WO2016000169A1

WO2016000169A1 - Digital pre-distortion correction apparatus and method

Info

Publication number: WO2016000169A1
Application number: PCT/CN2014/081265
Authority: WO
Inventors: 肖宇翔; 朱尔霓; 殷潜; 黄鑫
Original assignee: 华为技术有限公司
Priority date: 2014-06-30
Filing date: 2014-06-30
Publication date: 2016-01-07
Also published as: CN105453421A; CN105453421B

Abstract

A DPD correction apparatus and method, which can ensure the effect of DPD correction. The apparatus comprises: a resolving unit, used for determining a standard correction coefficient according to an input signal of the DPD correction apparatus and an output signal of a power amplifier; a determining unit, used for determining a correction application coefficient according to the standard correction coefficient determined by the resolving unit and a power amplifier state representation value, the power amplifier state representation value being related to a parameter value of at least one power amplifier state parameter; and a correcting unit, used for performing DPD correction according to the correction application coefficient determined by the determining unit.

Description

一种数字预失真校正装置及方法技术领域 Digital predistortion correction device and method

本发明涉及无线通信领域，特别涉及一种数字预失真校正装置及方法。皆景技术 The present invention relates to the field of wireless communications, and in particular, to a digital predistortion correction apparatus and method. Scenery technology

在目前的无线发射机***中，尤其是 BTS ( Base Transceiver Station, 基站收发信台 ) ***，通常都会釆用 DPD ( Digital Pre-Distortion, 数字预失真）来对功放进行线性化校正，减小功放的非线性失真。其基本原理为设置一个非线性的 DPD校正装置和功放级联，使得整个链路呈现线性放大。 In the current wireless transmitter system, especially the BTS (Base Transceiver Station) system, DPD (Digital Pre-Distortion) is usually used to linearize the power amplifier and reduce the power amplifier. Nonlinear distortion. The basic principle is to set up a non-linear DPD correction device and amplifier cascade, so that the entire link exhibits linear amplification.

在基于标准 DPD校正方法的 DPD校正装置中，对于 DPD校正装置的输入信号: 可以预先选择一组非线性函数 (|χ(«)|)作为基础，并应用记忆参数和则可以得到一组基函数 / χ(«-∞)|)·χ(«-ρ)来拟合功放的非线性；其中， In the DPD correction device based on the standard DPD correction method, for the input signal of the DPD correction device: a set of nonlinear functions (|χ(«)|) can be selected in advance as a basis, and a set of bases can be obtained by applying the memory parameters and The function / χ(«-∞)|)·χ(«-ρ) to fit the nonlinearity of the power amplifier;

/=0、 1 L-1 , 为非线性函数的数量。 /=0, 1 L-1 , is the number of nonlinear functions.

此时，可以基于下述公式进行 DPD校正：

At this point, DPD correction can be performed based on the following formula:

其中，为 DPD校正装置的输出信号； /为标准校正系数，可以根据 DPD校正装置的输入信号；与功放的输出信号的差异釆用自适应迭代算法生成。 Wherein, it is the output signal of the DPD correction device; / is the standard correction coefficient, which can be generated according to the difference between the input signal of the DPD correction device and the output signal of the power amplifier by an adaptive iterative algorithm.

基于标准 DPD校正方法的 DPD校正装置的实现电路逻辑如图 1所示。当功放状态稳定时，基于标准 DPD校正方法的 DPD校正装置的校正效果较好；然而，在实际的应用场景中，多方面因素会导致功放在不同时刻状态变化较大，其非线性失真的特性也随之变化，此时基于标准 DPD校正方法的 DPD校正装置将很难保证校正效果。发明内容 The circuit logic of the implementation of the DPD correction device based on the standard DPD correction method is shown in FIG. When the power amplifier state is stable, the correction effect of the DPD correction device based on the standard DPD correction method is better; however, in the actual application scenario, various factors may cause the state of the power to be changed at different times, and the characteristics of the nonlinear distortion There is also a change, and at this time, the DPD correction device based on the standard DPD correction method will have difficulty in ensuring the correction effect. Summary of the invention

本发明实施例提供一种 DPD校正装置及方法，能够保证校正效果。 Embodiments of the present invention provide a DPD calibration apparatus and method, which can ensure a correction effect.

第一方面，提供一种 DPD校正装置，包括： In a first aspect, a DPD correction apparatus is provided, including:

解算单元，用于根据 DPD校正装置的输入信号、功放的输出信号确定标准校正系数； a solving unit, configured to determine a standard correction coefficient according to an input signal of the DPD correction device and an output signal of the power amplifier;

确定单元，用于根据所述解算单元确定的标准校正系数以及功放状态表征值，确定校正应用系数；其中，所述功放状态表征值和至少一种功放状态参数的参数值相关； a determining unit, configured to determine, according to a standard correction coefficient determined by the solving unit and a power state state characterization value, a correction applying coefficient; wherein, the power amplifier state characterization value is related to a parameter value of at least one power amp state parameter;

校正单元，用于基于所述确定单元确定的校正应用系数，进行 DPD校正。结合第一方面，在第一种可能的实现方式中，所述确定单元，具体用于当功放状态表征值的数量为一个，和一种功放状态参数在一个度量尺度下的参数值相关时，基于下述公式确定校正应用系数： And a correction unit configured to perform DPD correction based on the correction application coefficient determined by the determining unit. With reference to the first aspect, in a first possible implementation manner, the determining unit is specifically configured to: when the number of the power amplifier state representation values is one, and when the power amplifier state parameter is related to the parameter values in one measurement scale, The correction applied coefficient is determined based on the following formula:

S-1 S-1

C pml ) 〉 ^ umis 'Ss ) - s=0 , C pml ) 〉 ^ umis 'Ss ) - s=0 ,

其中，为功放状态表征值； Wherein, the value is represented by the power amplifier state;

：)为校正应用系数； :) Apply the coefficient for correction;

Cpmls为标准校正系数； Cpmls is the standard correction factor;

为一组非线性基函数， s=0、 1 S-l , S为非线性基函数的数量， 5≥1。 For a set of nonlinear basis functions, s = 0, 1 S - l , S is the number of nonlinear basis functions, 5 ≥ 1.

