WO2017168608A1 - Contactless voltage measurement device and contactless voltage measurement method - Google Patents
Contactless voltage measurement device and contactless voltage measurement method Download PDFInfo
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- WO2017168608A1 WO2017168608A1 PCT/JP2016/060315 JP2016060315W WO2017168608A1 WO 2017168608 A1 WO2017168608 A1 WO 2017168608A1 JP 2016060315 W JP2016060315 W JP 2016060315W WO 2017168608 A1 WO2017168608 A1 WO 2017168608A1
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R15/00—Details of measuring arrangements of the types provided for in groups G01R17/00 - G01R29/00, G01R33/00 - G01R33/26 or G01R35/00
- G01R15/04—Voltage dividers
- G01R15/06—Voltage dividers having reactive components, e.g. capacitive transformer
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R15/00—Details of measuring arrangements of the types provided for in groups G01R17/00 - G01R29/00, G01R33/00 - G01R33/26 or G01R35/00
- G01R15/14—Adaptations providing voltage or current isolation, e.g. for high-voltage or high-current networks
- G01R15/16—Adaptations providing voltage or current isolation, e.g. for high-voltage or high-current networks using capacitive devices
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R19/00—Arrangements for measuring currents or voltages or for indicating presence or sign thereof
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- the present invention relates to a technique for measuring a voltage in an insulation-coated cable or the like, and in particular, is effective when applied to a non-contact voltage measuring apparatus and a non-contact voltage measuring method for measuring a voltage in a non-contact manner with respect to a conductor in the cable.
- Non-Patent Document 1 describes a surface potential sensor using an electrostatic induction phenomenon as a technique for measuring a voltage / potential without contact with an object.
- the electrostatic field intensity from the charged object is periodically changed by the vibrating electrode.
- the induced charge generated in the detection electrode is periodically changed, and the displacement current flowing from the detection electrode to the ground electrode is converted into an AC voltage signal to obtain the charged potential of the charged object.
- Non-Patent Document 2 describes a vibration capacity type surface potential meter.
- the capacitance generated between the sensor electrode in the probe and the surface to be measured is changed by a tuning fork in the probe to induce a signal in which the surface potential is AC-modulated in the sensor electrode. Then, this is input to an integral type high voltage generator to generate a high potential and fed back to the probe. It is described that the error of the measured value due to the distance between the probe and the measured surface is reduced by raising the potential of the probe body to the same potential as the measured surface and canceling the capacitance.
- Patent Document 1 describes a non-contact voltage measuring device that measures a voltage in an insulation-coated cable or the like in a non-contact manner with respect to a conductor in the cable.
- the voltage to be measured is derived based on the voltage detected at the detection point set on the electric circuit that obtains the voltage induced in the probe by the coupling capacitance between the probe and the conductor.
- the potential at the detection point and the electric potential at the electric field shield are made equal while maintaining a state in which no current flows from the detection point to the electric field shield.
- the leakage current does not flow through the parasitic capacitance generated between the detection point and the electric field shield, so that the parasitic capacitance can be ignored and the voltage at the detection point can be detected with high accuracy.
- Non-Patent Document 2 it is necessary to adjust the potential of the probe itself to the level of the measurement target. Therefore, depending on the object to be measured, a high potential must be generated on the probe and measurement device side, which causes a problem that the circuit load increases.
- a non-contact voltage measuring apparatus is a non-contact voltage measuring apparatus that measures a voltage of a measurement object made of an insulating-coated conductor in a non-contact manner from above the insulating coating, Based on the first probe and the second probe to be mounted on the measurement object, and the first measurement voltage and the second measurement voltage measured by the first probe and the second probe, And a measurement unit that obtains and outputs a voltage.
- the first probe and the second probe are formed with a first capacitor and a second capacitor having different capacitance values, respectively, and the measurement unit is configured to transmit the first probe and the second probe.
- a voltage evaluation unit that evaluates the first measurement voltage and the second measurement voltage measured by the probe; the first measurement voltage and the second measurement voltage that are evaluated by the voltage evaluation unit; And an arithmetic unit that calculates the voltage of the measurement target based on the first capacitance and the capacitance value of the second capacitance.
- the representative embodiment of the present invention it is possible to measure the voltage in a non-contact manner without depending on the condition of the measurement target. Further, not only the AC voltage but also the DC voltage can be measured with high accuracy. Further, the voltage on the measuring device side can be reduced.
- FIG. 1 is a diagram showing an outline of a configuration example of a non-contact voltage measuring apparatus according to Embodiment 1 of the present invention.
- the non-contact voltage measuring device 1 includes a probe pair 10 and a measuring unit 20, for example.
- the probe pair 10 is a member including, for example, a plurality of probes 11 (indicated by two probes A (11a) and B (11b) in the example of FIG. 1) connected to the measurement unit 20 with cables. .
- the user mounts the probe pair 10 on a cable to be measured and measures the voltage.
- “mounting” means attaching the measurement surface of the probe pair 10 so as to be in contact with the measurement target, such as placing the probe pair 10 on the measurement target, pinching the measurement target, or winding the measurement target.
- each probe 11 is previously formed with a capacitance having a different value by an electrode and a dielectric (not shown).
- a coupling capacitance is formed between each probe 11 and the conductor to be measured, and the voltage of the measuring object is measured by the capacitive coupling method.
- it is necessary to keep the relative positional relationship of the probe A (11a) and the probe B (11b) with respect to the measurement object constant when the probe pair 10 is mounted on the measurement object.
- each probe 11 is fixed to a member of the probe pair 10 and integrated as the probe pair 10. That is, the positions of the probe A (11a) and the probe B (11b) are fixed with respect to the probe pair 10, and the relative positions are also fixed between them. Thereby, the relative positional relationship of the probe A (11a) and the probe B (11b) with respect to the measurement object, that is, the measurement conditions can be maintained constant. And it is possible to measure the voltage by switching between the probe A (11a) and the probe B (11b) in one measurement under the same measurement conditions. Further, the measurer does not need to attach the probe A (11a) and the probe B (11b) individually to the measurement object, and can attach the probe A (11a) and the probe B (11b) as a whole with a single operation on the probe pair 10.
- the shape and structure of the probe pair 10 are not particularly limited.
- it may have a shape that the measurer presses against the measuring device, or may have a shape such as a clip or a clothespin that sandwiches and fixes a measurement object such as a cable. .
- the measurement unit 20 is a portable device configured by, for example, a CPU (Central Processing Unit) or an integrated circuit, and obtains and outputs a voltage to be measured based on the content measured by the probe pair 10. It is not necessary for all the components to be integrally formed, and a part of the components may be configured by another device or an information processing apparatus, and these may be linked.
- the measurement unit 20 includes, for example, a reference capacitor 21 (indicated by two reference capacitors A (21a) and B (21b) in the example of FIG. 1), a voltage evaluation unit 22, a calculation unit 23, a display unit 24, and the like. It has each part.
- Each reference capacity 21 is a capacity of a different value, and is a reference capacity used for calculating the voltage to be measured based on the voltage measured by the corresponding probe 11, as will be described later. Further, the voltage measured by the probe 11 is divided by the pair of the coupling capacitance formed between the probe 11 and the measurement target, thereby reducing the voltage on the measurement unit 20 side.
- the voltage evaluation unit 22 evaluates the voltage divided by the pair of the reference capacitance 21 and the coupling capacitance formed between each probe 11 and the measurement target for the voltage to be measured. Based on the evaluation result of the voltage evaluation unit 22 and the known capacity in the non-contact voltage measuring device 1, that is, the capacity formed in each probe 11 and the value of each reference capacity 21, the calculation unit 23 is a measurement target. Is calculated and output.
- the display unit 24 includes a display device such as a liquid crystal display (not shown), for example, and lays out the result output from the calculation unit 23 for display and displays the result on the display device.
- FIG. 2 is a diagram illustrating a method for measuring a voltage by the capacitive coupling method in the present embodiment.
- an example in which an insulation-coated cable is used as a measurement object 2 is schematically shown by a cross-sectional shape of the cable.
- a black portion of the cable is an insulation coating, and shows a state where the probe pair 10 is mounted on the insulation coating of the cable.
- a coupling capacitance C X whose value is unknown is formed in the portion of the insulation coating between the probe 11 and the conductor of the measuring object 2.
- the reference capacitance A (21a) and the reference capacitor B (21b), respectively, the value is C A and C B are known, connected to the capacitor in series with C Y and C Z formed in each probe 11 It has been shown.
- each probe 11 and the measurement target 2 are connected. with estimates the C X formed, it calculates the voltage V X of the measurement object 2.
