WO2010064287A1 - 放射線撮像装置 - Google Patents
放射線撮像装置 Download PDFInfo
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- WO2010064287A1 WO2010064287A1 PCT/JP2008/071781 JP2008071781W WO2010064287A1 WO 2010064287 A1 WO2010064287 A1 WO 2010064287A1 JP 2008071781 W JP2008071781 W JP 2008071781W WO 2010064287 A1 WO2010064287 A1 WO 2010064287A1
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- ray
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- 230000005855 radiation Effects 0.000 title claims description 18
- 238000003384 imaging method Methods 0.000 title description 20
- 238000012937 correction Methods 0.000 claims abstract description 27
- 239000000463 material Substances 0.000 claims description 43
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- 238000004364 calculation method Methods 0.000 claims description 5
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- 238000012544 monitoring process Methods 0.000 description 6
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- 238000012935 Averaging Methods 0.000 description 2
- 229920000049 Carbon (fiber) Polymers 0.000 description 2
- ZOKXTWBITQBERF-UHFFFAOYSA-N Molybdenum Chemical compound [Mo] ZOKXTWBITQBERF-UHFFFAOYSA-N 0.000 description 2
- 238000010521 absorption reaction Methods 0.000 description 2
- 239000000956 alloy Substances 0.000 description 2
- 229910045601 alloy Inorganic materials 0.000 description 2
- 229910052782 aluminium Inorganic materials 0.000 description 2
- XAGFODPZIPBFFR-UHFFFAOYSA-N aluminium Chemical compound [Al] XAGFODPZIPBFFR-UHFFFAOYSA-N 0.000 description 2
- 239000004917 carbon fiber Substances 0.000 description 2
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- VNWKTOKETHGBQD-UHFFFAOYSA-N methane Chemical compound C VNWKTOKETHGBQD-UHFFFAOYSA-N 0.000 description 2
- 229910052750 molybdenum Inorganic materials 0.000 description 2
- 239000011733 molybdenum Substances 0.000 description 2
- 238000005192 partition Methods 0.000 description 2
- 239000000126 substance Substances 0.000 description 2
- 229910052715 tantalum Inorganic materials 0.000 description 2
- GUVRBAGPIYLISA-UHFFFAOYSA-N tantalum atom Chemical compound [Ta] GUVRBAGPIYLISA-UHFFFAOYSA-N 0.000 description 2
- WFKWXMTUELFFGS-UHFFFAOYSA-N tungsten Chemical compound [W] WFKWXMTUELFFGS-UHFFFAOYSA-N 0.000 description 2
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01T—MEASUREMENT OF NUCLEAR OR X-RADIATION
- G01T1/00—Measuring X-radiation, gamma radiation, corpuscular radiation, or cosmic radiation
-
- A—HUMAN NECESSITIES
- A61—MEDICAL OR VETERINARY SCIENCE; HYGIENE
- A61B—DIAGNOSIS; SURGERY; IDENTIFICATION
- A61B6/00—Apparatus or devices for radiation diagnosis; Apparatus or devices for radiation diagnosis combined with radiation therapy equipment
- A61B6/52—Devices using data or image processing specially adapted for radiation diagnosis
- A61B6/5258—Devices using data or image processing specially adapted for radiation diagnosis involving detection or reduction of artifacts or noise
Definitions
- the present invention relates to correction of an X-ray flat panel detector used in a medical radiography apparatus and a grid for removing scattered radiation.
- a solid-state imaging device called a flat panel detector (FPD) has attracted attention.
- FPD flat panel detector
- X-ray energy is directly converted into electric charge, and this electric charge is read as an electric signal by a reading element such as a TFT, and the X-ray energy is converted into light by a scintillator or the like, and this converted photoelectric conversion element is used.
- An indirect type FPD that converts charges into electric charges and reads out the electric charges as electric signals by a reading element such as a TFT is known.
- the subject information collected on the detector surface is read as spatially sampled information according to the pitch of the reading elements (hereinafter referred to as detector pitch).
