WO2020051990A1 - 一种测量方法和测量装置 - Google Patents

一种测量方法和测量装置 Download PDF

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Publication number
WO2020051990A1
WO2020051990A1 PCT/CN2018/111328 CN2018111328W WO2020051990A1 WO 2020051990 A1 WO2020051990 A1 WO 2020051990A1 CN 2018111328 W CN2018111328 W CN 2018111328W WO 2020051990 A1 WO2020051990 A1 WO 2020051990A1
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values
measurement
measured
value
discrete
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PCT/CN2018/111328
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English (en)
French (fr)
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陈伟
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重庆惠科金渝光电科技有限公司
惠科股份有限公司
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Priority to US16/311,697 priority Critical patent/US20210223138A1/en
Publication of WO2020051990A1 publication Critical patent/WO2020051990A1/zh

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    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01M—TESTING STATIC OR DYNAMIC BALANCE OF MACHINES OR STRUCTURES; TESTING OF STRUCTURES OR APPARATUS, NOT OTHERWISE PROVIDED FOR
    • G01M11/00—Testing of optical apparatus; Testing structures by optical methods not otherwise provided for
    • G01M11/02—Testing optical properties
    • G01M11/0207—Details of measuring devices
    • G—PHYSICS
    • G09—EDUCATION; CRYPTOGRAPHY; DISPLAY; ADVERTISING; SEALS
    • G09G—ARRANGEMENTS OR CIRCUITS FOR CONTROL OF INDICATING DEVICES USING STATIC MEANS TO PRESENT VARIABLE INFORMATION
    • G09G3/00—Control arrangements or circuits, of interest only in connection with visual indicators other than cathode-ray tubes
    • G09G3/006—Electronic inspection or testing of displays and display drivers, e.g. of LED or LCD displays
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01M—TESTING STATIC OR DYNAMIC BALANCE OF MACHINES OR STRUCTURES; TESTING OF STRUCTURES OR APPARATUS, NOT OTHERWISE PROVIDED FOR
    • G01M11/00—Testing of optical apparatus; Testing structures by optical methods not otherwise provided for
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01M—TESTING STATIC OR DYNAMIC BALANCE OF MACHINES OR STRUCTURES; TESTING OF STRUCTURES OR APPARATUS, NOT OTHERWISE PROVIDED FOR
    • G01M11/00—Testing of optical apparatus; Testing structures by optical methods not otherwise provided for
    • G01M11/30—Testing of optical devices, constituted by fibre optics or optical waveguides
    • G01M11/31—Testing of optical devices, constituted by fibre optics or optical waveguides with a light emitter and a light receiver being disposed at the same side of a fibre or waveguide end-face, e.g. reflectometers
    • G01M11/3109—Reflectometers detecting the back-scattered light in the time-domain, e.g. OTDR
    • G01M11/3145—Details of the optoelectronics or data analysis
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T2207/00—Indexing scheme for image analysis or image enhancement
    • G06T2207/30—Subject of image; Context of image processing
    • G06T2207/30108—Industrial image inspection
    • G—PHYSICS
    • G09—EDUCATION; CRYPTOGRAPHY; DISPLAY; ADVERTISING; SEALS
    • G09G—ARRANGEMENTS OR CIRCUITS FOR CONTROL OF INDICATING DEVICES USING STATIC MEANS TO PRESENT VARIABLE INFORMATION
    • G09G2360/00—Aspects of the architecture of display systems
    • G09G2360/14—Detecting light within display terminals, e.g. using a single or a plurality of photosensors
    • G09G2360/144—Detecting light within display terminals, e.g. using a single or a plurality of photosensors the light being ambient light

Definitions

  • the present application relates to the field of display technology, and more particularly, to a measurement method and a measurement device.
  • the displays using active switch control include liquid crystal displays, OLED displays, and the like.
  • the liquid crystal display has many advantages such as a thin body, power saving, and no radiation, and has been widely used.
  • Most of the liquid crystal displays known to the inventors are backlight-type liquid crystal displays, which include a liquid crystal panel and a backlight module (BacklightModule).
  • the working principle of a liquid crystal panel is to place liquid crystal molecules in two parallel glass substrates, and apply a driving voltage to the two glass substrates to control the rotation direction of the liquid crystal molecules so as to refract the light of the backlight module to generate a picture.
