WO2015010300A1 - System and method for testing liquid crystal panel - Google Patents

System and method for testing liquid crystal panel Download PDF

Info

Publication number
WO2015010300A1
WO2015010300A1 PCT/CN2013/080121 CN2013080121W WO2015010300A1 WO 2015010300 A1 WO2015010300 A1 WO 2015010300A1 CN 2013080121 W CN2013080121 W CN 2013080121W WO 2015010300 A1 WO2015010300 A1 WO 2015010300A1
Authority
WO
WIPO (PCT)
Prior art keywords
liquid crystal
conductive
heat
crystal panel
test
Prior art date
Application number
PCT/CN2013/080121
Other languages
French (fr)
Chinese (zh)
Inventor
黄炳成
Original Assignee
深圳市华星光电技术有限公司
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by 深圳市华星光电技术有限公司 filed Critical 深圳市华星光电技术有限公司
Publication of WO2015010300A1 publication Critical patent/WO2015010300A1/en

Links

Images

Classifications

    • G—PHYSICS
    • G02—OPTICS
    • G02F—OPTICAL DEVICES OR ARRANGEMENTS FOR THE CONTROL OF LIGHT BY MODIFICATION OF THE OPTICAL PROPERTIES OF THE MEDIA OF THE ELEMENTS INVOLVED THEREIN; NON-LINEAR OPTICS; FREQUENCY-CHANGING OF LIGHT; OPTICAL LOGIC ELEMENTS; OPTICAL ANALOGUE/DIGITAL CONVERTERS
    • G02F1/00—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics
    • G02F1/01—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour 
    • G02F1/13—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour  based on liquid crystals, e.g. single liquid crystal display cells
    • G02F1/1306—Details
    • G02F1/1309—Repairing; Testing

