WO2017034372A1 - 오프셋 인쇄용 클리쉐의 제조방법 및 오프셋 인쇄용 클리쉐 - Google Patents
오프셋 인쇄용 클리쉐의 제조방법 및 오프셋 인쇄용 클리쉐 Download PDFInfo
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- WO2017034372A1 WO2017034372A1 PCT/KR2016/009529 KR2016009529W WO2017034372A1 WO 2017034372 A1 WO2017034372 A1 WO 2017034372A1 KR 2016009529 W KR2016009529 W KR 2016009529W WO 2017034372 A1 WO2017034372 A1 WO 2017034372A1
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- cliché
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- substrate
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- B—PERFORMING OPERATIONS; TRANSPORTING
- B41—PRINTING; LINING MACHINES; TYPEWRITERS; STAMPS
- B41N—PRINTING PLATES OR FOILS; MATERIALS FOR SURFACES USED IN PRINTING MACHINES FOR PRINTING, INKING, DAMPING, OR THE LIKE; PREPARING SUCH SURFACES FOR USE AND CONSERVING THEM
- B41N1/00—Printing plates or foils; Materials therefor
- B41N1/04—Printing plates or foils; Materials therefor metallic
- B41N1/06—Printing plates or foils; Materials therefor metallic for relief printing or intaglio printing
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- B—PERFORMING OPERATIONS; TRANSPORTING
- B41—PRINTING; LINING MACHINES; TYPEWRITERS; STAMPS
- B41C—PROCESSES FOR THE MANUFACTURE OR REPRODUCTION OF PRINTING SURFACES
- B41C1/00—Forme preparation
- B41C1/10—Forme preparation for lithographic printing; Master sheets for transferring a lithographic image to the forme
- B41C1/1008—Forme preparation for lithographic printing; Master sheets for transferring a lithographic image to the forme by removal or destruction of lithographic material on the lithographic support, e.g. by laser or spark ablation; by the use of materials rendered soluble or insoluble by heat exposure, e.g. by heat produced from a light to heat transforming system; by on-the-press exposure or on-the-press development, e.g. by the fountain of photolithographic materials
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/027—Making masks on semiconductor bodies for further photolithographic processing not provided for in group H01L21/18 or H01L21/34
- H01L21/0271—Making masks on semiconductor bodies for further photolithographic processing not provided for in group H01L21/18 or H01L21/34 comprising organic layers
- H01L21/0273—Making masks on semiconductor bodies for further photolithographic processing not provided for in group H01L21/18 or H01L21/34 comprising organic layers characterised by the treatment of photoresist layers
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- B—PERFORMING OPERATIONS; TRANSPORTING
- B41—PRINTING; LINING MACHINES; TYPEWRITERS; STAMPS
- B41C—PROCESSES FOR THE MANUFACTURE OR REPRODUCTION OF PRINTING SURFACES
- B41C1/00—Forme preparation
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- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F1/00—Originals for photomechanical production of textured or patterned surfaces, e.g., masks, photo-masks, reticles; Mask blanks or pellicles therefor; Containers specially adapted therefor; Preparation thereof
- G03F1/50—Mask blanks not covered by G03F1/20 - G03F1/34; Preparation thereof
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- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
- G03F7/004—Photosensitive materials
- G03F7/038—Macromolecular compounds which are rendered insoluble or differentially wettable
- G03F7/0385—Macromolecular compounds which are rendered insoluble or differentially wettable using epoxidised novolak resin
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- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
- G03F7/20—Exposure; Apparatus therefor
- G03F7/2002—Exposure; Apparatus therefor with visible light or UV light, through an original having an opaque pattern on a transparent support, e.g. film printing, projection printing; by reflection of visible or UV light from an original such as a printed image
- G03F7/2004—Exposure; Apparatus therefor with visible light or UV light, through an original having an opaque pattern on a transparent support, e.g. film printing, projection printing; by reflection of visible or UV light from an original such as a printed image characterised by the use of a particular light source, e.g. fluorescent lamps or deep UV light
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- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
- G03F7/20—Exposure; Apparatus therefor
- G03F7/2022—Multi-step exposure, e.g. hybrid; backside exposure; blanket exposure, e.g. for image reversal; edge exposure, e.g. for edge bead removal; corrective exposure
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- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
- G03F7/26—Processing photosensitive materials; Apparatus therefor
- G03F7/30—Imagewise removal using liquid means
- G03F7/32—Liquid compositions therefor, e.g. developers
- G03F7/325—Non-aqueous compositions
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- H—ELECTRICITY
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- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/02104—Forming layers
- H01L21/02107—Forming insulating materials on a substrate
- H01L21/02225—Forming insulating materials on a substrate characterised by the process for the formation of the insulating layer
- H01L21/0226—Forming insulating materials on a substrate characterised by the process for the formation of the insulating layer formation by a deposition process
- H01L21/02282—Forming insulating materials on a substrate characterised by the process for the formation of the insulating layer formation by a deposition process liquid deposition, e.g. spin-coating, sol-gel techniques, spray coating
