WO2021012634A1

WO2021012634A1 - Phase gain full-temperature automatic testing device and method for double-channel frequency conversion system

Info

Publication number: WO2021012634A1
Application number: PCT/CN2020/070254
Authority: WO
Inventors: 包晓军; 李琳; 刘会涛; 王育才; 刘远曦; 王永刚; 林政汉
Original assignee: 珠海纳睿达科技有限公司
Priority date: 2019-07-19
Filing date: 2020-01-03
Publication date: 2021-01-28
Also published as: CN110380742A; CN110380742B

Abstract

A phase gain full-temperature automatic testing device for a double-channel frequency conversion system, wherein same is applicable to testing of a double-channel simulation TR assembly with added upper and lower frequency conversion parts. The phase gain full-temperature automatic testing device comprises: a frequency source for outputting a signal with a specified frequency; a frequency converter for up-converting and down-converting the frequency of the signal; an intermediate frequency amplification module for amplifying an intermediate frequency signal; a high-power radio frequency switch for respectively connecting an A port and a B port of a double-channel simulation TR assembly to be tested to the frequency converter; a single-pole multi-throw switch for respectively connecting a high local oscillator and a low local oscillator of the double-channel simulation TR assembly to be tested to the frequency source; an intermediate frequency switch module for respectively connecting an intermediate frequency port group of the double-channel simulation TR assembly to be tested to the intermediate frequency amplification module; and a network analyzer for connecting the intermediate frequency amplification module to the frequency converter to form a detection path, wherein the double-channel simulation TR assembly is arranged inside a temperature-controllable temperature box.

Description

双通道变频***的相位增益全温度自动化测试装置及方法Phase gain full temperature automatic test device and method of dual-channel frequency conversion system

技术领域Technical field

本发明涉及天线设备测试技术领域，尤其涉及一种双通道变频***的相位增益全温度自动化测试装置及其使用方法。The invention relates to the technical field of antenna equipment testing, in particular to a phase gain full temperature automatic test device of a dual-channel frequency conversion system and a use method thereof.

背景技术Background technique

ATR组件是一种附带有上下变频部分的双通道模拟TR(Transmitter and Receiver)组件。该电子元件是现代有源相控阵雷达***的核心部件，其主要功能是实现射频微波信号的收发、增益、相移等指标的自动控制。因此，在有源相控阵雷达***的每个天线单元中均配置有一个ATR组件作为雷达射频前端。The ATR component is a dual-channel analog TR (Transmitter and Receiver) component with an up-down conversion part. This electronic component is the core component of the modern active phased array radar system. Its main function is to realize the automatic control of radio frequency microwave signal transmission and reception, gain, phase shift and other indicators. Therefore, each antenna unit of the active phased array radar system is equipped with an ATR component as the radar radio frequency front end.

在实际应用中，因为单个有源相控阵雷达***一般需要集合数千个独立的ATR组件，所以在雷达的生产过程中ATR组件生产和测试数量极大。一方面，ATR组件的制造工艺复杂，功能部件较多：既有大功率电平发射通道，又有高增益、低噪声的接收通道。一般地，ATR组件包含环形器、隔离器、限幅器、低噪声放大器(Low Noise Amplifier，LNA)、数字衰减器、数字移相器、收发开关、驱动及逻辑控制电路等。它是集高频、低频、大信号、小信号等为一体的复杂功能器件。另一方面，单个ATR组件需要测试指标多(例如频率范围、发射功率、发射/接收增益、收发隔离度、衰减范围/精度以及相移范围/精度等)。这使得ATR组件的测试过程繁琐且需要处理的大量测试数据。In practical applications, because a single active phased array radar system generally requires a collection of thousands of independent ATR components, the number of ATR components produced and tested in the radar production process is extremely large. On the one hand, the manufacturing process of ATR components is complicated, and there are many functional parts: both high-power level transmitting channels and high-gain, low-noise receiving channels. Generally, ATR components include a circulator, an isolator, a limiter, a low noise amplifier (LNA), a digital attenuator, a digital phase shifter, a transceiver switch, a drive and logic control circuit, etc. It is a complex functional device integrating high frequency, low frequency, large signal, small signal, etc. On the other hand, a single ATR component requires many test indicators (such as frequency range, transmit power, transmit/receive gain, transceiver isolation, attenuation range/precision, and phase shift range/precision, etc.). This makes the testing process of ATR components cumbersome and requires a large amount of test data to be processed.

因此，如何在不同温度下批量地测试ATR组件对自动化测试***提出了严格的要求。Therefore, how to test ATR components in batches at different temperatures places strict requirements on the automated test system.

发明内容Summary of the invention

本申请的目的是解决现有技术的不足，提供一种双通道变频***的相位增益全温度自动化测试装置及其使用方法，能够获得一次性测试出多个ATR组件在不同工作温度下的增益和相对相位的效果。其中，被测试的ATR组件是带有增加上下变频部分的双通道模拟TR组件。该双通道模拟TR组件具有用于外接频率源的高本振和低本振、两个用于发射和接收射频信号的A端口和B端口，以及用于中频信号输入和输出的中频端口组。The purpose of this application is to solve the deficiencies of the prior art, and provide a dual-channel frequency conversion system phase gain full temperature automatic test device and its use method, which can obtain the gains and gains of multiple ATR components at different operating temperatures by one-time test The effect of relative phase. Among them, the tested ATR component is a dual-channel analog TR component with an increased up-down frequency conversion part. This dual-channel analog TR component has a high local oscillator and a low local oscillator for external frequency sources, two A and B ports for transmitting and receiving radio frequency signals, and an intermediate frequency port group for intermediate frequency signal input and output.

为了实现上述目的，本申请采用以下的技术方案。In order to achieve the above objective, this application adopts the following technical solutions.

首先，本申请提出一种双通道变频***的相位增益全温度自动化测试装置，包括：频率源，用于输出指定频率的信号；变频器，用于上下变频信号的频率；中频放大模块，用于放大中频信号；大功率射频开关，分别可操作地联接待测试的所述双通道模拟TR组件的A端口和B端口到所述变频器；单刀多掷开关，分别可操作地联接待测试的所述双通道模拟TR组件的高本振和低本振到频率源；中频开关模块，分别可操作地联接待测试的所述双通道模拟TR组件的中频端口组中的各个中频端口到所述中频放大模块；以及网络分析仪，联接所述中频放大模块到所述变频器以形成检测通路，从而测试所述中频放大模块和所述变频器之间中频信号的增益相位。其中，所述双通道模拟TR组件设置在温度可控的温箱内部。测试时通过切换开关和上下变频，同时利用网络分析仪测试中频信号的增益相位，最终计算出各个双通道模拟TR组件的增益相位。First of all, this application proposes a phase gain full temperature automatic test device for a dual-channel frequency conversion system, which includes: a frequency source for outputting a signal of a specified frequency; a frequency converter for the frequency of the up and down conversion signal; an intermediate frequency amplifying module for Amplify the intermediate frequency signal; high-power radio frequency switches, respectively, operably connect the A port and B port of the dual-channel analog TR component for testing to the inverter; single-pole multi-throw switches, respectively, operably connect to the tester The high local oscillator and low local oscillator of the dual-channel analog TR component are connected to the frequency source; the intermediate frequency switch module is respectively operatively connected to each intermediate frequency port in the intermediate frequency port group of the dual-channel analog TR component for testing to the intermediate frequency amplifier module And a network analyzer, which connects the intermediate frequency amplifying module to the frequency converter to form a detection path, thereby testing the gain phase of the intermediate frequency signal between the intermediate frequency amplifying module and the frequency converter. Wherein, the dual-channel analog TR component is arranged inside a temperature-controllable incubator. During the test, the gain phase of the intermediate frequency signal is tested by switching the switch and up and down conversion, and the network analyzer is used to test the gain phase of each dual-channel analog TR component.

进一步地，在本申请的上述装置中，所述大功率射频开关和到所述变频器之间还设置有衰减器。Further, in the above-mentioned device of the present application, an attenuator is further provided between the high-power radio frequency switch and the frequency converter.

可替代地，在本申请的上述一个或多个装置中，所述变频器内还设置有负载电阻，以测试所述双通道模拟TR组件的A端口和B端口之间的隔离程度。Alternatively, in one or more of the above-mentioned devices of the present application, a load resistor is also provided in the frequency converter to test the degree of isolation between the A port and the B port of the dual-channel analog TR component.

可替代地，在本申请的上述一个或多个装置中，所述中频放大模块是由一组中频放大器串接而成。Alternatively, in one or more of the above-mentioned devices of the present application, the intermediate frequency amplifier module is formed by a series of intermediate frequency amplifiers.

可替代地，在本申请的上述一个或多个装置中，所述中频开关模块是由一组单刀多掷开关并接而成。Alternatively, in one or more of the above-mentioned devices of the present application, the intermediate frequency switch module is formed by a group of single-pole multi-throw switches connected in parallel.

可替代地，在本申请的上述一个或多个装置中，所述网络分析仪的端口至少有两个，并且所述网络分析仪的端口分别联接到中频放大器，以分别测试所述双通道模拟TR组件的A端口和B端口的发射增益相位和接收增益相位。Alternatively, in one or more of the above-mentioned devices of the present application, there are at least two ports of the network analyzer, and the ports of the network analyzer are respectively connected to an intermediate frequency amplifier to test the dual-channel analog Transmit gain phase and receive gain phase of the A port and B port of the TR component.

可替代地，在本申请的上述一个或多个装置中，待测试的所述双通道模拟TR组件的数量范围是1-8，且数量上限与所述单刀多掷开关的掷数相等。Alternatively, in the one or more devices of the present application, the number of the dual-channel analog TR components to be tested ranges from 1 to 8, and the upper limit of the number is equal to the number of throws of the single-pole multi-throw switch.

进一步地，在本申请的上述一个或多个装置中，待测试的所述双通道模拟TR组件的数量与所单刀多掷开关的掷数都是8。Further, in the one or more devices of the present application, the number of the dual-channel analog TR components to be tested and the number of throws of the single-pole multi-throw switch are both 8.

再次，本申请还提出一种双通道变频***的相位增益全温度自动化测试方法，适用于上述一个或多个装置。该方法包括以下步骤：Thirdly, this application also proposes a phase gain full-temperature automatic test method of a dual-channel frequency conversion system, which is suitable for one or more of the above devices. The method includes the following steps:

S100)在待测试的温度和频率下，校准所述双通道模拟TR组件各个通道的全温度增益相位；S100) Calibrate the full temperature gain phase of each channel of the dual-channel analog TR component at the temperature and frequency to be tested;

S200)在常温下，分别单独测试所述变频器和所述中频放大模块的发射增益和接收增益；S200) separately test the transmission gain and reception gain of the frequency converter and the intermediate frequency amplifying module at room temperature;

S300)在待测试的温度和频率下，通过网络分析仪分别测量在A端口和B端口下的发射增益、接收增益及对应的增益相位；S300) Under the temperature and frequency to be tested, measure the transmit gain, receive gain, and corresponding gain phase of the A port and the B port through a network analyzer;

S400)基于校准的所述全温度增益相位、所述变频器和所述中频放大模块的发射增益和接收增益和在A端口和B端口下的发射增益、接收增益及对应的增益相位，确定各个双通道模拟TR组件A端口和B端口的发射增益、接收增益及对应的增益相位。S400) Based on the calibrated full temperature gain phase, the transmission gain and reception gain of the frequency converter and the intermediate frequency amplifying module, and the transmission gain, reception gain and corresponding gain phase under the A port and B port, determine each Two-channel analog TR component A port and B port transmit gain, receive gain and corresponding gain phase.

