WO2018040117A1 - Method and system for ultrasonic imaging detection of welding seam of dual-array probe-based steel-rail - Google Patents

Method and system for ultrasonic imaging detection of welding seam of dual-array probe-based steel-rail Download PDF

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Publication number
WO2018040117A1
WO2018040117A1 PCT/CN2016/098192 CN2016098192W WO2018040117A1 WO 2018040117 A1 WO2018040117 A1 WO 2018040117A1 CN 2016098192 W CN2016098192 W CN 2016098192W WO 2018040117 A1 WO2018040117 A1 WO 2018040117A1
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WIPO (PCT)
Prior art keywords
array
probe
array probe
rail
receiving
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PCT/CN2016/098192
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French (fr)
Chinese (zh)
Inventor
付汝龙
詹红庆
陈伟
陈建华
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广东汕头超声电子股份有限公司
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Publication of WO2018040117A1 publication Critical patent/WO2018040117A1/en

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    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N29/00—Investigating or analysing materials by the use of ultrasonic, sonic or infrasonic waves; Visualisation of the interior of objects by transmitting ultrasonic or sonic waves through the object
    • G01N29/22—Details, e.g. general constructional or apparatus details
    • G01N29/26—Arrangements for orientation or scanning by relative movement of the head and the sensor
    • G01N29/262—Arrangements for orientation or scanning by relative movement of the head and the sensor by electronic orientation or focusing, e.g. with phased arrays
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N29/00—Investigating or analysing materials by the use of ultrasonic, sonic or infrasonic waves; Visualisation of the interior of objects by transmitting ultrasonic or sonic waves through the object
    • G01N29/04—Analysing solids
    • G01N29/06—Visualisation of the interior, e.g. acoustic microscopy
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N29/00—Investigating or analysing materials by the use of ultrasonic, sonic or infrasonic waves; Visualisation of the interior of objects by transmitting ultrasonic or sonic waves through the object
    • G01N29/22—Details, e.g. general constructional or apparatus details
    • G01N29/26—Arrangements for orientation or scanning by relative movement of the head and the sensor

Definitions

  • the invention relates to an ultrasonic non-destructive testing technology, in particular to an ultrasonic imaging detecting method and system for a rail weld based on a dual array probe.
  • planar defects existing in the rail welds such as spots, gray spots, cracks, incomplete penetration and fatigue cracks
  • the presence of these defects not only reduces the effective cross section of the rail, but also It is also possible to cause stress concentration, which causes the rail weld to be pulled apart or the rail to be broken, thus being the most dangerous defect.
  • stress concentration which causes the rail weld to be pulled apart or the rail to be broken
  • the reflected waves propagate in other directions according to the law of reflection and cannot return along the incident path. Therefore, it is difficult to perform detection using a single probe, and therefore, double probes are generally used for detection.
  • the conventional test method uses a single-wafer probe for a K-scan or a tandem scan.
  • two single-wafer probes are placed on the opposite two detection surfaces, one probe transmits ultrasonic waves, and the other probe receives ultrasonic waves.
  • the two probes need to move relative to each other at opposite speeds.
  • the reflected wave of the defect is received by the receiving array probe; in the tandem scan, the two single-wafer probes are placed one after the other on a detecting surface at a distance from the weld.
  • One probe on the side emits ultrasonic waves, and one probe on the far side of the weld receives ultrasonic waves.
  • the two probes also need to move at opposite or opposite speeds.
  • the ultrasonic wave emitted by the array probe is emitted.
  • Defects and the underside of the rail are reflected twice by the receiving array probe.
  • K-type scanning or tandem scanning due to the use of single-wafer probes, in order to achieve the entire height of the weld, the two probes must move relative to each other at opposite speeds, so it is difficult to complete by manual operation. All need to be equipped with professional scanning equipment.
  • the parts to be inspected for the rail weld include the K-type scanning of the rail head, the K-type scanning of the rail bottom, and the cross-track scanning of the rail, and due to the particularity of the rail structure, the coupling effect of the probe is guaranteed to the scanning device.
  • the technical problem to be solved by the embodiments of the present invention is to provide an ultrasonic imaging detection method for a rail weld based on a dual array probe. It can quickly, effectively and comprehensively detect the planar defects such as spots, gray spots, cracks, incomplete penetration and fatigue cracks in the rail welds without designing complicated scanning devices, which can significantly reduce the detection personnel's Labor intensity, improve detection efficiency and reliability of test results.
  • an embodiment of the present invention provides a method for ultrasonic imaging detection of a rail weld based on a dual array probe, comprising the following steps:
  • the receiving array probe is fixedly adsorbed on the measured rail, and the transmitting array probe moves forward or backward or sequentially placed at a plurality of fixed position points, so that the sound wave covers the weld of the tested rail;
  • the ultrasonic echo emitted by the transmitting array probe received by the transmitting array probe through the defect surface of the weld bead;
  • the height value of the defect is calculated by determining the start and end positions of the ultrasonic echo beam reflected by the defect of the weld received by the array wafer on the receiving array probe.
  • the receiving array probe has a strip-shaped probe body, a soft contact film sleeve disposed at a lower end of the probe body; the probe body has a magnetic rod, and the edge has a scale scale strip, and the probe body The bottom surface is arranged side by side with a plurality of array wafers perpendicular to the length thereof, the scale scale strips for indicating positional information of the array wafers, the soft contact film sleeves having the probe body horizontally or at an angle of inclination.
  • the transmitting array probe when the transmitting array probe is operated in a single beam scanning mode, the transmitting array probe moves back and forth within a specified area, and when the transmitting array probe operates in a sector scanning manner, the transmitting array probe Placed in several fixed position points in turn.
  • the plurality of fixed position points are determined by first moving the array probe according to the fan scan angle range of the transmitting array probe to adjust the distance between the incident point of the transmitting array probe and the center line of the weld to maximize the sector scan.
  • An angle beam is located at an end point of the weld detection area to determine a first fixed position, and then continues to move the array probe linearly on the rail to cause the emission array probe to scan the maximum angle beam at the first fixed position.
  • the width position of the minimum angle sound beam thereby determining the second fixed point, and determining the other position points in the same manner with the second fixed point as a new starting point until the fan-shaped scanning sound beam of all the position points covers the entire rail weld The area that needs to be detected.
  • the sector scan is to excite all or part of the wafers in the emission array probe, so that the sound beam formed by the excitation wafer sweeps through the sector at a certain step angle in a set angle range.
  • the transmitting array probe can be switched between a dual array probe working mode and a single array probe working mode, and when the transmitting array probe operates in a single array probe working mode, it operates in a spontaneous self-receiving mode.
  • the receiving array probe operates in a phased array linear scanning manner, and divides the array wafer into different wafer groups, and the wafer group may be one or more wafers, each group of activated wafer groups receiving a certain angle
  • the sound beam by cyclically changing the position of the initial activation wafer, causes the received sound beam to move back and forth in the direction of the wafer array.
  • an embodiment of the present invention further provides a system for ultrasonic imaging detection of a rail weld of a dual array probe, comprising a launch array probe, a receive array probe, and a phased array ultrasonic inspection device;
  • the transmitting array probe and the receiving array probe perform a tandem scan or a K-type scan on the tested rail;
  • the launch array probe has a phased array ultrasonic wedge and is mounted on the phased array ultrasonic wedge a phased array ultrasonic probe, the phased array ultrasonic probe comprising a probe body and a plurality of strip rectangular wafers;
  • the receiving array probe includes a strip-shaped probe body and a soft contact film disposed at a lower end of the probe body
  • the probe body has a magnetic rod, the edge has a scale scale strip, the probe body bottom surface is provided with an array wafer, the array wafer comprises a plurality of strip-shaped rectangular wafers, and the array wafers are sequentially arranged on the probe body
  • the scale scale strip is used to indicate position information of the array wafer, and the soft contact film sleeve makes the probe body horizontal or have an inclination angle;
  • the phased array ultrasonic detecting device enables the transmitting array probe and the receiving array probe to work in a dual array probe working mode or a single array probe working mode. When working in a single array probe working mode, the transmitting array probe works spontaneously.
  • the phased array ultrasonic detecting device acquires the starting and ending positions of the ultrasonic echo beam reflected by the weld defect received by the array wafer on the receiving array probe, and calculates the height value of the defect.
  • the transmitting array probe operates in a single beam or sector or line scanning mode.
  • the transmitting array probe and the receiving array probe each have a single bus device, and the phased array ultrasonic detecting device identifies and exchanges data through the single bus device.
  • the embodiment of the invention has the following beneficial effects: the invention can quickly, effectively and comprehensively face, such as spots, gray spots, cracks, incomplete penetration and fatigue cracks, in the weld seam of the rail without designing a complicated scanning device. Detection of defects can significantly reduce the labor intensity of the inspectors, improve the detection efficiency and the reliability of the test results.
  • Figure 1 is a schematic view of a rail weld seam track type scanning
  • Figure 2 is a schematic view of a K-type scan of a rail weld rail head
  • Figure 3 is a schematic view of a K-type scan of the rail weld rail bottom
  • FIG. 4 is a schematic structural view of a transmitting array probe
  • Figure 5 is a schematic structural view of a receiving array probe
  • Figure 6 is a schematic diagram of the principle of phased array sector scanning
  • Figure 7 is a schematic diagram of the principle of phased array single sound beam scanning
  • Figure 8 is a schematic diagram of the principle of phased array linear scanning
  • Figure 9 is a schematic view of the principle of a rail-side tandem sector scanning
  • Figure 10 is a schematic diagram of the principle of rail waist tandem single beam scanning
  • Figure 11 is a schematic view of the K-shaped sector scanning principle of the rail head
  • Figure 12 is a schematic diagram of the principle of a rail head K-type single beam scanning
  • Figure 13 is a schematic view of the K-shaped sector scanning principle of the rail bottom
  • Figure 14 is a schematic illustration of the principle of a rail head K-type single beam scanning.
  • a method for ultrasonic imaging detection of a rail weld based on a double array probe is as follows. First, when the rail weld rail is in series scanning, as shown in FIG. 1 , on the weld 2 side of the rail 1 Two array probes are arranged one after the other on the rail tread 8 , the array probe on the near side of the weld is used as the emission array probe 3 , and the array probe on the far side of the weld is used as the receiving array probe 4 , the emission array probe and the receiving array probe
  • the coupling agent is attached to the rail tread surface; when the rail weld head K-type scanning is performed, as shown in FIG.
  • an array probe is arranged on each side 7 of the rail head of the rail weld side, one of which The array probe serves as the transmitting array probe 3, and the other array probe serves as the receiving array probe 4.
  • the transmitting array probe and the receiving array probe are attached to the sides of the rail head by the coupling agent; the rail weld bottom K-scan is performed.
  • an array probe is arranged on each side 6 of the rail bottom of the rail weld side, one array probe is used as the emission array probe 3, and the other array probe is used as the array probe. 4 receiving array probe, the transmitting probe array and the receiving array probe by a coupling agent are affixed on both sides of the bottom side of the rail.
  • the transmitting array probe and the receiving array probe are respectively combined with the phased array ultrasonic detecting device 5
  • the corresponding ports are connected.
  • the phased array ultrasonic testing device is started to detect the rail weld seam, and the transmitting array probe is moved back and forth along the axial direction of the rail or placed at a certain fixed position, and the receiving array probe is closely attached to the adsorption in an immovable manner. It is fixed at the specified position of the rail, and the transmitting array probe transmits ultrasonic waves, and the receiving array probe synchronously receives the ultrasonic waves.
  • the phased array ultrasonic detecting device performs image display according to the signal received by the receiving array probe, and the detecting personnel displays and determines according to the detected image. Defect information in rail welds.
  • phased array ultrasonic testing device As a phased array ultrasonic testing device used for rail weld inspection, it has a dual array probe working mode and a single array probe working mode, and the two working modes can be automatically switched.
  • the dual array probe works, two array probes are used in combination. One array probe works in the transmit mode, and the other array probe works in the receive mode.
  • the transmit mode array probe only transmits ultrasonic waves, and the receive mode array probe only receives ultrasonic waves.
  • the transmission mode can be set to phased array sector scanning mode, phased array linear scanning mode or phased array single beam scanning mode.
  • the receiving mode can be set to phased array linear scanning mode; when single array probe working mode: receive phase
  • the array probes of the array ultrasonic testing equipment all work in the spontaneous self-receiving mode, that is, the array probe transmits ultrasonic waves while receiving the ultrasonic waves, and the array probes of the self-receiving mode can be set as the phased array fan scanning mode and the phased array linear scanning mode.
  • phased-array single-sound beam scanning and the same as the scanning method of transmitting and receiving spontaneously.
  • phased array ultrasonic testing device used for rail weld inspection, it has a single bus (1-wire) working principle to realize automatic identification and parameter setting of the array probe.
  • the method for identifying the array probe by the phased array ultrasonic detecting device is: when the phased array ultrasonic detecting device is started, the 1-wire device in the array probe connected to the device is initialized, the 1-wire device is identified and the data is exchanged, This enables automatic identification and parameter setting of the array probe.
  • phased array ultrasonic testing device As a phased array ultrasonic testing device used for rail weld inspection, it has the function of probe coupling monitoring.
  • the array probe connected to the phased array ultrasonic testing equipment works in the spontaneous self-receiving mode, and automatically determines the probe according to the condition of receiving the ultrasonic signal. Coupling situation, providing decoupling alarm function.
  • the phased array ultrasonic testing equipment automatically performs a coupling monitoring scan at a certain time and provides a coupling situation display and alarm.
  • the array probe as the transmitting array probe 3 includes a phased array ultrasonic probe 31 and a phased array ultrasonic wedge 32.
  • the phased array ultrasonic probe 31 includes a probe body, an array wafer 33, and a 1-wire device 34.
  • the column wafer 33 includes a plurality of strip-shaped rectangular wafers, and the 1-wire device 34 recognizes the type and parameters of the probe by accessing the phased array ultrasonic inspection device;
  • the phased array ultrasonic wedge has a bottom surface, a slope opposite to the bottom surface, and The vertical side of the bottom surface and the inclined surface, the phased array ultrasonic probe is mounted on the inclined surface of the phased array ultrasonic wedge, and the phased array ultrasonic probe and the phased array wedge are tightly coupled by the coupling agent.
  • the array probe as the receiving array probe 4 includes a probe body 41, an array wafer 42, a 1-wire device 43, a magnetic attraction tape 44, a scale scale tape 45, and a soft contact film cover 46.