- H01L21/02288—Forming insulating materials on a substrate characterised by the process for the formation of the insulating layer formation by a deposition process liquid deposition, e.g. spin-coating, sol-gel techniques, spray coating printing, e.g. ink-jet printing
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- H—ELECTRICITY
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- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/027—Making masks on semiconductor bodies for further photolithographic processing not provided for in group H01L21/18 or H01L21/34
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/027—Making masks on semiconductor bodies for further photolithographic processing not provided for in group H01L21/18 or H01L21/34
- H01L21/0271—Making masks on semiconductor bodies for further photolithographic processing not provided for in group H01L21/18 or H01L21/34 comprising organic layers
- H01L21/0273—Making masks on semiconductor bodies for further photolithographic processing not provided for in group H01L21/18 or H01L21/34 comprising organic layers characterised by the treatment of photoresist layers
- H01L21/0274—Photolithographic processes
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- H—ELECTRICITY
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- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/027—Making masks on semiconductor bodies for further photolithographic processing not provided for in group H01L21/18 or H01L21/34
- H01L21/033—Making masks on semiconductor bodies for further photolithographic processing not provided for in group H01L21/18 or H01L21/34 comprising inorganic layers
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- H—ELECTRICITY
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- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/027—Making masks on semiconductor bodies for further photolithographic processing not provided for in group H01L21/18 or H01L21/34
- H01L21/033—Making masks on semiconductor bodies for further photolithographic processing not provided for in group H01L21/18 or H01L21/34 comprising inorganic layers
- H01L21/0334—Making masks on semiconductor bodies for further photolithographic processing not provided for in group H01L21/18 or H01L21/34 comprising inorganic layers characterised by their size, orientation, disposition, behaviour, shape, in horizontal or vertical plane
- H01L21/0337—Making masks on semiconductor bodies for further photolithographic processing not provided for in group H01L21/18 or H01L21/34 comprising inorganic layers characterised by their size, orientation, disposition, behaviour, shape, in horizontal or vertical plane characterised by the process involved to create the mask, e.g. lift-off masks, sidewalls, or to modify the mask, e.g. pre-treatment, post-treatment
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- H—ELECTRICITY
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- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
- H01L21/67005—Apparatus not specifically provided for elsewhere
- H01L21/67011—Apparatus for manufacture or treatment
- H01L21/67155—Apparatus for manufacturing or treating in a plurality of work-stations
- H01L21/67207—Apparatus for manufacturing or treating in a plurality of work-stations comprising a chamber adapted to a particular process
- H01L21/67225—Apparatus for manufacturing or treating in a plurality of work-stations comprising a chamber adapted to a particular process comprising at least one lithography chamber
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- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/70—Manufacture or treatment of devices consisting of a plurality of solid state components formed in or on a common substrate or of parts thereof; Manufacture of integrated circuit devices or of parts thereof
- H01L21/71—Manufacture of specific parts of devices defined in group H01L21/70
- H01L21/768—Applying interconnections to be used for carrying current between separate components within a device comprising conductors and dielectrics
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- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/70—Manufacture or treatment of devices consisting of a plurality of solid state components formed in or on a common substrate or of parts thereof; Manufacture of integrated circuit devices or of parts thereof
- H01L21/71—Manufacture of specific parts of devices defined in group H01L21/70
- H01L21/768—Applying interconnections to be used for carrying current between separate components within a device comprising conductors and dielectrics
- H01L21/76801—Applying interconnections to be used for carrying current between separate components within a device comprising conductors and dielectrics characterised by the formation and the after-treatment of the dielectrics, e.g. smoothing
- H01L21/76802—Applying interconnections to be used for carrying current between separate components within a device comprising conductors and dielectrics characterised by the formation and the after-treatment of the dielectrics, e.g. smoothing by forming openings in dielectrics
- H01L21/76817—Applying interconnections to be used for carrying current between separate components within a device comprising conductors and dielectrics characterised by the formation and the after-treatment of the dielectrics, e.g. smoothing by forming openings in dielectrics using printing or stamping techniques
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- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
- G03F7/26—Processing photosensitive materials; Apparatus therefor
- G03F7/40—Treatment after imagewise removal, e.g. baking
Definitions
- the present specification relates to a manufacturing method of an offset printing cliché and an offset printing cliché.
