WO2015032106A1 - Light-on test fixture, and testing method for liquid crystal panel - Google Patents
Light-on test fixture, and testing method for liquid crystal panel Download PDFInfo
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- WO2015032106A1 WO2015032106A1 PCT/CN2013/083367 CN2013083367W WO2015032106A1 WO 2015032106 A1 WO2015032106 A1 WO 2015032106A1 CN 2013083367 W CN2013083367 W CN 2013083367W WO 2015032106 A1 WO2015032106 A1 WO 2015032106A1
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- liquid crystal
- crystal panel
- conductive metal
- test fixture
- scanning signal
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- 238000012360 testing method Methods 0.000 title claims abstract description 83
- 239000004973 liquid crystal related substance Substances 0.000 title claims abstract description 61
- 239000002184 metal Substances 0.000 claims abstract description 44
- 229910052751 metal Inorganic materials 0.000 claims abstract description 44
- 238000010998 test method Methods 0.000 claims description 10
- 239000000463 material Substances 0.000 claims description 9
- 239000004020 conductor Substances 0.000 claims description 8
- 229910052802 copper Inorganic materials 0.000 claims description 3
- 229910052737 gold Inorganic materials 0.000 claims description 3
- 238000012545 processing Methods 0.000 claims description 3
- 239000003292 glue Substances 0.000 claims 2
- 238000003475 lamination Methods 0.000 claims 2
- 230000007547 defect Effects 0.000 abstract description 37
- 238000000034 method Methods 0.000 abstract description 19
- 238000004519 manufacturing process Methods 0.000 abstract description 4
- 238000002360 preparation method Methods 0.000 description 4
- 230000002950 deficient Effects 0.000 description 3
- 239000010409 thin film Substances 0.000 description 3
- 210000002858 crystal cell Anatomy 0.000 description 2
- 238000007689 inspection Methods 0.000 description 2
- 238000003825 pressing Methods 0.000 description 2
- 238000012790 confirmation Methods 0.000 description 1
- 230000007812 deficiency Effects 0.000 description 1
- 238000013461 design Methods 0.000 description 1
- 238000009413 insulation Methods 0.000 description 1
Classifications
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- G—PHYSICS
- G09—EDUCATION; CRYPTOGRAPHY; DISPLAY; ADVERTISING; SEALS
- G09G—ARRANGEMENTS OR CIRCUITS FOR CONTROL OF INDICATING DEVICES USING STATIC MEANS TO PRESENT VARIABLE INFORMATION
- G09G3/00—Control arrangements or circuits, of interest only in connection with visual indicators other than cathode-ray tubes
- G09G3/006—Electronic inspection or testing of displays and display drivers, e.g. of LED or LCD displays
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- G—PHYSICS
- G02—OPTICS
- G02F—OPTICAL DEVICES OR ARRANGEMENTS FOR THE CONTROL OF LIGHT BY MODIFICATION OF THE OPTICAL PROPERTIES OF THE MEDIA OF THE ELEMENTS INVOLVED THEREIN; NON-LINEAR OPTICS; FREQUENCY-CHANGING OF LIGHT; OPTICAL LOGIC ELEMENTS; OPTICAL ANALOGUE/DIGITAL CONVERTERS
- G02F2203/00—Function characteristic
- G02F2203/69—Arrangements or methods for testing or calibrating a device
Definitions
- the present invention relates to a test fixture, and more particularly to a test fixture for performing a lighting test during processing of a liquid crystal panel, and testing the liquid crystal panel using the test fixture method.
- a liquid crystal display or LCD (Liquid Crystal Display) is a flat, ultra-thin display design
- LCD monitors have low power consumption and are characterized by high image quality, small size, and light weight, so they are favored by everyone and become the mainstream of displays.
- LCD monitors have low power consumption and are characterized by high image quality, small size, and light weight, so they are favored by everyone and become the mainstream of displays.
- liquid crystal displays are mainly thin film transistor (TFT) liquid crystal displays, and the fabrication of general thin film transistor liquid crystal displays can be roughly divided into three parts: thin film transistor array (TFT Array) preparation process and color filter plate preparation.
- Engineering liquid crystal display unit assembly (LC Cel l Assembly) preparation process, liquid crystal display module (Liquid Crystal Module, LCM) preparation process. In the process of manufacturing the liquid crystal panel, a plurality of inspection procedures are required.
- the test process first inputs a test signal to the liquid crystal panel to make the pixels appear color, and then observes each pixel one by one through the defect detecting device. This process is called a Light-on Test.
- the shorting bar (Shorting Bar) lighting test method is adopted.
- the Shorting Bar lighting test method generally connects all the data signal (Date) terminals to each other to form a Date signal receiving end.
- the gate signals of the odd rows are connected to each other to form a first Gate signal receiving end, and the Gate signal terminals of the even rows are connected to each other to form a second Gate signal receiving end.
- This test method has low cost and is tested.
- the jig is easy to make, but there are fewer defects that can be detected. Moreover, due to the large number of signal terminals, poor contact may occur when the terminals are connected to each other.
- the Shorting Bar lighting test method is used to trace the outer edges of the Shorting Bar. The bad error is that the LCD panel is defective.
- the 1G1D lighting test method is further confirmed.
- This test method is different from the Shorting Bar method in that the Gate signal is divided into more groups of scanning signal receiving terminals G1, G2, -Gn, as shown in Fig. 1, the cut LCD is completed.