  • the probe body 41 is made of a flexible material
  • the array wafer 42 includes a plurality of strip-shaped rectangular wafers, the array wafers are sequentially arranged on the probe body 41, and the array wafer 42 and the 1-wire device 43 are arranged on the bottom surface of the probe body;
  • the adsorption belt 44 is located on the upper surface of the probe body, and a magnetic rod is arranged at a certain distance.
  • the arrangement of the magnetic rods is perpendicular to the longitudinal direction of the array probe, and the magnetic adsorption belt has the function of adsorbing the ferromagnetic material to realize the adsorption of the array probe.
  • the scale scale strip 45 is located on one side of the magnetic adsorption strip on the upper surface of the probe body, has a scale scale value, indicates the position information of the array wafer, and can be used as a measurement function of the ruler;
  • 1-wire device is the array
  • the identification device of the probe identifies the type and parameters of the array probe through the access of the phased array ultrasonic testing device;
  • the soft contact film sleeve 46 is located at the bottom of the probe body, the film sleeve is filled with liquid, and the film sleeve has a certain inclination angle, which is beneficial to Ultrasonic reception.
  • the phased array sector scanning method used in the emission mode is to excite all or part of the wafers in the transmitting array probe, so that the sound beam formed by the excitation wafer is swept by a certain step value within a set angle range.
  • Sector area as shown in Figure 6.
  • the phased array single-beam scanning method used in the emission mode is to excite all or part of the wafers in the transmitting array probe, so that the excitation wafer forms an ultrasonic beam having only a certain angle, as shown in FIG.
  • the phased array linear scanning method used in the receiving mode refers to different wafer groups applied in the array probe by the same aggregation rule.
  • the wafer group may be one or more wafers, and each group of activated wafer groups receives a certain angle.
  • the sound beam by cyclically changing the position of the initial activation wafer, causes the received sound beam to move back and forth along the direction of the wafer array, thereby achieving a detection effect similar to that of a conventional manual ultrasonic inspection probe, as shown in FIG.
  • the transmitting array probe works in the phased array fan-shaped scanning, as shown in FIG. 9 , and the detection of a certain height region of the rail weld rail waist is fixed by a transmitting array probe at a certain position. By placing the array probes in sequence at a certain fixed position, the full height coverage of the rail weld rail waist is detected. When there is a planar defect in the rail weld rail waist region, the ultrasonic wave emitted by the array probe is defective. The surface and the bottom surface of the rail are received by the receiving array probe after being reflected twice.
  • the phased array ultrasonic detecting device determines the length of the receiving array probe array according to the sector scanning scanning beam of the transmitting array probe, and simultaneously displays the signal received by the receiving array probe.
  • the transmitting array probe works in a phased array single-beam scanning, as shown in Fig. 10, through the transmitting array probe to move forward and backward in the specified area of the rail head tread to realize the rail weld rail waist specific
  • the ultrasonic wave emitted by the transmitting array probe is received by the receiving array probe after being reflected by the defect surface and the bottom surface of the rail, and the phased array ultrasonic detecting device is based on the transmitting array probe.
  • the mono beam determines the length of the receiving array probe array wafer while simultaneously displaying the signals received by the receiving array probe.
  • the K-type scanning of the rail weld rail head is carried out, and the transmitting array probe works in the phased array fan-shaped scanning, as shown in Fig. 11, the detection of a certain width region of the rail weld rail head is fixed by a certain position of the transmitting array probe, and the detection is passed.
  • the transmitting array probes are sequentially placed at a certain fixed position to realize the full coverage of the rail weld rail head.
  • the phased array ultrasonic detecting device determines the length of the receiving array probe array wafer according to the transmitting array probe sector scanning sound beam, and simultaneously displays the signal received by the receiving array probe.
  • the launch array probe works in the phased array single-beam scan, as shown in Figure 12, the rail weld head is realized by moving the array probe to the position of the position on the side of the rail head.
  • the ultrasonic wave emitted by the transmitting array probe is reflected by the defective surface and received by the receiving array probe, and the phased array ultrasonic detecting device is determined according to the single beam of the transmitting array probe.
  • the length of the array probe array wafer is received, and the signals received by the receiving array probe are displayed.
  • Carry out the K-type scanning of the rail weld rail bottom, and the launching array probe works in the phased array fan-shaped scanning.
  • the transmitting array probe is fixed at a certain position to realize the detection of a certain width of the rail weld rail bottom.
  • the transmitting array probes are sequentially placed at a certain fixed position to realize the full width full coverage detection of the rail weld rail bottom region.
  • the ultrasonic wave emitted from the array probe passes through the defect surface.
  • the phased array ultrasonic detecting device determines the length of the receiving array probe array wafer according to the sector scanning scanning sound beam of the transmitting array probe, and simultaneously displays the signal received by the receiving array probe.
  • the launch array probe works in the phased array single-beam scanning.
  • the rail weld rail is realized by moving the probe to the position of the position of the bottom of the rail at the bottom side of the rail.
  • the detection of a certain width region of the bottom when there is a planar defect in the bottom portion of the rail weld rail, the ultrasonic wave emitted by the transmitting array probe is reflected by the defective surface and received by the receiving array probe, and the phased array ultrasonic detecting device according to the transmitting array probe single beam
  • the length of the receiving array probe array wafer is determined, and the signals received by the receiving array probe are displayed.
  • the fixed position of the transmitting array probe is determined by first moving the transmitting array according to the sector scanning angle range of the transmitting array probe.
  • the probe adjusts the distance between the incident point of the transmitting array probe and the center line of the rail weld, so that the beam at the maximum angle of the sector scanning is located at the upper end of the rail weld height detection to determine the first fixed position, and then continues to move on the rail tread Transmitting the array probe so that the transmitting array probe scans the height of the minimum angle beam at the maximum fixed angle of the sound beam at the first fixed position, thereby determining the second fixed point, starting from the second fixed point, with the same The way to determine other location points until the fan-shaped scanning beam at all location points covers the height area that the entire rail waist needs to detect.
  • the method for determining the length of the receiving array probe array wafer is: firstly, according to the fan-shaped scanning angle range of the transmitting array probe, The maximum angle beam of the fan scanning angle range is located at the upper end of the rail weld waist detection height range, and the intersection of the reflected wave of the upper end point and the rail tread is reflected by the upper end of the rail as the receiving array probe array wafer.
  • the moving range of the transmitting array probe and the array wafer length of the receiving array probe are determined by: first moving the transmitting array probe Adjust the distance between the incident point of the transmitting array probe and the center line of the rail weld, and place the sound beam of the transmitting array probe at the upper end of the height range of the rail waist detection.
  • the position of the transmitting array probe is the starting point of the movable range, and the reflected wave according to the upper end point The intersection of the steel rail and the rail tread is used as the starting point of the sound beam of the receiving array wafer.
  • the transmitting array probe beam is located at the lower end of the rail waist detecting height range, and the position of the transmitting array probe is the end of the movable range.
  • the intersection of the bottom end reflection wave and the rail tread surface is used as the end point of the sound beam of the receiving array probe array wafer; finally, the length and position of the wafer array are determined according to the determined sound beam starting point and the sound beam end point.
  • the fixed position of the launch array probe is determined by first moving the array probe according to the sector scan angle range of the transmit array probe. Adjusting the distance between the incident point of the transmitting array probe and the center line of the rail weld, so that the beam at the maximum angle of the sector scanning is located at the upper end of the rail head width detection to determine the first fixed position, and then continue to move on the side of the rail head.
  • the array probe enables the transmitting array probe to scan the width of the minimum angle beam when the maximum angle beam is located at the first fixed position, thereby determining the second fixed point, and determining the other position points in the same manner until all the points are
  • the sector scan beam covers the width of the entire track head that needs to be detected.
  • the method for determining the length of the array wafer in the receiving array probe is: firstly, according to the setting of the sector scanning angle range of the transmitting array probe, The maximum angular sound beam of the fan scanning angle range is located at the upper end of the rail head detecting width range, and the intersection of the upper end point reflected wave and the rail rail head side is used as the starting point of the receiving sound beam of the receiving array probe array chip; Second, moving the array probe, the minimum angle beam of the fan scan angle range is located at the lower end of the rail head detection width range, and the intersection of the lower end reflection wave and the rail head side is used as the receiving beam end of the receiving array probe array chip. Finally, the length and position of the wafer array are determined based on the determined sound beam start point and sound beam end point.
  • the moving range of the transmitting array probe and the length of the array wafer in the receiving array probe are determined by: first moving the transmitting array probe Adjust the distance between the incident point of the transmitting array probe and the center line of the rail weld, and locate the sound beam at the upper end of the range of the rail head detection width. At this time, the position of the transmitting array probe is the starting point of the movable range, according to the upper end point reflected wave and the rail track.
  • the intersection of the side of the head serves as the starting point of the sound beam of the receiving array wafer; secondly, the transmitting array probe sound beam is located at the lower end of the range of the head detecting width, and the position of the transmitting array probe is the end point of the movable range, and the reflected wave according to the lower end point
  • the intersection with the side of the rail head is used as the end of the sound beam of the receiving array probe array wafer; finally, the length and position of the wafer array are determined according to the determined sound beam starting point and the sound beam end point.
  • the method for determining the fixed position of the launch array probe is as follows: firstly, according to the sector scan angle range of the launch array probe, the mobile array probe is moved. Adjusting the distance from the incident point of the transmitting array probe to the center line of the rail weld, so that the beam at the maximum angle of the sector scanning is located at the upper end of the rail width detection of the rail to determine the first fixed position, and then continue to move on the bottom side of the rail rail.
  • the array probe enables the transmitting array probe to scan the width of the minimum angle beam when the maximum angle beam is located at the first fixed position, thereby determining the second fixed point, and determining the other position points in the same manner until all the points are
  • the sector scan beam covers the width of the entire track that needs to be detected.
  • the method for determining the length of the array wafer in the receiving array probe is as follows: firstly, according to the setting of the sector scanning angle range of the transmitting array probe, The maximum angle beam of the fan scanning angle range is located at the upper end of the rail bottom detection width range, and the intersection of the upper end point reflected wave and the bottom side of the rail track is used as the starting point of the receiving beam of the receiving array probe array chip; secondly, the fan scanning angle is used The minimum angle beam of the range is located at the lower end of the range of the detection width of the rail bottom, and the intersection of the reflected wave of the lower end point and the bottom side of the rail rail is used as the end point of the receiving beam of the receiving array probe array wafer; The length and position of the wafer array are determined from the determined sound beam origin and sound beam endpoint.
  • the moving range of the transmitting array probe and the array wafer length of the receiving array probe are determined by: firstly moving the transmitting array probe to adjust The distance from the incident point of the transmitting array probe to the center line of the rail weld is located at the upper end of the detection width of the rail bottom. At this time, the position of the transmitting array probe is the starting point of the movable range, and the reflected wave and the rail bottom are according to the upper end point.
  • intersection of the side faces serves as the starting point of the sound beam of the receiving array wafer; secondly, the transmitting array probe sound beam is located at the lower end of the detection width range of the track bottom, and the position of the transmitting array probe is the end point of the movable range, according to the reflected wave of the lower end point.
  • the intersection of the bottom side of the rail is used as the end of the sound beam of the receiving array probe array wafer; finally, the length and position of the wafer array are determined according to the determined sound beam starting point and the sound beam end point.
  • the image display method used in the phased array ultrasonic testing device used for the inspection of the rail weld is: the phased array detecting device displays the detection result as a linear scan image according to the linear scanning parameter setting in the receiving array probe, when the transmitting array probe works In the phased array fan scanning mode, the linear scan image displayed by the instrument and the real-time image corresponding to the position of the transmitting array probe, each of the linear scan images displayed by the instrument when the transmitting array probe is operated in the phased array single beam scanning mode
  • the sound beam has the function of amplitude peak memory retention, that is, when the image is refreshed, the ultrasonic signal of each sound beam of the linear scan image retains only the maximum amplitude peak information.
  • the defect information recognition method used in the phased array detecting device used for the inspection of the rail weld is: according to the linear scan image displayed in the phased array detecting device, when a certain sound beam in the linear scan image receives the reflected echo of the defect, It is then determined which echo is reflected by which reflection point in the rail weld.
  • the rail weld seam track is scanned in series, and the launch array probe works in the phased array fan scan mode.
  • the formula for determining the defect position is:
  • d gy (n) is the depth of the defect reflection point in the rail weld rail waist indicated by the nth sound beam in the linear scan image of the rail waist; d1 is the rail weld inspection of the rail weld rail.
  • the upper end depth, d2 represents the lower end depth of the rail weld rail detection sector scanning;
  • N represents the total number of ultrasonic beams in the linear scan image;
  • n represents a certain sound beam in the linear scan image, where 1 ⁇ n ⁇ N . Therefore, when a continuous sound beam appears in a linear scan image, there are defect reflection echoes.
  • the geosteer plane can be calculated by using d gy (n2)-d gy (n1). The height value of the defect.
  • d gy (n) is the depth of the defect reflection point in the rail weld rail waist indicated by the nth sound beam in the linear scan image of the rail waist; d1 indicates that the rail weld rail waist detection needs to be covered End point depth, d2 represents the depth of the lower end point to be covered by the rail weld rail waist detection; N represents the total number of ultrasonic beams in the line scan image; n represents a certain sound beam in the line scan image, where 1 ⁇ n ⁇ N. Therefore, when a continuous sound beam appears in a linear scan image, there are defect reflection echoes. According to the edge sound beams n1 and n2 with continuous reflected echoes, the geosteer plane can be calculated by using d gy (n2)-d gy (n1). The height value of the defect.
  • the rail weld head is K-scan, and the launch array probe works in the phased array fan scan mode.
  • the formula for determining the defect position is:
  • d gt (n) is the head position of the rail head detection.
  • the nth sound beam indicates the width position of the defect reflection point in the rail weld head;
  • d3 indicates the rail weld head detection sector scan coverage width.
  • the upper end position of the area, d4 represents the lower end position of the rail weld head detection sector coverage width region;
  • N represents the total number of ultrasonic beams in the line scan image;
  • n represents a certain sound beam in the line scan image, where 1 ⁇ n ⁇ N. Therefore, when a continuous sound beam appears in the linear scan image, there is a defect reflection echo.
  • the head plane can be calculated by using d gt (n2)-d gt (n1). The width value of the defect.
  • the rail weld head is K-scan, and the launch array probe works in the phased array single-beam scanning mode.