- the grid 101 has a structure in which the X-ray shielding material 103 is arranged in a stripe at regular intervals with the intermediate substance 104 interposed therebetween. Since the scattered radiation 113 is absorbed by the X-ray shielding material 103, it does not reach the detector 102. Therefore, the SN ratio and contrast of image information can be improved. However, when secondary scattered rays 116 in the intermediate material are generated, they cannot be completely removed.
- Grid ratio r A / B
- grid density N 1 / (B + C) [lp / cm]
- the moving grid is a method that prevents the fixed pattern of the grid from being imaged in the image by moving the grid in the direction perpendicular to the direction of the grid stripes in synchronization with the X-ray exposure.
- the fixed grid is a method of shooting with the grid fixed to the detector. When a fixed grid is used in the shooting method using the grid, grid stripes are fixed in the subject information that reaches the detector. A pattern will be included.
- the shape of the shadow of the marker changes as the X-ray focal position changes. Further, due to the influence of noise or the like, there may be a case where the shadow does not necessarily have the same shape as the marker shape. Furthermore, even if the extension of the shadow of the marker is determined by threshold processing for each pixel value, the value to be used as the threshold varies depending on the shooting conditions and the state of the subject. If it does so, it will become difficult to specify the extension of a shadow, As a result, it may be difficult to pinpoint the position of a marker correctly.
- An object of the present invention is to correct a fixed pattern of grid stripes accurately by solving at least one of the above problems.
- a two-dimensional radiation detector includes an X-ray irradiation means having an X-ray focal point, and a scattered radiation removal grid having a plurality of X-ray shielding foils arranged in a row direction or a column direction.
- An X-ray detector that detects X-rays emitted from the X-ray irradiating means and transmits the grid and outputs a two-dimensional signal; a marker made of an X-ray shielding material fixed to the grid; A plurality of regions of interest, a statistic calculating means for calculating a statistic of the two-dimensional signal, a correction parameter calculating means for calculating a correction parameter from the statistic, and the X-ray image using the correction parameter.
- Moire removal means for removing the shadow of the grid included in the image processing by image processing, and the plurality of regions of interest are relative to the X-ray focal point, the grid, or the X-ray detection unit
- the parameter calculation means calculates the correction parameter based on a difference in statistics obtained from the group of regions of interest.
- the present invention is characterized in that a plurality of the markers are provided, and the region of interest is defined for each of the plurality of markers.
- the present invention is characterized in that the two-dimensional signal includes an image signal and surrounding unused signals, and the statistics are obtained based on the unused signals.
- the present invention can remove the influence of noise by adding and averaging the statistics.
- the amount of movement of the marker can be calculated accurately. Therefore, even if the relative positions of the X-ray tube, the grid, and the X-ray detector change, the shadow of the grid can be effectively removed. Moreover, the size of each marker can be reduced by using a plurality of markers. In addition, since the marker is arranged so that a shadow is projected on the surrounding unused signal area, the effect of the invention can be obtained without affecting the captured image. Further, it is possible to calculate the statistic corresponding to the positional deviation under any photographing condition by eliminating the influence of the signal intensity. Therefore, the shadow of the grid can be effectively removed regardless of the shooting conditions. Furthermore, the influence of noise can be removed by addition and averaging.
- FIG. 1 is a perspective view of a radiation imaging apparatus in Embodiment 1.
- FIG. FIG. 2 is a cross-sectional view taken along the line AA in FIG. It is a top view in FIG.
- FIG. 4 is a detailed view of part B in FIG. 3. It is the graph showing the relationship between the relative position L with respect to the X-ray flat panel detector 1 of the grid 2 in Example 1, and Rg value.
- 6 is a top view of a modified example of Embodiment 1.
- FIG. It is a perspective view of the radiation imaging device in Example 2.
- FIG. FIG. 8 is a cross-sectional view taken along line AA in FIG. It is a top view in FIG.
- FIG. 10 is a detailed view of the vicinity of the marker 3 in FIG. 9.