Definitions

  • the present invention relates to the field of liquid crystal display technology, and in particular, to a test system and method for a liquid crystal panel.
  • liquid crystal panels With the continuous popularization of liquid crystal panels, the requirements for the quality of liquid crystal panels are getting higher and higher. Before the liquid crystal panels are shipped from the factory, the liquid crystal panels need to be tested to ensure the yield of the products. Especially in the prior art, many manufacturers open The shipment of cell (liquid crystal panel) gradually reduces the use and verification of the backlight module in the module factory, which brings great challenges to the detection of the liquid crystal panel.
  • the liquid crystal panel when detecting a liquid crystal panel, the liquid crystal panel is mostly detected by a television (TV) system, mainly by supplying heat to the liquid crystal panel to detect an operation index in the case where the liquid crystal panel has an early temperature rise. , to ensure that the factory LCD panel will not cause deformation and other problems due to the increase in temperature.
  • TV television
  • the TV system generated by different TV manufacturers produces different heats for detecting the liquid crystal panel, the detection effect is poor, and the liquid crystal panel cannot be uniformly and accurately detected, and the TV is passed.
  • the machine system detects the liquid crystal panel at a high cost.
  • the prior art has the following technical problems: the detection cost of the liquid crystal panel is high, the efficiency is low, and the detection effect is poor.
  • the present invention provides a test system and method for a liquid crystal panel to solve the technical problem of high cost, low efficiency, and poor detection effect of the liquid crystal panel in the prior art.
  • the present invention constructs a test system for a liquid crystal panel, comprising:
  • test box one side opening is arranged for placing the liquid crystal panel to be tested;
  • test box further includes a bottom plate opposite to the side of the opening of the test box, and the bottom plate is provided with a heat dissipation hole;
  • a conductive rail disposed on an inner side of the test box and connected to an external power source;
  • a power strip disposed in the test box and connected to the conductive power rail for illuminating and generating heat when the conductive power rail is turned on, to perform heat on the liquid crystal panel to be tested test.
  • the present invention also constructs a test system for a liquid crystal panel, the system comprising:
  • test box one side opening is provided for placing the liquid crystal panel to be tested
  • a conductive track disposed on an inner side of the test box;
  • a heat strip disposed in the test box and connected to the conductive power rail for generating heat after the conductive power rail is powered on, to test the liquid crystal panel to be tested.
  • the present invention also constructs a test method for a liquid crystal panel, the method comprising the following steps:
  • test box wherein one side of the test box is open, and the test box is provided with a conductive electric rail and a heat strip connected to the conductive electric rail;
  • the conductive rail is energized such that the heat strip generates heat and the liquid crystal panel to be tested is tested by the heat generated by the heat strip.
  • the present invention provides a test box which is provided with one side opening, and is internally provided with a conductive electric rail and a heat strip connected to the conductive electric rail.
  • a test box which is provided with one side opening, and is internally provided with a conductive electric rail and a heat strip connected to the conductive electric rail.
  • the liquid crystal panel is placed flat.
  • the side of the opening of the test box is energized, and the conductive track is energized such that the heat strip generates heat to test the liquid crystal panel.
  • the invention not only has low test cost, but also can uniformly test the liquid crystal panel, and has high test efficiency and good effect.
  • Figure 1 is a side elevational view of a test cartridge in accordance with an embodiment of the present invention.
  • FIG. 2 is a top plan view of a test box in an embodiment of the present invention.
  • FIG. 3 is a schematic structural view of a heat strip according to an embodiment of the present invention.
  • FIG. 4 is a schematic structural view of a light source strip according to an embodiment of the present invention.
  • FIG. 5 is a schematic structural view of a bottom plate according to an embodiment of the present invention.
  • FIG. 6 is a schematic structural view of a heat dissipation hole according to an embodiment of the present invention.
  • FIG. 7 is a schematic flow chart of a method for testing a liquid crystal panel according to an embodiment of the present invention.
  • FIG. 1 is a side view of a test system of a liquid crystal panel according to an embodiment of the present invention
  • FIG. 2 is a top view of a test system of a liquid crystal panel according to an embodiment of the present invention.
  • the test system of the liquid crystal panel includes a test box 10 including an opening portion 11 and a bottom plate 12, and the opening portion 11 is disposed opposite to the bottom plate 12.
  • a conductive electric rail 13 and a heat strip 14 are disposed in the test box 10, and the conductive electric rail 13 is connected to an external power source, and the heat strip 14 is connected to the conductive electric rail 13.
  • the conductive power rail 13 includes a first conductive power rail 131 and a second conductive power rail 132.
  • the first conductive power rail 131 and the second conductive power rail 132 are disposed on opposite sides of the test box 10,
  • the heat strip 14 is supported and connected by the first conductive rail 131 and the second conductive rail 132.
  • each of the conductive rails is provided with at least one fixing slot along the length thereof, and the first conductive rail 121 and the fixing slot on the second conductive rail 122 are in one-to-one correspondence, and pass through one by one.
  • the corresponding fixing groove is engaged with the supported heat strip 14 .
  • the fixing slots are evenly arranged along the length direction of the conductive rails in which they are located.
  • FIG. 3 is a partial schematic view of the first conductive power rail 131.
  • the first conductive power rail 131 is provided with a plurality of fixing slots 133.
  • FIG. 3 shows only a part, and the fixing slot 133 is along.
  • the longitudinal direction A of the first conductive electric rail 131 is evenly arranged, and the fixing groove 133 can be engaged with the heat strip 14 .
  • the heat strip 14 is preferably a light source strip.
  • the light source strip 14 includes a power strip body 141 and a power source 142 disposed on the power strip body 141 for generating heat when lighting.
  • the light source 142 is, for example, an LED lamp, and the LED lamps are evenly arranged along the length direction B of the light source strip body 141 to make the heat generated by the light source strip 14 uniform.
  • At least one heat strip 14 is disposed in the test box 11, and the heat strip 14 is coupled to the conductive rail 13 through the fixing slot 133 (FIG. 3), and The direction A is free to adjust the position on the conductive track 13.
  • the conductive rail 13 is used to supply the heat strip 14 in addition to the heat-storing of the heat strip 14, so that the heat strip 14 generates heat. For example, after the light source strip 14 shown in FIG. 4 is energized, the LED light on the light source strip 14 illuminates, thereby generating heat.
  • FIG. 4 is a schematic diagram of the bottom plate 12 of the test box 10 , wherein the bottom plate 12 is disposed relative to the opening portion 11 , and the bottom plate 12 is provided with at least one heat dissipation hole 121 .
  • the heat dissipation holes 121 are evenly arranged along a fixed direction of the bottom plate 12.
  • the heat dissipation holes 121 are evenly arranged along the row direction and the column direction of the bottom plate 12.
  • the heat dissipation hole 121 includes a pleat portion 122 , and the size of the heat dissipation hole 121 can be adjusted by the pleat portion 122 and thereby the inside of the test box 10 . Heat is controlled.
  • the liquid crystal panel When the liquid crystal panel is tested, the liquid crystal panel is placed flat on the opening portion 11 of the test cartridge 10, and then the conductive rail 13 is energized. After the conductive rail 13 is energized, the heat strip 14 begins to generate heat, and the liquid crystal panel is tested by the heat generated by the heat strip 14.
  • the heating of the liquid crystal panel can be controlled by adjusting the position of the heat strip 14.
  • the heat in the test box 10 can also be adjusted by adjusting the size of the pleat portion 122 on the heat dissipation hole 121, for example, if the heat in the test box 10 is too large, the compression is performed.
  • the pleat portion 122 is configured to increase the heat dissipation hole 121 to accelerate heat dissipation in the test box 10; otherwise, the pleat portion 122 is stretched to make the heat dissipation hole 121 small, and the test box is reduced.
  • the heat inside 10 is emitted.
  • FIG. 6 is a schematic flow chart of a method for testing a liquid crystal panel according to an embodiment of the present invention.
  • the test method of the liquid crystal panel is completed based on the test system of the liquid crystal panel provided in this embodiment.
  • step S601 a test cartridge 10 is provided.
  • the test box 10 includes an opening portion 11 and a bottom plate 12, and the opening portion 11 is disposed opposite to the bottom plate 12.
  • the bottom plate 12 defines a heat dissipation hole 121, and the test box 10 is provided with a conductive electric rail 13 And the heat strip 14.
  • step S602 the liquid crystal panel to be tested is placed on the open side (ie, the opening portion 11) of the test cartridge 10.
  • step S603 the conductive rail 13 is energized to cause the heat strip 14 to generate heat, and the liquid crystal panel to be tested is tested by the heat generated by the heat strip 14.
  • the heat strip 14 is preferably a light source strip.
  • the light source strip 14 includes a power strip body 141 and a power source 142 disposed on the power strip body 141.
  • the power source 142 is configured to generate heat when illuminated, and is generated by the power source 142. Heat is used to test the liquid crystal panel to be tested.
  • the light source 142 is, for example, an LED lamp, and the LED lamps are evenly arranged along the length direction B of the light source strip body 141 to make the heat generated by the light source strip 14 uniform.
  • the conductive power rail 13 includes a first conductive power rail 131 and a second conductive power rail 132.
  • the first conductive power rail 131 and the second conductive power rail 132 are disposed on opposite sides of the test box 10.
  • the heat strip 14 is supported and connected by the first conductive rail 131 and the second conductive rail 132.
  • the heat dissipation hole 121 includes a pleated portion 122.
  • the pleat portion 122 can adjust the size of the heat dissipation hole 121 and thereby control the heat in the test box 10.
  • the present invention provides a test box which is provided with one side opening, and is internally provided with a conductive electric rail and a heat strip connected to the conductive electric rail.
  • a test box which is provided with one side opening, and is internally provided with a conductive electric rail and a heat strip connected to the conductive electric rail.