- V 1A and V 2A are voltages divided by a capacitance pair of C XY that is the coupling capacitance on the probe A (11a) side and C A that is the reference capacitance A (21a) for V X to be measured.
- V 2B as shown
- V 2A and V 2B which are partial pressures to be evaluated by the measurement unit 20 are left
- the relationship (1) becomes (V X ⁇ V 2A ):
- V 2A C A : C XY
- the relationship (2) can be expressed as (V X ⁇ V 2B ):
- V 2B C B : C XZ .
- C XY is expressed by the following equation.
- V X is expressed by the following equation.
- Equation 2 C XY in Equation 2 is expressed by the following equation.
- C X can be obtained by the following series of equations.
- V X can be obtained from the following formulas from Formula 3 and Formula 5.
- the computing unit 23 can calculate the value of V X (and C X according to Equation 5) using Equation 6.
- the reference capacitance A (21a) and the reference capacitor B (21b), respectively are assumed to have a capacitance different values C A and C B, above by the same volume It is also possible to simplify the calculation.
- the capacitive coupling is performed using the probe pair 11 including the probes 11 in which capacitances having different conditions are formed in advance.
- the voltage is measured in a contactless manner.
- the voltages (V 2A and V 2B in the example of FIG. 2) divided by the two capacity pairs (C XY and C A and C XZ and C B in the example of FIG. 2) are evaluated and based on this calculating the voltage V X of the measured Te.
- the voltage reduction on the measurement unit 20 side can be realized by the capacity division.
- the capacity division using the reference capacitor 21 is not necessarily performed.
- the voltage V X to be measured can be calculated in a non-contact manner.
- the voltage V X to be measured is an alternating current (AC) voltage can be measured without any problem.
- the voltage to be measured is a direct current (DC) voltage
- the charge escapes from the coupling capacitance, and it is difficult to measure the correct value in a state where “burning” occurs.
- the non-contact voltage measuring apparatus 1 refreshes the vibrating unit by changing (vibrating) the capacitance value of the reference capacitance on the measuring unit 20 side.
- FIG. 3 is a diagram showing an outline of a configuration example of the non-contact voltage measuring apparatus according to the second embodiment of the present invention. Since the configuration of the non-contact voltage measuring apparatus 1 is basically the same as that shown in FIG. 2 of the first embodiment, only the differences will be described, and the others will be omitted.
- the two reference capacitors 21 of the measurement unit 20 are represented by two of the variable capacitors 25 (in the example of FIG. 3, variable capacitors A (25a) and B (25b)). Replaced). Moreover, it has the vibration control part 26 which vibrates the capacitance value of each variable capacity
- FIG. 3 is a diagram showing an outline of a configuration example of the non-contact voltage measuring apparatus according to the second embodiment of the present invention. Since the configuration of the non-contact voltage measuring apparatus 1 is basically the same as that shown in FIG. 2 of the first embodiment, only the differences will be described, and the others will be omitted.
- the two reference capacitors 21 of the measurement unit 20 are represented by two of the variable capacitor
- variable capacitor 25 and the vibration control unit 26 that is, a method for evaluating the DC voltage by vibrating the capacitance value of the variable capacitor 25
- a known technique can be used as appropriate. Specifically, for example, pp. Of “Basics of Electrical and Electronic Measurement-From Error to Uncertainty” (Hiroo Yamazaki, The Institute of Electrical Engineers of Japan, 2005/03, hereinafter referred to as “references”). Means for measuring voltage with high impedance, such as described in 114, can be used.
- FIG. 4 is a diagram showing an outline of an example of means for measuring voltage with high impedance.
- 4A shows an example of a basic form
- FIG. 4B shows an example of a circuit when incorporated in feedback control.
- the measurement potential portion is isolated by a capacitor to maintain a high impedance.
- the capacitance is vibrated by the vibrator, and an oscillating voltage having an amplitude proportional to the voltage to be measured (electric field strength) is taken out via a capacitor (AC coupling).
- AC coupling a capacitor
- a DC voltage proportional to the voltage to be measured (electric field strength) is taken out.
- FIG. 5 is a diagram showing an outline of an example of means for realizing the vibration capacity in a solid state.
- FIG. 5A shows a basic form
- FIG. 5B shows an example of a circuit when incorporated in feedback control.
- the vibration voltage is generated by replacing the mechanical vibration capacity in the above-described example of FIG. 4 with a solid variable capacitance diode. Considering that the diode is non-linear except near zero voltage and that the capacitance itself changes with an electric field, it is desirable to incorporate the feedback control as shown in FIG.
- V 2A DC voltage
- V 2B DC voltage
- the reference capacitor on the measuring unit 20 side is configured as the variable capacitor 25, and the circuit is vibrated physically or electrically. Let me refresh. As a result, it is possible to eliminate the influence of the leakage current and evaluate the voltage (V 2A , V 2B ) divided by the capacity pair with high impedance, and not only the alternating current (AC) voltage but also the direct current (DC) voltage. Can also be measured with high accuracy.
- the reference potential when evaluating the voltages (V 2A , V 2B ) divided by the capacity pair is the ground or the like according to the measurement object 2.
- the voltage difference between two arbitrary points in the measuring object 2 is measured in the actual measurement.
- FIG. 6 is a diagram showing an outline of a configuration example of the non-contact voltage measuring apparatus according to the third embodiment of the present invention.
- this basic configuration two sets (two sets) of the probe pair 10 and the measurement unit 20 shown in FIG. 2 of the first embodiment are provided in parallel, and these reference potentials are shared. Is.
- Capacitances (C Y , C Z , and C ′ Y , C ′ Z ) formed in the probe pair 10 and the probe pair 10 ′ have different capacitance values depending on dielectrics having different thicknesses (or dielectric constants). It is formed to have.
- the capacitors (C A , C B , and C ′ A , C ′ B ) formed in the reference capacitor 21 and the reference capacitor 21 ′ are also formed to have different capacitance values.
- the difference calculation unit 27 calculates the difference between the obtained V X and V ′ X.
- the display unit 24 displays the value calculated by the difference calculation unit 27 as a final display value.
- FIG. 6 two sets of the probe pair 10 and the measurement unit 20 shown in FIG. 2 of the above-described first embodiment are provided, but FIG. 3 of the second embodiment.
- the present invention can be applied to the configuration of the probe pair 10 and the measurement unit 20 shown in FIG.
- the non-contact voltage measuring apparatus 1 which is Embodiment 3 of this invention, it is set as the structure which measures a voltage between two arbitrary points of the measuring object 2, and uses the difference. Thereby, it is not necessary to make the reference potential depend on the measurement object 2, and it is possible to efficiently perform non-contact voltage measurement on a wider range of measurement objects 2.
- the present invention is not limited to the above-described embodiments, and various modifications can be made without departing from the scope of the invention. Needless to say.
- the above-described embodiment has been described in detail for easy understanding of the present invention, and is not necessarily limited to the one having all the configurations described.
- a part of the configuration of one embodiment can be replaced with the configuration of another embodiment, and the configuration of another embodiment can be added to the configuration of one embodiment. .
- the present invention can be used for a non-contact voltage measuring device and a non-contact voltage measuring method for measuring a voltage in a non-contact manner with respect to a conductor in a cable.
- Non-contact voltage measuring device 10, 10 '... probe pair, 11a, 11'a ... probe A, 11b, 11'b ... probe B, 20 ... Measurement unit, 21a, 21'a ... Reference capacitance A, 21b, 21'b ... Reference capacitance B, 22, 22 '... Voltage evaluation unit, 23, 23' ... Calculation unit, 24 ... Display unit, 25a ... Variable Capacity A, 25b ... Variable capacity B, 26 ... Vibration control section, 27 ... Difference calculation section
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Abstract
Provided is a contactless voltage measurement device (1) for contactlessly measuring the voltage of a measurement object (2), wherein: the contactless voltage measurement device (1) has a probe A (11a) and a probe B (11b) mounted on the measurement object (2), and a measurement unit (20) for determining the voltage of the measurement object (2) and outputting the determined voltage on the basis of a first measured voltage and a second measured voltage measured by the probe A (11a) and the probe B (11b); a CY and a CZ having different capacitance values are respectively formed in the probe A (11a) and the probe B (11b); and the measurement unit (20) has a voltage evaluation unit (22) for evaluating the first measured voltage and the second measured voltage measured by the probe A (11a) and the probe B (11b), and a computation unit (23) for calculating the voltage of the measurement object (2) on the basis of the first measured voltage and the second measured voltage evaluated by the voltage evaluation unit (22) and the capacitance values of the CY and the CZ.