- FIG. 6 is a graph showing the relationship between the relative distance d between the X-ray focal point F and the X-ray flat panel detector 1 and the Rf value in Example 2.
- 10 is a top view of a modification of Example 2.
- FIG. It is a figure explaining the modification which makes the marker 3 single.
- FIG. 1 shows a state in which a marker 3 is arranged integrally with a grid 2 with respect to a structure constituted by an X-ray flat panel detector 1 and a scattered X-ray removal grid 2 according to Embodiment 1 of the present invention.
- FIG. 2 is a sectional view taken along the line AA
- FIG. 3 is a top view thereof.
- the X-ray shielding foil 4 forming the grid 2 looks at the X-ray focal point F existing inside an X-ray tube (not shown), and the X-ray focal point F and the X-ray flat panel detector 1. Are arranged at a pitch that coincides with an integer multiple of the arrangement of each pixel on the surface of the X-ray flat panel detector 1. In the case of the embodiment of FIG. 1, the X-ray shielding foil 4 is arranged at a pitch three times the arrangement of each pixel on the surface of the X-ray flat panel detector 1.
- the cross section of the X-ray flat panel detector 1 does not actually have a partition as shown in FIG.
- the X-ray shielding foil 4 has an upper end surface and a lower end surface supported by an upper covering material 5 and a lower covering material 6.
- the upper covering material 5 and the lower covering material 6 are made of a thin carbon fiber sheet or aluminum plate that is transparent to X-rays.
- spacers 7 are sandwiched and bonded between the upper covering material 5 and the lower covering material 6.
- the marker 3 is disposed integrally with the grid 2 on the upper covering material 5, and masks a part of the X-ray flat panel detector 1 by shielding X-rays from the two signal regions of interest. ing.
- the X-ray tube corresponds to the X-ray irradiation means of the present invention.
- the grid 2 corresponds to the scattered radiation removal grid in the present invention.
- the X-ray flat panel detector 1 corresponds to an X-ray detector.
- the X-ray flat panel detector 1 has a signal acquisition area 11 in which the X-ray conversion film and the TFT are substantially operating, and an imaging use area 12 that actually performs imaging and diagnosis is located inside the area. Exists.
- the X-ray shielding foil 4 of the grid 2 is disposed so as to completely cover the imaging use area 12. Note that it is not an essential condition for the present invention that the X-ray shielding foil 4 completely covers the entire imaging use region 12.
- the marker 3 has a shadow outside the imaging use area 12 and inside the signal acquisition area 11 in the positional relationship among the X-ray flat panel detector 1, the X-ray focus F and the grid 2 that are normally used. It is arranged to come to. Further, the grid 2 is adhered and disposed so as to avoid coming over the X-ray shielding foil 4 and to be in the upper center of the upper covering material 5.
- FIG. 4 shows the positional relationship as a perspective view in more detail about the portion B in FIG.
- the marker 3 is composed of a shielding material mask 31 and a shielding material mask 32, and each is adhered and disposed so as to be at the center of the upper portion of the upper covering material 5 as shown in FIG.
- a material having a large atomic number and a large X-ray absorption such as molybdenum, tungsten, lead, tantalum, or an alloy mainly containing any of these, is selected. Therefore, when X-ray irradiation is performed, no signal is generated in the area shielded by the shielding material masks 31 and 32 in the X-ray flat panel detector 1.
- attention signal regions 13 and 14 are set in the signal obtainable region 11 in the X-ray flat panel detector 1.
- the attention signal areas 13 and 14 are partially shielded by the shielding material masks 31 and 32 of the marker 3, so that signals are transmitted only from unshielded areas. Obtainable.
- the attention signal regions 13 and 14 correspond to attention regions in the present invention.
- the signal acquired in the imaging use area 12 corresponds to the image signal in the present invention.
- a signal acquired in the signal acquisition possible area 11 outside the imaging use area 12 corresponds to an unused signal in the present invention.
- the relative positional relationship in the vertical direction is uniquely associated with the arrangement of the foils 4. Further, since the marker 3 is arranged integrally with the grid 2, that is, the value of Rg has a unique relative positional relationship in the vertical direction with respect to the arrangement of the X-ray shielding foil 4 of the grid 2 and the X-ray flat panel detector 1. It will be associated with.
