WO2009033639A3 - Method for cleaning vacuum chambers for extreme uv lithography devices - Google Patents
Method for cleaning vacuum chambers for extreme uv lithography devices Download PDFInfo
- Publication number
- WO2009033639A3 WO2009033639A3 PCT/EP2008/007384 EP2008007384W WO2009033639A3 WO 2009033639 A3 WO2009033639 A3 WO 2009033639A3 EP 2008007384 W EP2008007384 W EP 2008007384W WO 2009033639 A3 WO2009033639 A3 WO 2009033639A3
- Authority
- WO
- WIPO (PCT)
- Prior art keywords
- extreme
- vacuum chambers
- cleaning vacuum
- lithography devices
- irradiation
- Prior art date
Links
- 238000004140 cleaning Methods 0.000 title 1
- 238000001459 lithography Methods 0.000 title 1
- 238000000034 method Methods 0.000 title 1
- 238000011109 contamination Methods 0.000 abstract 2
- 230000005855 radiation Effects 0.000 abstract 2
Classifications
-
- A—HUMAN NECESSITIES
- A61—MEDICAL OR VETERINARY SCIENCE; HYGIENE
- A61L—METHODS OR APPARATUS FOR STERILISING MATERIALS OR OBJECTS IN GENERAL; DISINFECTION, STERILISATION OR DEODORISATION OF AIR; CHEMICAL ASPECTS OF BANDAGES, DRESSINGS, ABSORBENT PADS OR SURGICAL ARTICLES; MATERIALS FOR BANDAGES, DRESSINGS, ABSORBENT PADS OR SURGICAL ARTICLES
- A61L2/00—Methods or apparatus for disinfecting or sterilising materials or objects other than foodstuffs or contact lenses; Accessories therefor
- A61L2/02—Methods or apparatus for disinfecting or sterilising materials or objects other than foodstuffs or contact lenses; Accessories therefor using physical phenomena
- A61L2/08—Radiation
- A61L2/10—Ultraviolet radiation
-
- A—HUMAN NECESSITIES
- A61—MEDICAL OR VETERINARY SCIENCE; HYGIENE
- A61L—METHODS OR APPARATUS FOR STERILISING MATERIALS OR OBJECTS IN GENERAL; DISINFECTION, STERILISATION OR DEODORISATION OF AIR; CHEMICAL ASPECTS OF BANDAGES, DRESSINGS, ABSORBENT PADS OR SURGICAL ARTICLES; MATERIALS FOR BANDAGES, DRESSINGS, ABSORBENT PADS OR SURGICAL ARTICLES
- A61L2/00—Methods or apparatus for disinfecting or sterilising materials or objects other than foodstuffs or contact lenses; Accessories therefor
- A61L2/02—Methods or apparatus for disinfecting or sterilising materials or objects other than foodstuffs or contact lenses; Accessories therefor using physical phenomena
- A61L2/08—Radiation
- A61L2/087—Particle radiation, e.g. electron-beam, alpha or beta radiation
-
- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
- G03F7/70—Microphotolithographic exposure; Apparatus therefor
- G03F7/708—Construction of apparatus, e.g. environment aspects, hygiene aspects or materials
- G03F7/70908—Hygiene, e.g. preventing apparatus pollution, mitigating effect of pollution or removing pollutants from apparatus
- G03F7/70916—Pollution mitigation, i.e. mitigating effect of contamination or debris, e.g. foil traps
-
- A—HUMAN NECESSITIES
- A61—MEDICAL OR VETERINARY SCIENCE; HYGIENE
- A61L—METHODS OR APPARATUS FOR STERILISING MATERIALS OR OBJECTS IN GENERAL; DISINFECTION, STERILISATION OR DEODORISATION OF AIR; CHEMICAL ASPECTS OF BANDAGES, DRESSINGS, ABSORBENT PADS OR SURGICAL ARTICLES; MATERIALS FOR BANDAGES, DRESSINGS, ABSORBENT PADS OR SURGICAL ARTICLES
- A61L2202/00—Aspects relating to methods or apparatus for disinfecting or sterilising materials or objects
- A61L2202/20—Targets to be treated
- A61L2202/23—Containers, e.g. vials, bottles, syringes, mail
Landscapes
- Health & Medical Sciences (AREA)
- Public Health (AREA)
- Epidemiology (AREA)
- Life Sciences & Earth Sciences (AREA)
- Veterinary Medicine (AREA)
- General Health & Medical Sciences (AREA)
- Animal Behavior & Ethology (AREA)
- Atmospheric Sciences (AREA)
- Engineering & Computer Science (AREA)
- Environmental & Geological Engineering (AREA)
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Exposure And Positioning Against Photoresist Photosensitive Materials (AREA)
- Exposure Of Semiconductors, Excluding Electron Or Ion Beam Exposure (AREA)
Abstract
In order to be able to clean and, if appropriate, also passivate a vacuum chamber (30) efficiently from contamination, it comprises a radiation source (31), which can in particular generate high-energy radiation (32). The irradiation is carried out with gradually increasing energy. In order to protect a multilayer mirror (35) against contamination during the irradiation, a protection element (37) is provided, which is mounted in a displaceable manner on a rail (39) and can be displaced out of a basic position (P2) into a protection position (P1) in front of the multilayer mirror (35).