Abstract

A system and method for testing a liquid crystal panel. The system comprises: a test box (10), having one side opened, and used to place a liquid crystal panel under test; a conductive track (13), disposed inside the test box (10), and connected to an external power source; a heat bar (14), disposed in the test box (10), connected to the conductive track (13), and used to generate heat when the conductive track (13) is powered by the external power source, so as to test the liquid crystal panel under test. The test system has a low test cost, and can perform test on liquid crystal panels uniformly, so that the test has high efficiency and good effect.

Description

液晶面板的测试***及方法 Liquid crystal panel test system and method 技术领域Technical field
本发明涉及液晶显示技术领域，特别是涉及一种液晶面板的测试***及方法。The present invention relates to the field of liquid crystal display technology, and in particular, to a test system and method for a liquid crystal panel.
背景技术Background technique
随着液晶面板的不断普及，对液晶面板质量的要求越来越高，在液晶面板出厂前，需要对液晶面板进行检测，以保证产品的良率。尤其是现有技术中厂商多以open cell（液晶面板）的形式出货，逐渐减少了背光模组在模组厂的使用及验证，这给液晶面板的检测带来极大的挑战。With the continuous popularization of liquid crystal panels, the requirements for the quality of liquid crystal panels are getting higher and higher. Before the liquid crystal panels are shipped from the factory, the liquid crystal panels need to be tested to ensure the yield of the products. Especially in the prior art, many manufacturers open The shipment of cell (liquid crystal panel) gradually reduces the use and verification of the backlight module in the module factory, which brings great challenges to the detection of the liquid crystal panel.
现有技术在对液晶面板进行检测时，大多是通过电视（TV）整机***对液晶面板进行检测，主要是通过对液晶面板供热，以检测液晶面板早温度升高的情况下的运行指标，保证出厂的液晶面板不会由于温度的升高而导致变形等问题的出现。但是由于不同的TV整机厂生成的TV整机***对液晶面板检测时所释放的热量不一样，导致检测的效果较差，不能统一且准确有效的对液晶面板进行检测，而且通过的TV整机***对液晶面板进行检测，成本较高。In the prior art, when detecting a liquid crystal panel, the liquid crystal panel is mostly detected by a television (TV) system, mainly by supplying heat to the liquid crystal panel to detect an operation index in the case where the liquid crystal panel has an early temperature rise. , to ensure that the factory LCD panel will not cause deformation and other problems due to the increase in temperature. However, since the TV system generated by different TV manufacturers produces different heats for detecting the liquid crystal panel, the detection effect is poor, and the liquid crystal panel cannot be uniformly and accurately detected, and the TV is passed. The machine system detects the liquid crystal panel at a high cost.
因此，现有技术存在以下技术问题：对液晶面板的检测成本高，效率低，而且检测效果较差。Therefore, the prior art has the following technical problems: the detection cost of the liquid crystal panel is high, the efficiency is low, and the detection effect is poor.
技术问题technical problem
鉴于此，本发明提供一种液晶面板的测试***及方法，以解决现有技术中对液晶面板的检测成本高，效率低，而且检测效果较差的技术问题。In view of this, the present invention provides a test system and method for a liquid crystal panel to solve the technical problem of high cost, low efficiency, and poor detection effect of the liquid crystal panel in the prior art.
技术解决方案Technical solution
为解决上述技术问题，本发明构造了一种液晶面板的测试***，包括：To solve the above technical problem, the present invention constructs a test system for a liquid crystal panel, comprising:
测试盒；其一侧开口设置，用于放置待测试液晶面板；所述测试盒还包括一底板，其与所述测试盒开口的一侧相对设置，所述底板上开设有散热孔；a test box; one side opening is arranged for placing the liquid crystal panel to be tested; the test box further includes a bottom plate opposite to the side of the opening of the test box, and the bottom plate is provided with a heat dissipation hole;
导电电轨；其设置于所述测试盒的内侧，并连接外部电源；以及a conductive rail; disposed on an inner side of the test box and connected to an external power source;
电源条；其设置于所述测试盒内，并连接所述导电电轨，用于在所述导电电轨接通所述外部电源时点亮进而产生热量，以对所述待测试液晶面板进行测试。a power strip disposed in the test box and connected to the conductive power rail for illuminating and generating heat when the conductive power rail is turned on, to perform heat on the liquid crystal panel to be tested test.
为解决上述技术问题，本发明还构造了一种液晶面板的测试***，所述***包括：In order to solve the above technical problem, the present invention also constructs a test system for a liquid crystal panel, the system comprising:
测试盒；其一侧开口设置，用于放置待测试液晶面板；a test box; one side opening is provided for placing the liquid crystal panel to be tested;
导电电轨；其设置于所述测试盒的内侧；以及a conductive track; disposed on an inner side of the test box;
热量条；其设置于所述测试盒内，并连接所述导电电轨，用于在所述导电电轨接通电源后产生热量，以对所述待测试液晶面板进行测试。a heat strip; disposed in the test box and connected to the conductive power rail for generating heat after the conductive power rail is powered on, to test the liquid crystal panel to be tested.