- the added value here corresponds to a statistic in the present invention.
- the subject information that passes through the grid 2 and reaches the X-ray flat panel detector 1 during X-ray imaging includes grid stripes as a shadow of the X-ray shielding foil 4.
- a fixed pattern will be included. In order to remove this, it must generally be corrected. Accordingly, correction data is acquired in advance and used in a state of a relative distance relationship between the X-ray focal point F and the X-ray flat panel detector 1 and a certain relative position between the grid 2 and the X-ray flat panel detector 1. Then, correction processing is performed on data at the time of actual imaging.
- the grid 2 is detached from or attached to the X-ray flat panel detector 1 depending on the subject during X-ray imaging.
- the relative positional relationship between the grid 2 and the X-ray flat panel detector 1 when the correction data is acquired in advance at the time of the detachment may cause a positional shift.
- the error becomes conspicuous when a positional deviation occurs in the vertical direction with respect to the arrangement of the X-ray shielding foils 4.
- FIG. 5 shows an example of the relationship between the relative position L of the grid 2 with respect to the X-ray flat panel detector 1 and the Rg value.
- the correction data is held for each Rg value.
- the relative positional relationship can be determined from the calculated value Rg and the correction parameter at that time can be used. Even if an error due to the position deviation occurs, it can be easily corrected.
- markers 3 are provided at two locations in the upper center and lower center of the upper covering material 5 as a mechanism for monitoring the relative positional relationship between the grid 2 and the X-ray flat panel detector 1. Also good.
- three or more markers 3 may be provided as a mechanism for monitoring the relative positional relationship between the grid 2 and the X-ray flat panel detector 1.
- the markers 3 are arranged so as not to come on the X-ray shielding foil 4.
- the value of Rg is equal to that of the X-ray shielding foil 4 between the grid 2 and the X-ray flat panel detector 1.
- the X-ray shielding foil 4 may be disposed.
- the grid 2 is parallel to each other at a predetermined distance, and a large number of guide slits into which a large number of metal foils as X-ray absorbing materials provided therebetween are fitted so as to be parallel to the primary X-rays.
- the guide slit plate is formed in a relatively fixed manner, and both ends of the metal foil are inserted into the opposite guide slits of the respective guide slit plates. Then, one end or both ends of each metal foil is held in a state where tension is applied by the urging means, and a thin plate made of a light element is used as a grid cover on the X-ray incident side and the X-ray emission side of each metal foil.
- FIG. 7 shows a state in which the marker 3 is arranged integrally with the grid 2 with respect to the one constituted by the X-ray flat panel detector 1 and the scattered X-ray removal grid 2 according to the first embodiment of the present invention.
- FIG. 8 is a sectional view taken along the line AA, and
- FIG. 9 is a top view thereof.
- the X-ray shielding foil 4 forming the grid 2 looks at the X-ray focal point F, and the relative distance d between the X-ray focal point F and the X-ray flat panel detector 1 is d0 (specified position).
- d0 (specified position).
- the X-ray shielding foil 4 is arranged at a pitch that matches an integer multiple of the arrangement of each pixel on the surface of the X-ray flat panel detector 1.
- the X-ray shielding foil 4 is arranged at a pitch three times the arrangement of each pixel on the surface of the X-ray flat panel detector 1.
- the cross section of the X-ray flat panel detector 1 does not actually have a partition as shown in FIG.
- the X-ray shielding foil 4 has an upper end surface and a lower end surface supported by an upper covering material 5 and a lower covering material 6.
- the upper covering material 5 and the lower covering material 6 are made of a thin carbon fiber sheet or aluminum plate that is transparent to X-rays.
- spacers 7 are sandwiched and bonded between the upper covering material 5 and the lower covering material 6.
- the marker 3 is located at the right end of the X-ray shielding foil 4 and is disposed integrally with the grid 2 on the upper covering material 5.
