WO2016101984A1 - Gitterspektrometer mit verbesserter auflösung - Google Patents
Gitterspektrometer mit verbesserter auflösung Download PDFInfo
- Publication number
- WO2016101984A1 WO2016101984A1 PCT/EP2014/079056 EP2014079056W WO2016101984A1 WO 2016101984 A1 WO2016101984 A1 WO 2016101984A1 EP 2014079056 W EP2014079056 W EP 2014079056W WO 2016101984 A1 WO2016101984 A1 WO 2016101984A1
- Authority
- WO
- WIPO (PCT)
- Prior art keywords
- diffraction
- arrangement
- angle
- diffracted
- wavelength
- Prior art date
Links
- 230000003595 spectral effect Effects 0.000 claims abstract description 26
- 238000000354 decomposition reaction Methods 0.000 claims abstract description 19
- 230000003287 optical effect Effects 0.000 claims description 15
- 230000008859 change Effects 0.000 claims description 5
- 239000006185 dispersion Substances 0.000 description 33
- 238000001228 spectrum Methods 0.000 description 19
- 238000000034 method Methods 0.000 description 13
- 230000008569 process Effects 0.000 description 12
- 238000001636 atomic emission spectroscopy Methods 0.000 description 8
- 244000089409 Erythrina poeppigiana Species 0.000 description 7
- 235000009776 Rathbunia alamosensis Nutrition 0.000 description 7
- 230000000694 effects Effects 0.000 description 5
- 230000005855 radiation Effects 0.000 description 4
- 238000013459 approach Methods 0.000 description 3
- 238000007792 addition Methods 0.000 description 2
- 238000011161 development Methods 0.000 description 2
- 230000018109 developmental process Effects 0.000 description 2
- 229910052751 metal Inorganic materials 0.000 description 2
- 239000002184 metal Substances 0.000 description 2
- 150000002739 metals Chemical class 0.000 description 2
- 241000352333 Amegilla alpha Species 0.000 description 1
- LKJPSUCKSLORMF-UHFFFAOYSA-N Monolinuron Chemical compound CON(C)C(=O)NC1=CC=C(Cl)C=C1 LKJPSUCKSLORMF-UHFFFAOYSA-N 0.000 description 1
- VYPSYNLAJGMNEJ-UHFFFAOYSA-N Silicium dioxide Chemical compound O=[Si]=O VYPSYNLAJGMNEJ-UHFFFAOYSA-N 0.000 description 1
- 238000004458 analytical method Methods 0.000 description 1
- 230000008878 coupling Effects 0.000 description 1
- 238000010168 coupling process Methods 0.000 description 1
- 238000005859 coupling reaction Methods 0.000 description 1
- 238000013461 design Methods 0.000 description 1
- 238000001514 detection method Methods 0.000 description 1
- 238000000295 emission spectrum Methods 0.000 description 1
- 238000013507 mapping Methods 0.000 description 1
- 239000000463 material Substances 0.000 description 1
- 230000007704 transition Effects 0.000 description 1
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colours
- G01J3/12—Generating the spectrum; Monochromators
- G01J3/18—Generating the spectrum; Monochromators using diffraction elements, e.g. grating
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colours
- G01J3/02—Details
- G01J3/0205—Optical elements not provided otherwise, e.g. optical manifolds, diffusers, windows
- G01J3/021—Optical elements not provided otherwise, e.g. optical manifolds, diffusers, windows using plane or convex mirrors, parallel phase plates, or particular reflectors
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colours
- G01J3/02—Details
- G01J3/0291—Housings; Spectrometer accessories; Spatial arrangement of elements, e.g. folded path arrangements
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colours
- G01J3/12—Generating the spectrum; Monochromators
- G01J3/18—Generating the spectrum; Monochromators using diffraction elements, e.g. grating
- G01J3/20—Rowland circle spectrometers
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colours
- G01J3/28—Investigating the spectrum
- G01J3/30—Measuring the intensity of spectral lines directly on the spectrum itself
- G01J3/36—Investigating two or more bands of a spectrum by separate detectors
Definitions
- the present invention relates to an arrangement for the spectral decomposition of light according to the preamble of claim 1 and an optical
- Optical emission spectrometry uses grating spectrometers to determine elemental contents in a sample by analyzing the radiation emission of excited atoms. Large spectral ranges have to be measured simultaneously - starting from the deep UV to the near IR.
- a diffraction grating causes a dispersion of the spectrum according to the
- the angular dispersion ⁇ / ⁇ (equation 2) gives the difference of the diffraction angle ⁇ for two wavelengths which differ by the small amount ⁇ .