Description
本発明は、絶縁被覆されたケーブル等における電圧を測定する技術に関し、特に、ケーブル内の導体に対して非接触で電圧を測定する非接触電圧測定装置および非接触電圧測定方法に適用して有効な技術に関するものである。
The present invention relates to a technique for measuring a voltage in an insulation-coated cable or the like, and in particular, is effective when applied to a non-contact voltage measuring apparatus and a non-contact voltage measuring method for measuring a voltage in a non-contact manner with respect to a conductor in the cable. Technology.
対象物に対して非接触で電圧・電位を測定する技術として、例えば、非特許文献1には、静電誘導現象を利用した表面電位センサが記載されている。ここでは、帯電物体からの静電界強度を振動電極で周期的に変化させる。これにより、検出電極に発生する誘導電荷を周期的に変化させ、検出電極から接地極に流れる変位電流を交流電圧信号に変換して帯電物体の帯電電位を求める旨が記載されている。
For example, Non-Patent Document 1 describes a surface potential sensor using an electrostatic induction phenomenon as a technique for measuring a voltage / potential without contact with an object. Here, the electrostatic field intensity from the charged object is periodically changed by the vibrating electrode. Thus, it is described that the induced charge generated in the detection electrode is periodically changed, and the displacement current flowing from the detection electrode to the ground electrode is converted into an AC voltage signal to obtain the charged potential of the charged object.
また、非特許文献2には、振動容量型の表面電位計が記載されている。ここでは、プローブ内のセンサ電極と被測定面間に生じた静電容量を、プローブ内の音叉により変化させることで、センサ電極に表面電位を交流変調した信号を誘起させる。そして、これを積分型高圧発生器に入力して高電位を発生させ、プローブにフィードバックする。これによりプローブボディの電位を上昇させて被測定面と同電位にして、静電容量を打ち消すことで、プローブと被測定面間の距離による測定値の誤差を低減する旨が記載されている。
Further, Non-Patent Document 2 describes a vibration capacity type surface potential meter. Here, the capacitance generated between the sensor electrode in the probe and the surface to be measured is changed by a tuning fork in the probe to induce a signal in which the surface potential is AC-modulated in the sensor electrode. Then, this is input to an integral type high voltage generator to generate a high potential and fed back to the probe. It is described that the error of the measured value due to the distance between the probe and the measured surface is reduced by raising the potential of the probe body to the same potential as the measured surface and canceling the capacitance.
また、国際公開第2015/083618号(特許文献1)には、絶縁被覆されたケーブル等における電圧を、ケーブル内の導体に対して非接触で測定する非接触電圧測定装置が記載されている。ここでは、プローブと導体との間の結合容量によってプローブに誘起される電圧を取得する電気回路上に設定された検出点で検出された電圧に基づいて測定対象の電圧を導出する。このとき、電気回路の少なくとも一部を電界シールドで遮蔽することにより、検出点から電界シールドに電流が流れない状態を維持したまま、検出点の電位と電界シールドの電位を等しくする。これにより、検出点と電界シールドとの間に発生する寄生容量を漏れ電流が流れることがなくなるため、寄生容量を無視することができ、検出点の電圧を高精度で検出することができる旨が記載されている。
In addition, International Publication No. 2015/083618 (Patent Document 1) describes a non-contact voltage measuring device that measures a voltage in an insulation-coated cable or the like in a non-contact manner with respect to a conductor in the cable. Here, the voltage to be measured is derived based on the voltage detected at the detection point set on the electric circuit that obtains the voltage induced in the probe by the coupling capacitance between the probe and the conductor. At this time, by shielding at least a part of the electric circuit with the electric field shield, the potential at the detection point and the electric potential at the electric field shield are made equal while maintaining a state in which no current flows from the detection point to the electric field shield. As a result, the leakage current does not flow through the parasitic capacitance generated between the detection point and the electric field shield, so that the parasitic capacitance can be ignored and the voltage at the detection point can be detected with high accuracy. Are listed.
例えば、屋外なども含む様々な場所に敷設されたケーブル等における電圧を、交流電圧だけでなく直流電圧も含めて現場で容易かつ高精度に測定したいというニーズがある。
For example, there is a need to easily and accurately measure the voltage on cables laid in various places including outdoors, including the DC voltage as well as the AC voltage.
これを実現するためには、測定対象のケーブルの径や絶縁被覆の状態などの条件に依存しない手法が必要である。すなわち、プローブを用いて測定する場合でも、プローブとケーブル内の導体との間の距離や、その間の結合容量などに依存せず、これらの条件の相違を制御できる仕組みが必要である。この点、例えば、上述の非特許文献1に記載された技術では、測定距離が定められており、測定距離に依存して出力される電位が変化することから、適用することはできない。
To achieve this, a technique that does not depend on conditions such as the diameter of the cable to be measured and the state of the insulation coating is necessary. That is, even when measurement is performed using a probe, there is a need for a mechanism that can control the difference between these conditions without depending on the distance between the probe and the conductor in the cable, the coupling capacitance between them, and the like. In this regard, for example, in the technique described in Non-Patent Document 1 described above, the measurement distance is determined, and the output potential varies depending on the measurement distance, and therefore cannot be applied.
一方、例えば、特許文献1に記載された技術では、プローブと導体との間の結合容量を利用した容量結合方式をとることで、ケーブル等の条件に依存しない測定が可能である。
On the other hand, for example, in the technique described in Patent Document 1, measurement that does not depend on conditions of a cable or the like is possible by adopting a capacitive coupling method using a coupling capacitance between a probe and a conductor.
しかし、例えば特許文献1に記載された技術では、交流(AC)電圧のみが測定対象である。プローブと導体との間の結合容量を利用した容量結合方式を用いて直流(DC)電圧を測定しようとした場合、リーク電流によって結合容量から電荷が抜けてしまい、「焼き付け」を起こしたような状態となって正しい値を測定することが困難である。
However, in the technique described in Patent Document 1, for example, only an alternating current (AC) voltage is a measurement target. When a direct current (DC) voltage is measured using a capacitive coupling method that utilizes the coupling capacitance between the probe and the conductor, the leakage current causes the charge to escape from the coupling capacitance, causing “burning”. It is difficult to measure the correct value in the state.
また、例えば非特許文献2に記載された技術では、プローブ自身の電位を測定対象のレベルに合わせる必要がある。したがって、測定対象によってはプローブおよび測定装置側で高電位を生成しなければならず、回路負担が高くなるという課題を有する。
For example, in the technique described in Non-Patent Document 2, it is necessary to adjust the potential of the probe itself to the level of the measurement target. Therefore, depending on the object to be measured, a high potential must be generated on the probe and measurement device side, which causes a problem that the circuit load increases.
そこで本発明の目的は、測定対象の条件に依存せずに非接触で電圧を測定することができる非接触電圧測定装置および非接触電圧測定方法を提供することにある。また、本発明の他の目的は、AC電圧だけでなくDC電圧についても高精度で測定することができる非接触電圧測定装置および非接触電圧測定方法を提供することにある。また、本発明の他の目的は、測定装置側の低電圧化を可能とする非接触電圧測定装置および非接触電圧測定方法を提供することにある。
Therefore, an object of the present invention is to provide a non-contact voltage measuring device and a non-contact voltage measuring method capable of measuring a voltage in a non-contact manner without depending on conditions of a measurement object. Another object of the present invention is to provide a non-contact voltage measuring apparatus and a non-contact voltage measuring method capable of measuring not only an AC voltage but also a DC voltage with high accuracy. Another object of the present invention is to provide a non-contact voltage measuring device and a non-contact voltage measuring method that can reduce the voltage on the measuring device side.
本発明の前記ならびにその他の目的と新規な特徴は、本明細書の記述および添付図面から明らかになるであろう。
The above and other objects and novel features of the present invention will be apparent from the description of this specification and the accompanying drawings.
本願において開示される発明のうち、代表的なものの概要を簡単に説明すれば、以下のとおりである。
Of the inventions disclosed in this application, the outline of typical ones will be briefly described as follows.
本発明の代表的な実施の形態による非接触電圧測定装置は、絶縁被覆された導体からなる測定対象の電圧を、絶縁被覆の上から非接触で測定する非接触電圧測定装置であって、前記測定対象に装着する第1のプローブおよび第2のプローブと、前記第1のプローブおよび前記第2のプローブにおいて測定された第1の測定電圧および第2の測定電圧に基づいて、前記測定対象の電圧を求めて出力する測定部と、を有するものである。
A non-contact voltage measuring apparatus according to a typical embodiment of the present invention is a non-contact voltage measuring apparatus that measures a voltage of a measurement object made of an insulating-coated conductor in a non-contact manner from above the insulating coating, Based on the first probe and the second probe to be mounted on the measurement object, and the first measurement voltage and the second measurement voltage measured by the first probe and the second probe, And a measurement unit that obtains and outputs a voltage.
