigger signal when the light shielding sheet passes between the photoelectric gates.
- the corner reflector on the reflector device rotates to a position where the reflection port of the corner reflector faces the antenna.
- the processor 602 determines the target echo data corresponding to the rotating reflector device according to the echo data, it is specifically configured to:
- the distance between the reflector device and the antenna, and the echo data, target echo data corresponding to the rotating reflector device is determined.
- the processor 602 determines the target echo data corresponding to the rotating reflector device according to the rotation speed, the distance between the reflector device and the antenna, and the echo data, the specific Used for:
- the target echo data corresponding to the rotating reflector device is determined according to the target area.
- the processor 602 determines a target area in the two-dimensional transformed image according to the rotation speed and the distance between the reflector device and the antenna, it is specifically configured to:
- the target area is determined in the two-dimensional transformed image according to the Doppler information and the distance information.
- the processor 602 determines the target echo data corresponding to the rotating reflector device according to the target area, it is specifically configured to:
- the target echo data is determined according to the energy value in the target area.
- the target echo data includes target echo data corresponding to multiple test angles; when the processor 602 determines the directional pattern of the antenna according to the target echo data, it is specifically configured to:
- the antenna pattern test equipment acquires echo data generated by the antenna emitting electromagnetic waves to a target scene, the target scene includes a rotating reflector device; and determines the rotation according to the echo data Target echo data corresponding to the reflector device; thereby determining the antenna pattern according to the target echo data.
