WO2014134984A1 - Procédé et système d'essai - Google Patents

Procédé et système d'essai Download PDF

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Publication number
WO2014134984A1
WO2014134984A1 PCT/CN2014/071113 CN2014071113W WO2014134984A1 WO 2014134984 A1 WO2014134984 A1 WO 2014134984A1 CN 2014071113 W CN2014071113 W CN 2014071113W WO 2014134984 A1 WO2014134984 A1 WO 2014134984A1
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WO
WIPO (PCT)
Prior art keywords
test
devices
tested
path
control
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PCT/CN2014/071113
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English (en)
Chinese (zh)
Inventor
陈玉华
刘鑫正
蔡成亮
Original Assignee
中兴通讯股份有限公司
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Filing date
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Application filed by 中兴通讯股份有限公司 filed Critical 中兴通讯股份有限公司
Publication of WO2014134984A1 publication Critical patent/WO2014134984A1/fr

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Classifications

    • H—ELECTRICITY
    • H04—ELECTRIC COMMUNICATION TECHNIQUE
    • H04B—TRANSMISSION
    • H04B17/00—Monitoring; Testing
    • H04B17/10—Monitoring; Testing of transmitters
    • H04B17/15—Performance testing
    • H04B17/16—Test equipment located at the transmitter
    • H—ELECTRICITY
    • H04—ELECTRIC COMMUNICATION TECHNIQUE
    • H04B—TRANSMISSION
    • H04B17/00—Monitoring; Testing
    • H04B17/0082—Monitoring; Testing using service channels; using auxiliary channels
    • H04B17/0085—Monitoring; Testing using service channels; using auxiliary channels using test signal generators

