WO2009037914A1 - Method and system for detecting defect of structure - Google Patents

Method and system for detecting defect of structure Download PDF

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Publication number
WO2009037914A1
WO2009037914A1 PCT/JP2008/062488 JP2008062488W WO2009037914A1 WO 2009037914 A1 WO2009037914 A1 WO 2009037914A1 JP 2008062488 W JP2008062488 W JP 2008062488W WO 2009037914 A1 WO2009037914 A1 WO 2009037914A1
Authority
WO
WIPO (PCT)
Prior art keywords
defect
light emitting
light
detecting
periphery
Prior art date
Application number
PCT/JP2008/062488
Other languages
French (fr)
Japanese (ja)
Inventor
Chao-Nan Xu
Yusuke Imai
Naohiro Ueno
Original Assignee
National Institute Of Advanced Industrial Science And Technology
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Priority claimed from JP2008072068A external-priority patent/JP5007978B2/en
Application filed by National Institute Of Advanced Industrial Science And Technology filed Critical National Institute Of Advanced Industrial Science And Technology
Publication of WO2009037914A1 publication Critical patent/WO2009037914A1/en

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01M—TESTING STATIC OR DYNAMIC BALANCE OF MACHINES OR STRUCTURES; TESTING OF STRUCTURES OR APPARATUS, NOT OTHERWISE PROVIDED FOR
    • G01M11/00—Testing of optical apparatus; Testing structures by optical methods not otherwise provided for
    • G01M11/08—Testing mechanical properties
    • G01M11/081—Testing mechanical properties by using a contact-less detection method, i.e. with a camera

Landscapes

  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)

Abstract

A defect detecting system (10) detects existence of a defect by detecting light emission of a light emitting film (1) formed on a surface of a structure (2), i.e., a detection target. The light emitting film (1) contains light emitting particles (1a). When a deformation change is generated in the structure (2) having a defect, the periphery of the defect is deformed due to stress concentration generated at the periphery, and the light emitting film on the surface is also deformed. As strain energy propagates to the light emitting particles and makes the light emitting particles emit light, the defect which cannot be visually inspected canbe indicated to the outside of the structure by emission of light. Thus, the method and the system for easily and accurately detecting the existence of the defect without destroying the structure are provided.
PCT/JP2008/062488 2007-09-21 2008-07-10 Method and system for detecting defect of structure WO2009037914A1 (en)

Applications Claiming Priority (4)

Application Number Priority Date Filing Date Title
JP2007246161 2007-09-21
JP2007-246161 2007-09-21
JP2008072068A JP5007978B2 (en) 2007-09-21 2008-03-19 Method and system for detecting structural defects
JP2008-072068 2008-03-19

Publications (1)

Publication Number Publication Date
WO2009037914A1 true WO2009037914A1 (en) 2009-03-26

Family

ID=40467738

Family Applications (1)

Application Number Title Priority Date Filing Date
PCT/JP2008/062488 WO2009037914A1 (en) 2007-09-21 2008-07-10 Method and system for detecting defect of structure

Country Status (1)

Country Link
WO (1) WO2009037914A1 (en)

Cited By (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN101936714A (en) * 2010-08-16 2011-01-05 上海地铁盾构设备工程有限公司 Entire deformation detection system of subway tunnel
EP2927659A1 (en) * 2014-03-31 2015-10-07 Hitachi Ltd. Surface inspection apparatus for structures, and structure surface inspection method
US9373169B2 (en) 2010-01-12 2016-06-21 Koninklijke Philips N.V. Determination of a position characteristic for an object
CN105717154A (en) * 2016-05-05 2016-06-29 东旭科技集团有限公司 Device and method for measuring shrinking percentage of panels
CN107835937A (en) * 2015-07-09 2018-03-23 国立研究开发法人产业技术综合研究所 For determining the method for lesion progress degree and system for determining lesion progress degree

Citations (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2000186944A (en) * 1998-12-21 2000-07-04 Takenaka Komuten Co Ltd Structure with self-detecting function or self-repairing function and structural member thereof
JP2001021384A (en) * 1999-07-07 2001-01-26 Nippon Telegr & Teleph Corp <Ntt> Separation detection method by optical fiber sensor
JP2002340741A (en) * 2001-05-15 2002-11-27 Mitsubishi Heavy Ind Ltd System for predicting damage to storage tank using optical fiber
JP2002365021A (en) * 2001-06-07 2002-12-18 Yazaki Corp Strain detection system and strain detector
WO2007015532A1 (en) * 2005-08-03 2007-02-08 National Institute Of Advanced Industrial Science And Technology Material to be measured for stress analysis, coating liquid for forming coating film layer on the material to be measured, and stress-induced luminescent structure
JP2007163390A (en) * 2005-12-16 2007-06-28 Jfe Steel Kk Method and device for detecting defect of structure
JP2007192689A (en) * 2006-01-20 2007-08-02 National Institute Of Advanced Industrial & Technology Method and device for analyzing stress/distortion

Patent Citations (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2000186944A (en) * 1998-12-21 2000-07-04 Takenaka Komuten Co Ltd Structure with self-detecting function or self-repairing function and structural member thereof
JP2001021384A (en) * 1999-07-07 2001-01-26 Nippon Telegr & Teleph Corp <Ntt> Separation detection method by optical fiber sensor
JP2002340741A (en) * 2001-05-15 2002-11-27 Mitsubishi Heavy Ind Ltd System for predicting damage to storage tank using optical fiber
JP2002365021A (en) * 2001-06-07 2002-12-18 Yazaki Corp Strain detection system and strain detector
WO2007015532A1 (en) * 2005-08-03 2007-02-08 National Institute Of Advanced Industrial Science And Technology Material to be measured for stress analysis, coating liquid for forming coating film layer on the material to be measured, and stress-induced luminescent structure
JP2007163390A (en) * 2005-12-16 2007-06-28 Jfe Steel Kk Method and device for detecting defect of structure
JP2007192689A (en) * 2006-01-20 2007-08-02 National Institute Of Advanced Industrial & Technology Method and device for analyzing stress/distortion

Cited By (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US9373169B2 (en) 2010-01-12 2016-06-21 Koninklijke Philips N.V. Determination of a position characteristic for an object
CN101936714A (en) * 2010-08-16 2011-01-05 上海地铁盾构设备工程有限公司 Entire deformation detection system of subway tunnel
EP2927659A1 (en) * 2014-03-31 2015-10-07 Hitachi Ltd. Surface inspection apparatus for structures, and structure surface inspection method
CN107835937A (en) * 2015-07-09 2018-03-23 国立研究开发法人产业技术综合研究所 For determining the method for lesion progress degree and system for determining lesion progress degree
US20180172567A1 (en) * 2015-07-09 2018-06-21 National Institute Of Advanced Industrial Science And Technology A method for measuring damage progression and a system for measuring damage progression
CN105717154A (en) * 2016-05-05 2016-06-29 东旭科技集团有限公司 Device and method for measuring shrinking percentage of panels

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