  • the formula for determining the defect position is:
  • d gt (n) is the head position of the rail head.
  • the nth sound beam in the line scan image indicates the width position of the defect reflection point in the rail weld head; d3 indicates the upper part of the rail weld head detection width area. End position, d4 represents the lower end position of the rail weld head detection width region; N represents the total number of ultrasonic beams in the line scan image; n represents a certain sound beam in the line scan image, where 1 ⁇ n ⁇ N. Therefore, when a continuous sound beam appears in the linear scan image, there is a defect reflection echo. According to the edge sound beams n1 and n2 with the reflected echo continuously, the head plane can be calculated by using d gt (n2)-d gt (n1). The width value of the defect.
  • d gd (n) indicates that the nth sound beam in the linear scan image indicates the width position of the reflection point of the rail bottom defect in the rail weld; d5 indicates the rail weld bottom detection width of the rail weld.
  • the upper end position of the area, d6 represents the lower end position of the rail weld bottom detection sector coverage width region; N represents the total number of ultrasonic beams in the linear scan image; n represents a certain sound beam in the linear scan image, where 1 ⁇ n ⁇ N. Therefore, when a continuous sound beam appears in a linear scan image, there is a defect reflection echo.
  • the dgd (n2)-d gd (n1) can be used to calculate the plane bottom shape. The width value of the defect.
  • the embodiment of the invention further provides a system for ultrasonic imaging detection of a rail weld of a dual array probe, comprising a transmitting array probe, a receiving array probe and a phased array ultrasonic detecting device.
  • phased array ultrasonic testing device As a phased array ultrasonic testing device used for rail weld inspection, it has a dual array probe working mode and a single array probe working mode, and the two working modes can be automatically switched.
  • the dual array probe works, two array probes are used in combination. One array probe works in the transmit mode, and the other array probe works in the receive mode.
  • the transmit mode array probe only transmits ultrasonic waves, and the receive mode array probe only receives ultrasonic waves.
  • the transmission mode can be set to phased array sector scanning mode, phased array linear scanning mode or phased array single beam scanning mode.
  • the receiving mode can be set to phased array linear scanning mode; when single array probe working mode: receive phase
  • the array probes of the array ultrasonic testing equipment all work in the spontaneous self-receiving mode, that is, the array probe transmits ultrasonic waves while receiving the ultrasonic waves, and the array probes of the self-receiving mode can be set as the phased array fan scanning mode and the phased array linear scanning mode.
  • phased-array single-sound beam scanning and the same as the scanning method of transmitting and receiving spontaneously.
  • phased array ultrasonic testing device used for rail weld inspection, it has a single bus (1-wire) working principle to realize automatic identification and parameter setting of the array probe.
  • the method for identifying the array probe by the phased array ultrasonic detecting device is: when the phased array ultrasonic detecting device is started, the 1-wire device in the array probe connected to the device is initialized, the 1-wire device is identified and the data is exchanged, This enables automatic identification and parameter setting of the array probe.
  • phased array ultrasonic testing device As a phased array ultrasonic testing device used for rail weld inspection, it has the function of probe coupling monitoring.
  • the array probe connected to the phased array ultrasonic testing equipment works in the spontaneous self-receiving mode, and automatically determines the probe according to the condition of receiving the ultrasonic signal. Coupling situation, providing decoupling alarm function.
  • the phased array ultrasonic testing equipment automatically performs a coupling monitoring scan at a certain time and provides a coupling situation display and alarm.
  • the array probe as the transmitting array probe 3 includes a phased array ultrasonic probe 31 and a phased array ultrasonic wedge 32.
  • the phased array ultrasound probe 31 includes a probe body, an array wafer 33 and a 1-wire device 34.
  • the array wafer 33 includes a plurality of strip-shaped rectangular wafers, and the 1-wire device 34 recognizes the type of the probe by accessing the phased array ultrasonic inspection device.
  • the phased array ultrasonic wedge has a bottom surface, a slope opposite to the bottom surface, and a vertical side adjacent to the bottom surface and the inclined surface, and the phased array ultrasonic probe is mounted on the inclined surface of the phased array ultrasonic wedge, and the phased array Ultrasound The probe and the phased array wedge are tightly coupled by a coupling agent.
  • the array probe as the receiving array probe 4 includes a probe body 41, an array wafer 42, a 1-wire device 43, a magnetic attraction tape 44, a scale scale tape 45, and a soft contact film cover 46.
  • the probe body 41 is made of a flexible material
  • the array wafer 42 includes a plurality of strip-shaped rectangular wafers, the array wafers are sequentially arranged on the probe body 41, and the array wafer 42 and the 1-wire device 43 are arranged on the bottom surface of the probe body;
  • the adsorption belt 44 is located on the upper surface of the probe body, and a magnetic rod is arranged at a certain distance.
  • the arrangement of the magnetic rods is perpendicular to the longitudinal direction of the array probe, and the magnetic adsorption belt has the function of adsorbing the ferromagnetic material to realize the adsorption of the array probe.
  • the scale scale strip 45 is located on one side of the magnetic adsorption strip on the upper surface of the probe body, has a scale scale value, indicates the position information of the array wafer, and can be used as a measurement function of the ruler;
  • 1-wire device is the array
  • the identification device of the probe identifies the type and parameters of the array probe by accessing the phased array ultrasonic testing device; the soft contact film sleeve 46 is located at the bottom of the probe body, and the film sleeve is filled with liquid.
  • the soft contact film sleeve makes the probe body 41 horizontal or has a certain inclination angle, which is favorable for the reception of ultrasonic waves.
  • the phased array ultrasonic inspection is performed by the above method to obtain the start and end positions of the ultrasonic echo beam reflected by the array wafer on the receiving array probe to receive the weld defect, and calculate the height value of the defect.

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Abstract

A method and system for ultrasonic imaging detection of a welding seam (2) of a dual-array probe-based steel-rail (1). The method comprises: arranging a transmitting array probe (3) and a receiving array probe (4) on a steel-rail to be detected (1); fixedly attaching the receiving array probe (4) to the steel-rail to be detected (1), the transmitting array probe (3) moving forward and backward or being successively placed on several fixed position points, so that an ultrasonic wave covers the welding seam (2) of the steel-rail to be detected (1); the receiving array probe (4) receiving an ultrasound echo after an ultrasonic wave transmitted by the transmitting array probe (3) is reflected by a defective surface of the welding seam (2); and calculating a height value of a defect by determining starting and ending positions of an ultrasound echo beam reflected by the defect of the welding seam (2) and received by an array wafer (42) on the receiving array probe (4). The method and system can effectively improve the detection efficiency and the reliability of a detection result.

Description

一种基于双阵列探头的钢轨焊缝超声波成像检测方法及***Ultrasonic imaging detection method and system for rail weld seam based on double array probe 技术领域Technical field
本发明涉及一种超声无损检测技术，尤其涉及基于双阵列探头的钢轨焊缝超声波成像检测方法及***。The invention relates to an ultrasonic non-destructive testing technology, in particular to an ultrasonic imaging detecting method and system for a rail weld based on a dual array probe.
背景技术Background technique
对于钢轨焊缝的检测，尤其是涉及钢轨焊缝中存在的平面状缺陷，如光斑、灰斑、裂纹、未焊透及疲劳裂纹等，这些缺陷的存在不仅减小了钢轨的有效截面，而且还可能造成应力集中，使钢轨焊缝直接拉开或使钢轨折断，因而是最危险的缺陷。这些平面状的缺陷，采用超声波进行检测时，其反射波按照反射定律在其他方向传播而无法沿入射路径返回，因而采用单个探头难以实现检测，因此一般采用双探头进行检测。常规检测方法是采用两只单晶片的探头进行K型扫查或者串列式扫查。K型扫查时，两只单晶片探头分别放置在相对的两个探测面上，一只探头发射超声波，另一只探头接收超声波，扫查时，两只探头需要相对或相背等速移动，当焊缝中存在平面状缺陷时，缺陷的反射波会被接收阵列探头接收；串列式扫查时，两只单晶片探头一前一后同时放置在一个探测面上，距离焊缝近侧的一只探头发射超声波，距离焊缝远侧的一只探头接收超声波，两只探头也需要相对或相背等速移动，当焊缝中存在平面状缺陷时，发射阵列探头发出的超声波经缺陷和钢轨底面两次反射后被接收阵列探头接收。采用K型扫查或串列式扫查时，由于采用单晶片探头，为了实现焊缝整个高度的扫查，两只探头必须相对或相背等速移动，因而采用手工操作很难完成，一般都需要配备专业的扫查装置。然而钢轨焊缝需要检测的部位包括轨头K型扫查、轨底K型扫查以及轨腰串列式扫查，且由于钢轨结构的特殊性，要保证探头的耦合效果对扫查装置的要 求非常苛刻，而且由于检测工作量大，扫查装置的调节安装也比较费时费力，并且工作时需要检测人员操作扫查装置实现相对或相背等速移动探头，因而检测人员劳动强度大，检测结果易受检测人员的操作经验及疲劳程度影响。For the inspection of rail welds, especially the planar defects existing in the rail welds, such as spots, gray spots, cracks, incomplete penetration and fatigue cracks, the presence of these defects not only reduces the effective cross section of the rail, but also It is also possible to cause stress concentration, which causes the rail weld to be pulled apart or the rail to be broken, thus being the most dangerous defect. When these planar defects are detected by ultrasonic waves, the reflected waves propagate in other directions according to the law of reflection and cannot return along the incident path. Therefore, it is difficult to perform detection using a single probe, and therefore, double probes are generally used for detection. The conventional test method uses a single-wafer probe for a K-scan or a tandem scan. In the K-type scan, two single-wafer probes are placed on the opposite two detection surfaces, one probe transmits ultrasonic waves, and the other probe receives ultrasonic waves. When scanning, the two probes need to move relative to each other at opposite speeds. When there is a planar defect in the weld, the reflected wave of the defect is received by the receiving array probe; in the tandem scan, the two single-wafer probes are placed one after the other on a detecting surface at a distance from the weld. One probe on the side emits ultrasonic waves, and one probe on the far side of the weld receives ultrasonic waves. The two probes also need to move at opposite or opposite speeds. When there is a planar defect in the weld, the ultrasonic wave emitted by the array probe is emitted. Defects and the underside of the rail are reflected twice by the receiving array probe. When using K-type scanning or tandem scanning, due to the use of single-wafer probes, in order to achieve the entire height of the weld, the two probes must move relative to each other at opposite speeds, so it is difficult to complete by manual operation. All need to be equipped with professional scanning equipment. However, the parts to be inspected for the rail weld include the K-type scanning of the rail head, the K-type scanning of the rail bottom, and the cross-track scanning of the rail, and due to the particularity of the rail structure, the coupling effect of the probe is guaranteed to the scanning device. Want The requirements are very demanding, and because of the large amount of inspection work, the adjustment and installation of the scanning device is also time-consuming and laborious, and the inspection personnel are required to operate the scanning device to realize the relative or opposite-speed moving probe, so that the testing personnel have high labor intensity and detection. The results are susceptible to the experience of the tester and the degree of fatigue.
发明内容Summary of the invention
本发明实施例所要解决的技术问题在于，提供一种基于双阵列探头的钢轨焊缝超声波成像检测方法。可无需设计复杂的扫查装置就能够快速、有效、全面地对钢轨焊缝中存在的光斑、灰斑、裂纹、未焊透及疲劳裂纹等平面状缺陷进行有效检测，能够明显降低检测人员的劳动强度，提高检测效率和检测结果可靠性。The technical problem to be solved by the embodiments of the present invention is to provide an ultrasonic imaging detection method for a rail weld based on a dual array probe. It can quickly, effectively and comprehensively detect the planar defects such as spots, gray spots, cracks, incomplete penetration and fatigue cracks in the rail welds without designing complicated scanning devices, which can significantly reduce the detection personnel's Labor intensity, improve detection efficiency and reliability of test results.
为了解决上述技术问题，本发明实施例提供了一种基于双阵列探头的钢轨焊缝超声波成像检测方法，包括以下步骤：In order to solve the above technical problem, an embodiment of the present invention provides a method for ultrasonic imaging detection of a rail weld based on a dual array probe, comprising the following steps:
在被测钢轨上布置一发射阵列探头与一接收阵列探头进行串列式扫查或K型扫查；Deploying a transmitting array probe and a receiving array probe on the rail to be tested for serial scanning or K-type scanning;
使所述发射阵列探头工作于单声束或扇形或线形扫描方式；Having the transmit array probe operating in a single beam or sector or line scan mode;
将所述接收阵列探头固定吸附于所述被测钢轨上，所述发射阵列探头前后移动或是依次放置于的若干固定位置点上，使声波覆盖所述被测钢轨的焊缝；The receiving array probe is fixedly adsorbed on the measured rail, and the transmitting array probe moves forward or backward or sequentially placed at a plurality of fixed position points, so that the sound wave covers the weld of the tested rail;
所述接收阵列探头接收的所述发射阵列探头发射的超声波经所述焊缝的缺陷表面反射的超声回波；The ultrasonic echo emitted by the transmitting array probe received by the transmitting array probe through the defect surface of the weld bead;
通过确定所述接收阵列探头上阵列晶片接收到的所述焊缝的缺陷反射的超声波回波声束的起始和终点位置，计算所述缺陷的高度值。The height value of the defect is calculated by determining the start and end positions of the ultrasonic echo beam reflected by the defect of the weld received by the array wafer on the receiving array probe.
进一步地，使用的所述接收阵列探头具有带状的探头本体、设置于所述探头本体下端的软接触薄膜套；所述探头本体上具有磁吸棒，边沿具有刻度标尺带，所述探头本体底面并排设置有若干垂直其长度方向的阵列晶片，所述刻度标尺带用于指示阵列晶片的位置信息，所述软接触薄膜套使所述探头本体水平或具有倾角。 Further, the receiving array probe has a strip-shaped probe body, a soft contact film sleeve disposed at a lower end of the probe body; the probe body has a magnetic rod, and the edge has a scale scale strip, and the probe body The bottom surface is arranged side by side with a plurality of array wafers perpendicular to the length thereof, the scale scale strips for indicating positional information of the array wafers, the soft contact film sleeves having the probe body horizontally or at an angle of inclination.
