WO2020103165A1 - Structure de source de lumière, module de projection optique, appareil de détection et dispositif - Google Patents

Structure de source de lumière, module de projection optique, appareil de détection et dispositif

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Publication number
WO2020103165A1
WO2020103165A1 PCT/CN2018/117342 CN2018117342W WO2020103165A1 WO 2020103165 A1 WO2020103165 A1 WO 2020103165A1 CN 2018117342 W CN2018117342 W CN 2018117342W WO 2020103165 A1 WO2020103165 A1 WO 2020103165A1
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WO
WIPO (PCT)
Prior art keywords
light
emitting unit
source structure
emitting
emitting units
Prior art date
Application number
PCT/CN2018/117342
Other languages
English (en)
Chinese (zh)
Inventor
田浦延
Original Assignee
深圳阜时科技有限公司
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by 深圳阜时科技有限公司 filed Critical 深圳阜时科技有限公司
Priority to PCT/CN2018/117342 priority Critical patent/WO2020103165A1/fr
Priority to CN201880002352.7A priority patent/CN109643051B/zh
Publication of WO2020103165A1 publication Critical patent/WO2020103165A1/fr

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    • G—PHYSICS
    • G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
    • G03B—APPARATUS OR ARRANGEMENTS FOR TAKING PHOTOGRAPHS OR FOR PROJECTING OR VIEWING THEM; APPARATUS OR ARRANGEMENTS EMPLOYING ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ACCESSORIES THEREFOR
    • G03B21/00—Projectors or projection-type viewers; Accessories therefor
    • G03B21/14—Details
    • G03B21/20—Lamp housings
    • G03B21/2006—Lamp housings characterised by the light source
    • G03B21/2033—LED or laser light sources
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/24—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures
    • G—PHYSICS
    • G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
    • G03B—APPARATUS OR ARRANGEMENTS FOR TAKING PHOTOGRAPHS OR FOR PROJECTING OR VIEWING THEM; APPARATUS OR ARRANGEMENTS EMPLOYING ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ACCESSORIES THEREFOR
    • G03B21/00—Projectors or projection-type viewers; Accessories therefor
    • G03B21/14—Details
    • G03B21/20—Lamp housings
    • G03B21/2006—Lamp housings characterised by the light source
    • G03B21/2013—Plural light sources

Definitions

  • the present application belongs to the technical field of optics, and particularly relates to a light source structure, an optical projection module, a sensing device and equipment.
  • the existing three-dimensional (3D) sensing module usually uses a light source structure with an irregularly distributed light emitting unit to project a corresponding irregularly distributed light spot pattern for three-dimensional sensing.
  • forming irregularly distributed light-emitting units on a semiconductor substrate requires precise positioning of the light-emitting units, which is difficult to manufacture.
  • the distribution of the light-emitting units is designed to be arranged in a regular pattern in order to reduce the difficulty of production, the projected regular spot pattern will not be able to realize three-dimensional sensing because the relative positional relationship is too similar, and if you want to use a regular arrangement of light-emitting units to project
  • a diffractive optical element with a complex structure is expensive to manufacture and is not conducive to product promotion.
  • the application provides a light source structure, an optical projection module, a sensing device and equipment for realizing three-dimensional sensing.
  • An embodiment of the present application provides a light source structure, which is used to emit a light beam to a measured object for three-dimensional sensing.
  • the light source structure includes a semiconductor substrate and a plurality of light emitting units formed on the semiconductor substrate.
  • the light emitting units are distributed on the semiconductor substrate in the form of a two-dimensional lattice. Select a reference sub-region in the light-emitting unit. If there is a correlation coefficient between the transformation of the sub-region of the light-emitting unit and the reference sub-region in the light-emitting unit, the correlation coefficient is greater than or equal to a preset threshold.
  • the product of the ratio of the set of light-emitting unit sub-regions to all light-emitting units and the average value of the correlation coefficient corresponding to the transformation of each light-emitting unit sub-region in the set is greater than or equal to 0.25 and less than 1.