结合第一方面，在第二种可能的实现方式中，所述确定单元，具体用于当功放状态表征值的数量为 K个, 和一种功放状态参数在 f个度量尺度下的参数值分别相关时，基于下述公式确定校正应用系数： With reference to the first aspect, in a second possible implementation manner, the determining unit is specifically configured to: when the number of power amplifier state representation values is K, and a power amplifier state parameter in the f metric scales, respectively When relevant, the correction applied coefficient is determined based on the following formula:

^Cpml ( θ，3ΐ，· · ·，3κ—^) Ss.k (¾ ) ■ ^C pml ( θ,3ΐ,· · ·, 3κ—^) Ss.k (3⁄4 ) ■

，

,

其中，为功放状态表征值， k=0、 1 K-l , Κ>\ ; pmiqo ,

, . . . , qK-i)为校正应用系数； Where, for the power amplifier state representation value, k = 0, 1 Kl, Κ>\; pmiqo,

, . . . , qK-i) apply the coefficient for correction;

Cpmlks为标准校正系数； &, c( )为一组非线性基函数， s=0、 1 S-l , S为非线性基函数的数量， 5≥1。 Cpmlks is the standard correction factor; &, c( ) is a set of nonlinear basis functions, s = 0, 1 Sl , S is the number of nonlinear basis functions, 5 ≥ 1.

结合第一方面，在第三种可能的实现方式中，所述确定单元，具体用于当功放状态表征值的数量为 f个，和 f种功放状态参数的参数值分别相关时，基于下述公式确定校正应用系数：

， With reference to the first aspect, in a third possible implementation, the determining unit is specifically configured to: when the number of the power state state representation values is f, and the parameter values of the f power amplifier state parameters are respectively related, based on the following The formula determines the correction application factor:

,

其中，为功放状态表征值， k=0、 1 K-l , K>\ ; Among them, the power state state representation value, k=0, 1 K-l, K>\;

pmiqo ,

, . . . , qK-i)为校正应用系数； Pmiqo ,

, . . . , qK-i) apply the coefficient for correction;

为标准校正系数； Is the standard correction factor;

&, )为一组非线性基函数， s=0、 1 S-l , S为非线性基函数的数量， 5≥1。 &, ) is a set of nonlinear basis functions, s = 0, 1 S - l , S is the number of nonlinear basis functions, 5 ≥ 1.

结合第一方面，第一方面的第一种可能的实现方式，第一方面的第二种可能的实现方式，或者第一方面的第三种可能的实现方式，在第四种可能的实现方式中，所述功放状态参数具体包括功放的记忆效应的度量参数、功放的输入信号的功率、功放的输入信号的包络、功放的输入电压、功放的输入电流。 With reference to the first aspect, the first possible implementation manner of the first aspect, the second possible implementation manner of the first aspect, or the third possible implementation manner of the first aspect, in the fourth possible implementation manner The power amplifier state parameter specifically includes a measurement parameter of a memory effect of the power amplifier, a power of an input signal of the power amplifier, an envelope of an input signal of the power amplifier, an input voltage of the power amplifier, and an input current of the power amplifier.

第二方面，提供一种 DPD校正方法，包括： In a second aspect, a DPD correction method is provided, including:

根据 DPD校正装置的输入信号、功放的输出信号确定标准校正系数；根据所述标准校正系数以及功放状态表征值，确定校正应用系数；其中，所述功放状态表征值和至少一种功放状态参数的参数值相关； Determining a standard correction coefficient according to an input signal of the DPD correction device and an output signal of the power amplifier; determining a correction application coefficient according to the standard correction coefficient and the power amplifier state representation value; wherein, the power amplifier state representation value and the at least one power amplifier state parameter Parameter value correlation;

基于所述校正应用系数，进行 DPD校正。 DPD correction is performed based on the correction applied coefficients.

结合第二方面，在第一种可能的实现方式中，当功放状态表征值的数量为一个，和一种功放状态参数在一个度量尺度下的参数值相关时，根据所述标准校正系数以及功放状态表征值，确定校正应用系数，具体包括基于下述公式确定校正应用系数： s-ι With reference to the second aspect, in the first possible implementation manner, when the number of power amplifier state representation values is one, and a power amplifier state parameter is related to the parameter value of one measurement scale, according to the standard correction coefficient and the power amplifier The state characterization value, determining the correction application coefficient, specifically includes determining the correction application coefficient based on the following formula: S-ι

C pml ) 〉 C _Oml_s -§_s ) - 其中，为功放状态表征值； C pml ) 〉 C _Om l _s -§ _s ) - where, the value is represented by the power amplifier state;

：)为校正应用系数； :) Apply the coefficient for correction;

Cpmls为标准校正系数； Cpmls is the standard correction factor;

为一组非线性基函数， s=0、 1 S-l, S为非线性基函数的数量， 5≥1。 For a set of nonlinear basis functions, s = 0, 1 S - l, S is the number of nonlinear basis functions, 5 ≥ 1.

结合第二方面，在第二种可能的实现方式中，当功放状态表征值的数量为 f个，和一种功放状态参数在 f个度量尺度下的参数值分别相关时，根据所述标准校正系数以及功放状态表征值，确定校正应用系数，具体包括基于下述公式确定校正应用系数： With reference to the second aspect, in the second possible implementation manner, when the number of power amplifier state representation values is f, and a power amplifier state parameter is correlated with the parameter values of the f metric scales, respectively, according to the standard correction The coefficient and the power state state characterization value, determining the correction application coefficient, specifically including determining the correction application coefficient based on the following formula:

^Cpml ( θ，3ΐ，· ··，3κ—^) (¾ ) ■ ^C pml ( θ,3ΐ,···,3κ—^) (3⁄4 ) ■

，

,

其中，为功放状态表征值， k=0、 1 K-l, Κ>\; pmiqo ,

... , qK-i)为校正应用系数； Where, for the power amplifier state representation value, k = 0, 1 Kl, Κ>\; pmiqo,

... , qK-i) apply the coefficient for correction;

Cpmlks为标准校正系数； Cpmlks is the standard correction factor;

&, )为一组非线性基函数， s=0、 1 S-l, S为非线性基函数的数量， 5≥1。 &, ) is a set of nonlinear basis functions, s = 0, 1 S - l, S is the number of nonlinear basis functions, 5 ≥ 1.