更进一步地，当所述发射阵列探头工作于单声束扫描方式时，所述发射阵列探头在指定区域范围内前后移动，当所述发射阵列探头工作于扇形扫描方式时，所述发射阵列探头依次放置于的若干固定位置点上。Further, when the transmitting array probe is operated in a single beam scanning mode, the transmitting array probe moves back and forth within a specified area, and when the transmitting array probe operates in a sector scanning manner, the transmitting array probe Placed in several fixed position points in turn.
更进一步地，所述若干固定位置点的确定方式为：首先根据发射阵列探头的扇形扫描角度范围，移动发射阵列探头调节发射阵列探头入射点与所述焊缝中心线的距离，使扇形扫描最大角度的声束位于所述焊缝检测区域上端点从而确定第一个固定位置，接着继续在钢轨上直线移动发射阵列探头，使发射阵列探头扇形扫描最大角度声束位于第一个固定位置时的最小角度声束的宽度位置，从而确定第二个固定点，以所述第二个固定点作为新起点以同样的方式确定其他位置点，直到所有位置点的扇形扫描声束覆盖整个钢轨焊缝需要检测的区域。Further, the plurality of fixed position points are determined by first moving the array probe according to the fan scan angle range of the transmitting array probe to adjust the distance between the incident point of the transmitting array probe and the center line of the weld to maximize the sector scan. An angle beam is located at an end point of the weld detection area to determine a first fixed position, and then continues to move the array probe linearly on the rail to cause the emission array probe to scan the maximum angle beam at the first fixed position The width position of the minimum angle sound beam, thereby determining the second fixed point, and determining the other position points in the same manner with the second fixed point as a new starting point until the fan-shaped scanning sound beam of all the position points covers the entire rail weld The area that needs to be detected.
更进一步地，所述扇形扫描是激发所述发射阵列探头中的全部或部分晶片，使激发晶片形成的声束在设定的角度范围内以一定的步进值变换角度扫过扇形区域。Further, the sector scan is to excite all or part of the wafers in the emission array probe, so that the sound beam formed by the excitation wafer sweeps through the sector at a certain step angle in a set angle range.
更进一步地，所述发射阵列探头可在双阵列探头工作方式和单阵列探头工作方式中切换，当所述发射阵列探头工作于单阵列探头工作方式时，其工作于自发自收模式。Further, the transmitting array probe can be switched between a dual array probe working mode and a single array probe working mode, and when the transmitting array probe operates in a single array probe working mode, it operates in a spontaneous self-receiving mode.
更进一步地，所述接收阵列探头以相控阵线形扫描方式工作，将其阵列晶片分成不同的晶片组，所述晶片组可以是一个或多个晶片，每组激活晶片组接收某一特定角度的声束，通过循环改变起始激活晶片的位置，使接收声束沿晶片阵列方向循环前后移动。Further, the receiving array probe operates in a phased array linear scanning manner, and divides the array wafer into different wafer groups, and the wafer group may be one or more wafers, each group of activated wafer groups receiving a certain angle The sound beam, by cyclically changing the position of the initial activation wafer, causes the received sound beam to move back and forth in the direction of the wafer array.
相应地，本发明实施例还提供了一种用于双阵列探头的钢轨焊缝超声波成像检测的***，包括一发射阵列探头、一接收阵列探头以及相控阵超声检测设备；Correspondingly, an embodiment of the present invention further provides a system for ultrasonic imaging detection of a rail weld of a dual array probe, comprising a launch array probe, a receive array probe, and a phased array ultrasonic inspection device;
所述发射阵列探头、接收阵列探头在被测钢轨上进行串列式扫查或K型扫查；所述发射阵列探头具有相控阵超声楔块以及安装于所述相控阵超声楔块的相控阵超声探头，所述相控阵超声探头包括探头本体以及多个条状矩形晶片；The transmitting array probe and the receiving array probe perform a tandem scan or a K-type scan on the tested rail; the launch array probe has a phased array ultrasonic wedge and is mounted on the phased array ultrasonic wedge a phased array ultrasonic probe, the phased array ultrasonic probe comprising a probe body and a plurality of strip rectangular wafers;
所述接收阵列探头包括带状的探头本体、设置于所述探头本体下端的软接触薄膜 套；所述探头本体上具有磁吸棒，边沿具有刻度标尺带，所述探头本体底面设置有阵列晶片，所述阵列晶片包括多个条状矩形晶片，阵列晶片依次排列在所述探头本体上，所述刻度标尺带用于指示阵列晶片的位置信息，所述软接触薄膜套使所述探头本体水平或具有倾角；The receiving array probe includes a strip-shaped probe body and a soft contact film disposed at a lower end of the probe body The probe body has a magnetic rod, the edge has a scale scale strip, the probe body bottom surface is provided with an array wafer, the array wafer comprises a plurality of strip-shaped rectangular wafers, and the array wafers are sequentially arranged on the probe body The scale scale strip is used to indicate position information of the array wafer, and the soft contact film sleeve makes the probe body horizontal or have an inclination angle;
所述相控阵超声检测设备使所述发射阵列探头、接收阵列探头工作于双阵列探头工作方式或单阵列探头工作方式，工作于单阵列探头工作方式时，所述发射阵列探头工作于自发自收方式；The phased array ultrasonic detecting device enables the transmitting array probe and the receiving array probe to work in a dual array probe working mode or a single array probe working mode. When working in a single array probe working mode, the transmitting array probe works spontaneously. Receiving method
所述相控阵超声检测设备获取所述接收阵列探头上阵列晶片接收到的所述焊缝缺陷反射的超声波回波声束的起始和终点位置，计算所述缺陷的高度值。The phased array ultrasonic detecting device acquires the starting and ending positions of the ultrasonic echo beam reflected by the weld defect received by the array wafer on the receiving array probe, and calculates the height value of the defect.
其中，所述发射阵列探头工作于单声束或扇形或线形扫描方式。Wherein, the transmitting array probe operates in a single beam or sector or line scanning mode.
其中，所述发射阵列探头、接收阵列探头均还具有单总线器件，所述相控阵超声检测设备通过所述单总线器件进行识别与交换数据。The transmitting array probe and the receiving array probe each have a single bus device, and the phased array ultrasonic detecting device identifies and exchanges data through the single bus device.
实施本发明实施例，具有如下有益效果：本发明无需设计复杂的扫查装置就能够快速、有效、全面地对钢轨焊缝中存在的光斑、灰斑、裂纹、未焊透及疲劳裂纹等平面状缺陷进行检测，能够明显降低检测人员的劳动强度，提高检测效率和检测结果可靠性。The embodiment of the invention has the following beneficial effects: the invention can quickly, effectively and comprehensively face, such as spots, gray spots, cracks, incomplete penetration and fatigue cracks, in the weld seam of the rail without designing a complicated scanning device. Detection of defects can significantly reduce the labor intensity of the inspectors, improve the detection efficiency and the reliability of the test results.
附图说明DRAWINGS
图1是钢轨焊缝轨腰串列式扫查的示意图；Figure 1 is a schematic view of a rail weld seam track type scanning;
图2是钢轨焊缝轨头K型扫查的示意图；Figure 2 is a schematic view of a K-type scan of a rail weld rail head;
图3是钢轨焊缝轨底K型扫查的示意图；Figure 3 is a schematic view of a K-type scan of the rail weld rail bottom;
图4是发射阵列探头的结构示意图；4 is a schematic structural view of a transmitting array probe;
图5是接收阵列探头的结构示意图；Figure 5 is a schematic structural view of a receiving array probe;
图6是相控阵扇形扫描原理的示意图； Figure 6 is a schematic diagram of the principle of phased array sector scanning;
图7是相控阵单声束扫描原理的示意图；Figure 7 is a schematic diagram of the principle of phased array single sound beam scanning;
图8是相控阵线形扫描原理的示意图；Figure 8 is a schematic diagram of the principle of phased array linear scanning;
图9是轨腰串列式扇形扫描原理的示意图；Figure 9 is a schematic view of the principle of a rail-side tandem sector scanning;
图10是轨腰串列式单声束扫描原理的示意图；Figure 10 is a schematic diagram of the principle of rail waist tandem single beam scanning;
图11是轨头K型扇形扫描原理的示意图；Figure 11 is a schematic view of the K-shaped sector scanning principle of the rail head;
图12是轨头K型单声束扫描原理的示意图；Figure 12 is a schematic diagram of the principle of a rail head K-type single beam scanning;
图13是轨底K型扇形扫查原理的示意图；Figure 13 is a schematic view of the K-shaped sector scanning principle of the rail bottom;
图14是轨头K型单声束扫描原理的示意图。Figure 14 is a schematic illustration of the principle of a rail head K-type single beam scanning.
具体实施方式detailed description
为使本发明的目的、技术方案和优点更加清楚，下面将结合附图对本发明作进一步地详细描述。In order to make the objects, technical solutions and advantages of the present invention more apparent, the present invention will be further described in detail with reference to the accompanying drawings.
本发明实施例的一种基于双阵列探头的钢轨焊缝超声波成像检测方法，首先，进行钢轨焊缝轨腰串列式扫查时，如图1所示，在钢轨1的焊缝2一侧的钢轨踏面8上一前一后布置两个阵列探头，距离焊缝近侧的阵列探头作为发射阵列探头3，距离焊缝远侧的阵列探头作为接收阵列探头4，发射阵列探头和接收阵列探头通过耦合剂均贴在钢轨踏面上；进行钢轨焊缝轨头K型扫查时，如图2所示，在钢轨焊缝一侧的钢轨轨头两个侧面7各布置一个阵列探头，其中一个阵列探头作为发射阵列探头3，另一个阵列探头作为接收阵列探头4，发射阵列探头和接收阵列探头通过耦合剂均贴在钢轨轨头的两侧的侧面上；进行钢轨焊缝轨底K型扫查时，如图3所示，在钢轨焊缝一侧的钢轨轨底两个侧面6各布置一个阵列探头，其中一个阵列探头作为发射阵列探头3，另一个阵列探头作为接收阵列探头4，发射阵列探头和接收阵列探头通过耦合剂均贴在钢轨轨底两侧的侧面上。其次，发射阵列探头和接收阵列探头分别与相控阵超声检测设备5 相应的端口相连接。然后，启动相控阵超声检测设备对钢轨焊缝进行检测，发射阵列探头沿着钢轨轴向方向进行前后移动或者放置在某几个固定的位置点，接收阵列探头采用不可移动的方式紧贴吸附固定在钢轨指定位置上，发射阵列探头发射超声波的同时，接收阵列探头同步进行超声波的接收，相控阵超声检测设备根据接收阵列探头接收到的信号进行图像化显示，检测人员根据检测图像显示判定钢轨焊缝中的缺陷信息。In the embodiment of the present invention, a method for ultrasonic imaging detection of a rail weld based on a double array probe is as follows. First, when the rail weld rail is in series scanning, as shown in FIG. 1 , on the weld 2 side of the rail 1 Two array probes are arranged one after the other on the rail tread 8 , the array probe on the near side of the weld is used as the emission array probe 3 , and the array probe on the far side of the weld is used as the receiving array probe 4 , the emission array probe and the receiving array probe The coupling agent is attached to the rail tread surface; when the rail weld head K-type scanning is performed, as shown in FIG. 2, an array probe is arranged on each side 7 of the rail head of the rail weld side, one of which The array probe serves as the transmitting array probe 3, and the other array probe serves as the receiving array probe 4. The transmitting array probe and the receiving array probe are attached to the sides of the rail head by the coupling agent; the rail weld bottom K-scan is performed. At the time of inspection, as shown in Fig. 3, an array probe is arranged on each side 6 of the rail bottom of the rail weld side, one array probe is used as the emission array probe 3, and the other array probe is used as the array probe. 4 receiving array probe, the transmitting probe array and the receiving array probe by a coupling agent are affixed on both sides of the bottom side of the rail. Secondly, the transmitting array probe and the receiving array probe are respectively combined with the phased array ultrasonic detecting device 5 The corresponding ports are connected. Then, the phased array ultrasonic testing device is started to detect the rail weld seam, and the transmitting array probe is moved back and forth along the axial direction of the rail or placed at a certain fixed position, and the receiving array probe is closely attached to the adsorption in an immovable manner. It is fixed at the specified position of the rail, and the transmitting array probe transmits ultrasonic waves, and the receiving array probe synchronously receives the ultrasonic waves. The phased array ultrasonic detecting device performs image display according to the signal received by the receiving array probe, and the detecting personnel displays and determines according to the detected image. Defect information in rail welds.
作为钢轨焊缝检测使用的相控阵超声检测设备，具有双阵列探头工作方式和单阵列探头工作方式，并且两种工作方式可自动进行切换。双阵列探头工作方式时：两个阵列探头配套组合使用，一个阵列探头工作在发射模式，另一个阵列探头工作在接收模式，发射模式的阵列探头只发射超声波，接收模式的阵列探头只接收超声波，发射模式可以设置为相控阵扇形扫描方式、相控阵线形扫描方式或相控阵单声束扫描方式，接收模式可以设置为相控阵线形扫描方式；单阵列探头工作方式时：接到相控阵超声检测设备的阵列探头均工作在自发自收模式，即阵列探头发射超声波的同时进行接收超声波，自发自收模式的阵列探头可设置为相控阵扇形扫描方式、相控阵线形扫描方式或相控阵单声束扫描方式，并且自发自收时发射与接收的扫描方式一样。As a phased array ultrasonic testing device used for rail weld inspection, it has a dual array probe working mode and a single array probe working mode, and the two working modes can be automatically switched. When the dual array probe works, two array probes are used in combination. One array probe works in the transmit mode, and the other array probe works in the receive mode. The transmit mode array probe only transmits ultrasonic waves, and the receive mode array probe only receives ultrasonic waves. The transmission mode can be set to phased array sector scanning mode, phased array linear scanning mode or phased array single beam scanning mode. The receiving mode can be set to phased array linear scanning mode; when single array probe working mode: receive phase The array probes of the array ultrasonic testing equipment all work in the spontaneous self-receiving mode, that is, the array probe transmits ultrasonic waves while receiving the ultrasonic waves, and the array probes of the self-receiving mode can be set as the phased array fan scanning mode and the phased array linear scanning mode. Or phased-array single-sound beam scanning, and the same as the scanning method of transmitting and receiving spontaneously.