  • the ratio of the number of light-emitting units included in the reference sub-region to the total number of all light-emitting units is greater than or equal to 10%.
  • the reference sub-region includes more than ten light-emitting units.
  • the transformation is an affine transformation
  • the affine transformation includes a translation transformation, a rotation transformation, and a mirror transformation.
  • the total number of all light-emitting units is greater than or equal to 50.
  • the correlation coefficient is a normalized correlation coefficient
  • the preset correlation coefficient threshold is 0.3.
  • the product is greater than or equal to 0.3 and less than 0.5.
  • the ratio of the set of light-emitting unit sub-regions to all light-emitting units is the ratio of the number of light-emitting units included in the set of light-emitting unit sub-regions to the total number of all light-emitting units .
  • the ratio of the set of light-emitting unit sub-regions to all light-emitting units is the ratio of the sum of the areas of the light-emitting unit sub-regions in the set to the total area of the entire light-emitting region.
  • the light-emitting unit set includes two or more types of light-emitting unit sets that are arranged according to different arrangement patterns, and the normalized correlation coefficient between the different types of light-emitting unit sets is less than 0.3, the same There is no correlation between the light-emitting units in one set of light-emitting units.
  • the light source structure includes two sets of light emitting units, the normalized correlation coefficient between the light emitting units in the same set of light emitting units is less than 0.3, and the The normalized correlation coefficient is greater than or equal to 0.3 and less than or equal to 1.
  • the light emitting unit is selected from any one of vertical cavity surface emitting lasers, light emitting diodes, and laser diodes, and combinations thereof.
  • the light emitting unit emits laser light with a current signal, and the laser current is greater than 1 mA.
  • An embodiment of the present application provides an optical projection module for projecting a patterned light beam with a preset pattern onto a target to be measured for three-dimensional sensing, which includes a beam adjustment element, a patterned optical element, and any implementation as described above
  • the light source structure provided by the way.
  • the light beam adjusting element is used to adjust the light beam emitted by the light source structure to meet the preset propagation characteristic requirements.
  • the patterned optical element is used to rearrange the light field emitted by the light source structure to form a patterned light beam with a predetermined pattern.
  • the optical projection module further includes a driving circuit that provides current to drive the light emitting unit to emit light.
  • the beam adjustment element includes one or more of a collimating element, a beam expanding element, a reflecting element, an optical microlens array group, or a grating.
  • the patterned optical element includes one or more of a diffractive optical element, an optical microlens array, or a grating.
  • Embodiments of the present application provide a sensing device for sensing three-dimensional information of a measured object. It includes the optical projection module and the sensing module provided in the above embodiments.
  • the sensing module is used to sense the preset pattern projected by the optical module on the object to be measured and analyze the preset The image of the pattern acquires the three-dimensional information of the object to be measured.
  • the sensing module includes a lens, an image sensor, and an image analysis processor, and the image sensor senses the image formed by the patterned light beam on the measured object through the lens, the image The analysis processor analyzes the sensed image projected on the measured object to obtain three-dimensional information of the measured object.
  • the sensing device is a three-dimensional face recognition device that senses the three-dimensional information on the surface of the object to be measured and recognizes the identity of the object to be measured accordingly.
  • An embodiment of the present application provides an apparatus, including the sensing device provided by the above embodiment.
  • the device performs the corresponding function according to the three-dimensional information of the measured object sensed by the sensing device.
  • the sensing device is a three-dimensional face recognition device for sensing three-dimensional information on the surface of the target to be measured
  • the device is a mobile phone, which is used to sense the three-dimensional face recognition device The three-dimensional information of the face of the measured object to identify the identity of the measured object.
  • the light source structure, the optical projection module, the sensing device and the device provided in the embodiments of the present application are related to each other because the arrangement positions of the light emitting units of the different light emitting unit sets are related to each other.
  • the location can be accurately determined more easily, reducing the difficulty of production.
  • FIG. 1 is a schematic structural diagram of a light source structure provided by the first embodiment of the present application.
  • FIG. 2 is a schematic diagram of the light-emitting unit distribution of the light source structure shown in FIG. 1.
