WO2010050673A3 - Resistance measuring apparatus and measuring method - Google Patents

Resistance measuring apparatus and measuring method Download PDF

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Publication number
WO2010050673A3
WO2010050673A3 PCT/KR2009/005077 KR2009005077W WO2010050673A3 WO 2010050673 A3 WO2010050673 A3 WO 2010050673A3 KR 2009005077 W KR2009005077 W KR 2009005077W WO 2010050673 A3 WO2010050673 A3 WO 2010050673A3
Authority
WO
WIPO (PCT)
Prior art keywords
resistance
measuring
measurement
reference resistances
measuring method
Prior art date
Application number
PCT/KR2009/005077
Other languages
French (fr)
Korean (ko)
Other versions
WO2010050673A2 (en
Inventor
김규태
유광민
Original Assignee
한국표준과학연구원
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by 한국표준과학연구원 filed Critical 한국표준과학연구원
Publication of WO2010050673A2 publication Critical patent/WO2010050673A2/en
Publication of WO2010050673A3 publication Critical patent/WO2010050673A3/en

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R27/00—Arrangements for measuring resistance, reactance, impedance, or electric characteristics derived therefrom
    • G01R27/02—Measuring real or complex resistance, reactance, impedance, or other two-pole characteristics derived therefrom, e.g. time constant
    • G01R27/025—Measuring very high resistances, e.g. isolation resistances, i.e. megohm-meters
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R27/00—Arrangements for measuring resistance, reactance, impedance, or electric characteristics derived therefrom
    • G01R27/02—Measuring real or complex resistance, reactance, impedance, or other two-pole characteristics derived therefrom, e.g. time constant
    • G01R27/08—Measuring resistance by measuring both voltage and current
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/50—Testing of electric apparatus, lines, cables or components for short-circuits, continuity, leakage current or incorrect line connections
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R17/00—Measuring arrangements involving comparison with a reference value, e.g. bridge
    • G01R17/10—AC or DC measuring bridges
    • G01R17/105—AC or DC measuring bridges for measuring impedance or resistance
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2851—Testing of integrated circuits [IC]
    • G01R31/2855—Environmental, reliability or burn-in testing
    • G01R31/2872—Environmental, reliability or burn-in testing related to electrical or environmental aspects, e.g. temperature, humidity, vibration, nuclear radiation
    • G01R31/2879—Environmental, reliability or burn-in testing related to electrical or environmental aspects, e.g. temperature, humidity, vibration, nuclear radiation related to electrical aspects, e.g. to voltage or current supply or stimuli or to electrical loads

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Measurement Of Resistance Or Impedance (AREA)

Abstract

The present invention relates to a resistance measuring apparatus and to a measuring method, said apparatus comprising a power supply unit for supplying constant voltage to two fixed voltage sources, a resistance unit connected in parallel to the power supply unit and which includes two reference resistances connected in serial with a potentiometer disposed therebetween, a voltmeter for measuring the voltage between the connection node of said two fixed voltage sources and the variable terminal node of the potentiometer, and an electrical connection means for connecting a resistance to be measured in parallel to either of said two reference resistances. The resistance measuring apparatus and the measuring method according to the present invention are advantageous in that an input of a detector is directly connected to a well-defined common ground to reduce influences from noise and thus enable the measurement of high insulation resistance, and just two reference resistances are selected even without causing a deterioration of the measurement sensitivity during a selection of a measurement range to simplify a circuit configuration and improve the reliability of the measurement result.
PCT/KR2009/005077 2008-10-30 2009-09-08 Resistance measuring apparatus and measuring method WO2010050673A2 (en)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
KR1020080107059A KR100974650B1 (en) 2008-10-30 2008-10-30 Resistance Measuring Apparatus and Method
KR10-2008-0107059 2008-10-30

Publications (2)

Publication Number Publication Date
WO2010050673A2 WO2010050673A2 (en) 2010-05-06
WO2010050673A3 true WO2010050673A3 (en) 2010-06-24

Family

ID=42129407

Family Applications (1)

Application Number Title Priority Date Filing Date
PCT/KR2009/005077 WO2010050673A2 (en) 2008-10-30 2009-09-08 Resistance measuring apparatus and measuring method

Country Status (2)

Country Link
KR (1) KR100974650B1 (en)
WO (1) WO2010050673A2 (en)

Families Citing this family (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR101104784B1 (en) * 2010-12-14 2012-01-12 한국표준과학연구원 Sheet resistance measurement apparatus of thin film materials using the van der pauw method
DE102011107206A1 (en) * 2011-07-13 2013-01-17 Howaldtswerke-Deutsche Werft Gmbh Method for checking a measuring arrangement for voltage determination and method for charging a loadable voltage source
CN103376359B (en) * 2012-04-26 2015-10-21 石家庄杰泰特动力能源有限公司 A kind of high voltage direct current insulation monitoring and warning device being applicable to new-energy automobile
CN104977469B (en) * 2014-04-04 2018-03-23 中芯国际集成电路制造(上海)有限公司 Measuring circuit and method for IC design
KR20200084517A (en) * 2019-01-03 2020-07-13 주식회사 엘지화학 Insulation resistance measurement apparatus and method thereof

Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH05264616A (en) * 1992-03-23 1993-10-12 Yokogawa Electric Corp Resistance measuring device
JP2005207926A (en) * 2004-01-23 2005-08-04 Fab Solution Kk Method and instrument for measuring resistance
JP2007240320A (en) * 2006-03-08 2007-09-20 Fujitsu Ltd Electrical resistance measuring method and resistance measuring device using same

Family Cites Families (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR100223972B1 (en) 1997-07-08 1999-10-15 정명세 System for measuring resistance of dielectric

Patent Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH05264616A (en) * 1992-03-23 1993-10-12 Yokogawa Electric Corp Resistance measuring device
JP2005207926A (en) * 2004-01-23 2005-08-04 Fab Solution Kk Method and instrument for measuring resistance
JP2007240320A (en) * 2006-03-08 2007-09-20 Fujitsu Ltd Electrical resistance measuring method and resistance measuring device using same

Also Published As

Publication number Publication date
KR20100048060A (en) 2010-05-11
KR100974650B1 (en) 2010-08-06
WO2010050673A2 (en) 2010-05-06

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