WO2017118084A1 - Conveying apparatus, conveying method, and evaporation device - Google Patents
Conveying apparatus, conveying method, and evaporation device Download PDFInfo
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- WO2017118084A1 WO2017118084A1 PCT/CN2016/098977 CN2016098977W WO2017118084A1 WO 2017118084 A1 WO2017118084 A1 WO 2017118084A1 CN 2016098977 W CN2016098977 W CN 2016098977W WO 2017118084 A1 WO2017118084 A1 WO 2017118084A1
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- substrate
- conveying apparatus
- carrier
- slidable member
- fixing
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
- H01L21/677—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for conveying, e.g. between different workstations
- H01L21/67739—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for conveying, e.g. between different workstations into and out of processing chamber
- H01L21/67742—Mechanical parts of transfer devices
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
- H01L21/67005—Apparatus not specifically provided for elsewhere
- H01L21/67011—Apparatus for manufacture or treatment
- H01L21/67155—Apparatus for manufacturing or treating in a plurality of work-stations
- H01L21/6719—Apparatus for manufacturing or treating in a plurality of work-stations characterized by the construction of the processing chambers, e.g. modular processing chambers
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
- H01L21/673—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere using specially adapted carriers or holders; Fixing the workpieces on such carriers or holders
- H01L21/67346—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere using specially adapted carriers or holders; Fixing the workpieces on such carriers or holders characterized by being specially adapted for supporting a single substrate or by comprising a stack of such individual supports
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
- H01L21/677—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for conveying, e.g. between different workstations
- H01L21/67739—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for conveying, e.g. between different workstations into and out of processing chamber
- H01L21/67745—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for conveying, e.g. between different workstations into and out of processing chamber characterized by movements or sequence of movements of transfer devices
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
- H01L21/677—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for conveying, e.g. between different workstations
- H01L21/67739—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for conveying, e.g. between different workstations into and out of processing chamber
- H01L21/67748—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for conveying, e.g. between different workstations into and out of processing chamber horizontal transfer of a single workpiece
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- H—ELECTRICITY
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- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
- H01L21/677—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for conveying, e.g. between different workstations
- H01L21/67739—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for conveying, e.g. between different workstations into and out of processing chamber
- H01L21/6776—Continuous loading and unloading into and out of a processing chamber, e.g. transporting belts within processing chambers
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- H—ELECTRICITY
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- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
- H01L21/683—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for supporting or gripping
- H01L21/687—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for supporting or gripping using mechanical means, e.g. chucks, clamps or pinches
- H01L21/68707—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for supporting or gripping using mechanical means, e.g. chucks, clamps or pinches the wafers being placed on a robot blade, or gripped by a gripper for conveyance
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
- H01L21/683—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for supporting or gripping
- H01L21/687—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for supporting or gripping using mechanical means, e.g. chucks, clamps or pinches
- H01L21/68714—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for supporting or gripping using mechanical means, e.g. chucks, clamps or pinches the wafers being placed on a susceptor, stage or support
- H01L21/68721—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for supporting or gripping using mechanical means, e.g. chucks, clamps or pinches the wafers being placed on a susceptor, stage or support characterised by edge clamping, e.g. clamping ring
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
- H01L21/683—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for supporting or gripping
- H01L21/687—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for supporting or gripping using mechanical means, e.g. chucks, clamps or pinches
- H01L21/68714—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for supporting or gripping using mechanical means, e.g. chucks, clamps or pinches the wafers being placed on a susceptor, stage or support
- H01L21/68742—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for supporting or gripping using mechanical means, e.g. chucks, clamps or pinches the wafers being placed on a susceptor, stage or support characterised by a lifting arrangement, e.g. lift pins
Definitions
- the present invention relates to the field of display, and in particular to a conveying device, a conveying method, and a vapor deposition device.
- an evaporation apparatus generally uses a continuous transfer type (inline type) and an eight-claw type (cluster type).
- the eight-claw type vapor deposition apparatus generally uses a mechanical arm to transport a glass substrate into each cavity, and after being aligned with a mask, vapor deposition is performed.
- the substrate is fixed by the transport device, and after being aligned with the mask, the OLED device is formed on the substrate by passing the temperature above the heating source filled with different materials at a constant speed.
- the use of continuous transfer type evaporation equipment has the advantage of saving equipment space and reducing tact time.