前記第1のプローブおよび前記第2のプローブには、それぞれ、容量値が異なる第1の容量および第2の容量が形成されており、前記測定部は、前記第1のプローブおよび前記第2のプローブにおいて測定された前記第1の測定電圧および前記第2の測定電圧を評価する電圧評価部と、前記電圧評価部により評価された前記第1の測定電圧および前記第2の測定電圧と、前記第1の容量および前記第2の容量の容量値と、に基づいて、前記測定対象の電圧を算出する演算部と、を有する。
The first probe and the second probe are formed with a first capacitor and a second capacitor having different capacitance values, respectively, and the measurement unit is configured to transmit the first probe and the second probe. A voltage evaluation unit that evaluates the first measurement voltage and the second measurement voltage measured by the probe; the first measurement voltage and the second measurement voltage that are evaluated by the voltage evaluation unit; And an arithmetic unit that calculates the voltage of the measurement target based on the first capacitance and the capacitance value of the second capacitance.
本願において開示される発明のうち、代表的なものによって得られる効果を簡単に説明すれば以下のとおりである。
Among the inventions disclosed in the present application, effects obtained by typical ones will be briefly described as follows.
すなわち、本発明の代表的な実施の形態によれば、測定対象の条件に依存せずに非接触で電圧を測定することが可能となる。また、AC電圧だけでなくDC電圧についても高精度で測定することが可能となる。また、測定装置側の低電圧化が可能となる。
That is, according to the representative embodiment of the present invention, it is possible to measure the voltage in a non-contact manner without depending on the condition of the measurement target. Further, not only the AC voltage but also the DC voltage can be measured with high accuracy. Further, the voltage on the measuring device side can be reduced.
以下、本発明の実施の形態を図面に基づいて詳細に説明する。なお、実施の形態を説明するための全図において、同一部には原則として同一の符号を付し、その繰り返しの説明は省略する。一方で、ある図において符号を付して説明した部位について、他の図の説明の際に再度の図示はしないが同一の符号を付して言及する場合がある。
Hereinafter, embodiments of the present invention will be described in detail with reference to the drawings. Note that components having the same function are denoted by the same reference symbols throughout the drawings for describing the embodiment, and the repetitive description thereof will be omitted. On the other hand, parts described with reference numerals in some drawings may be referred to with the same reference numerals although not illustrated again in the description of other drawings.
(実施の形態1)
図1は、本発明の実施の形態1である非接触電圧測定装置の構成例について概要を示した図である。非接触電圧測定装置1は、例えば、プローブ対10と測定部20からなる。プローブ対10は、例えば、測定部20にケーブルで接続された複数のプローブ11(図1の例では、プローブA(11a)、B(11b)の2つにより示される)を備えた部材である。ユーザは、このプローブ対10を測定対象のケーブル等に装着して電圧を測定する。なお、「装着」とは、プローブ対10を測定対象に当てたり、測定対象を挟んだり、測定対象に巻きつけたり等、プローブ対10の測定面を測定対象に接するように取り付けることをいう。 (Embodiment 1)
FIG. 1 is a diagram showing an outline of a configuration example of a non-contact voltage measuring apparatus according toEmbodiment 1 of the present invention. The non-contact voltage measuring device 1 includes a probe pair 10 and a measuring unit 20, for example. The probe pair 10 is a member including, for example, a plurality of probes 11 (indicated by two probes A (11a) and B (11b) in the example of FIG. 1) connected to the measurement unit 20 with cables. . The user mounts the probe pair 10 on a cable to be measured and measures the voltage. Note that “mounting” means attaching the measurement surface of the probe pair 10 so as to be in contact with the measurement target, such as placing the probe pair 10 on the measurement target, pinching the measurement target, or winding the measurement target.
図1は、本発明の実施の形態1である非接触電圧測定装置の構成例について概要を示した図である。非接触電圧測定装置1は、例えば、プローブ対10と測定部20からなる。プローブ対10は、例えば、測定部20にケーブルで接続された複数のプローブ11(図1の例では、プローブA(11a)、B(11b)の2つにより示される)を備えた部材である。ユーザは、このプローブ対10を測定対象のケーブル等に装着して電圧を測定する。なお、「装着」とは、プローブ対10を測定対象に当てたり、測定対象を挟んだり、測定対象に巻きつけたり等、プローブ対10の測定面を測定対象に接するように取り付けることをいう。 (Embodiment 1)
FIG. 1 is a diagram showing an outline of a configuration example of a non-contact voltage measuring apparatus according to
各プローブ11には、後述するように、図示しない電極および誘電体により、それぞれ異なる値の容量が予め形成されている。これを測定対象に装着することで、後述するように、各プローブ11と測定対象の導体との間に結合容量を形成し、容量結合方式によって測定対象の電圧を測定する。これを実現するためには、測定対象にプローブ対10を装着した際のプローブA(11a)およびプローブB(11b)の測定対象に対する相対的な位置関係を一定に維持することが必要である。
As will be described later, each probe 11 is previously formed with a capacitance having a different value by an electrode and a dielectric (not shown). By attaching this to the measuring object, as will be described later, a coupling capacitance is formed between each probe 11 and the conductor to be measured, and the voltage of the measuring object is measured by the capacitive coupling method. In order to realize this, it is necessary to keep the relative positional relationship of the probe A (11a) and the probe B (11b) with respect to the measurement object constant when the probe pair 10 is mounted on the measurement object.
本実施の形態では、各プローブ11はプローブ対10の部材に固定され、プローブ対10として一体化されているものとする。すなわち、プローブA(11a)およびプローブB(11b)は、それぞれ、プローブ対10に対して位置が固定されているとともに、これらの間でも相対的な位置が固定されているものとする。これにより、測定対象に対するプローブA(11a)およびプローブB(11b)の相対的な位置関係、すなわち測定条件を一定に維持することができる。そして、同一の測定条件下での1回の測定で、プローブA(11a)およびプローブB(11b)を切り替えることなく双方で電圧を測定することができる。また、測定者は、プローブA(11a)およびプローブB(11b)を個別に測定対象に装着する必要がなく、プローブ対10に対する1回の操作で全体を装着することができる。
In this embodiment, it is assumed that each probe 11 is fixed to a member of the probe pair 10 and integrated as the probe pair 10. That is, the positions of the probe A (11a) and the probe B (11b) are fixed with respect to the probe pair 10, and the relative positions are also fixed between them. Thereby, the relative positional relationship of the probe A (11a) and the probe B (11b) with respect to the measurement object, that is, the measurement conditions can be maintained constant. And it is possible to measure the voltage by switching between the probe A (11a) and the probe B (11b) in one measurement under the same measurement conditions. Further, the measurer does not need to attach the probe A (11a) and the probe B (11b) individually to the measurement object, and can attach the probe A (11a) and the probe B (11b) as a whole with a single operation on the probe pair 10.
上記の条件を満たす限り、プローブ対10の形状や構造は特に限定されない。例えば、測定装置に対して測定者が押し当てる形状のものであってもよいし、クリップや洗濯バサミのような形状で、ケーブル等の測定対象を挟み込んで固定する構成のものであってもよい。
As long as the above conditions are satisfied, the shape and structure of the probe pair 10 are not particularly limited. For example, it may have a shape that the measurer presses against the measuring device, or may have a shape such as a clip or a clothespin that sandwiches and fixes a measurement object such as a cable. .
測定部20は、例えば、CPU(Central Processing Unit)や集積回路等により構成された可搬型の機器であり、プローブ対10により測定された内容に基づいて、測定対象の電圧を求めて出力する。全ての構成要素が一体として形成されている必要はなく、一部が別の機器や情報処理装置などにより構成され、これらが連携するものであってもよい。測定部20は、例えば、参照容量21(図1の例では、参照容量A(21a)、B(21b)の2つにより示される)、電圧評価部22、演算部23、および表示部24などの各部を有する。
The measurement unit 20 is a portable device configured by, for example, a CPU (Central Processing Unit) or an integrated circuit, and obtains and outputs a voltage to be measured based on the content measured by the probe pair 10. It is not necessary for all the components to be integrally formed, and a part of the components may be configured by another device or an information processing apparatus, and these may be linked. The measurement unit 20 includes, for example, a reference capacitor 21 (indicated by two reference capacitors A (21a) and B (21b) in the example of FIG. 1), a voltage evaluation unit 22, a calculation unit 23, a display unit 24, and the like. It has each part.