  • FIG. 3 is a schematic structural diagram of a light source structure provided by a second embodiment of the present application.
  • FIG. 4 is a schematic structural diagram of a light source structure provided by a third embodiment of the present application.
  • FIG. 5 is a schematic structural diagram of a light source structure provided by a fourth embodiment of the present application.
  • FIG. 6 is a schematic diagram of calculating correlation coefficients between sets of light-emitting units with different sizes.
  • FIG. 7 is a schematic structural diagram of a light source structure provided by a fifth embodiment of the present application.
  • FIG. 8 is a schematic structural diagram of a light source structure provided by a sixth embodiment of the present application.
  • FIG. 9 is a schematic structural diagram of an optical module provided by a seventh embodiment of the present application.
  • FIG. 10 is a schematic structural diagram of a sensing device provided in an eighth embodiment of the present application.
  • FIG. 11 is a schematic structural diagram of a device provided in a ninth embodiment of the present application.
  • connection should be understood in a broad sense, for example, it can be fixed or detachable Connection, or integrated connection; it can be mechanical connection, electrical connection or mutual communication; it can be directly connected, or it can be indirectly connected through an intermediary, it can be the connection between two components or the mutual connection between two components Role relationship.
  • the first embodiment of the present application provides a light source structure 1 for emitting a light beam to a measured object for three-dimensional sensing.
  • the light beam may be a light beam with a specific wavelength according to the sensing principle and application scenario.
  • the light beam is used to sense the three-dimensional information of the measured object, and may be an infrared or near-infrared wavelength light beam with a wavelength range of 750 nanometers (Nanometer, nm) to 1650 nm.
  • the light source structure 1 includes a semiconductor substrate 10, a plurality of light emitting units 12 formed on the semiconductor substrate 10, an anode 14 and a cathode 16.
  • the light-emitting unit 12 is a semiconductor structure capable of emitting light under the action of electrical excitation, and is formed on the semiconductor substrate 10 through processes such as photolithography, etching, and / or metal organic chemical vapor deposition.
  • the light emitting unit 12 may be, but not limited to, a vertical cavity surface emitting laser (Vertical Cavity Surface Emitting Laser, VCSEL).
  • the anode 14 and the cathode 16 are respectively disposed on opposite end surfaces of the semiconductor substrate 10, and the light-emitting unit 12 is excited by the current signal to emit light.
  • the excitation current is greater than 1 mA.
  • the light emitting unit 12 may also be a light emitting diode (Light Emitting Diode, LED) or a laser diode (Laser Diode, LD). Therefore, the light emitting unit 12 is selected from any one of VCSEL, LED, and LD, and a combination thereof.
  • LED Light Emitting Diode
  • LD Laser Diode
  • the light-emitting units 12 are distributed in the light-emitting area of the semiconductor substrate 10 in the form of a two-dimensional lattice, and at least three adjacent light-emitting units 12 are unequal on the semiconductor substrate 10 Arranged at intervals. All the light-emitting units 12 have correlation as a whole.
  • the correlation of the arrangement pattern composed of the plurality of light-emitting units 12 is usually evaluated by calculating the correlation coefficient f n between the plurality of light-emitting units 12, if the calculated correlation coefficient f n is greater than or equal to If the threshold is preset, then the light-emitting units 12 are considered to be related.
  • the calculation formula of the correlation coefficient f n may be, but not limited to, a normalized correlation coefficient formula (Normalized Correlation Coefficient, NCC), and the expression is as follows:
  • the R 0 is a reference sub-region of the light-emitting unit 12 randomly selected from all the light-emitting units 12 on the semiconductor substrate 10 according to a preset condition, and the light-emitting unit 12 refers to the sub-region R 0 to traverse the entire light-emitting region of the semiconductor substrate 10 except R Other parts other than 0 and calculate the correlation coefficient f n of the light-emitting unit 12 reference sub-region R 0 and the light-emitting unit sub-region R n passed through during the traversal process.
  • Said H is the height of the sub-region R n of the light-emitting unit 12 under consideration
  • W is the width of the sub-region R n of the light-emitting unit 12 under consideration.