- the embodiment of the present invention also provides a computer-readable storage medium, the computer-readable storage medium stores a computer program, and when the computer program is executed by a processor, the present invention is implemented in the embodiment corresponding to FIG. 3 or FIG. 4
- the described method can also implement the device corresponding to the embodiment of the present invention described in FIG. 6, which will not be repeated here.
- the computer-readable storage medium may be the internal storage unit of the device described in any of the foregoing embodiments, for example, the hard disk or memory of the device.
- the computer-readable storage medium may also be an external storage device of the device, such as a plug-in hard disk equipped on the device, a smart memory card (Smart Media Card, SMC), or a Secure Digital (SD) card. , Flash Card, etc.
- the computer-readable storage medium may also include both an internal storage unit of the device and an external storage device.
- the computer-readable storage medium is used to store the computer program and other programs and data required by the terminal.
- the computer-readable storage medium can also be used to temporarily store data that has been output or will be output.
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Abstract
一种天线方向图测试方法、设备、天线及存储介质,其中,该方法包括:获取天线向目标场景发射电磁波而产生的回波数据,目标场景包括转动的反射器装置(S301);根据回波数据,确定出转动的反射器装置对应的目标回波数据(S302);根据目标回波数据,确定天线的方向图(S303)。该方法可以降低天线方向图对测试环境的依赖和研发成本,提高测试效果。
Description
本发明涉及控制技术领域,尤其涉及一种天线方向图测试方法、设备及存储介质。
天线方向图的测试依赖于测试目标的回波,而测试目标普遍选用位置固定的静止的角反射器,由于该角反射器在频域上位于零多普勒,而地物杂波也主要位于零多普勒,因此地物杂波会影响天线方向图的测试效果。当前通用的解决方案是搭建微波暗室,利用吸波材料吸收地物杂波,但微波暗室的搭建成本极其高,需要较多的资金投入,也需要较多的人力成本及建设成本,因此无法满足大部分研究人员的需求。
因此,如何更好地进行天线方向图测试是亟需解决的重要问题。
发明内容
本发明实施例提供了一种天线方向图测试方法、设备及存储介质,可以降低天线方向图对测试环境的依赖和研发成本,提高测试效果。
第一方面,本发明实施例提供了一种天线方向图测试方法,包括:
获取天线向目标场景发射电磁波而产生的回波数据,所述目标场景包括转动的反射器装置;
根据所述回波数据,确定出所述转动的反射器装置对应的目标回波数据;
根据所述目标回波数据,确定所述天线的方向图。
第二方面,本发明实施例提供了一种天线方向图测试设备,包括存储器和处理器;
所述存储器,用于存储程序;
所述处理器,用于调用所述程序,当所述程序被执行时,用于执行以下操作:
获取天线向目标场景发射电磁波而产生的回波数据,所述目标场景包括转动的反射器装置;
根据所述回波数据,确定出所述转动的反射器装置对应的目标回波数据;