- the box includes a liquid crystal panel area 10 and a nip area 20, and the nip area 20 is provided with a plurality of data signal terminals 201 and a plurality of scanning signal terminals 202 for connecting the data signals and the scanning signals to the pixel units of the liquid crystal panel.
- each set of scanning signal receiving ends includes 300 ⁇ 800 scanning signal terminals 202, generally each of which uses a planar conductive paste 30 to connect each set of scanning signal terminals to each other.
- the use of a flat conductive paste to connect a signal terminal may cause a problem of a false line caused by poor contact, and there is a case of misjudgment.
- the present invention provides a lighting test fixture and a method for testing a liquid crystal panel using the test fixture, which can effectively reduce the false positive rate of the lighting test and quickly confirm the The detected defect is a true LCD panel defect or a defect in the test fixture.
- a lighting test fixture for a lighting test operation in a liquid crystal panel processing process comprising: a first conductive layer; disposed on the first conductive layer a plurality of conductive metal portions and a plurality of insulating portions arranged at a distance from each other, wherein the plurality of conductive metal portions are electrically connected to each other through the first conductive layer; wherein the conductive metal portion is higher than the insulating portion.
- the material of the first conductive layer is a conductive paste.
- the conductive metal portion is 0 to 1 mm higher than the insulating portion. Wherein, the conductive metal portion and the insulating portion are both elongated structures.
- the plurality of conductive metal portions and the plurality of insulating portions have the same width.
- the conductive metal portion has the same width as the insulating portion.
- the material of the conductive metal portion is a wear-resistant conductive material, and the wear-resistant conductive material is Cu or
- Another aspect of the present invention provides a liquid crystal panel testing method, the method comprising: (1) providing a liquid crystal panel, the liquid crystal panel comprising a liquid crystal panel area and a pressing area, wherein the pressing area is provided with a plurality of data signal terminals and a plurality of scanning signal terminals for connecting the data signal and the scanning signal Entering into the pixel unit of the liquid crystal panel;
- test fixtures are electrically connected to the scan signal terminals, wherein the conductive metal portions of the test fixture are oppositely connected to the scan signal terminals;
- FIG. 1 is a schematic view showing a conventional lighting test of a liquid crystal panel in which a scanning conductive signal is connected to each other by a planar conductive paste.
- FIG 2 is a front elevational view of a test fixture in accordance with an embodiment of the present invention.
- Figure 3 is a top plan view of the test fixture shown in Figure 2.
- DETAILED DESCRIPTION OF THE INVENTION As described above, an object of the present invention is to provide a lighting test fixture, and a method of testing a liquid crystal panel using the test fixture, the lighting test fixture comprising: a first conductive layer; a plurality of conductive metal portions and a plurality of insulating portions spaced apart from each other on the first conductive layer, wherein the plurality of conductive metal portions are electrically connected to each other through the first conductive layer; wherein the conductive metal The portion is higher than the insulating portion.
- the lighting test fixture can effectively reduce the false positive rate of the lighting test, and quickly confirm whether the detected defect is a true liquid crystal panel defect or a defect of the test fixture.
- the lighting test fixture in this embodiment includes: a first conductive layer 401; and a plurality of conductive metal portions 402 and a plurality of insulations arranged on the first conductive layer 401 Between the plurality of conductive metal portions 402, the first conductive layer 401 is electrically connected to each other; wherein the conductive metal portion 402 is higher than the insulating portion 403, wherein the conductive metal portion 402 is The insulating portion 403 is 0 to 1 mm high.
- the material of the first conductive layer 401 is a conductive paste
- the material of the conductive metal portion 402 is a wear-resistant conductive material
- the wear-resistant conductive material may be Cu or Au; in this embodiment, the conductive metal portion 402
- the material is Cu.
- the conductive metal portion 402 and the insulating portion 403 are both elongated structures, and the plurality of conductive metal portions 402 and the plurality of insulating portions 403 have the same width, and the The conductive metal portion 402 has the same width as the insulating portion 403.
- a method of performing a lighting test on a liquid crystal panel using the test fixture as described above includes the following steps:
- a liquid crystal panel is provided.
- the liquid crystal panel includes a liquid crystal panel region 10 and a nip region 20, and the nip region 20 is provided with a plurality of data signal terminals 201 and a plurality of scanning signal terminals 202.
- the nip region 20 is provided with a plurality of data signal terminals 201 and a plurality of scanning signal terminals 202.
- test fixtures are electrically connected to the scan signal terminals 202, wherein the conductive metal portions 402 in the test fixture are oppositely connected to the scan signal terminals 202;
- the data signal is input to the Date signal receiving terminal D, and the scanning signal is input to the scanning signal receiving terminals G1, G2, -Gn, and the liquid crystal panel is subjected to a lighting test.
- the lighting test fixture of the present embodiment is provided with a misalignment connection. If the defect point does not move following the movement of the test fixture, the defect point is A true liquid crystal panel defect; if the defect point moves with the movement of the test fixture, it indicates that the defect point is not a true liquid crystal panel defect.
- the first conductive metal portion of the lighting test fixture is connected to the tenth scanning signal terminal of the scanning signal receiving end G1 during the first test, and the first A defect occurs in the liquid crystal panel area corresponding to the 10 scanning signal terminals; at this time, the lighting test fixture is misaligned, and the 10th conductive metal portion of the lighting test fixture is connected to the 15th scanning signal terminal of the scanning signal receiving end G1. If the defect point does not move with the movement of the test fixture, it is still displayed as the corresponding 10th scan signal terminal.