最后，本申请还提出一种双通道变频***的相位增益全温度自动化测试***，包括：频率源，用于输出指定频率的信号；变频器，用于上下变频信号的频率；中频放大模块，用于放大中频信号；大功率射频开关，分别可操作地联接待测试的所述双通道模拟TR组件的A端口和B端口到所述变频器；单刀多掷开关，分别可操作地联接待测试的所述双通道模拟TR组件的高本振和低本振到频率源；中频开关模块，分别可操作地联接待测试的所述双通道模拟TR组件的中频端口组中的各个中频端口到所述中频放大模块；以及网络分析仪，联接所述中频放大模块到所述变频器以形成检测通路，从而测试所述中频放大模块和所述变频器之间中频信号的增益相位。其中，所述双通道模拟TR组件设置在温度可控的温箱内部。此外，所述相位增益全温度自动化测试***还包括控制模块，所述控制模块用于执行上述的相位增益全温度自动化测试方法。测试时通过切换开关和上下变频，同时利用网络分析仪测试中频信号的增益相位，最终计算出各个双通道模拟TR组件的增益相位。Finally, this application also proposes a phase gain full-temperature automatic test system for a dual-channel frequency conversion system, including: a frequency source for outputting a signal of a specified frequency; a frequency converter for the frequency of the up and down conversion signal; an intermediate frequency amplifying module for To amplify intermediate frequency signals; high-power radio frequency switches, respectively, operably connect the A port and B port of the dual-channel analog TR component to be tested to the inverter; single-pole multi-throw switches, respectively, operably connect to the tester The high local oscillator and low local oscillator of the dual-channel analog TR component are connected to the frequency source; the intermediate frequency switch module is respectively operatively connected to each intermediate frequency port in the intermediate frequency port group of the dual-channel analog TR component under test to the intermediate frequency amplifier Module; and a network analyzer for connecting the intermediate frequency amplifying module to the frequency converter to form a detection path, thereby testing the gain phase of the intermediate frequency signal between the intermediate frequency amplifying module and the frequency converter. Wherein, the dual-channel analog TR component is set inside a temperature-controllable incubator. In addition, the phase gain full temperature automated test system further includes a control module for executing the above-mentioned phase gain full temperature automated test method. During the test, the gain phase of the intermediate frequency signal is tested by switching the switch and up and down conversion, and the network analyzer is used to test the gain phase of each dual-channel analog TR component.

进一步地，在本申请的上述***中，所述大功率射频开关和到所述变频器之间还设置有衰减器。Further, in the above-mentioned system of the present application, an attenuator is also provided between the high-power radio frequency switch and the frequency converter.

可替代地，在本申请的上述一个或多个***中，所述变频器内还设置有负载电阻，以测试所述双通道模拟TR组件的A端口和B端口之间的隔离程度。Alternatively, in one or more of the aforementioned systems of the present application, a load resistor is also provided in the frequency converter to test the degree of isolation between the A port and the B port of the dual-channel analog TR component.

可替代地，在本申请的上述一个或多个***中，所述中频放大模块是由一组中频放大器串接而成。Alternatively, in one or more systems of the present application, the intermediate frequency amplifier module is formed by a series of intermediate frequency amplifiers.

可替代地，在本申请的上述一个或多个***中，所述中频开关模块是由一组单刀多掷开关并接而成。Alternatively, in one or more of the above systems of the present application, the intermediate frequency switch module is formed by a group of single-pole multi-throw switches connected in parallel.

可替代地，在本申请的上述一个或多个***中，所述网络分析仪的端口至少有两个，并且所述网络分析仪的端口分别联接到中频放大器，以分别测试所述双通道模拟TR组件的A端口和B端口的发射增益相位和接收增益相位。Alternatively, in one or more of the aforementioned systems of the present application, there are at least two ports of the network analyzer, and the ports of the network analyzer are respectively connected to an intermediate frequency amplifier to test the dual-channel analog Transmit gain phase and receive gain phase of the A port and B port of the TR component.

可替代地，在本申请的上述一个或多个***中，待测试的所述双通道模拟TR组件的数量范围是1-8，且数量上限与所述单刀多掷开关的掷数相等。Alternatively, in one or more systems of the present application, the number of the dual-channel analog TR components to be tested ranges from 1 to 8, and the upper limit of the number is equal to the number of throws of the single-pole multi-throw switch.

进一步地，在本申请的上述一个或多个***中，待测试的所述双通道模拟TR组件的数量与所单刀多掷开关的掷数都是8。Further, in one or more systems of the present application, the number of the dual-channel analog TR components to be tested and the number of throws of the single-pole multi-throw switch are both 8.

本发明的有益效果为：通过切换多个单刀多掷开关和上下变频，同时利用网络分析仪测试中频信号的增益相位，批量测试多个双通道模拟TR组件的增益相位。The beneficial effects of the present invention are: by switching a plurality of single-pole multi-throw switches and up and down frequency conversion, while using a network analyzer to test the gain phase of the intermediate frequency signal, batch testing the gain phase of a plurality of dual-channel analog TR components.

附图说明Description of the drawings

现在将参考附图以举例的方式描述一个或多个实施例，其中：One or more embodiments will now be described by way of example with reference to the drawings, in which:

图1所示为双通道模拟TR组件的接口示意图；Figure 1 shows the interface diagram of the dual-channel analog TR component;

图2所示为根据本申请一个实施例的相位增益全温度自动化测试***框图；Fig. 2 shows a block diagram of a phase gain full-temperature automated test system according to an embodiment of the present application;

图3所示为更加本申请一个实施例的相位增益全温度自动化测试方法流程图Fig. 3 shows a flowchart of a phase gain full-temperature automatic test method according to an embodiment of the present application

图4所示为根据本申请一个实施例的A端口RF开关与高本振开关对接校准示意图；FIG. 4 shows a schematic diagram of docking calibration of an A-port RF switch and a high local oscillator switch according to an embodiment of the present application;

图5所示为根据本申请一个实施例的B端口RF开关与高本振开关对接校准示意图；FIG. 5 shows a schematic diagram of docking calibration of a B-port RF switch and a high local oscillator switch according to an embodiment of the present application;

图6所示为根据本申请一个实施例的A端口RF开关与B端口RF开关对接校准示意图；FIG. 6 shows a schematic diagram of docking calibration of the A-port RF switch and the B-port RF switch according to an embodiment of the present application;

图7所示为根据本申请一个实施例的A端口中频发射开关与低本振校准示意图；FIG. 7 shows a schematic diagram of A-port IF transmission switch and low local oscillator calibration according to an embodiment of the present application;

图8所示为根据本申请一个实施例的B端口中频发射开关与低本振校准示意图；FIG. 8 shows a schematic diagram of calibration of the B-port IF transmission switch and low local oscillator according to an embodiment of the present application;

图9所示为根据本申请一个实施例的A端口中频收发开关分别与B通道中频收发开关联接的校准示意图；FIG. 9 is a schematic diagram of calibration of the connection between the A-port intermediate frequency transceiver switch and the B-channel intermediate frequency transceiver switch respectively according to an embodiment of the present application;

图10所示为根据本申请一个实施例的A端口中频接收开关与低本振校准示意图。FIG. 10 shows a schematic diagram of calibration of the A-port IF receiving switch and low local oscillator according to an embodiment of the present application.

具体实施方式Detailed ways

以下将结合实施例和附图对本发明的构思、具体结构及产生的技术效果进行清楚、完整的描述，以充分地理解本发明的目的、方案和效果。需要说明的是，在不冲突的情况下，本申请中的实施例及实施例中的特征可以相互组合。附图中各处使用的相同的附图标记指示相同或相似的部分。下文详细描述本质上仅是示例性的，并且不旨在限制本公开或其应用和用途。再者，前文的背景技术或下文具体实施方式中提出的任何原理均无意要构成约束。In the following, the concept, specific structure and technical effects of the present invention will be clearly and completely described in conjunction with the embodiments and the drawings, so as to fully understand the objectives, solutions and effects of the present invention. It should be noted that the embodiments in this application and the features in the embodiments can be combined with each other if there is no conflict. The same reference numerals used throughout the drawings indicate the same or similar parts. The following detailed description is merely exemplary in nature, and is not intended to limit the present disclosure or its applications and uses. Furthermore, the foregoing background art or any principles proposed in the following specific implementations are not intended to constitute constraints.

此处描述本公开的实施方案。然而要理解的是，所公开的实施方案仅是示例，并且其他实施方案可以采用多种和可替换的形式。附图不一定按比例绘制；一些特征可能被放大或缩小以便示出特定组件的细节。因此，本文所公开的具体结构和功能细节不应被解释为限制性的，而仅仅是作为用于教导本领域技术人员以多种方式利用本发明的代表性基础。正如本领域技术人员将理解的，参考附图中任一附图图示和描述的多种特征能够与一个或多个附图中图示的特征进行组合以产生未明确地图示或描述的实施方案。图示的特征的组合提供了典型应用的代表性实施方案。然而，符合本公开教导的这些特征的多种组合和修改可能是某个具体应用或实施方式所需要的。The embodiments of the present disclosure are described here. It is to be understood, however, that the disclosed embodiments are only examples, and other embodiments may take various and alternative forms. The drawings are not necessarily drawn to scale; some features may be enlarged or reduced to show details of specific components. Therefore, the specific structural and functional details disclosed herein should not be construed as restrictive, but merely serve as a representative basis for teaching those skilled in the art to utilize the present invention in various ways. As those skilled in the art will understand, the various features illustrated and described with reference to any one of the drawings can be combined with the features illustrated in one or more of the drawings to produce implementations that are not explicitly illustrated or described. Program. The illustrated combination of features provides a representative embodiment of a typical application. However, various combinations and modifications of these features consistent with the teachings of the present disclosure may be required for a specific application or implementation.

下文描述中可能使用某些术语仅是出于参考的目的，因此不旨在是限制性的。例如，如“上面”和“下面”的术语是指附图中所参考的方向。诸如“前面”、“背后”、“左边”、“右边”、“后面”以及“侧边”的术语描述组件或元件的多个部位在一致但任意的参照系内的取向和/或位置，该参照系在参考描述所论述的组件或者元件的文本和相关联的附图变得清楚。而且，可能使用诸如“第一”、“第二”、“第三”等的术语来描述单独的组件。此类术语可以包括上面具体提到的词语、其派生词和类似含义的词语。Certain terms may be used in the following description for reference purposes only and therefore are not intended to be limiting. For example, terms such as "above" and "below" refer to directions referenced in the drawings. Terms such as "front", "back", "left", "right", "rear" and "side" describe the orientation and/or position of multiple parts of a component or element in a consistent but arbitrary frame of reference, This frame of reference becomes clear with reference to the text describing the discussed components or elements and the associated drawings. Also, terms such as "first", "second", "third", etc. may be used to describe individual components. Such terms may include the words specifically mentioned above, their derivatives and words of similar meaning.