根据所述目标回波数据,确定所述天线的方向图。
第三方面,本发明实施例提供了一种计算机可读存储介质,该计算机可读存储介质存储有计算机程序,该计算机程序被处理器执行时实现如上述第一方面所述的方法。
本发明实施例中,天线方向图测试设备通过获取天线向目标场景发射电磁波而产生的回波数据,所述目标场景包括转动的反射器装置;并根据所述回波数据,确定出所述转动的反射器装置对应的目标回波数据;从而根据所述目标回波数据,确定所述天线的方向图。由于反射器装置处于转动状态,因此反射器装置对应的回波数据能够与地面上其他静止物体对应的回波数据区分开,从而避免了地杂波的干扰,在不借助吸波材料的情况下,保证了方向图测试的精确度。通过这种实施方式,可以降低天线方向图对测试环境的依赖和研发成本,提高测试效果。
为了更清楚地说明本发明实施例或现有技术中的技术方案,下面将对实施例中所需要使用的附图作简单地介绍,显而易见地,下面描述中的附图仅仅是本发明的一些实施例,对于本领域普通技术人员来讲,在不付出创造性劳动的前提下,还可以根据这些附图获得其他的附图。
图1是本发明实施例提供的一种天线方向图测试***的结构示意图;
图2a是本发明实施例提供的一种反射器装置的结构示意图;
图2b是本发明实施例提供的一种反射器装置的侧视图;
图3是本发明实施例提供的一种天线方向图测试方法的流程示意图;
图4是本发明实施例提供的另一种天线方向图测试方法的流程示意图;
图5为本发明实施例提供的一种二维变换图像;
图6是本发明实施例提供的一种天线方向图测试设备的结构示意图。
下面将结合本发明实施例中的附图,对本发明实施例中的技术方案进行清楚地描述,显然,所描述的实施例仅仅是本发明一部分实施例,而不是全部的 实施例。基于本发明中的实施例,本领域普通技术人员在没有做出创造性劳动前提下所获得的所有其他实施例,都属于本发明保护的范围。
下面结合附图,对本发明的一些实施方式作详细说明。在不冲突的情况下,下述的实施例及实施例中的特征可以相互组合。
本发明实施例中提供的天线方向图测试方法可以由一种天线方向图测试***执行,具体的,可以由天线方向图测试***中的天线方向图测试设备执行。其中,天线方向图测试***包括天线方向图测试设备、反射器装置和天线。在某些实施例中,天线方向图测试设备可以和天线连接;在某些实施例中,天线方向图测试设备可以在空间上独立于天线。在某些实施例中,天线方向图测试设备可以设置于终端设备(例如智能手机、平板电脑、台式电脑、膝上型电脑等)。在某些实施例中,天线为雷达天线,天线方向图测试设备可以设置于雷达或雷达的上位机。在某些实施例中,反射器装置包括驱动件、连接于驱动件的角反射器以及传感器;在某些实施例中,驱动件包括电机,用于驱动角反射器旋转;在某些实施例中,传感器包括遮光片和光电开关。
下面结合附图1对本发明实施例提供的天线方向图测试***进行示意性说明。
请参见图1,图1是本发明实施例提供的一种天线方向图测试***的结构示意图。天线方向图测试***包括:天线方向图测试设备11、天线12和反射器装置13。在一个实施例中,天线12为雷达天线,天线方向图测试设备11设置于雷达(图未示)或雷达的上位机(图未示)中。
在一个实施例中,反射器装置13的结构示意图如图2a所示,图2a是本发明实施例提供的一种发射器装置的结构示意图。如图2a所示,反射器装置13包括角反射器131、碳纤棒132、底板133、支撑板134、水平板135、安装板136、加强筋137、连接块138、步进电机139、电机支架1310、连轴器1311、传感器1311,其中,传感器1311包括遮光片13111和光电开关13112。在某些实施例中,两个角反射器131通过一根碳纤棒132连接,两个角反射器131于碳纤棒132中心对称安装。
在一个实施例中,天线方向图测试设备11通过获取天线12向包括转动的反射器装置13的目标场景发射电磁波而产生的回波数据,并根据回波数据,确定出转动的反射器装置13对应的目标回波数据,从而根据目标回波数 据,确定天线12的方向图。
在一个实施例中,在反射器装置13持续转动的过程中,可以根据天线方向图的测试角度需求,控制天线12转动到测试角度,等待传感器1311发送的触发信号。如图2b所示,图2b是本发明实施例提供的一种反射器装置的侧视图,在一个可选的实施方式中,遮光片13111固定设置于连轴器1311,光电开关13112包括固定块和竖直设置在固定块上的光电门,连轴器1311带动遮光片13111转动时经过光电门之间的间隙,从而遮住光电门之间的光束,此时光电开关13112发出一个触发信号。雷达接收到触发信号后,控制天线12以测试角度向目标场景发射电磁波并采集回波数据。通过对回波数据进行筛选后得到反射器装置13对应的目标回波数据,从而根据目标回波数据,确定天线12的方向图。
在一个实施例中,根据天线方向图的测试角度需求,控制天线12转动到测试角度后,天线方向图测试设备在接收到触发信号的预设延迟时间后,控制天线12以测试角度向目标场景发射电磁波,并采集回波数据。
