WO2012018425A3 - Real-time monitoring of retaining ring thickness and lifetime - Google Patents
Real-time monitoring of retaining ring thickness and lifetime Download PDFInfo
- Publication number
- WO2012018425A3 WO2012018425A3 PCT/US2011/036731 US2011036731W WO2012018425A3 WO 2012018425 A3 WO2012018425 A3 WO 2012018425A3 US 2011036731 W US2011036731 W US 2011036731W WO 2012018425 A3 WO2012018425 A3 WO 2012018425A3
- Authority
- WO
- WIPO (PCT)
- Prior art keywords
- retaining ring
- carrier head
- lifetime
- real
- time monitoring
- Prior art date
Links
- 238000012544 monitoring process Methods 0.000 title abstract 2
- 238000005498 polishing Methods 0.000 abstract 3
- 239000000758 substrate Substances 0.000 abstract 3
- 238000000034 method Methods 0.000 abstract 1
- 230000000717 retained effect Effects 0.000 abstract 1
Classifications
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B24—GRINDING; POLISHING
- B24B—MACHINES, DEVICES, OR PROCESSES FOR GRINDING OR POLISHING; DRESSING OR CONDITIONING OF ABRADING SURFACES; FEEDING OF GRINDING, POLISHING, OR LAPPING AGENTS
- B24B37/00—Lapping machines or devices; Accessories
- B24B37/005—Control means for lapping machines or devices
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/04—Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer
- H01L21/18—Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer the devices having semiconductor bodies comprising elements of Group IV of the Periodic Table or AIIIBV compounds with or without impurities, e.g. doping materials
- H01L21/30—Treatment of semiconductor bodies using processes or apparatus not provided for in groups H01L21/20 - H01L21/26
- H01L21/302—Treatment of semiconductor bodies using processes or apparatus not provided for in groups H01L21/20 - H01L21/26 to change their surface-physical characteristics or shape, e.g. etching, polishing, cutting
- H01L21/304—Mechanical treatment, e.g. grinding, polishing, cutting
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B24—GRINDING; POLISHING
- B24B—MACHINES, DEVICES, OR PROCESSES FOR GRINDING OR POLISHING; DRESSING OR CONDITIONING OF ABRADING SURFACES; FEEDING OF GRINDING, POLISHING, OR LAPPING AGENTS
- B24B37/00—Lapping machines or devices; Accessories
- B24B37/04—Lapping machines or devices; Accessories designed for working plane surfaces
- B24B37/042—Lapping machines or devices; Accessories designed for working plane surfaces operating processes therefor
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B24—GRINDING; POLISHING
- B24B—MACHINES, DEVICES, OR PROCESSES FOR GRINDING OR POLISHING; DRESSING OR CONDITIONING OF ABRADING SURFACES; FEEDING OF GRINDING, POLISHING, OR LAPPING AGENTS
- B24B37/00—Lapping machines or devices; Accessories
- B24B37/27—Work carriers
- B24B37/30—Work carriers for single side lapping of plane surfaces
- B24B37/32—Retaining rings
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B24—GRINDING; POLISHING
- B24B—MACHINES, DEVICES, OR PROCESSES FOR GRINDING OR POLISHING; DRESSING OR CONDITIONING OF ABRADING SURFACES; FEEDING OF GRINDING, POLISHING, OR LAPPING AGENTS
- B24B49/00—Measuring or gauging equipment for controlling the feed movement of the grinding tool or work; Arrangements of indicating or measuring equipment, e.g. for indicating the start of the grinding operation
- B24B49/12—Measuring or gauging equipment for controlling the feed movement of the grinding tool or work; Arrangements of indicating or measuring equipment, e.g. for indicating the start of the grinding operation involving optical means
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/04—Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer
- H01L21/18—Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer the devices having semiconductor bodies comprising elements of Group IV of the Periodic Table or AIIIBV compounds with or without impurities, e.g. doping materials
- H01L21/30—Treatment of semiconductor bodies using processes or apparatus not provided for in groups H01L21/20 - H01L21/26
- H01L21/302—Treatment of semiconductor bodies using processes or apparatus not provided for in groups H01L21/20 - H01L21/26 to change their surface-physical characteristics or shape, e.g. etching, polishing, cutting
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