- each set of scanning signal terminals includes 300 to 800 scanning signal terminals 202.
- the scan signals in the step (3) are input one by one to the scan signal receiving ends G1, G2, and Gn.
- the invention can effectively reduce the false positive rate of the lighting test, and quickly confirm whether the detected defect is a true liquid crystal panel defect or a defect of the test fixture.
- relational terms such as first and second are used merely to distinguish one entity or operation from another entity or operation, and do not necessarily require or imply these entities or operations. There is any such actual relationship or order between them.
- the terms "including”, “comprising” or “comprising” or “comprising” are intended to encompass a non-exclusive inclusion, such that a process, method, article, or device that includes a plurality of elements includes not only those elements but also Other elements, or elements that are inherent to such a process, method, item, or device. An element defined by the phrase “comprising a " does not exclude the presence of additional elements in the process, method, item, or device that comprises the element.
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- Computer Hardware Design (AREA)
- General Physics & Mathematics (AREA)
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Abstract
A light-on test fixture, and method for conducting light-on test on a liquid crystal panel by using the light-on test fixture, used for light-on test in the liquid crystal panel manufacturing process; the light-on test fixture comprises a first conductive layer (401), and a plurality of conductive metal parts (402) and a plurality of insulating parts (403) intervally arranged on the first conductive layer (401); the plurality of conductive metal parts (402) are electrically connected to each other via the first conductive layer (401); and the conductive metal parts (402) are higher than the insulating parts (403). The light-on test fixture can effectively reduce the misjudgment rate of a light-on test, and quickly determine whether a detected defect is the real defect of a liquid crystal panel or a defect of the test fixture.
Description
点灯测试治具以及液晶面板测试方法 技术领域 本发明涉及一种测试治具， 特别是一种在液晶面板加工过程中进行点灯测 试的测试治具， 以及使用该测试治具对液晶面板进行测试的方法。 BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a test fixture, and more particularly to a test fixture for performing a lighting test during processing of a liquid crystal panel, and testing the liquid crystal panel using the test fixture method.
说 Say
背景技术 液晶显示器， 或称 LCD (Liquid Crystal Display ) , 为平面超薄的显示设 书 BACKGROUND OF THE INVENTION A liquid crystal display, or LCD (Liquid Crystal Display), is a flat, ultra-thin display design
备， 它由一定数量的彩色或黑白像素组成， 放置于光源或者反射面前方。 液晶 显示器功耗很低， 并且具有高画质、 体积小、 重量轻的特点， 因此倍受大家青 睐， 成为显示器的主流。 目前液晶显示器是以薄膜晶体管 （Thin Fi lm Transi stor, TFT ) 液晶显示器为主， 而一般薄膜晶体管液晶显示器的制作可大 致分为三部分： 薄膜晶体管阵列 （TFT Array) 制备过程以及彩色滤光板制备工 程、 液晶显示单元组装 （LC Cel l Assembly ) 制备过程、 液晶显示模块 （Liquid Crystal Module, LCM) 制备过程。 液晶面板在制作的过程中，需要进行多个检验程序，其中一个很重要检验程 序就是对切割完成的液晶盒进行测试 (Cel l Test)，确认液晶盒是否存在缺陷。 该测试过程先是对液晶面板输入测试信号， 使其像素呈现色彩， 接着通过缺陷 检测装置逐一观察各个像素是否良好， 此过程称为点灯测试 （Light-on Test )。 目前工厂在大批量生产时， 为了节省成本， 多采用短路条 （Shorting Bar ) 的 点灯测试方式， Shorting Bar点灯测试方式一般会将所有的数据信号 （Date ) 端子相互连接形成一个 Date信号接收端， 对于扫描信号 （Gate ) ，则将奇数行 的 Gate信号端子相互连接形成第一 Gate信号接收端， 将偶数行的 Gate信号端 子相互连接形成第二 Gate信号接收端， 这种测试方式成本低， 测试治具容易制 作， 但是可以检测到的缺陷较少； 并且， 由于信号端子的数量很多， 将端子相 互连接时可能会出现接触不良的情况， 采用 Shorting Bar点灯测试方式存在着 将 Shorting Bar***走线不良误判为液晶面板不良。 It consists of a number of colored or black-and-white pixels placed in front of the light source or reflective surface. LCD monitors have low power consumption and are characterized by high image quality, small size, and light weight, so they are favored by everyone and become the mainstream of displays. At present, liquid crystal displays are mainly thin film transistor (TFT) liquid crystal displays, and the fabrication of general thin film transistor liquid crystal displays can be roughly divided into three parts: thin film transistor array (TFT Array) preparation process and color filter plate preparation. Engineering, liquid crystal display unit assembly (LC Cel l Assembly) preparation process, liquid crystal display module (Liquid Crystal Module, LCM) preparation process. In the process of manufacturing the liquid crystal panel, a plurality of inspection procedures are required. One of the most important inspection procedures is to test the cut liquid crystal cell (Cel l Test) to confirm whether the liquid crystal cell is defective. The test process first inputs a test signal to the liquid crystal panel to make the pixels appear color, and then observes each pixel one by one through the defect detecting device. This process is called a Light-on Test. At present, in the mass production of the factory, in order to save costs, the shorting bar (Shorting Bar) lighting test method is adopted. The Shorting Bar lighting test method generally connects all the data signal (Date) terminals to each other to form a Date signal receiving end. For the scan signal (Gate), the gate signals of the odd rows are connected to each other to form a first Gate signal receiving end, and the Gate signal terminals of the even rows are connected to each other to form a second Gate signal receiving end. This test method has low cost and is tested. The jig is easy to make, but there are fewer defects that can be detected. Moreover, due to the large number of signal terminals, poor contact may occur when the terminals are connected to each other. The Shorting Bar lighting test method is used to trace the outer edges of the Shorting Bar. The bad error is that the LCD panel is defective.