- the spectral resolution of the spectrometer is essentially determined by the angular dispersion of the diffraction grating.
- the cut-off wavelength A G denotes the wavelength for which the
- Diffraction angle 90 ° reached (equation 3). Larger wavelengths than A G are no longer diffracted at this grid. The cut-off wavelength must therefore be above the longest wavelength of the spectrum to be displayed.
- Eq. 3 states that, for the diffraction of long wavelengths, the spacing of the grating grooves d must be large and the diffraction order N must be low. For a high angular dispersion, however, exactly the reverse procedure is necessary. According to Eq. 2, a high angular dispersion is due to a small angle
- the largest wavelength to be measured determines the groove spacing of the grid and thus also defines the angular dispersion.
- the demands for high spectral coverage and high angular dispersion can therefore not be realized simultaneously.
- Angle dispersion lower, here it depends mainly on the large extent of the simultaneously detected spectral range.
- the first way is to use different diffraction orders of a diffraction grating simultaneously. Parts of the spectrum with higher requirements for the angular dispersion are in higher
- the second approach is to combine several spectrometer units simultaneously in one device, with the respective diffraction gratings having different groove spacings. In this way, parts of the spectrum can be displayed with a higher angular dispersion than that
- spectrometer units in one device have disadvantages. All units must be optically in the same way to the radiation source
- Diffraction element normal is directed back to the diffraction element, in such a way that the angle differences ⁇ ⁇ and ⁇ have different signs.
- the dispersion can be increased for a certain part of the spectrum by adding the dispersion effects from both diffraction processes.
- the limitation of the angular dispersion by the largest wavelength to be measured, which determines the groove spacing of the grating, can thus be avoided.
- the feedback arrangement comprises an even number of reflective components which, by their successive reflections, cause the angle differences ⁇ ⁇ and ⁇ to have different signs.
- the return arrangement preferably has exactly two reflective components.
- the distance of the reflective components is adjustable.
- Angle of incidence ⁇ ⁇ are chosen so that a desired diffraction angle ⁇ 'is established during the second diffraction at the grating.
- the diffraction element is a reflective grating.
- the return arrangement has at least one wavelength-dispersive elements, so that in addition to the
- Feedback arrangement filters out wavelength sub-ranges within the interval ⁇ to ⁇ + ⁇ , which are not attributed to the diffraction element.
- the feedback arrangement has at least one curved surface optical element, thereby correcting for divergence of the incident beam and the diffracted beam. From this point of view, it may also be preferable to
- the diffraction order N is equal to 1 or 2.
- an optical spectrometer comprising an entrance slit from which incident light into the spectrometer falls on a previously-mentioned spectral decomposition arrangement of light and detectors for detecting the light diffracted by the diffraction grating.
- the arrangement for the spectral decomposition of light has the previous one
- the diffraction grating is concave and the detectors are arranged on a Rowland circle.
- Fig. 1 a schematic representation of a spectrometer with a
- Fig. 5 a schematic representation of a return arrangement with three
- Fig. 6 a schematic representation of an inventive
- Fig. 7 a schematic representation of another erfindungsg
- Fig. L shows a dispersion arrangement with a reflective
- the beam 2 is incident on the diffraction grating 1 at the angle ⁇ to the normal.
- the beam 2 contains the two
- a return assembly 5 directs the beam 3 as a beam 6 of wavelength ⁇ at the new angle of incidence ⁇ ⁇ back to the grid.
- the return assembly 5 simultaneously directs the beam 4 as
- a desired diffraction angle .beta..sub. ⁇ can be set by selecting the appropriate angle of incidence .alpha..sub. ⁇ in the second diffraction process.
- the multiplier e in Eq. 5 describes the development of the
- the return assembly 5 in FIG. l accomplishes the repatriation of the
- Beam 6 is.
- the condition ⁇ ⁇ - ⁇ applies.
- the multiplier e of Eq. 5 is about 2, and the angular dispersion is about twice as large.
- the return arrangement 5 can also contain optical elements, which in turn themselves
- Angular dispersion is thus already raised in the course of the beam return by means of the return assembly 5.
- the feedback assembly 5 may include optical filters whereby individual wavelengths or a portion from the wavelength interval ⁇ to ⁇ + ⁇ can be removed and these are no longer directed back to the grid.
- Diffraction pass about three times higher than the single-diffracted spectrum, about four times higher after the fourth pass, etc.
- FIG. 3 shows by way of example the second mirror 11 with a curved surface.
- the divergent beams 3, 4 arriving from the grating are transferred by the device 5 into the convergent beams 6, 7, which are directed back to the center of the grating.
- the same effect could also be achieved with a lens in the beam path of the device.