结合第二方面，在第三种可能的实现方式中，当功放状态表征值的数量为 f个，和 f种功放状态参数的参数值分别相关时，根据所述标准校正系数以及功放状态表征值，确定校正应用系数，具体包括基于下述公式确定校正应用系数： With reference to the second aspect, in a third possible implementation manner, when the number of power amplifier state representation values is f, and the parameter values of the f power amplifier state parameters are respectively correlated, according to the standard correction coefficient and the power amplifier state representation value , determining the correction application coefficient, specifically including determining the correction application coefficient based on the following formula:

^Cpmt ( θ,3ΐ,· ··,3κ—^) ~ T mlhs Ss.k (¾ )■ ^C pmt ( θ,3ΐ,···,3κ—^) ~ T mlhs Ss.k (3⁄4 )■

k=T ^Cnk=T ^C n

0 s=0 ， 0 s=0,

其中，为功放状态表征值， k=0、 1 K-l, K>\; Wherein, for the power amplifier state representation value, k=0, 1 K-l, K>\;

Cpmiqo ,

qK-i)为校正应用系数； Cpmiqo,

qK-i) applies the coefficient for correction;

Cpmlks为标准校正系数； Cpmlks is the standard correction factor;

&, )为一组非线性基函数， s=0、 1 S-l, S为非线性基函数的数量， 5≥1。 &, ) is a set of nonlinear basis functions, s = 0, 1 Sl, S is a nonlinear basis The number of numbers, 5 ≥ 1.

结合第二方面，第二方面的第一种可能的实现方式，第二方面的第二种可能的实现方式，或者第二方面的第三种可能的实现方式，在第四种可能的实现方式中，所述功放状态参数具体包括功放的记忆效应的度量参数、功放的输入信号的功率、功放的输入信号的包络、功放的输入电压、功放的输入电流。 With reference to the second aspect, the first possible implementation manner of the second aspect, the second possible implementation manner of the second aspect, or the third possible implementation manner of the second aspect, in the fourth possible implementation manner The power amplifier state parameter specifically includes a measurement parameter of a memory effect of the power amplifier, a power of an input signal of the power amplifier, an envelope of an input signal of the power amplifier, an input voltage of the power amplifier, and an input current of the power amplifier.

根据第一方面提供的 DPD校正装置，第二方面提供的 DPD校正方法，在对功放进行线性化校正时所应用的系数，即校正应用系数和功放状态表征值相关；即使功放在不同时刻状态变化较大，因为本发明提供的 DPD校正方案考虑到了功放状态，因此相比于现有技术更为合理，能够保证校正效果。附图说明 According to the DPD correction apparatus provided by the first aspect, the DPD correction method provided by the second aspect relates to a coefficient applied when linearly correcting the power amplifier, that is, a correction application coefficient and a power amplifier state representation value; even if the power is changed at different times Larger, because the DPD correction scheme provided by the present invention takes into account the power amplifier state, it is more reasonable than the prior art, and the correction effect can be ensured. DRAWINGS

附图用来提供对本发明的进一步理解，并且构成说明书的一部分，与本发明实施例一起用于解释本发明，并不构成对本发明的限制。在附图中：图 1为基于标准 DPD校正方法的 DPD校正装置的实现电路的逻辑示意图； The drawings are intended to provide a further understanding of the invention, and are intended to be a part of the description of the invention. In the drawings: FIG. 1 is a logic diagram of an implementation circuit of a DPD correction apparatus based on a standard DPD correction method;

图 2为本发明实施例提供的 DPD校正装置的结构示意图； 2 is a schematic structural diagram of a DPD correction apparatus according to an embodiment of the present invention;

图 3为本发明实施例 1提供的 DPD校正装置的实现电路的逻辑示意图之图 4为本发明实施例 1提供的 DPD校正装置的实现电路的逻辑示意图之图 5为本发明实施例 2提供的 DPD校正装置的实现电路的逻辑示意图之图 6为本发明实施例 2提供的 DPD校正装置的实现电路的逻辑示意图之图 7为本发明实施例 3提供的 DPD校正装置的实现电路的逻辑示意图之图 8为本发明实施例 3提供的 DPD校正装置的实现电路的逻辑示意图之图 9为本发明实施例提供的 DPD校正方法的流程示意图。具体实施方式 3 is a schematic diagram of an implementation circuit of a DPD correction apparatus according to Embodiment 1 of the present invention. FIG. 4 is a schematic diagram of an implementation circuit of a DPD correction apparatus according to Embodiment 1 of the present invention. FIG. FIG. 6 is a schematic diagram of an implementation circuit of a DPD correction apparatus according to Embodiment 2 of the present invention. FIG. 7 is a schematic diagram of an implementation circuit of a DPD correction apparatus according to Embodiment 3 of the present invention. FIG. 8 is a schematic diagram of a schematic diagram of an implementation circuit of a DPD correction apparatus according to Embodiment 3 of the present invention. FIG. 9 is a schematic flowchart diagram of a DPD correction method according to an embodiment of the present invention. detailed description

为了给出保证 DPD校正效果的实现方案，本发明实施例提供了一种 DPD 校正装置及方法，以下结合说明书附图对本发明的优选实施例进行说明，应当理解，此处所描述的优选实施例仅用于说明和解释本发明，并不用于限定本发明。并且在不冲突的情况下，本申请中的实施例及实施例中的特征可以相互组合。 In order to provide an implementation solution for ensuring the DPD correction effect, an embodiment of the present invention provides a DPD correction apparatus and method. Hereinafter, a preferred embodiment of the present invention will be described with reference to the accompanying drawings. It should be understood that the preferred embodiments described herein are only The invention is illustrated and described, and is not intended to limit the invention. And in the case of no conflict, the embodiments in the present application and the features in the embodiments can be combined with each other.