- H01L21/67005—Apparatus not specifically provided for elsewhere
- H01L21/67242—Apparatus for monitoring, sorting or marking
Landscapes
- Engineering & Computer Science (AREA)
- Mechanical Engineering (AREA)
- Physics & Mathematics (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- General Physics & Mathematics (AREA)
- Manufacturing & Machinery (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Power Engineering (AREA)
- Mechanical Treatment Of Semiconductor (AREA)
- Finish Polishing, Edge Sharpening, And Grinding By Specific Grinding Devices (AREA)
- Constituent Portions Of Griding Lathes, Driving, Sensing And Control (AREA)
Abstract
Priority Applications (3)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
KR1020127020850A KR101754855B1 (en) | 2010-07-26 | 2011-05-17 | Real-time monitoring of retaining ring thickness and lifetime |
JP2013521776A JP2013532588A (en) | 2010-07-26 | 2011-05-17 | Real-time monitoring of retaining ring thickness and life |
CN201180007401.4A CN102725830B (en) | 2010-07-26 | 2011-05-17 | The thickness of retainer ring and the immediately monitoring method and apparatus of useful life |
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US12/843,793 | 2010-07-26 | ||
US12/843,793 US20120021671A1 (en) | 2010-07-26 | 2010-07-26 | Real-time monitoring of retaining ring thickness and lifetime |
Publications (2)
Publication Number | Publication Date |
---|---|
WO2012018425A2 WO2012018425A2 (en) | 2012-02-09 |
WO2012018425A3 true WO2012018425A3 (en) | 2012-05-18 |
Family
ID=45494015
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
PCT/US2011/036731 WO2012018425A2 (en) | 2010-07-26 | 2011-05-17 | Real-time monitoring of retaining ring thickness and lifetime |
Country Status (6)
Country | Link |
---|---|
US (1) | US20120021671A1 (en) |
JP (1) | JP2013532588A (en) |
KR (1) | KR101754855B1 (en) |
CN (1) | CN102725830B (en) |
TW (1) | TWI530359B (en) |
WO (1) | WO2012018425A2 (en) |
Families Citing this family (20)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
TWI381904B (en) * | 2009-12-03 | 2013-01-11 | Nat Univ Chung Cheng | The method of detecting the grinding characteristics and service life of the polishing pad |
KR101902049B1 (en) * | 2012-01-25 | 2018-09-27 | 어플라이드 머티어리얼스, 인코포레이티드 | Retaining ring monitoring and control of pressure |
US9067295B2 (en) * | 2012-07-25 | 2015-06-30 | Applied Materials, Inc. | Monitoring retaining ring thickness and pressure control |
US9242338B2 (en) * | 2013-10-22 | 2016-01-26 | Globalfoundries Singapore Pte. Ltd. | CMP head structure |
US9227294B2 (en) * | 2013-12-31 | 2016-01-05 | Taiwan Semiconductor Manufacturing Company Ltd. | Apparatus and method for chemical mechanical polishing |
JP2015188955A (en) | 2014-03-27 | 2015-11-02 | 株式会社荏原製作所 | Polishing device |
KR102323430B1 (en) * | 2014-03-31 | 2021-11-09 | 가부시키가이샤 에바라 세이사꾸쇼 | Polishing apparatus and polishing method |
JP6344950B2 (en) * | 2014-03-31 | 2018-06-20 | 株式会社荏原製作所 | Polishing apparatus and polishing method |
US9878421B2 (en) * | 2014-06-16 | 2018-01-30 | Applied Materials, Inc. | Chemical mechanical polishing retaining ring with integrated sensor |
CN107405523B (en) * | 2015-01-09 | 2021-03-16 | 铁堡发明有限公司 | Controller for game console |
CN105397618B (en) * | 2015-10-20 | 2018-03-06 | 上海华力微电子有限公司 | Retainer ring for work-table of chemicomechanical grinding mill |
KR102461598B1 (en) * | 2015-12-18 | 2022-11-01 | 주식회사 케이씨텍 | Apparatus of loading substrate in chemical mechanical polishing system |
JP6577385B2 (en) * | 2016-02-12 | 2019-09-18 | 株式会社荏原製作所 | Substrate holding module, substrate processing apparatus, and substrate processing method |
JP7356996B2 (en) * | 2018-03-13 | 2023-10-05 | アプライド マテリアルズ インコーポレイテッド | Consumable parts monitoring in chemical mechanical polishing equipment |
CN108716899B (en) * | 2018-06-27 | 2020-04-10 | 山东天厚石油科技有限责任公司 | Non-contact ultrasonic thickness gauge with high detection precision |
US11731232B2 (en) * | 2018-10-30 | 2023-08-22 | Taiwan Semiconductor Manufacturing Company, Ltd. | Irregular mechanical motion detection systems and method |
JP7220648B2 (en) * | 2019-12-20 | 2023-02-10 | 株式会社荏原製作所 | SUBSTRATE PROCESSING APPARATUS AND SUBSTRATE PROCESSING METHOD |
US11705354B2 (en) | 2020-07-10 | 2023-07-18 | Applied Materials, Inc. | Substrate handling systems |