- Gravure printing is a printing method that scrapes excess ink by printing ink on a concave plate and prints it. It is known as a method suitable for printing in various fields such as publishing, packaging, cellophane, vinyl, polyethylene, and the like. Research has been made to apply the gravure printing method to the fabrication of the applied active device or circuit pattern. Since gravure printing transfers ink onto a substrate using a transfer roll, by using a transfer roll corresponding to the area of a desired display element, a pattern can be formed by one transfer even in a large area display element. Will be.
- Such gravure printing not only forms an ink pattern for resist on a substrate, but also various patterns of a display element, for example, a liquid crystal display device, a TFT, as well as a gate line and a data line, a pixel electrode, connected to the TFT, It can be used to pattern metal patterns for capacitors.
- a display element for example, a liquid crystal display device, a TFT, as well as a gate line and a data line, a pixel electrode, connected to the TFT, It can be used to pattern metal patterns for capacitors.
- a blanket used for gravure printing is generally manufactured by casting a silicone-based resin into a rigid master mold.
- the blanket thus prepared is not only limited in manufacturing a uniform thickness, but also difficult to mass-produce on a pilot scale. have.
- a reverse offset printing method is mainly employed for precise fine pattern formation.
- the present specification is to provide a method of manufacturing a cliché for offset printing and a cliché for offset printing.
- a step of forming a light shielding mask pattern on the substrate Forming a negative photoresist layer on the substrate with the light shielding mask pattern; Irradiating light onto the substrate to expose the substrate; And developing the exposed negative photoresist layer to form a negative photoresist pattern layer having protruding raised portions and developed groove patterns, wherein the average thickness of the negative photoresist layer is 3 ⁇ m or more.
- the negative photoresist pattern layer has at least two groove pattern with different line widths, and the line width difference between the at least two groove pattern is 10 ⁇ ⁇ or more, and the at least two groove pattern having a difference in line width of 10 ⁇ ⁇ or more is mutually different.
- a method of manufacturing a cliché for offset printing is provided.
- the present specification is a substrate; A negative photoresist pattern layer provided on the substrate and having a relief portion and a groove pattern; And a light shielding mask pattern provided at the bottom of the groove pattern, wherein an average depth of the groove pattern of the negative photoresist is 3 ⁇ m or more, and the negative photoresist pattern layer includes at least two groove pattern having different line widths.
- the average depth of the groove pattern of the negative photoresist pattern layer is the same, and the line width difference between the at least two groove pattern is 10 ⁇ m or more, and the at least two groove pattern having a difference in line width of 10 ⁇ m or more. It provides a cliché for offset printing that is connected to each other.
- the manufacturing method of the cliché according to the present specification does not require a costly laser direct exposure process when manufacturing the cliché, and thus, there is an advantage in that the cost is reduced.
- the manufacturing method of the cliché according to the present disclosure may solve the bottom contact problem caused by the increase in the line width of the pattern by adjusting the thickness of the negative photoresist pattern of the cliché.
- FIG. 2 illustrates a method of manufacturing a cliché having a groove pattern having a depth adjusted according to a different line width according to the prior art.
- FIG 3 shows a method of manufacturing a cliché according to an exemplary embodiment of the present specification.
- FIG. 4 is a cross-sectional view of the cliché according to an exemplary embodiment of the present specification.
- FIG. 5 is a cross-sectional view of the cliché according to another exemplary embodiment of the present specification.
- FIG. 6 is an optical microscope image of an aluminum pattern formed on the glass substrate of Example 1.
- Example 7 is a scanning electron microscope image of the cliché prepared in Example 1.
- FIG. 8 is a scanning electron microscope image of a cliché prepared in Example 3.
- FIG. 8 is a scanning electron microscope image of a cliché prepared in Example 3.