因此， 采用 Shorting Bar点灯测试方式检测到缺陷的液晶面板一般会采用
1G1D的点灯测试方式进一歩确认， 这种测试方式与 Shorting Bar方式不同的是， 将 Gate信号分成更多组的扫描信号接收端 Gl、 G2、 -Gn, 如图 1所示， 切割完成 的液晶盒包括液晶面板区域 10和压合区域 20， 压合区域 20上设置有多个数据信 号端子 201和多个扫描信号端子 202， 用于将数据信号和扫描信号接入到液晶面 板的像素单元中， 其中， 所有的数据信号端子 201相互连接形成一个 Date信号接 收端 D, 而扫描信号端子 202则分成多组的扫描信号接收端 Gl、 G2、 -Gn, 每一 组扫描信号接收端包括 300〜800条扫描信号端子 202， 目前一般会使用一个平面 导电胶 30将每一组扫描信号端子相互连接。 采用平面导电胶连接信号端子会存 在接触不良造成假线的问题， 存在误判的情况。 发明内容 鉴于现有技术存在的不足， 本发明提供了一种点灯测试治具， 以及使用该 测试治具对液晶面板进行测试的方法， 能够有效地降低点灯测试的误判率， 快 速地确认所检测到的缺陷是真正的液晶面板缺陷还是测试治具的缺陷。 为了实现上述目的， 本发明采用了如下的技术方案： 一种点灯测试治具， 用于液晶面板加工工艺中的点灯测试作业， 包括： 第一导电层； 设置于所述第一导电层上的相互间隔排列的多个导电金属部和多个绝缘 部， 所述多个导电金属部之间通过所述第一导电层相互电性连接； 其中所述导 电金属部高于所述绝缘部。 其中， 所述第一导电层的材料为导电胶。 其中， 所述导电金属部比所述绝缘部高 0〜lmm。 其中， 所述导电金属部和所述绝缘部均为长条状结构。 其中， 所述多个导电金属部之间以及多个绝缘部之间分别具有相同的宽度。 其中， 所述导电金属部与所述绝缘部具有相同的宽度。 其中， 所述导电金属部的材料为耐磨导电材料， 所述耐磨导电材料为 Cu或Therefore, LCD panels that use the Shorting Bar lighting test method to detect defects are generally used. The 1G1D lighting test method is further confirmed. This test method is different from the Shorting Bar method in that the Gate signal is divided into more groups of scanning signal receiving terminals G1, G2, -Gn, as shown in Fig. 1, the cut LCD is completed. The box includes a liquid crystal panel area 10 and a nip area 20, and the nip area 20 is provided with a plurality of data signal terminals 201 and a plurality of scanning signal terminals 202 for connecting the data signals and the scanning signals to the pixel units of the liquid crystal panel. , wherein all the data signal terminals 201 are connected to each other to form a Date signal receiving end D, and the scanning signal terminal 202 is divided into a plurality of sets of scanning signal receiving ends G1, G2, -Gn, and each set of scanning signal receiving ends includes 300~ 800 scanning signal terminals 202, generally each of which uses a planar conductive paste 30 to connect each set of scanning signal terminals to each other. The use of a flat conductive paste to connect a signal terminal may cause a problem of a false line caused by poor contact, and there is a case of misjudgment. SUMMARY OF THE INVENTION In view of the deficiencies of the prior art, the present invention provides a lighting test fixture and a method for testing a liquid crystal panel using the test fixture, which can effectively reduce the false positive rate of the lighting test and quickly confirm the The detected defect is a true LCD panel defect or a defect in the test fixture. In order to achieve the above object, the present invention adopts the following technical solutions: A lighting test fixture for a lighting test operation in a liquid crystal panel processing process, comprising: a first conductive layer; disposed on the first conductive layer a plurality of conductive metal portions and a plurality of insulating portions arranged at a distance from each other, wherein the plurality of conductive metal portions are electrically connected to each other through the first conductive layer; wherein the conductive metal portion is higher than the insulating portion. The material of the first conductive layer is a conductive paste. The conductive metal portion is 0 to 1 mm higher than the insulating portion. Wherein, the conductive metal portion and the insulating portion are both elongated structures. The plurality of conductive metal portions and the plurality of insulating portions have the same width. The conductive metal portion has the same width as the insulating portion. Wherein, the material of the conductive metal portion is a wear-resistant conductive material, and the wear-resistant conductive material is Cu or
Au。 本发明的另一方面是提供一种液晶面板测试方法， 该方法包括歩骤：
( 1 ) 提供一液晶面板， 所述液晶面板包括液晶面板区域和压合区域， 所述 压合区域上设置有多个数据信号端子和多个扫描信号端子， 用于将数据信号和 扫描信号接入到液晶面板的像素单元中； Au. Another aspect of the present invention provides a liquid crystal panel testing method, the method comprising: (1) providing a liquid crystal panel, the liquid crystal panel comprising a liquid crystal panel area and a pressing area, wherein the pressing area is provided with a plurality of data signal terminals and a plurality of scanning signal terminals for connecting the data signal and the scanning signal Entering into the pixel unit of the liquid crystal panel;