作为钢轨焊缝检测使用的相控阵超声检测设备，具有利用单总线(1-wire)工作原理来实现阵列探头的自动识别和参数的设置。相控阵超声检测设备识别阵列探头的方法为：相控阵超声检测设备启动时，对接到设备上的阵列探头中的1-wire器件进行初始化、对1-wire器件进行识别和交换数据，以此实现阵列探头的自动识别和参数设置。As a phased array ultrasonic testing device used for rail weld inspection, it has a single bus (1-wire) working principle to realize automatic identification and parameter setting of the array probe. The method for identifying the array probe by the phased array ultrasonic detecting device is: when the phased array ultrasonic detecting device is started, the 1-wire device in the array probe connected to the device is initialized, the 1-wire device is identified and the data is exchanged, This enables automatic identification and parameter setting of the array probe.
作为钢轨焊缝检测使用的相控阵超声检测设备，具有探头耦合监控的功能，接到相控阵超声检测设备的阵列探头工作在自发自收模式，根据接收到超声波信号的情况自动判别探头的耦合情况，提供失耦报警功能。在进行钢轨焊缝检测的过程中，相控阵超声检测设备自动间隔一定时间进行耦合监控扫描并提供耦合情况显示和报警。As a phased array ultrasonic testing device used for rail weld inspection, it has the function of probe coupling monitoring. The array probe connected to the phased array ultrasonic testing equipment works in the spontaneous self-receiving mode, and automatically determines the probe according to the condition of receiving the ultrasonic signal. Coupling situation, providing decoupling alarm function. In the process of rail weld inspection, the phased array ultrasonic testing equipment automatically performs a coupling monitoring scan at a certain time and provides a coupling situation display and alarm.
如图4所示，作为发射阵列探头3的阵列探头，其包括相控阵超声探头31和相控阵超声楔块32。相控阵超声探头31包括探头本体、阵列晶片33和1-wire器件34，阵 列晶片33包括多个条状矩形晶片，1-wire器件34通过相控阵超声检测设备的访问从而识别探头的类型和参数；相控阵超声楔块具有底面、与底面相对的斜面，以及与底面、斜面相邻的竖直侧面，相控阵超声探头安装在相控阵超声楔块的斜面上，相控阵超声探头与相控阵楔块之间通过耦合剂紧密结合。As shown in FIG. 4, the array probe as the transmitting array probe 3 includes a phased array ultrasonic probe 31 and a phased array ultrasonic wedge 32. The phased array ultrasonic probe 31 includes a probe body, an array wafer 33, and a 1-wire device 34. The column wafer 33 includes a plurality of strip-shaped rectangular wafers, and the 1-wire device 34 recognizes the type and parameters of the probe by accessing the phased array ultrasonic inspection device; the phased array ultrasonic wedge has a bottom surface, a slope opposite to the bottom surface, and The vertical side of the bottom surface and the inclined surface, the phased array ultrasonic probe is mounted on the inclined surface of the phased array ultrasonic wedge, and the phased array ultrasonic probe and the phased array wedge are tightly coupled by the coupling agent.
如图5所示，作为接收阵列探头4的阵列探头，其包括探头本体41、阵列晶片42、1-wire器件43、磁吸附带44、刻度标尺带45及软接触薄膜套46。探头本体41由柔韧性材料制成带状，阵列晶片42包括多个条状矩形晶片，阵列晶片依次排列在探头本体41上，阵列晶片42与1-wire器件43布置于探头本体的底面；磁吸附带44位于探头本体的上表面，每间隔一定距离布置有磁吸棒，磁吸棒的排列方式与阵列探头的长度方向垂直，磁吸附带具有对铁磁性材料吸附的功能，实现阵列探头吸附在钢轨表面上；刻度标尺带45位于探头本体的上表面的磁吸附带的一侧，具有标尺刻度值，指示阵列晶片的位置信息，同时可作为尺子的测量功能；1-wire器件为该阵列探头的身份识别器件，通过相控阵超声检测设备的访问从而识别该阵列探头的类型和参数；软接触薄膜套46位于探头本体底部，薄膜套内充满液体，薄膜套具有一定倾斜角度，有利于超声波的接收。As shown in FIG. 5, the array probe as the receiving array probe 4 includes a probe body 41, an array wafer 42, a 1-wire device 43, a magnetic attraction tape 44, a scale scale tape 45, and a soft contact film cover 46. The probe body 41 is made of a flexible material, and the array wafer 42 includes a plurality of strip-shaped rectangular wafers, the array wafers are sequentially arranged on the probe body 41, and the array wafer 42 and the 1-wire device 43 are arranged on the bottom surface of the probe body; The adsorption belt 44 is located on the upper surface of the probe body, and a magnetic rod is arranged at a certain distance. The arrangement of the magnetic rods is perpendicular to the longitudinal direction of the array probe, and the magnetic adsorption belt has the function of adsorbing the ferromagnetic material to realize the adsorption of the array probe. On the surface of the rail; the scale scale strip 45 is located on one side of the magnetic adsorption strip on the upper surface of the probe body, has a scale scale value, indicates the position information of the array wafer, and can be used as a measurement function of the ruler; 1-wire device is the array The identification device of the probe identifies the type and parameters of the array probe through the access of the phased array ultrasonic testing device; the soft contact film sleeve 46 is located at the bottom of the probe body, the film sleeve is filled with liquid, and the film sleeve has a certain inclination angle, which is beneficial to Ultrasonic reception.
发射模式中使用的相控阵扇形扫描方式，是激发所述发射阵列探头中的全部或部分晶片，使激发晶片形成的声束在设定的角度范围内以一定的步进值变换角度扫过扇形区域，如图6所示。The phased array sector scanning method used in the emission mode is to excite all or part of the wafers in the transmitting array probe, so that the sound beam formed by the excitation wafer is swept by a certain step value within a set angle range. Sector area, as shown in Figure 6.
发射模式中使用的相控阵单声束扫描方式，是激发所述发射阵列探头中的全部或部分晶片，使激发晶片形成只有一条特定角度的超声波声束，如图7所示。The phased array single-beam scanning method used in the emission mode is to excite all or part of the wafers in the transmitting array probe, so that the excitation wafer forms an ultrasonic beam having only a certain angle, as shown in FIG.
接收模式中使用的相控阵线形扫描方式，是指以相同的聚集法则施加在阵列探头中的不同晶片组，晶片组可以是一个或多个晶片，每组激活晶片组接收某一特定角度的声束，通过循环改变起始激活晶片的位置，使接收声束沿晶片阵列方向循环前后移动，实现类似常规手动超声波检测探头前后移动的检测效果，如图8所示。 The phased array linear scanning method used in the receiving mode refers to different wafer groups applied in the array probe by the same aggregation rule. The wafer group may be one or more wafers, and each group of activated wafer groups receives a certain angle. The sound beam, by cyclically changing the position of the initial activation wafer, causes the received sound beam to move back and forth along the direction of the wafer array, thereby achieving a detection effect similar to that of a conventional manual ultrasonic inspection probe, as shown in FIG.
进行钢轨焊缝轨腰串列式扫查，发射阵列探头工作在相控阵扇形扫描，如图9所示，通过发射阵列探头固定在某一个位置实现钢轨焊缝轨腰一定高度区域的检测，通过将发射阵列探头依次放置在某几个固定的位置点上，实现钢轨焊缝轨腰整个高度全覆盖检测，当钢轨焊缝轨腰区域存在平面状缺陷时，发射阵列探头发出的超声波经缺陷表面和钢轨底面二次反射后被接收阵列探头接收，相控阵超声检测设备根据发射阵列探头扇形扫描声束确定接收阵列探头阵列晶片长度，同时将接收阵列探头接收到的信号进行显示。Conducting rail-weld rail-side tandem scanning, the transmitting array probe works in the phased array fan-shaped scanning, as shown in FIG. 9 , and the detection of a certain height region of the rail weld rail waist is fixed by a transmitting array probe at a certain position. By placing the array probes in sequence at a certain fixed position, the full height coverage of the rail weld rail waist is detected. When there is a planar defect in the rail weld rail waist region, the ultrasonic wave emitted by the array probe is defective. The surface and the bottom surface of the rail are received by the receiving array probe after being reflected twice. The phased array ultrasonic detecting device determines the length of the receiving array probe array according to the sector scanning scanning beam of the transmitting array probe, and simultaneously displays the signal received by the receiving array probe.
进行钢轨焊缝轨腰串列式扫查，发射阵列探头工作在相控阵单声束扫描，如图10所示，通过发射阵列探头在轨头踏面指定区域前后移动实现钢轨焊缝轨腰特定高度区域的检测，当钢轨焊缝轨腰区域存在平面状缺陷时，发射阵列探头发出的超声波经缺陷表面和钢轨底面二次反射后被接收阵列探头接收，相控阵超声检测设备根据发射阵列探头单声束确定接收阵列探头阵列晶片长度，同时将接收阵列探头接收到的信号进行显示。Conducting rail-weld rail-side tandem scanning, the transmitting array probe works in a phased array single-beam scanning, as shown in Fig. 10, through the transmitting array probe to move forward and backward in the specified area of the rail head tread to realize the rail weld rail waist specific In the detection of the height area, when there is a planar defect in the rail weld rail region, the ultrasonic wave emitted by the transmitting array probe is received by the receiving array probe after being reflected by the defect surface and the bottom surface of the rail, and the phased array ultrasonic detecting device is based on the transmitting array probe. The mono beam determines the length of the receiving array probe array wafer while simultaneously displaying the signals received by the receiving array probe.
进行钢轨焊缝轨头K型扫查，发射阵列探头工作在相控阵扇形扫描，如图11所示，通过发射阵列探头固定在某一个位置实现钢轨焊缝轨头一定宽度区域的检测，通过将发射阵列探头依次放置在某几个固定的位置点上实现钢轨焊缝轨头整个宽度全覆盖检测，当钢轨焊缝轨头区域存在平面状缺陷时，发射阵列探头发出的超声波经缺陷表面反射后被接收阵列探头接收，相控阵超声检测设备根据发射阵列探头扇形扫描声束确定接收阵列探头阵列晶片长度，同时将接收阵列探头接收到的信号进行显示。The K-type scanning of the rail weld rail head is carried out, and the transmitting array probe works in the phased array fan-shaped scanning, as shown in Fig. 11, the detection of a certain width region of the rail weld rail head is fixed by a certain position of the transmitting array probe, and the detection is passed. The transmitting array probes are sequentially placed at a certain fixed position to realize the full coverage of the rail weld rail head. When there is a planar defect in the rail weld rail head region, the ultrasonic waves emitted by the transmitting array probe are reflected by the defect surface. After being received by the receiving array probe, the phased array ultrasonic detecting device determines the length of the receiving array probe array wafer according to the transmitting array probe sector scanning sound beam, and simultaneously displays the signal received by the receiving array probe.
进行钢轨焊缝轨头K型扫查，发射阵列探头工作在相控阵单声束扫描，如图12所示，通过发射阵列探头在轨头侧面指定位置区域前后移动探头实现钢轨焊缝轨头一定宽度区域的检测，当钢轨焊缝轨头区域存在平面状缺陷时，发射阵列探头发出的超声波经缺陷表面反射后被接收阵列探头接收，相控阵超声检测设备根据发射阵列探头单声束确定接收阵列探头阵列晶片长度，同时将接收阵列探头接收到的信号进行显示。 For the rail weld head K-type scan, the launch array probe works in the phased array single-beam scan, as shown in Figure 12, the rail weld head is realized by moving the array probe to the position of the position on the side of the rail head. For the detection of a certain width region, when there is a planar defect in the rail head region of the rail, the ultrasonic wave emitted by the transmitting array probe is reflected by the defective surface and received by the receiving array probe, and the phased array ultrasonic detecting device is determined according to the single beam of the transmitting array probe. The length of the array probe array wafer is received, and the signals received by the receiving array probe are displayed.
进行钢轨焊缝轨底K型扫查，发射阵列探头工作在相控阵扇形扫描，如图13所示，将发射阵列探头固定在某一个位置实现钢轨焊缝轨底一定宽度区域的检测，通过将发射阵列探头依次放置在某几个固定的位置点上实现钢轨焊缝轨底区域整个宽度全覆盖检测，当钢轨焊缝轨底区域存在平面状缺陷时，发射阵列探头发出的超声波经缺陷表面反射后被接收阵列探头接收，相控阵超声检测设备根据发射阵列探头扇形扫描声束确定接收阵列探头阵列晶片长度，同时将接收阵列探头接收到的信号进行显示。Carry out the K-type scanning of the rail weld rail bottom, and the launching array probe works in the phased array fan-shaped scanning. As shown in Fig. 13, the transmitting array probe is fixed at a certain position to realize the detection of a certain width of the rail weld rail bottom. The transmitting array probes are sequentially placed at a certain fixed position to realize the full width full coverage detection of the rail weld rail bottom region. When there is a planar defect in the bottom portion of the rail weld rail, the ultrasonic wave emitted from the array probe passes through the defect surface. After being reflected, it is received by the receiving array probe, and the phased array ultrasonic detecting device determines the length of the receiving array probe array wafer according to the sector scanning scanning sound beam of the transmitting array probe, and simultaneously displays the signal received by the receiving array probe.
进行钢轨焊缝轨底K型扫查，发射阵列探头工作在相控阵单声束扫描，如图14所示，通过将发射阵列探头在轨底侧面指定位置区域前后移动探头实现钢轨焊缝轨底一定宽度区域的检测，当钢轨焊缝轨底区域存在平面状缺陷时，发射阵列探头发出的超声波经缺陷表面反射后被接收阵列探头接收，相控阵超声检测设备根据发射阵列探头单声束确定接收阵列探头阵列晶片长度，同时将接收阵列探头接收到的信号进行显示。For the K-scan of the rail weld rail bottom, the launch array probe works in the phased array single-beam scanning. As shown in Fig. 14, the rail weld rail is realized by moving the probe to the position of the position of the bottom of the rail at the bottom side of the rail. The detection of a certain width region of the bottom, when there is a planar defect in the bottom portion of the rail weld rail, the ultrasonic wave emitted by the transmitting array probe is reflected by the defective surface and received by the receiving array probe, and the phased array ultrasonic detecting device according to the transmitting array probe single beam The length of the receiving array probe array wafer is determined, and the signals received by the receiving array probe are displayed.
以下将对发射阵列探头与接收阵形探头的工作步骤进行详细说明。The working steps of the transmitting array probe and the receiving array probe will be described in detail below.