US20220184771A1 (en) * | 2020-12-14 | 2022-06-16 | Applied Materials, Inc. | Polishing system apparatus and methods for defect reduction at a substrate edge |
KR20240051153A (en) * | 2021-08-17 | 2024-04-19 | 도쿄엘렉트론가부시키가이샤 | Optical sensor for measuring the characteristics of consumable parts in a semiconductor plasma process chamber |
Citations (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2002367941A (en) * | 2001-06-08 | 2002-12-20 | Hitachi Ltd | Method for manufacturing semiconductor integrated circuit device |
US6579151B2 (en) * | 2001-08-02 | 2003-06-17 | Taiwan Semiconductor Manufacturing Co., Ltd | Retaining ring with active edge-profile control by piezoelectric actuator/sensors |
US20070232193A1 (en) * | 2006-03-31 | 2007-10-04 | Hozumi Yasuda | Substrate holding apparatus, polishing apparatus, and polishing method |
JP2009260142A (en) * | 2008-04-18 | 2009-11-05 | Panasonic Corp | Wafer-polishing apparatus and wafer-polishing method |
Family Cites Families (13)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US4056970A (en) * | 1975-10-30 | 1977-11-08 | Yeda Research And Development Co., Ltd. | Ultrasonic velocity and thickness gage |
EP0049956A1 (en) * | 1980-10-10 | 1982-04-21 | Imperial Chemical Industries Plc | Ultrasonic identification of damage in lined structures |
US5343750A (en) * | 1991-11-25 | 1994-09-06 | General Electric Company | Manual ultrasonic scanner for complex surfaces |
US5738574A (en) * | 1995-10-27 | 1998-04-14 | Applied Materials, Inc. | Continuous processing system for chemical mechanical polishing |
US6110025A (en) * | 1997-05-07 | 2000-08-29 | Obsidian, Inc. | Containment ring for substrate carrier apparatus |
JP2000153445A (en) * | 1998-11-19 | 2000-06-06 | Seiko Epson Corp | Dresser for polishing device |
US6390908B1 (en) * | 1999-07-01 | 2002-05-21 | Applied Materials, Inc. | Determining when to replace a retaining ring used in substrate polishing operations |
JP2001223190A (en) * | 2000-02-08 | 2001-08-17 | Hitachi Ltd | Method and device for evaluating surface state of polishing pad, and method and device for manufacturing thin-film device |
US6354928B1 (en) * | 2000-04-21 | 2002-03-12 | Agere Systems Guardian Corp. | Polishing apparatus with carrier ring and carrier head employing like polarities |
TW545580U (en) * | 2002-06-07 | 2003-08-01 | Nanya Technology Corp | CMP device of measuring apparatus with a notched size for measuring the guide ring of wafer edge |
US6964597B2 (en) * | 2003-06-27 | 2005-11-15 | Khuu's Inc. | Retaining ring with trigger for chemical mechanical polishing apparatus |
KR101044739B1 (en) * | 2004-11-01 | 2011-06-28 | 가부시키가이샤 에바라 세이사꾸쇼 | Polishing apparatus and polishing method |
JP2007287787A (en) * | 2006-04-13 | 2007-11-01 | Elpida Memory Inc | Method and equipment for manufacturing semiconductor device |
-
2010
- 2010-07-26 US US12/843,793 patent/US20120021671A1/en not_active Abandoned
-
2011
- 2011-05-17 WO PCT/US2011/036731 patent/WO2012018425A2/en active Application Filing
- 2011-05-17 CN CN201180007401.4A patent/CN102725830B/en active Active
- 2011-05-17 KR KR1020127020850A patent/KR101754855B1/en not_active Application Discontinuation
- 2011-05-17 JP JP2013521776A patent/JP2013532588A/en not_active Withdrawn
- 2011-05-25 TW TW100118338A patent/TWI530359B/en active
Patent Citations (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2002367941A (en) * | 2001-06-08 | 2002-12-20 | Hitachi Ltd | Method for manufacturing semiconductor integrated circuit device |
US6579151B2 (en) * | 2001-08-02 | 2003-06-17 | Taiwan Semiconductor Manufacturing Co., Ltd | Retaining ring with active edge-profile control by piezoelectric actuator/sensors |
US20070232193A1 (en) * | 2006-03-31 | 2007-10-04 | Hozumi Yasuda | Substrate holding apparatus, polishing apparatus, and polishing method |
JP2009260142A (en) * | 2008-04-18 | 2009-11-05 | Panasonic Corp | Wafer-polishing apparatus and wafer-polishing method |
Also Published As
Publication number | Publication date |
---|---|
US20120021671A1 (en) | 2012-01-26 |
KR101754855B1 (en) | 2017-07-06 |
TWI530359B (en) | 2016-04-21 |
CN102725830B (en) | 2016-03-16 |
JP2013532588A (en) | 2013-08-19 |
CN102725830A (en) | 2012-10-10 |
TW201204509A (en) | 2012-02-01 |
WO2012018425A2 (en) | 2012-02-09 |
KR20130088738A (en) | 2013-08-08 |
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