Definitions

  • the present invention relates to the field of communications, and in particular, to a test method and a test system.
  • various tests are involved, and in the current testing field, it is often necessary to use various test equipments to test the devices to be tested, and the most commonly used is test instruments.
  • the current test instrument can only be connected to one device to be tested at a time. After the test is completed, the device to be tested needs to be replaced. The device to be tested is usually manually completed by the tester. This causes the test instrument to be run in the presence of someone. In the off-hours, the expensive test instrument is completely idle, resulting in a huge waste of resources; it also reduces the efficiency of the test.
  • the main technical problem to be solved by the embodiments of the present invention is to provide a test method and a test system, which solve the problems of low test efficiency and high test cost in the current test process.
  • an embodiment of the present invention provides a test system, including: a test control device, a test path selection device, M test devices, and N devices to be tested, wherein the M is greater than or equal to 1, and the N is greater than or equal to 1; the M test devices are connected to an input end of the test path selecting device, the N test devices are connected to an output end of the test path selecting device, and the test path selecting device is configured to The test path control command sent by the test control device selects a corresponding test device from the M test devices to test the N test devices.
  • the test system further includes a power path selection device, wherein an input end of the power path selection device is connected to a power source, and an output end is connected to the N devices to be tested;
  • the selecting means is configured to connect the device under test in the current test path to the power source according to the power path control command sent by the test control device.
  • the test system further includes a communication path selecting device, one end of the communication selecting device is connected to the test control device, and the other end is connected to the N devices to be tested; Communication
  • the path selecting means is configured to connect the device under test in the current test path to the test control device according to the communication path control command sent by the test control device.
  • the test path selection device selects a corresponding test device from the M test devices according to a test path control command sent by the test control device to perform the N test devices.
  • the test is: the test path selecting device sequentially selects the test device from the M test devices according to the test path control instruction, and tests the N test devices one by one.
  • the test path control instruction includes a first test path control instruction and a second test path control instruction; the test path selection means sequentially sequentially from the M according to the test path control instruction Selecting the test device in the test device to test the N devices to be tested one by one includes: the test path selecting device selects one test device from the test device according to the first test path control instruction to the N devices to be tested Performing a test; during the test, the test device currently performing the test, after each test device is tested, the test path selection device is based on the second test path control command sent by the test control device from the remaining device under test Selecting one of the connection with the test device; after the test device currently performing the test tests the N devices to be tested, the test path selection device is based on the first test path control command sent by the test control device Re-selecting a test device in the test device to test the N devices under test, M to the test apparatus are of the N test apparatus were tested.
  • the testing device is further configured to send the test result to the test control device after testing each device to be tested.
  • the test control device is further configured to store a test strategy; the test device is further configured to acquire a test from the test control device before testing the device to be tested connected thereto The policy is then tested against the device under test to which it is currently connected according to the test strategy.
  • a testing method including: connecting M test devices to an input end of a test path selecting device, and connecting N test devices to an output end of the test path selecting device.
  • the M is greater than or equal to 1, and the N is greater than or equal to 1; the test path selection device selects a corresponding test device from the M test devices according to a test path control instruction to test the N devices to be tested.
  • the test path selection device selects a corresponding test device from the M test devices according to the test path control instruction to test the N devices to be tested as: Measurement
  • the test path selecting means sequentially selects the test device from the M test devices according to the test path control instruction to test the N test devices one by one.
  • the test control device is further configured to analyze all the test results received after the M test devices test the N test devices one by one, according to The analysis result determines a device to be tested that needs to be retested, and sends a retest control command to the test path selection device; the test path selection device is further configured to sequentially sequentially from the M test devices according to the retest control command The test device is selected to test the devices to be tested that need to be retested one by one.
  • the test path control instruction includes a first test path control instruction and a second test path control instruction; the test path selection device sequentially according to the test path control instruction sent by the test control device Selecting the test device from the M test devices to test the N test devices one by one includes: the test path selection device selects one test device from the test device according to the first test path control instruction N test devices are tested; during the test process, after the test device currently being tested, after each test device is tested, the test path selection device is left in accordance with the second test path control command sent by the test control device Selecting one of the devices to be tested is connected to the test device; after the test device currently performing the test tests the N devices to be tested, the test path selecting device is configured according to the first test path sent by the test control device Controlling instructions to reselect a test device from the remaining test devices to the N to The test device is tested until the N test devices have tested the N test devices.
  • the testing device sends the test result to the test control device after testing each device to be tested; the test control device is in the M test devices After the N test devices are tested one by one, all the test results received are analyzed, the device to be tested that needs to be retested is determined according to the analysis result, and a retest control command is sent to the test path selecting device; The selecting device sequentially selects the testing device from the M testing devices according to the retesting control command, and tests the device to be tested that needs to be retested one by one.
  • the beneficial effects of the embodiments of the present invention are:
  • the testing method and system provided by the embodiments of the present invention connect the M test devices to the input end of the test path selecting device, and output the N test devices and the test path selecting device Connection, M is greater than or equal to 1, N is greater than or equal to 1; then the test path selection device can select from M test devices according to the test path control command
  • the corresponding test device tests the N devices to be tested, that is, the test path selection device in the embodiment of the present invention can automatically select one or more test devices to test the N devices under test under the control of the test path control command. .
  • FIG. 1 is a schematic structural diagram 1 of a test system according to an embodiment of the present invention
  • FIG. 2 is a schematic structural diagram 2 of a test system according to an embodiment of the present invention
  • FIG. 3 is a test system according to an embodiment of the present invention
  • FIG. 4 is a schematic structural diagram of a test system according to an embodiment of the present invention
  • FIG. 5 is a schematic structural diagram of an integrated arrangement of each path selection device in FIG. 4;
  • FIG. 6 is a test diagram of an embodiment of the present invention.
  • Method flow diagram DETAILED DESCRIPTION OF THE PREFERRED EMBODIMENTS
  • FIG. 1 the figure shows a test system, a test control device, a test path selection device, M test devices, and N devices to be tested.
  • the M in this embodiment is greater than or equal to 1, N is greater than or equal to 1;
  • the test control device can also be used as a test control center, mainly for controlling the selection of each path, testing the device to be tested, collecting various parameter information of the device to be tested, and collecting Various test results fed back by the test device, various processing analysis based on the test results, and the like.
  • the test path selection device in this embodiment may be implemented by pure hardware, or may be implemented by software in combination with hardware, and may include a control unit for receiving a control command sent by the test control device to perform a corresponding operation.
  • the test device in this embodiment may be various test instruments, and the device to be tested may be various devices to be tested corresponding to the respective test instruments.
  • the M test devices are connected to the input end of the test path selection device, and the N test devices are connected to the output end of the test path selection device.
  • the input end and the output of the test path selection device are tested.
  • the number of channels in the end may be specifically set according to specific application scenarios and the like; and the specific selection of the M and N values in the embodiment may also be selected according to specific application scenarios, as long as the value of M is not greater than the test.
  • the number of paths at the input end of the path selection device, and the value of N is not greater than the number of channels at the output of the test path selection device; the test path selection device and the test control device are configured to receive test path control commands sent by the test control device, And selecting the corresponding test device from the M test devices according to the test path control instruction to test the N test devices.
  • the test device can be selected from the M test devices by selecting one or more (less than M) corresponding to the control command, or the test device can be selected one by one from the M test devices, and the selected device is selected.
  • the test device tests all of the N test devices.
  • the N devices to be tested when a test device tests N devices to be tested, according to actual conditions, the N devices to be tested may be tested one by one, or multiple of the N devices to be tested may be simultaneously tested.