进行钢轨焊缝轨腰串列式扫查，发射阵列探头工作在相控阵扇形扫描方式时，发射阵列探头位置固定点的确定方法为：首先根据发射阵列探头的扇形扫描角度范围，移动发射阵列探头调节发射阵列探头入射点与钢轨焊缝中心线的距离，使扇形扫描最大角度的声束位于钢轨焊缝轨腰高度检测的上端点从而确定第1个固定位置，接着继续在钢轨踏面上移动发射阵列探头，使发射阵列探头扇形扫描最大角度声束位于第1个固定位置时的最小角度声束的高度位置，从而确定第2个固定点，以第2个固定点作为起点，以同样的方式确定其他位置点，直到所有位置点的扇形扫描声束覆盖整个轨腰需要检测的高度区域。For the rail-weld rail-side tandem scanning, when the transmitting array probe works in the phased array sector scanning mode, the fixed position of the transmitting array probe is determined by first moving the transmitting array according to the sector scanning angle range of the transmitting array probe. The probe adjusts the distance between the incident point of the transmitting array probe and the center line of the rail weld, so that the beam at the maximum angle of the sector scanning is located at the upper end of the rail weld height detection to determine the first fixed position, and then continues to move on the rail tread Transmitting the array probe so that the transmitting array probe scans the height of the minimum angle beam at the maximum fixed angle of the sound beam at the first fixed position, thereby determining the second fixed point, starting from the second fixed point, with the same The way to determine other location points until the fan-shaped scanning beam at all location points covers the height area that the entire rail waist needs to detect.
进行钢轨焊缝轨腰串列式扫查，发射阵列探头工作在相控阵扇形扫描方式时，接收阵列探头阵列晶片长度的确定方法为：首先根据设定发射阵列探头的扇形扫描角度范围，将扇形扫描角度范围的最大角度声束位于钢轨焊缝轨腰检测高度范围的上端点，根据上端点反射波经钢轨底面反射后与钢轨踏面的交点作为接收阵列探头阵列晶片的 接收声束起点；其次，在踏面上移动发射阵列探头将扇形扫描角度范围的最小角度声束位于轨腰检测高度范围的下端点，根据下端点反射波经钢轨底面反射与钢轨踏面的交点作为接收阵列探头阵列晶片的接收声束终点；最后根据确定的声束起点和声束终点确定晶片阵列的长度和位置。For the rail-weld rail-side tandem scanning, when the transmitting array probe works in the phased array fan scanning mode, the method for determining the length of the receiving array probe array wafer is: firstly, according to the fan-shaped scanning angle range of the transmitting array probe, The maximum angle beam of the fan scanning angle range is located at the upper end of the rail weld waist detection height range, and the intersection of the reflected wave of the upper end point and the rail tread is reflected by the upper end of the rail as the receiving array probe array wafer. Receiving the sound beam starting point; secondly, moving the transmitting array probe on the tread surface to position the minimum angle sound beam of the sector scanning angle range at the lower end of the rail waist detecting height range, according to the intersection of the lower end reflected wave and the rail bottom surface reflection and the rail tread The array probe array wafer receives the sound beam end point; finally, the length and position of the wafer array are determined based on the determined sound beam start point and sound beam end point.
进行钢轨焊缝轨腰串列式扫查，发射阵列探头工作在相控阵单声束扫描方式时，发射阵列探头移动范围和接收阵列探头的阵列晶片长度的确定方法为：首先移动发射阵列探头调节发射阵列探头入射点与钢轨焊缝中心线的距离，将发射阵列探头声束位于轨腰检测高度范围的上端点，此时发射阵列探头的位置为可移动范围的起点，根据上端点反射波经钢轨底面反射后与钢轨踏面的交点作为接收阵列晶片的声束起点；其次，将发射阵列探头声束位于轨腰检测高度范围的下端点，此时发射阵列探头的位置为可移动范围的终点，根据下端点反射波经钢轨底面反射与钢轨踏面的交点作为接收阵列探头阵列晶片的声束终点；最后根据确定的声束起点和声束终点确定晶片阵列的长度及位置。For the rail-weld rail-side tandem scanning, when the transmitting array probe works in the phased array single-beam scanning mode, the moving range of the transmitting array probe and the array wafer length of the receiving array probe are determined by: first moving the transmitting array probe Adjust the distance between the incident point of the transmitting array probe and the center line of the rail weld, and place the sound beam of the transmitting array probe at the upper end of the height range of the rail waist detection. At this time, the position of the transmitting array probe is the starting point of the movable range, and the reflected wave according to the upper end point The intersection of the steel rail and the rail tread is used as the starting point of the sound beam of the receiving array wafer. Secondly, the transmitting array probe beam is located at the lower end of the rail waist detecting height range, and the position of the transmitting array probe is the end of the movable range. According to the intersection of the bottom end reflection wave and the rail tread surface, the intersection of the rail surface and the rail tread is used as the end point of the sound beam of the receiving array probe array wafer; finally, the length and position of the wafer array are determined according to the determined sound beam starting point and the sound beam end point.
进行钢轨焊缝轨头K型扫查，发射阵列探头工作在相控阵扇形扫描方式时，发射阵列探头位置固定点的确定方法为：首先根据发射阵列探头的扇形扫描角度范围，移动发射阵列探头调节发射阵列探头入射点与钢轨焊缝中心线的距离，使扇形扫描最大角度的声束位于钢轨轨头宽度检测的上端点从而确定第1个固定位置，接着继续在钢轨轨头侧面上移动发射阵列探头，使发射阵列探头扇形扫描最大角度声束位于第1个固定位置时的最小角度声束的宽度位置，从而确定第2个固定点，同样的方式确定其他位置点，直到所有位置点的扇形扫描声束覆盖整个轨头需要检测的宽度区域。For the rail weld head K-type scan, when the launch array probe works in the phased array fan scan mode, the fixed position of the launch array probe is determined by first moving the array probe according to the sector scan angle range of the transmit array probe. Adjusting the distance between the incident point of the transmitting array probe and the center line of the rail weld, so that the beam at the maximum angle of the sector scanning is located at the upper end of the rail head width detection to determine the first fixed position, and then continue to move on the side of the rail head. The array probe enables the transmitting array probe to scan the width of the minimum angle beam when the maximum angle beam is located at the first fixed position, thereby determining the second fixed point, and determining the other position points in the same manner until all the points are The sector scan beam covers the width of the entire track head that needs to be detected.
进行钢轨焊缝轨头K型扫查，发射阵列探头工作在相控阵扇形扫描方式时，接收阵列探头中的阵列晶片长度的确定方法为：首先根据设定发射阵列探头的扇形扫描角度范围，将扇形扫描角度范围的最大角度声束位于轨头检测宽度范围的上端点，根据上端点反射波与钢轨轨头侧面的交点作为接收阵列探头阵列晶片的接收声束起点；其 次，移动发射阵列探头，将扇形扫描角度范围的最小角度声束位于轨头检测宽度范围的下端点，根据下端点反射波与钢轨轨头侧面的交点作为接收阵列探头阵列晶片的接收声束终点；最后根据确定的声束起点和声束终点确定晶片阵列的长度和位置。For the K-type scanning of the rail weld rail head, when the transmitting array probe works in the phased array fan scanning mode, the method for determining the length of the array wafer in the receiving array probe is: firstly, according to the setting of the sector scanning angle range of the transmitting array probe, The maximum angular sound beam of the fan scanning angle range is located at the upper end of the rail head detecting width range, and the intersection of the upper end point reflected wave and the rail rail head side is used as the starting point of the receiving sound beam of the receiving array probe array chip; Second, moving the array probe, the minimum angle beam of the fan scan angle range is located at the lower end of the rail head detection width range, and the intersection of the lower end reflection wave and the rail head side is used as the receiving beam end of the receiving array probe array chip. Finally, the length and position of the wafer array are determined based on the determined sound beam start point and sound beam end point.
进行钢轨焊缝轨头K型扫查，发射阵列探头工作在相控阵单声束扫描方式时，发射阵列探头移动范围和接收阵列探头中的阵列晶片长度的确定方法为：首先移动发射阵列探头调节发射阵列探头入射点与钢轨焊缝中心线的距离，将声束位于轨头检测宽度范围的上端点，此时发射阵列探头的位置为可移动范围的起点，根据上端点反射波与钢轨轨头侧面的交点作为接收阵列晶片的声束起点；其次，将发射阵列探头声束位于轨头检测宽度范围的下端点，此时发射阵列探头的位置为可移动范围的终点，根据下端点反射波与钢轨轨头侧面的交点作为接收阵列探头阵列晶片的声束终点；最后根据确定的声束起点和声束终点确定晶片阵列的长度及位置。For the K-scan of the rail weld rail head, when the launch array probe works in the phased array single-beam scanning mode, the moving range of the transmitting array probe and the length of the array wafer in the receiving array probe are determined by: first moving the transmitting array probe Adjust the distance between the incident point of the transmitting array probe and the center line of the rail weld, and locate the sound beam at the upper end of the range of the rail head detection width. At this time, the position of the transmitting array probe is the starting point of the movable range, according to the upper end point reflected wave and the rail track. The intersection of the side of the head serves as the starting point of the sound beam of the receiving array wafer; secondly, the transmitting array probe sound beam is located at the lower end of the range of the head detecting width, and the position of the transmitting array probe is the end point of the movable range, and the reflected wave according to the lower end point The intersection with the side of the rail head is used as the end of the sound beam of the receiving array probe array wafer; finally, the length and position of the wafer array are determined according to the determined sound beam starting point and the sound beam end point.
进行钢轨焊缝轨底K型扫查，发射阵列探头工作在相控阵扇形扫描方式时，发射阵列探头位置固定点的确定方法为：首先根据发射阵列探头的扇形扫描角度范围，移动发射阵列探头调节发射阵列探头入射点距离钢轨焊缝中心线的距离，使扇形扫描最大角度的声束位于钢轨轨底宽度检测的上端点从而确定第1个固定位置，接着继续在钢轨轨底侧面上移动发射阵列探头，使发射阵列探头扇形扫描最大角度声束位于第1个固定位置时的最小角度声束的宽度位置，从而确定第2个固定点，同样的方式确定其他位置点，直到所有位置点的扇形扫描声束覆盖整个轨底需要检测的宽度区域。For the K-scan of the rail weld rail bottom, when the launch array probe works in the phased array fan scan mode, the method for determining the fixed position of the launch array probe is as follows: firstly, according to the sector scan angle range of the launch array probe, the mobile array probe is moved. Adjusting the distance from the incident point of the transmitting array probe to the center line of the rail weld, so that the beam at the maximum angle of the sector scanning is located at the upper end of the rail width detection of the rail to determine the first fixed position, and then continue to move on the bottom side of the rail rail. The array probe enables the transmitting array probe to scan the width of the minimum angle beam when the maximum angle beam is located at the first fixed position, thereby determining the second fixed point, and determining the other position points in the same manner until all the points are The sector scan beam covers the width of the entire track that needs to be detected.
进行钢轨焊缝轨底K型扫查，发射阵列探头工作在相控阵扇形扫描方式时，接收阵列探头中的阵列晶片长度的确定方法为：首先根据设定发射阵列探头的扇形扫描角度范围，将扇形扫描角度范围的最大角度声束位于轨底检测宽度范围的上端点，根据上端点反射波与钢轨轨底侧面的交点作为接收阵列探头阵列晶片的接收声束起点；其次，将扇形扫描角度范围的最小角度声束位于轨底检测宽度范围的下端点，根据下端点反射波与钢轨轨底侧面的交点作为接收阵列探头阵列晶片的接收声束终点；最后根 据确定的声束起点和声束终点确定晶片阵列的长度和位置。For the K-type scanning of the rail weld rail bottom, when the transmitting array probe works in the phased array fan scanning mode, the method for determining the length of the array wafer in the receiving array probe is as follows: firstly, according to the setting of the sector scanning angle range of the transmitting array probe, The maximum angle beam of the fan scanning angle range is located at the upper end of the rail bottom detection width range, and the intersection of the upper end point reflected wave and the bottom side of the rail track is used as the starting point of the receiving beam of the receiving array probe array chip; secondly, the fan scanning angle is used The minimum angle beam of the range is located at the lower end of the range of the detection width of the rail bottom, and the intersection of the reflected wave of the lower end point and the bottom side of the rail rail is used as the end point of the receiving beam of the receiving array probe array wafer; The length and position of the wafer array are determined from the determined sound beam origin and sound beam endpoint.
进行钢轨焊缝轨底K型扫查，发射阵列探头工作在相控阵单声束扫描方式时，发射阵列探头移动范围和接收阵列探头的阵列晶片长度的确定方法为：首先移动发射阵列探头调节发射阵列探头入射点距离钢轨焊缝中心线的距离，将声束位于轨底检测宽度范围的上端点，此时发射阵列探头的位置为可移动范围的起点，根据上端点反射波与钢轨轨底侧面的交点作为接收阵列晶片的声束起点；其次，将发射阵列探头声束位于轨底检测宽度范围的下端点，此时发射阵列探头的位置为可移动范围的终点，根据下端点反射波与钢轨轨底侧面的交点作为接收阵列探头阵列晶片的声束终点；最后根据确定的声束起点和声束终点确定晶片阵列的长度及位置。For the K-type scanning of the rail weld rail bottom, when the transmitting array probe works in the phased array single-beam scanning mode, the moving range of the transmitting array probe and the array wafer length of the receiving array probe are determined by: firstly moving the transmitting array probe to adjust The distance from the incident point of the transmitting array probe to the center line of the rail weld is located at the upper end of the detection width of the rail bottom. At this time, the position of the transmitting array probe is the starting point of the movable range, and the reflected wave and the rail bottom are according to the upper end point. The intersection of the side faces serves as the starting point of the sound beam of the receiving array wafer; secondly, the transmitting array probe sound beam is located at the lower end of the detection width range of the track bottom, and the position of the transmitting array probe is the end point of the movable range, according to the reflected wave of the lower end point The intersection of the bottom side of the rail is used as the end of the sound beam of the receiving array probe array wafer; finally, the length and position of the wafer array are determined according to the determined sound beam starting point and the sound beam end point.