  • OLED displays also known as organic electroluminescence displays, have many advantages such as self-illumination, short response time, high definition and contrast, flexible display and large-area full-color display. . Its superior performance and huge market potential have attracted many manufacturers and research institutions around the world to invest in the production and research and development of OLED display panels.
  • Liquid crystal displays and OLED displays use optical measuring instruments in the production process.
  • Optical measuring instruments are susceptible to external light when measuring, and the measurement results are subject to large errors due to equipment vibration and environmental factors.
  • the technical problem to be solved by the present application is to provide a measurement method and a measurement device that reduce measurement errors.
  • the present application provides a measurement method.
  • the method includes steps:
  • a measurement method comprising the steps:
  • the final measurement data is obtained based on the remaining measurement values.
  • the extreme values include a maximum value and a minimum value.
  • the step of obtaining final measurement data based on the remaining measurement values includes:
  • the remaining measurement values are averaged to obtain the final measurement data.
  • the step of removing extreme values from the measured values includes:
  • the discrete area and the non-discrete area are set according to the distribution distance of the measured values in the coordinate axis, and the difference between similar measured values in the non-discrete area is smaller than the discrete area; there are at least two non-discrete areas;
  • the step of averaging the remaining measurement values to obtain the final measurement data includes: performing a weighted average according to the weight of the measurement values to obtain the final measurement data.
  • the item to be measured is measured at least twice, and the step of recording the measurement value includes: performing three measurements on the item to be tested;
  • the step of removing extreme values in the measured values includes: removing the maximum and minimum values in the measured values;
  • the step of obtaining final measurement data based on the remaining measurement values includes:
  • the number of the measurement values is 5-10.
  • the present application also discloses a measurement method, which is characterized in that the method includes steps:
  • the extreme values include a maximum value and a minimum value.
  • the present application also discloses a measurement device, the measurement device includes:
  • Measurement chip set to perform at least two measurements on the item to be measured, and record the measurement value
  • Screening circuit remove extreme values from measured values
  • the extreme values include a maximum value and a minimum value.
  • the screening circuit is configured to set a discrete area and a non-discrete area according to the measured value, and set the measured value of the discrete area to an extreme value;
  • the difference between similar measurement values in the non-discrete area is smaller than the discrete area.
  • the measurement instrument is susceptible to external light, equipment vibration, and environmental factors that cause a large error in the measurement result during the measurement. Because the light intensity measured by the optical instrument is the result of the photoelectric sensor converting the light intensity into a discrete voltage, and then integrating it over a period of time, the photoelectric sensor collects each discrete voltage regardless of the external ambient light intensity. Changes in the measurement, or photoelectric conversion caused by equipment vibration, will cause the final measurement results to be too inaccurate. In this application, the measurement points are measured continuously for multiple times, and after removing the extreme values, the remaining measurement values are relatively close to the true values. Therefore, the final measurement data is obtained from this, which can eliminate or reduce the optical factors during the measurement process. The measurement error caused by factors such as ambient light and equipment vibration improves the measurement accuracy. In addition, this application does not require hardware modification to existing equipment, and the cost is low.
  • FIG. 1 is a schematic diagram of a measurement method according to an embodiment of the present application.
  • FIG. 2 is a schematic diagram of a measurement method according to another embodiment of the present application.
  • FIG. 3 is a schematic diagram of a measurement method according to another embodiment of the present application.
  • FIG. 4 is a schematic diagram of setting a discrete area and a non-discrete area according to an embodiment of the present application
  • FIG. 5 is a schematic diagram of a plurality of non-discrete regions according to another embodiment of the present application.
  • FIG. 6 is a schematic diagram of data distribution obtained by averaging six measurement values according to another embodiment of the present application.
  • FIG. 7 is a schematic diagram of a measurement method according to another embodiment of the present application.
  • FIG. 8 is a schematic diagram of a measurement device according to another embodiment of the present application.
  • an embodiment of the present application discloses a measurement method, and the method includes steps:
  • S11 Perform at least two optical measurements on the item to be measured, and record the measured value
  • Extreme values include maximum and minimum values.