(2 )将所有的数据信号端子相互连接形成一个 Date信号接收端 D, 将所有 的扫描信号端子分成多组扫描信号接收端 Gl、 G2、 -Gn, 每一组扫描信号接收 端采用如上所述的测试治具将其中的扫描信号端子相互电性连接， 其中， 所述 测试治具中的导电金属部与所述扫描信号端子相对连接； (2) connecting all the data signal terminals to each other to form a Date signal receiving end D, and dividing all the scanning signal terminals into a plurality of sets of scanning signal receiving ends G1, G2, -Gn, each of which is as described above. The test fixtures are electrically connected to the scan signal terminals, wherein the conductive metal portions of the test fixture are oppositely connected to the scan signal terminals;
(3 )将数据信号输入到所述 Date信号接收端 D, 将扫描信号输入到扫描信 号接收端 Gl、 G2、 -Gn, 对所述液晶面板进行点灯测试。 其中， 每一组扫描信号端子接收端包括 300〜800条扫描信号端子。 其中， 歩骤 （3 ) 中的扫描信号是逐一输入到扫描信号接收端 Gl、 G2、 一Gn 中的。 本发明能够有效地降低点灯测试的误判率， 快速地确认所检测到的缺陷是 真正的液晶面板缺陷还是测试治具的缺陷。 附图说明 图 1是现有的一种对液晶面板进行点灯测试的示意图， 其中采用一平面导 电胶将扫描信号端子相互连接。 图 2是本发明一实施例中的测试治具的主视图。 图 3是如图 2所示的测试治具的俯视图。 具体实施方式 如前所述， 本发明的目的提供了一种点灯测试治具， 以及使用该测试治具 对液晶面板进行测试的方法， 所述点灯测试治具包括， 第一导电层； 以及设置 于所述第一导电层上的相互间隔排列的多个导电金属部和多个绝缘部， 所述多 个导电金属部之间通过所述第一导电层相互电性连接； 其中所述导电金属部高 于所述绝缘部。 所述点灯测试治具能够有效地降低点灯测试的误判率， 快速地 确认所检测到的缺陷是真正的液晶面板缺陷还是测试治具的缺陷。 下面将对结合附图用实施例对本发明做进一歩说明。
参阅图 2和图 3， 本实施例中的点灯测试治具包括： 第一导电层 401 ; 以及 设置于所述第一导电层 401上的相互间隔排列的多个导电金属部 402和多个绝 缘部 403，所述多个导电金属部 402之间通过所述第一导电层 401相互电性连接; 其中所述导电金属部 402高于所述绝缘部 403， 其中， 所述导电金属部 402比所 述绝缘部 403高 0〜lmm。 其中， 所述第一导电层 401的材料为导电胶， 所述导电金属部 402的材料 为耐磨导电材料， 所述耐磨导电材料可以是 Cu或 Au; 在本实施中， 导电金属部 402的材料为 Cu。 其中， 所述导电金属部 402和所述绝缘部 403均为长条状结构， 所述多个 导电金属部 402之间以及多个绝缘部 403之间具有相同的宽度， 进一歩地， 所 述导电金属部 402与所述绝缘部 403具有相同的宽度。 使用如上所述的测试治具对液晶面板进行点灯测试的方法包括歩骤： (3) The data signal is input to the Date signal receiving terminal D, and the scanning signal is input to the scanning signal receiving terminals G1, G2, -Gn, and the liquid crystal panel is subjected to a lighting test. The receiving end of each set of scanning signal terminals includes 300 to 800 scanning signal terminals. The scan signals in the step (3) are input one by one to the scan signal receiving ends G1, G2, and Gn. The invention can effectively reduce the false positive rate of the lighting test, and quickly confirm whether the detected defect is a true liquid crystal panel defect or a defect of the test fixture. BRIEF DESCRIPTION OF THE DRAWINGS FIG. 1 is a schematic view showing a conventional lighting test of a liquid crystal panel in which a scanning conductive signal is connected to each other by a planar conductive paste. Figure 2 is a front elevational view of a test fixture in accordance with an embodiment of the present invention. Figure 3 is a top plan view of the test fixture shown in Figure 2. DETAILED DESCRIPTION OF THE INVENTION As described above, an object of the present invention is to provide a lighting test fixture, and a method of testing a liquid crystal panel using the test fixture, the lighting test fixture comprising: a first conductive layer; a plurality of conductive metal portions and a plurality of insulating portions spaced apart from each other on the first conductive layer, wherein the plurality of conductive metal portions are electrically connected to each other through the first conductive layer; wherein the conductive metal The portion is higher than the insulating portion. The lighting test fixture can effectively reduce the false positive rate of the lighting test, and quickly confirm whether the detected defect is a true liquid crystal panel defect or a defect of the test fixture. The present invention will be further described with reference to the embodiments in conjunction with the accompanying drawings. Referring to FIG. 2 and FIG. 3, the lighting test fixture in this embodiment includes: a first conductive layer 401; and a plurality of conductive metal portions 402 and a plurality of insulations arranged on the first conductive layer 401 Between the plurality of conductive metal portions 402, the first conductive layer 401 is electrically connected to each other; wherein the conductive metal portion 402 is higher than the insulating portion 403, wherein the conductive metal portion 402 is The insulating portion 403 is 0 to 1 mm high. The material of the first conductive layer 401 is a conductive paste, the