在一个实施例中,根据天线方向图的测试角度需求,控制天线12转动到测试角度后,在反射器装置13持续转动的过程中,天线方向图测试设备可控制天线12持续向目标场景发射电磁波并采集回波数据。
下面结合附图3-附图5对本发明实施例提供的天线方向图测试方法进行示意性说明。
具体请参见图3,图3是本发明实施例提供的一种天线方向图测试方法的流程示意图,所述方法可以由天线方向图测试设备执行,其中,天线方向图测试设备的具体解释如前所述。具体地,本发明实施例的所述方法包括如下步骤。
S301:获取天线向目标场景发射电磁波而产生的回波数据,所述目标场景包括转动的反射器装置。
本发明实施例中,天线方向图测试设备可以获取天线向目标场景发射电磁波而产生的回波数据,所述目标场景包括转动的反射器装置。某些实施例中,所述天线包括但不限于雷达天线。
在某些实施例中,所述反射器装置包括驱动件和连接于所述驱动件的角反射器,所述驱动件用于驱动所述角反射器旋转,所述角反射器在转动过程中每 隔预设时间转动至所述角反射器的反射口朝向所述天线的位置。
在一个实施例中,天线方向图测试设备在获取天线向目标场景发射电磁波而产生的回波数据之前,可以控制所述天线转动到测试角度,并控制所述天线以所述测试角度向所述目标场景发射电磁波。在某些实施例中,所述测试角度可以是根据天线方向图测试角度范围需求预先设置的。某些实施例中,所述目标场景除包括反射器装置以外,还包括其他的事物;在某些实施例中,所述天线向目标场景发射电磁波而产生的回波数据包括所述反射器装置对应反射的目标回波数据和所述目标场景中其他事物对应的地物杂波数据。
示例的,假设雷达天线的测试角度范围为±70度,则可以以5度为步进设置测试角度,例如测试角度为-70度、-65度、-60度、……、0度、……、60度、65度、70度。则天线方向图测试设备可以控制天线转动到上述测试角度,并以上述测试角度向包括反射器装置的目标场景发射电磁波,以获取向目标场景发射电磁波而产生的回波数据。
S302:根据所述回波数据,确定出所述转动的反射器装置对应的目标回波数据。
本发明实施例中,天线方向图测试设备可以根据所述回波数据,确定出所述转动的反射器装置对应的目标回波数据。
在一个实施例中,所述回波数据中包括地物杂波数据和所述转动的反射器装置对应的目标回波数据,本发明实施例采用转动的反射器装置,使得转动的反射器装置对应的目标回波数据具有一定的多普勒频偏,因此可以根据多普勒频偏将地物杂波数据和目标回波数据进行区分,从而从所述回波数据中确定出所述转动的反射器装置对应的目标回波数据。
在一个实施例中,天线方向图测试设备在根据所述回波数据,确定出所述转动的反射器装置对应的目标回波数据时,可以获取所述反射器装置的转动速度和所述反射器装置与所述天线的距离,并根据所述转动速度和所述反射器装置与所述天线的距离以及所述回波数据,确定出所述转动的反射器装置对应的目标回波数据。
在一个实施例中,所述反射器装置的转动速度可以根据所述反射器装置转动的角速度确定,所述反射器装置转动的角速度可以根据天线收发一帧数据的时间确定。在某些实施例中,所述天线收发一帧数据的时间如下公式(1)所 示:
T=N*PRT (1)
其中,T是天线收发一帧数据的时间,N是一帧中天线传输的信号的组数,PRT是每组信号发射的持续时间。
在某些实施例中,所述反射器装置在天线收发一帧数据的时间内的转动角度小于指定角度阈值;在一个示例中,所述指定角度阈值为10度。通过这种限定反射器装置在天线收发一帧数据的时间内的转动角度,可以提高天线采集回波数据的准确性。
在某些实施例中,所述反射器装置的最大角速度小于指定角速度阈值,所述指定角速度阈值是根据如下公式(2)计算得到:
其中,w是指定角速度阈值,T是天线收发一帧数据的时间,pi是常数。
在某些实施例中,所述反射器装置转动的最大转速为如下公式(3)所示:
其中,K为反射器装置转动的最大转速,w为指定角速度阈值,pi为常数。
在某些实施例中,所述反射器装置转动的最大线速度为如下公式(4)所示:
V=w*R (4)
其中,V为反射器装置转动的最大线速度,w为指定角速度阈值,R为反射器装置的角反射器的旋转半径。
在某些实施例中,所述天线可以分辨测试的反射器装置的最大速度为如下公式(5)所示:
其中,V_max为雷达可以分辨的最大速度,PRT是每组信号发射的持续时间,λ为波长。反射器装置转动的最大线速度需小于该最大速度。
在一个实施例中,天线方向图测试设备在根据所述转动速度和所述反射器装置与所述天线的距离以及所述回波数据,确定出所述转动的反射器装置对应的目标回波数据时,可以对所述回波数据进行二维离散傅里叶变换以得到二维变换图像,并根据所述转动速度和所述反射器装置与所述天线的距离在所述二 维变换图像中确定目标区域,以及根据所述目标区域确定出所述转动的反射器装置对应的目标回波数据。