  • optical measurement instruments are susceptible to external light, equipment vibration, and environmental factors that cause large errors in measurement results when performing measurements. Because the light intensity measured by the optical instrument is the result of the photoelectric sensor converting the light intensity into a discrete voltage, and then integrating it over a period of time, the photoelectric sensor collects each discrete voltage regardless of the external ambient light intensity. Changes in the measurement, or photoelectric conversion caused by equipment vibration, will cause the final measurement results to be too inaccurate. In this application, the measurement points are continuously measured multiple times, and then the maximum and minimum values are removed. The remaining measurement values are relatively close to the true values.
  • the final measurement data is obtained from this, which can eliminate or Attenuates measurement errors caused by ambient light, equipment vibration, and other factors during the measurement process to improve measurement accuracy.
  • this application does not require hardware modification to existing equipment, and the cost is low.
  • the maximum and minimum values deviate farthest from the true value, so after removing the maximum and minimum values from the measured values, the average value obtained from the remaining data is closer to the true value.
  • a measurement method is disclosed.
  • the method includes steps:
  • S21 Perform at least two measurements on the item to be measured, and record the measurement value
  • the extreme values include a maximum value and a minimum value.
  • the maximum and minimum values deviate farthest from the true value, so after removing the maximum and minimum values from the measured values, the average value obtained from the remaining data is closer to the true value.
  • optional steps for removing extreme values from the measured values include:
  • S31 Perform at least two measurements on the item to be measured, and record the measurement value.
  • the remaining measurement values are weighted and averaged according to the weight of the measurement values to obtain the final measurement data.
  • the measurement values close to the true value will be close to each other with a small difference.
  • the measured values that deviate from the real value will be far away from each other, and the difference is large.
  • the discrete and non-discrete regions can be divided based on similar measurement values, and the quality of the remaining measurement values can be further improved, making the average value closer to the true value.
  • the coordinate axis can display the distance between the measured values very intuitively.
  • each measured value has a point on the coordinate axis. It can be clearly seen that the points in the middle part are denser, and the points at both ends are obviously in a discrete state.
  • the A region can be set as a non-discrete region, and the B region can be set as a discrete region. Exclude the measurement value corresponding to area B.
  • the number of measured values is 5-10.
  • the larger the number of measurements the more time-consuming and labor-intensive it will increase production costs.
  • the measurement error deviation of the measuring instrument is generally not too large. Therefore, control within 5-10 intervals can ensure the accuracy of the measurement.
  • a measurement method is disclosed.
  • the method includes steps:
  • This embodiment can eliminate or reduce the measurement error caused by factors such as the ambient light of the optical instrument and the vibration of the equipment during the measurement process, and improve the measurement accuracy. Secondly, the greater the number of measurements, the lower the efficiency. Therefore, in order to ensure that the value is relatively reliable on as few measurements as possible, it is a simple and effective method to take the intermediate value through three measurements. The maximum and minimum values are removed, and the deviation between the intermediate value and the actual value is very close. It can be applied to general occasions and meets the accuracy requirements. Moreover, this embodiment does not require hardware modification to existing equipment, and the cost is low.
  • the measuring device includes:
  • Measurement chip 1 Set to perform at least two measurements on the item to be measured and record the measurement value
  • Screening circuit 2 remove extreme values from the measured values
  • Calculator 3 average the remaining measurement values; get the final measurement data.
  • the extreme values include a maximum value and a minimum value.
  • the maximum and minimum values deviate farthest from the true value, so after removing the maximum and minimum values from the measured values, the average value obtained from the remaining data is closer to the true value.
  • the screening circuit is optionally configured to set discrete areas and non-discrete areas according to the measured values, and set the measured values of the discrete areas to extreme values;
  • the difference between similar measurements is smaller than in discrete regions.
  • the panel of the present application may be a TN panel (full name is TwistedNematic, that is, a twisted nematic panel), an IPS panel (In-PaneSwitcing, plane conversion), a VA panel (Multi-domainVerticaAignment, multi-quadrant vertical alignment technology), of course, it can also Other types of panels are applicable.