- the continuous transport design how to carry and transport the substrate to align with the mask and then enter the vapor deposition chamber is a difficult problem. Due to factors such as the weight of the large-sized substrate and its own shape variable (bending amount), it is generally carried in an upright manner. This inevitably requires that the linear heating source is also upright, thereby increasing the difficulty of controlling the linear uniformity of the organic material during the evaporation process.
- the coated surface of the substrate is disposed obliquely upward, the coated surface of the substrate is more likely to deposit particles, thereby increasing the probability of defects caused by the particles and reducing the yield of the product.
- the large-size vapor deposition apparatus also adopts a transfer mode in which the TFT (thin film transistor) surface (ie, the plating surface) of the substrate is downward.
- the substrate is generally fixed to the transport device by electrostatic or adhesive means.
- the electrostatic type of fixing is liable to damage the TFT of the substrate.
- the adhesive type the stickiness of the stickies is not easily controlled, and the stickiness is too small to cause the substrate to fall, and if the stickiness is too large, the subsequent separation is difficult. Further, when the viscous material is heated by vapor deposition, problems such as viscous change and viscous aging may occur.
- the embodiments of the present invention are directed to solving one or more of the above technical problems or other technical problems.
- the embodiment of the invention provides a conveying device, comprising:
- a fixing mechanism for mechanically fixing the substrate to the carrier mechanism.
- the conveying device can reduce damage to the conveyed substrate and facilitate the picking up and separation of the substrate.
- the conveying device further comprises a lifting mechanism, the bearing mechanism is provided with a perforation, and the lifting mechanism controls the lifting and lowering of the substrate by passing through the perforation.
- the perforations are uniformly disposed on the carrying mechanism.
- the lifting mechanism includes a lifting pin corresponding to each of the perforations.
- the conveying device further includes a driver for driving the lifting mechanism to elevate and lower.
- the securing mechanism includes a slidable member disposed at an edge of the carrier mechanism and configured to secure the substrate.
- the fixing mechanism comprises two sets of slidable members, and each set of slidable members comprises two oppositely disposed two slidable members.
- the slidable member is made of a metal material.
- the slidable member is provided with a groove structure, and an edge portion of the substrate is fixed by being embedded in the groove structure
- an elastic lubricating layer is disposed in the groove structure.
- the slidable member is detachably mounted on the carrying mechanism.
- the cross-sectional shape of the slidable member perpendicular to the extending direction thereof is a concave shape or an L shape.
- the carrying mechanism is provided with a protrusion at a position for carrying the substrate, the protrusion is located in a region outside the through hole, and the protrusion is used when the substrate is placed at The carrier portion is suspended on the edge portion of the substrate.
- the lower surface of the groove structure is flush with the upper surface of the protrusion.
- a lower surface of the groove structure is flush with a lower surface of the slidable member, an upper surface of the groove structure is higher than an upper surface of the protrusion, and a height between the two The difference is greater than or equal to the thickness of the substrate.
- Embodiments of the present invention also provide an evaporation apparatus including the above-described conveying apparatus.
- the embodiment of the invention further provides a transport method, including:
- the substrate is mechanically fixed to the carrier by a securing mechanism.
- placing the substrate on the carrying mechanism comprises:
- the lowering mechanism is controlled to descend, and the substrate is lowered to place the substrate on the carrier mechanism.
- the method further includes:
- the coating surface of the substrate is controlled upward by controlling the supporting mechanism, releasing the fixing mechanism to the substrate, and controlling the lifting mechanism to rise, thereby Separated from the carrier mechanism.
- the substrate is mechanically fixed to the support mechanism by the fixing mechanism, and the damage to the substrate can be reduced and the reliability of the substrate can be improved, compared with the electrostatic type and the adhesive type. And facilitate the access and separation of the substrate.
- FIG. 1 is a schematic view of a conveying device according to an embodiment of the present invention.
- FIG. 2 is a schematic view of a slidable member provided by an embodiment of the present invention.
- FIG. 3 is a schematic view of another slidable member provided by an embodiment of the present invention.
- FIG. 10 is a flowchart of a transport method according to an embodiment of the present invention.
- the embodiment of the invention provides a conveying device, which comprises:
- a fixing mechanism for mechanically fixing the substrate to the carrier mechanism.
- the substrate is mechanically fixed to the support mechanism by the fixing mechanism, and the damage to the substrate can be reduced and the reliability of the substrate can be improved as compared with the electrostatic type and the adhesive type. And facilitate the access and separation of the substrate.