参照图1所示的接口图，除非另有说明本申请中所讨论的TR组件如图所示的接口，即该TR组件是具有上下变频部分(即图1中的ATR-A及ATR-B)的双通道模拟TR组件10。具体地，该双通道模拟TR组件10具有用于外接频率源的高本振12和低本振14，两个用于发射和接收射频信号的A端口16和B端口18(分别对应该双通道模拟TR组件10的A通道和B通道)，以及用于中频信号输入和输出的中频端口组19。当需要从A端口16发射信号时，中频信号从TX_IFA输入，经两次上变频滤波放大处理后从A端口16射频输出。当需要A端口16接收信号时，射频信号从A端口16输入，经两次下变频滤波放大处理后从RX_IFA输出。B端口的信号发射与接收过程与此类似。此外，为方便叙述，本申请中被测试的双通道模拟TR组件10的相对相位简称为相位，其等于与温度有关的相位与任意定值之和。因此，对于相位测试，该双通道模拟TR组件10的测试只包括与温度有关的内容。Referring to the interface diagram shown in FIG. 1, unless otherwise stated, the TR component discussed in this application has an interface as shown in the figure, that is, the TR component has an up-down conversion part (ie, ATR-A and ATR-B in Figure 1 ) Dual-channel analog TR component 10. Specifically, the dual-channel analog TR component 10 has a high local oscillator 12 and a low local oscillator 14 for external frequency sources, and two A port 16 and B port 18 for transmitting and receiving radio frequency signals (respectively corresponding to the dual-channel analog TR The A channel and the B channel of the component 10), and the intermediate frequency port group 19 for intermediate frequency signal input and output. When the signal needs to be transmitted from the A port 16, the intermediate frequency signal is input from TX_IFA, and is output from the A port 16 radio frequency after two up-conversion filtering and amplification processing. When the A port 16 is required to receive the signal, the radio frequency signal is input from the A port 16, and is output from RX_IFA after two down-conversion filtering and amplification processing. The signal transmission and reception process of the B port is similar to this. In addition, for convenience of description, the relative phase of the dual-channel analog TR component 10 tested in this application is referred to as phase for short, which is equal to the sum of the temperature-related phase and any fixed value. Therefore, for the phase test, the test of the dual-channel analog TR component 10 only includes temperature-related content.

参照图2所示的***框图，在本申请的一个或多个实施例中，双通道变频***的相位增益全温度自动化测试装置可以包括以下组件：频率源20，用于输出指定频率的信号；变频器30，用于上下变频信号的频率；中频放大模块40，用于放大中频信号；大功率射频开关50，分别可操作地联接待测试的所述双通道模拟TR组件10的A端口16和B端口18到所述变频器30，以满足待测试的所述双通道模拟TR组件10的发射信号强度；单刀多掷开关60，分别可操作地联接待测试的所述双通道模拟TR组件10的高本振和低本振到频率源20；中频开关模块70，分别可操作地联接待测试的所述双通道模拟TR组件10的中频端口组19中的各个中频端口到所述中频放大模块40；以及网络分析仪80，联接所述中频放大模块40到所述变频器30以形成检测通路，从而测试所述中频放大模块40和所述变频器30之间中频信号的增益相位。Referring to the system block diagram shown in FIG. 2, in one or more embodiments of the present application, the phase gain full temperature automatic test device of the dual-channel frequency conversion system may include the following components: a frequency source 20 for outputting a signal of a specified frequency; The frequency converter 30 is used for up-converting the frequency of the signal; the intermediate frequency amplifying module 40 is used for amplifying the intermediate frequency signal; the high-power radio frequency switch 50 is respectively operatively connected to the A port 16 and the A port 16 of the dual-channel analog TR component 10 for testing. Port B 18 to the frequency converter 30 to meet the transmission signal strength of the dual-channel analog TR assembly 10 to be tested; single-pole multi-throw switches 60 are respectively operatively connected to the dual-channel analog TR assembly 10 to be tested The high local oscillator and the low local oscillator to the frequency source 20; the intermediate frequency switch module 70 respectively operably connects each intermediate frequency port in the intermediate frequency port group 19 of the dual-channel analog TR component 10 receiving the test to the intermediate frequency amplifier module 40; And the network analyzer 80 connects the intermediate frequency amplifying module 40 to the frequency converter 30 to form a detection path to test the gain phase of the intermediate frequency signal between the intermediate frequency amplifying module 40 and the frequency converter 30.

继续参照图2，在本申请的一个或多个实施例中，所述大功率射频开关50和所述变频器30之间还设置有衰减器，以保护变频器30并使得变频器30在线性区内工作。此时，各个双通道模拟TR组件10的A端口16和B端口18的发射增益、接收增益及对应的增益相位，与全温度增益相位、变频器30和中频放大模块40的发射增益和接收增益之间存在线性关系，从而能够通过求解由上述变量组成的线性方程组而确定各个双通道模拟TR组件10的A端口16和B端口18的发射增益、接收增益及对应的增益相位。进一步地，在本申请的一个或多个实施例中，所述变频器30内还设置有负载电阻，以测试所述双通道模拟TR组件10的A端口和B端口之间的信号隔离程度。一般地，该负载电阻的大小由待测试的双通道模拟TR组件10的数量决定。对于图中8个双通道模拟TR组件10的实施例(此时单刀多掷开关60为单刀八掷开关SP8T，即与双通道模拟TR组件10的个数相等)，该负载电阻的大小为50欧。Continuing to refer to FIG. 2, in one or more embodiments of the present application, an attenuator is also provided between the high-power radio frequency switch 50 and the frequency converter 30 to protect the frequency converter 30 and make the frequency converter 30 linear Work in the area. At this time, the transmission gain, reception gain and corresponding gain phase of the A port 16 and B port 18 of each dual-channel analog TR component 10 are compared with the full temperature gain phase, and the transmission gain and reception gain of the frequency converter 30 and the intermediate frequency amplifying module 40 There is a linear relationship between them, so that the transmit gain, receive gain, and corresponding gain phase of the A port 16 and the B port 18 of each dual-channel analog TR component 10 can be determined by solving the linear equation set composed of the above variables. Further, in one or more embodiments of the present application, a load resistor is also provided in the frequency converter 30 to test the signal isolation degree between the A port and the B port of the dual-channel analog TR assembly 10. Generally, the size of the load resistance is determined by the number of dual-channel analog TR components 10 to be tested. For the embodiment with 8 dual-channel analog TR components 10 in the figure (in this case, the single-pole multi-throw switch 60 is a single-pole eight-throw switch SP8T, which is equal to the number of dual-channel analog TR components 10), the size of the load resistance is 50 Europe.

参照图3所示的流程图，上述一个或多个相位增益全温度自动化测试装置按照以下步骤就双通道模拟TR组件10执行测试过程：Referring to the flowchart shown in FIG. 3, the above-mentioned one or more phase gain full-temperature automatic test devices perform the test process on the dual-channel analog TR component 10 according to the following steps:

S100)在待测试的温度和频率下，校准所述双通道模拟TR组件10各个通道的全温度增益相位；S100) Calibrate the full temperature gain phase of each channel of the dual-channel analog TR component 10 under the temperature and frequency to be tested;

S200)在常温下，分别单独测试所述变频器30和所述中频放大模块40的发射增益和接收增益；S200) separately test the transmission gain and reception gain of the frequency converter 30 and the intermediate frequency amplifying module 40 at room temperature;

S300)在待测试的温度和频率下，通过网络分析仪80分别测量在A端口16和B端口18下的发射增益、接收增益及对应的增益相位；S300) At the temperature and frequency to be tested, the network analyzer 80 is used to measure the transmit gain, receive gain, and corresponding gain phase of the A port 16 and the B port 18 respectively;

S400)基于校准的所述全温度增益相位、所述变频器30和所述中频放大模块40的发射增益和接收增益和在A端口16和B端口18下的发射增益、接收增益及对应的增益相位，确定各个双通道模拟TR组件10的A端口16和B端口18的发射增益、接收增益及对应的增益相位。S400) Based on the calibration of the full temperature gain phase, the transmission gain and reception gain of the frequency converter 30 and the intermediate frequency amplifying module 40, and the transmission gain, reception gain and corresponding gain under the A port 16 and the B port 18 The phase determines the transmit gain, receive gain and corresponding gain phase of the A port 16 and the B port 18 of each dual-channel analog TR component 10.

参照图4-9所示的校准图，在执行步骤S100时，需要分别对双通道模拟TR组件各个通道的全温度增益相位进行校准。具体地，就图3所示的8个双通道模拟TR组件10的情况，需要分别校准以下变量：Referring to the calibration diagrams shown in FIGS. 4-9, when step S100 is performed, the full temperature gain phase of each channel of the dual-channel analog TR component needs to be calibrated separately. Specifically, in the case of the 8 dual-channel analog TR components 10 shown in Fig. 3, the following variables need to be calibrated separately:

a.高本振开关和线缆a. High local oscillator switch and cable

在高本振频率下全温度增益相位分别为G _LO1(LO1,N,T)，θ _LO1(LO1，N,T), At high local oscillator frequencies, the full temperature gain phases are G _LO1 (LO1, N, T), θ _LO1 (LO1, N, T),

在RF频率下全温度增益相位分别为G _RF(LO1,N,T)，θ _RF(LO1,N,T)。 The full temperature gain phase at RF frequency is G _RF (LO1, N, T) and θ _RF (LO1, N, T).

b.A通道RF开关和线缆b. Channel A RF switch and cable

在高本振频率下全温度增益相位分别为G _LO1(RFA,N,T)，θ _LO1(RFA,N,T), At high local frequency, the full temperature gain phase is G _LO1 (RFA, N, T), θ _LO1 (RFA, N, T),

在RF频率下全温度增益相位分别为G _RF(RFA,N,T)，θ _RF(RFA,N,T)。 The full temperature gain phase at RF frequency is G _RF (RFA, N, T) and θ _RF (RFA, N, T).

c.B通道RF开关和线缆c. Channel B RF switch and cable

在高本振频率下全温度增益相位分别为G _LO1(RFB,N,T)，θ _LO1(RFB,N,T), At high local frequency, the full temperature gain phase is G _LO1 (RFB, N, T), θ _LO1 (RFB, N, T),

在RF频率下全温度增益相位分别为G _RF(RFB,N,T)，θ _RF(RFB,N,T)。 The full temperature gain phase at RF frequency is respectively G _RF (RFB, N, T) and θ _RF (RFB, N, T).

d.低本振开关和线缆d. Low local oscillation switch and cable

在低本振频率下全温度增益相位分别为G _LO2(LO2,N,T)，θ _LO2(LO2,N,T), At low local oscillator frequencies, the full temperature gain phases are G _LO2 (LO2, N, T), θ _LO2 (LO2, N, T),

在中频频率下全温度增益相位分别为G _IF(LO2,N,T)，θ _IFLO2,N,T)。 At the intermediate frequency, the full temperature gain phase is G _IF (LO2, N, T), θ _IF LO2, N, T).

e.A通道中频发射开关和线缆e. Channel A IF transmitter switch and cable

在低本振频率下全温度增益相位分别为G _LO2(IFTA,N,T)，θ _LO2(IFTA,N,T), At low local oscillator frequency, the full temperature gain phase is G _LO2 (IFTA, N, T), θ _LO2 (IFTA, N, T),