  • the identification of the test device and the device to be tested may be specifically identified by each device number, or may be identified by identification information (such as identification information) of each device; The identification information of the device may be manually input by the tester, or the devices may be automatically reported through the corresponding communication link.
  • the test strategy used by the testing device to test each device to be tested may be preset on each test device or one or more of the test devices according to actual conditions, and then the test device is not preset.
  • test control device It can be obtained from a preset test device; or various test strategies can be preset directly on the test control device, and then the test control device will respond according to the test device currently being tested and the device to be tested currently on the side.
  • the test strategy is sent to the test device, and the test device currently being tested can actively request the test strategy from the test control device; when preset on the test control device, the test device is tested on the device to be tested connected thereto, The corresponding test strategy needs to be obtained on the test control device. Only when the test device detects that the currently stored test strategy matches the currently tested device under test, the test device may be re-acquired without testing the test device, and the device to be tested may be directly tested, and the test is completed.
  • the test result is uploaded to the data collection center corresponding to the uploaded value; in this embodiment, the test control device can be uploaded to the test control device, and the test result can be uploaded to the test control device after the test device is not tested.
  • the device can know that the current test is completed, and sends a control command to the test path selection device to switch the test path.
  • the test control device performs subsequent processing and analysis based on the collected test results.
  • the test results can also be sent to the corresponding processing device for processing analysis.
  • the test path selection device sequentially selects the test device from the M test devices according to the test path control command sent by the test control device, and the N test devices are tested one by one as an example.
  • the test path control instruction sent by the test control device in this embodiment includes a first test path control instruction and a second test path control instruction; the first test path control instruction is mainly used to select the test device, and the second test path control instruction is mainly
  • the specific selection and testing process is as follows: The test path selection device first selects one test device from the test device according to the first test path control command to test the N devices to be tested; the test process in the test device Medium, the test device currently being tested After each test device is tested, the test path selection device selects one of the remaining devices under test to be connected to the test device for testing according to the second test path control command sent by the test control device; the test device currently performing the test After testing the N devices to be tested, the test path selecting device reselects one test device from
  • each test device Since each of the M test devices tests the N devices to be tested, each test device has M test results, and the test results obtained by statistical analysis based on the M test results are more accurate. In order to better control the test process, the test results obtained are more accurate.
  • the power supply of each device to be tested can also be controlled by the test control device. Referring to FIG.
  • the test system in this embodiment may further include a power path selection device, wherein the input end of the power path selection device is connected to the power source, and the output end is connected to the N devices to be tested; Receiving a power path control command sent by the test control device, and after receiving the command, connecting the device under test in the current test path to the power source, and the output voltage and current of the power source are test control devices or The control unit of the power path selection device itself can be adjusted for different devices to be tested within a certain range.
  • the test system in this embodiment may further include a communication path selecting device. One end of the communication selecting device is connected to the test control device, and the other end is connected to the N devices to be tested. The communication path selecting device is used.
  • the test control device may acquire information such as various parameters of the device to be tested connected to the communication device based on the communication path, And sending, by the communication path, a corresponding instruction to the device under test to set, modify, and the like of the parameter of the device to be tested.
  • the test system in this embodiment may further include a display device, where the display device may be configured to set content to be displayed according to an application scenario, for the tester or the monitoring personnel to view, and more convenient to monitor the test.
  • the devices included in the test system can be connected by a bus or the like.
  • the test path selecting device, the power path selecting device and the communication path selecting device in the embodiment can be integrated into an intelligent multi-way switch, and each switch module is controlled by a control module, as shown in FIG. 5; Separate settings are provided, and a control unit is separately provided in each device to receive the command sent by the test control device to execute the corresponding function by running the corresponding program.
  • the input and output terminals of each device can be set as a universal connection port, and different types of test cables can be connected as needed, and the versatility is good, and the test control device sends the test path control command and the power supply.
  • the timing of the path control command and the communication path control command is not strictly limited, and the setting may be selected according to a specific application scenario; for example, when the device under test is switched according to the second test path control command sent by the test control device, the test is performed.
  • Control device The power path selection means and the communication path selecting means respectively transmit a power path control command and a communication path control command to perform switching of the power path and the communication path.
  • test system is initialized, and all the devices to be tested are connected with the output paths of the test path selection device, the power path selection device, and the communication path selection device, and all the test devices are connected with the input of the test path selection device, and the power path is connected.
  • the input end of the selection device is connected to the power source, and the power path selection device is connected to the test control device, and the input end of the communication path selection device is connected to the test control device; the specific connection can be connected through the bus; then the tester is on the test control device
  • the configuration software includes configuring a corresponding test strategy and starting the test; the test control device sends a corresponding control command according to the configuration to select a test path, a communication path and a power path, and the corresponding test device and the device to be tested are also determined.
  • the testing device starts to test the device to be tested that is currently connected thereto; when the device to be tested is tested, the testing device transmits the test data to the test control device for saving, and the test control device sends a corresponding control command to the test.
  • the path selection device, the power path selection device, and the communication path selection device select the next test path, the communication path and the power path, and start measuring a device to be tested; when all the devices to be tested are tested, the test device controls the test device Switching, switching to the next test device, until all test devices are tested by the test device; then the test control device analyzes all the test results received, and determines the device to be tested that needs to be retested based on the analysis result.
  • test control device sends the retest control command to the test path selection.
  • the test path selection device is further configured to sequentially select a test device from the M test devices according to the received retest control command to test the devices to be tested that need to be retested one by one; and select the test according to the retest control command.
  • the test control device may arrange for the device under test to have a problem with the test result to rearrange the retest according to the control strategy, and save the test result of the retest; the process of the retest may adopt the above test process.
  • the test device as the test instrument
  • the test control device as the control center
  • the test path selection device, the power path selection device, and the communication path selection device are collectively set as an intelligent multiplexer as an example, and the embodiment of the present invention is made with reference to FIG.
  • Step 600 Start;
  • Step 601 Test system software and hardware initialization, hardware aspects, M test instruments and N devices to be tested are connected to the intelligent multi-way switch through the bus according to the above manner, and
  • the control center is connected to the intelligent multi-way switch and the test instrument through the bus, and the software is configured to configure the test script;
  • Step 602 The intelligent multi-way switch automatically selects and connects with the test instrument j at the input end according to the instruction of the control center (j is greater than or equal to 1, less than or equal to M), and the output terminal automatically selects to connect with the device to be tested i (i ⁇ N),
  • the intelligent multi-way switch will also select the corresponding communication path and power path;
  • Step 603 Test instrument j to test device i,
  • the test strategy (or content) is controlled by the script of the control center, the power supply of the device to be tested is provided by the power supply
  • Step 605 The control center issues a second test path control command to automatically switch the output of the intelligent multiplexer device to the next device to be tested, and the program sets 1 +1; simultaneously sends the communication path control command and the power path
  • the control command performs the communication path and the power path;
  • Step 606 Determine whether i is less than or equal to N, and if yes, go to step 603 Otherwise, go to step 607;
  • Step 608 Determine whether j is less than or equal to M, if yes, device step 609; otherwise, go to step 610;
  • Step 609 Control Center Control Intelligence
  • the input of the multiplexer is switched to the test meter "', and then proceeds to step 603;
  • Step 610 The test ends.
  • test system and the test device provided by the embodiments of the present invention can continuously and automatically test the test equipment for a long time by using the control software on various existing test devices without increasing the labor cost.
  • the efficiency of the test device It is especially suitable for R&D testing and debugging, and can also be used for large-scale batch testing.