为解决上述技术问题，本发明还构造了一种液晶面板的测试方法，所述方法包括以下步骤：In order to solve the above technical problem, the present invention also constructs a test method for a liquid crystal panel, the method comprising the following steps:
提供一测试盒，其中所述测试盒的一侧开口设置，所述测试盒内设置有导电电轨以及与所述导电电轨连接的热量条；Providing a test box, wherein one side of the test box is open, and the test box is provided with a conductive electric rail and a heat strip connected to the conductive electric rail;
将待测试液晶面板放置于所述测试盒开口侧上；以及Placing a liquid crystal panel to be tested on the open side of the test box;
对所述导电电轨通电，以使得所述热量条产生热量，并通过所述热量条产生的热量对所述待测试液晶面板进行测试。The conductive rail is energized such that the heat strip generates heat and the liquid crystal panel to be tested is tested by the heat generated by the heat strip.
有益效果 Beneficial effect
本发明通过提供一测试盒，其一侧开口设置，内部设置有导电电轨以及与所述导电电轨连接的热量条，在对液晶面板进行测试时，将所述液晶面板平置于所述测试盒的开口部一侧，并对所述导电电轨通电，使得所述热量条产生热量，从而对所述液晶面板进行测试。显然，本发明不仅测试成本低，而且可统一对液晶面板进行测试，测试效率高，效果好。The present invention provides a test box which is provided with one side opening, and is internally provided with a conductive electric rail and a heat strip connected to the conductive electric rail. When the liquid crystal panel is tested, the liquid crystal panel is placed flat. The side of the opening of the test box is energized, and the conductive track is energized such that the heat strip generates heat to test the liquid crystal panel. Obviously, the invention not only has low test cost, but also can uniformly test the liquid crystal panel, and has high test efficiency and good effect.
附图说明DRAWINGS
图1为本发明实施例中测试盒的侧视图；Figure 1 is a side elevational view of a test cartridge in accordance with an embodiment of the present invention;
图2为本发明实施例中测试盒的俯视图；2 is a top plan view of a test box in an embodiment of the present invention;
图3为本发明实施例中热量条的结构示意图；3 is a schematic structural view of a heat strip according to an embodiment of the present invention;
图4为本发明实施例中光源条的结构示意图；4 is a schematic structural view of a light source strip according to an embodiment of the present invention;
图5为本发明实施例中底板的结构示意图；FIG. 5 is a schematic structural view of a bottom plate according to an embodiment of the present invention; FIG.
图6为本发明实施例中散热孔的结构示意图；6 is a schematic structural view of a heat dissipation hole according to an embodiment of the present invention;
图7为本发明实施例中液晶面板测试方法的流程示意图。FIG. 7 is a schematic flow chart of a method for testing a liquid crystal panel according to an embodiment of the present invention.
本发明的最佳实施方式BEST MODE FOR CARRYING OUT THE INVENTION
以下各实施例的说明是参考附加的图式，用以例示本发明可用以实施的特定实施例。本发明所提到的方向用语，例如「上」、「下」、「前」、「后」、「左」、「右」、「内」、「外」、「侧面」等，仅是参考附加图式的方向。因此，使用的方向用语是用以说明及理解本发明，而非用以限制本发明。在图中，结构相似的单元是以相同标号表示。The following description of the various embodiments is provided to illustrate the specific embodiments of the invention. The directional terms mentioned in the present invention, such as "upper", "lower", "before", "after", "left", "right", "inside", "outside", "side", etc., are merely references. Attach the direction of the drawing. Therefore, the directional terminology used is for the purpose of illustration and understanding of the invention. In the figures, structurally similar elements are denoted by the same reference numerals.
请一并参阅图1和图2，图1为本发明实施例中液晶面板的测试***的侧视图，图2为本发明实施例中液晶面板的测试***的俯视图。1 and FIG. 2, FIG. 1 is a side view of a test system of a liquid crystal panel according to an embodiment of the present invention, and FIG. 2 is a top view of a test system of a liquid crystal panel according to an embodiment of the present invention.
所述液晶面板的测试***包括测试盒10，所述测试盒10包括一开口部11以及一底板12，所述开口部11与所述底板12相对设置。The test system of the liquid crystal panel includes a test box 10 including an opening portion 11 and a bottom plate 12, and the opening portion 11 is disposed opposite to the bottom plate 12.
所述测试盒10内设置导电电轨13以及热量条14，所述导电电轨13连接外部电源，所述热量条14连接所述导电电轨13。所述导电电轨13包括第一导电电轨131和第二导电电轨132，所述第一导电电轨131和第二导电电轨132设置于所述测试盒10内相对的两侧，所述热量条14由所述第一导电电轨131和第二导电电轨132支撑连接。A conductive electric rail 13 and a heat strip 14 are disposed in the test box 10, and the conductive electric rail 13 is connected to an external power source, and the heat strip 14 is connected to the conductive electric rail 13. The conductive power rail 13 includes a first conductive power rail 131 and a second conductive power rail 132. The first conductive power rail 131 and the second conductive power rail 132 are disposed on opposite sides of the test box 10, The heat strip 14 is supported and connected by the first conductive rail 131 and the second conductive rail 132.