在中频频率下全温度增益相位分别为G _IF(IFTA,N,T)，θ _IF(IFTA,N,T)。 The full temperature gain phase at the intermediate frequency is G _IF (IFTA, N, T) and θ _IF (IFTA, N, T).

f.A通道中频接收开关和线缆f. A channel IF receiving switch and cable

在低本振频率下全温度增益相位分别为G _LO2(IFRA,N,T)，θ _LO2(IFRA,N,T), At low local oscillator frequencies, the full temperature gain phases are G _LO2 (IFRA, N, T), θ _LO2 (IFRA, N, T),

在中频频率下全温度增益相位分别为G _IF(IFRA,N,T)，θ _IF(IFRA,N,T)。 At the intermediate frequency, the full temperature gain phase is G _IF (IFRA, N, T) and θ _IF (IFRA, N, T).

g.B通道中频发射开关和线缆g.B channel IF transmitter switch and cable

在低本振频率下全温度增益相位分别为G _LO2(IFTB,N,T)，θ _LO2(IFTB,N,T), At low local oscillator frequency, the full temperature gain phase is G _LO2 (IFTB, N, T), θ _LO2 (IFTB, N, T),

在中频频率下全温度增益相位分别为G _IF(IFTB,N,T)，θ _IF(IFTB,N,T)。 The full temperature gain phase at the intermediate frequency is G _IF (IFTB, N, T) and θ _IF (IFTB, N, T).

h.B通道中频接收开关和线缆h.B channel IF receiving switch and cable

在低本振频率下全温度增益相位分别为G _LO2(IFRB,N,T)，θ _LO2(IFRB,N,T), At low local oscillator frequencies, the full-temperature gain phases are G _LO2 (IFRB, N, T), θ _LO2 (IFRB, N, T),

在中频频率下全温度增益相位分别为G _IF(IFRB,N,T)，θ _IF(IFRB,N,T)。 At the intermediate frequency, the full temperature gain phase is G _IF (IFRB, N, T) and θ _IF (IFRB, N, T).

其中，N取值1～8，代表8根线缆或通道，T为温度。下文采用相同的方式表示，不再说明。Among them, N takes a value of 1 to 8, representing 8 cables or channels, and T is temperature. It is expressed in the same way below and will not be explained again.

参照图4，8根高本振线缆与8根RF A端口线缆对接，网络分析仪80测得高本振频率下的全温度增益相位分别为G _LO1(LO1 _RFA,N,T)、θ _LO1(LO1_RFA,N,T)；RF频率下的全温度增益相位分别为G _RF(LO1_RFA,N,T)、θ _RF(LO1_RFA,N,T)。 Referring to Figure 4, 8 high local oscillator cables are connected to 8 RF A port cables. The network analyzer 80 measured the full temperature gain phase at high local oscillator frequencies as G _LO1 (LO1 _RFA ,N,T) and θ _LO1 (LO1_RFA). ,N,T); The full temperature gain phase at RF frequency is G _RF (LO1_RFA,N,T) and θ _RF (LO1_RFA,N,T).

参照图5，8根高本振线缆与8根RF B通道线缆对接，网络分析仪80测得高本振频率下的全温度增益相位分别为G _LO1(LO1_RFB,N,T)、θ _LO1(LO1_RFB,N,T)；RF频率下的全温度增益相位分别为G _RF(LO1_RFB,N,T)、θ _RF(LO1_RFB,N,T)。 Referring to Figure 5, 8 high local oscillation cables are connected to 8 RF B channel cables. The network analyzer 80 measured the full temperature gain phase at the high local oscillation frequency as G _LO1 (LO1_RFB, N, T) and θ _LO1 (LO1_RFB, N, T); The full temperature gain phase at RF frequency is G _RF (LO1_RFB, N, T) and θ _RF (LO1_RFB, N, T).

参照图6，8根RF A通道线缆与8根RF B通道线缆对接，网络分析仪80测得高本振频率下的全温度增益相位分别为G _LO1(RFA_RFB,N,T)、θ _LO1(RFA_RFB,N,T)，测得RF频率下的全温度增益相位分别为G _RF(RFA_RFB,N,T)、θ _RF(RFA_RFB,N,T)。 Referring to Figure 6, 8 RF A channel cables are connected to 8 RF B channel cables. The network analyzer 80 measured the full temperature gain phase at high local oscillator frequencies as G _LO1 (RFA_RFB, N, T) and θ _LO1 ( RFA_RFB, N, T), the measured full temperature gain phase at RF frequency is G _RF (RFA_RFB, N, T) and θ _RF (RFA_RFB, N, T).

由图4-6的测试结果可得如下等式：From the test results in Figure 4-6, the following equation can be obtained:

G _LO1(LO1_RFA,N,T)＝G _LO1(LO1,N,T)+G _LO1(RFA,N,T)——(1) G _LO1 (LO1_RFA,N,T)=G _LO1 (LO1,N,T)+G _LO1 (RFA,N,T)——(1)

G _LO1(LO1_RFB,N,T)＝G _LO1(LO1,N,T)+G _LO1(RFB,N,T)——(2) G _LO1 (LO1_RFB,N,T)=G _LO1 (LO1,N,T)+G _LO1 (RFB,N,T)——(2)

G _LO1(RFA_RFB,N,T)＝G _LO1(RRA,N,T)+G _LO1(RFB,N,T)——(3) G _LO1 (RFA_RFB,N,T)=G _LO1 (RRA,N,T)+G _LO1 (RFB,N,T)——(3)

G _RF(LO1_RFA,N,T)＝G _RF(LO1,N,T)+G _RF(RFA,N,T)——(4) G _RF (LO1_RFA,N,T)=G _RF (LO1,N,T)+G _RF (RFA,N,T)——(4)

G _RF(LO1_RFB,N,T)＝G _RF(LO1,N,T)+G _RF(RFB,N,T)——(5) G _RF (LO1_RFB,N,T)=G _RF (LO1,N,T)+G _RF (RFB,N,T)——(5)

G _RF(RFA_RFB,N,T)＝G _RF(RFA,N,T)+G _RF(RFB,N,T)——(6) G _RF (RFA_RFB,N,T)=G _RF (RFA,N,T)+G _RF (RFB,N,T)——(6)

θ _LO1(LO1_RFA,N,T)＝θ _LO1(LO1,N,T)+θ _LO1(RFA,N,T)——(7) θ _LO1 (LO1_RFA,N,T)=θ _LO1 (LO1,N,T)+θ _LO1 (RFA,N,T)——(7)

θ _LO1(LO1_RFB,N,T)＝θ _LO1(LO1,N,T)+θ _LO1(RFB,N,T)——(8) θ _LO1 (LO1_RFB,N,T)=θ _LO1 (LO1,N,T)+θ _LO1 (RFB,N,T)——(8)

θ _LO1(RFA_RFB,N,T)＝θ _LO1(RFA,N,T)+θ _LO1(RFB,N,T)——(9) θ _LO1 (RFA_RFB,N,T)=θ _LO1 (RFA,N,T)+θ _LO1 (RFB,N,T)——(9)

θ _RF(LO1_RFA,N,T)＝θ _RF(LO1,N,T)+θ _RF(RFA,N,T)——(10) θ _RF (LO1_RFA,N,T)=θ _RF (LO1,N,T)+θ _RF (RFA,N,T)——(10)

θ _RF(LO1_RFB,N,T)＝θ _RF(LO1,N,T)+θ _RF(RFB,N,T)——(11) θ _RF (LO1_RFB,N,T)=θ _RF (LO1,N,T)+θ _RF (RFB,N,T)——(11)

θ _RF(RFA_RFB,N,T)＝θ _RF(RFA,N,T)+θ _RF(RFB,N,T)——(12)。 θ _RF (RFA_RFB, N, T) = θ _RF (RFA, N, T) + θ _RF (RFB, N, T)-(12).

以上式子(1)+(2)-(3)得：The above formula (1)+(2)-(3) gives:

G _LO1(LO1,N,T)＝(G _LO1(LO1_RFA,N,T)+G _LO1(LO1_RFB,N,T)-G _LO1(RFA_RFB,N,T))/2——(13)。 G _LO1 (LO1,N,T)=(G _LO1 (LO1_RFA,N,T)+G _LO1 (LO1_RFB,N,T)-G _LO1 (RFA_RFB,N,T))/2——(13).

(4)+(6)-(5)得：(4)+(6)-(5) get:

G _RF(RFA,N,T)＝(G _RF(LO1_RFB,N,T)+G _RF(RFA_RFB,N,T)-G _RF(LO1_RFA,N,T))/2——(14)。 G _RF (RFA,N,T)=(G _RF (LO1_RFB,N,T)+G _RF (RFA_RFB,N,T)-G _RF (LO1_RFA,N,T))/2——(14).

(5)+(6)-(4)得：(5)+(6)-(4) get:

G _RF(RFB,N,T)＝(G _RF(LO1_RFA,N,T)+G _RF(RFA_RFB,N,T)-G _RF(LO1_RFB,N,T))/2——(15)。 G _RF (RFB,N,T)=(G _RF (LO1_RFA,N,T)+G _RF (RFA_RFB,N,T)-G _RF (LO1_RFB,N,T))/2——(15).

同理，相位所得等式如下：Similarly, the phase equation is as follows:

θ _LO1(LO1,N,T)＝(θ _LO1(LO1_RFA,N,T)+θ _LO1(LO1_RFB,N,T)-θ _LO1(RFA_RFB,N,T))/2——(16) θ _LO1 (LO1,N,T)=(θ _LO1 (LO1_RFA,N,T)+θ _LO1 (LO1_RFB,N,T)-θ _LO1 (RFA_RFB,N,T))/2——(16)

θ _RF(RFA,N,T)＝(θ _RF(LO1_RFB,N,T)+θ _RF(RFA_RFB,N,T)-θ _RF(LO1_RFA,N,T))/2——(17) θ _RF (RFA,N,T)=(θ _RF (LO1_RFB,N,T)+θ _RF (RFA_RFB,N,T)-θ _RF (LO1_RFA,N,T))/2——(17)

θ _RF(RFB,N,T)＝(θ _RF(LO1_RFA,N,T)+θ _RF(RFA_RFB,N,T)-θ _RF(LO1_RFB,N,T))/2——(18)。 θ _RF (RFB,N,T)=(θ _RF (LO1_RFA,N,T)+θ _RF (RFA_RFB,N,T)-θ _RF (LO1_RFB,N,T))/2——(18).

参照图7，8根低本振线缆与8根A通道中频发射线缆对接，网络分析仪80测得低本振频率下的全温度增益相位分别为G _LO2(LO2_IFTA,N,T)、θ _LO2(LO2_IFTA,N,T)，测得中频频率下的全温度增益相位分别为G _IF(LO2_IFTA,N,T)、θ _IF(LO2_IFTA，N,T)。 Referring to Figure 7, 8 low local oscillation cables are connected to 8 A channel IF transmission cables. The network analyzer 80 measured the full temperature gain phase at low local oscillation frequency as G _LO2 (LO2_IFTA, N, T), θ _LO2 (LO2_IFTA, N, T), the measured full temperature gain phase at the intermediate frequency is G _IF (LO2_IFTA, N, T) and θ _IF (LO2_IFTA, N, T).