在一个实施例中,天线方向图测试设备在根据所述目标区域,确定出所述转动的反射器装置对应的目标回波数据时,可以根据所述目标区域中的能量值,确定所述目标回波数据。在某些实施例中,将所述目标区域中的能量最大值作为所述目标回波数据;在某些实施例中,可以将所述目标区域中的在预设能量值范围内的能量值作为目标回波数据。
S303:根据所述目标回波数据,确定所述天线的方向图。
本发明实施例中,天线方向图测试设备可以根据所述目标回波数据,确定所述天线的方向图。
在一个实施例中,所述目标回波数据包括多个测试角度对应的目标回波数据;天线方向图测试设备在根据所述目标回波数据,确定所述天线的方向图时,可以根据所述目标回波数据确定所述天线在所述多个测试角度的增益值,并根据所述天线在所述多个测试角度的增益值,确定所述天线的方向图。
本发明实施例中,天线方向图测试设备通过获取天线向目标场景发射电磁波而产生的回波数据,所述目标场景包括转动的反射器装置;并根据所述回波数据,确定出所述转动的反射器装置对应的目标回波数据;从而根据所述目标回波数据,确定所述天线的方向图。由于反射器装置处于转动状态,因此反射器装置对应的回波数据能够与地面上其他静止物体对应的回波数据区分开,从而避免了地杂波的干扰,在不借助吸波材料的情况下,保证了方向图测试的精确度。通过这种实施方式可以降低天线方向图对测试环境的依赖和研发成本,提高测试效果。
具体请参见图4,图4是本发明实施例提供的另一种天线方向图测试方法的流程示意图,所述方法可以由天线方向图测试设备执行,其中,天线方向图测试设备的具体解释如前所述。具体地,本发明实施例的所述方法与图3所述实施例的方法的区别在于,本发明实施例是对通过获取传感器发送的触发信号来确定天线的方向图的过程进行示意性说明,本发明实施例的所述方法包括如下步骤。
S401:控制天线转动到测试角度。
本发明实施例中,天线方向图测试设备可以控制天线转动到测试角度。具体实施例如前所述。
S402:获取传感器发送的触发信号,所述传感器用于在反射器装置转动至预设位置时发送所述触发信号。
本发明实施例中,天线方向图测试设备可以获取传感器发送的触发信号,所述传感器用于在反射器装置转动至预设位置时发送所述触发信号。
在一些实施例中,所述传感器包括遮光片和光电开关,所述光电开关包括光电门,所述传感器在所述遮光片经过所述光电门之间时发送所述触发信号。
S403:在获取到所述触发信号的预设延迟时间后,控制所述天线以所述测试角度向目标场景发射电磁波,所述目标场景包括转动的反射器装置。
本发明实施例中,天线方向图测试设备可以在获取到所述触发信号的预设延迟时间后,控制所述天线以所述测试角度向目标场景发射电磁波,所述目标场景包括转动的反射器装置。
在一些实施例中,所述获取到所述触发信号的预设延迟时间后,所述反射器装置上的角反射器转动至所述角反射器的反射口朝向所述天线的位置。在某些实施例中,所述预设延迟时间可以是角反射器触发传感器到角反射器的反射口朝向所述天线的时间。可见,通过设置预设延迟时间可以天线采集到的回波数据更准确。
S404:获取天线向目标场景发射电磁波而产生的回波数据。
本发明实施例中,天线方向图测试设备可以获取天线向目标场景发射电磁波而产生的回波数据。具体实施例如前所述,此处不再赘述。
S405:根据所述回波数据,确定出所述转动的反射器装置对应的目标回波数据。
本发明实施例中,天线方向图测试设备可以根据所述回波数据,确定出所述转动的反射器装置对应的目标回波数据。
在一个实施例中,天线方向图测试设备在根据所述回波数据,确定出所述转动的反射器装置对应的目标回波数据时,可以获取所述反射器装置的转动速度和所述反射器装置与所述天线的距离,并根据所述转动速度和所述反射器装置与所述天线的距离以及所述回波数据,确定出所述转动的反射器装置对应的目标回波数据。
在一个实施例中,天线方向图测试设备在根据所述转动速度和所述反射器装置与所述天线的距离以及所述回波数据,确定出所述转动的反射器装置对应的目标回波数据时,可以对所述回波数据进行二维离散傅里叶变换以得到二维变换图像,并根据所述转动速度和所述反射器装置与所述天线的距离在所述二维变换图像中确定目标区域,以及根据所述目标区域确定出所述转动的反射器装置对应的目标回波数据。
在一个实施例中,天线方向图测试设备在根据所述转动速度和所述反射器装置与所述天线的距离在所述二维变换图像中确定目标区域时,可以获取雷达工作参数,所述雷达工作参数包括速度分辨率和距离分辨率,并根据所述转动速度和所述反射器装置与所述天线的距离以及所述雷达工作参数,确定所述反射器装置对应的多普勒信息和距离信息,以及根据所述多普勒信息和距离信息在所述二维变换图像中确定目标区域。
在一个实施例中,根据所述转动速度和所述反射器装置与所述天线的距离可确定多普勒和距离的基准值,进一步根据所述雷达工作参数可以确定多普勒波门范围、距离波门范围。根据所述基准值、所述多普勒波门范围和距离波门范围可以在上述二维变换图像内确定目标区域。将该目标区域中的能量最大值作为角反射器对应的目标回波数据。通过这种实施方式,可以防止采集回波数据时出现测距误差、测速误差等导致角反射器的回波数据异常、测到的方向图不准等问题。