  • TN panel full name is TwistedNematic, that is, a twisted nematic panel
  • IPS panel In-PaneSwitcing, plane conversion
  • VA panel Multi-domainVerticaAignment, multi-quadrant vertical alignment technology

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  • Chemical & Material Sciences (AREA)
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Abstract

本申请公开了一种测量方法和测量装置。所述测量方法包括步骤：对待测物品进行至少两次测量，记录测量值；去掉测量值中的极端值；基于剩余的测量值得到最终的量测数据。

Description

一种测量方法和测量装置
本申请要求于2018年09月11日提交中国专利局，申请号为CN201811055950.9、发明名称为“一种测量方法和测量装置”的中国专利申请的优先权，其全部内容通过引用结合在本申请中。
技术领域
本申请涉及显示技术领域，更具体的说，涉及一种测量方法和测量装置。
背景技术
这里的陈述仅提供与本申请有关的背景信息，而不必然地构成现有技术。
采用主动开关控制的显示器包括液晶显示器、OLED显示器等。液晶显示器具有机身薄、省电、无辐射等众多优点，得到了广泛的应用。发明人知晓的液晶显示器大部分为背光型液晶显示器，其包括液晶面板及背光模组(BacklightModule)。液晶面板的工作原理是在两片平行的玻璃基板当中放置液晶分子，并在两片玻璃基板上施加驱动电压来控制液晶分子的旋转方向，以将背光模组的光线折射出来产生画面。有机发光二极管(Organic Light-Emitting Diode，OLED)显示器，也称为有机电致发光显示器，具有自发光、响应时间短、清晰度与对比度高、可实现柔性显示与大面积全色显示等诸多优点。其优越性能和巨大的市场潜力，吸引了全世界众多厂家和科研机构投入到OLED显示面板的生产和研发中。
液晶显示器、OLED显示器在生产过程中都要使用到光学量测仪器。光学量测仪器在进行量测的时候容易受到外界光，设备震动以及环境因素造成量测结果误差较大。
技术解决方案
有鉴于上述的缺陷，本申请所要解决的技术问题是提供一种降低测量误差的测量方法和测量装置。
为实现上述目的，本申请提供了一种测量方法。所述方法包括步骤：
一种测量方法，所述方法包括步骤：
对待测物品进行至少两次测量，记录测量值；
去掉测量值中的极端值；
基于剩余的测量值得到最终的量测数据。
可选的，所述极端值包括最大值和最小值。
可选的，所述基于剩余的测量值得到最终的量测数据的步骤包括：
将剩余的测量值取平均值，得到最终的量测数据。
可选的，所述去掉测量值中的极端值的步骤包括：
将测量值记录到坐标轴中；
根据测量值在坐标轴中的分布间距设定离散区域和非离散区域，所述非离散区域内相近测量值之间的差值小于离散区域；所述非离散区至少有两个；
将离散区域的测量值设为极端值；
根据相近两个测量值的差值划分至少两个所述非离散区域的测量值的权重；
将所述剩余的测量值取平均值，得到最终的量测数据的步骤包括：根据测量值的权重进行加权平均，得到最终的量测数据。
可选的，所述对待测物品进行至少两次测量，记录测量值的步骤包括：对待测物品进行三次测量；
所述去掉测量值中的极端值的步骤包括：去掉测量值中的最大值和最小值；
所述基于剩余的测量值得到最终的量测数据的步骤包括：
取中间值作为最终的量测数据。
可选的，所述测量值的数量为5-10个。
本申请还公开了一种测量方法，其特征在于，所述方法包括步骤：
对待测物品进行至少两次光学测量，记录测量值；
去掉测量值中的极端值；
将剩余的测量值取平均值，得到最终的量测数据；
所述极端值包括最大值和最小值。
本申请还公开了一种测量装置，所述测量装置包括：
测量芯片：设置为对待测物品进行至少两次测量，并记录测量值；
筛选电路：去掉测量值中的极端值；
计算器：将剩余的测量值取平均值；得到最终的量测数据。