参照图8，8根低本振线缆与8根B通道中频发射线缆对接，网络分析仪80测得低本振频率下的全温度增益相位分别为G _LO2(LO2_IFTB,N,T)、θ _LO2(LO2_IFTB,N,T)，测得中频频率下的全温度增益相位分别为G _IF(LO2_IFTB,N,T)、θ _IF(LO2_IFTB,N,T)。 Referring to Figure 8, 8 low local oscillation cables are connected to 8 B channel IF transmission cables. The network analyzer 80 measured the full temperature gain phase at the low local oscillation frequency as G _LO2 (LO2_IFTB, N, T), θ _LO2 (LO2_IFTB,N,T), the measured full temperature gain phase at IF frequency is G _IF (LO2_IFTB,N,T) and θ _IF (LO2_IFTB,N,T).

参照图9，8根A通道中频发射线缆与8根B通道中频发射线缆对接，同时8根A通道中频接收线缆与8根B通道中频接收线缆对接。对于8根A通道中频发射线缆与8根B通道中频发射线缆对接，网络分析仪80测得低本振频率下的全温度增益相位分别为G _LO2(IFTA_IFTB,N,T)、θ _LO2(IFTA_IFTB,N,T)，测得中频频率下的全温度增益相位分别为G _IF(IFTA_IFTB,N,T)、θ _IF(IFTA_IFTB,N,T)。对于8根A通道中频接收线缆与8根B通道中频接收线缆对接，网络分析仪80测得中频频率下的全温度增益相位分别为G _IF(IFRA_IFRB,N,T)、θ _IF(IFRA_IFRB,N,T)。 Referring to Figure 9, 8 A-channel IF transmission cables are docked with 8 B-channel IF transmission cables, and 8 A-channel IF receiving cables are docked with 8 B-channel IF receiving cables. For the connection of 8 A-channel IF transmission cables with 8 B-channel IF transmission cables, the network analyzer 80 measured the full temperature gain phase at low local oscillator frequencies as G _LO2 (IFTA_IFTB,N,T) and θ _LO2. (IFTA_IFTB,N,T), the measured full-temperature gain phase at IF frequency is G _IF (IFTA_IFTB,N,T) and θ _IF (IFTA_IFTB,N,T). For the connection of 8 A channel IF receiving cables with 8 B channel IF receiving cables, the network analyzer 80 measured the full temperature gain phase at the IF frequency as G _IF (IFRA_IFRB,N,T) and θ _IF (IFRA_IFRB). ,N,T).

参照图10，8根低本振线缆与8根A通道中频接收线缆对接，网络分析仪80测得中频频率下的全温度增益相位分别为G _IF(LO2_IFRA,N,T)、θ _IF(LO2_IFRA,N,T)。 Referring to Figure 10, 8 low local oscillation cables are connected to 8 A channel IF receiving cables. The full temperature gain phase measured by the network analyzer 80 at the IF frequency is G _IF (LO2_IFRA, N, T) and θ _IF. (LO2_IFRA,N,T).

校准图7-10所测结果可得如下增益相位等式：The following gain and phase equations can be obtained by calibrating the measured results in Figure 7-10:

G _LO2(LO2_IFTA,N,T)＝G _LO2(LO2,N,T)+G _LO2(IFTA,N,T)——(19) G _LO2 (LO2_IFTA,N,T)=G _LO2 (LO2,N,T)+G _LO2 (IFTA,N,T)——(19)

G _IF(LO2_IFTA,N,T)＝G _IF(LO2,N,T)+G _IF(IFTA,N,T)——(20) G _IF (LO2_IFTA,N,T)=G _IF (LO2,N,T)+G _IF (IFTA,N,T)——(20)

G _LO2(LO2_IFTB,N,T)＝G _LO2(LO2,N,T)+G _LO2(IFTB,N,T)——(21) G _LO2 (LO2_IFTB,N,T)=G _LO2 (LO2,N,T)+G _LO2 (IFTB,N,T)——(21)

G _IF(LO2_IFTB,N,T)＝G _IF(LO2,N,T)+G _IF(IFTB,N,T)——(22) G _IF (LO2_IFTB,N,T)=G _IF (LO2,N,T)+G _IF (IFTB,N,T)——(22)

G _LO2(IFTA_IFTB,N,T)＝G _LO2(IFTA,N,T)+G _LO2(IFTB,N,T)——(23) G _LO2 (IFTA_IFTB,N,T)=G _LO2 (IFTA,N,T)+G _LO2 (IFTB,N,T)——(23)

G _IF(IFTA_IFTB,N,T)＝G _IF(IFTA,N,T)+G _IF(IFTB,N,T)——(24) G _IF (IFTA_IFTB,N,T)=G _IF (IFTA,N,T)+G _IF (IFTB,N,T)——(24)

G _IF(LO2_IFRA,N,T)＝G _IF(LO2,N,T)+G _IF(IFRA,N,T)——(25) G _IF (LO2_IFRA,N,T)=G _IF (LO2,N,T)+G _IF (IFRA,N,T)——(25)

G _IF(IFRA_IFRB,N,T)＝G _IF(IFRA,N,T)+G _IF(IFRB,N,T)——(26) G _IF (IFRA_IFRB,N,T)=G _IF (IFRA,N,T)+G _IF (IFRB,N,T)——(26)

θ _LO2(LO2_IFTA,N,T)＝θ _LO2(LO2,N,T)+θ _LO2(IFTA,N,T)——(27) θ _LO2 (LO2_IFTA,N,T)=θ _LO2 (LO2,N,T)+θ _LO2 (IFTA,N,T)——(27)

θ _IF(LO2_IFTA,N,T)＝θ _IF(LO2,N,T)+θ _IF(IFTA,N,T)——(28) θ _IF (LO2_IFTA,N,T)=θ _IF (LO2,N,T)+θ _IF (IFTA,N,T)——(28)

θ _LO2(LO2_IFTB,N,T)＝θ _LO2(LO2,N,T)+θ _LO2(IFTB,N,T)——(29) θ _LO2 (LO2_IFTB,N,T)=θ _LO2 (LO2,N,T)+θ _LO2 (IFTB,N,T)——(29)

θ _IF(LO2_IFTB,N,T)＝θ _IF(LO2,N,T)+θ _IF(IFTB,N,T)——(30) θ _IF (LO2_IFTB,N,T)=θ _IF (LO2,N,T)+θ _IF (IFTB,N,T)——(30)

θ _LO2(IFTA_IFTB,N,T)＝θ _LO2(IFTA,N,T)+θ _LO2(IFTB,N,T)——(31) θ _LO2 (IFTA_IFTB,N,T)=θ _LO2 (IFTA,N,T)+θ _LO2 (IFTB,N,T)——(31)

θ _IF(IFTA_IFTB,N,T)＝θ _IF(IFTA,N,T)+θ _IF(IFTB,N,T)——(32) θ _IF (IFTA_IFTB,N,T)=θ _IF (IFTA,N,T)+θ _IF (IFTB,N,T)——(32)

θ _IF(LO2_IFRA,N,T)＝θ _IF(LO2,N,T)+θ _IF(IFRA,N,T)——(33) θ _IF (LO2_IFRA,N,T)=θ _IF (LO2,N,T)+θ _IF (IFRA,N,T)——(33)

θ _IF(IFRA_IFRB,N,T)＝θ _IF(IFRA,N,T)+θ _IF(IFRB,N,T)——(34)。 θ _IF (IFRA_IFRB, N, T) = θ _IF (IFRA, N, T) + θ _IF (IFRB, N, T)-(34).

对于以上等式，由(19)+(21)-(23)可得：For the above equation, (19)+(21)-(23) can be obtained:

G _LO2(LO2,N,T)＝(G _LO2(LO2_IFTA,N,T)+G _LO2(LO2_IFTB,N,T)-G _LO2(IFTA_IFTB,N,T))/2——(35)。 G _LO2 (LO2,N,T)=(G _LO2 (LO2_IFTA,N,T)+G _LO2 (LO2_IFTB,N,T)-G _LO2 (IFTA_IFTB,N,T))/2——(35).

由(20)+(22)-(24)可得：From (20)+(22)-(24), we can get:

G _IF(LO2,N,T)＝(G _IF(LO2_IFTA,N,T)+G _IF(LO2_IFTB,N,T)-G _IF(IFTA_IFTB,N,T))/2——(36) G _IF (LO2,N,T)=(G _IF (LO2_IFTA,N,T)+G _IF (LO2_IFTB,N,T)-G _IF (IFTA_IFTB,N,T))/2——(36)

由(20)+(24)-(22)可得：From (20)+(24)-(22), we can get:

G _IF(IFTA,N,T)＝(G _IF(IFTA_IFTB,N,T)+G _IF(LO2_IFTA,N,T)-G _IF(LO2_IFTB,N,T))/2——(37)。 G _IF (IFTA,N,T)=(G _IF (IFTA_IFTB,N,T)+G _IF (LO2_IFTA,N,T)-G _IF (LO2_IFTB,N,T))/2——(37).

由(22)+(24)-(20)可得：From (22)+(24)-(20), we can get:

G _IF(IFTB,N,T)＝(G _IF(IFTA_IFTB,N,T)+G _IF(LO2_IFTB,N,T)-G _IF(LO2_IFTA,N,T))/2——(38)。 G _IF (IFTB,N,T)=(G _IF (IFTA_IFTB,N,T)+G _IF (LO2_IFTB,N,T)-G _IF (LO2_IFTA,N,T))/2——(38).

将(36)代入(25)可得：Substitute (36) into (25) to get:

G _IF(IFRA,N,T)＝(2*θ _IF(LO2_IFRA,N,T)-G _IF(LO2_IFTA,N,T)-G _IF(LO2_IFTB,N,T)+G _IF(IFTA_IFTB,N,T))/2——(39)。 G _IF (IFRA,N,T)=(2*θ _IF (LO2_IFRA,N,T)-G _IF (LO2_IFTA,N,T)-G _IF (LO2_IFTB,N,T)+G _IF (IFTA_IFTB,N, T))/2——(39).

将(39)代入(26)可得：Substitute (39) into (26) to get:

G _IF(IFRB,N,T)＝(G _IF(IFRA_IFRB,N,T)-G _IF(LO2_IFRA,N,T))+(G _IF(LO2_IFTA,N,T)+G _IF(LO2_IFTB,N,T)-G _IF(IFTA_IFTB,N,T))/2——(40)。 G _IF (IFRB,N,T)=(G _IF (IFRA_IFRB,N,T)-G _IF (LO2_IFRA,N,T))+(G _IF (LO2_IFTA,N,T)+G _IF (LO2_IFTB,N, T)-G _IF (IFTA_IFTB,N,T))/2——(40).