本发明实施例提供一种 DPD校正装置，如图 2所示，具体包括：解算单元 201 , 用于根据 DPD校正装置的输入信号、功放的输出信号确定标准校正系数； The embodiment of the present invention provides a DPD correction device, as shown in FIG. 2, specifically comprising: a resolving unit 201, configured to determine a standard correction coefficient according to an input signal of the DPD correction device and an output signal of the power amplifier;

确定单元 202,用于根据解算单元 201确定的标准校正系数以及功放状态表征值，确定校正应用系数；其中，功放状态表征值和至少一种功放状态参数的参数值相关； The determining unit 202 is configured to determine, according to the standard correction coefficient determined by the solving unit 201 and the power amplifier state representation value, the correction application coefficient; wherein, the power amplifier state representation value is related to the parameter value of the at least one power amplifier state parameter;

校正单元 203 , 用于基于确定单元 202确定的校正应用系数，进行 DPD 校正。 The correcting unit 203 is configured to perform DPD correction based on the corrected application coefficient determined by the determining unit 202.

其中，功放状态参数具体包括功放的记忆效应的度量参数、功放的输入信号的功率、功放的输入信号的包络、功放的输入电压、功放的输入电流等参数。前述参数仅为示例，并不用于限定本发明，其它能够表征功放状态的参数也可以作为本发明中功放状态参数的一种。述。 The power state parameter includes the measurement parameter of the memory effect of the power amplifier, the power of the input signal of the power amplifier, the envelope of the input signal of the power amplifier, the input voltage of the power amplifier, and the input current of the power amplifier. The foregoing parameters are merely examples and are not intended to limit the present invention, and other parameters capable of characterizing the state of the power amplifier can also be used as one of the power state state parameters in the present invention. Said.

实施例 1 : Example 1

在本发明实施例 1 中，功放状态表征值的数量为一个，和一种功放状态参数在一个度量尺度下的参数值相关，例如，功放状态表征值仅和功放的记忆效应的度量参数在单位为微秒下的参数值相关。 In the first embodiment of the present invention, the number of power amplifier state representation values is one, and one power amplifier state parameter is related to the parameter value in one measurement scale, for example, the power amplifier state representation value is only related to the power amplifier record. The metric parameter of the recall effect is related to the parameter value in microseconds.

解算单元 201 , 具体可以根据 DPD校正装置的输入信号与功放的输出信号的差异釆用自适应迭代算法确定标准校正系数。 The resolving unit 201 can determine the standard correction coefficient by using an adaptive iterative algorithm according to the difference between the input signal of the DPD correcting device and the output signal of the power amplifier.

在解算单元 201确定标准校正系数后，确定单元 202具体可以基于下述公式确定校正应用系数：〉 After the solving unit 201 determines the standard correction coefficient, the determining unit 202 may specifically determine the correction applying coefficient based on the following formula:

：)为校正应用系数； :) Apply the coefficient for correction;

Cpmls为标准校正系数； Cpmls is the standard correction factor;

为一组非线性基函数， s=0 1 S-l , S为非线性基函数的数量， 5≥1 For a set of nonlinear basis functions, s = 0 1 S-l , S is the number of nonlinear basis functions, 5 ≥ 1

在确定单元 202确定校正应用系数后，校正单元 203基于该校正应用系数进行 DPD校正：

After the determining unit 202 determines the correction applied coefficient, the correcting unit 203 performs DPD correction based on the corrected applied coefficient:

=∑∑∑∑^c (|^χ("— |) · ^χ("— ) ; 其中，为 DPD校正装置的输入信号； =∑∑∑∑ ^c (| ^χ ("— |) · ^χ ("— ) ; where is the input signal of the DPD correction device;

为 DPD校正装置的输出信号； Correcting the output signal of the device for DPD;

(|x(«)|)为一组非线性函数， /=0 1 L-1 ; (|x(«)|) is a set of nonlinear functions, /=0 1 L-1 ;

w和;?为记忆参数。 w and ;? are memory parameters.

即此时可以将 _&(） · fi\x(n-m)\) · 作为 DPD校正的基函数，来拟合功放的非线性，解算单元 201按照该基函数确定标准校正系数 c_pmls。 That is, at this time, _& () · fi\x(nm)\) can be used as a basis function of the DPD correction to fit the nonlinearity of the power amplifier, and the solving unit 201 determines the standard correction coefficient c _pmls according to the basis function.

本发明实施例 1提供的 DPD校正装置的实现电路逻辑可以如图 3所示， DPD校正装置包括 χ Λ/ χ Ρ个非线性模块，其中，为非线性函数 (|χ(«)|)的数量， Λ Η己忆参数的数量， Ρ为记忆参数;？的数量。 The implementation circuit logic of the DPD correction apparatus provided in Embodiment 1 of the present invention may be as shown in FIG. 3. The DPD correction apparatus includes χ χ / Ρ a nonlinear module, where is a nonlinear function (|χ(«)|) Quantity, Λ ΗRecall the number of parameters, Ρ is the memory parameter; quantity.

在每个非线性模块中，釆用延时器 Delayl对输入信号: 进行处理，得到 x{n-p); 同时，对输入信号：取绝对值得到再釆用延时器 2对进行处理，得到作为函数 ()的输入；校正应用系数与函数 ()的输出的乘积再与延时器 1的输出的乘积，即为该非线性模块的输出， χΛ/χ Ρ个非线性模块的输出之和即为该 DPD校正装置的输出。 In each non-linear module, the delay signal Delayl is used to process the input signal: x{np); At the same time, for the input signal: take the absolute value and then use the delay pair 2 to process, get the input as function (); correct the product of the applied coefficient and the output of the function () and then the delay The product of the output of 1 is the output of the nonlinear module, and the sum of the outputs of the 非线性/χ non-linear modules is the output of the DPD correction device.