- the fixing mechanism mechanically fixes the substrate.
- the fixing mechanism is a mechanical fixing structure such as a buckle or an elastic clip, and the fixing mechanism is used to press the substrate against the supporting mechanism to achieve fixing.
- the conveying device in order to facilitate the access and separation of the substrate, further includes a lifting mechanism, and the bearing mechanism is provided with a perforation.
- the lifting mechanism controls the lifting of the substrate by passing through the perforations to facilitate placement of the substrate on the carrier structure and separation of the substrate from the carrier mechanism.
- the securing mechanism secures the substrate to the carrier mechanism by mechanical attachment.
- a slidable member is provided at an edge position of the carrying mechanism.
- the slidable member is provided with a groove structure, and the substrate can be fixed to the supporting mechanism by embedding the edge portion of the substrate into the groove structure.
- FIG. 1 is a schematic diagram of a conveying device according to an embodiment of the present invention.
- the conveying device includes a bearing mechanism, a lifting mechanism, and a fixing mechanism.
- the carrying mechanism 100 is used to carry a substrate on which a plurality of through holes 110 are uniformly disposed.
- the lifting mechanism includes a lifting pin 210 corresponding to each of the perforations 110.
- the lifting pin 210 controls the substrate lifting by passing through the perforations 110, thereby enabling the substrate to be placed on the carrier mechanism or to separate the substrate from the carrier mechanism.
- a securing mechanism is used to secure the substrate to the carrier mechanism 100.
- the securing mechanism includes two sets of slidable members.
- Each set of slidable members includes two oppositely disposed two slidable members, one of which includes a slidable member 310 and a slidable member 330, and the other of which includes a slidable member 320 and a slidable member 340.
- Each of the edges of the rectangular substrate can be fixed by the above two sets of slidable members such that the periphery of the substrate is fixed by the slidable member.
- the edge portion of the substrate is embedded in the groove structure to enable the substrate to be fixed to the carrier mechanism.
- the cross-sectional shape of the slidable member perpendicular to its extending direction is a concave shape as shown in FIG.
- the cross-sectional shape is an L-shape as shown in Fig. 3, that is, the lower surface of the groove structure 311 is flush with the lower surface of the slidable member.
- the edge portion of the substrate can be fixed to the carrier mechanism 100 by being embedded in the groove structure 311 of the slidable member.
- a projection 120 is further provided at a position where the carrier mechanism is used to carry the substrate.
- the protrusion 120 is located outside the perforation 110.
- Openings corresponding to the perforations 100 are provided between the projections 120.
- the shape and size of the opening are the same as the shape and size of the perforation 110.
- the embodiment of the present invention does not limit the size and shape of the opening portion as long as the opening portion does not affect the passage of the lifting needle 210 of the lifting mechanism.
- the area of the protrusion 120 is smaller than the area of the substrate to be carried, and the lower surface of the groove structure 311 in the slidable member is located on the same level as the upper surface of the protrusion 120.
- the edge portion of the substrate is suspended by the protrusions 120 when the substrate is placed on the carrier mechanism 100, thereby facilitating the embedding of the edge portion of the substrate into the groove structure of the slidable member.
- the above substrate is a display substrate.
- the AA area (display area) of the substrate is placed at the raised position, and the edge area outside the AA area is suspended at the edge of the protrusion.
- the slidable member is made of a metal material, for example, made of a metal having a good strength, so that the micro-deformation of the groove structure does not affect the fixing and alignment of the substrate.
- an elastic lubricating layer is further disposed in the groove structure of the slidable member.
- an organic coating is placed within the trench structure to prevent the trench structure from rubbing the substrate to cause the substrate to form microcracks and break.
- the slidable member is detachably mounted on the carrying mechanism, so that substrates of different thicknesses can be transported.
- the fixing mechanism employs a mechanical substrate fixing method.
- the same action and time are applied to each substrate, eliminating the difference between the sheets of different substrate fixing methods.
- the adhesive fixing method the sorption and separation time necessary for the adhesion type is saved, and the tact time is saved.
- the conveying device further includes a driver for driving the lifting mechanism to move up and down, and the lifting and lowering mechanism is controlled by the driver to lift and lower, so that the substrate can be picked up and separated.
- Embodiments of the present invention also provide an evaporation apparatus including the above-described conveying apparatus.