  • the preset condition for selecting the reference sub-region R 0 of the light-emitting unit 12 is that the ratio of the number of light-emitting units 12 included in the reference sub-region of the selected light-emitting unit 12 to the total number of all light-emitting units 12 is greater than or equal to 10% or the selected light-emitting
  • the unit 12 reference sub-region includes more than ten light-emitting units 12.
  • the total number of all light-emitting units 12 is greater than or equal to 50.
  • the light-emitting unit 12 refers to the sub-region R 0 to perform traversal in a manner of translation in a plane rectangular coordinate system.
  • the The center is the origin to expand the area of the light-emitting unit 12 to avoid that when the physical size of the light-emitting unit 12 is small, the background area in the entire arrangement pattern is too large, so that the normalized correlation coefficient calculated by the above formula cannot be reflected
  • the actual correlation between the light emitting units 12 is shown.
  • the arrangement pattern of the light-emitting units 12 with low correlation can also calculate a high normalized correlation coefficient.
  • the calculated normalized correlation coefficient of the arrangement pattern of the light-emitting unit 12 can reflect the actual correlation between the light-emitting units 12 to the greatest extent.
  • the regions of each light-emitting unit 12 are expanded at the same scale, and the degree of expansion should be such that adjacent regions of the light-emitting units 12 do not overlap each other after expansion.
  • the light-emitting unit 12 may refer to the sub-region R 0 to traverse in a polar coordinate system by rotating around the coordinate origin.
  • f n 1
  • the selected light-emitting unit 12 refers to the light-emitting unit 12 in the sub-region R 0 and the light-emitting unit 12 in the sub-region R n of the light-emitting unit 12 passing through during traversal is exactly the same, that is, the light-emitting unit 12 refers to the sub-region R 0 is completely related to the light emitting unit 12 sub-region R n .
  • the selected light-emitting unit 12 refers to the light-emitting unit 12 in the sub-region R 0 and the light-emitting unit 12 in the sub-region R n of the light-emitting unit 12 passing through during traversing partially overlaps, that is, the light-emitting unit 12
  • the reference sub-region R 0 is partially related to the sub-region R n of the light-emitting unit 12.
  • a larger normalized correlation coefficient f n indicates that the selected light-emitting unit 12 refers to the light-emitting unit 12 in the reference sub-region R 0 and passes through The more the light-emitting units 12 in the light-emitting unit 12 sub-region R n overlap each other, that is, the higher the correlation between the light-emitting unit 12 reference sub-region R 0 and the light-emitting unit 12 sub-region R n .
  • the normalized correlation coefficient f n ⁇ 0.3 it can be considered that the reference sub-region R 0 of the light-emitting unit 12 is related to the sub-region R n of the light-emitting unit 12, and there is a correlation between the light-emitting units 12. If the normalized correlation coefficient f n ⁇ 0.5, it can be considered that the reference sub-region R 0 of the light-emitting unit 12 is highly correlated with the sub-region R n of the light-emitting unit 12, and there is a high correlation between the light-emitting units 12.
  • the correlation coefficient is a normalized correlation coefficient f n
  • the preset threshold is 0.3, that is, if the light-emitting unit 12 refers to the sub-region R 0 during the traversal process, the calculated normalization exists.
  • the normalized correlation coefficient f n ⁇ 0.3, or the peak value of the normalized correlation coefficient f n calculated by the light-emitting unit 12 with reference to the sub-region R 0 during the traversal process f n_max ⁇ 0.3 can be regarded as the light-emitting unit There is a correlation between 12 as a whole.
  • the position of the light-emitting units 12 on the semiconductor substrate 10 can be easily determined, which reduces the difficulty of manufacturing.
  • the second embodiment of the present application provides a light source structure 2, which is basically the same as the light source structure 1 in the first embodiment, and the main difference is that when evaluating the correlation between the light emitting units 22
  • the ratio of the light-emitting units 22 that is greater than or equal to the preset normalized correlation coefficient threshold to all the light-emitting units 22 is also considered to more objectively evaluate the light-emitting unit 22 Correlation between.
