WO2012105788A3 - Pin board - Google Patents

Pin board Download PDF

Info

Publication number
WO2012105788A3
WO2012105788A3 PCT/KR2012/000719 KR2012000719W WO2012105788A3 WO 2012105788 A3 WO2012105788 A3 WO 2012105788A3 KR 2012000719 W KR2012000719 W KR 2012000719W WO 2012105788 A3 WO2012105788 A3 WO 2012105788A3
Authority
WO
WIPO (PCT)
Prior art keywords
circuit board
flexible circuit
board unit
contact
predetermined elasticity
Prior art date
Application number
PCT/KR2012/000719
Other languages
French (fr)
Other versions
WO2012105788A9 (en
WO2012105788A2 (en
Inventor
Jun Soo Cho
Jong Hyun Park
Original Assignee
Pro-2000 Co. Ltd.
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Pro-2000 Co. Ltd. filed Critical Pro-2000 Co. Ltd.
Publication of WO2012105788A2 publication Critical patent/WO2012105788A2/en
Publication of WO2012105788A9 publication Critical patent/WO2012105788A9/en
Publication of WO2012105788A3 publication Critical patent/WO2012105788A3/en

Links

Classifications

    • G—PHYSICS
    • G09—EDUCATION; CRYPTOGRAPHY; DISPLAY; ADVERTISING; SEALS
    • G09G—ARRANGEMENTS OR CIRCUITS FOR CONTROL OF INDICATING DEVICES USING STATIC MEANS TO PRESENT VARIABLE INFORMATION
    • G09G3/00—Control arrangements or circuits, of interest only in connection with visual indicators other than cathode-ray tubes
    • G09G3/006—Electronic inspection or testing of displays and display drivers, e.g. of LED or LCD displays
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/06—Measuring leads; Measuring probes
    • G01R1/067—Measuring probes
    • G01R1/073—Multiple probes
    • G01R1/07307—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card
    • G01R1/07314—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card the body of the probe being perpendicular to test object, e.g. bed of nails or probe with bump contacts on a rigid support
    • G01R1/07328—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card the body of the probe being perpendicular to test object, e.g. bed of nails or probe with bump contacts on a rigid support for testing printed circuit boards
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
    • H01L21/673—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere using specially adapted carriers or holders; Fixing the workpieces on such carriers or holders
    • H01L21/67303—Vertical boat type carrier whereby the substrates are horizontally supported, e.g. comprising rod-shaped elements
    • H01L21/67309—Vertical boat type carrier whereby the substrates are horizontally supported, e.g. comprising rod-shaped elements characterized by the substrate support

Landscapes

  • Engineering & Computer Science (AREA)
  • General Physics & Mathematics (AREA)
  • Physics & Mathematics (AREA)
  • Computer Hardware Design (AREA)
  • Theoretical Computer Science (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Manufacturing & Machinery (AREA)
  • Power Engineering (AREA)
  • Condensed Matter Physics & Semiconductors (AREA)
  • Devices For Indicating Variable Information By Combining Individual Elements (AREA)
  • Combinations Of Printed Boards (AREA)
  • Coupling Device And Connection With Printed Circuit (AREA)
  • Multi-Conductor Connections (AREA)
  • Measuring Leads Or Probes (AREA)
  • Structure Of Printed Boards (AREA)

Abstract

A pin board is provided, comprising: a base block configured to have a lower portion on which a main flexible circuit board to be electrically connected to a main substrate is mounted; a flexible circuit board unit configured to be formed in a plate shape and have a predetermined elasticity; and a supporting unit configured to be coupled to the lower portion of the base block and support the flexible circuit board unit to be inclined downward at a predetermined angle of inclination such that a protruding upper end of the flexible circuit board unit can contact a contact point of the main flexible circuit board with a predetermined elasticity and a protruding lower end of the flexible circuit board can contact a contact pad of an external panel with a predetermined elasticity. Accordingly, the flexible circuit board unit can be supported as inclined and be easily replaced, and alignment of the flexible circuit board unit at a contact point can be visibly and easily identified.
PCT/KR2012/000719 2011-02-01 2012-01-31 Pin board WO2012105788A2 (en)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
KR2020110000972U KR200464494Y1 (en) 2011-02-01 2011-02-01 Pin board
KR20-2011-0000972 2011-02-01

Publications (3)

Publication Number Publication Date
WO2012105788A2 WO2012105788A2 (en) 2012-08-09
WO2012105788A9 WO2012105788A9 (en) 2012-10-26
WO2012105788A3 true WO2012105788A3 (en) 2012-12-13

Family

ID=46603199

Family Applications (1)

Application Number Title Priority Date Filing Date
PCT/KR2012/000719 WO2012105788A2 (en) 2011-02-01 2012-01-31 Pin board

Country Status (3)

Country Link
KR (1) KR200464494Y1 (en)
TW (1) TW201247062A (en)
WO (1) WO2012105788A2 (en)

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR102599359B1 (en) * 2023-05-31 2023-11-07 주식회사 프로이천 Probe replaceable pinboard and method for replacing probe on the pinboard

Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR20030023662A (en) * 2003-02-25 2003-03-19 프롬써어티 주식회사 Needle assembly in probe device for testing liquid crystal display panel and method for manufacturing thereof
KR20050097233A (en) * 2004-04-01 2005-10-07 주식회사 유림하이테크산업 Probe card for testing lcd
KR200409371Y1 (en) * 2005-12-12 2006-02-22 (주) 마이크로티엔 Probe block for testing LCD
KR100967161B1 (en) * 2010-03-23 2010-07-05 (주)유비프리시젼 Probe block for having film type probe contactor

Patent Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR20030023662A (en) * 2003-02-25 2003-03-19 프롬써어티 주식회사 Needle assembly in probe device for testing liquid crystal display panel and method for manufacturing thereof
KR20050097233A (en) * 2004-04-01 2005-10-07 주식회사 유림하이테크산업 Probe card for testing lcd
KR200409371Y1 (en) * 2005-12-12 2006-02-22 (주) 마이크로티엔 Probe block for testing LCD
KR100967161B1 (en) * 2010-03-23 2010-07-05 (주)유비프리시젼 Probe block for having film type probe contactor

Also Published As

Publication number Publication date
WO2012105788A9 (en) 2012-10-26
WO2012105788A2 (en) 2012-08-09
KR20120005743U (en) 2012-08-09
TW201247062A (en) 2012-11-16
KR200464494Y1 (en) 2013-01-08

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