WO2017184098A2 - Probe for atomic force microscope - Google Patents

Probe for atomic force microscope Download PDF

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Publication number
WO2017184098A2
WO2017184098A2 PCT/TR2017/050153 TR2017050153W WO2017184098A2 WO 2017184098 A2 WO2017184098 A2 WO 2017184098A2 TR 2017050153 W TR2017050153 W TR 2017050153W WO 2017184098 A2 WO2017184098 A2 WO 2017184098A2
Authority
WO
WIPO (PCT)
Prior art keywords
probe
coating
core
atomic force
force microscope
Prior art date
Application number
PCT/TR2017/050153
Other languages
French (fr)
Other versions
WO2017184098A3 (en
Inventor
Aykutlu Dana
Original Assignee
Okyay Enerji Ar-Ge Muhendislik Ticaret Ve Sanayi Limited Sirketi
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Okyay Enerji Ar-Ge Muhendislik Ticaret Ve Sanayi Limited Sirketi filed Critical Okyay Enerji Ar-Ge Muhendislik Ticaret Ve Sanayi Limited Sirketi
Publication of WO2017184098A2 publication Critical patent/WO2017184098A2/en
Publication of WO2017184098A3 publication Critical patent/WO2017184098A3/en

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01Q—SCANNING-PROBE TECHNIQUES OR APPARATUS; APPLICATIONS OF SCANNING-PROBE TECHNIQUES, e.g. SCANNING PROBE MICROSCOPY [SPM]
    • G01Q60/00—Particular types of SPM [Scanning Probe Microscopy] or microscopes; Essential components thereof
    • G01Q60/24—AFM [Atomic Force Microscopy] or apparatus therefor, e.g. AFM probes
    • G01Q60/38—Probes, their manufacture, or their related instrumentation, e.g. holders
    • G01Q60/42—Functionalisation
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01Q—SCANNING-PROBE TECHNIQUES OR APPARATUS; APPLICATIONS OF SCANNING-PROBE TECHNIQUES, e.g. SCANNING PROBE MICROSCOPY [SPM]
    • G01Q70/00—General aspects of SPM probes, their manufacture or their related instrumentation, insofar as they are not specially adapted to a single SPM technique covered by group G01Q60/00
    • G01Q70/08—Probe characteristics
    • G01Q70/10—Shape or taper
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01Q—SCANNING-PROBE TECHNIQUES OR APPARATUS; APPLICATIONS OF SCANNING-PROBE TECHNIQUES, e.g. SCANNING PROBE MICROSCOPY [SPM]
    • G01Q70/00—General aspects of SPM probes, their manufacture or their related instrumentation, insofar as they are not specially adapted to a single SPM technique covered by group G01Q60/00
    • G01Q70/08—Probe characteristics
    • G01Q70/14—Particular materials

Definitions

  • the present invention relates to an atomic force microscope probe that will be used for the examination of biological samples.
  • atomic force microscopes which are a type of scanning probe microscopes
  • measurements can be made at resolution in nanometers.
  • the interaction between a sharp probe located on a lever and the surface of the specimen to be inspected are utilized
  • US2013014295A1 discloses the use of an atomic force microscope probe on a target contained within a cell.
  • the purpose of the present invention is the development of a probe containing a tip that does not damage or adhere to the specimen during examination of biological samples by atomic force microscopy.
  • a probe comprising a sharp core and coatings on this core has been developed.
  • the coating exhibits oleophobic and hydrophobic properties.
  • Figure-1 It is a schematic cross-sectional illustration of a probe of atomic force microscope according to the present invention.
  • Figure-2 It is a schematic cross-sectional illustration of a probe of atomic force microscope according to the present invention.
  • the probe for atomic force microscope (1) of present invention which enables biological samples to be inspected without being damaged or adhered, basically comprises, a core (3) whose base is placed on the surface of the atomic force microscope lever (2) close to the free end of the lever (2) having a shape with a vertex such as a cone or pyramid; and a coating (4) which at least partially covers the the core (3) and forms a convex curved surface around the vertex of the core.
  • the coating (4) has a thickness between 5 and 1000 nm. With the coating (4) a wider contact surface between the sample surface and the probe (1) is ensured and thus damaging of specimen surface is avoided.
  • the coating (4) is composed of at least one material exhibiting both oleophobic and hydrophobic properties or coating (4) is composed of a micture of at least one material exhibiting oleophobic character and at least one material exhibiting hydrophobic character. Thus, during the examination of the biologic sample, the adhesion between surface of the biologic sample and probe (1) is avoided. With the utilization of the probe (1), measurements can also be made on the surfaces of droplets of water or oil or solutions containing both water and oil.
  • the coating (4) is preferably made of a fluoropolymer material.
  • the coating (4) is constituted with one of following methods of
  • the lever (2) and the core (3) are prevalently composed of one piece.
  • the lever (2) and the core (3) are made of silicon nitride.
  • This second coating (5) is a material which will enable the formation or strengthening of an electrical, magnetic or other type of interaction between the probe (1) and the surface to be examined.