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
DE102007043986.7 | 2007-09-14 | ||
DE102007043986 | 2007-09-14 |
Publications (2)
Publication Number | Publication Date |
---|---|
WO2009033639A2 WO2009033639A2 (en) | 2009-03-19 |
WO2009033639A3 true WO2009033639A3 (en) | 2009-04-30 |
Family
ID=40149570
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
PCT/EP2008/007384 WO2009033639A2 (en) | 2007-09-14 | 2008-09-10 | Method for cleaning vacuum chambers for extreme uv lithography devices |
Country Status (2)
Country | Link |
---|---|
DE (1) | DE102008041628A1 (en) |
WO (1) | WO2009033639A2 (en) |
Families Citing this family (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
DE102012215697A1 (en) * | 2012-09-05 | 2014-03-06 | Carl Zeiss Smt Gmbh | Blocking element for the protection of optical elements in projection exposure systems |
CN111954852A (en) * | 2018-04-12 | 2020-11-17 | Asml荷兰有限公司 | Apparatus comprising an electrostatic chuck and method for operating the apparatus |
CN111061129B (en) * | 2018-10-17 | 2022-11-01 | 台湾积体电路制造股份有限公司 | Lithography system and method for cleaning a lithography system |
DE102022121000B4 (en) | 2021-08-23 | 2024-03-07 | Carl Zeiss Smt Gmbh | Mirror arrangement for an EUV projection exposure system with a protective device for protecting the optical effective surface and EUV projection exposure system |
Citations (8)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
WO2000003304A1 (en) * | 1998-07-08 | 2000-01-20 | Carl Zeiss | Method for decontaminating microlithography projection lighting devices |
US6252648B1 (en) * | 1998-02-04 | 2001-06-26 | Canon Kabushiki Kaisha | Exposure apparatus and method of cleaning optical element of the same |
US20010043734A1 (en) * | 1998-07-16 | 2001-11-22 | Jeffrey A. Brigante | Method and apparatus for combined particle location and removal |
WO2002054115A2 (en) * | 2001-01-03 | 2002-07-11 | Euv Limited Liability Corporation | A self-cleaning optic for extreme ultraviolet lithography |
WO2003075098A2 (en) * | 2002-03-07 | 2003-09-12 | Carl Zeiss Smt Ag | Prevention of contamination of optical elements and cleaning said elements |
US20040218157A1 (en) * | 2002-12-20 | 2004-11-04 | Asml Netherlands B.V. | Method for cleaning a surface of a component of a lithographic projection apparatus, lithographic projection apparatus, device manufacturing method and cleaning system |
EP1643310A1 (en) * | 2004-10-04 | 2006-04-05 | ASML Netherlands B.V. | Method for the removal of deposition on an optical element, method for the protection of an optical element, device manufacturing method, apparatus including an optical element, and lithographic apparatus |
WO2006093781A2 (en) * | 2005-02-25 | 2006-09-08 | Cymer, Inc. | Systems for protecting internal components of an euv light source from plasma-generated debris |
-
2008
- 2008-08-28 DE DE102008041628A patent/DE102008041628A1/en not_active Withdrawn
- 2008-09-10 WO PCT/EP2008/007384 patent/WO2009033639A2/en active Application Filing
Patent Citations (8)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US6252648B1 (en) * | 1998-02-04 | 2001-06-26 | Canon Kabushiki Kaisha | Exposure apparatus and method of cleaning optical element of the same |
WO2000003304A1 (en) * | 1998-07-08 | 2000-01-20 | Carl Zeiss | Method for decontaminating microlithography projection lighting devices |
US20010043734A1 (en) * | 1998-07-16 | 2001-11-22 | Jeffrey A. Brigante | Method and apparatus for combined particle location and removal |
WO2002054115A2 (en) * | 2001-01-03 | 2002-07-11 | Euv Limited Liability Corporation | A self-cleaning optic for extreme ultraviolet lithography |
WO2003075098A2 (en) * | 2002-03-07 | 2003-09-12 | Carl Zeiss Smt Ag | Prevention of contamination of optical elements and cleaning said elements |
US20040218157A1 (en) * | 2002-12-20 | 2004-11-04 | Asml Netherlands B.V. | Method for cleaning a surface of a component of a lithographic projection apparatus, lithographic projection apparatus, device manufacturing method and cleaning system |
EP1643310A1 (en) * | 2004-10-04 | 2006-04-05 | ASML Netherlands B.V. | Method for the removal of deposition on an optical element, method for the protection of an optical element, device manufacturing method, apparatus including an optical element, and lithographic apparatus |
WO2006093781A2 (en) * | 2005-02-25 | 2006-09-08 | Cymer, Inc. | Systems for protecting internal components of an euv light source from plasma-generated debris |
Also Published As
Publication number | Publication date |
---|---|
WO2009033639A2 (en) | 2009-03-19 |
DE102008041628A1 (en) | 2009-03-19 |
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