WO2009075481A8 - A method for adsorption of nano-structure and adsorption matter using solid thin film mask - Google Patents
A method for adsorption of nano-structure and adsorption matter using solid thin film mask Download PDFInfo
- Publication number
- WO2009075481A8 WO2009075481A8 PCT/KR2008/006787 KR2008006787W WO2009075481A8 WO 2009075481 A8 WO2009075481 A8 WO 2009075481A8 KR 2008006787 W KR2008006787 W KR 2008006787W WO 2009075481 A8 WO2009075481 A8 WO 2009075481A8
- Authority
- WO
- WIPO (PCT)
- Prior art keywords
- tip
- nano
- adsorption
- mask
- thin film
- Prior art date
Links
Classifications
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B81—MICROSTRUCTURAL TECHNOLOGY
- B81C—PROCESSES OR APPARATUS SPECIALLY ADAPTED FOR THE MANUFACTURE OR TREATMENT OF MICROSTRUCTURAL DEVICES OR SYSTEMS
- B81C1/00—Manufacture or treatment of devices or systems in or on a substrate
- B81C1/00015—Manufacture or treatment of devices or systems in or on a substrate for manufacturing microsystems
- B81C1/00206—Processes for functionalising a surface, e.g. provide the surface with specific mechanical, chemical or biological properties
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B81—MICROSTRUCTURAL TECHNOLOGY
- B81C—PROCESSES OR APPARATUS SPECIALLY ADAPTED FOR THE MANUFACTURE OR TREATMENT OF MICROSTRUCTURAL DEVICES OR SYSTEMS
- B81C1/00—Manufacture or treatment of devices or systems in or on a substrate
- B81C1/00349—Creating layers of material on a substrate
- B81C1/0038—Processes for creating layers of materials not provided for in groups B81C1/00357 - B81C1/00373
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01Q—SCANNING-PROBE TECHNIQUES OR APPARATUS; APPLICATIONS OF SCANNING-PROBE TECHNIQUES, e.g. SCANNING PROBE MICROSCOPY [SPM]
- G01Q70/00—General aspects of SPM probes, their manufacture or their related instrumentation, insofar as they are not specially adapted to a single SPM technique covered by group G01Q60/00
- G01Q70/16—Probe manufacture
- G01Q70/18—Functionalisation
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B81—MICROSTRUCTURAL TECHNOLOGY
- B81B—MICROSTRUCTURAL DEVICES OR SYSTEMS, e.g. MICROMECHANICAL DEVICES
- B81B2201/00—Specific applications of microelectromechanical systems
- B81B2201/12—STM or AFM microtips
Abstract
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US12/747,396 US20100270265A1 (en) | 2007-08-09 | 2008-11-18 | Method for adsorption of nano-structure and adsorption matter using solid thin film mask |
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
KR10-2007-0127849 | 2007-12-10 | ||
KR1020070127849A KR20090015779A (en) | 2007-08-09 | 2007-12-10 | A method for adsorption using solid thin film mask of nano-particle and adsorption matter |
Publications (3)
Publication Number | Publication Date |
---|---|
WO2009075481A2 WO2009075481A2 (en) | 2009-06-18 |
WO2009075481A3 WO2009075481A3 (en) | 2009-08-27 |
WO2009075481A8 true WO2009075481A8 (en) | 2010-07-01 |
Family
ID=40756194
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
PCT/KR2008/006787 WO2009075481A2 (en) | 2007-08-09 | 2008-11-18 | A method for adsorption using solid thin film mask of nano-particle and adsorption matter |
Country Status (2)
Country | Link |
---|---|
KR (1) | KR20100087740A (en) |
WO (1) | WO2009075481A2 (en) |
Family Cites Families (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP3543967B2 (en) * | 2000-09-21 | 2004-07-21 | 松下電器産業株式会社 | SCANNING PROBE MICROSCOPE PROBE, METHOD OF MANUFACTURING THE SAME, SCANNING PROBE MICROSCOPE HAVING THE PROBE, AND MOLECULAR PROCESSING METHOD USING THE SAME |
JP3557589B2 (en) * | 2002-03-27 | 2004-08-25 | 株式会社ユニソク | Method of manufacturing probe for scanning probe microscope, probe manufactured by the method, and manufacturing apparatus |
KR100597280B1 (en) * | 2004-07-01 | 2006-07-06 | 한국기계연구원 | The attaching method of nano materials using Langmuir-Blodgett |
KR100736358B1 (en) * | 2004-11-12 | 2007-07-06 | 재단법인서울대학교산학협력재단 | Method to assemble nanostructures at the end of scanning probe microscope's probe and scanning probe microscope with the probe |
KR100781036B1 (en) * | 2005-12-31 | 2007-11-29 | 성균관대학교산학협력단 | Apparatus and method for manufacturing carbon nano-tube probe by using metallic vessel as a electrode |
-
2008
- 2008-11-18 WO PCT/KR2008/006787 patent/WO2009075481A2/en active Application Filing
- 2008-11-18 KR KR1020107012837A patent/KR20100087740A/en not_active Application Discontinuation
Also Published As
Publication number | Publication date |
---|---|
KR20100087740A (en) | 2010-08-05 |
WO2009075481A2 (en) | 2009-06-18 |
WO2009075481A3 (en) | 2009-08-27 |
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