Abstract

The present invention relates to an atomic force microscope probe that will be used for the examination of biological samples. With the present invention, a probe consisting of a sharp core and a coating on this core has been developed. The coating exhibits oleophobic and hydrophobic properties. With the probe developed with the present invention, measurements can also be made on the surfaces of drips, such as water or oil droplets, or dropelts of solutions comprising both of them.

Description

A PROBE FOR ATOMIC FORCE MICROSCOPE
Technical Field
The present invention relates to an atomic force microscope probe that will be used for the examination of biological samples.
Prior Art
With atomic force microscopes, which are a type of scanning probe microscopes, measurements can be made at resolution in nanometers. For this purpose, the interaction between a sharp probe located on a lever and the surface of the specimen to be inspected are utilized
During examination of biological samples, the sample may be damaged due to the sharpness of tip of the probe, or the measurement accuracy may be decreased because of the adherence of biological sample to the tip of the probe. If the tip of the probe is rounded, a loss of resolution occurs. In the US Patent application numbered US2013014295A1 discloses the use of an atomic force microscope probe on a target contained within a cell.
Purpose and Brief Description of the Present invention
The purpose of the present invention is the development of a probe containing a tip that does not damage or adhere to the specimen during examination of biological samples by atomic force microscopy.
For the purposes of this invention, a probe comprising a sharp core and coatings on this core has been developed. The coating exhibits oleophobic and hydrophobic properties. Definitions of Figures Illustrating the Present Invention
The figures and their explanations which are used for better explanation of the probe for atomic force microscope developed with present invention.
Figure-1 It is a schematic cross-sectional illustration of a probe of atomic force microscope according to the present invention.
Figure-2 It is a schematic cross-sectional illustration of a probe of atomic force microscope according to the present invention.
Definitions of the Elements of Present Invention
In order to better illustrate the probe for atomic force microscope developed with present invention, the parts and portions included in the figures are numbered and the counterpart of each number is given below.
1. Probe
2. Lever
3. Core
4. Coating
5. Second coating
Detailed Description of the Present Invention
The probe for atomic force microscope (1) of present invention, which enables biological samples to be inspected without being damaged or adhered, basically comprises, a core (3) whose base is placed on the surface of the atomic force microscope lever (2) close to the free end of the lever (2) having a shape with a vertex such as a cone or pyramid; and a coating (4) which at least partially covers the the core (3) and forms a convex curved surface around the vertex of the core.
The coating (4) has a thickness between 5 and 1000 nm. With the coating (4) a wider contact surface between the sample surface and the probe (1) is ensured and thus damaging of specimen surface is avoided. The coating (4) is composed of at least one material exhibiting both oleophobic and hydrophobic properties or coating (4) is composed of a micture of at least one material exhibiting oleophobic character and at least one material exhibiting hydrophobic character. Thus, during the examination of the biologic sample, the adhesion between surface of the biologic sample and probe (1) is avoided. With the utilization of the probe (1), measurements can also be made on the surfaces of droplets of water or oil or solutions containing both water and oil. The coating (4) is preferably made of a fluoropolymer material.
The coating (4) is constituted with one of following methods of
• Plasma polymerization with octafluorocyclobutane (C4Fs) or a intrinsically conductive polymer,
• Physical vapor deposition with evaporation of polymer granules,
• Immersion into a liquid polymer or a liquid mixture of a polymer in suspension or colloid form,
• Atomic layer deposition or with other methods upon the core(3).
The lever (2) and the core (3) are prevalently composed of one piece. The lever (2) and the core (3) are made of silicon nitride.
In one embodiment of the present invention, a second coating (5) over the core (3) or over the core (3) and lever (2), and between the core (3) and the coating (4) is also present. This second coating (5) is a material which will enable the formation or strengthening of an electrical, magnetic or other type of interaction between the probe (1) and the surface to be examined.
By preserving the sharpness of the vertex of the core (3) in the coating (4), interactions between the core (3) and the sample surface can be maintained without loss of resolution.