- the marker 3 includes an X-ray shielding plate 31 and an X-ray shielding plate 32.
- the cross-sectional shapes of the X-ray shielding plate 31 and the X-ray shielding plate 32 are the X-ray focal point F and the end portion of the X-ray flat panel detector 1.
- the shape includes a side that coincides with a line connecting pixels.
- the marker 3 masks part of the X-ray flat panel detector 1 by shielding X-rays from the two signal regions of interest at the right end.
- the X-ray flat panel detector 1 has a signal acquisition area 11 in which the X-ray conversion film and the TFT are substantially operated, and an imaging use area 12 for actually imaging and diagnosing the inside thereof.
- the X-ray shielding foil 4 of the grid 2 is arranged so as to completely cover the imaging use area 12.
- the marker 3 is arranged at the right end outside the imaging use area 12 and inside the signal acquisition area 11 with respect to the X-ray flat panel detector 1 in this example, and the X-ray shielding foil 4 with respect to the grid 2. It is arranged so as to avoid coming up and to come to the right end of the upper covering material 5.
- FIG. 10 shows the positional relationship as a more detailed perspective view around the marker 3 in FIG.
- the marker 3 includes an X-ray shielding plate 31 and an X-ray shielding plate 32.
- the X-ray shielding plate 31 and the X-ray shielding plate 32 are made of a material having a large atomic number and a large X-ray absorption, such as an alloy mainly composed of molybdenum, tungsten, lead, or tantalum. Therefore, when X-ray irradiation is performed, no signal is generated in the region shielded by the X-ray shielding plate 31 and the X-ray shielding plate 32 in the X-ray flat panel detector 1.
- attention signal regions 13 and 14 are set in the signal obtainable region 11 in the X-ray flat panel detector 1.
- the signal areas of interest 13 and 14 are partially shielded by the X-ray shielding plates 31 and 32 of the marker 3, so that signals are transmitted only from unshielded areas. Can be obtained.
- the X-ray 15 emitted from the X-ray focal point F passes around the marker 3 and irradiates the pixels on the X-ray flat panel detector 1.
- a signal is generated in a region other than the signal signal region 13 that is shielded by the X-ray shielding plate 31.
- a signal is generated in the region Wd0 at the relative distance d0, the region Wd1 at the relative distance d1, and the region Wd2 at the relative distance d2.
- the signal addition value Sx changes as the relative distance d becomes shorter and changes greatly as the relative distance d becomes longer.
- the X-ray 15 emitted from the X-ray focal point F passes around the marker 3 and irradiates the pixels on the X-ray flat panel detector 1.
- a signal is generated in an area other than the signal signal area 14 shielded by the X-ray shielding plate 32.
- signals are generated in the region Wd0 'at the relative distance d0, the region Wd1' at the relative distance d1, and the region Wd2 'at the relative distance d2.
- Sy changes as the relative distance d becomes shorter and changes as the relative distance d becomes longer.
- FIG. 13 shows an example of the relationship between the relative distance d between the X-ray focal point F and the X-ray flat panel detector 1 and the Rf value. Correction data is held for each Rf value.
- the relative positional relationship between the X-ray focal point F and the X-ray flat panel detector 1 is changed, and the X-ray focal point is changed. Even if an error due to a positional shift in the relative positional relationship between F and the X-ray flat panel detector 1 occurs, the relative positional relationship can be calculated from the calculated value Rf, and the correction parameter at that time can be used, and correction can be easily performed. Is possible.
- the markers 3 are positioned at the left and right ends of the X-ray shielding foil 4 array, You may arrange
- the marker 3 may be provided in three or more places as a mechanism for monitoring the relative positional relationship between the X-ray focal point F and the X-ray flat panel detector 1.
- the value of the calculated value Rf is the relative positional relationship between the X-ray focal point F and the X-ray flat panel detector 1. May be placed anywhere other than that.
- a plurality of markers 3 are provided. However, as shown in FIG.
- FIG. 15 is a diagram corresponding to FIG. 4 in the first embodiment and FIG. 10 in the second embodiment.