  • a correlation strength function for evaluating the correlation between the light-emitting units 22 is defined
  • the sub-regions of the light-emitting unit 22 are denoted as R 1 , ..., R N ,
  • the S is a collection of all light-emitting units on the entire semiconductor substrate 20.
  • the ratio may be, but not limited to, the ratio of the number of related light-emitting units 22 to the total number of all light-emitting units 22, or the ratio of the area of the related light-emitting units 22 to the total surface of the entire light-emitting area Evaluation can be selected according to the actual situation.
  • the P and S may be the number of the light-emitting units 22 in the corresponding light-emitting unit 12 set. If the light emitting units 22 are evenly distributed, the P and S may also be the area of the area where the corresponding light emitting units 22 are located. It can be understood that, in the calculation of P and S here, the overlapping parts that may occur in R 0 , R 1 , ..., R N are calculated only once without repeated calculation.
  • the preset correlation coefficient threshold is 0.3, that is, when f n ⁇ 0.3, the light-emitting unit 12 in the corresponding light-emitting unit 22 sub-region R n (0 ⁇ n ⁇ N) is considered to be
  • the selected light-emitting unit 22 has a correlation between reference sub-regions R 0 , and the light-emitting unit 22 sub-region R n (0 ⁇ n ⁇ N) can be applied to the correlation intensity function defined above To evaluate the overall correlation of all light emitting units 22 on the semiconductor substrate 10.
  • the a is the ratio of the light-emitting units 22 having correlation to all the light-emitting units 22, so 0 ⁇ a ⁇ 1. Said Is the average value of the normalized correlation coefficient f n , so Therefore, the correlation strength function
  • the calculated correlation strength value F also satisfies the value range 0 ⁇ F ⁇ 1.
  • the correlation intensity value F satisfies 0.25 ⁇ F ⁇ 0.5, all the light-emitting units 22 on the semiconductor substrate 20 have correlation as a whole. If the correlation intensity value F satisfies 0.5 ⁇ F ⁇ 1, all the light-emitting units 22 on the semiconductor substrate 20 are strongly correlated as a whole.
  • the calculated correlation intensity value F may be different according to the reference sub-region R 0 of the light-emitting unit 22 selected in the calculation process
  • the change is not always consistent, so when determining the correlation strength of all the light-emitting units 22 on the semiconductor substrate 20 as a whole, based on the correlation calculated by all light-emitting units 22 satisfying the preset conditions with reference to the sub-region R 0
  • the maximum value of the sexual intensity value F is used for judgment.
  • the correlation intensity value F calculated according to the light-emitting unit 22 reference sub-region R 0 satisfies the corresponding range of the correlation intensity defined above That is, the light-emitting unit 22 on the semiconductor substrate 20 has a corresponding correlation strength as a whole.
  • all the light-emitting units 22 on the semiconductor substrate 20 have correlation as a whole.
  • the maximum value F max of the correlation intensity value F of the entire light-emitting units 22 is greater than or equal to 0.25 and less than 1. That is, the correlation intensity value F calculated by the light-emitting unit 22 selected according to the preset condition with reference to the sub-region R 0 is greater than or equal to 0.25 and less than 1.
  • all the light emitting units 22 on the semiconductor substrate 20 have a strong correlation as a whole.
  • the maximum value F max of the correlation intensity value F of the entire light-emitting units 22 is greater than or equal to 0.5 and less than 1. That is, the correlation intensity value F calculated by the light-emitting unit 22 selected according to the preset condition with reference to the sub-region R 0 is greater than or equal to 0.5 and less than 1.
  • the third embodiment of the present application provides a light source structure 3, which is basically the same as the light source structure 2 in the second embodiment, and the main difference is that the reference sub-region R of the light-emitting unit 32 selected in the calculation 0 and the traversed correlation coefficient f n between other parts of the light-emitting region of the semiconductor substrate 30 when examining the light-emitting unit 32 reference sub-region R 0 and the traversed light-emitting unit 32 sub-region R n (0 ⁇ n ⁇ N )
  • the normalized correlation coefficient f n between the changing sub-regions R ′ n (0 ⁇ n ⁇ N) of the light-emitting unit 32 obtained after the transformation T.