在某些实施例中,若角反射器的转速较慢,则其回波的频偏较小,此时多普勒波门范围不应太大,太大可能会出现虚检。若天线的距离分辨率与速度分辨率较高,则此时多普勒波门范围和距离波门范围不应太小,否则可能会漏检。
示例的,请参考图5,图5是本发明实施例提供的一种二维变换图像,其中横轴X对应于距离信息,纵轴Y对应于多普勒信息。天线方向图测试设备根据反射器装置的转动速度、反射器装置与所述天线的距离、雷达的速度分辨率和距离分辨率可以确定目标区域,即图5中黑色方框所指示的区域,并将目标区域中的能量最大值作为目标回波数据,即Z=123.8。如此,可以得到角反射器反射的能量,结合发射能量、空间损耗等即可计算出天线在对应的测试角度上的增益。
S406:根据所述目标回波数据,确定所述天线的方向图。
本发明实施例中,天线方向图测试设备可以根据所述目标回波数据,确定所述天线的方向图。
在一个实施例中,所述目标回波数据包括多个测试角度对应的目标回波数据;天线方向图测试设备在根据所述目标回波数据,确定所述天线的方向图时,可以根据所述回波数据确定所述天线在所述多个测试角度的增益值,并根据所述天线在所述多个测试角度的增益值,确定所述天线的方向图。示例的,可将天线在所述多个测试角度的增益值进行拟合,得到所述天线的方向图。
本发明实施例中,天线方向图测试设备可以控制天线转动到测试角度,获取传感器发送的触发信号,并在获取到所述触发信号的预设延迟时间后,控制所述天线以所述测试角度向目标场景发射电磁波,以及根据获取到的天线向目标场景发射电磁波而产生的回波数据,确定出转动的反射器装置对应的目标回波数据,从而根据所述目标回波数据,确定所述天线的方向图。由于反射器装置处于转动状态,因此反射器装置对应的回波数据能够与地面上其他静止物体对应的回波数据区分开,从而避免了地杂波的干扰,在不借助吸波材料的情况下,保证了方向图测试的精确度。通过这种实施方式,可以降低天线方向图对测试环境的依赖和研发成本,提高天线采集回波数据的准确性,从而提高测试效果。
请参见图6,图6是本发明实施例提供的一种天线方向图测试设备的结构示意图。具体的,所述天线方向图测试设备包括:存储器601、处理器602。
在一种实施例中,所述天线方向图测试设备还包括数据接口603,所述数据接口603,用于传递天线方向图测试设备和其他设备之间的数据信息。
所述存储器601可以包括易失性存储器(volatile memory);存储器601也可以包括非易失性存储器(non-volatile memory);存储器601还可以包括上述种类的存储器的组合。所述处理器602可以是中央处理器(central processing unit,CPU)。所述处理器602还可以进一步包括硬件芯片。上述硬件芯片可以是专用集成电路(application-specific integrated circuit,ASIC),可编程逻辑器件(programmable logic device,PLD)或其组合。上述PLD可以是复杂可编程逻辑器件(complex programmable logic device,CPLD),现场可编程逻辑门 阵列(field-programmable gate array,FPGA)或其任意组合。
所述存储器601用于存储程序,所述处理器602可以调用存储器601中存储的程序,用于执行如下步骤:
获取天线向目标场景发射电磁波而产生的回波数据,所述目标场景包括转动的反射器装置;
根据所述回波数据,确定出所述转动的反射器装置对应的目标回波数据;
根据所述目标回波数据,确定所述天线的方向图。
进一步地,所述反射器装置包括驱动件和连接于所述驱动件的角反射器,所述驱动件用于驱动所述角反射器旋转,所述角反射器在转动过程中每隔预设时间转动至所述角反射器的反射口朝向所述天线的位置。
进一步地,所述处理器602获取天线向目标场景发射电磁波而产生的回波数据之前,还用于:
控制所述天线转动到测试角度;
控制所述天线以所述测试角度向所述目标场景发射电磁波。
进一步地,所述处理器602还用于:
获取传感器发送的触发信号,所述传感器用于在所述反射器装置转动至预设位置时发送所述触发信号;
所述处理器602控制所述天线以所述测试角度向所述目标场景发射电磁波时,具体用于:
在获取到所述触发信号的预设延迟时间后,控制所述天线以所述测试角度向所述目标场景发射电磁波。
进一步地,所述传感器包括遮光片和光电开关,所述光电开关包括光电门,所述传感器在所述遮光片经过所述光电门之间时发送所述触发信号。
进一步地,所述获取到所述触发信号的预设延迟时间后,所述反射器装置上的角反射器转动至所述角反射器的反射口朝向所述天线的位置。
进一步地,所述处理器602根据所述回波数据,确定出所述转动的反射器装置对应的目标回波数据时,具体用于:
获取所述反射器装置的转动速度和所述反射器装置与所述天线的距离;
