WO2014093721A3 - Abnormal clock rate detection in imaging sensor arrays - Google Patents

Abnormal clock rate detection in imaging sensor arrays Download PDF

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Publication number
WO2014093721A3
WO2014093721A3 PCT/US2013/074828 US2013074828W WO2014093721A3 WO 2014093721 A3 WO2014093721 A3 WO 2014093721A3 US 2013074828 W US2013074828 W US 2013074828W WO 2014093721 A3 WO2014093721 A3 WO 2014093721A3
Authority
WO
WIPO (PCT)
Prior art keywords
clock rate
counter
count value
imaging sensor
clock
Prior art date
Application number
PCT/US2013/074828
Other languages
French (fr)
Other versions
WO2014093721A2 (en
Inventor
Brian Simolon
Eric A. Kurth
Jim Goodland
Mark NUSSMEIER
Nicholas HÖGASTEN
Theodore R. Hoelter
Katrin Strandemar
Pierre Boulanger
Barbara Sharp
Original Assignee
Flir Systems, Inc.
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Flir Systems, Inc. filed Critical Flir Systems, Inc.
Priority to CN201380072541.9A priority Critical patent/CN104981905B/en
Publication of WO2014093721A2 publication Critical patent/WO2014093721A2/en
Publication of WO2014093721A3 publication Critical patent/WO2014093721A3/en

Links

Classifications

    • H—ELECTRICITY
    • H04—ELECTRIC COMMUNICATION TECHNIQUE
    • H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
    • H04N5/00—Details of television systems
    • H04N5/30—Transforming light or analogous information into electric information
    • H04N5/33—Transforming infrared radiation
    • H—ELECTRICITY
    • H04—ELECTRIC COMMUNICATION TECHNIQUE
    • H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
    • H04N25/00—Circuitry of solid-state image sensors [SSIS]; Control thereof
    • H04N25/60—Noise processing, e.g. detecting, correcting, reducing or removing noise
    • H04N25/67—Noise processing, e.g. detecting, correcting, reducing or removing noise applied to fixed-pattern noise, e.g. non-uniformity of response
    • H04N25/671—Noise processing, e.g. detecting, correcting, reducing or removing noise applied to fixed-pattern noise, e.g. non-uniformity of response for non-uniformity detection or correction
    • H04N25/673—Noise processing, e.g. detecting, correcting, reducing or removing noise applied to fixed-pattern noise, e.g. non-uniformity of response for non-uniformity detection or correction by using reference sources
    • H04N25/674—Noise processing, e.g. detecting, correcting, reducing or removing noise applied to fixed-pattern noise, e.g. non-uniformity of response for non-uniformity detection or correction by using reference sources based on the scene itself, e.g. defocusing
    • H—ELECTRICITY
    • H04—ELECTRIC COMMUNICATION TECHNIQUE
    • H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
    • H04N25/00—Circuitry of solid-state image sensors [SSIS]; Control thereof
    • H04N25/70—SSIS architectures; Circuits associated therewith
    • H04N25/71—Charge-coupled device [CCD] sensors; Charge-transfer registers specially adapted for CCD sensors
    • H04N25/745—Circuitry for generating timing or clock signals

Landscapes

  • Engineering & Computer Science (AREA)
  • Multimedia (AREA)
  • Signal Processing (AREA)
  • Transforming Light Signals Into Electric Signals (AREA)
  • Studio Devices (AREA)
  • Photometry And Measurement Of Optical Pulse Characteristics (AREA)

Abstract

Techniques are provided to detect abnormal clock rates in devices such as imaging sensor devices (e.g., infrared or visible light imaging devices). In one example, a device may include a clock rate detection circuit that may be readily integrated as part of the device to provide effective detection of an abnormal clock rate. The device may include a ramp generator, a counter, and/or other components. The ramp generator may generate a ramp signal independent of a clock signal provided to the device, while the counter may increment/decrement a count value in response to the clock signal. The device may include a comparator adapted to select the current count value of the counter when the ramp signal reaches a reference signal. A processor of the device may be adapted to determine whether the clock signal is operating in an acceptable frequency range, based on the selected count value.
PCT/US2013/074828 2012-12-14 2013-12-12 Abnormal clock rate detection in imaging sensor arrays WO2014093721A2 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
CN201380072541.9A CN104981905B (en) 2012-12-14 2013-12-12 Abnormal clock frequency detection in imaging sensor array

Applications Claiming Priority (6)

Application Number Priority Date Filing Date Title
US201261737678P 2012-12-14 2012-12-14
US61/737,678 2012-12-14
US201261748018P 2012-12-31 2012-12-31
US61/748,018 2012-12-31
US201361793181P 2013-03-15 2013-03-15
US61/793,181 2013-03-15

Publications (2)