作为钢轨焊缝检测使用的相控阵超声检测设备中图像显示方法为：相控阵检测设备根据接收阵列探头中使用线形扫描参数设置，将检测结果显示为线形扫描图像，当发射阵列探头工作在相控阵扇形扫描方式时，仪器显示的线形扫描图像与发射阵列探头位置对应的实时图像，当发射阵列探头工作在相控阵单声束扫描方式时，仪器显示的线形扫描图像中的每一条声束具有幅度峰值记忆保持的功能，即图像刷新时，线形扫描图像的每一条声束的超声波信号只保留最大幅度峰值信息。The image display method used in the phased array ultrasonic testing device used for the inspection of the rail weld is: the phased array detecting device displays the detection result as a linear scan image according to the linear scanning parameter setting in the receiving array probe, when the transmitting array probe works In the phased array fan scanning mode, the linear scan image displayed by the instrument and the real-time image corresponding to the position of the transmitting array probe, each of the linear scan images displayed by the instrument when the transmitting array probe is operated in the phased array single beam scanning mode The sound beam has the function of amplitude peak memory retention, that is, when the image is refreshed, the ultrasonic signal of each sound beam of the linear scan image retains only the maximum amplitude peak information.
作为钢轨焊缝检测使用的相控阵检测设备中缺陷信息识别方法为：根据相控阵检测设备中显示的线形扫描图像，当线形扫描图像中的某个声束接收到缺陷的反射回波，即可确定该回波是由钢轨焊缝中的哪个反射点反射的超声波。The defect information recognition method used in the phased array detecting device used for the inspection of the rail weld is: according to the linear scan image displayed in the phased array detecting device, when a certain sound beam in the linear scan image receives the reflected echo of the defect, It is then determined which echo is reflected by which reflection point in the rail weld.
钢轨焊缝轨腰串列式扫查，发射阵列探头工作在相控阵扇形扫描方式，缺陷位置的确定公式为：The rail weld seam track is scanned in series, and the launch array probe works in the phased array fan scan mode. The formula for determining the defect position is:
dgy(n)＝d1+(d2-d1)/N*(n-1)              (1)d gy (n)=d1+(d2-d1)/N*(n-1) (1)
公式(1)中：dgy(n)为轨腰检测线形扫描图像中第n条声束表示的钢轨焊缝轨腰中缺陷反射点的深度；d1表示钢轨焊缝轨腰检测扇形扫描覆盖的上端点深度,d2表示钢轨焊缝轨腰检测扇形扫描覆盖的下端点深度；N表示线形扫描图像中的超声波声束总 数；n表示线形扫描图像中的某一条声束，其中1≤n≤N。因此当线形扫描图像中出现连续的声束均有缺陷反射回波，根据连续有反射回波的边缘声束n1和n2，利用dgy(n2)-dgy(n1)即可算出轨腰平面状缺陷的高度值。In formula (1): d gy (n) is the depth of the defect reflection point in the rail weld rail waist indicated by the nth sound beam in the linear scan image of the rail waist; d1 is the rail weld inspection of the rail weld rail. The upper end depth, d2 represents the lower end depth of the rail weld rail detection sector scanning; N represents the total number of ultrasonic beams in the linear scan image; n represents a certain sound beam in the linear scan image, where 1≤n≤N . Therefore, when a continuous sound beam appears in a linear scan image, there are defect reflection echoes. According to the edge sound beams n1 and n2 with continuous reflected echoes, the geosteer plane can be calculated by using d gy (n2)-d gy (n1). The height value of the defect.
钢轨焊缝轨腰串列式扫查，发射阵列探头工作在相控阵单声束扫描方式，缺陷位置的确定公式为：Rail weld seam rail-type tandem scanning, the launch array probe works in the phased array single-beam scanning mode, and the determination formula of the defect position is:
dgy(n)＝d1+(d2-d1)/N*(n-1)                (2)d gy (n)=d1+(d2-d1)/N*(n-1) (2)
公式(2)中：dgy(n)为轨腰检测线形扫描图像中第n条声束表示的钢轨焊缝轨腰中缺陷反射点的深度；d1表示钢轨焊缝轨腰检测需要覆盖的上端点深度,d2表示钢轨焊缝轨腰检测需要覆盖的下端点深度；N表示线形扫描图像中的超声波声束总数；n表示线形扫描图像中的某一条声束，其中1≤n≤N。因此当线形扫描图像中出现连续的声束均有缺陷反射回波，根据连续有反射回波的边缘声束n1和n2，利用dgy(n2)-dgy(n1)即可算出轨腰平面状缺陷的高度值。In formula (2): d gy (n) is the depth of the defect reflection point in the rail weld rail waist indicated by the nth sound beam in the linear scan image of the rail waist; d1 indicates that the rail weld rail waist detection needs to be covered End point depth, d2 represents the depth of the lower end point to be covered by the rail weld rail waist detection; N represents the total number of ultrasonic beams in the line scan image; n represents a certain sound beam in the line scan image, where 1 ≤ n ≤ N. Therefore, when a continuous sound beam appears in a linear scan image, there are defect reflection echoes. According to the edge sound beams n1 and n2 with continuous reflected echoes, the geosteer plane can be calculated by using d gy (n2)-d gy (n1). The height value of the defect.
钢轨焊缝轨头K型扫查，发射阵列探头工作在相控阵扇形扫描方式，缺陷位置的确定公式为：The rail weld head is K-scan, and the launch array probe works in the phased array fan scan mode. The formula for determining the defect position is:
dgt(n)＝d3+(d4-d3)/N*(n-1)               (3)d gt (n)=d3+(d4-d3)/N*(n-1) (3)
公式(3)中：dgt(n)为轨头检测线形扫描图像中第n条声束表示钢轨焊缝轨头中缺陷反射点的宽度位置；d3表示钢轨焊缝轨头检测扇形扫描覆盖宽度区域的上端点位置,d4表示钢轨焊缝轨头检测扇形扫描覆盖宽度区域的下端点位置；N表示线形扫描图像中的超声波声束总数；n表示线形扫描图像中的某一条声束，其中1≤n≤N。因此当线形扫描图像中出现连续的声束均有缺陷反射回波，根据连续有反射回波的边缘声束n1和n2，利用dgt(n2)-dgt(n1)即可算出轨头平面状缺陷的宽度值。In formula (3): d gt (n) is the head position of the rail head detection. The nth sound beam indicates the width position of the defect reflection point in the rail weld head; d3 indicates the rail weld head detection sector scan coverage width. The upper end position of the area, d4 represents the lower end position of the rail weld head detection sector coverage width region; N represents the total number of ultrasonic beams in the line scan image; n represents a certain sound beam in the line scan image, where 1 ≤ n ≤ N. Therefore, when a continuous sound beam appears in the linear scan image, there is a defect reflection echo. According to the edge sound beams n1 and n2 with the reflected echo continuously, the head plane can be calculated by using d gt (n2)-d gt (n1). The width value of the defect.
钢轨焊缝轨头K型扫查，发射阵列探头工作在相控阵单声束扫描方式，缺陷位置的确定公式为：The rail weld head is K-scan, and the launch array probe works in the phased array single-beam scanning mode. The formula for determining the defect position is:
dgt(n)＝d3+(d4-d3)/N*(n-1)              (4) d gt (n)=d3+(d4-d3)/N*(n-1) (4)
公式(4)中：dgt(n)为轨头检测线形扫描图像中第n条声束表示钢轨焊缝轨头中缺陷反射点的宽度位置；d3表示钢轨焊缝轨头检测宽度区域的上端点位置,d4表示钢轨焊缝轨头检测宽度区域的下端点位置；N表示线形扫描图像中的超声波声束总数；n表示线形扫描图像中的某一条声束，其中1≤n≤N。因此当线形扫描图像中出现连续的声束均有缺陷反射回波，根据连续有反射回波的边缘声束n1和n2，利用dgt(n2)-dgt(n1)即可算出轨头平面状缺陷的宽度值。In formula (4): d gt (n) is the head position of the rail head. The nth sound beam in the line scan image indicates the width position of the defect reflection point in the rail weld head; d3 indicates the upper part of the rail weld head detection width area. End position, d4 represents the lower end position of the rail weld head detection width region; N represents the total number of ultrasonic beams in the line scan image; n represents a certain sound beam in the line scan image, where 1≤n≤N. Therefore, when a continuous sound beam appears in the linear scan image, there is a defect reflection echo. According to the edge sound beams n1 and n2 with the reflected echo continuously, the head plane can be calculated by using d gt (n2)-d gt (n1). The width value of the defect.
钢轨焊缝轨底K型扫查，发射阵列探头工作在相控阵扇形扫描方式，缺陷位置的确定公式为：The K-scan of the rail weld rail bottom, the launch array probe works in the phased array fan scan mode, and the determination formula of the defect position is:
dgd(n)＝d5+(d6-d5)/N*(n-1)            (5)d gd (n)=d5+(d6-d5)/N*(n-1) (5)
公式(5)中：dgd(n)表示轨底检测线形扫描图像中第n条声束表示钢轨焊缝中轨底缺陷反射点的宽度位置；d5表示钢轨焊缝轨底检测扇形扫描覆盖宽度区域的上端点位置,d6表示钢轨焊缝轨底检测扇形扫描覆盖宽度区域的下端点位置；N表示线形扫描图像中的超声波声束总数；n表示线形扫描图像中的某一条声束，其中1≤n≤N。因此当线形扫描图像中出现连续的声束均有缺陷反射回波，根据连续有反射回波的边缘声束n1和n2，利用dgd(n2)-dgd(n1)即可算出轨底平面状缺陷的宽度值。In formula (5): d gd (n) indicates that the nth sound beam in the linear scan image indicates the width position of the reflection point of the rail bottom defect in the rail weld; d5 indicates the rail weld bottom detection width of the rail weld. The upper end position of the area, d6 represents the lower end position of the rail weld bottom detection sector coverage width region; N represents the total number of ultrasonic beams in the linear scan image; n represents a certain sound beam in the linear scan image, where 1 ≤ n ≤ N. Therefore, when a continuous sound beam appears in a linear scan image, there is a defect reflection echo. According to the edge sound beams n1 and n2 with continuous reflected echoes, the dgd (n2)-d gd (n1) can be used to calculate the plane bottom shape. The width value of the defect.
钢轨焊缝轨底K型扫查，发射阵列探头工作在相控阵单声束扫描方式，缺陷位置的确定公式为：The K-scan of the rail weld rail bottom, the launch array probe works in the phased array single-beam scanning mode, and the determination formula of the defect position is:
dgd(n)＝d5+(d6-d5)/N*)n-1)              (6)d gd (n)=d5+(d6-d5)/N*)n-1) (6)
公式(6)中：dgd(n)表示轨底检测线形扫描图像中第n条声束表示钢轨焊缝中轨底缺陷反射点的宽度位置；d5表示钢轨焊缝轨底检测宽度区域的上端点位置,d6表示钢轨焊缝轨底检测宽度区域的下端点位置；N表示线形扫描图像中的超声波声束总数；n表示线形扫描图像中的某一条声束，其中1≤n≤N。因此当线形扫描图像中出现连续的声束均有缺陷反射回波，根据连续有反射回波的边缘声束n1和n2，利用dgd(n2)-dgd(n1)即可算出轨底平面状缺陷的宽度值。 In formula (6): d gd (n) indicates that the nth sound beam in the linear scan image indicates the width position of the reflection point of the rail bottom defect in the rail weld; d5 indicates the upper portion of the rail weld width detection width End position, d6 represents the lower end position of the rail weld bottom detection width region; N represents the total number of ultrasonic beams in the line scan image; n represents a certain sound beam in the line scan image, where 1≤n≤N. Therefore, when a continuous sound beam appears in a linear scan image, there is a defect reflection echo. According to the edge sound beams n1 and n2 with continuous reflected echoes, the dgd (n2)-d gd (n1) can be used to calculate the plane bottom shape. The width value of the defect.
本发明实施例对应还提供了一种用于双阵列探头的钢轨焊缝超声波成像检测的***，包括一发射阵列探头、一接收阵列探头以及相控阵超声检测设备。The embodiment of the invention further provides a system for ultrasonic imaging detection of a rail weld of a dual array probe, comprising a transmitting array probe, a receiving array probe and a phased array ultrasonic detecting device.
作为钢轨焊缝检测使用的相控阵超声检测设备，具有双阵列探头工作方式和单阵列探头工作方式，并且两种工作方式可自动进行切换。双阵列探头工作方式时：两个阵列探头配套组合使用，一个阵列探头工作在发射模式，另一个阵列探头工作在接收模式，发射模式的阵列探头只发射超声波，接收模式的阵列探头只接收超声波，发射模式可以设置为相控阵扇形扫描方式、相控阵线形扫描方式或相控阵单声束扫描方式，接收模式可以设置为相控阵线形扫描方式；单阵列探头工作方式时：接到相控阵超声检测设备的阵列探头均工作在自发自收模式，即阵列探头发射超声波的同时进行接收超声波，自发自收模式的阵列探头可设置为相控阵扇形扫描方式、相控阵线形扫描方式或相控阵单声束扫描方式，并且自发自收时发射与接收的扫描方式一样。As a phased array ultrasonic testing device used for rail weld inspection, it has a dual array probe working mode and a single array probe working mode, and the two working modes can be automatically switched. When the dual array probe works, two array probes are used in combination. One array probe works in the transmit mode, and the other array probe works in the receive mode. The transmit mode array probe only transmits ultrasonic waves, and the receive mode array probe only receives ultrasonic waves. The transmission mode can be set to phased array sector scanning mode, phased array linear scanning mode or phased array single beam scanning mode. The receiving mode can be set to phased array linear scanning mode; when single array probe working mode: receive phase The array probes of the array ultrasonic testing equipment all work in the spontaneous self-receiving mode, that is, the array probe transmits ultrasonic waves while receiving the ultrasonic waves, and the array probes of the self-receiving mode can be set as the phased array fan scanning mode and the phased array linear scanning mode. Or phased-array single-sound beam scanning, and the same as the scanning method of transmitting and receiving spontaneously.
作为钢轨焊缝检测使用的相控阵超声检测设备，具有利用单总线(1-wire)工作原理来实现阵列探头的自动识别和参数的设置。相控阵超声检测设备识别阵列探头的方法为：相控阵超声检测设备启动时，对接到设备上的阵列探头中的1-wire器件进行初始化、对1-wire器件进行识别和交换数据，以此实现阵列探头的自动识别和参数设置。As a phased array ultrasonic testing device used for rail weld inspection, it has a single bus (1-wire) working principle to realize automatic identification and parameter setting of the array probe. The method for identifying the array probe by the phased array ultrasonic detecting device is: when the phased array ultrasonic detecting device is started, the 1-wire device in the array probe connected to the device is initialized, the 1-wire device is identified and the data is exchanged, This enables automatic identification and parameter setting of the array probe.