具体的，每一导电电轨沿其长度方向开设有至少一个的固定槽，所述第一导电电轨121和所述第二导电电轨122上的固定槽均一一对应，并通过一一对应的所述固定槽卡合固定所支撑的所述热量条14。其中当每一导电电轨的固定槽为多个时，所述固定槽沿其所在导电电轨的长度方向均匀排列。譬如请参阅图3，图3为所述第一导电电轨131的部分示意图，所述第一导电电轨131开设有多个固定槽133，图3仅示出一部分，所述固定槽133沿所述第一导电电轨131的长度方向A均匀排列，所述固定槽133可卡合固定所述热量条14。Specifically, each of the conductive rails is provided with at least one fixing slot along the length thereof, and the first conductive rail 121 and the fixing slot on the second conductive rail 122 are in one-to-one correspondence, and pass through one by one. The corresponding fixing groove is engaged with the supported heat strip 14 . Wherein, when there are a plurality of fixing slots of each conductive rail, the fixing slots are evenly arranged along the length direction of the conductive rails in which they are located. For example, please refer to FIG. 3. FIG. 3 is a partial schematic view of the first conductive power rail 131. The first conductive power rail 131 is provided with a plurality of fixing slots 133. FIG. 3 shows only a part, and the fixing slot 133 is along. The longitudinal direction A of the first conductive electric rail 131 is evenly arranged, and the fixing groove 133 can be engaged with the heat strip 14 .
在本实施例中，所述热量条14优选为光源条。譬如请参阅图4，所述光源条14包括电源条主体141以及设置在所述电源条主体141上的电源142，所述电源142用于在点亮时产生热量。所述光源142譬如为LED灯，所述LED灯沿所述光源条主体141的长度方向B均匀排列，以使得所述光源条14产生的热量均匀。In the present embodiment, the heat strip 14 is preferably a light source strip. For example, referring to FIG. 4, the light source strip 14 includes a power strip body 141 and a power source 142 disposed on the power strip body 141 for generating heat when lighting. The light source 142 is, for example, an LED lamp, and the LED lamps are evenly arranged along the length direction B of the light source strip body 141 to make the heat generated by the light source strip 14 uniform.
请一并参阅图2，所述测试盒11内设置有至少一条的热量条14，所述热量条14通过所述固定槽133（图3）卡合连接所述导电电轨13，并可在方向A自由调节在所述导电电轨13上的位置。而所述导电电轨13除了用于卡合固定所述热量条14外，还用于对所述热量条14进行供电，以使得所述热量条14产生热量。譬如对图4所示的所述光源条14通电后，所述光源条14上的LED灯点亮，进而产生热量。Referring to FIG. 2 together, at least one heat strip 14 is disposed in the test box 11, and the heat strip 14 is coupled to the conductive rail 13 through the fixing slot 133 (FIG. 3), and The direction A is free to adjust the position on the conductive track 13. The conductive rail 13 is used to supply the heat strip 14 in addition to the heat-storing of the heat strip 14, so that the heat strip 14 generates heat. For example, after the light source strip 14 shown in FIG. 4 is energized, the LED light on the light source strip 14 illuminates, thereby generating heat.
请参阅图5，图4为所述测试盒10的底板12的示意图，其中所述底板12相对于所述开口部11设置，所述底板12上设置有至少一个的散热孔121。具体的，所述散热孔121沿着所述底板12的一固定方向均匀排列，譬如在图5中，所述散热孔121沿着所述底板12的行方向和列方向均匀排列。Referring to FIG. 5 , FIG. 4 is a schematic diagram of the bottom plate 12 of the test box 10 , wherein the bottom plate 12 is disposed relative to the opening portion 11 , and the bottom plate 12 is provided with at least one heat dissipation hole 121 . Specifically, the heat dissipation holes 121 are evenly arranged along a fixed direction of the bottom plate 12. For example, in FIG. 5, the heat dissipation holes 121 are evenly arranged along the row direction and the column direction of the bottom plate 12.
请参阅图6，在本发明实施例中，所述散热孔121包括有褶皱部122，通过所述褶皱部122可调节所述散热孔121的大小，并由此对所述测试盒10内的热量进行控制。Referring to FIG. 6 , in the embodiment of the present invention, the heat dissipation hole 121 includes a pleat portion 122 , and the size of the heat dissipation hole 121 can be adjusted by the pleat portion 122 and thereby the inside of the test box 10 . Heat is controlled.
本发明实施例提供的液晶面板的测试***的工作原理为：The working principle of the test system for the liquid crystal panel provided by the embodiment of the present invention is as follows:
在对液晶面板进行测试时，将所述液晶面板平置于所述测试盒10的开口部11，之后对所述导电电轨13通电。在所述导电电轨13通电后，所述热量条14开始产生热量，通过所述热量条14产生的热量对所述液晶面板进行测试。When the liquid crystal panel is tested, the liquid crystal panel is placed flat on the opening portion 11 of the test cartridge 10, and then the conductive rail 13 is energized. After the conductive rail 13 is energized, the heat strip 14 begins to generate heat, and the liquid crystal panel is tested by the heat generated by the heat strip 14.
在测试过程中，由于所述测试盒10内设置有多个热量条14，因此可通过调节所述热量条14的位置来控制对所述液晶面板的供热。During the test, since a plurality of heat strips 14 are disposed in the test cartridge 10, the heating of the liquid crystal panel can be controlled by adjusting the position of the heat strip 14.