- FIG. 11 is an optical microscope image showing a gradual change in the line width of a junction pattern, and illustrates line width measurement for calculating an average line width of the junction pattern.
- FIG. 13 is an optical microscope image of a pattern printed using the cliché of Example 1 and the cliché of Comparative Example when the pressure was 100 ⁇ m.
- FIG. 13 is an optical microscope image of a pattern printed using the cliché of Example 1 and the cliché of Comparative Example when the pressure was 100 ⁇ m.
- the manufacturing method of the cliché for offset printing may include forming a light shielding mask pattern on a substrate.
- the method of forming the light shielding mask pattern on the substrate is not particularly limited, but a method generally used in the art may be adopted.
- the method of forming the light shielding mask pattern on the substrate may be roll printing, inkjet printing, screen printing, vapor deposition, photolithography, etching, or the like.
- the forming of the shading mask pattern may include forming a shading film using a shading material on a substrate and etching the shading film to form a shading mask pattern.
- the forming of the light shielding mask pattern may be a step of transferring the light shielding mask pattern onto the substrate by contacting the substrate with a printing plate or a printing roll on which the pattern is formed of the substrate as a light shielding material.
- the forming of the light shielding mask pattern may be patterning the light shielding material ink on a substrate.
- the thickness of the shading mask pattern is not particularly limited as long as it can block the irradiated light, but for example, the average thickness of the shading mask pattern may be 20 nm or more and 500 nm or less.
- the material of the light shielding mask pattern is not particularly limited as long as it can block the irradiated light.
- the material of the light shielding mask pattern may be a metal pattern, and specifically, the metal pattern may be copper (Cu) or chromium (Cr). ), Aluminum (Al), molybdenum (Mo), nickel (Ni), gold (Au) and silver (Ag).
- the line width of the light shielding mask pattern is not particularly limited.
- the line width of the light shielding mask pattern may be 2 ⁇ m or more and 100 ⁇ m or less.
- the line width of at least some areas of the light shielding mask pattern provided on the substrate may be different from the line widths of the remaining areas.
- the light shielding mask pattern may include two or more types of light shielding mask patterns having different line widths.
- the line width difference between two or more light blocking mask patterns having different line widths may be 10 ⁇ m or more.
- At least two light shielding mask patterns having a difference in line width of 10 ⁇ m or more may be connected to each other.
- the shape of the light shielding mask pattern may be a pattern shape of a field requiring a metal pattern or a photoresist pattern.
- the shape of the light shielding mask pattern may be a shape of a metal pattern of the touch panel, and the same pattern may be repeated or two or more different patterns may be spaced apart or connected to each other.
- the shape of the shading mask pattern may include a grid-shaped active pattern, a router pattern connected to the screen pattern and connected to an external printed circuit board, and the screen pattern and the wiring part. It may be at least one of the junction (Junction) pattern to lower the resistance when the pattern is connected.
- a line width of the connection pattern is used to reduce resistance when the screen pattern and the wiring pattern are connected.
- the line width may increase from the screen portion pattern to the wiring portion pattern.
- the line width of the connecting portion pattern connecting the screen portion pattern and the wiring portion pattern increases from the screen portion pattern to the wiring portion pattern, wherein the average line width of the connecting portion pattern is the minimum line width in the connecting portion pattern.
- At least three or more linewidth values having a medium line width and a maximum line width were measured and their average values were described as average line widths.
- the shading mask pattern may further include a ground pattern of a circuit of an external printed circuit board, and the ground pattern may be spaced apart from the screen pattern, the wiring pattern, and the connection pattern. Can be.
- the manufacturing method of the cliché for offset printing may include forming a negative photoresist layer on a substrate having a light shielding mask pattern.
- the negative photoresist layer may include a polymer having a change in resistance to a developer by exposure to light.
- the negative photoresist layer may include a polymer in which light is not blocked by the light shielding mask pattern on the substrate and a portion exposed to the light is not developed by the developer so that a pattern opposite to the light shielding mask pattern is formed.
- the average thickness of the negative photoresist layer may be 3 ⁇ m or more.
- a groove depth of 3 ⁇ m or more may be secured regardless of the line width of the groove pattern, thereby preventing the bottom contact phenomenon due to the lack of the groove depth and the disconnection of the connection portion due to the change in the groove depth.
- the average thickness of the negative photoresist layer may be 3 ⁇ m or more and 15 ⁇ m or less, and more specifically, the average thickness of the negative photoresist layer may be 3 ⁇ m or more and 10 ⁇ m or less.