根据所述转动速度和所述反射器装置与所述天线的距离以及所述回波数据,确定出所述转动的反射器装置对应的目标回波数据。
进一步地,所述处理器602根据所述转动速度和所述反射器装置与所述天线的距离以及所述回波数据,确定出所述转动的反射器装置对应的目标回波数据时,具体用于:
对所述回波数据进行二维离散傅里叶变换以得到二维变换图像;
根据所述转动速度和所述反射器装置与所述天线的距离在所述二维变换图像中确定目标区域;
根据所述目标区域确定出所述转动的反射器装置对应的目标回波数据。
进一步地,所述处理器602根据所述转动速度和所述反射器装置与所述天线的距离在所述二维变换图像中确定目标区域时,具体用于:
获取雷达工作参数,所述雷达工作参数包括速度分辨率和距离分辨率;
根据所述转动速度和所述反射器装置与所述天线的距离以及所述雷达工作参数,确定所述反射器装置对应的多普勒信息和距离信息;
根据所述多普勒信息和距离信息在所述二维变换图像中确定目标区域。
进一步地,所述处理器602根据所述目标区域,确定出所述转动的反射器装置对应的目标回波数据时,具体用于:
根据所述目标区域中的能量值,确定所述目标回波数据。
进一步地,所述目标回波数据包括多个测试角度对应的目标回波数据;所述处理器602根据所述目标回波数据,确定所述天线的方向图时,具体用于:
根据所述回波数据确定所述天线在所述多个测试角度的增益值;
根据所述天线在所述多个测试角度的增益值,确定所述天线的方向图。
本发明实施例中,天线方向图测试设备通过获取天线向目标场景发射电磁波而产生的回波数据,所述目标场景包括转动的反射器装置;并根据所述回波数据,确定出所述转动的反射器装置对应的目标回波数据;从而根据所述目标回波数据,确定所述天线的方向图。通过这种实施方式,可以降低天线方向图对测试环境的依赖和研发成本,提高测试效果。
本发明的实施例还提供了一种计算机可读存储介质,所述计算机可读存储介质存储有计算机程序,所述计算机程序被处理器执行时实现本发明图3或图4所对应实施例中描述的方法,也可实现图6所述本发明所对应实施例的设备,在此不再赘述。
所述计算机可读存储介质可以是前述任一实施例所述的设备的内部存储 单元,例如设备的硬盘或内存。所述计算机可读存储介质也可以是所述设备的外部存储设备,例如所述设备上配备的插接式硬盘,智能存储卡(Smart Media Card,SMC),安全数字(Secure Digital,SD)卡,闪存卡(Flash Card)等。进一步地,所述计算机可读存储介质还可以既包括所述设备的内部存储单元也包括外部存储设备。所述计算机可读存储介质用于存储所述计算机程序以及所述终端所需的其他程序和数据。所述计算机可读存储介质还可以用于暂时地存储已经输出或者将要输出的数据。
以上所揭露的仅为本发明部分实施例而已,当然不能以此来限定本发明之权利范围,因此依本发明权利要求所作的等同变化,仍属本发明所涵盖的范围。
Claims (23)
- 一种天线方向图测试方法,其特征在于,包括:获取天线向目标场景发射电磁波而产生的回波数据,所述目标场景包括转动的反射器装置;根据所述回波数据,确定出所述转动的反射器装置对应的目标回波数据;根据所述目标回波数据,确定所述天线的方向图。
- 根据权利要求1所述的方法,其特征在于,所述反射器装置包括驱动件和连接于所述驱动件的角反射器,所述驱动件用于驱动所述角反射器旋转,所述角反射器在转动过程中每隔预设时间转动至所述角反射器的反射口朝向所述天线的位置。
- 根据权利要求1所述的方法,其特征在于,所述获取天线向目标场景发射电磁波而产生的回波数据之前,还包括:控制所述天线转动到测试角度;控制所述天线以所述测试角度向所述目标场景发射电磁波。
- 根据权利要求3所述的方法,其特征在于,还包括:获取传感器发送的触发信号,所述传感器用于在所述反射器装置转动至预设位置时发送所述触发信号;所述控制所述天线以所述测试角度向所述目标场景发射电磁波,包括:在获取到所述触发信号的预设延迟时间后,控制所述天线以所述测试角度向所述目标场景发射电磁波。
- 根据权利要求4所述的方法,其特征在于,所述传感器包括遮光片和光电开关,所述光电开关包括光电门,所述传感器在所述遮光片经过所述光电门之间时发送所述触发信号。
- 根据权利要求4所述的方法,其特征在于,所述获取到所述触发信号的预设延迟时间后,所述反射器装置上的角反射器转动至所述角反射器的反射口朝向所述天线的位置。
- 根据权利要求1所述的方法,其特征在于,所述根据所述回波数据,确定出所述转动的反射器装置对应的目标回波数据,包括:获取所述反射器装置的转动速度和所述反射器装置与所述天线的距离;根据所述转动速度和所述反射器装置与所述天线的距离以及所述回波数据,确定出所述转动的反射器装置对应的目标回波数据。