同理，对于相位可得如下等式：In the same way, the following equation can be obtained for the phase:

θ _LO2(LO2,N,T)＝(θ _LO2(LO2_IFTA,N,T)+θ _LO2(LO2_IFTB,N,T)-θ _LO2(IFTA_IFTB,N,T))/2——(41)； θ _LO2 (LO2,N,T)=(θ _LO2 (LO2_IFTA,N,T)+θ _LO2 (LO2_IFTB,N,T)-θ _LO2 (IFTA_IFTB,N,T))/2——(41);

θ _IF(IFTA,N,T)＝(θ _IF(IFTA_IFTB,N,T)+θ _IF(LO2_IFTA,N,T)-θ _IF(LO2_IFTB,N,T))/2——(42)； θ _IF (IFTA,N,T)=(θ _IF (IFTA_IFTB,N,T)+θ _IF (LO2_IFTA,N,T)-θ _IF (LO2_IFTB,N,T))/2——(42);

θ _IF(IFTB,N,T)＝(θ _IF(IFTA_IFTB,N,T)+θ _IF(LO2_IFTB,N,T)-θ _IF(LO2_IFTA,N,T))/2——(43)； θ _IF (IFTB,N,T)=(θ _IF (IFTA_IFTB,N,T)+θ _IF (LO2_IFTB,N,T)-θ _IF (LO2_IFTA,N,T))/2——(43);

θ _IF(IFRA,N,T)＝(2*θ _IF(LO2_IFRA,N,T)-θ _IF(LO2_IFTA,N,T)-θ _IF(LO2_IFTB,N,T)+θ _IF(IFTA_IFTB,N,T))/2——(44)； θ _IF (IFRA,N,T)=(2*θ _IF (LO2_IFRA,N,T)-θ _IF (LO2_IFTA,N,T)-θ _IF (LO2_IFTB,N,T)+θ _IF (IFTA_IFTB,N, T))/2——(44);

θ _IF(IFRB,N,T)＝(θ _IF(IFRA_IFRB，N,T)-θ _IF(LO2_IFRA,N,T))+(θ _IF(LO2_IFTA,N,T)+θ _IF(LO2_IFTB,N,T)-θ _IF(IFTA_IFTB,N,T))/2——(45)。 θ _IF (IFRB,N,T)=(θ _IF (IFRA_IFRB,N,T)-θ _IF (LO2_IFRA,N,T))+(θ _IF (LO2_IFTA,N,T)+θ _IF (LO2_IFTB,N, T)-θ _IF (IFTA_IFTB,N,T))/2——(45).

由于变频器30、中频放大模块40及其连接射频电缆均处于温箱外面。由于相位与温度无关，因此无需测试相位，只需测试常温下的增益即可。具体地，单独常温测试变频器的A通道发射增益G _TA(FC)，B通道发射增益G _RA(FC)，A通道接收增益G _TB(FC)，B通道接收增益G _RB(FC)。单独常温测试中频放大模块40的A通道发射增益G _TA(IF)，B通道发射增益G _TB(IF)，A通道接收增益G _RA(IF)，B通道接收增益G _RB(IF)。 Because the frequency converter 30, the intermediate frequency amplifying module 40 and the connecting radio frequency cable are all outside the thermostat. Since the phase is independent of temperature, there is no need to test the phase, only the gain at room temperature. Specifically, the A channel transmit gain G _TA (FC), the B channel transmit gain G _RA (FC), the A channel receive gain G _TB (FC), and the B channel receive gain G _RB (FC) of the frequency converter are tested separately at room temperature. The A channel transmission gain G _TA (IF), the B channel transmission gain G _TB (IF), the A channel reception gain G _RA (IF), and the B channel reception gain G _RB (IF) of the intermediate frequency amplifier module 40 are tested separately at room temperature.

至此，所有需要校准的数据全部测试完毕。At this point, all the data that needs to be calibrated have been tested.

再次参照图2，当使用A通道发射时，网络分析仪80的一个端口输出中频信号到中频放大模块40的一组串接的中频放大器，再经由中频开关模块70的一组并接单刀多掷开关联接将信号传送到待测试的所述双通道模拟TR组件10的A端口16以输入到相应的A通道。经由所述双通道模拟TR组件上变频滤波放大后输出射频到衰减器，再经由变频器30下变频回中频信号，然后经由中频放大，最后返回到网络分析仪80的另一个端口，并由网络分析仪80测试出装置整体的A通道发射增益相位。2 again, when using channel A to transmit, one port of the network analyzer 80 outputs an intermediate frequency signal to a set of intermediate frequency amplifiers of the intermediate frequency amplifier module 40, and then through a set of intermediate frequency switch modules 70 that are connected in parallel. The throw switch connection transmits the signal to the A port 16 of the dual-channel analog TR assembly 10 to be tested for input to the corresponding A channel. After the dual-channel analog TR component is up-converted and filtered and amplified, the radio frequency is output to the attenuator, and then down-converted back to the intermediate frequency signal by the inverter 30, then amplified by the intermediate frequency, and finally returned to the other port of the network analyzer 80, and the network The analyzer 80 tests the A channel transmit gain phase of the entire device.

类似地，当使用A通道接收时，网络分析仪80的一个端口输出中频信号到变频器上变频为射频信号、经过衰减器ATT1将射频信号传送到待测试的所述双通道模拟TR组件10的A端口16以输入到相应的A通道，由所述双通道模拟TR组件10接收A通道处理输出中频信号给到中频开关模块的70号一组并接单刀多掷开关，联接到中频放大模块的40的一组串接的中频放大器，最后输出的中频信号返回到网络分析仪80的另一个端口，由网络分析仪80测试出装置整体的A通道接收增益相位。Similarly, when using channel A to receive, one port of the network analyzer 80 outputs an intermediate frequency signal to the frequency converter for up-conversion into a radio frequency signal, and transmits the radio frequency signal to the dual-channel analog TR component 10 to be tested through the attenuator ATT1 The A port 16 is input to the corresponding A channel, and the dual-channel analog TR component 10 receives the A channel and processes the output intermediate frequency signal to the No. 70 group of the intermediate frequency switch module and connects the single-pole multi-throw switch to the intermediate frequency amplifier module. A group of 40 IF amplifiers connected in series, the final output IF signal is returned to another port of the network analyzer 80, and the network analyzer 80 tests the overall A channel receiving gain phase of the device.

相应地，当使用B通道发射时，网络分析仪80的一个端口输出中频信号到中频放大模块40的一组串接的中频放大器，再经由中频开关模块70的一组并接单刀多掷开关联接将信号传送到待测试的所述双通道模拟TR组件10的B端口18以输入到相应的B通道。经由所述双通道模拟TR组件上变频滤波放大后输出射频到衰减器，再经由变频器30下变频回中频信号，然后经由中频放大，最后返回到网络分析仪80的另一个端口，并由网络分析仪80测试出装置整体的B通道发射增益相位。Correspondingly, when the B channel is used for transmission, one port of the network analyzer 80 outputs an intermediate frequency signal to a group of IF amplifiers connected in series in the IF amplifier module 40, and then through a group of IF switch modules 70 that are connected in parallel to the single-pole multi-throw switch The connection transmits the signal to the B port 18 of the dual-channel analog TR component 10 to be tested for input to the corresponding B channel. After the dual-channel analog TR component is up-converted and filtered and amplified, the radio frequency is output to the attenuator, and then down-converted back to the intermediate frequency signal by the inverter 30, then amplified by the intermediate frequency, and finally returned to the other port of the network analyzer 80, and the network The analyzer 80 tests the overall B channel transmit gain phase of the device.

相反，当使用B通道接收时，网络分析仪80的一个端口输出中频信号到变频器上变频为射频信号、经过衰减器ATT1将射频信号传送到待测试的所述双通道模拟TR组件10的B端口18以输入到相应的B通道，由所述双通道模拟TR组件10接收B通道处理输出中频信号给到中频开关模块的70号一组并接单刀多掷开关，联接到中频放大模块的40的一组串接的中频放大器，最后输出的中频信号返回到网络分析仪80的另一个端口，由网络分析仪80测试出装置整体的B通道接收增益相位。On the contrary, when using the B channel to receive, one port of the network analyzer 80 outputs the intermediate frequency signal to the frequency converter for up-conversion into a radio frequency signal, and transmits the radio frequency signal to the B of the dual-channel analog TR component 10 to be tested through the attenuator ATT1. Port 18 is input to the corresponding B channel, and the dual-channel analog TR component 10 receives the B channel to process and output the intermediate frequency signal to the No. 70 group of the intermediate frequency switch module and connect the single-pole multi-throw switch to the intermediate frequency amplifier module. A group of IF amplifiers in series 40, the final output IF signal is returned to another port of the network analyzer 80, and the network analyzer 80 tests the overall B-channel receiving gain phase of the device.

假设整个装置联接完毕，并在多个工作温度下反复执行上述测试完毕后，网络分析仪80全温度测试结果如下：Assuming that the entire device is connected and the above tests are repeatedly performed at multiple operating temperatures, the network analyzer 80 full temperature test results are as follows:

A通道的发射增益为G _S21(A,N,T)，相位为θ _S21(A,N,T)。 The transmit gain of channel A is G _S21 (A, N, T), and the phase is θ _S21 (A, N, T).

B通道的发射增益为G _S21(B,N,T)，相位为θ _S21(B,N,T)。 The transmission gain of the B channel is G _S21 (B, N, T), and the phase is θ _S21 (B, N, T).

A通道的接收增益为G _S12(A,N,T)，相位为θ _S12(A,N,T)。 The receiving gain of A channel is G _S12 (A, N, T), and the phase is θ _S12 (A, N, T).

B通道的接收增益为G _S12(A,N,T)，相位为θ _S12(A,N,T)。 The receiving gain of the B channel is G _S12 (A, N, T), and the phase is θ _S12 (A, N, T).

那么，被测试的所述双通道模拟TR组件10的实际反射和增益相位可以按照以下方式计算：Then, the actual reflection and gain phase of the tested dual-channel analog TR component 10 can be calculated as follows:

G _TA(ATR,N,T)＝G _S21(A,N,T)-G _IF(IFTA,N,T)-G _RF(RFA,N,T)-G _TA(FC)-G _TA(IF)——(46) G _TA (ATR,N,T)=G _S21 (A,N,T)-G _IF (IFTA,N,T)-G _RF (RFA,N,T)-G _TA (FC)-G _TA (IF )——(46)

G _TB(ATR,N,T)＝G _S21(B,N,T)-G _IF(IFTB,N,T)-G _RF(RFB,N,T)-G _TB(FC)-G _TB(IF)——(47) G _TB (ATR,N,T)=G _S21 (B,N,T)-G _IF (IFTB,N,T)-G _RF (RFB,N,T)-G _TB (FC)-G _TB (IF )——(47)

G _RA(ATR,N,T)＝G _S12(A,N,T)-G _IF(IFRA,N,T)-G _RF(RFA,N,T)-G _RA(FC)-G _RA(IF)——(48) G _RA (ATR,N,T)=G _S12 (A,N,T)-G _IF (IFRA,N,T)-G _RF (RFA,N,T)-G _RA (FC)-G _RA (IF )——(48)

G _RB(ATR,N,T)＝G _S12(A,N,T)-G _IF(IFRB,N,T)-G _RF(RFB,N,T)-G _RB(FC)-G _RB(IF)——(49) G _RB (ATR,N,T)=G _S12 (A,N,T)-G _IF (IFRB,N,T)-G _RF (RFB,N,T)-G _RB (FC)-G _RB (IF )——(49)