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  • Physics & Mathematics (AREA)
  • Electromagnetism (AREA)
  • Engineering & Computer Science (AREA)
  • Computer Networks & Wireless Communication (AREA)
  • Signal Processing (AREA)
  • Testing Electric Properties And Detecting Electric Faults (AREA)
  • Data Exchanges In Wide-Area Networks (AREA)

Abstract

La présente invention se rapporte à un procédé et à un système d'essai. Le procédé selon l'invention comprend les étapes suivantes : M dispositifs d'essai sont connectés à la borne d'entrée d'un dispositif de sélection de canal d'essai, et N dispositifs devant être testés sont connectés à la borne de sortie du dispositif de sélection de canal d'essai, M étant supérieur ou égal à 1, et N étant supérieur ou égal à 1; ensuite, sur la base d'une instruction de commande de canal d'essai, le dispositif de sélection de canal d'essai peut sélectionner le dispositif d'essai correspondant parmi les M dispositifs d'essai, afin de tester les N dispositifs devant être testés. Sur la base d'une instruction de commande de canal d'essai, le dispositif de sélection de canal d'essai selon la présente invention peut sélectionner automatiquement un ou plusieurs dispositifs d'essai afin de tester les N dispositifs devant être testés. Durant le déroulement d'un essai, il n'est plus nécessaire de commuter manuellement le dispositif devant être testé, qui est connecté au dispositif d'essai. Sur la base de l'instruction de commande de canal d'essai, une commutation automatique est exécutée par le dispositif de sélection de canal d'essai, et un ou plusieurs essais peuvent être exécutés sur les N dispositifs devant être testés, qui sont connectés au dispositif de sélection de canal d'essai. De cette manière, dans la présente invention, l'efficacité d'essai du dispositif d'essai peut être accrue, et le coût des essais peut être réduit.
PCT/CN2014/071113 2013-08-14 2014-01-22 Procédé et système d'essai WO2014134984A1 (fr)

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