WO2016108451A3 - Time-of-flight mass spectrometer - Google Patents

Time-of-flight mass spectrometer Download PDF

Info

Publication number
WO2016108451A3
WO2016108451A3 PCT/KR2015/013252 KR2015013252W WO2016108451A3 WO 2016108451 A3 WO2016108451 A3 WO 2016108451A3 KR 2015013252 W KR2015013252 W KR 2015013252W WO 2016108451 A3 WO2016108451 A3 WO 2016108451A3
Authority
WO
WIPO (PCT)
Prior art keywords
unit
ionization
ion
mass spectrometer
flight mass
Prior art date
Application number
PCT/KR2015/013252
Other languages
French (fr)
Korean (ko)
Other versions
WO2016108451A2 (en
Inventor
양모
김승용
김현식
정완섭
Original Assignee
한국기초과학지원연구원
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Priority claimed from KR1020150171695A external-priority patent/KR101786950B1/en
Application filed by 한국기초과학지원연구원 filed Critical 한국기초과학지원연구원
Priority to US15/321,563 priority Critical patent/US10388506B2/en
Priority to JP2016575356A priority patent/JP6346965B2/en
Priority to EP15875545.4A priority patent/EP3147933A4/en
Publication of WO2016108451A2 publication Critical patent/WO2016108451A2/en
Publication of WO2016108451A3 publication Critical patent/WO2016108451A3/en

Links

Classifications

    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00—Particle spectrometers or separator tubes
    • H01J49/02—Details
    • H01J49/10—Ion sources; Ion guns
    • H01J49/14—Ion sources; Ion guns using particle bombardment, e.g. ionisation chambers
    • H01J49/147—Ion sources; Ion guns using particle bombardment, e.g. ionisation chambers with electrons, e.g. electron impact ionisation, electron attachment
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00—Particle spectrometers or separator tubes
    • H01J49/02—Details
    • H01J49/08—Electron sources, e.g. for generating photo-electrons, secondary electrons or Auger electrons
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00—Particle spectrometers or separator tubes
    • H01J49/02—Details
    • H01J49/10—Ion sources; Ion guns
    • H01J49/14—Ion sources; Ion guns using particle bombardment, e.g. ionisation chambers
    • H01J49/142—Ion sources; Ion guns using particle bombardment, e.g. ionisation chambers using a solid target which is not previously vapourised
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J43/00—Secondary-emission tubes; Electron-multiplier tubes
    • H01J43/04—Electron multipliers
    • H01J43/06—Electrode arrangements
    • H01J43/18—Electrode arrangements using essentially more than one dynode
    • H01J43/24—Dynodes having potential gradient along their surfaces
    • H01J43/246—Microchannel plates [MCP]
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00—Particle spectrometers or separator tubes
    • H01J49/26—Mass spectrometers or separator tubes
    • H01J49/34—Dynamic spectrometers
    • H01J49/40—Time-of-flight spectrometers

Landscapes

  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • Plasma & Fusion (AREA)
  • Other Investigation Or Analysis Of Materials By Electrical Means (AREA)
  • Electron Tubes For Measurement (AREA)

Abstract

A time-of-flight mass spectrometer comprises: an ionization unit for receiving an electron beam and emitting ions; a cold electron supply unit for injecting an electron beam into the ionization unit; an ion detection unit for detecting ions discharged from the ionization unit; and an ion separation unit for connecting the ionization unit and the ion detection unit, wherein the cold electron supply unit comprises a microchannel plate, which receives ultraviolet rays and emits an electron beam, ions discharged from the ionization unit pass through the ion separation unit and reach the ion detection unit, and the ion separation unit has the shape of a straight tube.
PCT/KR2015/013252 2014-12-30 2015-12-04 Time-of-flight mass spectrometer WO2016108451A2 (en)

Priority Applications (3)

Application Number Priority Date Filing Date Title
US15/321,563 US10388506B2 (en) 2014-12-30 2015-12-04 Time-of-flight mass spectrometer using a cold electron beam as an ionization source
JP2016575356A JP6346965B2 (en) 2014-12-30 2015-12-04 Time-of-flight mass spectrometer
EP15875545.4A EP3147933A4 (en) 2014-12-30 2015-12-04 Time-of-flight mass spectrometer

Applications Claiming Priority (4)

Application Number Priority Date Filing Date Title
KR20140194149 2014-12-30
KR10-2014-0194149 2014-12-30
KR10-2015-0171695 2015-12-03
KR1020150171695A KR101786950B1 (en) 2014-12-30 2015-12-03 Time of flight mass spectrometer

Publications (2)

Publication Number Publication Date
WO2016108451A2 WO2016108451A2 (en) 2016-07-07
WO2016108451A3 true WO2016108451A3 (en) 2016-10-13

Family

ID=56285116

Family Applications (1)

Application Number Title Priority Date Filing Date
PCT/KR2015/013252 WO2016108451A2 (en) 2014-12-30 2015-12-04 Time-of-flight mass spectrometer

Country Status (1)

Country Link
WO (1) WO2016108451A2 (en)

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN109461642B (en) * 2018-12-07 2024-04-02 中国烟草总公司郑州烟草研究院 Ion-initiated electron bombardment ionization source

Citations (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2001078880A1 (en) * 2000-04-12 2001-10-25 The Regents Of The University Of California Method of reducing ion fragmentation in mass spectrometry
US20110073754A1 (en) * 2009-09-30 2011-03-31 United States Of America As Represented By The Administrator Of The National Aeronautics And Spac High precision electric gate for time-of-flight ion mass spectrometers
US20110234233A1 (en) * 2007-12-19 2011-09-29 Brucker Gerardo A Ionization Gauge Having Electron Multiplier Cold Emission Source
WO2013081195A1 (en) * 2011-11-28 2013-06-06 한국기초과학지원연구원 Anion generating and electron capture dissociation apparatus using cold electrons
JP2014078504A (en) * 2013-09-19 2014-05-01 Hamamatsu Photonics Kk Mcp unit, mcp detector and time-of-flight mass spectrometer

Patent Citations (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2001078880A1 (en) * 2000-04-12 2001-10-25 The Regents Of The University Of California Method of reducing ion fragmentation in mass spectrometry
US20110234233A1 (en) * 2007-12-19 2011-09-29 Brucker Gerardo A Ionization Gauge Having Electron Multiplier Cold Emission Source
US20110073754A1 (en) * 2009-09-30 2011-03-31 United States Of America As Represented By The Administrator Of The National Aeronautics And Spac High precision electric gate for time-of-flight ion mass spectrometers
WO2013081195A1 (en) * 2011-11-28 2013-06-06 한국기초과학지원연구원 Anion generating and electron capture dissociation apparatus using cold electrons
JP2014078504A (en) * 2013-09-19 2014-05-01 Hamamatsu Photonics Kk Mcp unit, mcp detector and time-of-flight mass spectrometer

Non-Patent Citations (1)

* Cited by examiner, † Cited by third party
Title
See also references of EP3147933A4 *

Also Published As

Publication number Publication date
WO2016108451A2 (en) 2016-07-07

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