作为钢轨焊缝检测使用的相控阵超声检测设备，具有探头耦合监控的功能，接到相控阵超声检测设备的阵列探头工作在自发自收模式，根据接收到超声波信号的情况自动判别探头的耦合情况，提供失耦报警功能。在进行钢轨焊缝检测的过程中，相控阵超声检测设备自动间隔一定时间进行耦合监控扫描并提供耦合情况显示和报警。As a phased array ultrasonic testing device used for rail weld inspection, it has the function of probe coupling monitoring. The array probe connected to the phased array ultrasonic testing equipment works in the spontaneous self-receiving mode, and automatically determines the probe according to the condition of receiving the ultrasonic signal. Coupling situation, providing decoupling alarm function. In the process of rail weld inspection, the phased array ultrasonic testing equipment automatically performs a coupling monitoring scan at a certain time and provides a coupling situation display and alarm.
如图4所示，作为发射阵列探头3的阵列探头，其包括相控阵超声探头31和相控阵超声楔块32。相控阵超声探头31包括探头本体、阵列晶片33和1-wire器件34，阵列晶片33包括多个条状矩形晶片，1-wire器件34通过相控阵超声检测设备的访问从而识别探头的类型和参数；相控阵超声楔块具有底面、与底面相对的斜面，以及与底面、斜面相邻的竖直侧面，相控阵超声探头安装在相控阵超声楔块的斜面上，相控阵超声 探头与相控阵楔块之间通过耦合剂紧密结合。As shown in FIG. 4, the array probe as the transmitting array probe 3 includes a phased array ultrasonic probe 31 and a phased array ultrasonic wedge 32. The phased array ultrasound probe 31 includes a probe body, an array wafer 33 and a 1-wire device 34. The array wafer 33 includes a plurality of strip-shaped rectangular wafers, and the 1-wire device 34 recognizes the type of the probe by accessing the phased array ultrasonic inspection device. And the parameter; the phased array ultrasonic wedge has a bottom surface, a slope opposite to the bottom surface, and a vertical side adjacent to the bottom surface and the inclined surface, and the phased array ultrasonic probe is mounted on the inclined surface of the phased array ultrasonic wedge, and the phased array Ultrasound The probe and the phased array wedge are tightly coupled by a coupling agent.
如图5所示，作为接收阵列探头4的阵列探头，其包括探头本体41、阵列晶片42、1-wire器件43、磁吸附带44、刻度标尺带45及软接触薄膜套46。探头本体41由柔韧性材料制成带状，阵列晶片42包括多个条状矩形晶片，阵列晶片依次排列在探头本体41上，阵列晶片42与1-wire器件43布置于探头本体的底面；磁吸附带44位于探头本体的上表面，每间隔一定距离布置有磁吸棒，磁吸棒的排列方式与阵列探头的长度方向垂直，磁吸附带具有对铁磁性材料吸附的功能，实现阵列探头吸附在钢轨表面上；刻度标尺带45位于探头本体的上表面的磁吸附带的一侧，具有标尺刻度值，指示阵列晶片的位置信息，同时可作为尺子的测量功能；1-wire器件为该阵列探头的身份识别器件，通过相控阵超声检测设备的访问从而识别该阵列探头的类型和参数；软接触薄膜套46位于探头本体底部，薄膜套内充满液体。As shown in FIG. 5, the array probe as the receiving array probe 4 includes a probe body 41, an array wafer 42, a 1-wire device 43, a magnetic attraction tape 44, a scale scale tape 45, and a soft contact film cover 46. The probe body 41 is made of a flexible material, and the array wafer 42 includes a plurality of strip-shaped rectangular wafers, the array wafers are sequentially arranged on the probe body 41, and the array wafer 42 and the 1-wire device 43 are arranged on the bottom surface of the probe body; The adsorption belt 44 is located on the upper surface of the probe body, and a magnetic rod is arranged at a certain distance. The arrangement of the magnetic rods is perpendicular to the longitudinal direction of the array probe, and the magnetic adsorption belt has the function of adsorbing the ferromagnetic material to realize the adsorption of the array probe. On the surface of the rail; the scale scale strip 45 is located on one side of the magnetic adsorption strip on the upper surface of the probe body, has a scale scale value, indicates the position information of the array wafer, and can be used as a measurement function of the ruler; 1-wire device is the array The identification device of the probe identifies the type and parameters of the array probe by accessing the phased array ultrasonic testing device; the soft contact film sleeve 46 is located at the bottom of the probe body, and the film sleeve is filled with liquid.
软接触薄膜套使探头本体41水平或是具有一定倾斜角度，有利于超声波的接收。The soft contact film sleeve makes the probe body 41 horizontal or has a certain inclination angle, which is favorable for the reception of ultrasonic waves.
相控阵超声检测设通过上述方法，获得接收阵列探头上阵列晶片接收焊缝缺陷反射的超声波回波声束的起始和终点位置，计算所述缺陷的高度值。The phased array ultrasonic inspection is performed by the above method to obtain the start and end positions of the ultrasonic echo beam reflected by the array wafer on the receiving array probe to receive the weld defect, and calculate the height value of the defect.
以上所述是本发明的优选实施方式，应当指出，对于本技术领域的普通技术人员来说，在不脱离本发明原理的前提下，还可以做出若干改进和润饰，这些改进和润饰也视为本发明的保护范围。 The above is a preferred embodiment of the present invention, and it should be noted that those skilled in the art can also make several improvements and retouchings without departing from the principles of the present invention. It is the scope of protection of the present invention.

Claims (10)

  1. 一种基于双阵列探头的钢轨焊缝超声波成像检测方法，其特征在于，包括以下步骤：An ultrasonic imaging detection method for rail weld seam based on double array probe, characterized in that the method comprises the following steps:
    在被测钢轨上布置一发射阵列探头与一接收阵列探头进行串列式扫查或K型扫查；Deploying a transmitting array probe and a receiving array probe on the rail to be tested for serial scanning or K-type scanning;
    使所述发射阵列探头工作于单声束或扇形或线形扫描方式；Having the transmit array probe operating in a single beam or sector or line scan mode;
    将所述接收阵列探头固定吸附于所述被测钢轨上，所述发射阵列探头前后移动或是依次放置于若干固定位置点上，使超声波覆盖所述被测钢轨的焊缝；The receiving array probe is fixedly adsorbed on the tested steel rail, and the transmitting array probe is moved back and forth or sequentially placed at a plurality of fixed position points, so that the ultrasonic waves cover the weld bead of the tested steel rail;
    所述接收阵列探头接收所述发射阵列探头发射的超声波经所述焊缝的缺陷表面反射的超声波回波；The receiving array probe receives an ultrasonic echo reflected by the ultrasonic wave emitted by the transmitting array probe through a defect surface of the weld bead;
    通过确定所述接收阵列探头上的阵列晶片接收到的所述焊缝的缺陷反射的超声波回波声束的起始和终点位置，计算所述缺陷的高度值。The height value of the defect is calculated by determining the start and end positions of the ultrasonic echo beam reflected by the defect of the weld received by the array wafer on the receiving array probe.
  2. 根据权利要求1所述的方法，其特征在于，使用的所述接收阵列探头具有带状的探头本体、设置于所述探头本体下端的软接触薄膜套；所述探头本体上具有磁吸棒，边沿具有刻度标尺带，所述探头本体底面并排设置有若干垂直其长度方向的阵列晶片，所述刻度标尺带用于指示阵列晶片的位置信息，所述软接触薄膜套使所述探头本体水平或具有倾角。The method according to claim 1, wherein the receiving array probe has a strip-shaped probe body, a soft contact film sleeve disposed at a lower end of the probe body, and a magnetic rod on the probe body. The edge has a scale scale strip, and the bottom surface of the probe body is arranged side by side with a plurality of array wafers perpendicular to the length direction thereof, the scale scale strip is used to indicate position information of the array wafer, and the soft contact film sleeve makes the probe body horizontal or Has an angle of inclination.
  3. 根据权利要求2所述的方法，其特征在于，当所述发射阵列探头工作于单声束扫描方式时，所述发射阵列探头在指定区域范围内前后移动，当所述发射阵列探头工作于扇形扫描方式时，所述发射阵列探头依次放置于若干固定位置点上。 The method according to claim 2, wherein when said transmitting array probe operates in a single beam scanning mode, said transmitting array probe moves back and forth within a specified area, when said transmitting array probe operates in a sector In the scanning mode, the transmitting array probes are sequentially placed at a plurality of fixed position points.
  4. 根据权利要求3所述的方法，其特征在于，所述若干固定位置点的确定方式为：首先根据发射阵列探头的扇形扫描角度范围，移动发射阵列探头调节发射阵列探头入射点与所述焊缝中心线的距离，使扇形扫描最大角度的声束位于所述焊缝检测区域上端点从而确定第一个固定位置，接着继续在钢轨上直线移动发射阵列探头，使发射阵列探头扇形扫描最大角度声束位于第一个固定位置时的最小角度声束的宽度位置，从而确定第二个固定点，以所述第二个固定点作为新起点以同样的方式确定其他位置点，直到所有位置点的扇形扫描声束覆盖整个钢轨焊缝需要检测的区域。The method according to claim 3, wherein the plurality of fixed position points are determined by first moving the transmitting array probe to adjust the incident point of the transmitting array probe and the weld according to a sector scanning angle range of the transmitting array probe. The distance of the center line is such that the sound beam of the maximum angle of the sector scanning is located at the end point of the weld detection area to determine the first fixed position, and then the moving array probe is continuously moved linearly on the rail, so that the emission array probe is fanned to scan the maximum angle sound. The width position of the minimum angle beam when the beam is in the first fixed position, thereby determining the second fixed point, and determining the other position points in the same manner by using the second fixed point as a new starting point until all the points are The sector scan beam covers the area of the entire rail weld that needs to be inspected.
  5. 根据权利要求4所述的方法，其特征在于，所述扇形扫描是激发所述发射阵列探头中的全部或部分晶片，使激发晶片形成的声束在设定的角度范围内以一定的步进值变换角度扫过扇形区域。The method according to claim 4, wherein said sector scanning is to excite all or a portion of the wafers in said transmitting array probe such that the sound beam formed by the exciting wafer is stepped within a set angular range The value transformation angle sweeps across the sector.
  6. 根据权利要求1所述的方法，其特征在于，所述发射阵列探头可在双阵列探头工作方式和单阵列探头工作方式中切换，当所述发射阵列探头工作于单阵列探头工作方式时，其工作于自发自收模式。The method of claim 1 wherein said transmit array probe is switchable between a dual array probe mode of operation and a single array probe mode of operation, and wherein said transmit array probe is operated in a single array probe mode of operation Work in spontaneous self-receiving mode.
  7. 根据权利要求1-6任一项所述的方法，其特征在于，所述接收阵列探头以相控阵线形扫描方式工作，将其阵列晶片分成不同的晶片组，所述晶片组可以是一个或多个晶片，每组激活晶片组接收某一特定角度的声束，通过循环改变起始激活晶片的位置，使接收声束沿晶片阵列方向循环前后移动。The method according to any one of claims 1 to 6, wherein the receiving array probe operates in a phased array linear scanning mode to divide the array wafer into different wafer groups, and the wafer group may be one or A plurality of wafers, each set of activated wafers receiving a sound beam of a certain angle, and the position of the initial activated wafer is changed by a cycle to move the received sound beam back and forth in the direction of the wafer array.
  8. 一种权利要求1所使用的***，其特征在于，包括一发射阵列探头、一接收阵列探头以及相控阵超声检测设备；A system as claimed in claim 1, comprising a transmitting array probe, a receiving array probe, and a phased array ultrasonic detecting device;
    所述发射阵列探头、接收阵列探头在被测钢轨上进行串列式扫查或K型扫查；所 述发射阵列探头具有相控阵超声楔块以及安装于所述相控阵超声楔块的相控阵超声探头，所述相控阵超声探头包括探头本体以及多个条状矩形晶片；The transmitting array probe and the receiving array probe perform a tandem scan or a K-type scan on the rail to be tested; The transmitting array probe has a phased array ultrasonic wedge and a phased array ultrasonic probe mounted on the phased array ultrasonic wedge, the phased array ultrasonic probe comprising a probe body and a plurality of strip-shaped rectangular wafers;
    所述接收阵列探头包括带状的探头本体、设置于所述探头本体下端的软接触薄膜套；所述探头本体上具有磁吸棒，边沿具有刻度标尺带，所述探头本体底面设置有阵列晶片，所述阵列晶片包括多个条状矩形晶片，阵列晶片依次排列在所述探头本体上，所述刻度标尺带用于指示阵列晶片的位置信息，所述软接触薄膜套使所述探头本体水平或具有倾角；The receiving array probe comprises a strip-shaped probe body, a soft contact film sleeve disposed at a lower end of the probe body; the probe body has a magnetic rod, the edge has a scale scale strip, and the bottom surface of the probe body is provided with an array wafer The array wafer includes a plurality of strip-shaped rectangular wafers, the array wafers are sequentially arranged on the probe body, the scale scale strips are used to indicate position information of the array wafers, and the soft contact film sleeves are horizontally arranged on the probe body Or have an inclination;
    所述相控阵超声检测设备使所述发射阵列探头、接收阵列探头工作于双阵列探头工作方式或单阵列探头工作方式，工作于单阵列探头工作方式时，所述发射阵列探头工作于自发自收方式；The phased array ultrasonic detecting device enables the transmitting array probe and the receiving array probe to work in a dual array probe working mode or a single array probe working mode. When working in a single array probe working mode, the transmitting array probe works spontaneously. Receiving method
    所述相控阵超声检测设备获取所述接收阵列探头上阵列晶片接收到的所述焊缝缺陷反射的超声波回波声束的起始和终点位置，计算所述缺陷的高度值。The phased array ultrasonic detecting device acquires the starting and ending positions of the ultrasonic echo beam reflected by the weld defect received by the array wafer on the receiving array probe, and calculates the height value of the defect.
  9. 根据权利要求8所述的***，其特征在于，所述发射阵列探头工作于单声束或扇形或线形扫描方式。The system of claim 8 wherein said transmit array probe operates in a single beam or sector or line scan mode.
  10. 根据权利要求9所述的***，其特征在于，所述发射阵列探头、接收阵列探头均还具有单总线器件，所述相控阵超声检测设备通过所述单总线器件进行识别与交换数据。 The system of claim 9 wherein said transmit array probe and receive array probe each further have a single bus device, said phased array ultrasonic sensing device identifying and exchanging data via said single bus device.
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