  • the transformation T may be, but not limited to, an affine transformation.
  • the affine transformation includes transformations such as translation, rotation, and mirroring. In this embodiment, the transformations T are all referred to a plane rectangular coordinate system.
  • the light-emitting unit 32 sub-region R n (0 ⁇ n ⁇ N) of the original light-emitting unit 32 on the semiconductor substrate 30 undergoes the conversion T, and the conversion sub-region R ′ n of the light-emitting unit 32 and the selected light-emitting unit 32 reference sub
  • the normalized correlation coefficient f n between the regions R 0 satisfies f n ⁇ 0.3
  • the number of 32 light-emitting units in the sub-region R n (0 ⁇ n ⁇ N) of the light-emitting unit 32 is related to the corresponding normalization
  • the coefficient f n is applied to the correlation strength function defined above To evaluate the overall correlation of all light emitting units 32 on the semiconductor substrate 30.
  • the expression of the normalized correlation coefficient f n is as follows:
  • R ′ n T (R n )
  • H is the height of the light emitting unit 32 of the sub-region examined R n (0 ⁇ n ⁇ N)
  • the light emitting unit 32 W is examined in the sub region R n (0 ⁇ n ⁇ N) width.
  • the fourth embodiment of the present application provides a light source structure 4, which is basically the same as the light source structure 1 in the first embodiment, and the main difference is that all the light emitting units 42 on the semiconductor substrate 40 can Divided into a plurality of light-emitting unit sets 420, the plurality here refers to two or more than two. There is a correlation between the light-emitting unit sets 420. There is at least one light-emitting unit 42 within the light-emitting unit set 420 that has no correlation.
  • the correlation between the light-emitting unit sets 420 can be evaluated by calculating the normalized correlation coefficient f n between the light-emitting unit sets 420.
  • the calculation formula is as described above and can be:
  • R 0 and R n are respectively two sets of light emitting units 420 that need to calculate the normalized correlation coefficient f n
  • H is the height of the light emitting unit set 420 under consideration
  • W is the width of the light emitting unit set 420 under consideration.
  • the value range of the normalized correlation coefficient f n is 0 ⁇ f n ⁇ 1, when f n ⁇ 0.3, it is considered that there is no correlation between the light-emitting unit sets 420; when f n ⁇ 0.3, it is considered that between said light emitting unit 420 having a set of correlation; when f n ⁇ 0.5, it is considered set between the light emitting unit 420 are highly correlated.
  • the number of light-emitting units 42 included in the light-emitting unit set 420 is greater than or equal to 10, or the ratio of the number of light-emitting units 42 included in the total number of all light-emitting units 42 is greater than or equal to 10%.
  • the normalized correlation coefficient between the light-emitting unit sets 420 is 0.3 ⁇ f n ⁇ 1.
  • the light-emitting unit sets 420 may be highly correlated, and the normalized correlation coefficient between the light-emitting unit sets 420 is 0.5 ⁇ f n ⁇ 1.
  • the light-emitting unit set 421 is used as a reference sub-region to traverse the extended region 400 according to the formula of the normalized correlation coefficient f n to calculate the normalization between the light-emitting units 42 in the entire region 400 correlation coefficient f n set as the light emitting means and the light emitting unit 420 a set of normalized correlation coefficient between 421 f n.
  • the coordinate values in the extended area 400 except for the light emitting unit set 420 and the light emitting unit set 421 need to be set to 0, so as to eliminate The influence caused by the normalized correlation coefficient f n between the light-emitting unit 42 originally existing in the unit set 420 and the light-emitting unit set 421.
  • the correlation between the light-emitting unit sets 420 may be that each two of the light-emitting unit sets 420 are related to each other, or there may be a case where at least two light-emitting unit sets 420 have correlation Not all the light-emitting unit sets 420 are related to each other.