- the vapor deposition apparatus has a continuous transfer type configuration.
- the present invention also provides a method for transporting by using the above-mentioned transport device, comprising:
- the substrate is placed on its carrying mechanism.
- the substrate is placed on its carrying mechanism.
- the above-described transfer method of the present invention is used, for example, in an evaporation process, and after mechanically fixing the substrate to the support mechanism by a fixing mechanism, the method further includes:
- the above transfer method is used, for example, in an evaporation process of an array substrate, and the method includes:
- the slidable member has a concave cross-sectional shape and is slidable in a direction perpendicular to the sides of the substrate in a plane parallel to the substrate.
- the technical features in the above embodiments may be combined with each other as long as the technical features do not contradict each other.
- the protrusion 120 shown in FIG. 2 is the same as that shown in FIG.
- the slidable member 310 is combined.
- the upper surface of the groove structure 311 in the slidable member 310 is higher than the upper surface of the protrusion 120, and the height difference between the two is greater than or equal to the thickness of the substrate to be carried, so that the groove structure 311 accommodates the edge portion of the substrate.
- the substrate is fixed to the carrier mechanism 100.
- the substrate When the substrate is placed on the carrier mechanism 100, the substrate is carried by the protrusion 120 in the AA region, the edge region outside the AA region is suspended at the edge of the protrusion 120, and the substrate is carried by the upper surface of the groove structure 311 in the edge region. Limit. That is, the substrate carried on the carrier mechanism 100 is sandwiched between the upper surface of the groove structure 311 and the upper surface of the protrusion 120.
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Abstract
Description
Claims (19)
- 一种搬送装置,包括:A conveying device comprising:承载机构,用于承载基板;以及a carrier mechanism for carrying the substrate;固定机构,用于以机械方式将所述基板固定在所述承载机构上。a fixing mechanism for mechanically fixing the substrate to the carrier mechanism.
- 根据权利要求1所述的搬送装置,还包括升降机构,所述承载机构上设置有穿孔,所述升降机构通过穿过所述穿孔控制所述基板升降。The conveying apparatus according to claim 1, further comprising an elevating mechanism provided with a perforation, said elevating mechanism controlling said substrate to elevate by passing through said perforation.
- 根据权利要求2所述的搬送装置,其中所述穿孔均匀设置在所述承载机构上。The conveying apparatus according to claim 2, wherein said perforations are uniformly disposed on said carrying mechanism.
- 根据权利要求3所述的搬送装置,其中所述升降机构包括与每一个所述穿孔一一对应的升降针。The conveying apparatus according to claim 3, wherein said elevating mechanism comprises a lifting pin in one-to-one correspondence with each of said perforations.
- 根据权利要求2-4中任意一项所述的搬送装置,还包括驱动所述升降机构升降的驱动器。The conveying apparatus according to any one of claims 2 to 4, further comprising a driver for driving the lifting mechanism to move up and down.
- 根据权利要求2所述的搬送装置,其中所述固定机构包括可滑动件,其设置在所述承载机构边缘位置上并且配置成固定所述基板。The conveying apparatus according to claim 2, wherein said fixing mechanism includes a slidable member disposed at an edge position of said carrier mechanism and configured to fix said substrate.
- 根据权利要求6所述的搬送装置,其中所述固定机构包括两组可滑动件,每一组可滑动件包括两个相对设置的两个可滑动件。The conveying apparatus according to claim 6, wherein said fixing mechanism comprises two sets of slidable members, and each set of slidable members comprises two oppositely disposed slidable members.
- 根据权利要求6所述的搬送装置,其中所述可滑动件采用金属材料制成。The conveying apparatus according to claim 6, wherein said slidable member is made of a metal material.
- 根据权利要求6所述的搬送装置,其中所述可滑动件设置有槽结构,并且所述基板的边缘部分通过嵌入所述槽结构被固定。The conveying apparatus according to claim 6, wherein the slidable member is provided with a groove structure, and an edge portion of the substrate is fixed by being embedded in the groove structure.
- 根据权利要求9所述的搬送装置,其中所述槽结构内设置有弹性润滑层。The conveying apparatus according to claim 9, wherein an elastic lubricating layer is provided in said groove structure.
- 根据权利要求6所述的搬送装置,其中所述可滑动件可拆卸的安装在所述承载机构上。The conveying apparatus according to claim 6, wherein said slidable member is detachably mounted on said carrying mechanism.