各参照容量21は、それぞれ異なる値の容量であり、後述するように、対応するプローブ11で測定された電圧に基づいて、測定対象の電圧を算出するために用いられる参照用の容量である。また、プローブ11と測定対象との間に形成される結合容量との対により、プローブ11により測定された電圧を分圧することで、測定部20側の低電圧化を図るものである。
Each reference capacity 21 is a capacity of a different value, and is a reference capacity used for calculating the voltage to be measured based on the voltage measured by the corresponding probe 11, as will be described later. Further, the voltage measured by the probe 11 is divided by the pair of the coupling capacitance formed between the probe 11 and the measurement target, thereby reducing the voltage on the measurement unit 20 side.
電圧評価部22は、測定対象の電圧につき、各プローブ11と測定対象との間に形成される結合容量と、参照容量21との対により分圧された分の電圧を評価する。演算部23は、電圧評価部22の評価結果と、非接触電圧測定装置1における既知の容量、すなわち、各プローブ11に形成されている容量、および各参照容量21の値に基づいて、測定対象の電圧を算出して出力する。表示部24は、例えば、図示しない液晶ディスプレイ等の表示デバイスを備え、演算部23から出力された結果を表示用にレイアウトして表示デバイスに表示する。
The voltage evaluation unit 22 evaluates the voltage divided by the pair of the reference capacitance 21 and the coupling capacitance formed between each probe 11 and the measurement target for the voltage to be measured. Based on the evaluation result of the voltage evaluation unit 22 and the known capacity in the non-contact voltage measuring device 1, that is, the capacity formed in each probe 11 and the value of each reference capacity 21, the calculation unit 23 is a measurement target. Is calculated and output. The display unit 24 includes a display device such as a liquid crystal display (not shown), for example, and lays out the result output from the calculation unit 23 for display and displays the result on the display device.
[電圧の算出]
図2は、本実施の形態における容量結合方式により電圧を測定する手法について説明した図である。図中では、絶縁被覆されたケーブルを測定対象2とした例を、ケーブルの断面形状により模式的に示している。ケーブルの黒塗りの部分は絶縁被覆であり、ケーブルの絶縁被覆の上からプローブ対10を装着した状態を示している。 [Calculation of voltage]
FIG. 2 is a diagram illustrating a method for measuring a voltage by the capacitive coupling method in the present embodiment. In the drawing, an example in which an insulation-coated cable is used as ameasurement object 2 is schematically shown by a cross-sectional shape of the cable. A black portion of the cable is an insulation coating, and shows a state where the probe pair 10 is mounted on the insulation coating of the cable.
図2は、本実施の形態における容量結合方式により電圧を測定する手法について説明した図である。図中では、絶縁被覆されたケーブルを測定対象2とした例を、ケーブルの断面形状により模式的に示している。ケーブルの黒塗りの部分は絶縁被覆であり、ケーブルの絶縁被覆の上からプローブ対10を装着した状態を示している。 [Calculation of voltage]
FIG. 2 is a diagram illustrating a method for measuring a voltage by the capacitive coupling method in the present embodiment. In the drawing, an example in which an insulation-coated cable is used as a
プローブ11と測定対象2の導体の間の絶縁被覆の部分には、値が不明である結合容量CXが形成されていることを示している。また、プローブA(11a)およびプローブB(11b)には、それぞれ、電極と厚さ(もしくは誘電率)が異なる誘電体により、値が既知であるCYおよびCZ(=βCY)の容量が形成されていることを示している。また、参照容量A(21a)および参照容量B(21b)は、それぞれ、値が既知であるCAおよびCBであり、各プローブ11に形成されたCYおよびCZの容量と直列に接続されていることを示している。
It is shown that a coupling capacitance C X whose value is unknown is formed in the portion of the insulation coating between the probe 11 and the conductor of the measuring object 2. Further, the probe A (11a) and the probe B (11b) have capacitances of C Y and C Z (= βC Y ) whose values are known due to dielectrics having different thicknesses (or dielectric constants) from the electrodes, respectively. Is formed. The reference capacitance A (21a) and the reference capacitor B (21b), respectively, the value is C A and C B are known, connected to the capacitor in series with C Y and C Z formed in each probe 11 It has been shown.
本実施の形態では、各プローブ11に形成されている異なる容量CY、CZ(および参照容量21であるCA、CB)を利用することで、各プローブ11と測定対象2との間に形成されるCXを推定するとともに、測定対象2の電圧VXを算出する。
In the present embodiment, by using the different capacities C Y and C Z (and the reference capacities 21 C A and C B ) formed in each probe 11, each probe 11 and the measurement target 2 are connected. with estimates the C X formed, it calculates the voltage V X of the measurement object 2.
直列に接続された状態となる容量CXとCYの合成容量をCXY、容量CXとCZの合成容量をCXZとすると、CXY、CXZは以下の式で表される。
When the combined capacitance of the capacitance C X and C Y that in a state of being connected in series C XY, the combined capacitance of the capacitance C X and C Z and C XZ, C XY, C XZ is expressed by the following equation.
まず、VX=V1A+V2A=V1B+V2Bであることから、測定部20が評価する方の分圧であるV2AおよびV2Bを残すと、関係(1)は、(VX-V2A):V2A=CA:CXYと表すことができ、関係(2)は、(VX-V2B):V2B=CB:CXZと表すことができる。この関係(1)から、CXYは以下の式で表される。
First, since V X = V 1A + V 2A = V 1B + V 2B , if V 2A and V 2B which are partial pressures to be evaluated by the measurement unit 20 are left, the relationship (1) becomes (V X − V 2A ): V 2A = C A : C XY, and the relationship (2) can be expressed as (V X −V 2B ): V 2B = C B : C XZ . From this relationship (1), C XY is expressed by the following equation.
なお、本実施の形態では、参照容量A(21a)および参照容量B(21b)は、それぞれ、異なる値の容量CAおよびCBを有するものとしているが、同一の容量とすることで上記の計算をより簡略化することも可能である。
In this embodiment, the reference capacitance A (21a) and the reference capacitor B (21b), respectively, but it is assumed to have a capacitance different values C A and C B, above by the same volume It is also possible to simplify the calculation.
以上に説明したように、本発明の実施の形態1である非接触電圧測定装置1によれば、予め異なる条件の容量が形成されている各プローブ11からなるプローブ対11を用いて、容量結合方式により非接触で電圧を測定する。そして、2つの容量対(図2の例ではCXYとCA、およびCXZとCB)により分圧された電圧(図2の例ではV2A、V2B)を評価し、これに基づいて測定対象の電圧VXを算出する。これにより、測定対象2の導体とプローブ11間の容量(CX)や距離などの条件に依存せずに、VXを高精度に測定することができる。また、容量分圧により測定部20側の低電圧化を実現することができる。
As described above, according to the non-contact voltage measuring apparatus 1 according to the first embodiment of the present invention, the capacitive coupling is performed using the probe pair 11 including the probes 11 in which capacitances having different conditions are formed in advance. The voltage is measured in a contactless manner. Then, the voltages (V 2A and V 2B in the example of FIG. 2) divided by the two capacity pairs (C XY and C A and C XZ and C B in the example of FIG. 2) are evaluated and based on this calculating the voltage V X of the measured Te. This makes it possible to measure V X with high accuracy without depending on conditions such as the capacitance (C X ) and distance between the conductor of the measuring object 2 and the probe 11. Moreover, the voltage reduction on the measurement unit 20 side can be realized by the capacity division.
なお、例えば、測定対象2の特性などにより、測定部20の低電圧化が要求されない場合には、参照容量21を用いた容量分圧は必ずしも行う必要はない。
Note that, for example, when the voltage of the measurement unit 20 is not required to be reduced due to the characteristics of the measurement object 2, the capacity division using the reference capacitor 21 is not necessarily performed.
(実施の形態2)
上述した実施の形態1の手法を用いることで、非接触で測定対象の電圧VXを算出することができる。ここで、従来技術と同様に、測定対象の電圧VXが交流(AC)電圧である場合は問題なく測定することができる。一方、測定対象の電圧が直流(DC)電圧である場合は、各容量対により分圧された電圧(図2の例ではV2A、V2B)を高インピーダンスで評価する必要がある。しかし、実際にはリーク電流の影響を受け、結合容量から電荷が抜けてしまい、「焼き付け」を起こしたような状態となって正しい値を測定することが困難である。 (Embodiment 2)
By using the method of the first embodiment described above, the voltage V X to be measured can be calculated in a non-contact manner. Here, similarly to the prior art, when the voltage V X to be measured is an alternating current (AC) voltage can be measured without any problem. On the other hand, when the voltage to be measured is a direct current (DC) voltage, it is necessary to evaluate the voltage divided by each capacity pair (V 2A and V 2B in the example of FIG. 2) with high impedance. However, in actuality, due to the influence of the leakage current, the charge escapes from the coupling capacitance, and it is difficult to measure the correct value in a state where “burning” occurs.