- the marker 3 is also shifted to the right. Therefore, the shadow of the marker 3 also moves to the right on the X-ray flat panel detector 1.
- the amount of X-rays detected in the attention signal region 13 increases and the amount of X-rays detected in the attention signal region 14 decreases. Therefore, by setting the attention signal areas 13 and 14 according to the direction of “shift” to be detected, the same effects as those of the first and second embodiments can be obtained.
- the effect of the present invention can also be obtained by providing a single marker 3.
- the markers 31 and 32 can be arranged at positions where the change is maximum, for example, corresponding to the left and right ends of the grid 2.
- the markers 31 and 32 can be arranged at positions where the change is maximum, for example, corresponding to the left and right ends of the grid 2.
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Abstract
Description
図7は、本発明の実施例1に係るX線フラットパネルディテクタ1と散乱X線除去用のグリッド2で構成されたものに対して、マーカー3がグリッド2と一体的に配置された状態を表す斜視図であり、図8はそのA-A断面図、図9はその上面図である。
よって、検出したい「ずれ」の方向に応じて、注目信号領域13、14を設定することにより、当該上述の実施例1、2と同様の効果を得ることができる。
Claims (5)
- X線焦点を有するX線照射手段と、
行方向又は列方向に配列された複数のX線遮蔽箔を有する散乱線除去グリッドと、
前記X線照射手段から照射され前記グリッドを透過したX線を検出して2次元信号を出力するX線検出部と、
前記グリッドに固設されたX線遮蔽材からなるマーカーと、
あらかじめ定められた複数の注目領域において、前記2次元信号の統計量を求める統計量算出手段と、
前記統計量から、補正パラメータを算出する補正パラメータ算出手段と、
当該補正パラメータを用いて、前記X線画像に含まれる前記グリッドの陰影を画像処理によって除去するモアレ除去手段と、を有し、
前記複数の注目領域は、前記X線焦点、前記グリッド、又は前記X線検出部の相対位置関係が変化することにより、前記マーカーの陰影が、前記X線遮蔽箔の配列方向に移動したときに、一方の注目領域における統計量の増減方向と、他方の注目領域における統計量の増減方向とが相反する関係となる注目領域の組を含むことを特徴とする2次元放射線検出器。 - 前記マーカーが複数設けられ、当該複数のマーカーのそれぞれについて、前記注目領域が定められていることを特徴とする請求項1記載の2次元放射線検出器。
- 前記2次元信号は、画像信号と、その周囲の未使用信号とからなり、前記統計量を、未使用信号に基づいて求めることを特徴とする請求項1又は2記載の2次元放射線検出器。
- 前記注目領域の組について求められた統計量をSa,Sb、前記補正パラメータをRgとしたとき、Rg=(Sa-Sb)/(Sa+Sb)であることを特徴とする、請求項1~3のいずれかに記載の2次元放射線検出器。
- 前記統計量は、加算又は平均であることを特徴とする請求項1~4記載の2次元放射線検出器。
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JP2010541151A JP4853591B2 (ja) | 2008-12-01 | 2008-12-01 | 放射線撮像装置 |
US13/132,150 US8712715B2 (en) | 2008-12-01 | 2008-12-01 | Radiation imaging device |
PCT/JP2008/071781 WO2010064287A1 (ja) | 2008-12-01 | 2008-12-01 | 放射線撮像装置 |
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CN103222010A (zh) * | 2010-10-08 | 2013-07-24 | 海龟湾合伙有限责任公司 | 三维聚焦防散射栅格及其制造方法 |
US9048002B2 (en) * | 2010-10-08 | 2015-06-02 | Turtle Bay Partners, Llc | Three-dimensional focused anti-scatter grid and method for manufacturing thereof |
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Also Published As
Publication number | Publication date |
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US8712715B2 (en) | 2014-04-29 |
JPWO2010064287A1 (ja) | 2012-04-26 |
JP4853591B2 (ja) | 2012-01-11 |
US20110238354A1 (en) | 2011-09-29 |
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