material of the conductive metal portion 402 is a wear-resistant conductive material, and the wear-resistant conductive material may be Cu or Au; in this embodiment, the conductive metal portion 402 The material is Cu. The conductive metal portion 402 and the insulating portion 403 are both elongated structures, and the plurality of conductive metal portions 402 and the plurality of insulating portions 403 have the same width, and the The conductive metal portion 402 has the same width as the insulating portion 403. A method of performing a lighting test on a liquid crystal panel using the test fixture as described above includes the following steps:
( 1 )提供一液晶面板， 参阅图 1， 所述液晶面板包括液晶面板区域 10和压 合区域 20，所述压合区域 20上设置有多个数据信号端子 201和多个扫描信号端 子 202， 用于将数据信号和扫描信号接入到液晶面板的像素单元中； (1) A liquid crystal panel is provided. Referring to FIG. 1, the liquid crystal panel includes a liquid crystal panel region 10 and a nip region 20, and the nip region 20 is provided with a plurality of data signal terminals 201 and a plurality of scanning signal terminals 202. For connecting the data signal and the scan signal into the pixel unit of the liquid crystal panel;
(2 )将所有的数据信号端子相互连接形成一个 Date信号接收端 D, 将所有 的扫描信号端子分成多组扫描信号接收端 Gl、 G2、 -Gn, 每一组扫描信号接收 端采用如上所述的测试治具将其中的扫描信号端子 202相互电性连接， 其中， 所述测试治具中的导电金属部 402与所述扫描信号端子 202相对连接； (2) connecting all the data signal terminals to each other to form a Date signal receiving end D, and dividing all the scanning signal terminals into a plurality of sets of scanning signal receiving ends G1, G2, -Gn, each of which is as described above. The test fixtures are electrically connected to the scan signal terminals 202, wherein the conductive metal portions 402 in the test fixture are oppositely connected to the scan signal terminals 202;
(3 )将数据信号输入到所述 Date信号接收端 D, 将扫描信号输入到扫描信 号接收端 Gl、 G2、 -Gn, 对所述液晶面板进行点灯测试。 当检测到其中的某一点扫描信号端子对应的液晶面板区域出现缺陷时，将 本实施例提供点灯测试治具错位连接， 假如缺陷点不跟随测试治具的移动而移 动，则说明该缺陷点是真正的液晶面板缺陷； 假如缺陷点随着测试治具的移动而 移动，则说明该缺陷点不是真正的液晶面板缺陷。 以对扫描信号接收端 G1进行 测试为例， 假设在进行第一次测试时， 将点灯测试治具的第 10个导电金属部与 扫描信号接收端 G1的第 10条扫描信号端子相连， 发现第 10条扫描信号端子对 应的液晶面板区域出现缺陷； 此时将点灯测试治具错位连接， 将点灯测试治具 的第 10个导电金属部与扫描信号接收端 G1的第 15条扫描信号端子相连， 假如 缺陷点不跟随测试治具的移动而移动，还是显示为第 10条扫描信号端子对应的
液晶面板区域出现缺陷， 则说明该缺陷点是真正的液晶面板缺陷； 假如缺陷点 随着测试治具的移动而移动， 显示为第 15条扫描信号端子对应的液晶面板区域 出现缺陷，则说明该缺陷点不是真正的液晶面板缺陷。 错位连接确认的过程可以 重复进行多次， 由此， 本实施例提供的点灯测试治具和测试方法， 可以快速地 确认所检测到的缺陷是真正的液晶面板缺陷还是测试治具的缺陷。 其中， 每一组扫描信号端子接收端包括 300〜800条扫描信号端子 202。 其中， 歩骤（3 ) 中的扫描信号是逐一输入到扫描信号接收端 Gl、 G2、 〜Gn 中的。 本发明能够有效地降低点灯测试的误判率， 快速地确认所检测到的缺陷是 真正的液晶面板缺陷还是测试治具的缺陷。 需要说明的是， 在本文中， 诸如第一和第二等之类的关系术语仅仅用来将 一个实体或者操作与另一个实体或操作区分开来， 而不一定要求或者暗示这些 实体或操作之间存在任何这种实际的关系或者顺序。 而且， 术语 "包括"、 "包 含"或者其任何其他变体意在涵盖非排他性的包含， 从而使得包括一系列要素 的过程、 方法、 物品或者设备不仅包括那些要素， 而且还包括没有明确列出的 其他要素， 或者是还包括为这种过程、 方法、 物品或者设备所固有的要素。 在 没有更多限制的情况下， 由语句 "包括一个…… " 限定的要素， 并不排除在包 括所述要素的过程、 方法、 物品或者设备中还存在另外的相同要素。 (3) The data signal is input to the Date signal receiving terminal D, and the scanning signal is input to the scanning signal receiving terminals G1, G2, -Gn, and the liquid crystal panel is subjected to a lighting test. When a defect occurs in the liquid crystal panel area corresponding to the scanning signal terminal at a certain point, the lighting test fixture of the present embodiment is provided with a misalignment connection. If the defect point does not move following the movement of the test fixture, the defect point is A true liquid crystal panel defect; if the defect point moves with the movement of the test fixture, it indicates that the defect point is not a true liquid crystal panel defect. Taking the test of the scanning signal receiving end G1 as an example, it is assumed that the first conductive metal portion of the lighting test fixture is connected to the tenth scanning signal terminal of the scanning signal receiving end G1 during the first test, and the first A defect occurs in the liquid crystal panel area corresponding to the 10 scanning signal terminals; at this time, the lighting test fixture is misaligned, and the 10th conductive metal portion of the lighting test fixture is connected to the 15th scanning signal terminal of the scanning signal receiving end G1. If the defect point does not move with the movement of the test fixture, it is still displayed as the corresponding 