上述した実施の形態1の手法を用いることで、非接触で測定対象の電圧VXを算出することができる。ここで、従来技術と同様に、測定対象の電圧VXが交流(AC)電圧である場合は問題なく測定することができる。一方、測定対象の電圧が直流(DC)電圧である場合は、各容量対により分圧された電圧(図2の例ではV2A、V2B)を高インピーダンスで評価する必要がある。しかし、実際にはリーク電流の影響を受け、結合容量から電荷が抜けてしまい、「焼き付け」を起こしたような状態となって正しい値を測定することが困難である。 (Embodiment 2)
By using the method of the first embodiment described above, the voltage V X to be measured can be calculated in a non-contact manner. Here, similarly to the prior art, when the voltage V X to be measured is an alternating current (AC) voltage can be measured without any problem. On the other hand, when the voltage to be measured is a direct current (DC) voltage, it is necessary to evaluate the voltage divided by each capacity pair (V 2A and V 2B in the example of FIG. 2) with high impedance. However, in actuality, due to the influence of the leakage current, the charge escapes from the coupling capacitance, and it is difficult to measure the correct value in a state where “burning” occurs.
これを回避するためには、容量対により分圧された電圧(V2A、V2B)を測定するための回路を物理的もしくは電気的にリフレッシュする必要がある。そして、リフレッシュを行いつつ測定を行うように制御する等の仕組みも必要となる。そこで、本発明の実施の形態2である非接触電圧測定装置1は、測定部20側の参照容量の容量値を振動手段によって可変させて(振動させて)リフレッシュする。
In order to avoid this, it is necessary to physically or electrically refresh the circuit for measuring the voltages (V 2A , V 2B ) divided by the capacity pair. And a mechanism such as control to perform measurement while performing refresh is also required. Therefore, the non-contact voltage measuring apparatus 1 according to the second embodiment of the present invention refreshes the vibrating unit by changing (vibrating) the capacitance value of the reference capacitance on the measuring unit 20 side.
図3は、本発明の実施の形態2である非接触電圧測定装置の構成例について概要を示した図である。非接触電圧測定装置1の構成は、上述の実施の形態1の図2に示したものと基本的には同じであるため、相違点についてのみ説明し、他は省略する。本実施の形態では、実施の形態1と異なり、測定部20の2つの参照容量21を、可変容量25(図3の例では、可変容量A(25a)、B(25b)の2つにより示される)により置き換えている。また、各可変容量25の容量値を振動させる振動制御部26を有している。
FIG. 3 is a diagram showing an outline of a configuration example of the non-contact voltage measuring apparatus according to the second embodiment of the present invention. Since the configuration of the non-contact voltage measuring apparatus 1 is basically the same as that shown in FIG. 2 of the first embodiment, only the differences will be described, and the others will be omitted. In the present embodiment, unlike the first embodiment, the two reference capacitors 21 of the measurement unit 20 are represented by two of the variable capacitors 25 (in the example of FIG. 3, variable capacitors A (25a) and B (25b)). Replaced). Moreover, it has the vibration control part 26 which vibrates the capacitance value of each variable capacity | capacitance 25. FIG.
可変容量25および振動制御部26の構成、すなわち、可変容量25の容量値を振動させて直流電圧を評価する手法については、公知の技術を適宜用いることができる。具体的には、例えば、「電気電子計測の基礎-誤差から不確かさへ」(山崎 弘郎著、電気学会大学講座、2005/03、以下「参考文献」と記載する場合がある)のpp.114に記載されているような、高インピーダンスで電圧を計測する手段を用いることができる。
As the configuration of the variable capacitor 25 and the vibration control unit 26, that is, a method for evaluating the DC voltage by vibrating the capacitance value of the variable capacitor 25, a known technique can be used as appropriate. Specifically, for example, pp. Of “Basics of Electrical and Electronic Measurement-From Error to Uncertainty” (Hiroo Yamazaki, The Institute of Electrical Engineers of Japan, 2005/03, hereinafter referred to as “references”). Means for measuring voltage with high impedance, such as described in 114, can be used.
図4は、高インピーダンスで電圧を計測する手段の例について概要を示した図である。図4(a)は基本形、図4(b)はフィードバック制御に組み込んだ場合の回路の例を示している。ここでは、測定電位部分をコンデンサで隔離し、高インピーダンスを保っている。そして、振動子により容量を振動させ、被測定電圧(電界強度)に比例した振幅を持つ振動電圧を、コンデンサ(AC結合)を介して取り出す。そして、これを増幅・検波することで被測定電圧(電界強度)に比例した直流電圧を取り出す。
FIG. 4 is a diagram showing an outline of an example of means for measuring voltage with high impedance. 4A shows an example of a basic form, and FIG. 4B shows an example of a circuit when incorporated in feedback control. Here, the measurement potential portion is isolated by a capacitor to maintain a high impedance. Then, the capacitance is vibrated by the vibrator, and an oscillating voltage having an amplitude proportional to the voltage to be measured (electric field strength) is taken out via a capacitor (AC coupling). Then, by amplifying and detecting this, a DC voltage proportional to the voltage to be measured (electric field strength) is taken out.
また、参考文献のpp.116に記載されているような、振動容量を固体で実現する手段を用いることもできる。図5は、振動容量を固体で実現する手段の例について概要を示した図である。図5(a)は基本形、図5(b)はフィードバック制御に組み込んだ場合の回路の例を示している。ここでは、上述の図4の例における機械的な振動容量を、固体の可変容量ダイオードで置き換えることで、振動電圧を発生させている。ダイオードが電圧ゼロ付近以外で非線形性であること、および電界で容量自体が変わることを考慮すると、図5(b)に示すようなフィードバック制御に組み込むのが望ましい。
Also, it is possible to use means for realizing the vibration capacity as a solid as described in pp. 116 of the reference document. FIG. 5 is a diagram showing an outline of an example of means for realizing the vibration capacity in a solid state. FIG. 5A shows a basic form, and FIG. 5B shows an example of a circuit when incorporated in feedback control. Here, the vibration voltage is generated by replacing the mechanical vibration capacity in the above-described example of FIG. 4 with a solid variable capacitance diode. Considering that the diode is non-linear except near zero voltage and that the capacitance itself changes with an electric field, it is desirable to incorporate the feedback control as shown in FIG.
図4、図5に示したような構成を適宜用いて、可変容量25および振動制御部26を構成することで、電圧評価部22では、被測定電圧(電界)に比例した直流電圧(V2A、V2B)を高精度で評価することができる。その後の演算部23でのVX(およびCX)を求める演算処理は、実施の形態1の図2に示した演算部23での手順と同様である。
4 and FIG. 5 are used as appropriate to configure the variable capacitor 25 and the vibration control unit 26, so that the voltage evaluation unit 22 allows the DC voltage (V 2A ) proportional to the voltage to be measured (electric field). , V 2B ) can be evaluated with high accuracy. Subsequent calculation processing for calculating V X (and C X ) in the calculation unit 23 is the same as the procedure in the calculation unit 23 shown in FIG. 2 of the first embodiment.
以上に説明したように、本発明の実施の形態2である非接触電圧測定装置1によれば、測定部20側の参照容量を可変容量25として構成し、回路を物理的もしくは電気的に振動させてリフレッシュする。これにより、リーク電流の影響を解消し、容量対により分圧された電圧(V2A、V2B)を高インピーダンスで評価することが可能となり、交流(AC)電圧だけでなく直流(DC)電圧についても高精度で測定することが可能となる。
As described above, according to the non-contact voltage measuring apparatus 1 according to the second embodiment of the present invention, the reference capacitor on the measuring unit 20 side is configured as the variable capacitor 25, and the circuit is vibrated physically or electrically. Let me refresh. As a result, it is possible to eliminate the influence of the leakage current and evaluate the voltage (V 2A , V 2B ) divided by the capacity pair with high impedance, and not only the alternating current (AC) voltage but also the direct current (DC) voltage. Can also be measured with high accuracy.
(実施の形態3)
上述した実施の形態1、2の構成では、容量対により分圧された電圧(V2A、V2B)を評価する際の基準電位を、測定対象2に応じて大地等としている。これに対し、本発明の実施の形態3である非接触電圧測定装置1では、実際の測定の際に、測定対象2における任意の2点間の電圧差を測定する。 (Embodiment 3)
In the configurations of the first and second embodiments described above, the reference potential when evaluating the voltages (V 2A , V 2B ) divided by the capacity pair is the ground or the like according to themeasurement object 2. On the other hand, in the non-contact voltage measuring apparatus 1 which is Embodiment 3 of this invention, the voltage difference between two arbitrary points in the measuring object 2 is measured in the actual measurement.