θ _TA(ATR,N,T)＝θ _S21(A,N,T)-θ _IF(IFTA,N,T)-θ _LO2(LO2,N,T)-θ _LO1(LO1,N,T)-θ _RF(RFA,N,T)——(50) θ _TA (ATR,N,T)=θ _S21 (A,N,T)-θ _IF (IFTA,N,T)-θ _LO2 (LO2,N,T)-θ _LO1 (LO1,N,T)- θ _RF (RFA,N,T)——(50)

θ _TB(ATR,N,T)＝θ _S21(B,N,T)-θ _IF(IFTB,N,T)-θ _LO2(LO2,N,T)-θ _LO1(LO1,N,T)-θ _RF(RFB,N,T)——(51) θ _TB (ATR,N,T)=θ _S21 (B,N,T)-θ _IF (IFTB,N,T)-θ _LO2 (LO2,N,T)-θ _LO1 (LO1,N,T)- θ _RF (RFB,N,T)——(51)

θ _RA(ATR,N,T)＝θ _S12(A,N,T)-θ _IF(IFRA,N,T)+θ _LO2(LO2,N,T)+θ _LO1(LO1,N,T)-θ _RF(RFA,N,T)——(52) θ _RA (ATR,N,T)=θ _S12 (A,N,T)-θ _IF (IFRA,N,T)+θ _LO2 (LO2,N,T)+θ _LO1 (LO1,N,T)- θ _RF (RFA,N,T)——(52)

θ _RB(ATR,N,T)＝θ _S12(B,N,T)-θ _IF(IFRB,N,T)+θ _LO2(LO2,N,T)+θ _LO1(LO1,N,T)-θ _RF(RFB,N,T)——(53)。 θ _RB (ATR,N,T)=θ _S12 (B,N,T)-θ _IF (IFRB,N,T)+θ _LO2 (LO2,N,T)+θ _LO1 (LO1,N,T)- θ _RF (RFB,N,T)——(53).

其中，among them,

A通道的发射增益为G _TA(ATR,N,T)，相位为θ _TA(ATR,N,T)； The transmit gain of channel A is G _TA (ATR, N, T), and the phase is θ _TA (ATR, N, T);

B通道的发射增益为G _TB(ATR,N,T)，相位为θ _TB(ATR,N,T)； The transmit gain of channel B is G _TB (ATR, N, T), and the phase is θ _TB (ATR, N, T);

A通道的接收增益为G _RA(ATR,N,T)，相位为θ _RA(ATR,N,T)； The receiving gain of channel A is G _RA (ATR, N, T), and the phase is θ _RA (ATR, N, T);

B通道的接收增益为G _RB(ATR,N,T)，相位为θ _RB(ATR,N,T)。 The receiving gain of the B channel is G _RB (ATR, N, T), and the phase is θ _RB (ATR, N, T).

如上所述，为自动化执行上述测试过程，控制模块90可以是电子控制装置，其具有：预编程的数字计算机或处理器；存储器或非暂时性计算机可读介质，其用于存储诸如控制逻辑、软件应用、指令、计算机代码、软件或应用、数据、查找表等数据；以及收发器(或输入\输出端)。计算机可读介质或存储器包括能够由计算机访问的任何类型的介质，诸如只读存储器(ROM)、随机存取存储器(RAM)、硬盘驱动器、光盘(CD)、数字视频光盘(DVD)或任何其他类型的存储器。“非暂时性”计算机可读介质排除传输暂时电信号或其他信号的有线、无线、光学或其他通信链路。非暂时性计算机可读介质包括其中可以永久存储数据的介质和其中可以存储数据并随后重写数据的介质，诸如可重写光盘或可擦除存储装置。计算机代码、软件或应用程序包括任何类型的程序代码(包括源代码、目标代码和可执行代码)。处理器配置成执行代码或指令，以实施上述方法。As mentioned above, in order to automate the execution of the above-mentioned test process, the control module 90 may be an electronic control device, which has: a pre-programmed digital computer or processor; a memory or a non-transitory computer-readable medium for storing control logic, Software applications, instructions, computer codes, software or applications, data, lookup tables and other data; and transceivers (or input/output terminals). Computer-readable media or memory includes any type of media that can be accessed by a computer, such as read only memory (ROM), random access memory (RAM), hard drive, compact disk (CD), digital video compact disk (DVD), or any other Type of storage. "Non-transitory" computer-readable media excludes wired, wireless, optical, or other communication links that transmit temporary electrical or other signals. The non-transitory computer-readable medium includes a medium in which data can be permanently stored and a medium in which data can be stored and then the data is rewritten, such as a rewritable optical disc or a removable storage device. Computer code, software or application programs include any type of program code (including source code, object code, and executable code). The processor is configured to execute codes or instructions to implement the above methods.

应强调的是，可以对本文描述的实施方案实施多种变化和修改，其要件应理解为可接受的示例。所有此类修改和变化旨在使得本文中包含在本公开的范围内并且受到所附权利要求的保护。而且，本文描述的步骤中任一步骤可以同时执行或以不同于在本文的排序的这些步骤的次序来执行。而且，正如应该显见到的，本文所公开的具体实施方案的特征和属性可以按不同的方式进行组合以形成附加的实施方案，所有这些实施方案均落在本公开的范围内。It should be emphasized that various changes and modifications can be implemented to the embodiments described herein, and the elements should be understood as acceptable examples. All such modifications and changes are intended to be included herein within the scope of this disclosure and protected by the appended claims. Moreover, any one of the steps described herein may be performed at the same time or in an order different from the order of these steps in this document. Moreover, as should be apparent, the features and attributes of the specific embodiments disclosed herein can be combined in different ways to form additional embodiments, all of which fall within the scope of the present disclosure.

除非另有具体说明，或者在所使用的上下文中有另外的理解，否则在本文中使用的条件语言(诸如，尤其是，“能”、“可”、“可能”、“可以”、“例如”等)一般旨在表达某些实施方案包括，而另一些实施方案不包括某些特征、元件和/或状态。因此，此类条件语言一般不旨在以任何方式暗示特征、元件和/或状态对于一个或者多个实施方案是必不可少的，或者一个或者多个实施方案必定包括用于决定(在有或者没有作者输入或者提示的情况下)这些特征、元件和/或状态包括在任何具体实施方案中或者是否要在任何特定实施方案中执行这些特征、元件和/或状态的逻辑。Unless specifically stated otherwise, or otherwise understood in the context used, the conditional language used herein (such as, in particular, "can", "may", "may", "may", "for example "Etc.) is generally intended to express that certain embodiments include, while other embodiments do not include certain features, elements, and/or states. Therefore, such conditional language is generally not intended to imply in any way that features, elements, and/or states are indispensable for one or more embodiments, or that one or more embodiments must include a decision (when there is or Without the author's input or prompt) these features, elements and/or states are included in any specific implementation or whether the logic of these features, elements and/or states is to be implemented in any specific implementation.

流程图和流程图中的框图示出了根据本公开的各种实施例的***、方法和计算机程序产品的可能实现的架构、功能和操作。就这一点而言，流程图或框图中的每个框可表示代码的模块、片段或部分，其包括用于实现指定的一个或多个逻辑功能的一个或多个可执行指令。还应注意，框图和/或流程图图示中的每个框，以及框图和/或流程图图示中的框的组合可由执行特定功能或动作，或专用硬件和计算机指令的组合的基于专用硬件的***来实现。这些计算机程序指令还可存储在计算机可读介质中，该计算机可读介质可指示控制模块或其它可编程数据处理设备以特定方式起作用，使得存储在计算机可读介质中的指令产生包括用于实现在流程图和/或一个或多个框图块中指定的功能/动作的指令的制品。The flowcharts and the block diagrams in the flowcharts show possible implementation architecture, functions, and operations of the system, method, and computer program product according to various embodiments of the present disclosure. In this regard, each block in the flowchart or block diagram may represent a module, segment, or portion of code, which includes one or more executable instructions for implementing the specified one or more logical functions. It should also be noted that each block in the block diagram and/or flowchart illustration, and the combination of blocks in the block diagram and/or flowchart illustration may perform specific functions or actions, or a combination of dedicated hardware and computer instructions based on dedicated The hardware system is implemented. These computer program instructions can also be stored in a computer-readable medium, which can instruct the control module or other programmable data processing equipment to function in a specific manner, so that the generation of instructions stored in the computer-readable medium includes A product that implements instructions for the functions/actions specified in the flowchart and/or one or more block diagrams.

数值数据在本文中可能以范围的格式表示或呈示。要理解的是，仅仅出于方便和简洁而使用此类范围格式，并且因此，此类范围格式应该灵活地解释为不只包括如该范围的限制叙述的数值，而且解释为包括涵盖在该范围内的所有个别数值或者子范围，如同明确地引述了每个数值和子范围。作为说明，“大约1至5”的数值范围应该解释为不仅包括大约1至大约5中明确引述的值，而且应该解释为还包括在指示的范围内的各个值和子范围。因此，包括在该数值范围内的是诸如2、3和4等的各个值以及诸如“大约1至大约3”、“大约2至大约4”和“大约3至大约5”、“1至3”、“2至4”、“3至5”等子范围。此原理同样适用于仅引述一个数值的范围(例如，“约大于1”)，并且无论范围的广度或者描述的特点如何，都应该适用。为了方便起见，可以在公共列表中呈示多个项。然而，这些列表应该解释为好像列表中的每个成员各自被识别为单独且唯一的成员。因此，此类列表中的个别成员在没有相反明示的情况下均不应仅基于它们存在于公共组中而被解释为同一个列表中的任何其它成员的实际等效物。而且，当结合项的列表使用术语“和”和“或者”时，术语“和”和“或者”应该被广义地解释，因为可以单独地或者结合其它列出的项来使用所列出的项中的任何一个或者多个项。术语“可替换地”是指选择两个或者更多个替换方案中的一个，但是不旨在将选择仅限于那些列出的替换方案或者仅限于一次选择所列出的替换方案中的一个，除非上下文另有明确指示。Numerical data may be expressed or presented in a range format in this article. It is to be understood that such range formats are used only for convenience and brevity, and therefore, such range formats should be flexibly interpreted as not only including the numerical values as stated in the limits of the range, but also as including being included in the range All individual values or sub-ranges of, as if each value and sub-range were clearly quoted. As an illustration, the numerical range of "approximately 1 to 5" should be interpreted as not only including the values expressly quoted in about 1 to about 5, but also as including various values and sub-ranges within the indicated range. Therefore, included in this numerical range are various values such as 2, 3, and 4, as well as values such as "about 1 to about 3", "about 2 to about 4" and "about 3 to about 5", "1 to 3 ", "2 to 4", "3 to 5" and other sub-ranges. This principle is also applicable to a range that only quotes a value (for example, "about greater than 1"), and should apply regardless of the breadth of the range or the characteristics of the description. For convenience, multiple items can be presented in a public list. However, these lists should be interpreted as if each member in the list is individually identified as a separate and unique member. Therefore, individual members in such lists should not be construed as actual equivalents of any other members in the same list based on their existence in the public group, unless they are explicitly stated to the contrary. Also, when the terms "and" and "or" are used in conjunction with a list of items, the terms "and" and "or" should be interpreted broadly, because the listed items can be used alone or in combination with other listed items Any one or more items in. The term "alternatively" refers to the selection of one of two or more alternatives, but is not intended to limit the selection to only those listed alternatives or to select only one of the listed alternatives at a time, Unless the context clearly indicates otherwise.