10th scan signal terminal. If there is a defect in the area of the liquid crystal panel, it indicates that the defect is a true liquid crystal panel defect; if the defect point moves with the movement of the test fixture, it is displayed that the liquid crystal panel area corresponding to the 15th scanning signal terminal is defective, indicating that the defect The defect point is not a true LCD panel defect. The process of the misconnection confirmation can be repeated a plurality of times. Therefore, the lighting test fixture and the test method provided in this embodiment can quickly confirm whether the detected defect is a true liquid crystal panel defect or a defect of the test fixture. The receiving end of each set of scanning signal terminals includes 300 to 800 scanning signal terminals 202. The scan signals in the step (3) are input one by one to the scan signal receiving ends G1, G2, and Gn. The invention can effectively reduce the false positive rate of the lighting test, and quickly confirm whether the detected defect is a true liquid crystal panel defect or a defect of the test fixture. It should be noted that, in this context, relational terms such as first and second are used merely to distinguish one entity or operation from another entity or operation, and do not necessarily require or imply these entities or operations. There is any such actual relationship or order between them. Furthermore, the terms "including", "comprising" or "comprising" or "comprising" are intended to encompass a non-exclusive inclusion, such that a process, method, article, or device that includes a plurality of elements includes not only those elements but also Other elements, or elements that are inherent to such a process, method, item, or device. An element defined by the phrase "comprising a ..." does not exclude the presence of additional elements in the process, method, item, or device that comprises the element.
以上所述仅是本申请的具体实施方式， 应当指出， 对于本技术领域的普通 技术人员来说， 在不脱离本申请原理的前提下， 还可以做出若干改进和润饰， 这些改进和润饰也应视为本申请的保护范围。
The above description is only a specific embodiment of the present application, and it should be noted that those skilled in the art can also make some improvements and retouching without departing from the principle of the application, and these improvements and retouchings are also It should be considered as the scope of protection of this application.
Claims
1、 一种点灯测试治具， 用于液晶面板加工工艺中的点灯测试作业， 其中， 包括： 第一导电层； 设置于所述第一导电层上的相互间隔排列的多个导电金属部和多个绝缘 部， 所述多个导电金属部之间通过所述第一导电层相互电性连接； 其中所述导 电金属部高于所述绝缘部。 1. A lighting test fixture, used for lighting test operations in liquid crystal panel processing technology, which includes: a first conductive layer; a plurality of conductive metal parts arranged at intervals and arranged on the first conductive layer; A plurality of insulating parts, the plurality of conductive metal parts are electrically connected to each other through the first conductive layer; wherein the conductive metal part is higher than the insulating part.
2、 根据权利要求 1所述的点灯测试治具， 其中， 所述第一导电层的材料为 导电胶。 2. The lighting test fixture according to claim 1, wherein the material of the first conductive layer is conductive glue.
3、 根据权利要求 1所述的点灯测试治具， 其中， 所述导电金属部比所述绝 缘部高 0〜lmm。 3. The lighting test fixture according to claim 1, wherein the conductive metal part is 0~1 mm higher than the insulating part.
4、 根据权利要求 1所述的点灯测试治具， 其中， 所述导电金属部和所述绝 缘部均为长条状结构。 4. The lighting test fixture according to claim 1, wherein both the conductive metal part and the insulating part have a strip-shaped structure.
5、 根据权利要求 4所述的点灯测试治具， 其中， 所述多个导电金属部之间 以及多个绝缘部之间分别具有相同的宽度。 5. The lighting test fixture according to claim 4, wherein the plurality of conductive metal parts and the plurality of insulating parts have the same width respectively.
6、 根据权利要求 5所述的点灯测试治具， 其中， 所述导电金属部与所述绝 缘部具有相同的宽度。 6. The lighting test fixture according to claim 5, wherein the conductive metal part and the insulating part have the same width.
7、 根据权利要求 1所述的点灯测试治具， 其中， 所述导电金属部的材料为 耐磨导电材料， 所述耐磨导电材料为 Cu或 Au。 7. The lighting test fixture according to claim 1, wherein the material of the conductive metal part is a wear-resistant conductive material, and the wear-resistant conductive material is Cu or Au.