可选的，所述极端值包括最大值和最小值。
可选的，所述筛选电路设置为：根据测量值设定离散区域和非离散区域，将离散区域的测量值设为极端值；
所述非离散区域内相近测量值之间的差值小于离散区域。
发明人研究发现，测量仪器在进行量测的时候容易受到外界光，设备震动以及环境因素造成量测结果误差较大。因为光学仪器量测出来的光强度是光电传感器将光的强度转换成离散的电压，然后在一段时间内做积分的结果，所以光电传感器在采集每一个离散的电压时无论是受到外部环境光强的变化，或是设备振动引起光电转换，都将导致最终的量测结果误差太大。本申请待对量测点连续量测量多次，然后去掉极端值后，剩余的测量值都比较接近于真实值，因此从中得到最终的量测数据，这样可以消除或减弱量测过程中因光学仪器受环境光，设备振动等因素引起的量测误差，提高测量准确性。而且本申请无须对现有设备进行硬件改动，成本低廉。
附图说明
所包括的附图用来提供对本申请实施例的进一步的理解，其构成了说明书的一部分，用于例示本申请的实施方式，并与文字描述一起来阐释本申请的原理。显而易见地，下面描述中的附图仅仅是本申请的一些实施例，对于本领域普通技术人员来讲，在不付出创造性劳动性的前提下，还可以根据这些附图获得其他的附图。在附图中：
图1是本申请实施例测量方法的示意图；
图2是本申请另一实施例测量方法的示意图；
图3是本申请另一实施例测量方法的示意图；
图4是本申请实施例离散区域和非离散区域设置的示意图；
图5是本申请另一实施例有多个非离散区域的示意图；
图6是本申请另一实施例采用六个测量值求平均值数据分布示意图；
图7是本申请另一实施例测量方法的示意图；
图8是本申请另一实施例测量装置的示意图。
其中，1、测量芯片；2、筛选电路；3、计算器。
本申请的实施方式
这里所公开的具体结构和功能细节仅仅是代表性的，并且是用于描述本申请的示例性实施例的目的。但是本申请可以通过许多替换形式来具体实现，并且不应当被解释成仅仅受限于这里所阐述的实施例。
在本申请的描述中，需要理解的是，术语“中心”、“横向”、“上”、“下”、“左”、“右”、“竖直”、“水平”、“顶”、“底”、“内”、“外”等指示的方位或位置关系为基于附图所示的方位或位置关系，仅是为了便于描述本申请和简化描述，而不是指示或暗示所指的装置或元件必须具有特定的方位、以特定的方位构造和操作，因此不能理解为对本申请的限制。此外，术语“第一”、“第二”仅用于描述目的，而不能理解为指示或暗示相对重要性或者隐含指明所指示的技术特征的数量。由此，限定有“第一”、“第二”的特征可以明示或者隐含地包括一个或者更多个该特征。在本申请的描述中，除非另有说明，“多个”的含义是两个或两 个以上。另外，术语“包括”及其任何变形，意图在于覆盖不排他的包含。
在本申请的描述中，需要说明的是，除非另有明确的规定和限定，术语“安装”、“相连”、“连接”应做广义理解，例如，可以是固定连接，也可以是可拆卸连接，或一体地连接；可以是机械连接，也可以是电连接；可以是直接相连，也可以通过中间媒介间接相连，可以是两个元件内部的连通。对于本领域的普通技术人员而言，可以具体情况理解上述术语在本申请中的具体含义。
这里所使用的术语仅仅是为了描述具体实施例而不意图限制示例性实施例。除非上下文明确地另有所指，否则这里所使用的单数形式“一个”、“一项”还意图包括复数。还应当理解的是，这里所使用的术语“包括”和/或“包含”规定所陈述的特征、整数、步骤、操作、单元和/或组件的存在，而不排除存在或添加一个或更多其他特征、整数、步骤、操作、单元、组件和/或其组合。
下面结合附图和较佳的实施例对本申请作进一步说明。
如图1所示，本申请实施例公布了一种测量方法，方法包括步骤：
S11：对待测物品进行至少两次光学测量，记录测量值；
S12：去掉测量值中的最大值和最小值；
S13：将剩余的测量值取平均值；
S14：得到最终的量测数据。
极端值包括最大值和最小值。
发明人研究发现，光学量测仪器在进行量测的时候容易受到外界光，设备震动以及环境因素造成量测结果误差较大。因为光学仪器量测出来的光强度是光电传感器将光的强度转换成离散的电压，然后在一段时间内做积分的结果，所以光电传感器在采集每一个离散的电压时无论是受到外部环境光强的变化，或是设备振动引起光电转换，都将导致最终的量测结果误差太大。本申请待对量测点连续量测量多次，然后去掉测量值中的最大值和最小值后，剩余的测量值都比较接近于真实值，因此从中得到最终的量测数据，这样可以消除或减弱量测过程中因光学仪器受环境光，设备振动等因素引起的量测误差，提高测量准确性。而且本申请无须对现有设备进行硬件改动，成本低廉。而最大值和最小值偏离真实数值最远，因此去掉测量值中的最大值和最小值后，剩余数据得到的平均值更接近于真实数值。