在测试过程中，还可通过调节所述散热孔121上的所述褶皱部122的大小，来调节所述测试盒10内的热量，譬如一旦所述测试盒10内的热量过大，则压缩所述褶皱部122，以使得所述散热孔121变大，加快所述测试盒10内的热量散发；反之伸展所述褶皱部122，以使得所述散热孔121变小，减少所述测试盒10内的热量散发。During the test, the heat in the test box 10 can also be adjusted by adjusting the size of the pleat portion 122 on the heat dissipation hole 121, for example, if the heat in the test box 10 is too large, the compression is performed. The pleat portion 122 is configured to increase the heat dissipation hole 121 to accelerate heat dissipation in the test box 10; otherwise, the pleat portion 122 is stretched to make the heat dissipation hole 121 small, and the test box is reduced. The heat inside 10 is emitted.
请参阅图6，图6为本发明实施例提供的液晶面板的测试方法的流程示意图，其中所述液晶面板的测试方法基于本实施例提供的液晶面板的测试***而完成。Referring to FIG. 6 , FIG. 6 is a schematic flow chart of a method for testing a liquid crystal panel according to an embodiment of the present invention. The test method of the liquid crystal panel is completed based on the test system of the liquid crystal panel provided in this embodiment.
在步骤S601中，提供一测试盒10。In step S601, a test cartridge 10 is provided.
所述测试盒10包括一开口部11以及一底板12，所述开口部11与所述底板12相对设置，所述底板12上开设有散热孔121，所述测试盒10内设置导电电轨13以及热量条14。The test box 10 includes an opening portion 11 and a bottom plate 12, and the opening portion 11 is disposed opposite to the bottom plate 12. The bottom plate 12 defines a heat dissipation hole 121, and the test box 10 is provided with a conductive electric rail 13 And the heat strip 14.
在步骤S602中，将待测试液晶面板放置于所述测试盒10的开口侧（即开口部11）上。In step S602, the liquid crystal panel to be tested is placed on the open side (ie, the opening portion 11) of the test cartridge 10.
在步骤S603中，对所述导电电轨13通电，以使得所述热量条14产生热量，并通过所述热量条14产生的热量对所述待测试液晶面板进行测试。In step S603, the conductive rail 13 is energized to cause the heat strip 14 to generate heat, and the liquid crystal panel to be tested is tested by the heat generated by the heat strip 14.
在本实施例中，所述热量条14优选为光源条。譬如请参阅图4，所述光源条14包括电源条主体141以及设置在所述电源条主体141上的电源142，所述电源142用于在点亮时产生热量，并通过所述电源142产生热量以对所述待测试液晶面板进行测试。所述光源142譬如为LED灯，所述LED灯沿所述光源条主体141的长度方向B均匀排列，以使得所述光源条14产生的热量均匀。In the present embodiment, the heat strip 14 is preferably a light source strip. For example, referring to FIG. 4, the light source strip 14 includes a power strip body 141 and a power source 142 disposed on the power strip body 141. The power source 142 is configured to generate heat when illuminated, and is generated by the power source 142. Heat is used to test the liquid crystal panel to be tested. The light source 142 is, for example, an LED lamp, and the LED lamps are evenly arranged along the length direction B of the light source strip body 141 to make the heat generated by the light source strip 14 uniform.
其中所述导电电轨13包括第一导电电轨131和第二导电电轨132，所述第一导电电轨131和第二导电电轨132设置于所述测试盒10内相对的两侧，所述热量条14由所述第一导电电轨131和第二导电电轨132支撑连接。The conductive power rail 13 includes a first conductive power rail 131 and a second conductive power rail 132. The first conductive power rail 131 and the second conductive power rail 132 are disposed on opposite sides of the test box 10. The heat strip 14 is supported and connected by the first conductive rail 131 and the second conductive rail 132.
请一并参阅图6，所述散热孔121包括有褶皱部122，通过所述褶皱部122可调节所述散热孔121的大小，并由此对所述测试盒10内的热量进行控制。Referring to FIG. 6 together, the heat dissipation hole 121 includes a pleated portion 122. The pleat portion 122 can adjust the size of the heat dissipation hole 121 and thereby control the heat in the test box 10.
本发明通过提供一测试盒，其一侧开口设置，内部设置有导电电轨以及与所述导电电轨连接的热量条，在对液晶面板进行测试时，将所述液晶面板平置于所述测试盒的开口部一侧，并对所述导电电轨通电，所述热量条产生热量从而对所述液晶面板进行测试。显然，本发明不仅测试成本低，而且可统一对液晶面板进行测试，测试效率高，效果好。The present invention provides a test box which is provided with one side opening, and is internally provided with a conductive electric rail and a heat strip connected to the conductive electric rail. When the liquid crystal panel is tested, the liquid crystal panel is placed flat. The open side of the test box is energized, and the conductive track is energized, and the heat strip generates heat to test the liquid crystal panel. Obviously, the invention not only has low test cost, but also can uniformly test the liquid crystal panel, and has high test efficiency and good effect.
综上所述，虽然本发明已以优选实施例揭露如上，但上述优选实施例并非用以限制本发明，本领域的普通技术人员，在不脱离本发明的精神和范围内，均可作各种更动与润饰，因此本发明的保护范围以权利要求界定的范围为准。In the above, the present invention has been disclosed in the above preferred embodiments, but the preferred embodiments are not intended to limit the present invention, and those skilled in the art can make various modifications without departing from the spirit and scope of the invention. The invention is modified and retouched, and the scope of the invention is defined by the scope defined by the claims.
本发明的实施方式Embodiments of the invention
工业实用性Industrial applicability
序列表自由内容Sequence table free content