- the forming of the negative photoresist layer may include preparing a composition of negative photoresist; Forming a film by applying a composition of negative photoresist on the substrate having the light shielding mask pattern; And drying the film formed of the composition of the negative photoresist to form a negative photoresist layer.
- the negative photoresist composition may include a photosensitive resin, and may further include at least one of a crosslinking agent, an adhesion promoter, a surfactant, and a solvent.
- the type of the photosensitive resin, the crosslinking agent, the adhesion promoter, the surfactant, and the solvent is not particularly limited, and a material generally used in the art may be selected.
- the method of manufacturing an offset printing cliché may include exposing light to a substrate side (hereinafter, an exposure step).
- the exposing step light is irradiated to the substrate side to expose the light. Specifically, light is irradiated to the opposite side of the substrate on which the light shielding mask pattern and the negative photoresist layer are provided to selectively light the light by the light shielding mask pattern on the substrate. It can be exposed to a photoresist layer.
- the exposing step light is irradiated to opposite sides of the surface of the substrate, where the light shielding mask pattern and the negative photoresist layer are provided, and light is transmitted only to a region where the light shielding mask pattern is not formed. Some of the formed negative photoresist layers may be exposed to transmitted light.
- a part of the negative photoresist layer exposed to light by the exposure step may change to a property that is not developed by the developer.
- the manufacturing method of the cliché for offset printing may include developing the exposed negative photoresist layer (hereinafter, referred to as a developing step).
- the developing step may be a step of developing an exposed negative photoresist layer to form a negative photoresist pattern layer having a protruding relief and a groove pattern developed by a developer.
- the protruding relief portion is a portion exposed to light in the exposing step
- the portion developed by the developing solution is a portion which is not exposed to light in the exposing step or is not irradiated with sufficient light to cause resistance by the developing solution.
- the individual line width of the groove pattern of the negative photoresist pattern layer may be 2 ⁇ m or more and 100 ⁇ m or less.
- the line width of the groove part pattern may be determined according to the line width of the light shielding mask pattern and the light property of the light source.
- the line width of the groove pattern may be proportional to the line width of the shading mask pattern.
- the line width of the groove pattern may be the same as or similar to the line width of the shading mask pattern.
- the line width of at least some areas of the groove pattern may be different from the line width of the remaining areas.
- the negative photoresist pattern layer may have at least two groove portion patterns having different line widths.
- a line width difference between the at least two groove patterns may be 10 ⁇ m or more.
- At least two groove patterns having a difference in line width of 10 ⁇ m or more may be connected to each other.
- the groove pattern may be a pattern shape of a field in which a metal pattern or a photoresist pattern is required.
- the groove pattern may be a shape of a metal pattern of the touch panel, and the same pattern may be repeated or two or more different patterns may be spaced apart or connected to each other.
- the shape of the shading mask pattern may include a grid-shaped screen pattern, a wiring pattern connected to the screen pattern and connected to an external flexible printed circuit board, and a resistance when the screen pattern and the wiring pattern are connected. It may be at least one of the connection pattern to lower the.
- the shape of the light shielding mask pattern may further include a ground pattern of a circuit of an external printed circuit board.
- An average depth of the groove pattern may be 3 ⁇ m or more. In this case, it is possible to prevent the bottom contact phenomenon due to the lack of the depth of the groove and the disconnection of the connection part due to the change of the depth of the groove.
- the average depth of the groove pattern may be 3 ⁇ m or more and 15 ⁇ m or less, and more specifically, the average depth of the groove pattern may be 3 ⁇ m or more and 10 ⁇ m or less.
- the average depth of the groove pattern may be determined by the average thickness of the negative photoresist layer.
- the depth of the groove pattern may be affected by the flatness and the degree of development of the negative photoresist layer, but in theory, the average depth of the groove pattern may be the same.
- the average depth of the groove pattern may be the same.
- the manufacturing method of the cliché for offset printing may further include curing the negative photoresist pattern layer after the developing step.
- the curing conditions may be adjusted according to the negative photoresist, it is not particularly limited.
- the method of manufacturing an offset printing cliché may further include depositing a metal oxide on a substrate on which a negative photoresist pattern layer is formed after the developing step.
- the method of depositing the metal oxide is not particularly limited, and a method generally used in the art may be adopted.