作为本申请的另一实施例，参考图2至所示，公开了一种测量方法。方法包括步骤：
S21、对待测物品进行至少两次测量，记录测量值；
S22、去掉测量值中的极端值；
S23、基于剩余的测量值得到最终的量测数据。
本实施方式可选的，极端值包括最大值和最小值。
最大值和最小值偏离真实数值最远，因此去掉测量值中的最大值和最小值后，剩余数据得到的平均值更接近于真实数值。
参考图3，本实施方式可选的，去掉测量值中的极端值的步骤包 括：
S31、对待测物品进行至少两次测量，记录测量值；
S32、将测量值记录到坐标轴中；
S33、根据测量值在坐标轴中的分布间距设定离散区域和非离散区域，非离散区域内相近测量值之间的差值小于离散区域；非离散区至少有两个；
S34、将离散区域的测量值设为极端值；
S35、根据相近两个测量值的差值划分至少两个非离散区域的测量值的权重；
S36、根据测量值的权重对将剩余的测量值进行加权平均，得到最终的量测数据。
对待测物品进行至少两次测量以后，接近真实值的测量值会彼此靠近，差值较小。而偏离真实值的测量值会相互远离，差值较大。基于此，可以基于相近的测量值来划分离散区域和非离散区域，可以进一步提高剩余的测量值的质量，使得平均值更接近于真实值。坐标轴可以非常直观的展示测量值之间的间距，对待测物品进行至少两次测量以后，一部分数据会明显积聚，而***的数据则明显离散分布，因此，可以用很直观的方式来合理划分离散区域和非离散区域。针对非离散区域，越接近真实值的测量值差值越小，可靠性越高，在求平均值的时候应该有更高的权重，这样可以进一步缩小测量误差，提高测量准确性。
参考图4，每个测量值在坐标轴上都有一个点，可以明显看到中 间部分的点比较密集，而两端的点明显呈现出离散状态，因此。可以将A区域设定为非离散区域，B区域设定为离散区域。把B区域对应的测量值排除掉。
参考图5，同样是A区域的，靠近中间区域的密度更高，更接近于真实值，因此可以再设定一个A1区域和A2区域，A1部分的权重设定更高一些，在计算平均值的时候可以更准确。
针对非离散区域，越接近真实值的测量值差值越小，可靠性越高，在求平均值的时候应该有更高的权重，这样可以进一步缩小测量误差，提高测量准确性。
本实施方式可选的，测量值的数量为5-10个。测量数量越多，耗时耗力，会增加生产成本。而在实际生产过程中，测量仪器的测量误差偏差一般不会太大，因此，控制在5-10个区间内，可以保障测量的准确性。
参考图6，将一个待量测点连续量测6次，去掉一个最大值，去掉一个最小值，然后剩下四组数据取平均值作为量测点的最终量测值，这样可以消除或减弱量测过程中因光学仪器受环境光，设备振动等因素引起的量测误差。
作为本申请的另一实施例，参考图7所示，公开了一种测量方法。该方法包括步骤：
S71、对待测物品进行三次测量，记录测量值；
S72、去掉测量值中的最大值和最小值；
S73、取中间值作为最终的量测数据。
本实施方式可以消除或减弱量测过程中因光学仪器受环境光，设备振动等因素引起的量测误差，提高测量准确性。其次，测量次数越多，效率越低，因此，为了在尽可能少的测量次数上确保取值相对可靠，通过三次测量取中间值是比较简单有效的办法。把最大值和最小值去掉，中间值跟实际值的偏差就很接近了，完全可以应用于一般的场合，满足精度要求。再者，本实施方式无须对现有设备进行硬件改动，成本低廉。
作为本申请的另一实施例，参考图8所示，公开了一种测量装置。测量装置包括：
测量芯片1：设置为对待测物品进行至少两次测量，并记录测量值；
筛选电路2：去掉测量值中的极端值；
计算器3：将剩余的测量值取平均值；得到最终的量测数据。
本实施方式可选的，极端值包括最大值和最小值。
最大值和最小值偏离真实数值最远，因此去掉测量值中的最大值和最小值后，剩余数据得到的平均值更接近于真实数值。
本实施方式可选的，筛选电路设置为：根据测量值设定离散区域和非离散区域，将离散区域的测量值设为极端值；