进一步的，也可以釆用二维的查找表实现图 3所示的 DPD校正装置，如图 4所示，此时： y{n) = ^x(n-p)-^^c_p^_s.g_s(q)-f_l(\x(n-m)\) Further, the DPD correction device shown in FIG. 3 can also be implemented by using a two-dimensional lookup table, as shown in FIG. 4, at this time: y{n) = ^x(np)-^^c _p ^ _s .g _s (q)-f _l (\x(nm)\)

= ^ (/7- ?)·^ LUT_2D (，|x(W- ；其中， LUT_2D 为二维查找表，计算好 q 和 |x(n-m)|的组合与

Corresponding relationship between the values stored in the two-dimensional lookup table LUT _2D , according to the current power amplifier state representation value q and the |x(nm)| output of the delayer 2, can determine the corresponding

(μ("-™)ι)的值。上述非线性基函数可以根据校正应用系数对功放状态表征值的依赖关系选取。具体实施时，可以选取一组简单的区间指标函数作为非线性基函数_&( )，例如： η= η ( )=ί^{λ lfge Is} .The value of (μ("-TM) ι) The above nonlinear basis function can be selected according to the dependence of the correction applied coefficient on the characterization value of the power amplifier state. In the specific implementation, a simple set of interval index function can be selected as the nonlinear basis function. _& ( ), for example: η= η ( )= ί ^{λ lfge Is} .

其中， L是对功放状态表征值的范围区间 I的一个划分，即 ^^=I 此时，校正应用系数对功放状态表征值 q的依赖关系就是分段的常数。在本发明实施例 1中，在对功放进行线性化校正时所应用的系数，即校正应用系数和一种功放状态参数在一个度量尺度下的参数值相关，即使功放在不同时刻状态变化较大，也能够保证 DPD校正效果。

Where L is a division of the range interval I of the power amplifier state representation value, that is, ^ ^{= I.} At this time, the dependence of the correction applied coefficient on the power amplifier state representation value q is a segmentation constant. In the first embodiment of the present invention, the coefficient applied when linearly correcting the power amplifier, that is, the correction applied coefficient and the parameter value of a power amplifier state parameter in one metric scale are related, even if the power is changed at different times. , can also guarantee the DPD correction effect.

实施例 2: Example 2:

在本发明实施例 2中，功放状态表征值的数量为 f个，和一种功放状态参数在 f 个度量尺度下的参数值分别相关，例如，功放状态表征值的数量为三个，其中，一个功放状态表征值和功放的记忆效应的度量参数在单位为微秒下的参数值相关，一个功放状态表征值和功放的记忆效应的度量参数在单位为毫秒下的参数值相关，一个功放状态表征值和功放的记忆效应的度量参数在单位为秒下的参数值相关。 In the second embodiment of the present invention, the number of power amplifier state representation values is f, and a power amplifier state The parameter values of the parameters in the f metrics are respectively related. For example, the number of characterization values of the power amplifier state is three. Among them, the metric value of a power amplifier state characterization value and the memory effect of the power amplifier are related to the parameter value in microseconds. The metric parameter of the power amplifier state characterization value and the memory effect of the power amplifier is related to the parameter value in milliseconds, and the metric parameter of the power amplifier state characterization value and the memory effect of the power amplifier are related to the parameter value in seconds.

解算单元 201, 具体可以根据 DPD校正装置的输入信号与功放的输出信号的差异釆用自适应迭代算法确定标准校正系数。 The resolving unit 201 can determine the standard correction coefficient by using an adaptive iterative algorithm according to the difference between the input signal of the DPD correction device and the output signal of the power amplifier.

在解算单元 201确定标准校正系数后，确定单元 202具体可以基于下述公式确定校正应用系数： ( θ，3ΐ，···，3κ—^) ^^ After the solving unit 201 determines the standard correction coefficient, the determining unit 202 can specifically determine the correction applying coefficient based on the following formula: ( θ, 3 ΐ, ···, 3κ-^) ^^

， ,

pmi(qo， q ...， qt-i)为校正应用系数； Pmi(qo, q ..., qt-i) is the correction applied coefficient;

为标准校正系数； Is the standard correction factor;

在确定单元 202确定校正应用系数 _ra/( Q, q_x, - 0后，校正单元 203 基于该校正应用系数进行 DPD校正： After the determining unit 202 determines the correction applied coefficient _{ra /} ( Q, q _x , - 0 , the correcting unit 203 performs DPD correction based on the corrected applied coefficient:

• ") ⁼∑∑∑^c i). (|^x("— )|).^x("—P)

• ") ⁼ ∑∑∑ ^c i). (| ^x ("- )|). ^x ("-P)

其中，为 DPD校正装置的输入信号； Wherein, the input signal of the DPD correction device;

(|x(«)|)为一组非线性函数； (|x(«)|) is a set of nonlinear functions;

w和;?为记忆参数。 w and ;? are memory parameters.

即此时可以将 _k(q_k) · fi(\x(n-m)\) · 作为 DPD校正的基函数，来拟合功放的非线性，解算单元 201按照该基函数确定标准校正系数 c_pmlks 本发明实施例 2提供的 DPD校正装置的实现电路逻辑可以如图 5所示。进一步的，也可以釆用维的查找表实现图 5所示的 DPD校正装置，如图 6所示，此时： That is, _k (q _k ) · fi(\x(nm)\) can be used as the basis function of the DPD correction. The non-linearity of the power amplifier, the resolving unit 201 determines the standard correction coefficient c _pmlks according to the basis function. The implementation circuit logic of the DPD correction apparatus provided in Embodiment 2 of the present invention can be as shown in FIG. 5. Further, the DPD correction device shown in FIG. 5 can also be implemented by using a lookup table of dimensions, as shown in FIG.

K S-1 K S-1

y{n) = ^x(n-p)-^^ ^c_p^.g_sk(q_k)-f_l(\x(n-m)\) y{n) = ^x(np)-^^ ^c _p ^.g _sk (q _k )-f _l (\x(nm)\)

s二 0

。上述非线性基函数&, 的选取方法可参见上述实施例 1。 s two 0

. For the selection method of the above nonlinear basis function &, refer to the above embodiment 1.

在本发明实施例 2中，校正应用系数和一种功放状态参数在 K个度量尺度下的参数值相关，因此，本发明实施例 2 方案可以应用于功放状态对某一种功放状态参数的多个尺度的度量有比较复杂的依赖关系的应用场景中。 In the second embodiment of the present invention, the correction application coefficient and a power amplifier state parameter are related to the parameter values of the K metric scales. Therefore, the embodiment 2 of the present invention can be applied to the power amplifier state for a certain power amplifier state parameter. The measure of the scale has a more complex dependency in the application scenario.