Publication Number Publication Date
WO2014093721A2 WO2014093721A2 (en) 2014-06-19
WO2014093721A3 true WO2014093721A3 (en) 2014-08-07

Family

ID=49943514

Family Applications (1)

Application Number Title Priority Date Filing Date
PCT/US2013/074828 WO2014093721A2 (en) 2012-12-14 2013-12-12 Abnormal clock rate detection in imaging sensor arrays

Country Status (2)

Country Link
CN (1) CN104981905B (en)
WO (1) WO2014093721A2 (en)

Families Citing this family (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US10602082B2 (en) 2014-09-17 2020-03-24 Fluke Corporation Triggered operation and/or recording of test and measurement or imaging tools
US10271020B2 (en) 2014-10-24 2019-04-23 Fluke Corporation Imaging system employing fixed, modular mobile, and portable infrared cameras with ability to receive, communicate, and display data and images with proximity detection
US10530977B2 (en) 2015-09-16 2020-01-07 Fluke Corporation Systems and methods for placing an imaging tool in a test and measurement tool
WO2017070629A1 (en) 2015-10-23 2017-04-27 Fluke Corporation Imaging tool for vibration and/or misalignment analysis
US20180091290A1 (en) * 2016-09-26 2018-03-29 Mediatek Inc. Method for performing sensor clock estimation of one or more sensors in electronic device, and associated apparatus
CN113162587B (en) * 2021-02-28 2022-03-29 珠海巨晟科技股份有限公司 Clock frequency abnormal deviation detection circuit

Citations (5)

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US5124597A (en) * 1991-04-01 1992-06-23 Tektronix, Inc. Timer circuit including an analog ramp generator and a CMOS counter
JP2003150451A (en) * 2001-11-14 2003-05-23 Sharp Corp Semiconductor device and ic card
JP2005223588A (en) * 2004-02-05 2005-08-18 Fuji Photo Film Co Ltd Digital camera and control method therefor
US20070024383A1 (en) * 2005-07-28 2007-02-01 Zarlink Semiconductor Inc. Phase Locked Loop Fast Lock Method
KR20090088071A (en) * 2008-02-14 2009-08-19 (주)유우일렉트로닉스 Infrared sensor for space detection based on soc(system on chip)

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US4906944A (en) * 1988-08-17 1990-03-06 Rockwell International Corporation Integrator controlled time compensated clock oscillator
US6028309A (en) 1997-02-11 2000-02-22 Indigo Systems Corporation Methods and circuitry for correcting temperature-induced errors in microbolometer focal plane array
US5982318A (en) * 1997-10-10 1999-11-09 Lucent Technologies Inc. Linearizing offset cancelling white balancing and gamma correcting analog to digital converter for active pixel sensor imagers with self calibrating and self adjusting properties
US6452425B1 (en) * 2001-02-13 2002-09-17 Exar Corporation Automatic frequency rate switch
US6812465B2 (en) 2002-02-27 2004-11-02 Indigo Systems Corporation Microbolometer focal plane array methods and circuitry
US7034301B2 (en) 2002-02-27 2006-04-25 Indigo Systems Corporation Microbolometer focal plane array systems and methods
KR100833177B1 (en) * 2002-05-14 2008-05-28 삼성전자주식회사 Signal converting circuit and Signal converting method for automatically adjusting offset
KR100790969B1 (en) * 2005-08-23 2008-01-02 삼성전자주식회사 Image sensor and method using auto-calibrated ramp signal for improving display quality
US7470902B1 (en) 2006-03-20 2008-12-30 Flir Systems, Inc. Infrared camera electronic architectures
US7470904B1 (en) 2006-03-20 2008-12-30 Flir Systems, Inc. Infrared camera packaging
US7679048B1 (en) 2008-04-18 2010-03-16 Flir Systems, Inc. Systems and methods for selecting microbolometers within microbolometer focal plane arrays
BR112019025668B1 (en) 2017-06-08 2024-03-12 Superior Energy Services, L.L.C SUBSURFACE SAFETY VALVE

Patent Citations (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5124597A (en) * 1991-04-01 1992-06-23 Tektronix, Inc. Timer circuit including an analog ramp generator and a CMOS counter
JP2003150451A (en) * 2001-11-14 2003-05-23 Sharp Corp Semiconductor device and ic card
JP2005223588A (en) * 2004-02-05 2005-08-18 Fuji Photo Film Co Ltd Digital camera and control method therefor
US20070024383A1 (en) * 2005-07-28 2007-02-01 Zarlink Semiconductor Inc. Phase Locked Loop Fast Lock Method
KR20090088071A (en) * 2008-02-14 2009-08-19 (주)유우일렉트로닉스 Infrared sensor for space detection based on soc(system on chip)

Also Published As

Publication number Publication date
CN104981905A (en) 2015-10-14
CN104981905B (en) 2018-09-25
WO2014093721A2 (en) 2014-06-19

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