非离散区域内相近测量值之间的差值小于离散区域。
本申请的面板可以是TN面板(全称为TwistedNematic，即扭曲向列型面板)、IPS面板(In-PaneSwitcing，平面转换)、VA面板 (Multi-domainVerticaAignment，多象限垂直配向技术)，当然，也可以是其他类型的面板，适用即可。
以上内容是结合具体的优选实施方式对本申请所作的进一步详细说明，不能认定本申请的具体实施只局限于这些说明。对于本申请所属技术领域的普通技术人员来说，在不脱离本申请构思的前提下，还可以做出若干简单推演或替换，都应当视为属于本申请的保护范围。

Claims (17)

  1. 一种测量方法，所述方法包括步骤：
    对待测物品进行至少两次测量，记录测量值；
    去掉测量值中的极端值；以及
    基于剩余的测量值得到最终的量测数据。
  2. 如权利要求1所述的一种测量方法，其中，所述极端值包括最大值和最小值。
  3. 如权利要求2所述的一种测量方法，其中，所述基于剩余的测量值得到最终的量测数据的步骤包括：
    将剩余的测量值取平均值，得到最终的量测数据。
  4. 如权利要求3所述的一种测量方法，其中，所述去掉测量值中的极端值的步骤包括：
    将测量值记录到坐标轴中；
    根据测量值在坐标轴中的分布间距设定离散区域和非离散区域，所述非离散区域内相邻测量值之间的差值小于离散区域内相邻测量值之间的差值；所述非离散区域至少有两个；
    将离散区域的测量值设为极端值；
    根据相邻两个测量值的差值划分至少两个所述非离散区域的测量值的权重；以及
    将所述剩余的测量值取平均值，得到最终的量测数据的步骤包括：根据测量值的权重进行加权平均，得到最终的量测数据。
  5. 如权利要求2所述的一种测量方法，其中，所述基于剩余的测量值得到最终的量测数据的步骤包括：
    取剩余的测量值的中间值，得到最终的量测数据。
  6. 如权利要求1所述的一种测量方法，其中，所述测量值的数量为5-10个。
  7. 如权利要求1所述的一种测量方法，其中，所述待测物品包括显示面板。
  8. 一种测量方法，其特征在于，所述方法包括步骤：
    对待测物品进行至少两次光学测量，记录测量值；
    去掉测量值中的极端值；
    将剩余的测量值取平均值，得到最终的量测数据；以及
    所述极端值包括最大值和最小值。
  9. 一种测量装置，所述测量装置包括：
    测量芯片：设置为对待测物品进行至少两次测量，并记录测量值；
    筛选电路：设置为去掉测量值中的极端值；以及
    计算器：设置为基于剩余的测量值得到最终的量测数据。
  10. 如权利要求9所述的一种测量装置，其中，所述极端值包括最大值和最小值。
  11. 如权利要求9所述的一种测量装置，其中，所述筛选电路设置为：根据测量值设定离散区域和非离散区域，将离散区域的测量值设为极端值；
    所述非离散区域内相近测量值之间的差值小于离散区域。
  12. 如权利要求10所述的一种测量装置，其中，所述计算器设置为：
    将剩余的测量值取平均值，得到最终的量测数据。
  13. 如权利要求12所述的一种测量装置，其中，所述筛选电路设置为：
    将测量值记录到坐标轴中；
    根据测量值在坐标轴中的分布间距设定离散区域和非离散区域，所述非离散区域内相邻测量值之间的差值小于离散区域内相邻测量值之间的差值；所述非离散区域至少有两个；
    将离散区域的测量值设为极端值；
    根据相邻两个测量值的差值划分至少两个所述非离散区域的测量值的权重；以及
    将所述剩余的测量值取平均值，得到最终的量测数据的步骤包括：根据测量值的权重进行加权平均，得到最终的量测数据。
  14. 如权利要求10所述的一种测量装置，其中，所述计算器设置为：
    取剩余的测量值的中间值，得到最终的量测数据。
  15. 如权利要求9所述的一种测量装置，其中，所述测量值的数量为5-10个。
  16. 如权利要求15所述的一种测量装置，其中，所述测量值的数量为6个。
  17. 如权利要求9所述的一种测量装置，其中，所述待测物品包括显示面板。
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