虽然上文描述了示例性实施方案，但并这些实施方案不旨在描述权利要求所包含的所有可能形式。本说明书中使用的词汇是描述词汇，而不是限制词汇，并且要理解的是，在不脱离本发明的精神和范围的情况下，可以进行多种更改。如先前描述，可以将多种实施方案的特征进行组合以形成可能未被明确地描述或图示的本公开的示例性方面。虽然多种实施方案可能描述为关于一个或多个期望的特性提供相对于其他实施方案或现有技术实施方式的优点或优选于其他实施方案或现有技术实施方式，但本领域技术人员认识到，可以将一个或多个特征或特性进行折中处理以实现根据具体应用和实施方式所期望的总体***属性。这些属性可以包括但不限于成本、强度、耐久性、寿命周期成本、适销性、外观、包装、尺寸、可维修性、重量、可制造性、易于装配等。因此，关于一个或多个特性不像其他实施方案或现有技术实施方式那样描述为期望的实施方案不在本发明的范围外，并且可能是特定应用所期望的。Although exemplary embodiments have been described above, these embodiments are not intended to describe all possible forms encompassed by the claims. The vocabulary used in this specification is a description vocabulary, not a limiting vocabulary, and it should be understood that various changes can be made without departing from the spirit and scope of the present invention. As previously described, the features of various embodiments may be combined to form exemplary aspects of the present disclosure that may not be explicitly described or illustrated. Although various embodiments may be described as providing advantages over or preferred over other embodiments or prior art implementations with respect to one or more desired characteristics, those skilled in the art recognize , One or more features or characteristics can be compromised to achieve the overall system properties expected according to specific applications and implementations. These attributes can include, but are not limited to, cost, strength, durability, life cycle cost, marketability, appearance, packaging, size, maintainability, weight, manufacturability, ease of assembly, etc. Therefore, embodiments that are not described as desired with respect to one or more characteristics like other embodiments or prior art embodiments are outside the scope of the present invention and may be desired for a particular application.

Claims

一种双通道变频***的相位增益全温度自动化测试装置，适用于测试带有增加上下变频部分的双通道模拟TR组件；其中，所述双通道模拟TR组件具有用于外接频率源的高本振和低本振、两个用于发射和接收射频信号的A端口和B端口，以及用于中频信号输入和输出的中频端口组；A full-temperature automatic test device for phase gain of a dual-channel frequency conversion system, which is suitable for testing dual-channel analog TR components with increased up-down conversion parts; wherein, the dual-channel analog TR components have high local oscillator and low frequency for external frequency sources. Local oscillator, two A and B ports for transmitting and receiving radio frequency signals, and an intermediate frequency port group for intermediate frequency signal input and output;

所述相位增益全温度自动化测试装置包括：The phase gain full temperature automatic test device includes:

频率源，用于输出指定频率的信号；Frequency source, used to output signals of specified frequency;

变频器，用于上下变频信号的频率；Frequency converter, used for frequency up and down frequency conversion signal;

中频放大模块，用于放大中频信号；IF amplifying module, used to amplify IF signals;

大功率射频开关，分别可操作地联接待测试的所述双通道模拟TR组件的A端口和B端口到所述变频器；High-power radio frequency switches respectively operably connect the A port and B port of the dual-channel analog TR component to be tested to the frequency converter;

单刀多掷开关，分别可操作地联接待测试的所述双通道模拟TR组件的高本振和低本振到频率源；Single-pole multi-throw switches, respectively, operably connect the high local oscillator and low local oscillator to the frequency source of the dual-channel analog TR component tested;

中频开关模块，分别可操作地联接待测试的所述双通道模拟TR组件的中频端口组中的各个中频端口到所述中频放大模块；以及The intermediate frequency switch module is respectively operatively connected to each intermediate frequency port in the intermediate frequency port group of the dual-channel analog TR component under test to the intermediate frequency amplifier module; and

网络分析仪，联接所述中频放大模块到所述变频器以形成检测通路，从而测试所述中频放大模块和所述变频器之间中频信号的增益相位；A network analyzer, connecting the intermediate frequency amplifying module to the frequency converter to form a detection path, thereby testing the gain phase of the intermediate frequency signal between the intermediate frequency amplifying module and the frequency converter;

其中，所述双通道模拟TR组件设置在温度可控的温箱内部。Wherein, the dual-channel analog TR component is arranged inside a temperature-controllable incubator.
根据权利要求1所述的相位增益全温度自动化测试装置，其特征在于，所述大功率射频开关和所述变频器之间还设置有衰减器。The phase gain full temperature automatic test device according to claim 1, wherein an attenuator is further provided between the high-power radio frequency switch and the frequency converter.
根据权利要求1所述的相位增益全温度自动化测试装置，其特征在于，所述变频器内还设置有负载电阻，以测试所述双通道模拟TR组件的A端口和B端口之间的隔离程度。The phase gain full temperature automatic test device according to claim 1, wherein a load resistor is also provided in the frequency converter to test the degree of isolation between the A port and the B port of the dual-channel analog TR component .
根据权利要求1所述的相位增益全温度自动化测试装置，其特征在于，所述中频放大模块是由一组中频放大器串接而成。The phase gain full-temperature automatic test device according to claim 1, wherein the intermediate frequency amplifier module is formed by a series of intermediate frequency amplifiers.
根据权利要求1所述的相位增益全温度自动化测试装置，其特征在于，所述中频开关模块是由一组单刀多掷开关并接而成。The phase gain full temperature automatic test device according to claim 1, wherein the intermediate frequency switch module is formed by a group of single-pole multi-throw switches connected in parallel.
根据权利要求1所述的相位增益全温度自动化测试装置，其特征在于，所述网络分析仪的端口至少有两个，并且所述网络分析仪的端口分别联接到中频放大器，以分别测试所述双通道模拟TR组件的A端口和B端口的发射增益相位和接收增益相位。The phase gain full-temperature automatic test device according to claim 1, wherein there are at least two ports of the network analyzer, and the ports of the network analyzer are respectively connected to an intermediate frequency amplifier to test the The transmit gain phase and receive gain phase of the A port and B port of the dual-channel analog TR component.
根据权利要求1-6中任一所述的相位增益全温度自动化测试装置，其特征在于，待测试的所述双通道模拟TR组件的数量范围是1-8，且数量上限与所述单刀多掷开关的掷数相等。The phase gain full-temperature automatic test device according to any one of claims 1-6, wherein the number of the dual-channel analog TR components to be tested ranges from 1 to 8, and the upper limit of the number is equal to that of the single pole. The number of throws of the throw switch is equal.
根据权利要求7中所述的相位增益全温度自动化测试装置，其特征在于，待测试的所述双通道模拟TR组件的数量与所单刀多掷开关的掷数都是8。The phase gain full-temperature automatic test device according to claim 7, wherein the number of the dual-channel analog TR components to be tested and the number of throws of the single-pole multi-throw switch are both 8.
一种双通道变频***的相位增益全温度自动化测试方法，用于如上述权利要求1-7中任一所述相位增益全温度自动化测试装置，并包括以下步骤：A phase gain full-temperature automated test method for a dual-channel frequency conversion system, used in the phase gain full-temperature automated test device according to any one of claims 1-7, and includes the following steps:

S100)在待测试的温度和频率下，校准所述双通道模拟TR组件各个通道的全温度增益相位；S100) At the temperature and frequency to be tested, calibrate the full temperature gain phase of each channel of the dual-channel analog TR component;

S200)在常温下，分别单独测试所述变频器和所述中频放大模块的发射增益和接收增益；S200) separately test the transmission gain and reception gain of the frequency converter and the intermediate frequency amplifying module under normal temperature;

S300)在待测试的温度和频率下，通过网络分析仪分别测量在A端口和B端口下的发射增益、接收增益及对应的增益相位；S300) Under the temperature and frequency to be tested, measure the transmit gain, receive gain, and corresponding gain phase of the A port and the B port through a network analyzer;

S400)基于校准的所述全温度增益相位、所述变频器和所述中频放大模块的发射增益和接收增益和在A端口和B端口下的发射增益、接收增益及对应的增益相位，确定各个双通道模拟TR组件A端口和B端口的发射增益、接收增益及对应的增益相位。S400) Based on the calibrated full temperature gain phase, the transmission gain and reception gain of the frequency converter and the intermediate frequency amplifying module, and the transmission gain, reception gain and corresponding gain phase under the A port and B port, determine each Two-channel analog TR component A port and B port transmit gain, receive gain and corresponding gain phase.
一种双通道变频***的相位增益全温度自动化测试***，适用于测试带有增加上下变频部分的双通道模拟TR组件；其中，所述双通道模拟TR组件具有用于外接频率源的高本振和低本振，两个用于发射和接收射频信号的A端口和B端口，以及用于中频信号输入和输出的中频端口组；A phase gain full-temperature automatic test system for a dual-channel frequency conversion system, suitable for testing dual-channel analog TR components with increased up-down conversion parts; wherein, the dual-channel analog TR components have high local oscillators and low frequency for external frequency sources. Local oscillator, two A and B ports for transmitting and receiving radio frequency signals, and an intermediate frequency port group for intermediate frequency signal input and output;

所述相位增益全温度自动化测试装置包括：The phase gain full temperature automatic test device includes:

频率源，用于输出指定频率的射频信号；Frequency source, used to output radio frequency signal of specified frequency;

变频器，用于改变射频信号的频率；Frequency converter, used to change the frequency of the radio frequency signal;

中频放大模块，用于放大中频信号IF amplifier module, used to amplify IF signals

大功率射频开关，分别可操作地联接待测试的所述双通道模拟TR组件的A端口和B端口到所述变频器；High-power radio frequency switches respectively operably connect the A port and B port of the dual-channel analog TR component to be tested to the frequency converter;

单刀多掷开关，分别可操作地联接待测试的所述双通道模拟TR组件的高本振和低本振到频率源；Single-pole multi-throw switches, respectively, operably connect the high local oscillator and low local oscillator to the frequency source of the dual-channel analog TR component tested;

中频开关模块，分别可操作地联接待测试的所述双通道模拟TR组件的中频端口组中的各个中频端口到所述中频放大模块；以及The intermediate frequency switch module is respectively operatively connected to each intermediate frequency port in the intermediate frequency port group of the dual-channel analog TR component under test to the intermediate frequency amplifier module; and

网络分析仪，联接所述中频放大模块到所述变频器以形成检测通路，从而测试所述中频放大模块和所述变频器之间中频信号的增益相位；A network analyzer, connecting the intermediate frequency amplifying module to the frequency converter to form a detection path, thereby testing the gain phase of the intermediate frequency signal between the intermediate frequency amplifying module and the frequency converter;

其中，所述双通道模拟TR组件设置在温度可控的温箱内部；以及Wherein, the dual-channel analog TR component is arranged inside a temperature-controllable incubator; and

其中，所述相位增益全温度自动化测试***还包括控制模块，所述控制模块用于执行如权利要求9所述的方法。Wherein, the phase gain full temperature automatic test system further includes a control module, and the control module is used to execute the method according to claim 9.