实施例 3: Example 3:

在本发明实施例 3中，功放状态表征值的数量为 f个，和 f种功放状态参数的参数值分别相关，例如，功放状态表征值的数量为三个，其中，一个功放状态表征值和功放的记忆效应的度量参数在单位为小时下的参数值相关，一个功放状态表征值和功放的输入信号的功率在单位为瓦下的参数值相关，一个功放状态表征值和功放的输入电压在单位为毫伏下的参数值相关。 In the third embodiment of the present invention, the number of power amplifier state representation values is f, and the parameter values of the f power amplifier state parameters are respectively related. For example, the number of power amplifier state representation values is three, wherein one power amplifier state representation value and The metric parameter of the memory effect of the power amplifier is related to the parameter value in units of hours. The power value of a power amplifier state and the power of the input signal of the power amplifier are related to the parameter value under the watt, and the power characterization state and the input voltage of the power amplifier are The unit is related to the parameter value at millivolts.

在解算单元 201确定标准校正系数后，确定单元 202具体可以基于下述公式确定校正应用系数：

， After the solution unit 201 determines the standard correction coefficient, the determining unit 202 may specifically determine the correction application coefficient based on the following formula:

,

其中，为功放状态表征值， k=0 1 K-l, K>\; Wherein, for the power amplifier state representation value, k=0 1 K-l, K>\;

为标准校正系数； Is the standard correction factor;

&, )为一组非线性基函数， s=0、 1 S-l, S为非线性基函数的数量， 5≥1 &, ) is a set of nonlinear basis functions, s = 0, 1 Sl, S is a nonlinear basis The number of numbers, 5≥1

• ") ⁼∑∑∑^c i). (|^x("— )|).^x("—P) • ") ⁼ ∑∑∑ ^c i). (| ^x ("- )|). ^x ("-P)

⁼ ΈΈΈTlΈ^Cprnlks^gs^M·fl(\^X{ⁿ-^m)\)·^χ{ⁿ-p)^ 其中，为 DPD校正装置的输入信号； ⁼ ΈΈΈTlΈ ^C prnlks^gs^M·fl(\ ^X { ⁿ - ^m )\)· ^χ { ⁿ -p)^ where is the input signal of the DPD correction device;

(|x(«)|)为一组非线性函数； (|x(«)|) is a set of nonlinear functions;

w和;?为记忆参数。即此时可以将

DPD校正的基函数，来拟合功放的非线性，解算单元 201按照该基函数确定标准校正系数 c_pmlks 本发明实施例 3提供的 DPD校正装置的实现电路逻辑可以如图 7所示。进一步的，也可以釆用维的查找表实现图 7所示的 DPD校正装置，如图 8所示，此时： w and ;? are memory parameters. That is, you can

The basis function of the DPD correction is used to fit the nonlinearity of the power amplifier. The solving unit 201 determines the standard correction coefficient c _pmlks according to the basis function. The implementation circuit logic of the DPD correction apparatus provided in Embodiment 3 of the present invention can be as shown in FIG. 7 . Further, the DPD correction device shown in FIG. 7 can also be implemented by using a lookup table of dimensions, as shown in FIG.

。.

上述非线性基函数&, 的选取方法可参见上述实施例 1 For the selection method of the above nonlinear basis function &, refer to the above embodiment 1

在本发明实施例 3中，校正应用系数和 f种功放状态参数的参数值相关，因此，本发明实施例 3 方案可以应用于功放状态对多种功放状态参数均有较强依赖关系的应用场景中。 In the embodiment 3 of the present invention, the correction application coefficient is related to the parameter value of the f power amplifier state parameter. Therefore, the embodiment 3 of the present invention can be applied to an application scenario in which the power amplifier state has strong dependence on various power amplifier state parameters. in.

基于同一发明构思，根据本发明上述实施例提供的 DPD校正装置，相应地，本发明实施例还提供一种 DPD校正方法，其结构示意图如图 9所示，具体包括： Based on the same inventive concept, the DPD correction apparatus provided by the above-mentioned embodiments of the present invention, and correspondingly, the embodiment of the present invention further provides a DPD correction method, and a schematic structural diagram thereof is shown in FIG. 9, which specifically includes:

根据 DPD校正装置的输入信号、功放的输出信号确定标准校正系数；根据该标准校正系数以及功放状态表征值，确定校正应用系数；其中，该功放状态表征值和至少一种功放状态参数的参数值相关； Determining a standard correction coefficient according to an input signal of the DPD correction device and an output signal of the power amplifier; Determining a correction application coefficient according to the standard correction coefficient and the power amplifier state representation value; wherein the power amplifier state representation value is related to the parameter value of the at least one power amplifier state parameter;

基于该校正应用系数，进行 DPD校正。 DPD correction is performed based on the correction applied coefficient.

进一步的，当功放状态表征值的数量为一个，和一种功放状态参数在一个度量尺度下的参数值相关时，根据该标准校正系数以及功放状态表征值，确定校正应用系数，具体包括基于下述公式确定校正应用系数： Further, when the number of the power state state representation values is one, and the power amplifier state parameter is related to the parameter value of the one measurement scale, determining the correction application coefficient according to the standard correction coefficient and the power amplifier state representation value, specifically including The formula determines the correction application factor:

S-1 S-1

C pml ) 〉 ^ umis 'Ss ) - s=0 , C pml ) 〉 ^ umis 'Ss ) - s=0 ,

：)为校正应用系数； :) Apply the coefficient for correction;

Cpmls为标准校正系数； Cpmls is the standard correction factor;

进一步的，当功放状态表征值的数量为 f 个，和一种功放状态参数在 f 个度量尺度下的参数值分别相关时，根据该标准校正系数以及功放状态表征值，确定校正应用系数，具体包括基于下述公式确定校正应用系数： Further, when the number of the power amplifier state representation values is f, and the power amplifier state parameters are respectively correlated with the parameter values of the f metric scales, determining the correction application coefficient according to the standard correction coefficient and the power amplifier state representation value, This includes determining the corrected application factor based on the following formula:

，

,

其中，为功放状态表征值， k=0、 1 K-l, Κ>\; pmiqo ,

... , qK-i) apply the coefficient for correction;

Cpmlks为标准校正系数； Cpmlks is the standard correction factor;

进一步的，当功放状态表征值的数量为 f个，和 f种功放状态参数的参数值分别相关时，根据该标准校正系数以及功放状态表征值，确定校正应用系数，具体包括基于下述公式确定校正应用系数： Further, when the number of the power state state representation values is f, and the parameter values of the f power amplifier state parameters are respectively correlated, determining the correction application coefficient according to the standard correction coefficient and the power amplifier state representation value, specifically including determining according to the following formula Correction application factor:

^Cpmt ( θ,3ΐ,· ··,3κ—^) ~ T nmlhs Ss.k (¾ )■ ^C pmt ( θ,3ΐ,···,3κ—^) ~ T nmlhs Ss.k (3⁄4 )■

k=T ^C k=T ^C

0 s=0 ，其中，为功放状态表征值， k=0、 1 K-l , Κ>\ ; pmiqo ,

, . . . , qK-i)为校正应用系数； 0 s=0, Where, for the power amplifier state representation value, k = 0, 1 Kl, Κ>\; pmiqo,

, . . . , qK-i) apply the coefficient for correction;

为标准校正系数； Is the standard correction factor;

其中，该功放状态参数具体包括功放的记忆效应的度量参数、功放的输入信号的功率、功放的输入信号的包络、功放的输入电压、功放的输入电流。 The power state parameter specifically includes a measurement parameter of a memory effect of the power amplifier, a power of the input signal of the power amplifier, an envelope of an input signal of the power amplifier, an input voltage of the power amplifier, and an input current of the power amplifier.

上述流程中的各处理步骤可对应于图 2-图 8所示相应单元的功能，在此不再赘述。 The processing steps in the above process may correspond to the functions of the corresponding units shown in FIG. 2-8, and are not described herein again.

本领域内的技术人员应明白，本发明的实施例可提供为方法、 ***、或计算机程序产品。因此，本发明可釆用完全硬件实施例、完全软件实施例、或结合软件和硬件方面的实施例的形式。而且，本发明可釆用在一个或多个其中包含有计算机可用程序代码的计算机可用存储介质 (包括但不限于磁盘存储器、 CD-ROM、光学存储器等）上实施的计算机程序产品的形式。 Those skilled in the art will appreciate that embodiments of the present invention can be provided as a method, system, or computer program product. Accordingly, the present invention may take the form of an entirely hardware embodiment, an entirely software embodiment, or a combination of software and hardware. Moreover, the invention can be embodied in the form of one or more computer program products embodied on a computer-usable storage medium (including but not limited to disk storage, CD-ROM, optical storage, etc.) in which computer usable program code is embodied.

本发明是参照根据本发明实施例的方法、设备（***）、和计算机程序产品的流程图和 /或方框图来描述的。应理解可由计算机程序指令实现流程图和 /或方框图中的每一流程和 /或方框、以及流程图和 /或方框图中的流程和 /或方框的结合。可提供这些计算机程序指令到通用计算机、专用计算机、嵌入式处理机或其他可编程数据处理设备的处理器以产生一个机器，使得通过计算机或其他可编程数据处理设备的处理器执行的指令产生用于实现在流程图一个流程或多个流程和 /或方框图一个方框或多个方框中指定的功能的装置。 The present invention has been described with reference to flowchart illustrations and/or block diagrams of methods, apparatus (system), and computer program products according to embodiments of the invention. It will be understood that each flow and/or block of the flowcharts and/or block diagrams, and combinations of flow and/or blocks in the flowcharts and/or block diagrams can be implemented by computer program instructions. These computer program instructions can be provided to a processor of a general purpose computer, special purpose computer, embedded processor, or other programmable data processing device to produce a machine for the execution of instructions for execution by a processor of a computer or other programmable data processing device. Means for implementing the functions specified in one or more of the flow or in a block or blocks of the flow chart.

这些计算机程序指令也可存储在能引导计算机或其他可编程数据处理设备以特定方式工作的计算机可读存储器中，使得存储在该计算机可读存储器中的指令产生包括指令装置的制造品，该指令装置实现在流程图一个流程或多个流程和 /或方框图一个方框或多个方框中指定的功能。 The computer program instructions can also be stored in a computer readable memory that can direct a computer or other programmable data processing device to operate in a particular manner, such that the instructions stored in the computer readable memory produce an article of manufacture comprising the instruction device. The apparatus implements the functions specified in one or more blocks of a flow or a flow and/or block diagram of the flowchart.

这些计算机程序指令也可装载到计算机或其他可编程数据处理设备上，使得在计算机或其他可编程设备上执行一系列操作步骤以产生计算机实现的处理，从而在计算机或其他可编程设备上执行的指令提供用于实现在流程图一个流程或多个流程和 /或方框图一个方框或多个方框中指定的功能的步骤。 These computer program instructions can also be loaded onto a computer or other programmable data processing device. Having a series of operational steps performed on a computer or other programmable device to produce computer-implemented processing, such that instructions executed on a computer or other programmable device are provided for implementing one or more processes and/or block diagrams in the flowchart The steps of a function specified in a box or multiple boxes.

尽管已描述了本发明的优选实施例，但本领域内的技术人员一旦得知了基本创造性概念，则可对这些实施例作出另外的变更和修改。所以，所附权利要求意欲解释为包括优选实施例以及落入本发明范围的所有变更和修改。脱离本发明实施例的精神和范围。这样，倘若本发明实施例的这些修改和变型属于本发明权利要求及其等同技术的范围之内，则本发明也意图包含这些改动和变型在内。 Although the preferred embodiment of the invention has been described, it will be apparent to those skilled in the < Therefore, the appended claims are intended to be interpreted as including the preferred embodiments and the modifications and modifications The spirit and scope of the embodiments of the present invention are departed. Thus, it is intended that the present invention cover the modifications and modifications of the embodiments of the invention.