  • the correlation between the light-emitting units 42 inside the light-emitting unit set 420 adopts the correlation intensity function described in the first embodiment
  • the correlation intensity value F ⁇ 0.1 between all the light-emitting units 42 in the light-emitting unit set 420 there is no correlation between the light-emitting units 42 in at least one of the light-emitting unit sets 420, and the correlation intensity value F ⁇ 0.1 between all the light-emitting units 42 in the light-emitting unit set 420.
  • the fifth embodiment of the present application provides a light source structure 5, which is basically the same as the light source structure 4 in the fourth embodiment, and the main difference is that the light emitting unit set 520 includes a third type of light emitting unit Set 521 and fourth type light emitting unit set 522. There is no correlation between the light-emitting units 52 in the third type of light-emitting unit set 521.
  • the light-emitting units 52 in the third type of light-emitting unit set 521 are all arranged according to the same first arrangement pattern. There is no correlation between the light-emitting units in the fourth type of light-emitting unit set 522.
  • the light emitting units 52 in the fourth type light emitting unit set 522 are all arranged according to the same second arrangement pattern, and the second arrangement pattern is different from the first arrangement pattern. There is no correlation between the different types of light-emitting unit sets 521 and 522. That is, the normalized correlation coefficient between the light-emitting unit sets 521 and 522 of different classes is less than 0.3.
  • all the light emitting units 52 on the semiconductor substrate 50 can be divided into nine light emitting unit sets 520.
  • the number of the third type light emitting unit set 521 is four, and the number of the fourth type light emitting unit set 522 is five.
  • Each light-emitting unit set 520 includes at least ten light-emitting units 52. It can be understood that the positions of the third type light-emitting unit set 521 and the fourth type light-emitting unit set 522 may be any grid in the matrix arrangement, as long as the requirements of the corresponding number and arrangement pattern are satisfied.
  • the total number of the light-emitting unit sets 520 is not limited to nine, and the arrangement manner is not limited to nine-grid or matrix arrangement. It suffices that at least one set of the third type light emitting unit set 521 and at least one set of the fourth type light emitting unit set 522 are satisfied.
  • the sixth embodiment of the present application provides a light source structure 6, which is basically the same as the light source structure 4 in the fourth embodiment, and the main difference is that the light source structure 6 includes two light emitting unit sets 620 . There is no correlation between the light-emitting units 62 in each light-emitting unit set 620. There is a correlation between the two light-emitting unit sets 620. That is, the set of two light emitting units normalized correlation coefficient between 620 0.3 ⁇ f n ⁇ 1, the normalized correlation coefficient f n ⁇ 0.3 between the light emitting cells 62 within each of the light emitting unit 620. In this embodiment, each light-emitting unit set 620 includes at least one hundred unrelated light-emitting units 62.
  • the seventh embodiment of the present application provides an optical projection module 7 for projecting a patterned light beam with a preset pattern onto an object to be measured for sensing.
  • the optical projection module 7 includes a beam adjustment element 70, a patterned optical element 72, and the light source structure 1 in the first to sixth embodiments described above.
  • the beam adjustment element 70 includes, but is not limited to, a collimating element, a beam expanding element, a reflecting element, an optical microlens array group, and a grating.
  • the light beam adjusting element 70 is used to adjust the light beam emitted by the light source structure 1 so as to satisfy the preset propagation characteristic requirements, such as: propagation direction, collimation, beam aperture, etc.
  • the patterned optical element 72 is used to rearrange the light field emitted by the light source structure 1 to form a patterned light beam that can project a preset pattern on the object to be measured.
  • the patterned optical element 72 includes but is not limited to one or more of a diffractive optical element (Diffractive Optical Element, DOE), an optical microlens array group, or a grating.
  • the diffractive optical element replicates the light beam emitted by the light source structure 1 and spreads it within a preset angle range to form a patterned light beam and project it onto the object to be measured.
  • the eighth embodiment of the present application provides a sensing device 8 for sensing three-dimensional information of a measured object.
  • the sensed spatial information of the measured object can be used to identify the measured object or construct a three-dimensional model of the measured object.
  • the sensing device 8 includes the optical projection module 7 and the sensing module 80 as provided in the seventh embodiment described above.