Claims

1. A probe (1) which enables biological samples to be inspected without being damaged or adhered, and comprising a core (3) whose base is placed on the surface of the atomic force microscope lever (2) close to the free end of the lever (2), having a shape with a vertex like a cone or pyramid; characterized with a coating (4) which at least partially covers the the core (3) and forms a convex curved surface around the vertex of the core.
2. A probe (1) as in claim 1, characterized by a coating (4) having a thickness between 5 and 1000 nm.
3. A probe (1) as in claim 1, characterized by a coating (4) consisting of at least one material exhibiting both oleophobic and hydrophobic characteristics or coating (4) consisting of a mixture of at least one material exhibiting hydrophobic property with at least one material exhibiting oleophobic property.
4. A probe (1) as in claim 3, characterized by a fluoropolymer coating (4).
5. A probe (1) as in claim 4, characterized by a coating (4) formed by plasma polymerization with octafluorocyclobutane (C4Fs) or a intrinsically conductive polymer.
6. A probe (1) according to claim 4, characterized by a coating (4) formed by physical vapor deposition with evaporation of the polymer granules.
7. A probe (1) as in Claim 4 characterized by a coating (4) formed by immersion into a liquid polymer or a liquid mixture of a polymer in suspension or colloid form.
8. A probe (1) as in Claim 4, characterized by a coating (4) formed by atomic layer deposition.
PCT/TR2017/050153 2016-04-20 2017-04-20 Probe for atomic force microscope WO2017184098A2 (en)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
TR201605127 2016-04-20
TR2016/05127 2016-04-20

Publications (2)

Publication Number Publication Date
WO2017184098A2 true WO2017184098A2 (en) 2017-10-26
WO2017184098A3 WO2017184098A3 (en) 2017-12-21

Family

ID=59914506

Family Applications (1)

Application Number Title Priority Date Filing Date
PCT/TR2017/050153 WO2017184098A2 (en) 2016-04-20 2017-04-20 Probe for atomic force microscope

Country Status (1)

Country Link
WO (1) WO2017184098A2 (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2020179773A1 (en) * 2019-03-05 2020-09-10 昭和電工株式会社 Probe production method and surface observation method

Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US20130014295A1 (en) 2011-07-05 2013-01-10 Nazumi Alice Yamada Method for positioning an atomic force microscopy tip in a cell

Family Cites Families (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH06264217A (en) * 1993-03-15 1994-09-20 Canon Inc Probe, scanning type probe microscope and information processing device using the probe
JPH08262036A (en) * 1995-03-20 1996-10-11 Nikon Corp Water-repellent microprobe

Patent Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US20130014295A1 (en) 2011-07-05 2013-01-10 Nazumi Alice Yamada Method for positioning an atomic force microscopy tip in a cell

Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2020179773A1 (en) * 2019-03-05 2020-09-10 昭和電工株式会社 Probe production method and surface observation method
CN113454466A (en) * 2019-03-05 2021-09-28 昭和电工株式会社 Method for manufacturing probe and method for observing surface
JPWO2020179773A1 (en) * 2019-03-05 2021-11-25 昭和電工株式会社 Manufacturing method of probe, surface observation method
US20220050125A1 (en) * 2019-03-05 2022-02-17 Showa Denko K.K. Probe production method and surface observation method

Also Published As

Publication number Publication date
WO2017184098A3 (en) 2017-12-21

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