上述した実施の形態1、2の構成では、容量対により分圧された電圧(V2A、V2B)を評価する際の基準電位を、測定対象2に応じて大地等としている。これに対し、本発明の実施の形態3である非接触電圧測定装置1では、実際の測定の際に、測定対象2における任意の2点間の電圧差を測定する。 (Embodiment 3)
In the configurations of the first and second embodiments described above, the reference potential when evaluating the voltages (V 2A , V 2B ) divided by the capacity pair is the ground or the like according to the
図6は、本発明の実施の形態3である非接触電圧測定装置の構成例について概要を示した図である。ここでの基本的な構成は、上述の実施の形態1の図2に示したプローブ対10と測定部20の構成を2セット(2組)設けて並列とし、これらの基準電位を共通としたものである。
FIG. 6 is a diagram showing an outline of a configuration example of the non-contact voltage measuring apparatus according to the third embodiment of the present invention. In this basic configuration, two sets (two sets) of the probe pair 10 and the measurement unit 20 shown in FIG. 2 of the first embodiment are provided in parallel, and these reference potentials are shared. Is.
具体的には、図2に示したプローブ対10(プローブA(11a)、プローブB(11b))と測定部20内の参照容量21、電圧評価部22、演算部23の構成のセットに対して、さらに、同様のプローブ対10’(プローブA(11’a)、プローブB(11’b))と、測定部20内の参照容量21’(参照容量A(21’a)、参照容量B(21’b))、電圧評価部22’、演算部23’の構成のセットを並列に設けている。
Specifically, for the set of configurations of the probe pair 10 (probe A (11a), probe B (11b)) and the reference capacitor 21, the voltage evaluation unit 22, and the calculation unit 23 shown in FIG. In addition, a similar probe pair 10 ′ (probe A (11′a), probe B (11′b)), reference capacitor 21 ′ (reference capacitor A (21′a), reference capacitor in the measurement unit 20) B (21′b)), a set of configurations of a voltage evaluation unit 22 ′ and a calculation unit 23 ′ are provided in parallel.
プローブ対10およびプローブ対10’に形成されている容量(CY、CZ、およびC’Y、C’Z)は、それぞれ、厚さ(もしくは誘電率)が異なる誘電体により異なる容量値を有するよう形成されている。また、参照容量21および参照容量21’に形成されている容量(CA、CB、およびC’A、C’B)についても、それぞれ、異なる容量値を有するよう形成されている。
Capacitances (C Y , C Z , and C ′ Y , C ′ Z ) formed in the probe pair 10 and the probe pair 10 ′ have different capacitance values depending on dielectrics having different thicknesses (or dielectric constants). It is formed to have. In addition, the capacitors (C A , C B , and C ′ A , C ′ B ) formed in the reference capacitor 21 and the reference capacitor 21 ′ are also formed to have different capacitance values.
演算部23および演算部23’では、それぞれ、実施の形態1に示したような手法によって個別に測定対象2の電圧(VXおよびV’X)を算出する。そして、得られたVXとV’Xの差を差分演算部27により計算する。表示部24は、差分演算部27により計算された値を、最終的な表示値として表示する。
In the calculation unit 23 and the calculation unit 23 ′, the voltages (V X and V ′ X ) of the measurement target 2 are individually calculated by the method as described in the first embodiment. Then, the difference calculation unit 27 calculates the difference between the obtained V X and V ′ X. The display unit 24 displays the value calculated by the difference calculation unit 27 as a final display value.
なお、図6の例では、上述の実施の形態1の図2に示したプローブ対10と測定部20の構成に対して、これを2セット設ける構成としているが、実施の形態2の図3に示したプローブ対10と測定部20の構成に対して適用することも当然可能である。
In the example of FIG. 6, two sets of the probe pair 10 and the measurement unit 20 shown in FIG. 2 of the above-described first embodiment are provided, but FIG. 3 of the second embodiment. Of course, the present invention can be applied to the configuration of the probe pair 10 and the measurement unit 20 shown in FIG.
以上に説明したように、本発明の実施の形態3である非接触電圧測定装置1によれば、測定対象2の任意の2点間で電圧を測定し、その差分を用いる構成とする。これにより、基準電位を測定対象2に依存させる必要がなく、より広範な測定対象2に対して効率的に非接触での電圧測定を行うことが可能となる。
As explained above, according to the non-contact voltage measuring apparatus 1 which is Embodiment 3 of this invention, it is set as the structure which measures a voltage between two arbitrary points of the measuring object 2, and uses the difference. Thereby, it is not necessary to make the reference potential depend on the measurement object 2, and it is possible to efficiently perform non-contact voltage measurement on a wider range of measurement objects 2.
以上、本発明者によってなされた発明を実施の形態に基づき具体的に説明したが、本発明は上記の実施の形態に限定されるものではなく、その要旨を逸脱しない範囲で種々変更可能であることはいうまでもない。例えば、上記の実施の形態は本発明を分かりやすく説明するために詳細に説明したものであり、必ずしも説明した全ての構成を備えるものに限定されるものではない。また、ある実施の形態の構成の一部を他の実施の形態の構成に置き換えることが可能であり、また、ある実施の形態の構成に他の実施の形態の構成を加えることも可能である。また、各実施の形態の構成の一部について、他の構成の追加・削除・置換をすることが可能である。
As mentioned above, the invention made by the present inventor has been specifically described based on the embodiments. However, the present invention is not limited to the above-described embodiments, and various modifications can be made without departing from the scope of the invention. Needless to say. For example, the above-described embodiment has been described in detail for easy understanding of the present invention, and is not necessarily limited to the one having all the configurations described. Further, a part of the configuration of one embodiment can be replaced with the configuration of another embodiment, and the configuration of another embodiment can be added to the configuration of one embodiment. . Further, it is possible to add, delete, and replace other configurations for a part of the configuration of each embodiment.
本発明は、ケーブル内の導体に対して非接触で電圧を測定する非接触電圧測定装置および非接触電圧測定方法に利用可能である。
The present invention can be used for a non-contact voltage measuring device and a non-contact voltage measuring method for measuring a voltage in a non-contact manner with respect to a conductor in a cable.
1…非接触電圧測定装置、
10、10’…プローブ対、11a、11’a…プローブA、11b、11’b…プローブB、
20…測定部、21a、21’a…参照容量A、21b、21’b…参照容量B、22、22’…電圧評価部、23、23’…演算部、24…表示部、25a…可変容量A、25b…可変容量B、26…振動制御部、27…差分演算部 1 ... Non-contact voltage measuring device,
10, 10 '... probe pair, 11a, 11'a ... probe A, 11b, 11'b ... probe B,
20 ... Measurement unit, 21a, 21'a ... Reference capacitance A, 21b, 21'b ... Reference capacitance B, 22, 22 '... Voltage evaluation unit, 23, 23' ... Calculation unit, 24 ... Display unit, 25a ... Variable Capacity A, 25b ... Variable capacity B, 26 ... Vibration control section, 27 ... Difference calculation section
10、10’…プローブ対、11a、11’a…プローブA、11b、11’b…プローブB、
20…測定部、21a、21’a…参照容量A、21b、21’b…参照容量B、22、22’…電圧評価部、23、23’…演算部、24…表示部、25a…可変容量A、25b…可変容量B、26…振動制御部、27…差分演算部 1 ... Non-contact voltage measuring device,
10, 10 '... probe pair, 11a, 11'a ... probe A, 11b, 11'b ... probe B,
20 ... Measurement unit, 21a, 21'a ... Reference capacitance A, 21b, 21'b ... Reference capacitance B, 22, 22 '... Voltage evaluation unit, 23, 23' ... Calculation unit, 24 ... Display unit, 25a ... Variable Capacity A, 25b ... Variable capacity B, 26 ... Vibration control section, 27 ... Difference calculation section
Claims (8)
- 絶縁被覆された導体からなる測定対象の電圧を、絶縁被覆の上から非接触で測定する非接触電圧測定装置であって、
前記測定対象に装着する第1のプローブおよび第2のプローブと、
前記第1のプローブおよび前記第2のプローブにおいて測定された第1の測定電圧および第2の測定電圧に基づいて、前記測定対象の電圧を求めて出力する測定部と、
を有し、
前記第1のプローブおよび前記第2のプローブには、それぞれ、容量値が異なる第1の容量および第2の容量が形成されており、
前記測定部は、
前記第1のプローブおよび前記第2のプローブにおいて測定された前記第1の測定電圧および前記第2の測定電圧を評価する電圧評価部と、
前記電圧評価部により評価された前記第1の測定電圧および前記第2の測定電圧と、前記第1の容量および前記第2の容量の容量値と、に基づいて、前記測定対象の電圧を算出する演算部と、
を有する、非接触電圧測定装置。 A non-contact voltage measuring device for measuring a voltage to be measured comprising a conductor with insulation coating in a non-contact manner from above the insulation coating,
A first probe and a second probe attached to the measurement object;
A measurement unit that obtains and outputs the voltage of the measurement object based on the first measurement voltage and the second measurement voltage measured by the first probe and the second probe;
Have
In the first probe and the second probe, a first capacitor and a second capacitor having different capacitance values are formed, respectively.