- the type of metal oxide is ITO, SiO 2 And Al 2 O 3 .
- the average thickness of the deposited metal oxide may be 200 nm or less. Specifically, the average thickness of the deposited metal oxide may be 20 nm or more and 100 nm or less.
- the metal or metal oxide is deposited on the substrate 1 to be manufactured by the cliché, the resist pattern 3 having various widths is formed on the metal or metal oxide, and the metal or metal oxide is etched.
- the etching pattern 2 was formed.
- the substrate on which the etching pattern 2 is not formed may be etched to form a pattern on the cliché.
- a printing roll contacting the cliché may contact the bottom of the groove pattern of the cliché.
- the ink of the portion of the cliché groove pattern is removed so that a pattern different from the shape of the groove pattern of the cliché remains on the printing roll.
- a groove portion pattern having a deeper depth may be formed in the cliché 10.
- the depth according to the line width must be calculated, and at least two or more layers of etching patterns must be formed to form the calculated depth, and two or more etching processes must be performed.
- the substrate when the etching pattern is formed once as shown in FIG. 1 and the substrate is etched by the etching pattern, the substrate can be deeply patterned at a time so that there is no bottom contact of the printing roll, but the depth of the groove pattern is increased.
- the etching time not only the depth of the groove pattern but also the overetching increases the width of the groove pattern, and the shape of the groove pattern formed in the cliché differs from the shape of the desired groove pattern.
- the average depth of the cliché groove pattern may be adjusted by adjusting the average thickness of the negative photoresist pattern, thereby easily solving the problem of bottom contact due to the increase in the line width of the pattern.
- offset printing cliché description that may overlap with the manufacturing method of the offset printing cliché is omitted, and the configuration of the offset printing cliché may refer to the description of the manufacturing method of the offset printing cliché.
- the material of the substrate is not particularly limited, but may be, for example, a glass substrate, a thick plastic substrate, or a thin plastic film.
- the material of the plastic substrate or the plastic film is not particularly limited, but for example, polyacrylate, polypropylene (PP, polypropylene), polyethylene terephthalate (PET), polyethylene ether phthalate ), Polyethylene phthalate, polybutylene phthalate, polyethylene naphthalate, polycarbonate, polystyrene, polyether imide , Polyether sulfone, polydimethyl siloxane (PDMS; polydimethyl siloxane), polyether ether ketone (PEEK; Polyetheretherketone) and polyimide (PI) may include any one or more.
- the substrate may be a substrate having high transparency, and the light transmittance of the substrate may be 50% or more.
- the average thickness of the substrate may be 15 ⁇ m or more and 2 mm or less, but is not limited thereto.
- the negative photoresist pattern layer may have an embossed portion and a groove portion pattern.
- An average depth of the groove pattern of the negative photoresist may be 3 ⁇ m or more.
- a groove depth of 3 ⁇ m or more may be secured regardless of the width of the groove, thereby preventing floor contact due to insufficient depth of the groove and connection disconnection due to a change in the depth of the groove.
- the average depth of the groove pattern may be 3 ⁇ m or more and 15 ⁇ m or less, and more specifically, the average depth of the groove pattern may be 3 ⁇ m or more and 10 ⁇ m or less.
- the line width of at least some areas of the groove pattern may be different from the line width of the remaining areas.
- the negative photoresist pattern layer may have at least two groove pattern patterns having different line widths.
- a line width difference between the at least two groove patterns may be 10 ⁇ m or more.
- At least two groove pattern having a difference in line width of 10 ⁇ m or more may be connected to each other.
- the groove pattern may be a pattern shape of a field in which a metal pattern or a photoresist pattern is required.
- the groove pattern may be a shape of a metal pattern of the touch panel, and the same pattern may be repeated or two or more different patterns may be spaced apart or connected to each other.
- the shape of the shading mask pattern may include a grid-shaped screen pattern, a wiring pattern connected to the screen pattern and connected to an external flexible printed circuit board, and a resistance when the screen pattern and the wiring pattern are connected. It may be at least one of the connection pattern to lower the.
- the shape of the light shielding mask pattern may further include a ground pattern of a circuit of an external printed circuit board.
- the light shielding mask pattern may be provided at the bottom of the groove pattern of the negative photoresist pattern layer.
- the method may further include a metal oxide film provided on the substrate provided with the photoresist pattern layer.