- a return arrangement 5 ' has a single mirror 10'.
- Figures 6 and 7 show two examples of an inventive
- FIGS. 6 and 7 show by way of example that the arrangement of the mirrors 18, 19 allows the angle of incidence ⁇ ⁇ to be selected so that a desired diffraction angle ⁇ 'is established at the second diffraction at the grating.
- a filter 20a is set on the line sensor 20, which filters out the original spectrum at this point.
- the inventive arrangement for the spectral decomposition of light makes it possible to split a broad, extended wavelength range, wherein a portion of the spectrum has an angular dispersion which is higher than the angular dispersion in the remaining wavelength range.
- the arrangement is through the use of a single dispersive element and the mapping of the spectrum to a single detector array, the more
- Detector elements z. B. line sensors 17, 20 can contain, inexpensive and compact.
Landscapes
- Physics & Mathematics (AREA)
- Spectroscopy & Molecular Physics (AREA)
- General Physics & Mathematics (AREA)
- Diffracting Gratings Or Hologram Optical Elements (AREA)
- Spectrometry And Color Measurement (AREA)
Abstract
Description
Claims
Priority Applications (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
DE112014007078.5T DE112014007078B4 (de) | 2014-12-22 | 2014-12-22 | Gitterspektrometer mit verbesserter auflösung |
PCT/EP2014/079056 WO2016101984A1 (de) | 2014-12-22 | 2014-12-22 | Gitterspektrometer mit verbesserter auflösung |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
PCT/EP2014/079056 WO2016101984A1 (de) | 2014-12-22 | 2014-12-22 | Gitterspektrometer mit verbesserter auflösung |
Publications (1)
Publication Number | Publication Date |
---|---|
WO2016101984A1 true WO2016101984A1 (de) | 2016-06-30 |
Family
ID=52144716
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
PCT/EP2014/079056 WO2016101984A1 (de) | 2014-12-22 | 2014-12-22 | Gitterspektrometer mit verbesserter auflösung |
Country Status (2)
Country | Link |
---|---|
DE (1) | DE112014007078B4 (de) |
WO (1) | WO2016101984A1 (de) |
Citations (6)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
GB765441A (en) * | 1953-03-24 | 1957-01-09 | William George Fastie | Spectroscopic device |
US2868063A (en) * | 1957-05-16 | 1959-01-13 | Leeds & Northrup Co | Adjustable mirror support in successive dispersion monochromator |
US6061129A (en) * | 1999-01-22 | 2000-05-09 | Cymer, Inc. | Compact high resolution grating spectrometer |
US6166805A (en) * | 1998-07-13 | 2000-12-26 | Ando Electric Co., Ltd. | Double pass monochromator |
US20020135879A1 (en) * | 2001-02-20 | 2002-09-26 | Valdimir Pogrebinsky | Super high resolution optical resonator |
WO2015018790A1 (fr) * | 2013-08-06 | 2015-02-12 | Commissariat à l'énergie atomique et aux énergies alternatives | Spectrometre a plusieurs reseaux de diffraction. |
Family Cites Families (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US2922331A (en) | 1953-03-24 | 1960-01-26 | Walter G Finch | Spectroscopic device |
EP1031825B1 (de) | 1999-02-26 | 2006-06-14 | Yokogawa Electric Corporation | Doppelmonochromator |
-
2014
- 2014-12-22 DE DE112014007078.5T patent/DE112014007078B4/de active Active
- 2014-12-22 WO PCT/EP2014/079056 patent/WO2016101984A1/de active Application Filing
Patent Citations (6)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
GB765441A (en) * | 1953-03-24 | 1957-01-09 | William George Fastie | Spectroscopic device |
US2868063A (en) * | 1957-05-16 | 1959-01-13 | Leeds & Northrup Co | Adjustable mirror support in successive dispersion monochromator |
US6166805A (en) * | 1998-07-13 | 2000-12-26 | Ando Electric Co., Ltd. | Double pass monochromator |
US6061129A (en) * | 1999-01-22 | 2000-05-09 | Cymer, Inc. | Compact high resolution grating spectrometer |
US20020135879A1 (en) * | 2001-02-20 | 2002-09-26 | Valdimir Pogrebinsky | Super high resolution optical resonator |
WO2015018790A1 (fr) * | 2013-08-06 | 2015-02-12 | Commissariat à l'énergie atomique et aux énergies alternatives | Spectrometre a plusieurs reseaux de diffraction. |
Also Published As
Publication number | Publication date |
---|---|
DE112014007078A5 (de) | 2017-08-17 |
DE112014007078B4 (de) | 2022-01-20 |
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