  • the optical projection module 7 is used to project a specific light beam onto the measured object.
  • the sensing module 80 includes a lens 81, an image sensor 82, and an image analysis processor 83.
  • the image sensor 82 senses the image formed by the patterned light beam on the object to be measured through the lens 81.
  • the image analysis processor 83 analyzes the sensed image projected on the measured object to obtain three-dimensional information of the measured object.
  • the sensing device 8 is a three-dimensional face recognition device that senses the three-dimensional information on the surface of the measured object and recognizes the identity of the measured object accordingly.
  • the sensing module 80 analyzes the three-dimensional information of the surface of the measured target according to the shape change of the preset pattern projected on the measured target by the sensed patterned light beam and performs the measurement on the measured target accordingly Face recognition.
  • the ninth embodiment of the present application provides a device 9, such as a mobile phone, a notebook computer, a tablet computer, a touch interactive screen, a door, a vehicle, a robot, an automatic CNC machine tool, and so on.
  • the device 9 includes at least one sensing device 8 provided in the eighth embodiment described above.
  • the device 9 is used to perform corresponding functions according to the sensing result of the sensing device 8.
  • the corresponding functions include, but are not limited to, any one of unlocking, paying, launching a preset application, avoiding obstacles, and recognizing a user's facial expression using deep learning technology to determine the user's emotions and health One or more.
  • the sensing device 8 is a three-dimensional face recognition device that senses the three-dimensional information on the surface of the measured object and recognizes the identity of the measured object accordingly.
  • the device 9 is an electronic terminal such as a mobile phone, a notebook computer, a tablet computer, a touch interactive screen equipped with the three-dimensional face recognition device, or a door, a vehicle, a security inspection instrument, an immigration gate, etc. that involve access authority Device 9.
  • the light source structure 1, the optical projection module 7, the sensing device 8 and the device 9 provided in this application are related to each other due to the arrangement positions of the light emitting units 12 of the different light emitting unit sets 120 In fact, the position of the light-emitting unit 12 on the semiconductor substrate 10 can be easily and accurately determined, which reduces the difficulty of manufacturing.

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  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Optics & Photonics (AREA)
  • Length Measuring Devices By Optical Means (AREA)

Abstract

La présente invention concerne une structure de source de lumière (3) qui sert à émettre un faisceau lumineux au niveau d'un objet cible en cours de mesure dans le but d'effectuer une détection tridimensionnelle. La structure de source de lumière (3) comprend un substrat semi-conducteur (30) et de multiples unités électroluminescentes (32) formées sur le substrat semi-conducteur (30). Les unités électroluminescentes (32) sont formées en un réseau bidimensionnel distribué sur le substrat semi-conducteur (30). Une sous-région de référence (R0) est sélectionnée parmi les unités électroluminescentes (32). Si un coefficient de corrélation entre une sous-région d'unité électroluminescente transformée (R'n), acquise par la transformation d'une sous-région d'unité électroluminescente (Rn) dans les unités électroluminescentes (32), et la sous-région de référence (R0) est plus grande ou égale à un seuil prédéfini, le produit du rapport du nombre d'ensembles formés par les sous-régions d'unité électroluminescente (Rn) au nombre total des unités électroluminescentes (32), et une valeur moyenne des coefficients de corrélation correspondant aux sous-régions d'unités électroluminescentes transformées (R'n) acquise par la transformation de toutes les sous-régions d'unité électroluminescente (Rn) dans chaque ensemble est supérieure ou égale à 0,25 et inférieure à 1.
PCT/CN2018/117342 2018-11-24 2018-11-24 Structure de source de lumière, module de projection optique, appareil de détection et dispositif WO2020103165A1 (fr)

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PCT/CN2018/117342 WO2020103165A1 (fr) 2018-11-24 2018-11-24 Structure de source de lumière, module de projection optique, appareil de détection et dispositif
CN201880002352.7A CN109643051B (zh) 2018-11-24 2018-11-24 一种光源结构、光学投影模组、感测装置及设备

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