- the average thickness of the metal oxide film may be 200 nm or less. Specifically, the average thickness of the metal oxide film may be 20 nm or more and 100 nm or less.
- the metal oxide film increases the cliché surface energy to increase the transfer pattern of the resist pattern during the printing process, and can prevent the cliché pattern layer from being damaged by the repeated printing process.
- the line width of the wiring portion was 30.2 ⁇ m
- the line width of the connection portion was 3.7 ⁇ m-29.7 ⁇ m
- the screen width was 3.2 ⁇ m. Formed a pattern.
- the resist pattern was removed with the resist stripper to form an aluminum pattern as a light shielding mask pattern as shown in FIG.
- the average line width of the wiring aluminum pattern 30 ⁇ m
- the line width of the connecting aluminum pattern 3.5 to 29.5 ⁇ m
- the average line width of the connecting aluminum pattern 16.87 ⁇ m
- the screen aluminum pattern 3.0 ⁇ m.
- a negative photoresist layer having an average thickness of 3.5 ⁇ m was formed using SU-8 2005 negative photoresist.
- the negative photoresist layer was PEB (Post Exposure Bake) on a 95 ° C. hot plate for 3 minutes.
- a SiO 2 layer was formed to a thickness of 100 nm by using a sputter on the entire surface provided with the negative photoresist pattern layer.
- FIG. 7 An image taken of the prepared cliché with a scanning electron microscope is shown in FIG. 7.
- a negative photoresist layer having an average thickness of 6.0 ⁇ m was formed on the glass substrate having the aluminum pattern manufactured in Example 1 by using SU-8 2005 negative photoresist.
- the negative photoresist layer was PEB (Post Exposure Bake) on a 95 ° C. hot plate for 3 minutes.
- a cliché was prepared by washing with isopropyl alcohol (IPA, Isopropyl Alcohol).
- IPA isopropyl alcohol
- the average line width of the wiring part groove pattern in the negative photoresist pattern layer after development is 30 ⁇ m
- the line width of the connection part groove pattern is 3.5 ⁇ m-29.5 ⁇ m (average line width: 16.87 ⁇ m)
- the average line width of the screen part groove pattern is 3 micrometers.
- a SiO 2 layer was formed to a thickness of 100 nm by using a sputter on the entire surface provided with the negative photoresist pattern layer.
- a negative photoresist layer having an average thickness of 7.0 ⁇ m was formed using SU-8 2005 negative photoresist.
- the negative photoresist layer was PEB (Post Exposure Bake) on a 95 ° C. hot plate for 3 minutes.
- a cliché was prepared by washing with isopropyl alcohol (IPA, Isopropyl Alcohol).
- IPA isopropyl alcohol
- the line width of the groove part pattern of the wiring part in the negative photoresist pattern layer after development is 30 ⁇ m
- the line width of the connection part groove pattern is 3.5 ⁇ m-29.5 ⁇ m (average line width: 16.87 ⁇ m)
- the line width of the screen part groove pattern is 3 ⁇ m. It was.
- a SiO 2 layer was formed to a thickness of 100 nm by using a sputter on the entire surface provided with the negative photoresist pattern layer.
- FIG. 8 An image taken of the prepared cliché with a scanning electron microscope is shown in FIG. 8.
- the exposed glass surface was further etched to 250 nm depth using a hydrofluoric acid etchant.
- the chromium layer on the upper surface of the laminate was removed with a chromium etchant to complete a double etch cliché.
- the line width of the screen portion of the double-etched cliché manufactured through the above process was 3 ⁇ m
- the depth of the screen portion groove was 250 nm
- the line width of the wiring portion was 30 ⁇ m
- the depth of the wiring portion groove was 5.25 ⁇ m.
- FIG. 10 An image taken of the prepared cliché with a scanning electron microscope is shown in FIG. 10.
- a blanket roll coated with a resist ink of 3 mu m thickness was brought into rotational contact with the cliché prepared through Examples 1-3 and Comparative Examples. After the unnecessary resist pattern was transferred from the blanket roll to the upper part of the cliché, the blanket pattern with the resist pattern was rotated in contact with the printed substrate to transfer the resist pattern onto the printed substrate.
- the phosphorus pressure means a pressure that is pressed in the Z axis when the blanket roll contacts the cliché.
- the actual numerical value representing the phosphorus pressure is not expressed by the pressure, but the contact point at which the blanket and the cliché contact with the Z-axis that can represent the pressure is represented by the moving distance d in the Z-axis.