- 根据权利要求7所述的方法,其特征在于,所述根据所述转动速度和所述反射器装置与所述天线的距离以及所述回波数据,确定出所述转动的反射器装置对应的目标回波数据,包括:对所述回波数据进行二维离散傅里叶变换以得到二维变换图像;根据所述转动速度和所述反射器装置与所述天线的距离,在所述二维变换图像中确定目标区域;根据所述目标区域确定出所述转动的反射器装置对应的目标回波数据。
- 根据权利要求8所述的方法,其特征在于,所述根据所述转动速度和所述反射器装置与所述天线的距离,在所述二维变换图像中确定目标区域,包括:获取雷达工作参数,所述雷达工作参数包括速度分辨率和距离分辨率;根据所述转动速度和所述反射器装置与所述天线的距离以及所述雷达工作参数,确定所述反射器装置对应的多普勒信息和距离信息;根据所述多普勒信息和距离信息在所述二维变换图像中确定目标区域。
- 根据权利要求9所述的方法,其特征在于,所述根据所述目标区域,确定出所述转动的反射器装置对应的目标回波数据,包括:根据所述目标区域中的能量值,确定所述目标回波数据。
- 根据权利要求1所述的方法,其特征在于,所述目标回波数据包括多 个测试角度对应的目标回波数据;所述根据所述目标回波数据,确定所述天线的方向图,包括:根据所述回波数据确定所述天线在所述多个测试角度的增益值;根据所述天线在所述多个测试角度的增益值,确定所述天线的方向图。
- 一种天线方向图测试设备,其特征在于,包括存储器和处理器;所述存储器,用于存储程序;所述处理器,用于调用所述程序,当所述程序被执行时,用于执行以下操作:获取天线向目标场景发射电磁波而产生的回波数据,所述目标场景包括转动的反射器装置;根据所述回波数据,确定出所述转动的反射器装置对应的目标回波数据;根据所述目标回波数据,确定所述天线的方向图。
- 根据权利要求12所述的设备,其特征在于,所述反射器装置包括驱动件和连接于所述驱动件的角反射器,所述驱动件用于驱动所述角反射器旋转,所述角反射器在转动过程中每隔预设时间转动至所述角反射器的反射口朝向所述天线的位置。
- 根据权利要求12所述的设备,其特征在于,所述处理器获取天线向目标场景发射电磁波而产生的回波数据之前,还用于:控制所述天线转动到测试角度;控制所述天线以所述测试角度向所述目标场景发射电磁波。
- 根据权利要求14所述的设备,其特征在于,所述处理器还用于:获取传感器发送的触发信号,所述传感器用于在所述反射器装置转动至预设位置时发送所述触发信号;所述处理器控制所述天线以所述测试角度向所述目标场景发射电磁波时,具体用于:在获取到所述触发信号的预设延迟时间后,控制所述天线以所述测试角度 向所述目标场景发射电磁波。
- 根据权利要求15所述的设备,其特征在于,所述传感器包括遮光片和光电开关,所述光电开关包括光电门,所述传感器在所述遮光片经过所述光电门之间时发送所述触发信号。
- 根据权利要求15所述的设备,其特征在于,所述获取到所述触发信号的预设延迟时间后,所述反射器装置上的角反射器转动至所述角反射器的反射口朝向所述天线的位置。
- 根据权利要求12所述的设备,其特征在于,所述处理器根据所述回波数据,确定出所述转动的反射器装置对应的目标回波数据时,具体用于:获取所述反射器装置的转动速度和所述反射器装置与所述天线的距离;根据所述转动速度和所述反射器装置与所述天线的距离以及所述回波数据,确定出所述转动的反射器装置对应的目标回波数据。
- 根据权利要求18所述的设备,其特征在于,所述处理器根据所述转动速度和所述反射器装置与所述天线的距离以及所述回波数据,确定出所述转动的反射器装置对应的目标回波数据时,具体用于:对所述回波数据进行二维离散傅里叶变换以得到二维变换图像;根据所述转动速度和所述反射器装置与所述天线的距离,在所述二维变换图像中确定目标区域;根据所述目标区域确定出所述转动的反射器装置对应的目标回波数据。
- 根据权利要求19所述的设备,其特征在于,所述处理器根据所述转动速度和所述反射器装置与所述天线的距离,在所述二维变换图像中确定目标区域时,具体用于:获取雷达工作参数,所述雷达工作参数包括速度分辨率和距离分辨率;根据所述转动速度和所述反射器装置与所述天线的距离以及所述雷达工作参数,确定所述反射器装置对应的多普勒信息和距离信息;根据所述多普勒信息和距离信息在所述二维变换图像中确定目标区域。
- 根据权利要求20所述的设备,其特征在于,所述处理器根据所述目标区域,确定出所述转动的反射器装置对应的目标回波数据时,具体用于:根据所述目标区域中的能量值,确定所述目标回波数据。
- 根据权利要求12所述的设备,其特征在于,所述目标回波数据包括多个测试角度对应的目标回波数据;所述处理器根据所述目标回波数据,确定所述天线的方向图时,具体用于:根据所述回波数据确定所述天线在所述多个测试角度的增益值;根据所述天线在所述多个测试角度的增益值,确定所述天线的方向图。
- 一种计算机可读存储介质,所述计算机可读存储介质存储有计算机程序,其特征在于,所述计算机程序被处理器执行时实现如权利要求1至11任一项所述方法。
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