WO2011099822A3 - 테스트 소켓 - Google Patents

테스트 소켓 Download PDF

Info

Publication number
WO2011099822A3
WO2011099822A3 PCT/KR2011/000955 KR2011000955W WO2011099822A3 WO 2011099822 A3 WO2011099822 A3 WO 2011099822A3 KR 2011000955 W KR2011000955 W KR 2011000955W WO 2011099822 A3 WO2011099822 A3 WO 2011099822A3
Authority
WO
WIPO (PCT)
Prior art keywords
conductive
conductive pin
hole
conductive member
test socket
Prior art date
Application number
PCT/KR2011/000955
Other languages
English (en)
French (fr)
Other versions
WO2011099822A2 (ko
Inventor
이재학
Original Assignee
Lee Jae Hak
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Lee Jae Hak filed Critical Lee Jae Hak
Publication of WO2011099822A2 publication Critical patent/WO2011099822A2/ko
Publication of WO2011099822A3 publication Critical patent/WO2011099822A3/ko

Links

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02General constructional details
    • G01R1/04Housings; Supporting members; Arrangements of terminals
    • G01R1/0408Test fixtures or contact fields; Connectors or connecting adaptors; Test clips; Test sockets
    • G01R1/0433Sockets for IC's or transistors
    • G01R1/0441Details
    • G01R1/0466Details concerning contact pieces or mechanical details, e.g. hinges or cams; Shielding
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01RELECTRICALLY-CONDUCTIVE CONNECTIONS; STRUCTURAL ASSOCIATIONS OF A PLURALITY OF MUTUALLY-INSULATED ELECTRICAL CONNECTING ELEMENTS; COUPLING DEVICES; CURRENT COLLECTORS
    • H01R12/00Structural associations of a plurality of mutually-insulated electrical connecting elements, specially adapted for printed circuits, e.g. printed circuit boards [PCB], flat or ribbon cables, or like generally planar structures, e.g. terminal strips, terminal blocks; Coupling devices specially adapted for printed circuits, flat or ribbon cables, or like generally planar structures; Terminals specially adapted for contact with, or insertion into, printed circuits, flat or ribbon cables, or like generally planar structures
    • H01R12/70Coupling devices
    • H01R12/71Coupling devices for rigid printing circuits or like structures
    • H01R12/712Coupling devices for rigid printing circuits or like structures co-operating with the surface of the printed circuit or with a coupling device exclusively provided on the surface of the printed circuit
    • H01R12/714Coupling devices for rigid printing circuits or like structures co-operating with the surface of the printed circuit or with a coupling device exclusively provided on the surface of the printed circuit with contacts abutting directly the printed circuit; Button contacts therefore provided on the printed circuit

Landscapes

  • Engineering & Computer Science (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Testing Of Individual Semiconductor Devices (AREA)
  • Measuring Leads Or Probes (AREA)
  • Connecting Device With Holders (AREA)

Abstract

본 발명은 테스트 소켓에 대한 것으로서 더욱 상세하게는 반도체 디바이스의 단자와 테스트 장치의 패드를 전기적으로 연결시키기 위하여 그 반도체 디바이스와 테스트 장치의 사이에 배치되는 테스트 소켓으로서, 상기 반도체 디바이스의 단자와 대응되는 위치에 배치된 제1접속전극을 지지하는 제1시트부재; 상기 제1시트부재의 하측에 배치되되 상기 제1접속전극과 대응되는 위치에 상하방향으로 연장된 관통공이 형성되는 하우징; 상기 하우징의 관통공에 삽입되되 상기 제1접속전극의 하면과 접촉되며 중앙에 상하방향으로 연장되는 삽입구멍이 형성되는 도전부재; 상기 하우징의 관통공에 삽입되되 상기 도전부재의 하측에 위치하며 그 하단이 상기 관통공으로부터 돌출되어 있으며 그 상단이 상기 도전부재의 삽입구멍 내에 삽입되어 그 삽입구멍 내벽과 접촉될 수 있는 도전핀; 및 상기 도전부재와 도전핀의 사이에 배치되되 상기 도전부재와 상기 도전핀을 서로 멀어지는 방향으로 탄성바이어스시키는 스프링부재;를 포함하는 것을 특징으로 하는 테스트 소켓에 대한 것이다.
PCT/KR2011/000955 2010-02-11 2011-02-11 테스트 소켓 WO2011099822A2 (ko)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
KR10-2010-0012904 2010-02-11
KR1020100012904A KR101138964B1 (ko) 2010-02-11 2010-02-11 테스트 소켓

Publications (2)

Publication Number Publication Date
WO2011099822A2 WO2011099822A2 (ko) 2011-08-18
WO2011099822A3 true WO2011099822A3 (ko) 2011-12-15

Family

ID=44368337

Family Applications (1)

Application Number Title Priority Date Filing Date
PCT/KR2011/000955 WO2011099822A2 (ko) 2010-02-11 2011-02-11 테스트 소켓

Country Status (2)

Country Link
KR (1) KR101138964B1 (ko)
WO (1) WO2011099822A2 (ko)

Families Citing this family (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR20160001723A (ko) 2013-10-23 2016-01-07 주식회사 아테코 테스트 소자 인서트 및 전자부품 테스트 장치
KR20160119942A (ko) * 2015-04-06 2016-10-17 에스케이하이닉스 주식회사 소켓 플러그 접속 구조를 포함하는 반도체 패키지
KR101793717B1 (ko) * 2015-08-07 2017-11-03 조인셋 주식회사 전기접속단자
KR102270275B1 (ko) * 2020-04-10 2021-06-28 주식회사 오킨스전자 테스트 소켓
KR102359547B1 (ko) * 2020-09-25 2022-02-08 (주)티에스이 테스트 소켓 및 이를 포함하는 테스트 장치

Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2001116795A (ja) * 1999-10-18 2001-04-27 Mitsubishi Electric Corp テスト用ソケット、およびテスト用ソケットに用いる接続シート
JP2003084047A (ja) * 2001-06-29 2003-03-19 Sony Corp 半導体装置の測定用治具
KR200313240Y1 (ko) * 2003-02-27 2003-05-17 (주)티에스이 볼 그리드 어레이(bga) 패키지용 테스트 소켓

Family Cites Families (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR200163193Y1 (ko) 1999-07-01 2000-02-15 리노공업주식회사 분리형칩검사소켓장치

Patent Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2001116795A (ja) * 1999-10-18 2001-04-27 Mitsubishi Electric Corp テスト用ソケット、およびテスト用ソケットに用いる接続シート
JP2003084047A (ja) * 2001-06-29 2003-03-19 Sony Corp 半導体装置の測定用治具
KR200313240Y1 (ko) * 2003-02-27 2003-05-17 (주)티에스이 볼 그리드 어레이(bga) 패키지용 테스트 소켓

Also Published As

Publication number Publication date
WO2011099822A2 (ko) 2011-08-18
KR20110093085A (ko) 2011-08-18
KR101138964B1 (ko) 2012-04-25

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