- the pressure margin means the maximum value of the moving distance d on the Z axis in which the pattern can be printed without bottom contact.
- Example 13 shows a resist pattern printed on the substrate to be printed using the blanket roll and the cliché prepared in Example 1 and Comparative Example under the condition that the pressure was 100 ⁇ m.
- the cliché of the first embodiment may recognize that the screen portion pattern and the connection portion pattern are seamlessly printed.
- the cliché of the comparative example it can be seen that the screen pattern and the connection part pattern printed on the substrate to be printed are broken because the resist which the blanket roll touches the bottom of the cliché groove pattern is removed.
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Abstract
Description
Claims (5)
- 기판 상에 차광마스크패턴을 형성하는 단계;상기 차광마스크패턴이 구비된 기판 상에 네가티브 포토레지스트층을 형성하는 단계;기판 측에 광을 조사하여 노광하는 단계; 및노광된 네가티브 포토레지스트층을 현상하여, 돌출된 양각부와 현상된 홈부패턴을 갖는 네가티브 포토레지스트 패턴층을 형성하는 단계를 포함하며,상기 네가티브 포토레지스트층의 평균 두께는 3㎛ 이상이며,상기 네가티브 포토레지스트 패턴층은 선폭이 상이한 적어도 2종의 홈부패턴을 가지며, 상기 적어도 2종의 홈부패턴 간의 선폭차이는 10㎛ 이상이고,상기 선폭의 차이가 10㎛ 이상인 적어도 2종의 홈부패턴은 서로 연결된 것인 오프셋 인쇄용 클리쉐의 제조방법.
- 청구항 1에 있어서, 상기 현상단계 후에, 네가티브 포토레지스트 패턴층이 형성된 기판 상에 금속 산화물을 증착하는 단계를 더 포함하는 것인 오프셋 인쇄용 클리쉐의 제조방법.
- 기판; 상기 기판 상에 구비되고, 양각부와 홈부패턴을 갖는 네가티브 포토레지스트 패턴층; 및 상기 홈부패턴의 바닥부에 구비된 차광마스크패턴을 포함하며,상기 네가티브 포토레지스트의 홈부 패턴의 평균 깊이는 3㎛ 이상이고,상기 네가티브 포토레지스트 패턴층은 선폭이 상이한 적어도 2종의 홈부패턴을 포함하며, 상기 네가티브 포토레지스트 패턴층의 홈부 패턴의 평균 깊이는 동일하고,상기 적어도 2종의 홈부패턴 간의 선폭차이는 10㎛ 이상이며, 상기 선폭의 차이가 10㎛ 이상인 적어도 2종의 홈부패턴은 서로 연결된 것인 오프셋 인쇄용 클리쉐.
- 청구항 3에 있어서, 상기 포토레지스트 패턴층이 구비된 기판 상에 구비된 금속 산화막을 더 포함하는 것인 오프셋 인쇄용 클리쉐.
- 청구항 4에 있어서, 상기 금속 산화막의 평균 두께는 200nm 이하인 것인 오프셋 인쇄용 클리쉐.
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JP2017527770A JP6358488B2 (ja) | 2015-08-26 | 2016-08-26 | オフセット印刷用クリシェの製造方法及びオフセット印刷用クリシェ |
CN201680004462.8A CN107107603B (zh) | 2015-08-26 | 2016-08-26 | 用于胶版印刷的铅版的制造方法以及用于胶版印刷的铅版 |
US15/536,046 US10696081B2 (en) | 2015-08-26 | 2016-08-26 | Method for manufacturing cliché for offset printing, and cliché for offset printing |
EP16839660.4A EP3343591B1 (en) | 2015-08-26 | 2016-08-26 | Method for manufacturing cliché for offset printing, and cliché for offset printing |
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JP6358488B2 (ja) | 2018-07-18 |
KR102113903B1 (ko) | 2020-05-21 |
EP3343591A4 (en) | 2019-05-01 |
KR20170026257A (ko) | 2017-03-08 |
CN107107603B (zh) | 2020-05-05 |
US10696081B2 (en) | 2020-06-30 |
US20170368862A1 (en) | 2017-12-28 |
EP3343591A1 (en) | 2018-07-04 |
EP3343591B1 (en) | 2020-01-29 |
JP2018501509A (ja) | 2018-01-18 |
CN107107603A (zh) | 2017-08-29 |
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