Claims (14)

  1. 一种液晶面板的测试***，包括：A test system for a liquid crystal panel, comprising:
    测试盒；其一侧开口设置，用于放置待测试液晶面板；所述测试盒还包括一底板，其与所述测试盒开口的一侧相对设置，所述底板上开设有散热孔；a test box; one side opening is arranged for placing the liquid crystal panel to be tested; the test box further includes a bottom plate opposite to the side of the opening of the test box, and the bottom plate is provided with a heat dissipation hole;
    导电电轨；其设置于所述测试盒的内侧，并连接外部电源；以及a conductive rail; disposed on an inner side of the test box and connected to an external power source;
    电源条；其设置于所述测试盒内，并连接所述导电电轨，用于在所述导电电轨接通所述外部电源时点亮进而产生热量，以对所述待测试液晶面板进行测试。a power strip disposed in the test box and connected to the conductive power rail for illuminating and generating heat when the conductive power rail is turned on, to perform heat on the liquid crystal panel to be tested test.
  2. 根据权利要求1所述的液晶面板的测试***，其中所述电源条包括电源条主体以及设置在所述电源条主体上的电源，所述电源用于在点亮时产生热量。A test system for a liquid crystal panel according to claim 1, wherein said power strip comprises a power strip body and a power source provided on said power strip main body, said power source for generating heat when lighting.
  3. 根据权利要求1所述的液晶面板的测试***，其中所述导电电轨包括第一导电电轨和第二导电电轨，所述第一导电电轨和第二导电电轨设置于所述测试盒内相对的两侧，所述热量条由所述第一导电电轨和第二导电电轨同时支撑连接。The test system of a liquid crystal panel according to claim 1, wherein said conductive power rail comprises a first conductive power rail and a second conductive power rail, and said first conductive power rail and said second conductive power rail are disposed in said test The opposite side of the box, the heat strip is simultaneously supported and connected by the first conductive rail and the second conductive rail.
  4. 根据权利要求1所述的液晶面板的测试***，其中所述散热孔包括有褶皱部，所述褶皱部用于改变所述散热孔的大小。A test system for a liquid crystal panel according to claim 1, wherein said heat dissipation hole includes a pleat portion for changing a size of said heat dissipation hole.
  5. 一种液晶面板的测试***，包括：A test system for a liquid crystal panel, comprising:
    测试盒；其一侧开口设置，用于放置待测试液晶面板；a test box; one side opening is provided for placing the liquid crystal panel to be tested;
    导电电轨；其设置于所述测试盒的内侧，并连接外部电源；以及a conductive rail; disposed on an inner side of the test box and connected to an external power source;
    热量条；其设置于所述测试盒内，并连接所述导电电轨，用于在所述导电电轨接通所述外部电源时产生热量，以对所述待测试液晶面板进行测试。a heat strip; disposed in the test box and connected to the conductive power rail for generating heat when the conductive power rail is turned on by the external power source to test the liquid crystal panel to be tested.
  6. 根据权利要求5所述的液晶面板的测试***，其中所述热量条包括电源条，所述电源条包括电源条主体以及设置在所述电源条主体上的电源，所述电源用于在点亮时产生热量。A test system for a liquid crystal panel according to claim 5, wherein said heat strip comprises a power strip, said power strip comprising a power strip body and a power source provided on said power strip body, said power source being used for lighting It generates heat.
  7. 根据权利要求5所述的液晶面板的测试***，其中所述导电电轨包括第一导电电轨和第二导电电轨，所述第一导电电轨和第二导电电轨设置于所述测试盒内相对的两侧，所述热量条由所述第一导电电轨和第二导电电轨同时支撑连接。A test system for a liquid crystal panel according to claim 5, wherein said conductive track comprises a first conductive track and a second conductive track, said first conductive track and said second conductive track being disposed in said test The opposite side of the box, the heat strip is simultaneously supported and connected by the first conductive rail and the second conductive rail.
  8. 根据权利要求5所述的液晶面板的测试***，还包括：The test system for a liquid crystal panel according to claim 5, further comprising:
    底板，其与所述测试盒开口的一侧相对设置，所述底板上开设有散热孔。a bottom plate opposite to a side of the opening of the test box, wherein the bottom plate is provided with a heat dissipation hole.
  9. 根据权利要求8所述的液晶面板的测试***，其中所述散热孔包括有褶皱部，所述褶皱部用于改变所述散热孔的大小。A test system for a liquid crystal panel according to claim 8, wherein said heat dissipation hole includes a pleat portion for changing a size of said heat dissipation hole.
  10. 一种液晶面板的测试方法，包括：A method for testing a liquid crystal panel, comprising:
    提供一测试盒，其中所述测试盒的一侧开口设置，所述测试盒内设置有导电电轨以及与所述导电电轨连接的热量条；Providing a test box, wherein one side of the test box is open, and the test box is provided with a conductive electric rail and a heat strip connected to the conductive electric rail;
    将待测试液晶面板放置于所述测试盒的开口侧上；以及Placing a liquid crystal panel to be tested on the open side of the test box;
    对所述导电电轨通电，以使得所述热量条产生热量，并通过所述热量条产生的热量对所述待测试液晶面板进行测试。The conductive rail is energized such that the heat strip generates heat and the liquid crystal panel to be tested is tested by the heat generated by the heat strip.
  11. 根据权利要求10所述的液晶面板的测试方法，其中所述热量条包括电源条，所述电源条包括电源条主体以及设置在所述电源条主体上的电源，对所述导电电轨通电，以使得所述热量条产生热量的步骤包括：The testing method of a liquid crystal panel according to claim 10, wherein the heat strip comprises a power strip, the power strip comprises a power strip body and a power source disposed on the power strip body, and the conductive rail is energized, The step of causing the heat strip to generate heat includes:
    对所述导电电轨通电，以点亮所述电源，并通过所述电源产生热量以对所述待测试液晶面板进行测试。The conductive rail is energized to illuminate the power source, and heat is generated by the power source to test the liquid crystal panel to be tested.
  12. 根据权利要求10所述的液晶面板的测试方法，其中所述导电电轨包括第一导电电轨和第二导电电轨，所述第一导电电轨和第二导电电轨设置于所述测试盒内相对的两侧，所述热量条由所述第一导电电轨和第二导电电轨同时支撑连接。The method of testing a liquid crystal panel according to claim 10, wherein said conductive track comprises a first conductive track and a second conductive track, said first conductive track and said second conductive track being disposed in said test The opposite side of the box, the heat strip is simultaneously supported and connected by the first conductive rail and the second conductive rail.
  13. 根据权利要求10所述的液晶面板的测试方法，其中所述测试盒还包括：The testing method of a liquid crystal panel according to claim 10, wherein the test box further comprises:
    底板，其与所述测试盒开口的一侧相对设置，所述底板上开设有散热孔。a bottom plate opposite to a side of the opening of the test box, wherein the bottom plate is provided with a heat dissipation hole.
  14. 根据权利要求13所述的液晶面板的测试方法，其中所述散热孔包括有褶皱部，而在通过所述热量条产生的热量对所述待测试液晶面板进行测试时，包括：The method for testing a liquid crystal panel according to claim 13, wherein the heat dissipation hole includes a pleat portion, and when the heat to be tested is tested by the heat generated by the heat strip, the method includes:
    通过改变所述褶皱部以改变所述散热孔的大小，并由此控制所述测试盒内的热量。The heat in the test box is controlled by changing the pleats to change the size of the heat dissipation holes.
PCT/CN2013/080121 2013-07-23 2013-07-25 System and method for testing liquid crystal panel WO2015010300A1 (en)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
CN201310311022.5A CN103399421B (en) 2013-07-23 2013-07-23 The test macro of liquid crystal panel and method
CN201310311022.5 2013-07-23