Claims

权利要求 Rights request

1、一种数字预失真 DPD校正装置，其特征在于，包括： A digital predistortion DPD correction apparatus, comprising:

校正单元，用于基于所述确定单元确定的校正应用系数，进行 DPD校正。 And a correction unit configured to perform DPD correction based on the correction application coefficient determined by the determining unit.

2、如权利要求 1所述的装置，其特征在于，所述确定单元，具体用于当功放状态表征值的数量为一个，和一种功放状态参数在一个度量尺度下的参数值相关时，基于下述公式确定校正应用系数： The device according to claim 1, wherein the determining unit is specifically configured to: when the number of power amplifier state representation values is one, and when a power amplifier state parameter is related to a parameter value in one metric scale, The correction applied coefficient is determined based on the following formula:

S-1 S-1

C pml ) 〉 ^ umis 'Ss ) - s=0 , C pml ) 〉 ^ umis 'Ss ) - s=0 ,

：)为校正应用系数； :) Apply the coefficient for correction;

Cpmls为标准校正系数； Cpmls is the standard correction factor;

3、如权利要求 1所述的装置，其特征在于，所述确定单元，具体用于当功放状态表征值的数量为 f个，和一种功放状态参数在 K个度量尺度下的参数值分别相关时，基于下述公式确定校正应用系数： The device according to claim 1, wherein the determining unit is specifically configured to: when the number of power amplifier state representation values is f, and a power amplifier state parameter in the K metric scales, respectively When relevant, the correction applied coefficient is determined based on the following formula:

，

,

pmi(qo， q …， qK-i)为校正应用系数； Pmi(qo, q ..., qK-i) is the correction applied coefficient;

Cpmlks为标准校正系数； Cpmlks is the standard correction factor;

&, )为一组非线性基函数， s=0、 1 S-l , S为非线性基函数的数量， 5≥1。 &, ) is a set of nonlinear basis functions, s = 0, 1 Sl, S is a nonlinear basis The number of numbers, 5 ≥ 1.

4、如权利要求 1所述的装置，其特征在于，所述确定单元，具体用于当功放状态表征值的数量为 K个, 和 f种功放状态参数的参数值分别相关时，基于下述公式确定校正应用系数： The device according to claim 1, wherein the determining unit is specifically configured to: when the number of power amplifier state representation values is K, and the parameter values of the f power amplifier state parameters are respectively correlated, based on the following The formula determines the correction application factor:

, q₁, ..., q_K_₁ ) = ^c fa -g_s,k (¾ ), q ₁ , ..., q _K _ ₁ ) = ^c fa -g _s ,k (3⁄4 )

其中，为功放状态表征值， k=Q、 1 Κ-\ , Κ>\ ; pmi(qo， q …， qK-i)为校正应用系数； Wherein, for the power amplifier state representation value, k=Q, 1 Κ-\ , Κ>\ ; pmi(qo, q ..., qK-i) is the correction application coefficient;

为标准校正系数； Is the standard correction factor;

5、如权利要求 1-4任一所述的装置，其特征在于，所述功放状态参数具体包括功放的记忆效应的度量参数、功放的输入信号的功率、功放的输入信号的包络、功放的输入电压、功放的输入电流。 The device according to any one of claims 1 to 4, wherein the power amplifier state parameter specifically includes a metric parameter of a memory effect of the power amplifier, a power of an input signal of the power amplifier, an envelope of an input signal of the power amplifier, and a power amplifier. Input voltage, input current of the amplifier.

6、一种数字预失真 DPD校正方法，其特征在于，包括： 6. A digital predistortion DPD correction method, comprising:

7、如权利要求 6所述的方法，其特征在于，当功放状态表征值的数量为一个，和一种功放状态参数在一个度量尺度下的参数值相关时，根据所述标准校正系数以及功放状态表征值，确定校正应用系数，具体包括基于下述公式确定校正应用系数：

7. The method according to claim 6, wherein when the number of power amplifier state representation values is one, and a power amplifier state parameter is related to a parameter value at a metric scale, according to the standard correction coefficient and the power amplifier The state characterization value, determining the correction application coefficient, specifically includes determining the correction application coefficient based on the following formula:

：)为校正应用系数; Cpmls为标准校正系数； :) Apply the coefficient for correction; Cpmls is the standard correction factor;

8、如权利要求 6所述的方法，其特征在于，当功放状态表征值的数量为 f个，和一种功放状态参数在 f 个度量尺度下的参数值分别相关时，根据所述标准校正系数以及功放状态表征值，确定校正应用系数，具体包括基于下述公式确定校正应用系数：

8. The method according to claim 6, wherein when the number of power amplifier state representation values is f, and a power amplifier state parameter is correlated with parameter values of f metric scales, respectively, according to the standard correction The coefficient and the power state state characterization value, determining the correction application coefficient, specifically including determining the correction application coefficient based on the following formula:

其中，为功放状态表征值， k=Q、 1 K-\ , Κ>\ ; Among them, the power state state representation value, k=Q, 1 K-\, Κ>\ ;

Cpmlks为标准校正系数； Cpmlks is the standard correction factor;

9、如权利要求 6所述的方法，其特征在于，当功放状态表征值的数量为 f 个，和 f种功放状态参数的参数值分别相关时，根据所述标准校正系数以及功放状态表征值，确定校正应用系数，具体包括基于下述公式确定校正应用系数：

The method according to claim 6, wherein when the number of power amplifier state representation values is f, and the parameter values of the f power amplifier state parameters are respectively correlated, the standard correction coefficient and the power amplifier state representation value are , determining the correction application coefficient, specifically including determining the correction application coefficient based on the following formula:

Cpmlks为标准校正系数； Cpmlks is the standard correction factor;

10、如权利要求 6-9任一所述的方法，其特征在于，所述功放状态参数具体包括功放的记忆效应的度量参数、功放的输入信号的功率、功放的输入信号的包络、功放的输入电压、功放的输入电流。 The method according to any one of claims 6-9, wherein the power amplifier state parameter specifically includes a metric parameter of a memory effect of the power amplifier, a power of an input signal of the power amplifier, and an input signal of the power amplifier. The envelope of the number, the input voltage of the amplifier, and the input current of the amplifier.