8、 一种液晶面板测试方法， 其特征在于， 包括歩骤： 8. A liquid crystal panel testing method, characterized by including steps:
( 1 ) 提供一液晶面板， 所述液晶面板包括液晶面板区域和压合区域， 所述 压合区域上设置有多个数据信号端子和多个扫描信号端子， 用于将数据信号和 扫描信号接入到液晶面板的像素单元中； (1) Provide a liquid crystal panel. The liquid crystal panel includes a liquid crystal panel area and a lamination area. The lamination area is provided with a plurality of data signal terminals and a plurality of scanning signal terminals for connecting the data signal and the scanning signal. into the pixel unit of the LCD panel;
(2)将所有的数据信号端子相互连接形成一个 Date信号接收端 D, 将所有 的扫描信号端子分成多组扫描信号接收端 Gl、 G2、 -Gn, 每一组扫描信号接收 端采用一测试治具将其中的扫描信号端子相互电性连接， 其中， 所述测试治具 包括：
第一导电层； 设置于所述第一导电层上的相互间隔排列的多个导电金属部和多个绝缘 部， 所述多个导电金属部之间通过所述第一导电层相互电性连接； 其中所述导 电金属部高于所述绝缘部； 其中， 将所述测试治具中的导电金属部与所述扫描信号端子相对连接； (2) Connect all data signal terminals to each other to form a Date signal receiving terminal D. Divide all scanning signal terminals into multiple groups of scanning signal receiving terminals Gl, G2, -Gn. Each group of scanning signal receiving terminals adopts a test method. The test fixture electrically connects the scanning signal terminals to each other, wherein the test fixture includes: a first conductive layer; a plurality of conductive metal parts and a plurality of insulating parts arranged at intervals on the first conductive layer, the plurality of conductive metal parts being electrically connected to each other through the first conductive layer ; wherein the conductive metal part is higher than the insulating part; wherein the conductive metal part in the test fixture is relatively connected to the scanning signal terminal;
(3 )将数据信号输入到所述 Date信号接收端 D, 将扫描信号输入到扫描信 号接收端 Gl、 G2、 -Gn, 对所述液晶面板进行点灯测试。 (3) Input the data signal to the Date signal receiving terminal D, input the scanning signal to the scanning signal receiving terminals Gl, G2, and -Gn, and perform a lighting test on the liquid crystal panel.
9、 根据权利要求 8所述的液晶面板测试方法， 其中， 每一组扫描信号端子 接收端包括 300〜800条扫描信号端子。 9. The liquid crystal panel testing method according to claim 8, wherein each group of scanning signal terminal receiving ends includes 300 to 800 scanning signal terminals.
10、 根据权利要求 8所述的液晶面板测试方法， 其中， 歩骤 （3 ) 中的扫描 信号是逐一输入到扫描信号接收端 Gl、 G2、 一Gn中的。 10. The liquid crystal panel testing method according to claim 8, wherein the scanning signals in step (3) are input to the scanning signal receiving terminals G1, G2, and Gn one by one.
11、 根据权利要求 8所述的液晶面板测试方法， 其中， 所述第一导电层的 材料为导电胶。 11. The liquid crystal panel testing method according to claim 8, wherein the material of the first conductive layer is conductive glue.
12、 根据权利要求 8所述的液晶面板测试方法， 其中， 所述导电金属部比 所述绝缘部高 0〜lmm。 12. The liquid crystal panel testing method according to claim 8, wherein the conductive metal part is 0~1 mm higher than the insulating part.
13、 根据权利要求 8所述的液晶面板测试方法， 其中， 所述导电金属部和 所述绝缘部均为长条状结构。 13. The liquid crystal panel testing method according to claim 8, wherein both the conductive metal part and the insulating part have a strip-shaped structure.
14、 根据权利要求 13所述的液晶面板测试方法， 其中， 所述多个导电金属 部之间以及多个绝缘部之间分别具有相同的宽度。 14. The liquid crystal panel testing method according to claim 13, wherein the plurality of conductive metal parts and the plurality of insulating parts have the same width respectively.
15、 根据权利要求 14所述的液晶面板测试方法， 其中， 所述导电金属部与 所述绝缘部具有相同的宽度。 15. The liquid crystal panel testing method according to claim 14, wherein the conductive metal part and the insulating part have the same width.
16、 根据权利要求 8所述的液晶面板测试方法， 其中， 所述导电金属部的 材料为耐磨导电材料， 所述耐磨导电材料为 Cu或 Au。
16. The liquid crystal panel testing method according to claim 8, wherein the material of the conductive metal part is a wear-resistant conductive material, and the wear-resistant conductive material is Cu or Au.
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| CN201310404897.XA CN103454794B (en) | 2013-09-06 | 2013-09-06 | Lighting test jig and liquid crystal panel method of testing |
| CN201310404897.X | 2013-09-06 |
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| CN102681227A (en) * | 2012-05-30 | 2012-09-19 | 深圳市华星光电技术有限公司 | Detection method for liquid crystal display panel |
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| CN201138366Y (en) * | 2008-01-10 | 2008-10-22 | 环国科技股份有限公司 | Panel test structure |
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- 2013-09-12 WO PCT/CN2013/083367 patent/WO2015032106A1/en active Application Filing
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| EP0066087A1 (en) * | 1981-05-26 | 1982-12-08 | International Business Machines Corporation | Inspection of unsintered single layer or multilayer ceramics using a broad area electrical contacting structure |
| JPS61250906A (en) * | 1985-04-26 | 1986-11-08 | ジェイエスアール株式会社 | Conductive elastomer sheet |
| US6144216A (en) * | 1995-04-01 | 2000-11-07 | Enplas Corporation | Electric contact apparatus for inspecting a liquid crystal display panel |
| CN1639919A (en) * | 2002-03-07 | 2005-07-13 | Jsr株式会社 | Anisotropic conductive connector and its production method, and circuit device test instrument |
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| CN110262097A (en) * | 2019-07-01 | 2019-09-20 | 苏州精濑光电有限公司 | A kind of lighting jig leans on position mechanism |
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| CN103454794A (en) | 2013-12-18 |
| CN103454794B (en) | 2016-06-08 |
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