The measuring unit is
A voltage evaluation unit that evaluates the first measurement voltage and the second measurement voltage measured in the first probe and the second probe;
Based on the first measurement voltage and the second measurement voltage evaluated by the voltage evaluation unit, and the capacitance values of the first capacitor and the second capacitor, the voltage of the measurement target is calculated. An arithmetic unit to perform,
A non-contact voltage measuring device. - 請求項1に記載の非接触電圧測定装置において、
前記測定部は、
さらに、前記第1の容量および前記第2の容量に対応して、それぞれ直列に接続され、容量値が異なる第1の参照容量および第2の参照容量を有し、
前記電圧評価部は、
前記第1のプローブと前記測定対象との間に形成される容量と、前記第1の容量との第1の結合容量、および前記第1の参照容量からなる第1の容量対によって、前記測定対象の電圧を分圧して得られる、前記第1の参照容量に対応する容量分圧を前記第1の測定電圧とし、
前記第2のプローブと前記測定対象との間に形成される容量と、前記第2の容量との第2の結合容量、および前記第2の参照容量からなる第2の容量対によって、前記測定対象の電圧を分圧して得られる、前記第2の参照容量に対応する容量分圧を前記第2の測定電圧として、
前記第1の測定電圧と前記第2の測定電圧を評価し、
前記演算部は、
前記電圧評価部により評価された前記第1の測定電圧および前記第2の測定電圧と、
前記第1の容量および前記第2の容量の容量値と、
前記第1の参照容量および前記第2の参照容量の容量値と、
に基づいて、前記測定対象の電圧を算出する、
非接触電圧測定装置。 In the non-contact voltage measuring device according to claim 1,
The measuring unit is
Furthermore, corresponding to the first capacitor and the second capacitor, each of the first reference capacitor and the second reference capacitor are connected in series and have different capacitance values.
The voltage evaluation unit
The measurement is performed by a first capacitance pair consisting of a capacitance formed between the first probe and the measurement object, a first coupling capacitance with the first capacitance, and the first reference capacitance. Capacitance partial pressure obtained by dividing the voltage of the object and corresponding to the first reference capacitance is set as the first measurement voltage,
The measurement is performed by a second capacitance pair including a capacitance formed between the second probe and the measurement object, a second coupling capacitance with the second capacitance, and the second reference capacitance. Capacitance partial pressure corresponding to the second reference capacity obtained by dividing the target voltage is used as the second measurement voltage.
Evaluating the first measurement voltage and the second measurement voltage;
The computing unit is
The first measurement voltage and the second measurement voltage evaluated by the voltage evaluation unit;
Capacitance values of the first capacitor and the second capacitor;
Capacitance values of the first reference capacitor and the second reference capacitor;
Calculating the voltage of the measurement object based on
Non-contact voltage measuring device. - 請求項2に記載の非接触電圧測定装置において、
前記測定部の前記第1の参照容量および前記第2の参照容量は、それぞれ可変であり、
前記測定部は、さらに、前記第1の参照容量および前記第2の参照容量の容量値を振動させる振動制御部を有する、
非接触電圧測定装置。 In the non-contact voltage measuring device according to claim 2,
The first reference capacity and the second reference capacity of the measurement unit are each variable.
The measurement unit further includes a vibration control unit that vibrates the capacitance values of the first reference capacitor and the second reference capacitor.
Non-contact voltage measuring device. - 請求項1に記載の非接触電圧測定装置において、
前記第1のプローブおよび前記第2のプローブと、前記電圧評価部と、前記演算部と、からなる構成を2組備え、
さらに、2つの前記演算部により算出された電圧の差分を算出して、前記測定対象の電圧として出力する差分演算部を有する、
非接触電圧測定装置。 In the non-contact voltage measuring device according to claim 1,
Two sets of configurations including the first probe and the second probe, the voltage evaluation unit, and the calculation unit are provided,
Furthermore, it has a difference calculation unit that calculates the difference between the voltages calculated by the two calculation units and outputs the difference as the voltage to be measured.
Non-contact voltage measuring device. - 請求項1に記載の非接触電圧測定装置において、
前記第1のプローブおよび前記第2のプローブは、双方が1つの部材に固定されている、非接触電圧測定装置。 In the non-contact voltage measuring device according to claim 1,
The first probe and the second probe are both non-contact voltage measuring devices fixed to one member. - 絶縁被覆された導体からなる測定対象の電圧を、絶縁被覆の上から非接触で測定する非接触電圧測定方法であって、
容量値が異なる第1の容量および第2の容量がそれぞれ形成された第1のプローブおよび第2のプローブを、前記測定対象に装着して、測定された第1の測定電圧および第2の測定電圧を評価する第1のステップと、
前記第1のステップで評価された前記第1の測定電圧および前記第2の測定電圧と、前記第1の容量および前記第2の容量の容量値と、に基づいて、前記測定対象の電圧を算出する第2のステップと、
を有する、非接触電圧測定方法。 A non-contact voltage measuring method for measuring a voltage to be measured comprising a conductor coated with insulation coating in a non-contact manner from above the insulation coating,
A first probe and a second probe each having a first capacitance and a second capacitance having different capacitance values are attached to the measurement object, and the measured first measurement voltage and second measurement are measured. A first step of evaluating the voltage;
Based on the first measurement voltage and the second measurement voltage evaluated in the first step, and the capacitance values of the first capacitance and the second capacitance, the voltage of the measurement target is calculated. A second step of calculating;
A non-contact voltage measuring method. - 請求項6に記載の非接触電圧測定方法において、
前記第1のステップでは、
前記第1のプローブと前記測定対象との間に形成される容量と、前記第1の容量との第1の結合容量、および前記第1の容量に対して直列に接続された第1の参照容量からなる第1の容量対によって、前記測定対象の電圧を分圧して得られる、前記第1の参照容量に対応する容量分圧を前記第1の測定電圧とし、
前記第2のプローブと前記測定対象との間に形成される容量と、前記第2の容量との第2の結合容量、および前記第2の容量に対して直列に接続された第2の参照容量からなる第2の容量対によって、前記測定対象の電圧を分圧して得られる、前記第2の参照容量に対応する容量分圧を前記第2の測定電圧として、
前記第1の測定電圧と前記第2の測定電圧を評価し、
前記第2のステップでは、
前記第1のステップで評価された前記第1の測定電圧および前記第2の測定電圧と、
前記第1の容量および前記第2の容量の容量値と、
前記第1の参照容量および前記第2の参照容量の容量値と、
に基づいて、前記測定対象の電圧を算出する、
非接触電圧測定方法。 In the non-contact voltage measuring method according to claim 6,
In the first step,
A capacitance formed between the first probe and the measurement object, a first coupling capacitance with the first capacitance, and a first reference connected in series with the first capacitance A capacitance divided corresponding to the first reference capacitance obtained by dividing the voltage to be measured by a first capacitance pair consisting of capacitance is defined as the first measurement voltage,
A capacitance formed between the second probe and the measurement object, a second coupling capacitance with the second capacitance, and a second reference connected in series with the second capacitance Capacitance partial pressure corresponding to the second reference capacitance obtained by dividing the voltage to be measured by the second capacitance pair consisting of capacitance is used as the second measurement voltage.
Evaluating the first measurement voltage and the second measurement voltage;
In the second step,
The first measurement voltage and the second measurement voltage evaluated in the first step;
Capacitance values of the first capacitor and the second capacitor;
Capacitance values of the first reference capacitor and the second reference capacitor;
Calculating the voltage of the measurement object based on
Non-contact voltage measurement method. - 請求項7に記載の非接触電圧測定方法において、
さらに、それぞれ可変に構成された前記第1の参照容量および前記第2の参照容量の容量値を振動させる第3のステップを有する、
非接触電圧測定方法。 In the non-contact voltage measuring method according to claim 7,
Furthermore, it has a third step of oscillating the capacitance values of the first reference capacitor and the second reference capacitor that are each variably configured.
Non-contact voltage measurement method.
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