Publications (1)

Publication Number Publication Date
WO2015010300A1 true WO2015010300A1 (en) 2015-01-29

Family

ID=49563073

Family Applications (1)

Application Number Title Priority Date Filing Date
PCT/CN2013/080121 WO2015010300A1 (en) 2013-07-23 2013-07-25 System and method for testing liquid crystal panel

Country Status (2)

Country Link
CN (1) CN103399421B (en)
WO (1) WO2015010300A1 (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN113851065A (en) * 2020-06-09 2021-12-28 华为技术有限公司 Display panel testing device and display panel testing box

Families Citing this family (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN105259685B (en) * 2015-11-27 2018-08-24 武汉华星光电技术有限公司 A kind of experiment jig applied to liquid crystal display die set
CN107316595B (en) * 2017-07-03 2020-09-01 深圳市华星光电技术有限公司 Backlight source device for aging test and aging test method of liquid crystal display panel

Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US20020153921A1 (en) * 2001-04-19 2002-10-24 Lin Shao- Ming Test device for testing a liquid crystal display (LCD) unit
US20070047239A1 (en) * 2005-09-01 2007-03-01 Kang Dong W Backlight unit for test device of LCD panel
CN101881424A (en) * 2010-06-17 2010-11-10 深圳市华星光电技术有限公司 Backlight module and lamp tube support frame thereof
CN102981290A (en) * 2012-11-29 2013-03-20 友达光电(厦门)有限公司 Diaphragm detection jig used for liquid crystal display module

Patent Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US20020153921A1 (en) * 2001-04-19 2002-10-24 Lin Shao- Ming Test device for testing a liquid crystal display (LCD) unit
US20070047239A1 (en) * 2005-09-01 2007-03-01 Kang Dong W Backlight unit for test device of LCD panel
CN101881424A (en) * 2010-06-17 2010-11-10 深圳市华星光电技术有限公司 Backlight module and lamp tube support frame thereof
CN102981290A (en) * 2012-11-29 2013-03-20 友达光电(厦门)有限公司 Diaphragm detection jig used for liquid crystal display module

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN113851065A (en) * 2020-06-09 2021-12-28 华为技术有限公司 Display panel testing device and display panel testing box
CN113851065B (en) * 2020-06-09 2023-08-22 华为技术有限公司 Display panel testing device and display panel testing box

Also Published As

Publication number Publication date
CN103399421A (en) 2013-11-20
CN103399421B (en) 2015-09-09

Similar Documents

Publication Publication Date Title
WO2015010300A1 (en) System and method for testing liquid crystal panel
WO2015196498A1 (en) Direct-type backlight structure for double-surface display
WO2017063270A1 (en) Backlight module and plastic frame structure
CN105446002B (en) Display and its backlight module
CN107316595B (en) Backlight source device for aging test and aging test method of liquid crystal display panel
US9357611B2 (en) Light emitting diode driver apparatus
TW200630685A (en) Liquid crystal display and method of adjusting internal temperature thereof
CN206093640U (en) LED lamp panel
WO2013159377A1 (en) Detection method and device for backlight module
CN108037617A (en) Liquid crystal display and its backlight module
CN106355982A (en) Electrical general-purpose test bench
WO2013071609A1 (en) Back frame of flat panel display device and backlight system
CN106443507A (en) Induction lamp detection system and method thereof
TW200724886A (en) Inspection apparatus for liquid crystal display panels
CN102740113A (en) Sensitization measurement device of miniature camera
CN105093673A (en) Anti-assembling backlight glue frame, backlight module and display apparatus
CN203759383U (en) Display panel tray and high-temperature aging system
CN206489350U (en) A kind of single sided backlight
CN204612351U (en) Integral type lighting display device and there is the refrigerator of this integral type lighting display device
CN201916870U (en) LED backlight lamp line, LED liquid crystal module and display device thereof
CN207904277U (en) Incubator and culture box assembly
CN203147400U (en) Small-sized LED backlight plate
WO2013071535A1 (en) Flat-panel display device and stereo display device
CN216647768U (en) Magnetic rubber back-pasting type liquid crystal splicing screen with adjustable light intensity
CN108572828A (en) A kind of circuit board burning test device

Legal Events

Date Code Title Description
121 Ep: the epo has been informed by wipo that ep was designated in this application

Ref document number: 13890213

Country of ref document: EP

Kind code of ref document: A1

NENP Non-entry into the national phase

Ref country code: DE

122 Ep: pct application non-entry in european phase

Ref document number: 13890213

Country of ref document: EP

Kind code of ref document: A1