- 根据权利要求9所述的搬送装置,其中所述可滑动件的与其延伸方向垂直的横截面形状为凹字形或L字形。The conveying apparatus according to claim 9, wherein a cross-sectional shape of said slidable member perpendicular to an extending direction thereof is a concave shape or an L shape.
- 根据权利要求9所述的搬送装置,其中所述承载机构用于承载所述基板的位置上设置有凸起,所述凸起位于所述穿孔之外的区域,并且所述凸起用于当所述基板放置在所述承载机构上时使所述基板的边缘部分悬空。 A conveying apparatus according to claim 9, wherein said carrying mechanism is provided with a projection at a position for carrying said substrate, said projection being located outside said perforation, and said projection is used for The edge portion of the substrate is suspended when the substrate is placed on the carrier mechanism.
- 根据权利要求13所述的搬送装置,其中所述槽结构的下表面与所述凸起的上表面齐平。The conveying apparatus according to claim 13, wherein a lower surface of said groove structure is flush with an upper surface of said projection.
- 根据权利要求13所述的搬送装置,其中所述槽结构的下表面与所述可滑动件的下表面齐平,所述槽结构的上表面高于所述凸起的上表面,并且二者之间的高度差大于或等于所述基板的厚度。The conveying apparatus according to claim 13, wherein a lower surface of said groove structure is flush with a lower surface of said slidable member, an upper surface of said groove structure is higher than an upper surface of said projection, and both The height difference between the two is greater than or equal to the thickness of the substrate.
- 一种蒸镀设备,包括根据权利要求1-15中任意一项所述的搬送装置。An evaporation apparatus comprising the conveying apparatus according to any one of claims 1-15.
- 一种搬送方法,包括:A method of transport, including:将基板放置在承载机构上;以及Placing the substrate on the carrier; and通过固定机构将所述基板以机械方式固定在所述承载机构上。The substrate is mechanically fixed to the carrier by a securing mechanism.
- 根据权利要求17所述的搬送方法,其中将基板放置在承载机构上包括:The transport method according to claim 17, wherein the placing the substrate on the carrying mechanism comprises:控制升降机构穿过所述承载机构的穿孔,并升至预设位置;Controlling the lifting mechanism to pass through the perforation of the carrying mechanism and raising it to a preset position;将所述基板放置在所述升降机构上;以及Placing the substrate on the lifting mechanism;控制所述升降机构下降,使所述基板下降从而使所述基板放置在所述承载机构上。The lowering mechanism is controlled to descend, and the substrate is lowered to place the substrate on the carrier mechanism.
- 根据权利要求18所述的搬送的方法,其中通过固定机构将所述基板以机械方式固定在所述承载机构上之后还包括:The method of transporting according to claim 18, wherein after the substrate is mechanically fixed to the carrier mechanism by a fixing mechanism, the method further comprises:控制所述承载机构翻转,使所述基板的镀膜面朝下;以及Controlling the carrier mechanism to flip such that the coated side of the substrate faces downward;在对所述镀膜面蒸镀后通过控制所述承载机构使所述基板的镀膜面朝上,解除所述固定机构对所述基板的固定,并控制所述升降机构上升,从而将所述基板与所述承载机构分离。 After vaporizing the coated surface, the coating surface of the substrate is controlled upward by controlling the supporting mechanism, releasing the fixing mechanism to the substrate, and controlling the lifting mechanism to rise, thereby Separated from the carrier mechanism.
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CN105575866A (en) | 2016-01-06 | 2016-05-11 | 京东方科技集团股份有限公司 | Transporting device, transporting method and evaporation equipment |
CN108598038A (en) * | 2018-01-09 | 2018-09-28 | 京东方科技集团股份有限公司 | Bogey |
CN111244016B (en) * | 2020-03-10 | 2022-10-18 | 深超光电(深圳)有限公司 | Transfer device, manufacturing method of transfer device, and transfer method |
CN113058767B (en) * | 2021-03-05 | 2022-05-31 | Tcl华星光电技术有限公司 | Support column and alignment mechanism |
CN112960371B (en) * | 2021-04-06 | 2023-02-28 | Tcl华星光电技术有限公司 | Vacuum conveying device and conveying method |
CN115072369A (en) * | 2022-06-28 | 2022-09-20 | 深圳市华星光电半导体显示技术有限公司 | Transport module and film forming apparatus |
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